EE 533 Stage 1 Submission

By: Harnit Singh Sudan(2016EEB1079)

Guided by: Dr. Devarshi Das

Research Papers to be Studied (one of these):

1. Yelten Berke M. et. al, “Analog Negative Bias Temperature Instability Monitoring Circuit”, IEEE
TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 12, NO. 1, MARCH 2012.

2. Luo H. et. al, “Bulk-Compensation technique and its application to subthreshold ICs”, IET ELECTRONICS
LETTERS, VOL.46, NO.16, 5th AUGUST 2010.

Analysis to be done in respective papers:

1. Paper-I:
a. Study of NBTI phenomenon
b. Explanation of the change in threshold voltage relation
c. Explain the working of the proposed circuit
d. Developing an understanding of the results

2. Paper-II:
a. Understanding the subthreshold conduction phenomenon
b. Explaining the various process- parameters (e.g. process- corners)
c. Explaining what is “bulk compensation technique”
d. Application of the technique in a class-C inverter