Professional Documents
Culture Documents
Knipp
Ref.: Apple
Ref.: IBM
Critical
10-8 10-7 10-6 10-5 10-4 10-3 10-2 10-1 1 101 dimension (m)
Ref.: Palo Alto Research Center
Diodes 1
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
3 Diodes
3.1 Introduction
3.2 Pn-junctions at zero bias
3.2.1 Semiconductor in Thermal Equilibrium
3.2.2 Pn-junctions in thermal equilibrium
3.2.3 The Space Charge Region
3.2.4 The Built-in voltage
3.2.5 Field and Potential Distribution
3.3 Pn-junctions under bias conditions
3.3.1 Diode under forward bias
3.3.2 The law of the Junction
3.3.3 Splitting of Quasi Fermi levels
3.3.4 The Shockley model of the pn-junction
3.3.4.1 The abrupt pn-junction
3.3.4.2 Carrier concentration at the boundaries
3.3.4.3 Low Injection
3.3.4.4 Constant current densities in the depletion region
3.3.5 Minority carrier in the neutral region of a pn-junction
3.3.6 Ideal diode equation
3.3.7 The asymmetric pn-junction / p+n diode
Diodes 2
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
References
Diodes 3
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
3.1 Introduction
This chapter will deal with pn-junctions, metal-semiconductor junctions
(Schottky diodes) and ohmic contacts. Pn-junctions are of importance for
several modern electronic devices like diodes (e.g. Optical detectors, solar
cells, light emitting diodes, laser diodes), bipolar transistors, thyristor and field
effect transistors. In the following the operating principle of pn-junctions will be
discussed starting from the semiconductor materials. The ideal diode equation
will be derived. Furthermore, an equivalent circuit for pn-junctions will be
presented.
The main characteristic of a pn-junction or a diode is that for positive voltages
(forward bias) the diode is conduction, whereas for negative voltages (reverse
bias) the current flow is blocked. Due to this properties a diode can be used for
several applications like rectifiers, sampling circuits, demodulators, logic gates
and so on.
Diodes 4
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
3.1 Introduction
A silicon pn-junction can be realized by the formation of a junction between an
n-type and a p-type doped region. The junction can be formed by the
implantation or diffusion of dopants in an wafer. For example a silicon pn-
junction can be formed by the implantation of boron atoms in an n-type silicon
wafer.
Dopant concentration
p-type Silicon p+
Acceptors
n-type Silicon
Depth
n
Donors
Diodes 5
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
p+ - + n
-xp 0 xn
Diodes 8
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 9
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 10
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
dn dEFn
jn = q ⋅ nµ n F + Dn = qµ n n =0
dx dx
dp dEFp
j p = q ⋅ pµ n F − D p = qµ p p =0
dx dx
The Fermi level is constant throughout the sample independent of the spatail
position.
Diodes 11
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
ni2
nn ≈ N D , pn =
ND
The carrier concentration in the p-
region is given by:
ni2
pp ≈ N A, np =
NA Energy band diagram and carrier
concentration for a silicon pn-junction
Ref.: M.Shur, Introduction to Electronic Devices
at zero bias.
Diodes 12
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
N A x p = N D xn Charge neutrality
Diodes 13
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
ND NA
ϕbn ≈ Vth ⋅ ln ϕbp ≈ −Vth ⋅ ln
ni ni
the build-in voltage can be described as a function of the doping concentrations.
ND N A
Vbi ≈ Vth ⋅ ln 2
Built-in voltage
ni
Therefore, the built-in voltage is determined by the product of the donor and
acceptor concentration. The intrinsic carrier concentration can be substituted by
Eg
ni = N C NV ⋅ exp − Intrinsic carrier concentration
2kT
Diodes 15
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Eg N N
Vbi ≈ + Vth ⋅ ln D A
q N C NV
Built-in voltage
Diodes 16
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
dF d 2ϕ 1
=− 2 = ρ Poisson Equation
dx dx ε 0ε r
Let’s start with the semiconductor material outside of the space charge region.
The charges outside of the space charge region are zero, ρ=0, so that the electric
field distribution is zero
Fn = Fp = 0 for x < − x p and x > xn
and subsequently the potential distribution for this region of the device results to
Within the space charge region the space charge density is given by
qN A
− for − xp < x < 0
dF ε S
=
dx qN D for 0 < x < xn
ε S
Here, x=0 corresponds to the boundary between the p-type and the n-type region
and xp and xn are the depletion widths on both sides of the junction.
Diodes 18
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
x
− Fm ⋅ 1 + for − x p < x < 0
xp
F = Electric field distribution
− F ⋅ 1 − x for 0 < x < x
m n
xn
where Fm is the maximum electric field. Further, it is assumed that F(x=-xp)=0 and
F(x=xn)=0. The maximum electric field is observed for Fm=F(x=0), where
qN D xn qN A x p
Fm = =
εS εS
so that electric field distribution results to
where ϕ(-xp)=Vbi and ϕ(xn)=0. Due to charge neutrality, xpNA=xnND, the built-in
voltage can be calculated by
2
qN D xn2 qN A x p
Vbi = +
2ε S 2ε S
Diodes 20
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
w = xn + x p
Diodes 21
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
qN A (x + x p )
2
Depletion layer width and energy diagram of a pn-junction under two different
biasing conditions. (left) Thermal equilibrium, (right) Forward bias.
Ref.: M.S. Sze, Semiconductor Devices
Diodes 24
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
EF(n ) − EC
n = N C ⋅ exp Quasi electron concentration
kT
EV − EF( p )
p = NV ⋅ exp Quasi hole concentration
kT
Under thermal equilibrium the quasi Fermi levels for electrons and holes are
identical, so that the Fermi potential is identical for electrons and holes. Under
non-equilibrium conditions EF(n) is not equal to EF(p) and both might be a function
of the position and the time.
Diodes 25
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
EFn − EFp
n p = n p 0 ⋅ exp Energy band diagram for a silicon
kT pn-junction under forward bias
(bottom). Note that the length
scale for the two band diagrams is
different.
Diodes 29
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 30
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 31
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 32
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
qV
n p = n p 0 ⋅ exp
kT
The minority carrier concentration at the boundary x=xn is given by
qV
pn = pn 0 ⋅ exp
kT
Therefore, the minority carrier concentration under bias (non-thermal equilibrium)
is expressed in terms of the carrier concentration under thermal equilibrium.
Diodes 33
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Low injection assumes now that the change of the minority carrier concentration
is smaller than the majority carrier concentration in thermal equilibrium. As a
consequence Fermi level for the majority carriers is assumed to be identical with
the Fermi level under thermal equilibrium.
Diodes 34
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 35
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
( )
R = A ⋅ np − ni2 = A ⋅ (nn pn − nn 0 p p 0 ) Recombination equation
Diodes 37
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
The Diffusion equation can be solved by using the following general solution.
x−x
pn ( x ) − pn 0 = A ⋅ exp n + B ⋅ exp − x − xn
D pτ pl D pτ pl
To simply the equation the Diffusion Length for minority carriers is introduced.
Diodes 38
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
x − xn x − xn
pn ( x ) − pn 0 = A ⋅ exp + B ⋅ exp −
L L
p p
The following boundary conditions can be used to determine the constants
A and B:
qV
pn ( x = xn ) = pn 0 ⋅ exp
kT
pn ( x → ∞ ) = pn 0
Diodes 39
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 40
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
dpn qD p pn 0 qV x − xn
j p ≈ j pD = − qD p = exp − 1 ⋅ exp −
dx L p kT LP
Diodes 41
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
j = j pD + jnD x=− x p
x = xn
where jpD and jnD are the hole and the electron diffusion current densities at the
boundaries.
Diodes 43
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
D p ni2 Dn ni2 V
j = q ⋅ + ⋅ exp − 1
V
L p N D Ln N A
th
Leading to the Shockley / ideal diode equation
Dp D V
I= qAni2 ⋅ + n ⋅ exp − 1
V
Ideal diode equation /
L N L N Shockley equation
p D n A th
Diodes 45
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
V Dp D
I = I S ⋅ exp − 1 IS = qAni2 ⋅ + n
L N
Vth p D Ln N A
Ideal diode equation / Saturation current
Shockley equation
Current voltage curve using a linear (a) and a semilog (b) plot.
Diodes 46
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Adding
Diodes 47
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
qV X n − x
pn ( x ) − pn 0 ≈ pn 0 ⋅ exp − 1 ⋅
kT X n − xn
∂p qD p pn 0 qV
j ≈ qD p n = ⋅ exp − 1
∂x x = xn X n − xn kT
The electron diffusion current can be ignored, because the hole
concentration is much higher due to the highly doped p-region.
Diodes 49
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Reverse Bias:
•Generation
•Avalanche Breakdown
Forward bias:
•Recombination
•High injection
•Series resistance and
bulk region effects Comparison of the ideal diode equation with a
non-ideal model of a diode.
Ref.: T. Fjeldly, T. Ytterdal, M. S. Shur, Introduction to device modeling and circuit simulation
Diodes 50
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 51
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
2ε s (Vbi − V ) 2ε s (Vbi − V )
xn = xp =
qN D (1 + N D N A ) qN A (1 + N D N A )
Diodes 52
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
ni
jGen = q ⋅ w ⋅
τ gen
Diodes 53
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 54
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 55
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 56
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
I I
d n = n 0 ⋅ (α n dx ) Multiplication currrent
q q
Based on this equation for the multiplication current the condition for breakdown
can be derived.
w
∫ αdx = 1
0
Breakdown condition
Diodes 57
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
FC w ε S FC2
VB = = Breakdown voltage
2 2qN B
Diodes 58
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
qV
jrec = jrecs exp Recombination current
2 kT
In reality traps levels may not only exist in the middle of the bandgap, which
leads to the following empirical equation:
qV
jrec = jrecs exp Recombination current
mr kT
So that the overall forward current can be described by:
qV qV
jF = js ⋅ exp +
recs
j ⋅ exp Forward bias current
kT mr kT
Diodes 59
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
qV
I F = I s _ eff ⋅ exp (Empirical) Forward bias current
nkT
where Is_eff is the effective saturation current and n is the ideality factor.
Therefore, the ideality factor varies between 1 and 2 depending on the material
properties and the applied bias voltage. If the ideality factor shifts towards 2 for
higher applied voltages we can conclude that the properties materials are
reduced (materials with higher defect density).
Diodes 60
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
p n + N D = nn + N A Charge neutrality
∆ p n + p n 0 + N D = ∆ nn + nn 0 + N A Charge neutrality
Carrier
concentration at
low-level injection
(a) and high-level
injection (b).
qV
p n nn = p n ⋅ ( N D + pn ) = ni2 ⋅ exp Diode under forward bias.
kT
qV qV
pn ≈ ni ⋅ exp I ∝ exp
2 kT 2 kT Ref.: G.W. Neudeck, The pn Junction diode
Diodes 62
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Both effects can be combined in a single series resistance. The I/V curve of a
diode can be described by:
V − IRS
I = I S ⋅ exp − 1
Vth
Diodes 63
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
For small series resistance the diode behaves like an ideal diode.
Influence of the series resistance on the I/V curve under forward bias.
Diodes 65
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Cd(V) Rseries
• Differential capacitance
+ -
Rd(V)
Internal diode
Small signal
equivalent circuit of a pn diode.
Diodes 66
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
V − IRS V − IRs
I = I S ⋅ exp − 1 + Diode current
Vth Rshunt
1 dI
= Gd = Differential resistance
Rd dV
Under reverse bias the differential admittance is
Diodes 69
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
εs εs
Cdep = A ⋅ = A⋅ Depletion capacitance of a
w x p + xn symmetric and abrupt pn-junction
where A is area of the diode, w is the width of the depletion region and εs is the
dielectric constant of the semiconductor. The width of the depletion region is the
sum of the depletion region in the n- and the p-region.
Diodes 70
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
2ε S N 1
xn = ⋅ (Vbi − V ) ⋅ D ⋅ Width of the space charge region
q N A N A + ND in the n-type region
2ε S N 1
xp = ⋅ (Vbi − V ) ⋅ A ⋅ Width of the space charge region
q ND N A + ND in the p-type region
w = xn + x p
2ε S N + ND
⋅ (Vbi − V ) ⋅ A
Width of the overall space
w= charge region
q N A ⋅ ND
Diodes 71
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
dQd qε s N A N D
Cdep = =A Depletion capacitance
dV 2 ⋅ ( N A + N D ) ⋅ (Vbi − V )
qε s N A N D 1 Cj
Cdep =A ⋅ =
2( N A + N D ) ⋅ Vbi 1 − V Vbi 1 − V Vbi
where Cj is the junction capacitor, which is independent of the applied
voltage. Therefore, the depletion capacitance of an abrupt pn-junction is
proportional to
1 1 − V Vbi
Diodes 72
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
C j0
Cdep = Depletion capacitance
(1 − V Vbi )
m
Diodes 73
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 74
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
τ pl =
L2p
⇒
( X n − xn )
2
= 2t
tr
Dp Dp
This leads to the following expression for the diffusion capacitance
IF
Cdif = Gd ttr = ttr Diffusion capacitance
Vth
Diodes 75
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
ε sVth ε sVth
L Dn = L Dp = Debye length
qN D qN A
Diodes 76
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
1
Cd =
1 (Cdep + Cdif ) + 1 Cd _ max
Differential capacitance
Depletion (Cdep),
diffusion (Cdif),
maximum diffusion
(Cd_max) and differential
capacitance (Cd).
Diodes 77
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 78
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 79
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
∆EC = q(χ 2 − χ1 )
∆EV = E g1 + qχ1 − (E g 2 + qχ 2 )
= ∆E g − ∆EC
Diodes 80
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
∆EC = q(χ 2 − χ1 )
∆EV = E g1 + qχ1 − (E g 2 + qχ 2 )
= ∆E g − ∆EC
Diodes 81
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 82
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
2ε1ε 2 N 2 ⋅ (Vbi − V )
x1 = Width of the depletion region in
qN1 ⋅ (ε1 N1 + ε 2 N 2 ) semiconductor 1
Diodes 83
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Schematic energy
diagram for the
electrons in a metal
and a semiconductor.
Diodes 84
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Schematic energy
diagram for the
electrons in a metal
and a semiconductor
including the vacuum
energy level.
Diodes 86
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 88
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 90
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
qV
I = I 0 ⋅ exp Schottky barrier under (Empirical)
nkT Forward bias
Diodes 91
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
Diodes 92
Introduction to Electronic Devices, Fall 2006, Dr. D. Knipp
References
Michael Shur, Introduction to Electronic Devices, John Wiley & Sons;
(January 1996).
(Price: US$100), Audience: under graduate students
Simon M. Sze, Semiconductor Devices, Physics and Technology, John
Wiley & Sons; 2nd Edition (2001).
(Price: US$115), Audience: under graduate students
R.F. Pierret, G.W. Neudeck, Modular Series on Solid State Devices,
Volumes in the Series: Semicondcutor Fundamentals, The pn junction
diode, The bipolar junction transistor, Field effect devices,
(Price: US$25 per book), Audience: under graduate students
T. Fjeldly, T. Ytterdal, M. S. Shur, Introduction to device
modeling and circuit simulation, Wiley (1997)
Diodes 93