IEEE Std 31 4-1 971

IEEE Standards Report on

State of the Art of Measuring
Unbalanced Transmission-Line Impedance

Published by The Institute of Electrical and Electronics Engineers, Inc 3 4 5 East 47th Street, New York, NY 10017, USA

jlIlL’ .1 !

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 IEEE
Std 314-1971

IEEE Standards Report on

State of the Art of Measuring
UNBALANCED TRANSMISSION-LINE IMPEDANCE

Sponsored by the
Instrumentation and Measurement Group

' Copyright 1971 by

The Institute of Electrical and Electronics Engineers, Inc.

N o part of this publication may be reproduced in any form,

in an electronic retrieval system or otherwise,
without the prior written permission of the publisher.

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 ACKNOWLEDGMENT
The Institute wishes t o acknowledge its indebtedness t o those who have so freely given of their time and knowl-
edge and who have conducted experimental work on which many of the I E E E publications are based.
This publication was prepared by Subcommittee 14 of the Electromagnetic Measurement State+f-the-Art
Committee of the I E E E Instrumentation and Measurement Group, whose membership was:
R. L. Jesch, Chairman
It. W. Anderson It. C. Powell
T. E. MacKenzie L. 0. Sweet

Approved September 15,1970

IEEE Standards Committee

B. B. Barrow, Chairman S. I. Sherr, Secretary

E. C. Barnes J. A . Goetz G. Shapiro

F. K. Becker A. D. Hasley H. H. Smith
R. C. Cunningham A. R. Hileman S. V. Soanes
W. H. Devenish D. T. Michael F. G. Timmel
C. J. Esse1 E. H. Myers H. P. Westman
R. F. Estoppey F. M. Oberlander W. T. Wintringham
J. P. Fitzgerald A. M. Okun C. J. Wylie
D. C. Fleckenstein J. B. Owens W. N.Zippler
R. H. Rose

NOTICE
The IEEE will maintain this Report current with the state of the technology. Comments on this Report as well
as suggestions for additional material that should be included are invited. These should be addressed to:
Secretary
IEEE Standards Committee
The Institute of Electrical and Electronics Engineers, Inc.
345 East 47th Street
New York, N. Y. 10017.

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 IEEE Standards Report on
State of the Art of Measuring

UNBALANCED TRANSMISSION-LINE IMPEDANCE

1. INTRODUCTION cylindrical coaxial sybtcm propagating only a TEM nave.

This document is concerned with reporting the state Whenever the term “measurand” is used in this docu-
of the art of measuring impedance in distributed parameter ment, it is to be understood as a specific measurand.
coaxial waveguide systems, propagating a TEA1 wave. 2.4. Accuracy. “The quality of closeness to a value
Coaxial lines can be used from direct current to above specified in a stated reference frame; quantitatively ex-
40 gigahertz, but are widely utilized beginning U ith the pressed by uncertainty” (ad hoc task force of the Funda-
audio frequencies up through 18 gignhertz. Considered mental Electrical Standards Committee of the Instru-
are availsble accuracies from 50 megahertz to 1 G gigahertz, mentation and Measurement Group of the IEEE). The
general principles of measurement techniques, basic pre- uncertainty, or the limits of the errors, in this Report, is
cautions, and references to pertinent literature. I t is one based upon the sum of the systematic errors and the
of a series of such reports prepared under a program random errors. In general, the random errors are much
being carried out by the IEEE. The data in this Report smaller than the systematic errors. Systematic errors
have becn assembled by a special t a k group working include those errors associated with the measurement
in the field of radio-frequency impedance measurements. system while random errors are based upon the observed
The data have been organized into tables according to deviations of measurements from the mean of a set of
levels or echelons of accuracy ranging from that of the measurements. (Refer to U. S. Department of Commerce
national standard to that of the instruments used by Special Publication 300, Vol. 1, on Precision Measurement
the consumer. :tnd Calibration Statistical Concepts and Procedures,
2. DEFINITIONS OF TERMS February 1959, for a complete discussion of random and
systematic errors and uncertainties in calibration, pre-
The definitions of terms used in this document are not, cision, and accuracy.) Since the true value of a measurand
in all cases, approved IEEE definitions and are under- cannot be determined exactly, the measured or calculated
stood to apply only to this document. value of highest available accuracy may be assumed to
2.1. Impedance (of a linear constant-parameter system). be the true value or reference value. Hence, when an
At a terminal pair of a network, the ratio of the phasor instrument is calibrated in a given echelon, the measure-
equivalent of a steady-state sine-wave voltage to the ment made o n an instrument of a higher accuracy echelon
phasor equivalent of a steady-state sine-wave current. usually will be used as the reference value.
The real part is the resistance and the imaginary part
2.5. True Value (of a measured quantity). The actual
is thc reactance.
value of a precisely defined quantity under the conditions
2.2. Echelon. A specific level of accuracy of calibratioii existing during its measurement.
in a series of levels, the highest of which is represented by
an accepted national standards laboratory. There may 2.6. Error. “In any measurement of a particular quan-
be one or more auxiliary levels between two successive tity, the difference between the measurement concerned
echelons. The classification of accuracy levels into Eche- and the true value of the magnitude of this quantity,
lons I, 11, and 111 is shown in Table 1. talcen positive or negative accordingly as the measure-
ment is greater or less than the true value” (Churchill
2.3. Measurand. “The measurand is a physical quan- Eisenhart, “Realistic Evaluation of the Precision and
tity, property, or condition which is to be measured” Accuracy of Instrument Calibration Systems,” Journal
(quoted from American Kational Standard, C42.30, 1957, of Research of the National Bureau of Standards, Vol.
“Definitions of Electrical Terms,” Group 30, Instruments, 67C, 50.2, .ipril-June 1963).
Xlcters, and Meter Testing, page 5). A4measurand, such
as impedance, can be used in a very general sense, being 2.7. Systematic Error. The inherent bias (offset) of a
defined as the ratio of two electrical quantities. In practice, measurement process or of one of its components.
however, it is usually helpful to consider a specific meas- 2.8. Random Error. A component of error whose mag-
urand, as restricted to a specific range of parameters, nitude and direction vary in a random manner in a
generally requiring individual measuring methods, tech- sequence of measurements made under nominally identical
niques, or instruments. This document is concerned only conditions.
i t ith impedance. Further, this document is concerned
only with impedance determined a t a defined reference 2.9. Fractional Error. The magnitude of the ratio of
plane lying perpendicular to the axis of a uniform circular the error to the true value.

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 TABLE 1
ECHELON OF LEVELSOF ACCURACY
DESIGNATIONS OF CAL~BR.ATION

Accuracy of Calibration Typical Agencies of Facilities Reference Standards Used or

Designation Description Operating at This Level
Echelon I Highest available within a Specialized laboratories including
country government agencies. In the U.S.A.,
the National Bureau of Standardsfor
electrical quantities as well as a
number of other quantities. I n
certain areas NBS is legally respon-
sible for maintenance of National
Standards.
Echelon I1 Intermediate level, which Standards laboratories of universities,
may be divided into sub- armed services, industrial research
levels and development laboratories,
standards laboratories, and standard-
ization laboratories of instrument
manufacturers.
Echelon 111 Levels a t which measuring 1) Production-line test departments
instruments are calibrated and service departmenh of instru-
prior to use by ultimate ment manufacturers.
consrimer. 2 ) Inst,rument repair and calibration
facilities of instrument users.
Maintained at This Level
Direct reference standards may be
compared against other quantities
and parameters such as frequency,
length, mass, and time for which
standards exist.
Standards calibrated by an agency
operating a t the Echelon I level of
accuracy. Other standards of reduced
accuracy may be obtained by suc-
cessive calibrations within the
Echelon I1 level of accuracy. The
number of permissible sublevels is
limited by the reduction in overall
accuracy resulting a t each successive
step. The lowest accuracy must not
be less than the accuracy required in
Echelon I11 operations.
Standards calibrated with an accuracy
obtained at the Echelon I1 level or
one of the Echelon I1 sublevels.
The reference standard used for the
calibration should be cited in a
calibration cert.ificate.

2.10. Precision (of a measurement process). “The qual- trical length, reflection coefficients, scattering coefficients,
ity of coherence or repeatability of measurement data, and other parameters may be referred.
customarily expressed in terms of the standard deviation
of the extended set of measurement results from a well- 3. TABLES OF ACCURACIES
defined (adequately specified) measurement process in a I n the frequency range of interest, most measurements
state of statistical control. The standard deviation of the of impedance in coaxial lines are based on a sampling of
conceptual population is approximated by the standard the standing or traveling waves on the transmission line
deviation of an extended set of actual measurements” to determine a ratio. The instruments of concern deter-
(ad hoc task force of the Fundamental Electrical Standards mine this ratio most directly in terms of reflection coeffi-
Committee of the Instrumentation and Measurement cient or voltage standing wave ratio, which are often the
Group of the IEEE). measurands of interest. Estimated limits of error in reflec-
tion coefficient are presented in this document in both
2.11. Precision Connector. A connector that has the
magnitude and phase.
property of making connections with a high degree of
Tables 2, 3, and 4 list presently attainable ranges of
repeatability between conductors of transmission lines
accuracies for each of the three echelons, respectively, for
and waveguides without introducing significant reflections,
reflection coefficient over designated spreads of reflection
loss, or leakage.
coefficient magnitude for particular frequencies. Included
Note: Specifications for precision coaxial connectors are contained also is available information on phase angle of reflection
both in IEEE Standards Publication No. 287 and the September
1968 issue of I E E E Transactions on Instrumentation and Measure- coefficient. The frequencies were chosen to show best the
ment. variation of accuracy with frequency. These accuracies
are based upon the best combined information and judg-
2.12. Reference Air Line. A uniform section of air-die- ment of the members of the Subcommittee on Impedance,
lectric transmission line of accurately defined character- Unbalanced Transmission Lines. The main measurement
istic impedance, used as a standard of impedance. techniques used in determining the attainable ranges of
2.13. Standard. A device having stable and precisely accuracies were bridge techniques, slotted line techniques,
defined and determined characteristics, which map be and modified reflectometer techniques [51]. While other
used as a reference. techniques are also used [17], [34], [49], these three tech-
niques appear to yield the best accuracy for the various
2.14. Reference Plane. A plane perpendicular to the echelons. Varying degrees of accuracy may also exist
direction of propagation in a uniform waveguide or trans- between techniques and frequencies as shown in Table 2
mission line, to which measurements of impedance, elec- where the measurements made at 500 megahertz bv

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 TABLE 2
ACCURACIES ATTAINABLE BY ECHELON I AGEXCIES
These facilities calibrate the most accurate national standards available in the U. S.A. The following table lists ranges of limits of frac-
tional error in magnitude of reflection coeficient and limits of error in phase angle in degrees. These uncertainties are normally available in
standards passed on to Echelon I1 agencies. Some of the measurements were made with respect to reference air lines whose mechanical
dimensions were known to within 1.27 micrometers or less for the inner conductor, and 0.64 micrometer or less for the outer conductor.
~~
~
._______
-- ~ _ ~
_ ~ ~ ~
Magnitude of Reflection
Coefficient
I rl Frequency, gigahert,z
0.03 0.2 0.5 1 2 4 S 16
-
dlngnitude Error
0 0,0005 0.001 0.003 0.0003 0.0003 0.0003 0.0003 0.006
0.1 0.0005 0.001 0.003 0.0004 0.0004 0.0004 0.0004 0.007
0.2 0.0005 0.001 0.004 0.0006 0.0006 0.0006 0.0006 0.008
0 ..j 0 . 0004 0.0008 0.005 0,001 0.001 0.001 0.001 0.009
1.0 0,0004 0.0004 0.001 0.0003 0.000:3 0,0003 0.0003 0.0005
_-__
ghasc Error
0.1 0.1" 0.1" 1.2" 0.5 0.2" 0.3" 0.9" 6.0"
0.2 O.1° 0.1" 0.6" 0.2" 0.2" 0.2" 0.5" 4.0O
0.5 0.1" O.1° 0.3" 0.1" O.1° 0.2" 0.2" 2.0"
1.0 O.1° 0.1" 0.2" O.1° 0.1" O.1° 0.lo 0.5"

Magnitude of Reflection
Coefficient Frequency, gigahertz

Jlagnitirtlt Error
0 0 004 0 005 0 003 0 002 0 0009 0.000!~ 0.0012 0.006
0 1 0.005 0 006 0 00.5 0 002 0 00% 0.002 0.002 0.007
0 2 0 005 0 006 0 006 0 003 0 003 0.003 0.003 0.008
0 5 ~ 0.006 0 007 0 007 0 00.5 0 004 0.004 0.005 0.009
I O 0 003 0 003 0 003 0 002 0 002 0.002 0.003 0.010

0.1 ~ 2.0" 0.6" 1.0" 6.0"

0.2 ~ 1.2" 0.4O 0.3" 0.3" 0.7" 4.0"
0.5 0.5" 0.3: 0.3O 0.3O 0.4" 2.0"
1.0 ~ 0.3O 0.3" 0.2O 0.2 0.3O 0.3" 0.3" 1.8"

TABLE 4
I W ECIIELUS
hccaic L C I E S ATT.\IN.WLC I11 A G I . ~ C I E S
These areas calibrate equipment to be issued to lilt iriinle consumers, in terms of standards obtained from Echelon I1 agencies. This equip-
ment is used in production, maintenance, and repair. The following table lists ranges of limits of fractional error in magnitude of reflection
coefiicient and limits of error in phase angle in degrees.
~~~
~
.~
_______________
~ ~~~
~ ~- -~ ~ ~~
~.~~~

llagnit ude of Reflection

Coeliicient i Freqiieiicy, gigahertz
rl 1 0.05 0.2 0 . .i 1 2 4 S 16

0
0.1
0.3
0.5
1 .0
'
~

i
0.010
0,008
0.009
0 . 010
0.007
0 . 008
0.008
0 . OO!)
0.010
0 . (107
0.006
0.00s
0,010
0 . 0 1.i
0 .00.5
.Ilayniiiitlc
0.004
0 .00.i
0 . OO!)
0 . 0 1 .i
0 . 005
Phasc Error
Error
0,004
0.00.;
0 . OO!)
0.01.;
0 . 00.i
0.004
0.005
0.010
0.01.5
0.003
0.00.5
0.008
0.012
0.017
0.007
0.020
0.021
0.0Z
0,030
0.012

5.0° .i.0" 4.0" .,

.>..I
- 0
:: . O " . 3"
:i .i.0" 16.0"
4.5" 4.5" :3 . 0 2.0" 1 ..io 2.0" 3.3" 10.0"
1.0" 1 .O" 0 . .i 0.6" O.SO 1 .,jo 3.0" 6.5"
1 .0 0.8" 0.8" o.2° O..i" 0.i" 1.4" 2.5O 6.0"
i

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 slotted line techniques, for example, did not give the can often be made available when expenditure of the
same degree of accuracy that was obtained a t one gigahertz necessary time and effort and higher cost can be justified.
by reflectometer techniques. The availability of instruments stable enough to maintain
The figures in the tables should be considered as their accuracy with time and handling must be considered
representing the boundaries of overlapping accuracy also. I n the case of the measurands covered here, higher
ranges of groups of instruments measured under similar accuracies than those listed in Echelon I levels are at
conditions of frequency and reflection coefficient magni- present available, for example, a t the National Bureau of
tude, and not as applying to individual instruments. Standards of the U. S. A. for many of the ranges listed.
The accuracies for reflection coefficient are given for These higher accuracy calibrations involve additional
absolute magnitude and phase angle. It should be rec- effort, time, and cost already referred to. Investigation
ognized that the magnitude errors are dependent to some may also reveal the availability of higher accuracy, and of
extent on the phase angle of the reflection coefficient. At sufficiently stable monitors, in other research laboratories
this time equations relating the dependence of the un- where there has been need to develop such facilities for
certainty of Irl to phase have not been sufficiently ana- special applications. Instances will be known by in-
lyzed to yield analytical predictions. dividuals working in the field, such as the members of the
With the increased use of all coaxial components in the special Task Committee 25.1.14 listed a t the beginning of
past several years, interest has been steadily growing in this Report. When design and development engineers
the field of miniature coaxial components employing con- become familiar with the contents of the tables included
nectors of the 3.5-millimeter size. Once the standards and in this Report, it is hoped that they will be encouraged to
systems employing these connectors have been sufficiently point out to appropriate committees and organizations
analyzed, the tables of accuracy will need to be expanded their anticipated needs for greater accuracy. When urgent
to include values above 16 gigahertz. needs for higher accuracies are known, there may be
opportunities to develop and establish the facilities in
4. USE OF TABLES OF ACCURACIES government or private laboratories.
Tables 2, 3, and 4 contain up-to-date accuracy in-
formation that should be useful for various purposes. The
accuracy levels corresponding to Echelon I11 probably 5. STANDARDS AND CALIBRATION PROCEDURES
would be of most interest to a designer of coaxial devicc s 5.1. Description of Reference Standards. Present tech-
and components to be manufactured in large quantitie:. niques for coaxial-transmission-line impedance measure-
The higher levels of accuracy of Echelons I and I1 may ments consist of determinations of phase shift and of ratio,
be of interest to one concerned with the development and and require reference to known impedance standards.
construction of a small number of units or of a unique These impedance standards usually consist of sections of
piece of equipment requiring high accuracies. precision coaxial transmission line [30], [32], [33] that
I n all cases the accuracies (limits of error) given are can be inserted as two-port standards or used as termina-
those of the reflection coefficient measuring technique and tions with precision open and short circuits. The char-
instruments. The accuracies for Echelon I11 are those acteristic impedances of the lines serve as reference points.
attained with the best commercially available instruments For other reference points, other standards of impedance
using standard procedures and making only primary cor- must be used. The characteristic impedance of a precision
rections. Accuracies for Echelon I1 are those attained transmission line can be calculated from the physical
with special equipment usually available in this level of dimensions to obtain an absolute value [43], or it can be
laboratory or those attained with commercial instruments determined by calibration against higher echelon stand-
using extraordinary care in calibration and measurement. ards. The other standards must either be determined by
Other uses of the tables are discussed in [27] in the elaborate measurement techniques or referred to a higher
Bibliography. One valuable advantage is that the user of echelon. These determinations are made by reference to
radio-frequency measuring equipment can determine how direct-current standards, or by rr ' . or step techniques
well his measurements can be related to similar measure- from transmission line standarcib. Tor lower accuracy
ments throughout the field. The user of impedance meas- measurements internal standards built into the measuring
uring equipment for reliable measurements undoubtedly equipment are usually used.
would want the instruments calibrated to meet the best
available accuracy of the Echelon I1 and I11 level for the 5.2. Recommended Interlaboratory Standards. As dis-
conditions of measurement. cussed above, the recommended interlaboratory standards
I n order that greater confidence in measurements can for coaxial transmission line impedance are sections of
be generated, it is recommended that all instruments precision transmission lines, precision open- and short-
employed as standards be calibrated against a reference circuit terminations, precision mismatches, and stable
standard, or instrument of higher accuracy level, and that standards of complex impedance. These should all be
the reference standard be identified in the report of equipped with precision coaxial connectors, preferably
calibration. meeting the specifications described in IEEE Standards
If accuracies higher than those listed are needed, they Publication No. 287 on Precision Coaxial Connectors [53].

Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
 5.3. Recommended Periods of Calibration. Anticipated
impedance reference standards for Echelons I and I1
accuracy levels are of the type recommended in paragraph
5.2. With careful handling of the standard equipment the
calibration period should be of the order of 12 months.
Reference standards of Echelon I11 levels should also be
calibrated within periods of about 12 months and in
addition should be spot-checked once a month; for greater
reliability, it is recommended that production-line ref-
erence standards be intercompared weekly with a standby
reference standard.
Recalibration periods for “working,” “bench,” or “field”
equipment should preferably be specified by the manu-
facturers of the respective equipment. For maximum
reliability they should be treated as the standards of
Echelon I11 level.
5*4’
Conditions Of Calibration. Ambient
Conditions: For the Echelon I and I1 levels the ambient
conditions are a relative humidity of 40 f 2 percent and a
temperature of 23.0 f 1.1”C (73.4 f 2’F). For the
Echelon I11 level the ambient conditions specified by the
manufacturer of the catalogued measuring standard of
the Echelon 111 level should be kept within f 1 0 0 and~
within $40 to +20 percent relative humidity of Echelon
I1 level unless otherwise specified and justified in the
calibration reports accompanying the final products.
Calibration Frequencies: It is recommended that cali-
brations be performed a t frequencies that are decade
multiples of 1 and 3 and expressed either in megahertz or
gigahertz, whichever is most convenient. Some of these [IO] R. A. Kempf, “Coaxial impedance standards,” Bell Syst.
steps may be omitted when the impedance-versus-fre-
[ l l ] J. K. Hunton and W. B. Wholey, “The perfect load and the null
quency variations within a step are not expected to
exceed the
accuracy’ Other frequency steps may [12] R. A. Soderman, “Improved accuracy and convenience with the
need to be added when high reliability is essential. Ad-
ditional measurements may have to be made near the [13] M. C. Selby, E. C. Wolsien, and R. M. Jickling, “Coaxial radio
frequency of interest, Shce a hmsmission line may show
a periodic variation due to irregularities caused by die-
lectric support and the full magnitude of these variations
[141 ” , ~ . s f i ~ $ ~ r ~ o ~ ; n ~ ~
may not be apparent at the recommended test frequencies.
5.5. Recommended Calibration Procedures for Meas-
urement Instruments. The error limits of impedance
measuring equipment can be determined by 1) measure-
rnent of known standards, or by 2) analysis of errors and
Of the limits Of error’ The former is
where a series of known impedances are measured on the
instrument, and the difference between the known im-
pedance and the dial readings are plotted against the dial
readings’ Because the magnitude and phase
or the resistance and reactance dials are usually not
independent, this
technique is Often lengthy,
but the resulting plots save considerable measurement
time in using the instrument. The second method, which
is most often used, consists of determining the sources of
the major and determining the
causing
them. This can often be accomplished by measuring a few
known impedances on the system or by direct measure-
ment or calculation of the residuals. This technique is
Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
often used to determine the limits of error. When used to
correct instrument readings, the calculations can in some
cases be quite involved. The calibration method is de-
pendent on the instrument being calibrated; therefore
the manufacturer’s literature or references should be con-
sulted for details.
ACKNOWLEDGMENT
Helpful discussions and material from Stephen Adam
and B. C. Yates are gratefully acknowledged.
BIBLIOGRAPHY
[ 11 A. Weissfloch, “Ein transformationssatz verlustlose vierpole
und seine anwendung auf die experimentelle untenuchung von
desimeter-und-sentimeterwellen-schaltungen,” Hochfreq. Elek-
troakust., vol. 60, Sept. 1942, pp. 67-73.
[2] P. H. Smith, “Transmission line calculator,” Electronics,
Jan. 1939, pp. 29-31; also, “An improved transmission line
calculator,” Electronics,Jan. 1944, p. 130.
[3] William Altar, F. B. Marshall, and I,. P. Hunter, “Probe error in
standing-wave detectors,” Proc. IRE, vol. 34, Jan. 1946, pp.
33-44*
[4] J. F. Byrne, “A null method for the determination of impedance
in the 100-400 Mc range,” in Proc. Nut. Electronics Conf.,
vol. 3, 1947, pp. 603-614.
c. G. Montgomery, Ed., Techniqueof Mierrnave Measurements,
Rad. Lab. Series, vol. 2. New York: McGraw-Hill, 1947.
[6] A. Fong, “Direct measurement of impedance in the 50-500
Mc range,” Hewlett-Packard J., vol. 1, Apr. 1950.
[7] R. A. Soderman, “A new bridge for the measurement of imped-
.;:$ i!7.and 165 Mci” Gen. Radio ExP.1 vol. 24,
[8] A. M. Winsemer, “Methods for obtaining the voltage standing-
wave ratio on transmission lines independently of the detector
characteristics,” in Proc. IRE, vol. 38, Mar. 1950, pp. 275-279.
(91 H. E. Sorrows, W. E. Ryan, and R. C. Ellenwood, “Evaluation
of coaxial slotted-line impedance measurements,” in Proc.
IRE, vol. 39, Feb. 1951, pp. 162-168.
Tech. J . 1 vol. 30, July 1951, PP. 689-705.
shift-aids in VSWR measurements,” Hewlett-Packard J.,
vol. 3, Jan./Feb. 1952, pp. 2-4.
g p e 1602-B admittance meter in the VHF and UHF bands,”
en. Radio Exp., vol. 28, Aug. 1953.
frequency connectors and their electrical quality,” J . Res. Nut.
~~~~PPS~?~~~; .
technique
measurement of microwave standing-wave ratios,” in Proc.
for the
IRE, vol. 44, Aug. 1956, pp. 1024-1030.
[151 Andrew Alford and Chester B. Watts, Jr., “A wide band
coaxial hybrid,” 1956 IRE Nut. Conv. Rec., pt. 1, pp. 171-179.
[16] E. L. Ginston, M~~~~~~~Measurements. New York: McGraw-
Hill, 1957.
[I71 Chester B. Watts, Jr.1 and Andrew Alford, “An automatic
impedance plotter based on a hybrid-like network with a
very wide frequency range,” 1957 IRE Nut. Conv. Rec., pt. 5,
pp. 146-150.
[18] R. C. Powell, R. M. Jickling, and A. E. Hess, “High-frequency
impedance standards a t the National Bureau of Standards,”
IRE Trans. Instrum., vol. 1-7, Dec. 1958, pp. 270-274.
[I91 G. F. Engen and R. W. Beatty, ,iMicrowave reflectometer
techniques,” IRE Trans. Microwave Theory Tech., vol. MTT-7,
July 1959, pp. 351-355.
[20] R. W. Beatty, “Magnified and squared VSWR responses for
microwave reflection coefficient measurements,” IRE Trans.
Microwave Theory Tech., vol. MTT-7, July 1959, pp. 346-350.
[21] D. Woods, “Admittance standardization and measurementin
relation to coaxial systems,” I R E Trans. Instrum., vol. 1-9,
Sept. 1960, pp. 258-268.
1221~, coaxial connector system for precision RF measuring
instruments and standards,” in Proc. Inst. Elec. Eng., vol. 108,
pt. B, Mar. 1961, pp. 205-215.
1231 A. E. Sanderson, “A new high-precision method for the
ment of the VSWR of coaxial connectors,” IRE Trans. Micro-
wave Theory Tech., vol. MTT-9, Nov. 1961, pp. 524-528.
[24] L. sweet and R. A. ~ ~ b ~t ~ i t t ~ ~, of VSWR ~ in ~ ~ ~ ~
coaxial systems,” PRD Rep., vol. 7, no. 3, July 1961.
 [25] F. R. Huber and H. Neubauer, “Measurement techniques for
the determination of the major characteristics of coaxial
components,” Microwave J., vol. 5, Sept. 1962, pp. 196-203.
[26] R. W. Beatty and W. J. Anson, “Application of reflectometer
techniques to accurate reflection measurements in coaxial
systems,” in Proc. Inst. Elec. Eng., vol. 109, pt. B, July 1962,
pp. 345-348.
[27] I R E Subcommittee 25.1 on B,asic. Standards and Calibration
Methods, “A program to provide information on the accuracy
of electrical measurements,” in Proc. IEEE, vol. 51, Apr. 1963,
pp. 569-574.
[28] A. B. Giordano, “Measurement of standing-wave ratio,’’ in
Handbook of Microwave Measurements, M. Sucher and J. Fox,
Eds. New York: Polytechnic Press, Polytechnic Inst. of
Brooklyn, 1963, ch. 2, pp. 73-133.
[29] R. E. Spinney, “A precision reflectometer method for measurp
ments on coaxial components a t ultra-high frequencies,” in
Proc. Inst. Elec. Eng., vol. 110, Mar. 1963, pp. 521-522.
[SO] A. E. Sanderson, “Calibration techniques for one- and two-
port devices using coaxial air lines as absolute impedance
standards,” in 1964 Annu. Instrument Soc. of America Conf.
and Exhibit, Reprint B21.
[31] B. 0. Weinschel, G. U. Sorger, S. J. Raff, and J. E. Ebert,
“Precision coaxial VSWR measurements by coupled sliding-
load technique,” ZEEE Trans. Instrum. Meas., vol. IM-13,
Dec. 1964, pp. 292-300.
[32] I. A. Harris and R. E. Spinney, “The realization of high-fre-
quency impedance standards using air-spaced coaxial lines,”
IEEE Trans. Instrum. Meas., vol. IM-13, Dec. 1964, pp. 265-
272.
[33] B. 0. Weiychel, “Air-filled coaxial lines as absolute impedance
standards, Microwave J., vol. 7, Apr. 1964, pp. 47-50.
[34] B. M. Oliver, “Time domain reflectometry,” Hewlett-Packard J.,
vol. 15, Feb. 1964.
[35] A. E. Sanderson, “A slotted-line recorder system,” Gen. Radio
Ezp., vol. 39, Jan. 1965, pp. 3-10.
[36] W. E. Little and J. P. Wakefield, “Measurement of precision
coaxial connectors using reflectometer techniques,” ZEEE
I d . Conv. Rec., pt. 11, Mar. 1965, pp. 89-97.
[37] F. Jayne, “Improved reflectometer test for coaxial connectors,’’
Microwaves, vol. 4, Sept. 1965, p. 34.
[38] Robert W. Beatt “An automatic method for obtaining data
in the WeissflocZLFeenberg node-shif t technique,” in Proc.
ZEEE (Corresp., vol. 53, Jan. 1965, pp. 79-80.
[39] -, “Microwave impedance measurements and standards,”
Nat. Bur. Stand., Washington, D. C., Monograph 82, Aug. 1965.
[40] J. E. Cruz and R. L. Brooke, “A variable characteristic imped-
ance coaxial line,” ZEEE Trans. Microwave Theory Tech.
(COITXIP., vol. MTT-13, July 1965, pp. 477-478.
[41] T. E. MacKenaie and A. E. Sanderson, “Some fundamental
design principles for the $evelopment of precision coaxial
standards and components, IEEE Trans. Microwave Theory
Tech., vol. MTT-14, Jan. 1966, pp. 29-39.
Authorized licensed use limited to: NATIONAL INSTITUTE OF TECHNOLOGY SURATHKAL. Downloaded on January 06,2014 at 06:30:00 UTC from IEEE Xplore. Restrictions apply.
1421
. . John D. Dvson. “The measurement of Dhase a t UHF and
microwave “frequencies,” ZEEE Trans. Microwave Theory
Tech., vol. MTT-14, Sept. 1966, pp. 410-423.
[43] R. E. Nelson and M. R. Coryell, “Electrical parameters of
precision, coaxial, air-dielecth .transmission -lines,” Nat .
Bur. Stand., Washington, D. C., Monograph 96, June 1966,
p. 6.
[44] Thomas E. MacKenzie, “Some techniques and their limitations
as related to the measurement of small reflections in precision
coaxial transmission lines,” ZEEE Trans. Znstrum. Meas.,
vol. IM-15, Dec. 1966, pp. 365-374.
[45] R. Levy, “Directional couplers,” in Advances i n Microwaves,
vol. 1. New York: Academic Press, 1966, pp. 115-209.
[46] Robert W. Beatty, “Impedance measurements and standards
for uniconductor waveguide,” in Proc. IEEE, vol. 55, June 1967,
pp. 933-941.
[47] Bruno 0. Weinschel, “Standardization of precision coaxial
connectors,” in Proc. ZEEE, vol. 55, June 1967, pp. 923-932.
[48] L. E. Huntley and R. N. Jones, “Lumped parameter impedance
measurements,” in Proc. IEEE, vol. 55, June 1967, pp. 900-911.
[49] Paul C. Ely, Jr., “Swept-frequency techniques,” in Proc. ZEEE,
vol. 55, June 1967, pp. 991-1002.
[50] D. L. Hollway, “The comparison reflectometer,” ZEEE Trans.
Microwave Theory Tech., vol. MTT-15, Apr. 1967, pp. 250-259.
[51] R. L. Jesch and R. M. Jickling, “Impedance measurements in
coaxial waveguide systems,” in Proc. ZEEE, vol. 55, June 1967,
pp. 912-923.
[52] William E. Little, Doyle A. Ellerbruch, and Glenn F. Engen,
“An analysis of the ‘quarter-wave’ technique of reducing the
errors in UHF and microwave imDedance measurements.”
ZEEE Trans. Microwave Theory Te‘ch., vol. MTT-15, Sept.
1967, pp. 504-507.
[53] G-IM Subcommittee on Precision Coaxial Connectors, “IEEE
standard for Drecision coaxial connectors” and “Precision
coaxial connector coupling mechanisms, contact designs, and
higher mode resonances,” IEEE Trans. Instrum. Meas.,
vol. IM-17, Sept. 1968, pp. 204-218 and 219-222.
Marvin B. Chasek and Rudolph C. Drechsler, “C?,mputer-
operated impedance stability measurement system, IEEE
Trans. Instrum. Meas., vol. IM-17, Dec. 1968, pp. 303-308.
Stephen F. Adam, “A new precision automatic microwave
measurement system,” IEEE Trans. Instrum. Meas., vol.
IM-17, Dec. 1968, pp. 308-313.
Gunther U. Sorger, “Coaxial swept-frequency VSWR meas-
urements using slotted lines,” ZEEE Trans. Instrum. Meus.,
vol. IM-17, Dec. 1968, pp. 403412.
T. E. MacKenzie. J. F. Gilmore. and M. Khazam. “The new
sweep-frequency ‘reflectometer,”’ Gen. Radio Exp., vol. 43,
Mar./Apr. 1969.
R. W. Beatty and B. C . Yaks, “A graph of return loss versus
frequency for quarter-wavelength short-circuited waveguide
imDedance standards.” IEEE Trans. Micrmave Theoru Tech.
(Cbrresp., vol. MTT-17, May 1969, pp. 282-284. _.