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Test Procedure
Ten types of tap-connectors were evaluated in the thermal
cycling tests. The generic connector designs are illustrated in
Figure 1. They include four compression connectors, three
bolted connectors, two types of wedge-connectors and one
formed-wire connector. The compression devices comprised
the following types: the dieless sleeve, the barrel sleeve, the Figure 1. Schematics of tap-connectors evaluated in the
‘‘6’’ compression and the ‘‘H’’ compression connectors. The present investigation.
dieless sleeve and barrel sleeve connectors were identical ex-
cept that the former was installed using a dieless crimping tool.
The bolted connectors included a 2-bolt parallel-groove, a
bolt-driven wedge-connector and a bolt-vise connector. The For the thermal cycling tests, four connectors of each type were
wedge-connectors included two fired-wedge connectors ob- installed for a total of 40 connectors per loop, using 397.5
tained from two different manufacturers. The formed-wire kcmil AAC conductor. As mentioned earlier, separate loops
connector is a simple device that attaches main and tap conduc- were prepared using new/unused conductors, cleaned service-
tors directly to each other. This type of connector was included aged conductors and as-received/uncleaned service-aged
in the performance evaluations for the sake of completeness but conductors. The test loops were prepared in accordance with
is otherwise seldom used in power tap applications. Thus, of ANSI C119.4 test specifications3, using welded aluminum
the ten types of connectors subjected to evaluations, nine electrical equalizer plates to allow electrical resistance mea-
represented commonly used devices. surements across a connector after selected thermal cycling
intervals. To monitor the temperature excursions during thermal
All compression connectors are installed by crimping part of cycling a thermocouple was attached to the center of each
the connector over the conductors. In this investigation, the connector, as identified by the arrow location in Figure 1.
compression connectors were attached to conductors using the Finally, a 61 cm length of 397.5 kcmil AAC conductor,
crimping tool and the crimping procedures recommended by terminated at each end with an electrical equalizer plate, was
the connector manufacturers. Similarly, all bolted devices connected in series with each test loop to provide a reference
temperature during test-cycling. The reference temperature was
were installed using recommended procedures inclusive of the
measured at the mid point of the conductor length. All conduc-
recommended torque applied to the securing bolts.
tors were wire-brush cleaned before installation except those
that were to be tested in the as-received, uncleaned, service-
As shown in Figure 1, wedge-connectors consist of a metal
aged condition.
wedge located between the main and tap cables situated at
opposite ends of a C-shaped metal component. An electrical All loops were mechanically supported on wooden racks in an
connection is formed by inserting the wedge between the two open laboratory environment and were electrically energized
cables with sufficient force to cause plastic deformation of the using AC. The current was passed through the loops and cycled
C-member4. In the bolt-driven wedge-connector, the wedge is a maximum of 500 times, with identical current-on and current-
inserted by the driving action of a bolt. On the other hand, fired off intervals of 90 minutes. Temperature was measured once
wedge-connectors are installed using a tool actuated by a every three hours at the end of each current-on cycle. For loops
powder cartridge5. In this work, the wedge-connectors were that used new/unused conductors, the current was adjusted
installed using the appropriate tools in accordance with to raise the temperature of the reference 397.5 kcmil AAC
manufacturers’ specifications. conductor to a level 100°C above the ambient temperature in
Figure 2. Connector temperature reached after a maximum Figure 3. Connector temperature reached after a maximum
of 500 current cycles, using cleaned, new/unused 397.5 of 129 current cycles, using cleaned, service-aged 397.5
kcmil AAC conductor. kcmil AAC conductor.
Figure 7. Typical results of harsh-environment testing. (a) The wedge is installed using a tool of special design5 actuated
peak connector temperature generated during current cy- by a powder cartridge, as illustrated in Figure 8. Briefly, the
cling. (b) corresponding electrical resistance variations. tool consists of a breech carrying a cartridge at one end and a
sliding steel ram at the other. During connector installation the
The results of the FEA simulation indicate that only the C-body
undergoes plastic deformation. Stresses in the region of contact
interfaces are well within the elastic range. The total reaction
force generated by the C-member, when deflected by 0.48 mm
in the Y direction, was calculated as 16,170 N. This compares
favorably with the corresponding average force of 14,000 N
determined experimentally by the tests described in reference
to Figure 9.
The main conclusions drawn from the FEA calculations are that
* only the C-member undergoes plastic deformation,
Figure 15. Scanning electron micrograph of a wedge sur-
* this deformation occurs in areas situated away from the face after conductor installation. Note the many scratches at
interfaces with the conductors, the surface indicating disruption of the oxide layer. The micro-
* the relatively small mechanical stresses generated in the graph was obtained after the connector had been carefully
contact interfaces preclude significant conductor creep and cut into two parts along a direction parallel to the feed cable,
probably account in part for the superior performance of to allow removal of the wedge and conductors. Due to the
fired wedge-connectors during current cycling and harsh- penetration of the oxide layer, the metal-to-metal contact area
environment tests, in this aluminum-aluminum interface is high.
* although the conductors deform only elastically, the total
holding force generated by the C-member is high, i.e., of
the order of 14,000 N, thus producing a pull-out constrain- Figures 16(a) and 16(b) show typical depth profiles obtained by
ing force of 5,600 N on each conductor for a friction Auger Electron Spectroscopy (AES) of areas on the wedge surface
coefficient of 0.2. that were, respectively, abraded and unabraded. In the first case
ACKNOWLEDGEMENTS
The authors thank R. Heinrichs and P. Bjorkstedt of AMP In-
corporated for helpful discussions. The authors also thank M.L.
Rockfield and T. Nothelfer of PG&E for sharing their technical
expertise and providing assistance during the course of this
work.
REFERENCES
1. J.D. Sprecher and B. Royse, ‘‘Higher Loads Demand New
Tap-Connector Practices’’, Electrical World, 208, 48
(1994).
6. J.J. Schindler, R.T. Axon and R.S. Timsit, ‘‘Mechanical Mr. Sprecher received a Bachelor of Science degree in electri-
and Electrical Properties of Wedge-Connectors’’, Proc. cal engineering from the University of Wyoming and a Master
of Science degree in Engineering Management from Santa
41st IEEE/Holm Conference on Electrical Contacts, Mon-
Clara University, CA. He has worked at PG&E for 29 years and
treal, p. 1 (1995).
has held various department head positions in the last 26 years.
Mr. Sprecher has served as program manager for many of
7. P. Kohnke, ANSYS User’s Manual for Revision 5.1, Vol. IV, PG&E’s strategic initiative programs.
Theory (Swanson Analysis Systems, Inc., Sept. 30, 1994)
pp. 15.26-15.32. John J. Schindler was Senior Project Leader at AMP of
Canada Ltd. when the work reported here was done.
8. ANSYS User’s Manual for Revision 5.1, Volume III, Ele-
ments (Swanson Analysis Systems, Inc., Sept. 30, 1994) Barry Johnson is Manager of Product Development at AMP of
pp. 4.337-4.342. Canada Ltd.
9. T.R. Thomas, ed., Rough Surfaces (Longman, London, Mr. Johnson obtained a Bachelor of Science degree in Electri-
New York, 1982). cal Engineering from the University of Toronto, and a Master
of Business Administration from York University, Toronto,
10. R.S. Timsit, ‘‘The Connectibility Properties of Aluminum: Canada. He joined AMP of Canada Ltd. as a Product Engineer
in 1987. His career at AMP has focused largely on the design,
Contact Fundamentals’’, Canadian Electrical Association
development and testing of power and utility connectors.
Report 76-19, (1976).
Gino Menechella is Product Development Engineer at AMP
11. F.J. Esposto, C.-S. Zhang, P.R. Norton and R.S. Timsit, Canada Ltd.
‘‘Segregation of Mg to the Surface of an Al-Mg Single
Crystal Alloy and its Influence on the Initial Oxidation at Mr. Menechello graduated in mechanical engeneering from the
Room Temperature’’, Surf. Sci., 302, 109-120 (1994). University of Toronto. He joined the Product Engineering
Group of AMP Canada Ltd. in 1989 where he has been in-
12. J. Bloch, D. Bottomley, J.G. Mihaychuk, H.M. van Driel volved in design, development and testing of power utility
and R.S. Timsit, ‘‘Magnesium Segregation and its Effect connectors. He is an active participant in several North Ameri-
on the Oxidation Rate of the (111) Surface of Al-1.45 at% can standards committees associated with the performance
Mg’’, Surf. Sci., 322, 168-176 (1995). evaluation of power utility electrical connectors.