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In-Circuit Functional Test (ICFT) Using QT200
In-Circuit Functional Test (ICFT) Using QT200
30/7/2019 16BEE0326
APPARATUS REQUIRED:
HARDWARE OUTPUT:
RESULT:
Therefore the experiment has been performed successfully, and the chip has passed the given test.
INFERENCE:
In this experiment, IC 2432 was tested, a clip was placed to connect all the required pins. On
comparison with the standard values, satisfy the result and therefore has passed the quality test.