STH7500 Smart Test Head

• J750 loadboard and probe card compatible

• No new hardware need to be designed to improve time to market
• Compact size design for In-House ATE engineering and production test
• Small footprint and low power consumption
• Delivers industry’s lowest operation cost
• Integrated with PXI Universal instrument architecture – allowing easy scaling to
massive multi-site configurations for a broad range of Digital, Analog and RF
options aligned with all test needs
• NI Teststand, Microsoft Visual Stusio C++, NI Labview programming interface
• Optional TAAS EdgeOS and EdgeNC to stream DUT test data in real time and
provide AI/ML functions

DESCRITION
The STH7500 Smart Test Head is the only test head solution
for building In-House ATE to perform engineering and
production tests. It accepts J750 existing loadboard and
probe card without re-design a new one. The compact size
design, small footprint and low power consumption delivers
industry’s lowest operation cost. It integrates with your
existing PXI systems to provide multi-site configuration for a
broad range of Digital, Mixed signal and RF test
requirements. Optional TAAS AI/ML-enabled Edge
computing device with network data transfer capabilities.
FEATURES
The STH7500 is designed for In-House ATE solution for
engineering and production test. It provides the best
solution for fabless, IDM and testing houses. With the
incorporation of an integral, J750 compatible pogo receiver
interface and PXI system integration, the STH7500 offers
users an application ready test system which can be
upgraded or reconfigured at the test lab if needed. The
system is also supported with various software development
including NI Labview, Test Standard, Visual Studio C++, ATE
OI and more.

Confidential