Professional Documents
Culture Documents
Microstrip discontinuities
a a
RAMESH GARG & I. J. BAHL
a
Advanced Centre for Electronic Systems, Indian Institute of Technology, Kanpur, India
Version of record first published: 16 Jan 2007.
To cite this article: RAMESH GARG & I. J. BAHL (1978): Microstrip discontinuities, International Journal of Electronics, 45:1,
81-87
This article may be used for research, teaching, and private study purposes. Any substantial or systematic
reproduction, redistribution, reselling, loan, sub-licensing, systematic supply, or distribution in any form to
anyone is expressly forbidden.
The publisher does not give any warranty express or implied or make any representation that the contents
will be complete or accurate or up to date. The accuracy of any instructions, formulae, and drug doses should
be independently verified with primary sources. The publisher shall not be liable for any loss, actions, claims,
proceedings, demand, or costs or damages whatsoever or howsoever caused arising directly or indirectly in
connection with or arising out of the use of this material.
Microstrip discontinuities
RAMESH GARGt and I. J. BAHLt
1. Introduction
Discontinuities in microstrip have been extensively studied by a number
of authors. These include open ends, gaps, step in width, right-angle bend,
T and cross-junctions, etc. The abrupt change in the dimension of the strip
conductor of microstrip gives rise to a change in the electric and magnetic-
field distributions resulting in discontinuity. The altered electric-field distri-
bution gives rise to an excess capacitance and the changed magnetic-field
distribution can be written in terms of an equivalent inductance. The
capacitive component of the discontinuities has been analysed by Benedek
and Silvester (1972), Silvester and Benedek (1972, 1973, 1975), Farrar and
Adams (1971, 1972), Maeda (1972), Horton (1973) and Itoh et al. (1972).
The inductive component has been determined by Thomson and Gopinath
(1975) and Gopinath et al. (1976). Experimental measurement on the charac-
terization of discontinuities has been carried out by a number of investigators.
Some of the prominent ones are Napoli and Hughes (1971), Easter (1975),
Stephens and Easter (1971) and Groll and Weidmann (1975). The dynamic
behavionr of discontinuities has been carried out by Wolff and Menzel (1975)
and Mehran (1975 a, b). An excellent comparison of theoretical and experi-
mental results on discontinuities has been reported by Buontempo and
Reggiani (1975).
The numerical results available for the discontinuities are in the form of
graphs which have been plotted for some discrete values of parameters. The
method of interpolation between these discrete values is not given. Some
attempts were made in the past to provide closed-form expressions for some
of the discontinuities (Jain et al. 1972, Hammerstad 1975). Due to the
advent of new and improved results i t haa become necessary to update the
existing results and to include other discontinuities. This has been accom-
plished in this paper for the following discontinuities : open ends, gaps, step
in width, right-angle bend, T and cross-junctions.
We have taken the numerical results of Silvester and Benedek for curve-
fitting the discontinuity capacitance. The results of Gopinath et al. have been
chosen for inductance values. It has been shown by Easter (1975) that agree-
ment between the theoretical calculations (Benedek and Silvester 1972 a, b,
1973, 1975, l'homson and Gopinath 1975, Gopinat,h el al. 1976) and his
experimental results is reasonably good.
2. Closed-form expressions
The configuration of various cliscontinuit,ies and their equivalent circuits,
used in this paper, are shown in the figure. The closed-form expressions,
their range of validity and the maximum error with respect to numerical
results are discussed below.
2 . 2 . Gap
The study of gap in microstrip is useful in the design of d.c. blocks, end-
coupled filters, coupling element to resonators, etc. Its equivalent circuit is
a n-network, as shown in the figure (b). The shunt capacitance C, is the
result of the disorder in electric-field distribution a t the edge of the strip.
The series capacitance C,, arises from the coupling between the strip conductors
constituting the gap. Apparently, C,, should reduce with the increase in gap
spacing and for infinite spacing C,, should approach zero and C, should equal
end-capacitance for an open-ended line.
Microstrip discontinuities
T
OPEN E N 0
1 , I
T
i T
Downloaded by [University of South Dakota] at 06:08 23 April 2013
BEND
CROSS- f
JUNCTION L!.
where C,,,, and Cod, are the equivalent circuit parameters for the gap when
it is excited symmetrically and anti-symmetrically respectively. The closed-
form expressions for C,,,, (C,) and Codd (Go) for c,=9.6 and 0.5$ W/h$ 2
are given as
Downloaded by [University of South Dakota] at 06:08 23 April 2013
m,
W
(0'619 log W/h- 0.3853)
1.565 0.03
m e = (W/h)O,lB-1, K,=1.97-- W / h (for 0.3 < S/W < 1.0)
The value of C, and C, for other values of r, in the range 2.5 < c, < 15 can
be calculated by using the following scaling factors :
The above expressions give results which are accurate to within 7% for the
above-mentioned set of parameters.
A
' W2 - 12.6 log r,-
( p F / m ) = ( 1 0 . 1log r,+2.33) - 3.17
d(W , W2) W1
(for r, < 10, 1.5 < W 2 /W , < 3.5) (8a)
within 0 6 % .
The numerical results of Gopinath el al. (1976) have been used to obtain
the expression for AL,. It is given as
Equation ( 9 ) has an error of less than 5% for IV,/W, $ 5 and IV,/h= 1.0
2.5. T junction
The T junction is one of the most frequently encountered discontinuities.
Typical circuits using a T junction are stubs, branch-line couplers, T-R
switch, filters, etc. The equivalent circuit, as shown in the figure (e), consists
of series inductances AL, in the main line and AL, in the stub arm, and
junction capacitance CT. I n the design of stubs, the inductance AL, plays
a significant role in determining the stub length, while for branch-line couplers
and T-R switch both AL, and AL, are equally important.
86 R. Garg and I . J . Bahl
+ 0,0283 sin ( --
m 0 . 7 5 ~ ) Lw2
)