Microns to Angstroms on one platform!

Light Microscope-Confocal– SEM – AFM – BTBP Clarity

BTBP, 359 PIERCY RD. SAN JOSE, CA 95138

Imaging range millimeters
down to Angstroms
 XYZ RESOLUTION LIMITS
300-250nm XY AND <10 ANGSTROM IN Z
 250um LMLM
L
A
10um S B
E
R T
1um B
S
Useful range of measurement in
0.5 um C P
S XYZ A
N
0.25um E
M C C
Z um 100nm
O
N
L
F A
C
50nm A R
L
Z-Resolution better than I
25nm
Confocal T
10nm Y
and in the AFM range
0.01nm AFM
100 A 10nm 50nm 100nm 100um 250um 500um
Lateral XY Resolution
 SCANNING LASER CONFOCAL

BTBP CLARITY OPTICAL MICROSCOPE

 SCANNING LASER CONFOCAL

BTBP CLARITY OPTICAL MICROSCOPE

 Metal Coating Defect on Glass Substrate

AFM
SEM BTBP

DEREK LEONG
 3D global curvature and local height variation

DEREK LEONG

The curvature view demonstrates the displacement of material wen the defect occured
DEREK LEONG
 Clarity 3D Data

SEM data

Microscope image
 POLISHED GLASS SUBSTRATE

SEM AFM

BTBP
The Next Frontier in Life Science Microscopy, Cell Surface Imaging

Derek Leong
Line Profile Trace
Line Profile Trace and Area Graph
For more information please contact us at:

Derek Leong
derek@dblmicrosystems.com
510/543-8694
DBLMICROSYSTEMS.COM