Ansi C37.50-R2000

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Copyright National Electrical Manufacturers Association

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ANSI C37.50-I989 (R1995,R2000)
AMERICAN NATIONAL STANDARD
Low-Voltage
AC Power Circuit
Breakers Used in Enclosures-
Test Procedures
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Secretariat
lnstitute of Electrical and Electronics Engineers

National Electrical Manufacturers Association
Approved 02/11/O0
American National Standards Institute, Inc.

S T D - N E M A C37.50-ENGL L989 m 6470247 0524173 3TT m
ANSI C37.50-1989 (R1995)
American Approval of an American National Standard requires verification by ANSI that the
requirements for due process, consensus, and other criteria for approval have been
National met bythe
standards
developer.
Standard Consensus is established when, in the judgment of the ANSI Board of Standards
Review, substantial agreement has been reached by directly and materially affected
interests. Substantial agreement means much more than a simple majority, but not
necessarily unanimity. Consensus requires thatall views and objections be
considered, and thata concerted effort be made toward their resolution.
The use of American National Standards is completely voluntary; their existence

does not in any respect preclude anyone, whether he has approved the standards
or not,from manufacturing, marketing, purchasing, or using products, processes, or
procedures not conforming to the standards.
The American National Standards Institute does not develop standards and will in
no circumstances give an interpretation of any American National Standard.
Moreover, no person shall have the right or authority to issue an interpretation
of an
American National Standard in the name of the American National Standards
Institute. Requests for interpretations shall be addressed to the secretariat or
sponsor whose name appears on the title page of this standard.
CAUTION NOTICE: This American National Standard may be revised or withdrawn

at any time. The procedures of the American National Standards Institute require
or withdraw this standard no later than five
that action be taken to reaffirm, revise,
years from the dateof approval. Purchasers of American National Standards may
receive current information on all standards by calling or writing
the American
National Standards Institute.
Published by
National Electrical Manufacturers Association

1300 N. 17th Street, Rosslyn, Virginia 22209
CopyrightO 2000 National Electrical Manufacturers Association
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All rights reserved.
No patt of this publication maybe reproduced in any
form, in an electronic retrieval
system or otherwise,
without prior written permission of the publisher.
Printed in the United States of America

Foreword (This Foreword is not part of American National Standard C3750-1989.)
This standardwas first published in 1973 as a replacement for Section9 (Test Require-
ments) of American National Standard forLow-Voltage AC Power Circuit Breakers (600-
Volt Insulation Class), ANSI C37.13-1969. In 1975 a supplement, American National
Standard Test Procedures forLow-Voltage AC Integrally Fused Power Circuit Breakers,
ANSI C37.50a-1975, was published as a replacement for Section8 (Test Requirements)
of ANSI C37.28-1969 and Section8 of ANSI C37.13a-1975. The contentsof ANSI
C37.50-1973 and C37.50a-1975 were combined in ANSI C37.50-1981 in accordance
with the IEEE Low-Voltage Switchgear Devices Subcommittee revision and combination
of ANSI C37.13-1969 andANSI C37.13a-1975 into ANSIIIEEE C37.13-1981. This
(1 989)revision of the 1981 standardwas developed t o clarify miscellaneous areas of
interpretation within the document.
This standard was originally written as a description of design test requirements andthe
performance criteria outlinedestablished the basis for certification of low voltage ac-
power circuit breakersused in enclosures for use in nonutility installations subject to
regulation by public authorities and similar agencies concerned withlaws, ordinances,
regulations, administrative orders,and similar instruments. It was established as a sepa-
rate document to facilitate its use by test laboratories and itstimely revision based on
experience. This revision supports that original proposition.
Experience has also indicated that there have been misinterpretations regarding the
testing requirements for fielddesign-change modifications. This has resulted in circuit
breaker modifications by manufacturers other than the original manufacturer without
sufficient testingto properly recertify themodified products. Any change to a basic
design should be coordinated with theoriginal manufacturer. Otherwise, the original
certifcation responsibility cannotbe continued.
This revision was prepared by the NEMA Power Switchgear Assemblies, Low-and
Medium-Voltage Power Circuit Breaker, Medium-Voltage Load-Interrupter Switches
Technical Committee,NEMA/SG/V, which has assumed responsibility for its maintenance.
Suggestions for improvement ofthisstandard will be welcome. They shouldbe sent to:
NationalElectricalManufacturersAssociation, 2101 L Street, W ,Washington, IX 20037.
The standard wasprocessed and approved for submittal t o ANSI by Accredited Standards
Committee on Power Switchgear, C37. Committee approvalof the standard doesnot nec-
essarily imply that all Committee members voted for its approval. At the time it approved
t h i s standard, the C37 Committeehad the following members:
W.E. Laubach, Chair

A. K. McCabe, Executive Vice-Chair, HV Standards
S.H. Telander, Executive Vice-Chair, LV Standards
D. L. Swindler, Executive ViceChair, IEC Activities
C. H. White, Secretary
M. B. Williams, Program Administrator
Organizations Represented Name of Representative

Association of Iron and Steel Engineers ...................... J. M. T han
Electric Lght and Power Group. . . . . . . . . . . . . . . . . . . . . . . . . . . .R. L. Capra (Chair)
M. J. Eckelkamp
K. D. Hendrix
J. H. Provanzana
D. E. Soffrin
D. T. Weston
G. R. Brandenberger (Alt)
T. E. Bru& (Alt)
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Organization Represented Name of Representative
Institute of Electrical and Electronics Engineers ................. H.W.Mikulecky, Chair
R. W. Haas
W. F. Hoenigmann
D. M. Larson
E.W. Schmunk
C. A. Schwable
S. C. Atkiison (Alt)
D. G. Kumbera (Alt)
National Electrical Manufacturers Association . . . . . . . . . . . . . . . . . . R. A. McMaster (Chair)
T. C. Burtnett
R. H. Miller
R.O. D. Whitt
H.L. Miller (Alt)
Tennessee Valley Authority ............................. R. B. Rotton
Testing Laboratory Group. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . L. Frier
W. T. O'Grady
R. W. Seelbach (Alt)
U.S. Department of Agriculture,
Rural ElectrZcation Administration. ...................... H. L. Bowles
U.S. Department of the A m y ,
Office of the Chief of Engineers ......................... W. M. Jones
US. Department of the Interior,
of Bureau Reclamation. .............................. J. W. Reif
U.S. Department of theNavy,
Naval Construction Battalion Center. ...................... R. L. Clark
Western Area PowerAdminstration. . . . . . . . . . . . . . . . . . . . . . . . . G. D. Birney
The Power Switchgear Assemblies, Low- and Medium-Voltage Circuit Breaker, Medium-
Voltage Load-InterrupterSwitches Technical Committee(NEMA/SG/V) of the NEMA
Switchgear Section, which developed this standard, had the following members:
S. H. Telander, Chair P. Clickner

C. White, Secretary N. Davies
H. Keating
W.Laubach
S. Roberts
T. Robirds
G. Sakats
D.Swindler
A. Tomeo
C. Welter
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STD.NEMA C37-50-ENGL L989 m b470247 052413b O09 m
Contents SECTION PAGE
1.General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.1 Sc0pe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.2 References to American National Standards . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2 . General Test Conditions and Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3 . Design Test Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3.2 Specific TestRequirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.3 TestConditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.4 Trip-Device Calibration Check Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3.5 AC Dielectric Withstand-Voltage Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.6 ContinuousCurrent Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.7 Overload Switching Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.8 Endurance Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.9 Short-circuitCurrent Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.10 Short-Time Current Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4 . Accessory Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.2 Alarm and Auxiliary Switches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.3 Undervoltage Trip Devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.4 Mechanical Accessory Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
5 . Treatment of Failures within Test Sequences ............................. 19
6 . Production Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.2 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.3 Control, Secondary Wiring, and Devices Check Test . . . . . . . . . . . . . . . . . . . . . 19
6.4 AC Dielectric Withstand Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.5 No-Load Operation Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.6 Open-Fuse Trip Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
7 . Production Monitoring and Product Retest Requirements . . . . . . . . . . . . . . . . . . . . . 20
7.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
7.2 Production Monitoring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
7.3 ProductRetestRequirements ................................... 20
Tables
Test Sequences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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Table 1 9
Table 2 Copper Conductors for Use in Continuous-Current Tests . . . . . . . . . . . . . . . . 11
Table 3 Short-circuit Current Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Table 4 Overload TestConditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Table 5 Endurance Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Table 6 Retest Series (Unfused Breakers) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Appendix Guide for Methods of Power-Factor Measurement
for Low-Voltage Test Circuits .................................. 23

-
S T D * N E M A C37-50-ENGL L989 b 4 7 0 2 4 7 0524377 T 4 5 m
American National Standard

for Switchgear -
Low-Voltage AC Power Circuit Breakers

Used in Enclosures -
Test Procedures
This standard constitutes Section 9of American National Standard forLow-Voltage AC Power Circuit Breakers Used
in Enclosures, ANSI/IEEE C37.13-1981.
1 . General ANSI/IEEE C37.09-1979 (R1989),Test Procedure for

AC High-Voltage Circuit Breakers Rated on a Symmet-
1.1 Scope. This standard covers the test procedures rical Current Basis
for enclosed low-voltage ac power circuit breakers as
follows: ANSI/IEEE C37.13-1981, Low-Voltage AC Power
Circuit BreakersUsed in Enclosures
(1) Stationary or drawout circuit breakers of two-
or three-pole construction, withone or more rated ANSI/IEEE C37.26-1972 (R1978), Guide for Methods
maximum voltages of 635 (600 for units incorporating of Power-Factor Measurement for Low-Voltage Induc-
fuses), 508, and 254 V for application on systemshav- tive Test Circuits(see Appendix)
ing nominalvoltages of 600,480, and 250 V.
(2) (a) Unfused circuit breakers ANSI/UL 198C-1986, High Interrupting-Capacity
(b) Fused circuit breakers Fueses, Current-Limiting Types
(3) Manually operated or power-operated circuit
breakers withor withoutelectromechanical or solid-
state trip devices.
2. General Test Conditions and Requirements
NOTE: In this standard the words “circuit breaker” shall mean
“enclosed low-voltage ac power circuit breaker,” either fused The conditions prevailing at the test site during tests
or unfused. The words ‘bfused circuit breaker’’ shall mean
a “circuit breaker without integral fuses” and the words “fused on circuit breakersshall be as stated in Section 2 of
circuit breaker” shall mean a “circuit breaker incorporating ANSI/IEEE C37.13-198 1, except that continuous-
current-limiting fuses as an integral part of the unit.” current testsand trip-device calibration checktests
shall be conducted at an ambient air temperature be-
1.2 Referenced American National Standards. This tween 10°C (50°F) and 40°C (104°F).
standard is intended for use with thefollowing Ameri-
can National Standards.When these standards are super-
seded by a revision approved by theAmerican National
3. Design Test Requirements
Standards Institute, Inc, therevision shall apply.
ANSI C37.16-1988, Switchgear - Low-Voltage Power 3.1 General. Design tests are performed on representa-
Circuit Breakers and AC Power Circuit Protectors - tive circuit breakers to demonstrate the capability of a
Preferred Ratings, Related Requirements, andAppli- particular frame size of a circuit breaker to meet its
cation Recommendations assigned ratings andto operate under service conditions
given in Section 2 of ANSI/IEEE C37.13-1981.
ANSI C37.17-1979 (R1988), TripDevices for AC and
Although the tests described in this standard cover
General-Purpose DC Low-Voltage Power Circuit
the performance of completelow-voltage power circuit
Breakers
breakers, it should be recognized that they may not
ANSIlIEEE 4-1982, Techniques forHigh-Voltage cover some of the component parts of circuit breakers
Testing such as wire, insulation materials, and the like. Addi-
7
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S T D * N E M A C37.50-ENGL 1989
AMERICAN NATIONAL STANDARDC37.50-1989
tional evaluation in accordance with applicable stan- 3.3 Test Conditions

dards covering these components maybe necessary. 3.3.1 Test Enclosure. All tests listed in 3.2, with
When major design changes (such as contact struc- the exception of the trip-device calibration check test
ture) are made, a complete sequence retest shall be and the ac dielectric withstand-voltage test,shall be
made. Minor design changes that affect only aspecific made with a drawout circuit breakerin its test enclo-
area shall be retested within theapplicable sequence sure.
(for example, an electrical operator change needs only The test enclosure for circuit breakersof a particular
an endurance test, or an arc chute change needs only frame size shall be the minimum-dimension single-unit
an interrupting test). enclosure with the smallest electricalspacings recom-
mended by the manufacturer and with enclosure ter-
3.2 Specific Test Requirements minals exposed to the ambient air. The manufacturer’s
3.2.1 Test Requirements for Unfused Circuit test enclosure description shall include minimum clear-
Breakers. Each circuit breaker frame size, including ance t o ground, location of ventilationopenings and
functional components as listed in Table 1 of ANSI/ their effective area, total enclosure dimensions, and
IEEE C37.13-1981 and accessory devices as givenin configuration of connections for the enclosure terminals.
Section 4 of this standard, with which it is equipped, 3.3.2 Circuit Breakers Using Only One Type of
shall successfully complete all of the following tests, Trip Device. Circuit breakers that are designed to be
utilizing the applicable sequences as outlined in Table l equipped only with solid-state, direct-acting trip de-
of this standard. vices (or only electromechanicaldevices) shall be com-
(1) Trip-device calibration check test (see 3.4) pletely tested in accordance with the test sequences
(2) AC dielectric withstand-voltage test (see 3.5) given in Table 1;that is, test sequencesI-IV for unfused
(3) Continuous-current test (see 3.6) circuit breakers andthe additional test sequence V for
(4) Overload switching test (see 3.7) fused circuit breakers.
(5) Endurance tests (see 3.8) 3.3.3 Circuit BreakersUsing More than One Type
(6) Short-circuit current tests (see 3.9) of Trip Device. Circuit breakers that are designed t o be
(7) Short-time current test (see 3.10) equipped with morethan one type of direct-acting trip
device, either electromechanical or solid-state, shallbe
NOTE: Where there is close similaritybetween frame size de- tested in accordance with the requirementsgiven in
s i g n s or where duplicate ratings (such as shortcircuit current)
exist, certain tests may be combined in order to obviate dupli- 3.3.3.1,3.3.3.2, and 3.3.3.3.
cate testing. 3.3.3.1 Each circuit-breaker frame size, with the
3.2.2 Test Requirementsfor Fused CircuitBreakers.
electromechanical trip device installed, shall be tested
The circuit breaker elementof the fused circuit breaker for all applicable tests in accordance with the test
shall have met the test requirements of3.2.1 for un- sequences I, II, III, and IV of Table 1.
fused circuit breakers.Each fused circuit breaker frame NOTE: Contingent upon review of construction differences
between circuit breakers using alternate tripping devices, test 3
size shall be equipped with direct-acting tripdevices of sequence II(c) may be omitted for the alternate configura-
with long-time-delay and instantaneous elements. The tions, based on successful testing of one of theconfigurations.
trip device may be either electromechanicalor solid-
3.3.3.2 Each circuit-breaker frame size, with the
state as required by the circuit-breakerdesign except
solid-state trip device installed, shall be tested in accor-
that when the circuit breakerdesign will accept either
type, the solid-state typeshall be used. When power dance with test sequenceII given in Table 1, except
and manually operated fused circuit breakers have that under (c), only short-circuit current test 3 needbe
performed.
storedenergy closing mechanisms that differ only in
When the basic design of the solid-state trip device
the means of supplying the energy to be stored, the
does not vary substantially between framesizes, the
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sequence of tests shall be performed as outlined on the

required tests just mentioned need be performed only
power-operated fused circuit breaker only.
When a manually operatedfused circuit breakeris
cn the 1600-and 3000/320Oampere frame sizes.
3.3.3.3 Each fused circuit breaker frame size
not essentiallythe same as the power-operated fused
shall be equipped with a solid-state tripdevice and shall
circuit breaker or does not have any power-operated
be tested in accordance with sequence Vof Table 1.
equivalent, all test sequences shall also be performed
on the manually operatedfused circuit breaker.
The fused circuit breakershall be equipped with the 3.4 TripDevice Calibration Check Test
functional components listed in Table 1 of ANSI/IEEE 3.4.1 Direct-Acting Overcurrent Trip Devices. Cali-
C37.13-1981 and shall complete all of the tests in bration check testsshall be made on direct-acting over-
sequence V of Table 1 of this standard. current trip devices, both before and after applicable

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STD.hJENA C37.50-ENGL L987 R b470247 0524179 ALB m

AMERICAN NATIONAL.STANDARD C37.50-1989
Table 1
Test Sequences
Sequence I (Power-Operated Cicuit Breaker with Selective Trip Device)
(a) TripDevice Calibration Check Test (3.4)
(b) AC Dielectric Withstand-VoltageTest (3.5)
(c) ContinuousCurrent Test (3.6)
(d) Overload Switchmg Test (3.7)
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(e) Short-circuit Current Tests (Table 3, test 8)

(r) TripDevice Calibration Check Test (3.4)
(g) AC Dielectric Withstand-VoltageTest (3.5)
Sequence II (Power-Operated Circuit Breaker with Dual Trip Deviœ)
(b) AC Dielectric Withstand-Voltage Test (3.5)
(c) ShortCircuit Current Tests (Table 3, tests 1, 2.3,4,5, and 6 )
(d) TripDevice Calibration Check Test (3.4)
(e) AC Dielectric Withstand-Voltage Test (3.5)
Sequence III (PowerQperated Circuit Breaker with Dual Trip Device)
(b) AC Dielectric Withstand-Voltage Test (3.5)
(c) Endurance Tests (3.8)
(d) ShortCicuit Current Tests (Table 3, test 7)
(e) TripDevice Calibration Check Test (3.4)
( f ) AC Dielectric Withstand-VoltageTest (35)
Sequenœ IV (Manually Operated Circuit Breaker without Direct-Acting
Trip Device, with Shunt Trip)
(a) AC Dielectric Withstand-Voltage Test (3.5)
(b) Short-Time Current Test (3.10)
(c) ShortCircuit Current Tests (Table 3, test 8)
(d) AC Dielectric Withstand-Voltage Test (35)
Sequence V (Power4perated Fused Circuit Breaker with Dual Trip Device)
(b) AC Dielectric Withstand-Voltage Test (35)
(c) ContinuousCurrent Test (3.6)
(d) ShortCimit Current Tests (Table 3, tests 9, 10, 11, and 12)
(e) TripDevice Calibration Check Test (3.4)
( f ) AC Dielectric Withstand-VoltageTest (35)
NOTES: at the same instant (t 3 ms) as fault-current inception. If the

(1) Power-Operated and Manually Operated Cicuit Breakers total clearing time is 83 ms or less, short-circuit current test 1
When power-operated and manually operated circuit breakers in sequence II (c) may be omitted. In the event that an inda
have stored-energy closing mechanismsthat differ only in the pendent manually operated circuit breaker is not manufac-
means of supplying the energy to be stored, the sequence of tured in a particular frame size, this test sequence is to beper-
tests shall be performed as outlined on the power-operated cir- formed on a power-operated circuit breaker.
cuit breaker only.
When a manually operated circuit breaker is not essentially (S) Sequence V. Use one new or rebuilt circuit breaker per
the same as thepower-operated circuit breaker or does not frame size to perform as many short-circuit duty cycles per set
have any power-operated equivalent, all test sequences shall of contacts as the manufacturer chooses. Contacts and arc
also be performed on the manually operated circuit breaker. chutes may be dressed 01cleaned between short-circuit tests
(d) provided that test (f) is performed before arc chutes are
(2) Number of Samples. Use one circuit breaker per frame dressed and cleaned. The manufacturer may rebuild or provide
size, either new or rebuilt, to complete each test sequence: I, a new circuit breaker after any short-circuit test provided that
III, and N. tests (e) and (r) are performed prior to rebuilding or replacing
the circuit breaker. All tripdevice calibration check tests and
(3) Sequence II. Use one new or rebuilt circuit breaker dielectric withstand tests shall be performed on each new or
per frame size to perform as many short-circuit duty cycles per rebuilt circuit breaker.
set of contacts as the manufacturer chooses. Contacts and arc
chutes may be dressed or cleaned between short-circuit tests (6) When a rating is to bechanged subsequent to complet-
(c), provided that test (e) is performed before arc chutes are ing sequences in Table 1 only those tests needed to demon-
dressed and cleaned. The manufacturer may rebuild or provide strate thechanged rating need to be performed. For example:
a new circuit breaker after any short-circuit test provided that Increased 635-V instantaneous short-circuit rating can be
tests (d) and (e) are performed prior to rebuilding or replacing demonstrated by performing Sequence II of Table 1with short-
the circuit breaker. All tripdevice calibration check tests and circuit current tests 1 and 4 of Table 3 at theincreased rating.
dielectric withstand tests shall be performed on each new or Increased shortcircuit current ratings with selective trip d a
rebuilt circuit breaker. vices can be demonstrated by performing sequence I at the in-
creased rating.
(4) Sequence IV. The direct-acting trip device is to be Increased short-time or nonautomatic short-circuit current
made inoperative or removed ifthis is the construction used ratings (both ratings shall b e of equal value) can be demon-
when the circuit breaker is supplied without a directacting strated by performing sequence IV at thedifferent current and
trip device. For test (c), the shunt trip circuit is to be energized voltage rating.
9

S T D * N E M A C37.50-ENGL 1989
test sequencesas givenin Table 1to demonstrate the sta- setting is applied to the tripdevice. The test current
bility of the tripdevices. Tests shall be conducted on shall be initiated and maintained at the testvalue for
the tripdevices usinga 60-Hz current supply ofsinu- the time necessary to establish performance criteria.
soidal wave shape at any appropriate voltage. Tests on In addition, each short-time-delay tripelement is
trip devices may be conducted with the tripdevice(s) to be tested io determine that it will not trip the cir-
removed from the circuitbreaker. cuit breaker when a currentless than the pickup setting
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Solid-state trip devices may betested as described in (minus the allowable tolerance)is applied. This current
3.4.1.lY3.4.1.2,and 3.4.1.3,or, alternatively, by apply- should not be maintained for longer than 1 second.
ing directly t o the solid-state tripdevices current or 3.4.1.4 Alternate Test Method. If the calibrating
voltage values equal to the output of the overcurrent test currents specified in3.4.1.1 and 3.4.1.3 are not
sensing device for the specified value of primary test readily available, test currents as low as 150% of the
current. The trip device shall function to open the cir- pickup setting may beused.
cuit breaker within thespecified time limits. When the
alternate method is employed, the overcurrentsensing 3.5 AC Dielectric Withstand-Voltage Test
device(s) shall be checked separatelyto verify that its 3.5.1 General. Dielectric withstand tests shall be
output is within the manufacturer’s standards. conducted on completely assembled circuit breakers,
The tripping times shall be in accordance with the including secondary control wiring, at voltages and
requirements ofANSI C37.17-1979, and the appro- under the conditions given in 3.5.2 and 3.53.
priate table depending upon whether the device is of All voltages shall be measured in accordance with
electromechanical or solid-state design, as well aswith ANSI/IEEE 4-1982. The potential shall be increased
the manufacturer’s time-current characteristiccurve gradually from zero so as to reach the required test
for the particular device. value in 5 to 10 seconds, and shall be held at that value
3.4.1.1 Long-TheDelay Trip Elements. The for 1 minute,except 3.5.2(4), which is to be a momen-
long-time-delay trip element of the direct-acting trip tary voltage test t o verify the solid-state control
device’s
device shall be set at the 100%long-time pickup setting integral surge-protection features.
and at themarked minimum time setting (band). The The test voltages shall be essentially sinusoidal and
element shall be tested once to determine the time of applied with a minimum crest value equal t o 1.414
operation by applying a test current equalto 150% times the specified values. The frequency of the test
300% of the 100% setting for electromechanical voltage shall be within *20% of the rated frequency
devices, and 200% of the 100%setting for solid-state of the circuit breakerbeing tested. If atest transformer
devices. The test current shall be initiated at the test of less than 500 VA is used, a suitable voltmeter shall
value or shall be increased from a lower value to the be provided to measure the applied output potential
test value as quickly as possible, but notlonger than directly.
5 seconds, and shall be maintained at the testvalue. 3.5.2 Test Voltages. The dielectric withstand test
3.4.1.2 Instantaneous Trip Elements.The in- voltage shall be not less than the following:
stantaneous trip elementof the direct-acting trip (1) 2200 V for the primary circuit of a new, com-
device shall be set at any marked pickup setting and pletely assembled circuit breaker.
shall be tested once t o determine that the element (2) 1500 V for secondary control wiring and con-
operates within theallowable tolerance. Compliance trol devices including current sensors and magnetic
with this requirementmay be determined by initiat- latch, except (3),(4), and (5).
ing the test current at approximately 70% of the in- (3) 1000 V for new motors.
stantaneous trip settingand quickly raising the current (4) 500 V momentary for control devices and cir-
at a uniform rate and as rapidly as consistent with an cuitry operating at 80 V ac rms (110 V dc) or less that
accurate determination of the trip value or by using a are not connected directly to theprimary circuit or ex-
symmetrical currentpulse of such magnitude and dura- ternal secondarycontrol circuits.
tion at bothlimits of the allowable tolerance that oper- (5) Twice rated voltage plus 1000 V for undervol-
ation of the trip element only within theallowable tage trip devices operating at avoltage above 250 V ac.
tolerance can be determined. (6) 60%of the values given in (l), (2), (3), (4), and
3.4.1.3 Short-TheDelay Trip Elements. The (5) after completionof any of the testsequences in
short-time-delaytrip element of the direct-acting trip Table 1.
device shall be set at any marked short-time-delay pick- 3.5.3 Points of Application of Test Voltage
up setting andat the marked maximum time setting 3.5.3.1 With the circuit breaker in theopen
(band) and shall be tested once to determine the time position, apply the primary-circuit test potential be-
of operation when a test current equalto 250% of that tween:
10

STDONEMA C37.50-ENGL 1989 m 6470247 0524LBL 476
AMENCAN NATIONAL STANDARD C37.50-1989
(1) The primary circuit, includingboth upper and Table 2

lower terminals, and metal partsthat are normally Copper Conductors for Use in
grounded. Continuowcurrent Tests
(2) The primary circuit and the secondary control
wiring. Bus Bars* per Terminal
Circuit-Breaker
(3) The upper terminals and lower terminals of the Frame Sie Size
primary circuit. (amperes) Quantity (inches)
For convenience, tests (1)and (2) above may be 600 1 1/4X 2 (6.35 X 50.8 mm)
combined by connecting secondary terminals to metal 800 1 1/4 x 3 (6.35 x 76.2 mm)
parts that are normally grounded. 1600 2 114 X 3 (6.35 X 76.2 mm)
2000 2 1/4 X 4 (6.35 X 101.6 mm)
3.5.3.2 With the circuit breakerin the closed 3 1/4X 5 (6.35 X 127.0 mm)
3000/3200
position, apply the primary-circuit test potentialbe- 4000 4 1/4X 5 (6.35 X 127.0 mm)
tween:
(1) The primary circuit and metal parts that are W e r e multiple bus bars are used, they are to bespaced 1/4
normally grounded. inch (6.35 mm) apart. The 4000-ampere group is to be two sets
of two bars with not more than 4 inches (101.6 mm) between
(2) The primary circuit and secondary control pair centers. When testing nonpreferred ratings above4000
wiring. amperes, the bus bar groups and sizes shouldbe adapted to the
(3) Primary terminals of different phases. particular terminal designs, and so may not necessarily have
1/4-iich spacings and may vary from4 inches maximum be-
For convenience, tests (1) and (2) above may be tween sets.
combined by connecting secondaryterminals to metal
parts that are normally grounded.
3.5.3.3 With the circuit breaker in either the a continuous-current rating equalto the fused circuit-
open or closed position, apply the secondary control breaker frame size.
wiring test potential between the secondary control 3.6.2 Duration of Test. The continuous-current
wiring terminals and metal parts thatare normally test shall be performed for such a period of time that
grounded. the temperature rise of the terminals of the test enclo-
If the circuit-breaker control circuitincludes a sure will not have increased by more than 1.O°C (1.8'F)
motor, the motormay be disconnected during the di- during each of two successive 30-minute intervalsas
electric withstand teston the control circuitand sub- indicated by three successive readings.If the tempera-
sequently tested at the potentials specified in 3.5.2(3). ture rise at the end of the second interval is equal to
Undervoltage trip devices operating at a potential the established limits and if the temperature rise has
above 250 V shall be tested separately as specified in increased since the previous reading, the test shall be
3.5.2(5). continued.
3.6.3 Method of Measuring Temperature of the Air
3.6 Continuous-Current Test Surrounding the Enclosure (Ambient). The temperature
3.6.1 General. The continuous-current test is per- of the air surrounding the enclosure (ambient) shallbe
formed to ensure that circuit breakerscan carry 100% determined by one thermometer or thermocouple hav-
of their rated continuous current at rated frequency ing a heat sink attached and placed approximately 12
within a test enclosure withoutexceeding the allow- inches (304.8mm) from the side surface of theenclo-
able temperature limits specified in Table 2 of ANSI/ sure and midway between the top and bottom of the
IEEE C37.13-1981. Circuit breakersshall be equipped enclosure.
with overcurrent trip devices havinga continuous- 3.6.4 Copper Conductors for Use in Continuous
current rating equal to the continuous-current rating Current Tests. Specifications for copper bus bars are
of the circuit-breaker frame size. The overcurrent trip given in Table 2.
device shall be prevented from opening thecircuit Configurations shall be vertical unless the design of
breaker. the test enclosure requires them to be horizontal.
See Section 4 for information concerning accessory The conductors connected to the enclosure terminals
devices. shall be a minimum of 4 feet (1.2 m) long.
Three-pole circuit breakersmay be tested using If the test enclosure terminal configuration isnot
either a three-phase circuit or single-phase circuit (all compatible with the number of bars listed in Table 2,
poles in series) at theoption of the manufacturer. then the test bussize and number may be changed to
The fused circuit breakershall be equipped with match the enclosure terminals, provided that the cross-
the minimum-rating fuse recommended by the manu- sectional area is not increased and a 1/4-inch minimum
facturer for use with an overcurrent trip device having thckness is used.
11
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---

AMERICAN NATIONAL STANDARD C37.50-1989
If continuous current ratings other than those listed The open-circuitvoltage of the supply circuit shall
in Table 2 are tested, determine the test bussize by be not less than 100% or more than 105% of the rated
interpolation using the nearest standard bus barsizes. maximum voltage of the circuit breaker, except that a
For example, thesize for a 2500-A breaker rating is higher voltage may be employed at theoption of the
found as follows: manufacturer. The maximum fault current available
at the circuit-breaker terminalsshall not exceed the
2000A: 2 X l / 4 X 4 = 2 i n 2
rated short-circuit currentof the circuit breaker.
3000 A: 3 X 1/4 X 5 = 3.75 in2 The closed-circuit voltage as measured at the test
terminals to which the supplyside of the circuit
2500 A: 2 + (3
= 2.875 in2 breaker is connected shall be not less than 65% of the
rated maximum voltage for which the circuit breaker
3.6.5 Method of Measuring Device Temperatures. is being tested.
Thermocouples shall be used to measure the tempera- The enclosure and the frame of the circuit breaker
tures on the circuit breaker. shall be insulated from grouna and shallbe connected
Thermocouples used for measuring the temperature through a 30-ampere fuse of adequate interrupting
of insulation shall be located on the current-carrying rating to the supply side of the phase judged least
member or other metal part at a pointas close as prac- likely to strike to the enclosure. As an alternate con-
tical to the accessible junction of the insulationand the figuration, at the manufacturer's option, the 30-ampere
current-carrying member or other metal part. fuse may be replaced by a minimum No. 10 AWG cop-
Thermocouples used for measuring the temperature per wire. The configuration may be changed at any
of the test enclosure terminal connectionsand other time during the test. Metallic contact between the cir-
conducting joints shall be located approximately 112 cuit-breaker frame and the enclosureshall be considered
inch (12.7 mm) from the terminal or otherconducting a connection.
joints on the current-carrying member. 3.7.3 Rate of Operation. Rate of operation shall be
Thermocouples may be used to determine the air not less than one operation every minute for a group of
temperature of the areas within the circuit breaker five operations. Groupsof operations maybe separated
where accessory devices are mounted as a means of by intervals of up to 15 minutesmaximum.
establishing the required ambient temperature for 3.7.4 Opening of Circuit Breaker. The circuit
separate accessory device testing. breaker shall be opened by a separatelyenergized shunt
Thermocouples shall be held in intimate contact trip device.
with the conductor surface bysuch methods as weld- 3.7.5 Duration of Current. The circuit breaker shall
ing, drilling andpeening, or cementing. carry the current for not less than one cycle before
3.6.6 Performance. Circuit breakers shall be con- opening for each operation.
sidered to have passed this test if the limits of observ- 3.7.6 Number of Operations. Circuit breakers in
able temperature rise specified in Table 2 of ANSIIIEEE each frame size shall make and break the circuit not
C37.13-1981 are not exceeded. less than the numberof times given in Table 3 of ANSI
C37.16-1988. For frame sizes not listed in Table 3, the
tests shall be conducted based on the values specified
3.7 Overload Switching Test for the next-lower preferredframe-size rating.
3.7.1 General. The overload switching test shall be
3.7.7 Performance. At the conclusion of this test,
performed at notless than the rated maximum voltage,
any rated control voltage, and at a current level no less the circuit breaker shall be in a condition to continue
than 600% of rated continuous current of the circuit- the applicable test sequence without repair or replace-
breaker frame size. ment of parts, and thegrounding means (eitherwire or
3.7.2 Test Circuit. The three-phase test circuitshall fuse) mentioned in 3.7.2 shall not have opened.
have a maximum power factor of 50% lagging with X 3.8 Endurance Tests
and R in series connection. The frequencyof the test 3.8.1 General. All endurance tests shall be per-
circuit shall be 60 Hz k 20%.The power factor shall be formed on the same circuit breaker to determine com-
determined in accordance withANSI/IEEE C37.26- pliance with specified mechanical and electrical require-
1972.' ments as givenin Table 4 of ANSI C37.16-1988. Ser-
vicing shall be permitted at the intervalsgiven in the
table.
'ANSIlEEE C37.26-1972has been withdrawn as an Ameri- For frame sizes not listed h Table 4, the testsshall
can National Standard (pending review or reaffirmation), but
is reproduced in the Appendix to aid in the completion of the be conducted based on thevalues specified for the next-
requirements of ANSI C3750-1989. lower preferred frame-size rating.
12
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---

3.8.1.1 Power-operated circuit breakersshdl be and enclosure shall be considered a connection.

subjected to all endurance tests. For circuit breakers forwhich the overload switch-
3.8.1.2 Manually operated circuit breakers having test is required, the 30-ampere fuse or alternate
ing storedenergy mechanisms that differ from the ground connection may be omitted.
power-operated equivalent only in the means of sup- 3.8.4 Mechanical Endurance Test. Themechanical
plying the energy to be stored need not be subjected endurance test shall be performed at no load and at
to endurance tests. any rated control voltage.
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
3.8.1.3 Manually operated circuit breakers,not 3.8.5 Performance. At the conclusion of these tests,
essentially the same as power-operated circuit breakers the circuit breakers shall be in a condition to continue
or not having any power-operated equivalent,shall be the applicable test sequence without repair or replace-
subjected to all endurance tests except that thenum- ment of parts that affect short-circuit performance,
ber of mechanical endurance operations performed charging of the mechanism, opening of the breaker,
shall be 50% of the number specified in Table 4 of or closing of the breaker, and the groundingmeans
ANSI C37.16-1988. (either wire or fuse) mentioned in 3.8.3.1 shall not
3.8.2 Rate of Operation. The rate of operation shall have opened.
be one operation every 2 minutes. At the option of the 3.9 Short-circuit Current Tests
manufacturer, the ratemay be increased. During each 3.9.1 General. Short-circuit current tests as de-
operation, the circuit breakershall remain closed for scribed in 3.9.2 and given in Table 3, shall be performed
no less than 116 second. on circuit breakers to determine their abilityto close,
Due to the large total numberof operations required, carry, and interrupt currents within theirratings, and
both electrical and mechanical endurance tests may be to demonstrate that fused breakers withmaximum-
conducted in groups at the optionof the manufacturer. rated fuses will provide short-circuit interruption at
However, at least one group shall consist of not leSS current values at and above ratings given for the600-V
than 120 electrical endurance operations. system nominal voltages given in Table 1 of ANSI
3.8.3 Electrical Endurance Test. The electrical en- C37.16-1988. Short-circuit current ratingsare given in
durance test shall be performed with not less than ANSI C37.16-1988, Tables1and 2 forunfused breakers
rated continuous current,at not less than rated maxi- and Table 17 for fused breakers. For frame sizes not
mum voltage, and at any rated controlvoltage. listed in these tables, theratings shall be based on the
3.8.3.1 Test Circuit. The test circuit shall have a n e x t - m e r preferred frame-size rating or the maxi-
maximum power factor of 85% lagging with the X and mum-preferred frame-size rating, whichever is less.
R in series connection. The frequencyof the test cir-
cuit shall be 60 Hz 2 20%.The power factor shall be de- 3.9.2 Types of Tests. Typesof short-circuit current
t e h e d in accordance withANSI/IEEE C37.26-1972.' tests are described in 3.9.2.1 through 3.9.2.4.
The open-circuitvoltage of the supply circuit shall 3.9.2.1 Single-phase tests with a line-to-line volt-
be not less than 10W0 or more than 105%of the rated age not less than each rated maximum voltzge applied
maximum voltage of the circuit breaker, exceptthat a across any pole and with theavailable rms symmetrical
higher voltagemay be employed at the option of the current not less than 87%of the applicable rated three-
manufacturer. The maximum fault current available at phase short-circuit current.See Table 3, tests 4,5,and,
the circuit-breaker terminalsshall not exceed the rated 6 for unfused breakers and test 9 for fused breakers.
short-circuit currentof the circuit breaker. 3.9.2.2 Three-phase tests with a line-to-line volt-
The closed-circuit voltage as measured at the test age not less than each ratedmaximum voltage and the
terminals to which the supplyside of the circuit breaker average of the available rms symmetrical components
is connected shall be not less than 80% of therated maxi- of the available three-phase currents notless than the
mum voltagefor which the circuit breaker is being tested. applicable rated short-circuit current.See Table 3, tests
The enclosure and the frame of circuit breakers for 1, 2 , 3 , 7 , and 8 for unfused breakers and test 10 for
which the overload switching test is not required shall fused breakers.
be insulated from ground and connectedthrough a 30- 3.9.2.3 For fused breakers, a three-phase test
ampere fuse of adequate interrupting ratingto the sup- with a line-to-line voltage not less than rated maximum
ply side of the phase judged least likely t o strike to voltage and the average of the available rrns symmetrical
the enclosure. As an alternate configuration, at the components of the available three-phase currents be-
manufacturer's option, the 30-ampere fuse may be re- tween 90% and 100% of the rated short-circuit current
placed by a minimum No. 10 AWG copper .wire. The values given for the 600-V system nominal voltages of
configuration may be changed at any time during the the circuit-breaker elementas listed in Table 1 of ANSI
test. Metallic contact between the circuit-breaker frame C37.16-1988. See test 11 of Table 3 of this standard.
13

Table 3 sured one-half cycle after inception of the currentflow

Short-circuit Current Tests in the test circuit.This current shall be calculated in ac-
cordance with ANSI/IEEE C37.09-1979.
Rated
Type of Test Maximum For three-phase circuits the symmetrical-current
Test Duty Cycle (No. of Phases) Voltage Current value shall be the average of the phase currents.
1 0-15 S-C-O 3 635 Il 3.9.3.2 The power factor of the test circuit for
2 0-15 S-c-o 3 125 08 unfused circuit breakersshall be 15% lagging or less
3 0-15 S-c-o 3 254 13 (X/Rratio or 6.6 or greater) withX and R in series
4 0-15 S-c-o 1 635 0.8711 connection. Any reactor used in the test circuitshall
5 0-15 S-c-o 508 0.8712
6 0-15 S-C-O 0.8713254 be an air-core reactor. The power factor for fusedcir-
7 0 635 Il cuit breakers shall be 20% lagging or less (X/Rratio of
8 0-15 S-C-O 635 18
4.9 or greater) withX and R in series connection.The
9 0 600
174 O00
10 O+t+C-O 200.000
600 power factor shal be determined in accordance with
11 o 600 See 3.9.2.3 ANSIlIEEE C37.26-1972.'
12 o 600 See 3.9.2.4
3.9.3.3 Transient current characteristicsof the
NOTES: test circuit shall be as given in 3.9.3.3.1 through
(1) O = opening operation; C-O = close-open; t = time neces- 3.9.3.3.4.
sary for the test procedures, including replacement of fuses and
resetting of the open-fuse trip device;ïl = rated short-circuit 3.9.3.3.1 For circuit breakers with instanta-
current at rated maximum voltage of 635 V;12= rated short- neous trip elements therms value of the alternating
circuit current at rated maximum voltage of 508 V ; I s = rated component of the current at the endof three cycles
short-circuit current at rated maximum voltage of 254 V (see
Table 1 of ANSI C37.16-1988;Ig = rated short-circuit current shall be not less than 90% of the value measured at
at rated maximum voltage of 635 V (see Table 2 of ANSI one-half cycle after initiation ofthe current.
C37.16-1988). 3.9.3.3.2 For unfused circuit breakers with-
(2) Tests 1 and 2 are to be performed with opposite termi- out ipstantaneous trip elements therms value of the
nals energized.(For example, if upper terminals are used for
test 1,then lower terminals are used for test 2, and vice versa.) alternating components of the current atthe end of
(3) Test 2 is to be performed in sequence II given in Table 1, 1/2 second shall be not less than 80% of the value mea-
using a circuit breaker equipped with the minimum-rated con-
tinuous-current electromechanical overcurrent trip device for
sured at one-half cycle after initiation of the current.
the circuit-breaker frame size being tested. 3.9.3.3.3 For the first opening operation
(4) Tests 4,5,and 6 may be performed on the same circuit (unfused circuit breakers) on eachduty cycle, the cur-
breaker, one test per pole. rent shall be initiated in the test circuit in such a man-
(5) For tests 9 and 10 the current is in r m s symmetrical
amperes. ner as to ensure that the peak current available would
(6) For tests 11 and 12 see the referenced sections of this be not less than 2.3 times the single-phase rms sym-
standard. metrical value for the single-phasetest and 2.3 times
(7) At the option of the manufacturer, test 11 may be
omitted if the total clearing time of the maximum fuse is equal the three-phase rms symmetrical value in one.phase
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
to or less than the minimum total clearing time of the circuit- for three-phase tests.
breaker element, at the short-circuit test current value. If the 3.9.3.3.4 For the first opening operation
circuit breaker's timecurrent characteristic data are for the
maximum clearing time, subtract 0.016 second to obtain a (fused circuit breakers) on eachduty cycle, the current
value for the minimum total clearing time of the circuitshall be initiated in the test circuit in such a manneras
breaker element. to ensure that the peak current available would be not
less than 2.16 times the single-phase rms symmetrical
3.9.2.4 For fused breakers, a three-phase test value for the single-phase test and 2.16 times the three-
with a liw-to-linevoltage not less than rated maximum phase r m s symmetrical value in one phase for three-
voltage and the average of the available rms symmetrical phase tests.
components of the available three-phase currents equal 3.9.3.4 The test-circuit voltage prior to the in-
to approximately twice (*lo%) the rated short-circuit ception of current flow shall be not less than the rated
current values given for the 600-Vsystem nominal volt- maximum voltage for the short-circuit current rating
ages of the circuit-breaker elementas listed in Table 1 being verified.
of ANSI C37.16-1988. See test 12 of Table 3 of this 3.9.3.5 The frequency of the test circuit shall be
standard. 60 HZ-+ 20%.
3.9.3 Test Circuit Conditions 3.9.3.6 On three-phase tests, either the power
3.9.3.1 The rms symmetricalcurrent that verifies source or fault connectionsshall be grounded, but not
the short-time or the short-circuit rating shall be deter- both.
mined by calibrating the test circuit with the circuit 3.9.3.7 The power-frequency recovery voltage
breaker short-circuited or omittedand shall be mea- shall be not less than 95% of the rated maximumvolt-
14

S T D - N E M A C37.50-ENGL 1989
age of the circuit breaker when testing with instanta- the opening test of a duty cycle the maximum current
neous trip elements. When testing circuit breakers with- offset shall not exist in the phase to which the fuse is
out instantaneous trip elements, therecovery voltage connected.
shall be not less than 80% of the rated maximum volt- 3.9.3.9 For single-phase testing, the test enclo-
age of the circuit breaker. sure and circuit-breaker frame shall be insulated from
The peak value of the power-frequency recovery ground and shall be connected through a 30-ampere
voltage within the first full half-cycle after clearing and fuse of adequate interrupting rating to the unused
for the next five successive p e a k s shall be not less than phase of the three-phase source. As an alternate con-
1.343 (fi X 0.95) times the rated maximum voltage of figuration, at the manufacturer’s option, the30-ampere
the circuit breaker for tests conducted with instanta- fuse may be replaced by a minimum No. 10 AWG c o p
neous tripelements; and not less than 1.131 (fi X per wire. The configuration may be changed at any
0.800) times the rated maximum voltage of the circuit time during the test.
breaker for tests conducted withoutinstantaneous trip 3.9.4 Circuit-BreakerDirect-Acting TripDevice
elements. Each of the peaks shall be displaced not Settings
more than ? 10 electrical degrees from the peaks of 3.9.4.1 Ratings and settings of unfused circuit-
the open-circuit voltage wave prior to current flow. breaker direct-acting trip devices that shall be used for
When making this comparison, it will be necessary all test sequences except sequence II(c), test 2, are spec-
to compensate for any frequencychange that may oc- ified in 3.9.4.1.1 and 3.9.4.1.2.
cur during the test.This may be done bycomparing 3.9.4.1.1 For test sequences II and III, circuit
the positions of the zero crossing points of thevoltage breakers shall be equipped with direct-acting trip de-
wave when referred t o a timing wave, before and after vices with long-time-delay and instantaneous elements.
the test. For tests performed at 60 Hz, the average of The continuous-current rating of the trip device shall
the instantaneous value of the recovery voltage of each be equal to the circuit-breaker frame size being tested.
of the first six half-cycles measured at the 45-degree The long-time-delay element’s pickup and time setting
and 135-degree points on thewave shall be not less may be set as desired by the manufacturer, but the
than 85% of ther m s value of the recovery voltage. The instantaneous settingshall be set at themarked maxi-
instantaneous value of therecovery voltage measured mum setting.
at the45-degree and 135degree points of each of the 3.9.4.1.2 For test sequence 1, circuit breakers
first six half-cycles shall be not less than 75% of the shall be equipped with direct-acting trip devices with
rms value of the recovery voltage. long-time-delay and short-time-delay trip elements. The
For tests performed at SO Hz (which are intended continuous-current rating of the tripdevices shall be
to establish a 60-Hzrating) the instantaneous value of equal to the circuit-breaker frame size being tested.
recovery voltage measured at the 45degree and 135- The long-timedelay element’s pickup and time setting
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
degree points of each of the first six half-cycles may be set as desired by the manufacturer, but the
shall be not less than 90% of the rms value of the short-timedelay elementshall be set at the marked
recovery voltage. maximum pickup setting andmaximum time setting.
If, in a test circuit that employs secondary closing, 3.9.4.2 Ratings and setting of unfused circuit-
there is no attenuation of phase displacement of the breaker direct-acting trip devices that shall be used for
first full cycle of the recovery-voltage wave when com- test sequence II(c), test 2, to demonstrate withstand-
pared with the open-circuit secondary-voltage wave ability of the minimum-rated tripdevices are specifEd
before current flows, the detailed measurement of the in 3.9.4.2.1 and 3.9.4.2.2.
recovery-voltage characteristics indicated in the preced- 3.9.4.2.1 The circuit breakers shall be
ing paragraphs is not required. equipped with direct-acting trip devices with long-time-
3.9.3.8 For three-phase testing, the enclosure delay and instantaneous tripelements. The continuous
and the frame of the circuit breaker shall be insulated rating of the trip device shall be the minimum continu-
from ground andshall be connected through a 30-am- ous-current rating at 480 V for the circuit-breaker
pere fuse of adequate interrupting rating to the line frame size being tested. The long-time-delay element’s
side of the phase judged least likely to strike to the pickup and time setting may be set as desired by the
enclosure. As an alternate configuration, at the manu- manufacturer, but the instantaneous element shall be
facturer’s option, the 30-ampere fuse may be replaced set at the marked maximum pickup setting.
by a minimum No. 10 AWG copper wire. The configu- 3.9.4.2.2 Where no change of the integral
ration may be changed at any time during the test. series conductor is involved, only the maximum rating
Metallic contact between the circuit breaker frame and of the frame size need be checked as stated in 3.9.4.1 .l.
the enclosure shall be considered a connection. During However, for solid-state trip devices, t h e lowest-ratio
15

current-transformer (sensor) shall be used. front of the circuit-breaker enclosure andshall be lo-
3.9.43 For solid-statetrip devices an additional cated 1 inch (25.4 mm) from, and parallel to, the front
interrupting test (not requiredto be part of Sequence I) door of the circuit-breakerenclosure. The cheesecloth
shall be conducted as indicated in Table 3, Test 8, with may be displaced as necessary to accommodate projec-
the lowest-ratio current-transformer (sensor), short time- tions such as handles.
delay element setat maximum pickup and maximum 3.9.8 Performance
time-delay, to demonstrate the thermal capabilityof the 3.9.8.1 The unfused circuit breaker at the con-
solid-state trip-device system with themaximum energy clusion of each test shall be in a condition to continue
input during Test Duty Cycle 8. If the actual energy the applicable test sequence without repair or replace-
input to thetrip device at another voltage rating is ment of parts, except as permitted in Note 3 of Table 1,
greater than 635 volts,the test shall be conducted at and the emission indicators shall not have ignited.
that rating. This test is requiredfor solid-state trip de- Scorching of the cheesecloth shall not be considered as
vice qualification and is in addition to Table l . After ignition. The groundingmeans (either wire or fuse)
this test the tripdevice shall be in a conditionto con- mentionedin 3.9.3.8 and 3.9.3.9 shallnot have opened.
tinue any test without repair or replacementparts. of 3.9.8.2 The fused circuit breaker at the conclu-
3.9.4.4 Fused circuit breakers shall be equipped sion of each test shall be in a conditionto complete the
with direct-acting tripdevices with long-time-delay and test sequence (tests (e) and ( f ) of sequence V, Table 1)
instantaneous elements. Thelong-time-delay element’s without repairs or replacement of parts other than
pickup and time settingmay be set as desired by the the primary fuses and open-fuse trip-device trigger fuses
manufacturer, but the instantaneous settingshall be set if applicable, exceptas stated in Note5 of Table l . The
at the marked maximum setting. The continuous- emission indicator shall not have ignited. Scorchingof
current rating of the trip device shall be equal to the the cheesecloth shall not be considered as ignition. The
fused circuit-breaker framesize being tested. The fuses grounding means (either wire or fuse) mentioned in
shall be the maximum current rating supplied by the 3.9.3.8 and 3.9.3.9 shall not have opened.
manufacturer for the circuit-breakerframe size. The open-fuse trip device shall have functioned t o
3.9.4.5 When a solid-statetrip device of new de-
open the fused circuit breaker. The fusesshall show no
sign is added to existing qualified circuit breakers, the evidence of arcing on their exterior orthat molten
following testsshall be conducted : metal wasexpelled. They shall not be cracked or charred
(1) Sequence I(e) with 1600- and 3000/3200-ampere
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
and shall not have damaged the supporting means.

frame sizes 3.9.9 Making Current. A circuit breaker’s making-
(2) Sequence II(c), Table 3, Test 2, with 1600- and current capability is demonstrated by its ability to pass
3000/3200ampere frame sizes the three-phase short-circuit current duty cycle test de-
(3) Maximum energy input as indicatedin 3.9.4.3 scribed in 3.9.5.
Each test may be conducted on aseparate tripde- 3.9.10 Latching Current. Latching-current capabil-
vice. After these tests the trip devices shall be in a con- ity (for a circuit breakernot equipped with an instanta-
dition to continue any test sequence withoutrepairs or neous phase trip element) is demonstratedby theabil-
replacement of parts. ity of the circuit breakert o pass the three-phase short-
3.9.5 Short-Circuit CurrentDuty Cycle. Each duty circuit current duty-cycle testdescribed in 3.9.5.
cycle shall consist of an opening operation followed by
an interval as specified in Table 3 followed by a close- 3.1O Short-Time Current Test
open operation. When short-time-delay trippingdevices 3.10.1 General. The short-time current test shall be
are used, the tripping on each openingshall be delayed performed to verify the ability of the circuit breakerto
by these trippingdevices, except when equipped with perform a short-time current duty cycle at its rated
instantaneous tripping elements effective only during available short-time current and any rated maximum
closing. voltage when applied without direct-acting trip devices
3.9.6 Test Procedure.The circuit breaker shall be (as described in Table 1, Note 4). See Table 2 of ANSI
inserted into the test circuit and the designated short- C37.16-1988. For frame sizes not listed in C37.16-
circuit current tests performed (see Tables 1 and 3). 1988, the ratings shall be based on the next-lower pre-
3.9.7 Emission Indicators for ShortCircuitCurrent ferred frame-size rating.
Tests. An indicator consisting of three layers of cheese- 3.10.2 Test Circuit. The test circuit shall conform
cloth shall be employed to detect any excessive emis- to the requirements given in 3.9.3. A three-pole circuit
sion of flame, hot gases, or molten particlesduring the breaker shall be tested using a three-phase circuit.
short-circuit current test. The cheesecloth shall be 3.10.3 Test Procedure. The circuit breaker shall be
loosely stretched on a frame at least as large as the inserted inthe test circuit,placed in the closed position,
16

AMENCAN NATIONAL STANDARD C37.50-1989
and tested in accordance with test (b) of sequence IV, (1) The maximum number ofswitches that can be
Table1. installed.
3.10.4 Short-Time Current Duty Cycle. The duty ( 2 ) Those switches that controlexternal circuits
cycle shall consist of two periods of 112 second each, and are normally closed when the circuit breaker is
with a 15-second interval of zero current between the closed carrying 50% of their rated continuous current.
112-second periods. (3) Those switches used in the internal control of a
3.10.5 Performance. After a short-time current circuit breaker energized and carrying normal continu-
duty cycle, the circuit breaker shall be in a condition to ous control currents.
continue the test sequence without repairs or replace- Rated continuous currentof a switch rated only in
ment of parts. inductive amperes is the highest rated inductive current
listed.
4.2.2 Overload Test. Alarm and auxiliary swiiches
4. Accessory Devices shall be subjected to an overload test of 50 operations.
4.1 General. Accessory devices, as contrasted with The rate of operation shall be in accordance with 3.7.3.
functional components, are those devices that are not For an alarm switch, this test shall also be proof of the
basically required for proper operation of a circuit endurance capability of the switch.The appropriate
breaker but perform a secondary or minor function as test(s) shall be selected from Table4.
an adjunct or refinement to theprimary function of 4.2.2.1 Performance. At the conclusion of the
the circuit breaker. overload test, an alarm switch shall be capable of mak-
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
Functional components are parts of the circuit ing and breaking the test circuit without repairs or re-
breaker required during sequential testing, as outlined placement of parts and shall withstand the dielectric
in 3.3.2, and successful operation of those components test.
throughout all the test sequences shall constitute suffi- An auxiliary switch shall be in a condition to con-
cient proof of theirdesign and that no further testing tinue with the endurance test.
of them is necessary. 4.2.3 Endurance Test - Auxiliary Switch. An auxil-
Available electrical accessory devices, including iary switch that has completed the overload test shall
alarm and auxiliary switches and undervoltage trip be subjectedto thenumber of electrical and mechanical
devices, shall be operationally tested. An accessory de- operations specified in 3.8.1 and at the rate of opera-
vice shall be mounted in its normal place on the circuit tion given in 3.8.2. The endurance test on theauxiliary
breaker during the applicable testing sequence when its’ witch may be performed in conjunction with the en-
installation or operation may affect the performance durance test performed on the circuit breaker. When
of the circuit breaker or if the circuit breaker may af- the design of an auxiliary switch is common to more
fect the operation of the accessory. Servicing of func- than one frame size of circuit breaker; the test may be
tional componentsand accessory devices by cleaning, made only in conjunction with the endurance test of
adjusting, or repositioning the contacts shall be per- the smallest frame size, at the option of the rnanufac-
mitted at theintervals specified in Table 4 of ANSI turer. The appropriate test(s) shall be selected from
C37.16-1988 and in accordance with themanufac- Table 5 .
4.2.3.1 Performance. At the conclusion of the
turer’s established maintenance procedures.
electrical and mechanical endurance test,the switch
4.2 Alarm and Auxiliary Switches shall be capable of making and breaking the test circuit
4.2.1 Temperature Test. An alarm or auxiliary without repairs or replacement of parts and shall with-
switch shall be subjected to a temperature test. With stand the dielectric test.
the circuit breaker and one alarm or auxiliary switch 4.3 Undervoltage Trip Devices
carrying not less than rated continuous current, the 4.3.1 General. An undervoltage trip device shall
switch shall not attain temperatures higher than those operate to open the circuit breaker at 30% or less of
permitted for the materials involved, in accordance the voltage ratings of its trip coil. It shall not operate
with Table2 of ANSI/IEEE C37.13-1981. As an alter- to open the circuit breaker at values above 60% of the
native test procedure at the manufacturer’s option, voltage ratings of its trip coil. However, an undervolt-
temperature tests may be conducted on alarmand age trip device may operate to open the circuit breaker
auxiliary switches separately mounted in an equivalent when the voltage across the trip coil is greater than
ambient temperature determined as described in 3.6.5. 30% but is 60% o r less of the voltage rating of its trip
When more than one alarm or auxiliary switch can be coil.
installed on a circuit breaker, the temperature test shall An electrically reset undervoltage trip device shall
be performed with: pick up, and a mechanically reset undervoltage trip
17

Table 4
Overload Test Conditions
Test Conditions
Type of Assigned
Contact-Interrupting Power Factor 'ILpe of Load
Rating Voltage Current (ad @c)
assigned
None
Maximum 150%continuous 75%-80%
Resistance
of applicable rating w4wt
range*
Noninductive Maximum 100%75%-80%
assigned
Resistance
of applicable rating laggingt
range*
Inductive Maximum 100%assigned 30%-35% Electromagnet
of applicable rating laggingt
range*
*See Table 23 of ANSI C37.16-1988.

t A t the option of the manufacturer, the power factor may be lower.
Table 5
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
Endurance Test Conditions

Test Conditions
Type of Assigned
Contact-Interrupting Power Factor Type of Load
Rating Voltage Current (ad (dc)
None assigned Rated* 100%continuous 75%-80% Resistance
rating wangt
Noninductive Rated* 100%assigned 75%-80% Resistance
rating laggingt
Inductive Rated* 100%assigned 45%-50% Electromagnet
rating
*See Table 23 of ANSI C37.16-1988.

?At the optionof the manufacturer, the power factor may be lower.
device shallseal in, at 85%of rated voltage. They may (1) Energize the undervoltage trip device to 85%of
also pick up and seal in at any lower voltage greater the rated voltage of the coil.
than 30% of the voltage rating of-its tripcoil. (2) Close the circuit breaker.
4.3.2 Temperature Test. With the undervoltage trip- (3) Reduce the voltage to 60% of the rated voltage
device coil energized at the maximum voltage of the of the coil. The circuit breakershall not open above
applicable range given inTable 23 of ANSI C37.16- this voltage.
1988, the maximum temperature rise of an undervolt- (4) Reduce voltage to 30% of the rated voltage of
age trip coil shall not be higher than that permitted in the coil, The circuit breaker shall open.
Table 2 of ANSI/IEEE C37.13-1981 for the materials 4.3.4 Endurance Test. An undervoltage trip device
involved, As an alternate test procedureat themanu- shall cause the circuit breakerto trip for 10%of the
facturer's option, temperature tests may be conducted electrical endurance operations andat the frequency of
on undervoltage trip devices separately mounted inan operation given in 3.8.2. The tests maybe performed
equivalent ambient temperature determined as de- as part of the endurance test on the circuit breaker.
scribed in 3.6.5. When so tested, the numberof tripping operationsto
4.3.3 Operation Test. To determine compliance be performed by the shunt trip device shall be reduced
with the requirements statedin 4.3.1 tests shall be con- t o 90%.
ducted as follows, starting withthe circuit breakerin At the conclusion of the endurance test, the under-
the tripped position. voltage trip device shall be capable of meeting the re-
18

STD*NEMA C37-50-ENGLL989 m 6470247 0524389 767
quirements given in 4.3.1. (3) Instantaneous-element pickup

With the electrical accessory device@) installed on (4) Time delay of long-time-delay element
the circuit breaker, the accessory device(s) shall meet (5) Time delay of short-time-delay element
the requirements for ac dielectric withstand voltage set (6) Ground-element pickup
forth in 3.5. (7) Time delay of the ground element
4.4 Mechanical Accessory Devices. When accessory 6.2.3 Undervoltage Trip Devices. Each undervoltage
devices are mechanical only, such as key interlocks, trip device shall be calibrated to ensure that it trips the
mechanical interlocks, etc, which are operated rela- circuit breaker when thevoltage drops to a value that
tively infrequently, normal production tests will be falls within therange of 30% to 60%of rated voltage.
the criteria for proving the operational characteristics A test shall be performed to determine that with 85%
of these devices. of ratedvoltage applied the undervoltage trip device
will permit the circuit breaker to be closed.
For an undervoltage trip device equipped with time
5 . Treatment of Failures within Test Sequences delay, the time delay shall also be checked to see that
it falls within the manufacturer’s specified limits and
Should failures occur during performance testing, they that thedevice resets if voltage recovers in the delay
should be evaluated and corrections should be made period.
before retesting is carried out. 6.3 Control, Secondary Wiring, and Devices Check Test.
A design change made to correct a test failure shall Control, secondary wiring, and devices shall be checked
be evaluated for its effect on anypreceding test in the to make sure that all connections have been made cor-
sequence, and retesting shall beperformed as necessary. rectly. Devices and relays, if used, shall be checked by
actual operation where feasible. Those circuits for
which operation isnot feasible shall bechecked for
6. Production Tests continuity.
6.4 AC Dielectic Withstand Test. The test shall be
6.1 General. All applicable production tests shall be
conducted in accordance with the requirements given
performed by the manufacturer on each circuit breaker
in 3.5. The duration of the test may be reduced to
at the factory after final assembly, except that calibra-
1 second if a voltage 20% greater than that specified in
tion may be performed on the individualdirect-acting
3.5.2 is used. It is recognized that other suitable test
trip-device subassembly prior to final assembly on the
terminal combinations than those stated in 3.5.3 may
circuit breaker. When the latteris carried out, the effect
be used. These shall be permitted to be used if all of
of the operating time of the circuit breaker shall be
the conditions represented by 3.5.3 have been tested.
recognized, and the complete assembly shall be tested
to ensure that the device will mechanically trip the cir- 6.5 No-Load Operation Test
cuit breaker. 6.5.1 Power-Operated Circuit Breakers. Power-
Production tests shall include the following: operated circuit breakers shall be given the following
(1) Calibration no-load operation tests:
(2) Control and secondary wiring and device check ( I ) Five closing and five opening operations at min-
test imum control voltage.
(3) Dielectric withstand test (2) Five closing, five opening, and five trip-free
(4) No-load operation test operations atmaximum control voltage.
(3) Two operations to check antipumping, which
6.2 Calibration shall be performed in the following manner:
6.2.1 General. Calibration shall include the proce- (a) Apply uninterrupted control power to the
dures given in 6.2.2 and 6.2.3, where applicable. closing circuit of the open circuitbreaker as the closing
6.2.2 Direct-Acting Trip Devices, Direct-acting trip signal.
devices shall be subjected to the following calibration, (b) Trip the circuit breaker. The circuitbreaker
where applicable, for conformance to published time- shall remain open until closing circuit power has been
current characteristic curves. Sinusoidal-wave-shape interrupted and then restored.
single-phase 60-HZcurrent at a convenient voltage shall If other devices, electrical or mechanical, are appli-
be used. The calibration may be performed in any order cable, they shall be checked for proper functioning.
deemed appropriate by the manufacturer: Such devices shall include key interlocks, mechanical
(1) Long-time-delay-element pickup interlocks, electrical interlocks, padlocking, racking
(2) Short-time-delayelement pickup mechanisms, etc.
19
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---

S T D e N E n A C 3 7 - 5 0 - E N G L L989
6.5.2 Manually Operated Circuit Breakers. Manu- 7.2 Production Monitoring. Monitoring of production
ally operated circuit breakersshall be given the follow- units shall be done quarterly or atshorter intervals at
ing no-load operation tests: the discretionof the certifyingagency to verify that
(1) Five closing and five opening operations. production tests are in accordance with the require-
(2) When shunt trip is used, a minimum of five ments given in Section 6 and that the product con-
openings using the shunt trip at the minimum control forms to the design that was certified.
voltage specified for the coil. 7.3 Product Retest Requirements, Retesting shall be
(3) Five trip-free operations. initiated at the end of specified periods measured from
If otherdevices, electrical or mechanical, are appli- time of certification. The periods are defined by elapsed
cable, they shall be checked for proper functioning. time intervals or by the number of units certified,
Such devices shall include key interlocks, padlocking, whichever comes first. However, not more than one
racking mechanisms, etc. test sequence shall be required to be started on the
same frame size in the same 12-month period.Not all
6.6 Open-Fuse Trip Device. The trip device shall be possible tests are required at the endof a period.The
tested mechanically or by application of proper volt- test sequences to be performed at the end of each
age to the device to establish positive tripping of the period are specified by numberin Table 6 and are de-
fused circuit breaker. scribed in Table l and the subsectionsto which it refers.
7.3.1 Product Retest Requirements (Fused Circuit
Breakers). When fused circuit breakerscovered in this
standard are composed of a circuit-breaker element
that is periodically retested in accordance with this
7. Production Monitoring and Product Retest standard and fusesthat are periodically retested and
Requirements are separately listedin, and comply with,ANSI/UL
198C-1986,no periodic retestingis required for the
7.1 General. Subsequent to certification of a circuit combination.
breaker in accordance with this standard, retest inter- Where the fuses are not separately listed in, and
vals shall be determined either by the total numberof may comply with,ANSI/UL 198C-1986,the test de-
circuit breakers produced to this standard orby the scribed in 3.2.2 of this standard shall be repeated at
elapsed time since completion of the immediately pre- 5-year intervals.
vious test schedule, whichever occurs sooner. When major design changes(such as contact struc-
7.1.1 General (Fused Cicuit Breakers). Subse- ture) are made,a complete sequence retest shall be per-
quent to certification of a fusedcircuit breaker in ac- formed. Minor designchanges that do not affect the
cordance with this standard, production unitsshall be performance ofthe combination and are proved by
monitored and retestingshall be carried out when de- separate testsof the circuit-breaker elementor fuse
sign changes are made. shall not require retestof the combination.
20
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---

STD NEMA m 6470247 0524371 315
Table 6
Retest Series (Unfused Breakers)
Total Total Total
(A) Units or Test (A) orUnits Test (A) Unitsor Test
Frame Size (B) Years Sequence (B) Years Sequence (B) Sequence
Years
600&800 (A) 8 800 I (A) 17 600 II* (A) 26 400 III& Ivf
Cs) 5 (B) 10 (B) 15
1600 & (A) 8500 I (A) 17 O00 II* (A) 25 500 III & Ivt
2 O00 (B) 5 (B) 10 (B) 15
3 000/3 200 (A) 2 100 I (A) 3 600 II* (A) 5 100 III&IVt
(B) 7 (B1 12 (B) 17
4 O00 (A) 830 I (A) 1350 SI* (A) 1870 III&Ivt
(B) 8 (B) 13 (B) 18
NOTES:
(1) After completion of test sequence III and N,the series shall be repeated.
(2) When major design changes (such as contact structure) are made, a complete sequence retest shall be
made. Minor design changesthat affect only a specific area shall be retested within the applicable sequence
(for example, electrical operator change needs only an endurance test, or arc chute change needsonly an
interrupting test).
(3) For frame sizes not listed in Table 6, the tests shall be conducted based on the values specifiedfor the
next-lower preferred frame size rating.
*Under sequence II(c), Table 1, conduct test 2 only.
tFor retest sequence III the shortcircuit opening test (d) is to be omitted if the condition of the circuit
breaker prior to the test is considered to be equivalent to that of the circuit breaker that successfuly met the
original certification requirements. It is important that adequate documentation be made origmdy of the
condition of the contactsand arc chutes by description, photographs, and measurements or by retention of
representative parts so that meaningful comparisons can be made.
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
21

L989
Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
ANSI/IEEE C37.26-1972 has been withdrawnas an American National Standard (pendingreview or reaffirmation),
but is reproduced in thisAppendix to aid in the completion of the requirements of ANSI C37.50-1989.
1. scope 3. Definitions
This standarddescribes three methodsused The definitions and terms contained in this
tomeasurethe power factor in 60 Hz in- document orin otherAmericanNational
ductive low-voltage (1000 volts and below) test Standards referred to in this document. are
circuits. Similar methods may apply at other not intended to embrace all legitimate mean-
frequencies. These methodsare: ings of the terms. They areapplicable only to
(1) Ratio method the subject treated in this standard.
(2) dc decrement method For additional definitions of terms used in
(3) Phase relationship method thisstandard, refer to AmericanNational
These preferred methodsareshown in Standard Definitions for Power Switchgear.
Table 1. C37.100-1972.
2. Purpose 4. Ratio Method

The purpose of this standard is to recom- 4.1 General. Devices such as current-limiting
mend methods of measuring power factor for fuses, fused circuit breakers, and similar fast
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
inductive test circuits by such means as os- clearing devices may have total interrupting
cillographic records. so thatthe preferred times of 0.5 cycle or lem. T h e ratio method
method, giving the greatest accuracy, is rec- permits measurement to be made within the
ommended for any particular circuit. operating time of these devices and generally
Table 1
Preferred Methoda of Power Factor Measurement
lot Low-Voltage Inductive Test Circuitr (See Note 1)
Test Circuit Intexruptiry Time

Current m on Teat Device circuit Power Factor
(rms syrnmatrid) (Cyekr) Above
0-30 Percent 30 Percent
0.5 or l e u Ratio Method
20 kA and below P h relationship
Above 0.5 dc Decrement method
Method
Above 20 kA
to 130 kA,
0.5 or l e u Method
Ratio -
inclusive Above 0.5 de Decrement
Method
Above 130 k A Any Ratio Method

(Note 2)
-
Notes:
(1) Table 1 applies to ringle-phase or three-phare t a r circuit. 60 Hz.
(2) For circuita above130 LA. where asymmetrical claing conditions mayjeopardize equipment
or inrtrumenktion.
the phase rclationrhip maybe used.
23
Copyright National Electrical Manufacturers Association Previous page is blank.

S T D O N E M A C37-50-ENGL 6470247 052LiL93 L98 m
APPENDIX
is not suitable on circuits with power factors current flow by determining the asymmetrical
above 30 percent. and symmetrical currents at this point. (See
Since this method requires closing the cir- Figs. 1 and 2, and Table 2.) Both total rms
cuit to produce maximum current asymmetry. asymmetrical current and rrns symmetrical
the resulting high mechanical forces on bus current are tobe measured and the ratio MA
supports and circuitcomponentsmay jeop- or M" calculated as follows: Construct the
ardize the test equipmentor instrumentation. envelope of the wave as shown in Fig. 1. The
When there is aquestion of jeopardy, the rms symmetrical and rms asymmetrical cur-
phase relationship method maybe used. rents shall be determined as indicated in the
equations of Fig. 1. Having determined these
4.2 Procedure for Determining Power Factor.
values, the M A for three-phase circuits and
The power factor is determined at an instant M M for single-phase circuits are determined
one-half cycle (based on the fundamenta1fre-
from the following:
quency timing wave) after the initiation of
Average of the rmsAsymmetrical Current in the Phases

Ratio M A (forThree-Phase Tests) Average of the rrns Symmetrical Current in the Phases
rrns Asymmetrical Current
Ratio M M (for Single-phase Tests) rms Symmetrical Current
Fig. 1
Ratio Method
A' = major ordinate I = r m s symmetrical = A' + B' = A
B' = minor ordinate current 2.828 2.828
A = peak-to-peak value of alternating component 1' = 1m aaymmetricd =
= A' + B' current
D = dc component = -
A' - A
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
2
~ I N l T l A f l O NOF FAULT
I/2 CYCLE POINT
CURRENTWAVE
T I M I N G WAVE
24

S T D - N E M A C37-50-ENGL L989 6‘470247 0524394 024
APPENDIX
Refer to Fig. 2 or Table 2 t o determine the 5.2 Procedure for Determining Power Factor.
power factor of the teat circuit. T h e power factor may be determined from the
curve of the dc component of theasym-
metrical current wave. See Fig. 3.
5.2.1 The equationfor the dc component is:
5. DC Decrement Method
id= ldO e - ( R t / L 1
5.1 General. This methodis recommended for where
circuits of 30 percent power factoror less
where the device to be tested interrupts a t a id = value of the dc component a t time
point in time more than one-half cycle from t
theinitiation of thecurrent. This method Id0 = initial value of the dc component
relates power factor to the rateof decay of the L/R = timeconstant of the circuit in
dc component. The current measuring meth- seconds
od used should not introduce distortion into t = timeinterval. in seconds, between
the dc component. Use noninductive shunts id and Ido
since current transformers may introduce Sig e = base of Napierian logarithms
nificant error. (2.7183)
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
Fig. 2
Multiplying Factor v8 Power Factor
MA = Average of the rms Asymmetrical Current in the Phases

Average of the rms Symmetrical Current in the Phases
MM = nns Asymmetrical Current

rms Symmetrical Current
SHORT-CIRCUITPOWERFACTOR,PERCENT
25

Multiplying Factors
Table 2
Multiplying Factor Factor Multiplying
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
Maximum Average Maxlmum Average
Stngle Phase Three Phase Smgle Phase Three Phase
Power rms Current rms
Current Power rms Current rms Current
Factor at ‘h Cycle at H Cycle
Factor at H Cycle at ‘h Cycle
(Curve M M ) (Curve MA) (Curve M M ) (Curve MA )
Percent XIR Ratio Percent X I R Ratio
O œ 1.732 1.394 29 3.3001 1.139 1 .O70

1 100.00 1.696 1.374 30 3.1798 1.130 1 .O66
2 49.993 1.665 1.355 31 3.0669 1.121 1.062
3 33.322 1.630 1.336 32 2.9608 1.113 1 .O57
4 24.979 1.598 1.318 33 2.8606 1.105 1 .O53
5 19.974 1.568 1.301 34 2.7660 1 .O98 1 .O49
6 16.623 1.540 1.285 35 2.6764 1.091 1 .O46
7 14.251 1.511 1.270 36 2.5916 1 .O84 1 .O43
8 12.460 1.485 1.256 37 2.5109 1.078 1.039
8.5 11.723 1.473 1.248 38 2.4341 1.073 1 .O36
9 11.066 1.460 1.241 39 2.3611 1 .O68 1 .O33
10 9.9501 1.436 1.229 40 2.2913 1.O62 1.031
11 9.0354 1.413 1.216 41 2.2246 1.057 1 .O28
12 8.2733 1.391 1.204 42 2.1608 1.053 1 .O26
13 7.6271 1.372 1.193 43 2.0996 1.O49 1 .O24
14 7.0721 1.350 1.182 44 2.0409 1.045 1 .o22

15 6.5912 1.330 1.171 45 1.9845 1.041 1.020
16 6.1695 1.312 1.161 46 1.9303 1 .o38 1.019
17 5.7967 1.294 1.152 47 1.8780 1.034 1.017
18 5.4649 1.277 1.143 48 1.8277 1.031 1.016
19 5.1672 1.262 1.135 49 1.7791 1 .o29 1.014
20 4.8990 1.247 1.127 50 1.7321 1 .O26 1.013
21 4.6557 1.232 1.119 55 1.5185 1.015 1.O08
22 4.4341 1.218 1.112 60 1.3333 1.o09 1.004
23 4.2313 1.205 1.105 65 1.1691 1.O04 1 .o02
24 4.0450 1.192 1.o99 70 1.0202 1.002 1.001
25 3.8730 1.181 1.093 75 0.88 19 1.O008 1 .O004
26 3.7138 1.170 1.087 80 0.7500 l .0002 1. O W 5
27 3.5661 1.159 1.081 85 0.6128 1.00004 1.00002
28 3.4286 1.149 1.075 100 0.0000 1.00000 l .00000
The time constant L / R can be ascertained 5.2.2 Determine the angle 9 from:
from the above formula as follows: = arctan ( w L / R )
(1) Measure the value of Id, at the time of where
current initiation and the value of id at any W = 2 r times the actualfrequency
other time t 5.23 Power Factor = cos 4
(2) Determine the value of e “Rr‘L by di-
viding id by fd,
(3) From a table of values of e“ determine 6. Phase Relationship Method
the value of - x corresponding to the ratio
i d/ r , o 6.1 General. Methods dependent upon asym-
(4) The value x then represents R t / L . from metricalvalues of current or the decay of
which L / R is determined the dc component generally are not suitable
26

S T D - N E M A C37-50-ENGL L989 m 6470247 05241196 9T7 m
APPENDIX
I I
Fig. 3
DC Decrement Method
for the measurement of power factor circuits teristics. The average of thephase power
above 30 percent where the dc component is factors is considered as the circuit power fac-
severely reduced. Therefore, the phase rela- tor. If the voltage wave is subject to measur-
tionship method, using current and voltage able phaseshift upon closure of the test circuit
waves, is the recommended method on circuits (as shown in Fig. 4). it is necessary ta deter-
having power factors over 30 percent. mine anduse the voltage zero (O) point which
would have existed (indicated dash line)if the
8.2 Procedure for Determining Power Factor.
phase shift in the voltage wave had not oc-
This method involves controlled closing and
curred.
determines the power factor of the test circuit
under essentially symmetrical closing condi-
tions.Constructsuitablestraight.parallel
wave envelope lines and a line midway be- 7 . Referencea
tween them to determine the "zero point" of
(11 NEMA Standard for Molded Case Circuit
the "true" axis of the currentwave at theend Breakers, Publication AB 1-1969.
of the first major half cycle. B y relating this
point to ihe open circuit voltage wave "zero [ 2 ) IEC Specification for Alternating-Cut-
point," the power factor can be determined rent Circuit Breakers. IEC Publication 56-
from the difference in electrical degrees be- 1-1971.
tween the "zero point" of the current at the
[3] Underwriters' Laboratories. Inc. High-Zn-
end of thefirstmajor half cycle andthe
terrupting-Capacity Fuses; Curren t-Limiting
corresponding "zero point"position of the
circuit voltage wave. For three-phasecircuits,
Turns, UL198.2-1970.
each phase current mustbe related to its own [a) Harder, J.E. A method of power factor
phase-to-neutralvoltage.Greateraccuracy measurement for circuit interrupter testing.
will result if each power factor is determined IEEE Transactions on Power Apparatus and
when the circuit is closed so that the phase Systems, vol PAS-87. no 10. Oct 1968. TP21
under consideration has symmetrical charac- PWR.
27
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---

-360 ELEETRI CAL DEGREES
-4 + 360 ELECTRICAL DEGREES
COS @ = POWER FACTOR
Fig. 4
Phase Relationship Method
[5) Farquhar, W. A.; Schall. G.E.:Plate, Presented at IEEE WinterPower Meeting

G. H. Comparison of Pourer Factor Measure- New York, N. Y., Jan 29.1968.68CP2O-PWR.
mentMethods. Presented atIEEE Winter 171 Withers, J. S. Ammeter-Voltmeter- Watt-
Power Meeting* New York* N*'** Jan 299 meterMethod of ~eterminingShort-circuit
1968.68CP168-PWR. Power Factor in a Short-Circuit Laboratory.
161 Brandt, T.F.,Jr. Test Procedure for De- Presented at IEEE WinterPower Meeting.
terminingShort-CircuitPowerFactor. New York, N.Y.,Jan29.1968,68CP82-PWR.
--`,`,````,,`,,,,,,`,,,,,```,`,-`-`,,`,,`,`,,`---
28


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Copyright National Electrical Manufacturers Association

AMERICAN NATIONAL STANDARD

lnstitute of Electrical and Electronics Engineers

American National Standards Institute, Inc.

Copyright National Electrical Manufacturers Association

ANSI C37.50-1989 (R1995)

The use of American National Standards is completely voluntary; their existence

CAUTION NOTICE: This American National Standard may be revised or withdrawn

National Electrical Manufacturers Association

CopyrightO 2000 National Electrical Manufacturers Association

Printed in the United States of America

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W.E. Laubach, Chair

Organizations Represented Name of Representative

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S. H. Telander, Chair P. Clickner

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Contents SECTION PAGE

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S T D * N E M A C37-50-ENGL L989 b 4 7 0 2 4 7 0524377 T 4 5 m

American National Standard

Low-Voltage AC Power Circuit Breakers

1 . General ANSI/IEEE C37.09-1979 (R1989),Test Procedure for

Copyright National Electrical Manufacturers Association

AMERICAN NATIONAL STANDARDC37.50-1989

tional evaluation in accordance with applicable stan- 3.3 Test Conditions

sequence of tests shall be performed as outlined on the

Copyright National Electrical Manufacturers Association

STD.hJENA C37.50-ENGL L987 R b470247 0524179 ALB m

(e) Short-circuit Current Tests (Table 3, test 8)

NOTES: at the same instant (t 3 ms) as fault-current inception. If the

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Copyright National Electrical Manufacturers Association

AMENCAN NATIONAL STANDARD C37.50-1989

(1) The primary circuit, includingboth upper and Table 2

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Copyright National Electrical Manufacturers Association

3.8.1.1 Power-operated circuit breakersshdl be and enclosure shall be considered a connection.

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Table 3 sured one-half cycle after inception of the currentflow

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and shall not have damaged the supporting means.

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*See Table 23 of ANSI C37.16-1988.

Endurance Test Conditions

*See Table 23 of ANSI C37.16-1988.

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AMERICAN NATIONAL STANDARD C37.50-1989

quirements given in 4.3.1. (3) Instantaneous-element pickup

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AMERICAN NATIONAL STANDARD C37.50-1989

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2. Purpose 4. Ratio Method

Test Circuit Intexruptiry Time

Above 130 k A Any Ratio Method

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Average of the rmsAsymmetrical Current in the Phases

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MA = Average of the rms Asymmetrical Current in the Phases