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Detector Window
Every Vanta analyzer is drop tested, features Olympus’ Axon Technology, and is rugged, fast, and reliable.
Vanta analyzers are capable of measuring elements from concentrations as low as single parts per million (ppm) all the
way up to 100%.
The limits of detection (LODs) represent the calculated value using a three-sigma, 99.7% confidence level. The LOD for
each element is a function of the testing time. Please contact your local Olympus representative for more information.
The LOD table gives an indication of the performance of Vanta VMR GeoChem LODs
the Vanta model VMR across many elements and sets of
LOD LOD LOD LOD
certified standards.
Element (ppm) (ppm) Element (ppm) (ppm)
40 kV 50 kV 40 kV 50 kV
• LODs were developed by testing a variety of certified reference
materials or standards. Mg 1800 1800 Y 1 1
• LODs are dependent on testing time, sample heterogeneity, Al 125 125 Zr 1 1
the presence/absence of interfering elements, and the beam
Si 190 190 Nb 2 2
conditions used (kV and μA of the X-ray tube and filter settings).
P 20 20 Mo 1 1
• All values are determined using multiple automatically selected
beam conditions. S 15 15 Ag 2 1
• The LOD (3 sigma) is the lowest quantity of an element that can K 15 15 Cd 2 1
be detected in an interference-free silica blank.
Ca 20 20 Sn 2 2
• There are many commonly known inter element interferences,
such as iron (Fe) on cobalt (Co), titanium (Ti) on barium (Ba), Ti 20 20 Sb 2 2
and lead (Pb) on arsenic (As). Please contact your Olympus Ba 10 10 Ta 2 2
representative for more information.
V 5 5 W 1 1
• Analysis time is 120 seconds per beam condition.
Cr 10 10 Au 1 1
• Only the common elements are listed, other elements are
possible. Mn 5 5 Hg 1 1
www.olympus-ims.com
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Technology are trademarks of Olympus Corporation.
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