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The invention of this high-power solid state switching device, known as thyristor,
in the year 1957 suggested a complete change in the concepts of control
engineering. It was so named as its characteristics resembled those of its
predecessor, i.e. gas-tube thyratron. With the development of numerous similar
devices of alike characteristics, the whole family of such high-power switching
devices has come to be known as thyristors. The whole thyristor family,
therefore, includes the following devices:
Power-switching devices are used for power control in the following applications:
Figure 1.2.1 shows the symbolic representations of the devices belonging to the
thyristor family.
Figure 1.2.1 Symbolic representations of devices of thyristor family.
The cross-sectional views of two typical SCRs are shown in Figs. 1.2.3 (b) and(c).
Basically, the SCR consists of a four-layer pellet of P-type and N-type
semiconductor materials. Silicon is used as the intrinsic semiconductor to which
the proper impurities are added. The junctions are either diffused or alloyed. The
planar construction in Fig. 5.2(b) is used for low-power SCRs. This technique is
useful for making a number of units from a single wafer. Here, all the junctions
are diffused. The other technique is the mesa construction shown in Fig. 1.2.3(c)
which is used for high-power SCRs. Here, the inner junction J2 is obtained by
diffusion, and then the outer two layers are alloyed to it. Because the P-N-P-N
pellet is required to handle large currents, it is properly braced with tungsten or
molybdenum plates to provide greater mechanical strength. One of these plates
is hard-soldered to a copper or an aluminum stud, which is threaded for
attachment to a heat sink. The heat sink provides an efficient thermal path for
conducting the internal losses to the surrounding medium.
Figure 1.2.3 Cross-sectional views of typical SCRs: (b) planar type (all diffused)
and (c) mesa type (alloy diffused).
In the structure of the SCR as shown in Fig.1.2.2, the inner N-region is lightly
doped. The outer P-region and the outer N-region are heavily doped. The doping
of the inner P-region is intermediate between that of the inner N-region and the
outer P-region (or the outer N-region). If a positive voltage VF is applied to the
anode with respect to the cathode, junctions J1 and J3 are forward biased but
junction J2 in the middle is reverse biased. Junction J2 passes a greater value
of leakage current than a simple P-N junction would pass because junctions J1
and J3 here act as sources of minority carriers. Junctions J1-J2 and J2-J3 can
be considered to constitute a P-N-P and N-P-N transistor, respectively, as shown
in Fig. 1.2.4, where the junction J2 is the collector-base junction common to
both component transistors. In a transistor, the total collector current is, IC =
αIE + ICO where α and ICO are the emitter-collector current gain and collector
reverse saturation current, respectively. The collector currents of the two
transistors Q1 and Q2 are, therefore, given by
𝑰𝑪𝟏 𝜶𝟏 𝑰𝑨 𝑰𝑪𝑶𝟏
and
𝑰𝑪𝟐 𝜶𝟐 𝑰𝑨 𝑰𝑪𝑶𝟐
The total current in the anode terminal of the SCR is then given by
𝑰𝑪𝟏 𝜶𝟏 𝑰𝑨 𝑰𝑪𝑩𝑶𝟏 ; 𝑰𝑪𝟐 𝜶𝟐 𝑰𝑲 𝑰𝑪𝑩𝑶𝟐
ICBO is the leakage current of the collector-base junction
𝑰𝑲 𝑰𝑮 𝑰𝑨
𝑰𝑨 𝑰𝑪𝟏 𝑰𝑪𝟐
𝑰𝑨 𝜶𝟏 𝑰𝑨 𝑰𝑪𝑩𝑶𝟏 𝜶𝟐 𝑰𝑲 𝑰𝑪𝑩𝑶𝟐
Normally, (α1 + α2) for silicon is less than unity. But a slight increase in as causes
the denominator of Eq. (2.1) to become extremely small and this produces a large
forward current IA. When the forward voltage VF is increased, the leakage current
at junction J2 increases. This increases the values of α1 and α2, causing a
reduction in the value of denominator of Eq. (2.1). If the forward voltage is
sufficiently large, carrier multiplication at J2 causes its breakdown and the
leakage current increases rapidly. As a result, 1 – (α1 + α2) reduces to zero. The
increase in forward current IA at J2 is accelerated by an increase in current gains
α1 and α2, until avalanche breakdown occurs. The current becomes so large that
the component transistors are saturated. The voltage drop across the SCR falls
nearly to 1.5 V and the forward current IA is limited by the external resistance
RL. Once the forward breakdown occurs, the device remains in the ON state with
a very low resistance until ((α1 + α2) becomes less than unity.
Thus, if a current is caused to flow across J3, the current through the entire
device is increased. This enhancement is due to the increasing values of α1 and
α2. If the current going to P-layer between J3 and J2, i.e. the gate current, is
made greater than zero, the breakover voltage VBO is lowered. The effect of
increasing gate current is to increase α2 only, and α1 is determined by the overall
forward current. This means that 1 – (α1 + α2) is controlled both by the gate
current and the total forward current. As the gate current increases in value, the
forward breakover voltage becomes smaller and equal to the forward voltage drop
of one P-N junction at some value of the gate current.
When the SCR is turned on, all the four layers are filled with carriers, and even
if the gate supply is removed, the device will continue to stay on because of
internal regeneration. Therefore, a gate signal is required only for turning on the
SCR. Once the SCR starts conducting, the gate loses all control and even if the
gate voltage is removed, the anode current does not decrease at all. The only way
to stop conduction is to reduce the applied voltage to zero or bring the forward
current below the value of holding current IH.
The SCR shown in Fig. 1.2.2 can be visualized as consisting of two separate
transistors as shown in Fig. 1.2.4. Thus, the equivalent circuit of the SCR is
composed of P-N-P and N-P-N transistors connected as shown in Fig. 1.2.5. It is
clear that the collector of each transistor is coupled to the base of the other,
thereby making positive feedback loops. With the gate G open, there is no base
current in the transistor Q2. Therefore, no current can flow in the collector of Q2
and hence in the collector of Q1. Under such a condition, the SCR is open.
Figure 1.2.5 Two transistor analogy of the SCR using the equivalent symbol.
If the switch S is closed, a small gate current IG (which is the base current of Q2)
will flow through the base of Q2 which means that its collector current IC2 will
increase. The collector current of Q2 is the base current of Q1, therefore, the
collector current of Q1 increases. But the collector current of Q1 is the base
current of Q2 which combines with the gate current IG. It thus results in the
enhancement of the base current of Q2.
A positive voltage VF when applied to the anode with respect to the cathode as
shown in Fig. 1.2.2, forward biases J1 and J3, but J2 in the middle region is
reverse biased. The depleted region at J2 sustains the applied forward voltage.
No current can flow between the anode (A) and the cathode (C) because of reverse
bias at J2. This is known as forward blocking. However, there is a small reverse
leakage current because of the presence of minority carriers.
When the applied voltage VF is gradually increased towards the breakover voltage
VBO with the gate open, then more holes are injected from the outer P-region to
the inner N-region. Because of this large electric field at J2, the injected holes
can easily diffuse from the inner N-region to the inner P-region. These large
number of holes reaching the inner P-region increase the positive bias on J3,
temporarily. This causes more electrons from the outer N-region to be injected
into the inner P-region. Because of the electric field, these electrons further reach
the inner N-region and increase the forward bias on J1 which further increases
the hole injection from the outer P-region. This regenerative action continues till
the voltage across the SCR drops to about 1.5 V and the forward current IA is
limited by the external resistance RL. The SCR now conducts heavily and is said
to be in the ON state with a very low resistance. The applied voltage at which the
forward current suddenly jumps to a high value is called the breakover voltage
+VBO as shown in Fig. 1.2.6.
When a small positive voltage is applied to the gate of the SCR, the junction J2
gets more forward biased. The injection of this gate current into the SCR lowers
the breakover voltage to a value equal to that of the applied voltage, thereby
turning the SCR on. When the SCR turns on, the voltage across the device is
somewhat greater than the voltage drop across a diode with single junction. Once
the SCR starts conducting, the gate loses all control and even if the gate voltage
is removed, the anode current does not decrease at all. The only way to stop
conduction is to reduce the applied voltage to zero.
When a negative voltage is applied to the anode with respect to the cathode as
shown in Fig. 1.2.2, J3 is forward biased while J1 and J3 are reverse biased.
Again, no current will flow between the anode and the cathode except for the
leakage current. This is known as reverse blocking.
Reverse conduction region
The different terminologies used with SCRs are explained in the following
subsections with reference to Fig. 1.2.6
The holding current IH is usually lower than, but very close to, the latching
current IL. The holding current is temperature sensitive and decreases
with the increase in temperature. Thus, if the holding current IH of an SCR
is 6 mA, it means that if the anode current is made less than the 6 mA,
then the SCR will be turned off. The holding current rating is generally
specified at room temperature with gate open.
Latching Current
The latching current of an SCR specifies a value of the anode current
slightly higher than the holding current, which is the minimum value
required to sustain conduction immediately after the SCR is switched from
the OFF state to the ON state and the gate signal removed as shown in Fig.
1.2.6. Once the latching current is reached, the SCR remains in the ON
state until the anode current is decreased below the holding current value.
o turn-on switching,
o forward conduction,
o turn-off or commutation,
o reverse blocking, and
o triggering.
When the anode voltage is positive, a small current flow through the gate
junction. This anode current is a function of the gate current. As the gate
current is increased, the total current through the junction and the voltage
drop across it increase rapidly.
If the gate triggering current is increased, then the device current gain
increases till the loop gain (two transistor analogy) changes the SCR from
its forward blocking to forward conducting state and the blocking junction
turns from reverse to forward bias. The negative gate bias increases the
forward blocking capability of the device. The magnitude of the gate voltage
and, therefore, that of the gate current to trigger an SCR varies inversely
as the junction temperature. The lower the junction temperature, the
worse is the trigger condition.
Power Rating
This is strictly applicable to current conduction and the forward voltage
drop, therefore, the power loss is a better consideration. The following are
the power losses in an SCR which are usually specified by the
manufacturers.
The best shape of a gate signal is one with a sharp leading edge, and the
shorter the signal duration the greater must be its magnitude for a reliable
turn-on. Once the SCR is ON, the gate current is no longer required to flow
for the device to remain conducting, so a gate pulse is enough. The
following points must be noted while designing the gate control circuit.
The gate control circuit of an SCR converter is designed to provide the gate
triggering pulse to the SCRs at the appropriate instants of time. The switching
control unit of a power electronic converter normally has a timing circuit in it.
This timing circuit generates the timing pulses at the correct instant of time at
which each power device has to be switched on. The timing circuit for a switching
element normally provides a pulse whose duration is the ON time of the device.
In general, such a pulse from the timing circuit is unsuitable for being directly
applied to the gate terminal of the SCR for the following three reasons:
1. An SCR only needs a pulse of short duration, and not for the entire
duration of the ON time. Therefore, the unwanted gate power dissipation
can be avoided by using a very short pulse that starts at the leading edge
of the timing pulse.
2. It may need further amplification to be able to provide the required current
and power to turn on the switching device successfully.
3. It is invariably necessary to provide electrical isolation between the
switching control circuit and the power circuit of the converter. The power
switching elements will generally be working at high and variable
potentials, from which the control circuit is to be isolated.
When signal on the secondary is removed, the core gets saturated after a
few cycles and will bypass the gate current flowing through R. The SCR
will then stop conducting and the load voltage will become zero. The flow
of negative current through the primary winding of transformer T is
prevented by diode D2. Diode D1 is used to prevent reverse breakdown of
the gate-cathode junction in the negative half-cycle.
When Q2 turns on, it provides an amplified base current for the P-N-P
transistor Q1 and causes it to turn on. The value of the base current for
Q1 is decided by the value chosen for R2 and the power supply VCC,
provided that the input to Q2 is sufficient to turn it fully on. When Q1
turns on, it applies a pulse of amplitude approximately equal to VCC to
the primary of the pulse transformer. This pulse has the same duration as
the input pulse. But it has a large current capability, which is determined
by the base current provided to Q1.
The secondary coil of the pulse transformer feeds the pulse to the gate of
the SCR. The resistances, R5 and R6, serve to limit the gate voltage and
current. The diode D2 prevents any reverse voltage on the gate from the
transformer. Resistance R6 also serves to provide an ohmic path from the
gate to the cathode of the SCR.
Solution 1.1
The gate pulse should be present at least until the current rises to the latching
current.
The exponential rise of current in the power circuit is given by
𝒕
𝒊 𝑰 𝟏 𝒆 𝑻 𝟐. 𝟐
where T is the time constant of the load.
From Eq. (5.2),
𝒕
𝟐𝟓𝟎 𝒎𝑨 𝟏𝟎𝟎 𝟏 𝒆 𝟏
Therefore, the minimum duration of the gate drive pulse required to turn on the
SCR is
𝒕 𝟎. 𝟎𝟎𝟐𝟓 𝒔
Example 1.2
The SCR in the switching circuit of Fig. 1.2.15 is in the ON state. Its holding
current rating is 150 mA. An additional resistance R is introduced in the circuit
by opening the switch S across this resistance. What is the lowest value of R that
will cause the SCR to turn off when S is opened?
Figure 1.2.15 Example 1.2
Solution 1.2
The specified holding current implies that the SCR will turn off if the current
tends to fall below this value. The total value of resistance Rt that will just keep
the SCR ON with switch S open is given by
Therefore, the lowest value of R that will cause the SCR to turn OFF when the
switch S is opened, is given by
𝑹 𝑹𝒕 𝟏𝟎𝛀 𝟔𝟓𝟔. 𝟔𝟕 𝛀
Example 1.3
An SCR in the switching circuit of Fig. 1.2.16 has a di/dt rating of 40 A/μs.
Determine the minimum value of inductance L needed to protect the SCR from
the di/dt failure.
Neglecting forward voltage drop across the SCR, the loop equation during turn-
on switching, is given by
𝒅𝒊
𝑽𝑭 𝑹𝒊 𝑳 𝟎
𝒅𝒕
The initial rate of change of current with i = 0 at t = 0 is
𝒅𝒊
𝑽𝑭 𝑹 𝟎 𝑳 𝟎
𝒅𝒕
𝒅𝒊
𝑳 𝑽𝑭
𝒅𝒕
𝒅𝒊 𝑽𝑭
𝒅𝒕 𝒕 𝟎 𝑳
Equating this to the maximum di/dt rating, the minimum value of L is obtained
as
𝑨 𝟒𝟎𝟎 𝑽
𝟒𝟎𝟎𝟎𝟎𝟎𝟎𝟎
𝒔 𝑳
𝑳 𝟏𝟎 𝝁𝑯
When the current is zero, the capacitor will get charged to a voltage higher than
the supply voltage, and reverse voltage will appear across the SCR after it is
turned off. Therefore, when the SCR is fired (triggered), it automatically gets
turned off after approximately one-half period of the resonant circuit. No other
SCR need be fired to commutate the conducting SCR as is done in parallel or
bridge inverters. This method of turn-off is also referred to as self-commutation.
(2.3)
Initially, the capacitor C remains charged to the dc voltage V with its upper
plate positive as shown in Fig. 1.2.17(a). When the SCR (T) is triggered,
load current iR flows. Due to triggering on of T, the stored charge on the
capacitor drives an oscillatory current through the loop formed by
capacitor C, SCR (T) and inductor L. The overall SCR current iT will be the
algebraic sum of load current iR and oscillatory current iC. Beyond point
‘a’ as shown in Fig. 1.2.17(b), the electromagnetic energy of L is converted
to electrostatic energy and capacitor C recharges in the reverse direction.
Thus, when oscillatory current iC reverses its direction (i.e. when capacitor
C discharges from – V) and tends to exceed the load current iR, the SCR
current iT becomes zero. As a result, the SCR (T) gets turned off at point
‘b’ and the circuit looks like that shown in Fig. 1.2.18. Referring to the
waveform [Fig. 1.2.17(b)], it is seen that at the instant of commutation (i.e.
iT = 0), the remaining voltage of the capacitor (VC) is additive to the dc
supply voltage V; the load current iR flowing through the branch C, L, and
RL continues to increase corresponding to point ‘d’ as shown in the wave
diagram (even after commutation) but soon becomes zero (point ‘e’) when
the capacitor C is charged to dc voltage V with its upper plate positive. In
the case of an inductive load, a freewheeling diode is used across the load.
The triggering of T1 causes currents in two paths. In one path there will be
a steady dc load current iR through the load RL. In the other path there
will be sinusoidal capacitor current iC through the loop C, T1, L, and D.
Because of the oscillatory sinusoidal current iC, the charge on C is reversed
and then held in this condition. Since diode D prevents any reverse current
through this loop, iC will be only a sinusoid of positive half-cycle. At any
desired time, SCR (T2) may be triggered which then places capacitor C
across T1, reverse biases T1 and turns it off.
It should be noted that at the instant of triggering T2, the capacitor voltage
aids the supply voltage V and the combination drives a much higher
current through the branch C, T2, and RL. Therefore, iR will suddenly jump
to a higher value [point ‘a’ in Fig. 1.2.22] from the steady dc level but then
ultimately decays to zero with a time constant RLC. The corresponding
capacitor current also decays, but its direction is obviously opposite to
that of the positive half-cycle sinusoid (during oscillatory current through
C, T1, L, and D). The current iT1 will be the sum of the sinusoidal parts of
the iC and the steady dc part of iR. Jone’s chopper is an example of this
class.
Figure 1.2.23 and (b) Class E commutation: (a) circuit diagram and (b)
waveforms.
Class F—ac line commutation.
AC line commutation is also recognized as a method of forced
commutation, as commutation is forced by the opposite half-cycle of the
ac supply. The negative ac voltage of the line reverse biases the SCR and
turns it off. Since external commutating elements are not required to
commutate the conducting SCR, this type of commutation is not generally
referred to as forced commutation in most literature. This method is
commonly known as AC line commutation or natural commutation. It is
extensively used in line-commuted rectifiers, inverters, and
cycloconverters. Figures 1.2.24(c) and 1.2.24(d) show the circuit diagram
and waveforms, respectively.
Figure 1.2.24 Class F commutation: (c) circuit diagram and (d) waveforms
COMPARISON OF SCRS AND TRANSISTORS
SCRs develop heat internally because of (i) ON state conduction losses, (ii)
switching losses, and (iii) OFF state losses caused by the blocking current. In
addition to these steady state losses, heat may also be generated on account of
electrical overloads and ambient temperature variations. These losses mainly
occur in the thin wafer of silicon. The heat thus generated flows out mostly
through the outer casing to the cooling medium. Therefore, SCRs are mounted
on special heat sinks so that the maximum temperature rating of the junction is
not exceeded. A heat sink on an SCR increases its surface area and removes heat
from the case of the device at a much faster rate.
Copper or aluminum is generally used as the heat sink. Nickel sinks are also
sometimes used. Because of low weight, high thermal conductivity and good heat
storage capacity, aluminum sinks provide the best results per unit cost. Copper
sinks provide the best results per unit volume. Calculations related to design
need the following data:
Thermal resistance (q). The thermal resistance of a body (device) is the ratio of
the temperature difference across it in the direction of heat flow and the power
giving rise to this temperature difference. The thermal resistance is expressed in
degrees Celsius per watt (oC/W).
The qCS is mainly in the pressure contact interface between the device base and
the heat sink.
The effective thermal resistance of the heat sink depends on various factors, such
as material, shape and size of the sink. It also depends on the coolant properties,
such as viscosity, density, the temperature difference between the two, flow
conditions, and the magnitude of heat dissipated.
(2.4)
Also,
The thermal resistance qJA is not a property of the device but of the external heat
sink and is not a constant quantity; it varies with the material, the size, the
surface treatment of the sink and the temperature difference between the heat
sink and the atmosphere. The value of qJA is provided by the manufacturer of
the heat sink. Figure 1.2.25 shows the heat flow and temperature diagram of an
SCR device.
Example 1.4
The maximum junction temperature of a transistor (or an SCR) is TJ = 150°C
and the ambient temperature is 25°C. If the thermal impedances are, qJC = 0.4
°C/W, qCS = 0.1 °C/W, and qSA = 0.5°C/W, calculate the maximum power
dissipation and the case temperature.
Solution 1.4
Power dissipation is given by
For conventional cooling, the power dissipation is
or
Example 1.5
Calculate the ON state power loss for a 460 V, 500 A SCR converter operating
continuously at rated load. The ambient temperature and junction temperature
are 40°C and 80°C, respectively. Thermal resistance—junction to atmosphere—
is 0.15 °C/W.
Solution 1.5
The ON-state power loss for an SCR converter is given by
The SCRs can get damaged on account of voltage and current ratings being
exceeded. Under transient conditions, the derivatives of voltage (dv/dt) and
current (di/dt) can also damage the SCR. The behavior of an SCR is, therefore,
specified in terms of average, repetitive and non-repetitive voltage and current
ratings for anode and gate circuits.
The SCRs are robust devices within their rated capabilities. However, they get
easily damaged by excessive voltages. An SCR will be switched to its ON state if
the forward voltage exceeds the forward breakover voltage VBO or if the forward
voltage is supplied at a rate that exceeds the dv/dt (max) for the device. Most of
the SCRs get damaged by the application of the reverse voltage in excess of the
specified reverse voltage. Such destruction of SCRs results in tracking across the
surface or melting of silicon near the junction because of excessive leakage
currents. Repeated low energy transients cause local heating of silicon, resulting
in increased reverse leakage currents. Excessive reverse power dissipation
destroys the device. Overvoltage in the forward direction causes the breakdown
of the SCR into the conduction stage.
Transient voltages are also produced by the make and break of the ac input
contactors, and by the blowing out of fuses. Sometimes, severe surges may occur
on the overhead transmission lines because of lightning. The surge because of
lightning may occur either on the input side, or on the dc output side of a rectifier
used for distribution purposes. On the dc side of the equipment, severe surges
can also occur owing to the blowing out of fuses or tripping off of switches or
circuit breakers.
The rate of rise of the surge voltage may be as high as 1000 V/ms, owing to faulty
operation of contactors. Generally, the transient voltage appears as spikes on
the supply voltage waveform. Surge voltage is also produced by the turn-on or
turn-off of the SCRs with a highly inductive load. Again, because of very rapid
drop of reverse current (hole storage current), harmful voltage surges are
induced across the inductances in the circuit.
Figure 1.2.26 Protection circuits: (a) snubber circuit and (b) modified
snubber circuit.
Resistance R helps to prevent damage caused by minority carrier storage
during commutation oscillations. Capacitor C provides a path for reverse
current when the SCR suddenly blocks at the end of the minority carrier
storage time, but charges with opposite polarity during forward blocking
and then discharges rapidly through the SCR at turn-on. The resistance R
limits the initial forward current when the SCR turns on and damps out
oscillations caused by carrier storage effects when the SCR is reverse
blocking.
To limit di/dt, when circuit conditions are such that there is a danger of
exceeding the specification, an inductance L may be added to the snubber
circuit as shown in Fig. 1.2.26(b). This is usually a coil of a few turns,
capable of carrying the full SCR current. In some designs, this coil is
wound on a small ferrite ring. This reduces the size of the coil for the same
inductance value.
Gate protection
Gate circuits also need protective elements because of the low voltage and
low power involved. Rapid voltage and current changes produce unwanted
induced voltages in the gate leads, therefore, careful screening, grounding,
and filtering are essential. In Fig. 1.2.27, diode D3, which must have a
lower reverse blocking current compared to SCR, would take a greater
share of the reverse voltage. Since the gate should never be negative with
respect to the cathode by more than a specified value (about 5 V), diode
D1 or D2 precisely prevents this. Diode D1 limits the negative bias to its
forward voltage drop, which is about 1.5 V.
One common use for the SCR is in protecting other equipment from overvoltage’s
because of their fast switching action. Figure 1.2.28 shows a crowbar transient
protection circuit that is connected across the ac mains. Two SCRs used for
protection are connected across the load in reverse parallel connection in series
with a protecting resistance R1. Whenever the supply voltage exceeds a specified
limit, the gate of one of the SCRs will get energized and in turn trigger that SCR.
A large current will thus be drawn from the supply mains, increasing the voltage
drop across the source impedance ZS that will reduce the overvoltage at the load
end.
Since the voltage applied is ac, one SCR (T1) is used in the positive half-cycle
and the other (T2) in the negative half-cycle. Resistance R1 limits the short-
circuit current when the SCRs are fired. A zener diode D5 in series with R1 and
R2 constitutes a voltage-sensing circuit. When the line voltage is above the
specified limit, a breakover voltage will occur across diode D5. Then, during the
positive half-cycle, the gate of T1 gets energized through R1, D1, R2, and D3. As
a result, T1 conducts. In the negative half-cycle, the gate of T2 will get energized
through D2, R2, D4 and R1. Consequently, T2 will turn on if the overvoltage
persists. As soon as the load voltage returns to the safe value, the zener diode
D5 goes to the OFF state and the current through it falls ensuring that the SCRs
do not fire.