1446-18

Object Product family of protection relays

Type Relion 670 and 650 series, version 2.2 Serial No. -

Client ABB AB,

Nätverksgatan 3, Västerås, Sweden
Manufacturer ABB AB,
Nätverksgatan 3, Västerås, Sweden*)
Tested by KEMA B.V.,
Arnhem, the Netherlands
Date of tests 16 November 2017 to 6 August 2018

Test specification The tests have been carried out in accordance with IEC 60255-1, subclause 6.5.

Summary and The objects have complied with the relevant requirements of the standard.
conclusion

This report applies only to the object tested. The responsibility for
conformity of any object having the same type references as that tested
rests with the Manufacturer.
*) as declared by the manufacturer

This report consists of 509 pages in total.

DNV GL Netherlands B.V.

Bas Verhoeven
Director, High-Voltage
Laboratory

Arnhem, 19 February 2019

Version: 1

Copyright: Only integral reproduction of this report is permitted without written permission from KEMA B.V. Electronic copies as PDF or scan of this report
may be available and have the status “for information only”. The sealed and bound version of the report is the only valid version.
 -2- 1446-18

INFORMATION SHEET
1 KEMA Type Test Certificate
A KEMA Type Test Certificate contains a record of a series of (type) tests carried out in accordance
with a recognized standard. The object tested has fulfilled the requirements of this standard and the
relevant ratings assigned by the manufacturer are endorsed by KEMA B.V. In addition, the object’s
technical drawings have been verified and the condition of the object after the tests is assessed and
recorded. The Certificate contains the essential drawings and a description of the object tested. A
KEMA Type Test Certificate signifies that the object meets all the requirements of the named
subclauses of the standard. It can be identified by gold-embossed lettering on the cover and a gold
seal on its front sheet.
The Certificate is applicable to the object tested only. KEMA B.V. is responsible for the validity and the
contents of the Certificate. The responsibility for conformity of any object having the same type
references as the one tested rests with the manufacturer.
Detailed rules on types of certification are given in KEMA B.V.’s Certification procedure applicable to
KEMA Laboratories.

2 KEMA Report of Performance

A KEMA Report of Performance is issued when an object has successfully completed and passed a
subset (but not all) of test programmes in accordance with a recognized standard. In addition, the
object’s technical drawings have been verified and the condition of the object after the tests is
assessed and recorded. The report is applicable to the object tested only. A KEMA Report of
Performance signifies that the object meets the requirements of the named subclauses of the
standard. It can be identified by silver-embossed lettering on the cover and a silver seal on its front
sheet.
The sentence on the front sheet of a KEMA Report of Performance will state that the tests have been
carried out in accordance with …… The object has complied with the relevant requirements.

3 KEMA Test Report

A KEMA Test Report is issued in all other cases. Reasons for issuing a KEMA Test Report could be:
• Tests were performed according to the client’s instructions.
• Tests were performed only partially according to the standard.
• No technical drawings were submitted for verification and/or no assessment of the condition of
the object after the tests was performed.
• The object failed one or more of the performed tests.
The KEMA Test Report can be identified by the grey-embossed lettering on the cover and grey seal on
its front sheet.
In case the number of tests, the test procedure and the test parameters are based on a recognized
standard and related to the ratings assigned by the manufacturer, the following sentence will appear
on the front sheet. The tests have been carried out in accordance with the client's instructions. Test
procedure and test parameters were based on ..... If the object does not pass the tests such
behaviour will be mentioned on the front sheet. Verification of the drawings (if submitted) and
assessment of the condition after the tests is only done on client's request.
When the tests, test procedure and/or test parameters are not in accordance with a recognized
standard, the front sheet will state the tests have been carried out in accordance with client’s
instructions.

4 Official and uncontrolled test documents

The official test documents of KEMA B.V. are issued in bound form. Uncontrolled copies may be
provided as a digital file for convenience of reproduction by the client. The copyright has to be
respected at all times.
Version: 1
 -3- 1446-18

TABLE OF CONTENTS

1 Summary ................................................................................................................. 11

2 General information ................................................................................................... 13

2.1 The tests were witnessed by 13
2.2 The tests were carried out by 13
2.3 Purpose of the tests 13
2.4 Measurement uncertainty 13

3 Current protection ..................................................................................................... 14

3.1 Negative sequence overcurrent/Current unbalance protection, NS2PTOC 14
3.1.1 Intrinsic accuracy 15
3.1.2 Definite time, 0,1IB, 0 s 17
3.1.3 Definite time 0,1IB, 0,3 s 18
3.1.4 Definite time 0,1IB, 30 s 19
3.1.5 Reset 0,1IB, 0 s 20
3.2 Instantaneous phase overcurrent protection, PHPIOC 21
3.2.1 Intrinsic accuracy 22
3.2.2 Trip operate 0,05IB 24
3.2.3 Trip operate 1,0IB 25
3.2.4 Trip operate 4,0IB 26
3.2.5 Reset time 0,05IB 27
3.2.6 Reset time 1,0IB 28
3.2.7 Reset time 10,0IB 29
3.2.8 Transient overreach 30
3.3 Directional phase overcurrent protection, OC4PTOC 32
3.3.1 Intrinsic accuracy 33
3.3.2 Definite time 0,05IB, 0 s 34
3.3.3 Definite time 0,05IB, 0,3 s 35
3.3.4 Definite time 0,05IB, 60 s 36
3.3.5 Definite time 1,0IB, 0 s 37
3.3.6 Definite time 1,0IB, 0,3 s 38
3.3.7 Definite time 1,0IB, 60 s 39
3.3.8 Definite time 4,0IB, 0 s 40
3.3.9 Definite time 4,0IB, 0,3 s 41
3.3.10 Definite time 4,0IB, 60 s 42
3.3.11 Reset time 0,05IB 43
3.3.12 Reset time 1,0IB 44
3.3.13 Reset time 10,0IB 45
3.3.14 IEC Normal inverse time 0,05IB 46
3.3.15 IEC Normal inverse time 1,0IB 49
Version: 1
 -4- 1446-18

3.3.16 IEC Normal inverse time 2,0IB 52

3.3.17 IEC Very inverse time 0,05IB 55
3.3.18 IEC Very inverse time 1,0IB 58
3.3.19 IEC Very inverse time 2,0IB 61
3.3.20 IEC Extremely inverse time 0,05IB 64
3.3.21 IEC Extremely inverse time 1,0IB 67
3.3.22 IEC Extremely inverse time 2,0IB 70
3.3.23 IEC Long time inverse 0,05IB 73
3.3.24 IEC Long time inverse 1,0IB 76
3.3.25 IEC Long time inverse 2,0IB 79
3.3.26 IEC Short time inverse 0,05IB 82
3.3.27 IEC Short time inverse 1,0IB 85
3.3.28 IEC Short time inverse 2,0IB 88
3.3.29 IEEE Normal inverse time 0,05IB 91
3.3.30 IEEE Normal inverse time 1,0IB 94
3.3.31 IEEE Normal inverse time 2,0IB 97
3.3.32 IEEE Moderately inverse time 0,05IB 100
3.3.33 IEEE Moderately inverse time 1,0IB 103
3.3.34 IEEE Moderately inverse time 2,0IB 106
3.3.35 IEEE very inverse time 0,05IB 109
3.3.36 IEEE very inverse time 1,0IB 112
3.3.37 IEEE very inverse time 2,0IB 115
3.3.38 IEEE extremely inverse time 0,05IB 118
3.3.39 IEEE extremely inverse time 1,0IB 121
3.3.40 IEEE extremely inverse time 2,0IB 124
3.3.41 IEEE long time inverse 0,05IB 127
3.3.42 IEEE long time inverse 1,0IB 130
3.3.43 IEEE long time inverse 2,0IB 133
3.3.44 IEEE long time very inverse 0,05IB 136
3.3.45 IEEE long time very inverse 1,0IB 139
3.3.46 IEEE long time very inverse 2,0IB 142
3.3.47 IEEE long time extremely inverse 0,05IB 145
3.3.48 IEEE long time extremely inverse 1,0IB 148
3.3.49 IEEE long time extremely inverse 2,0IB 151
3.3.50 Overshoot time, OC4PTOC 154
3.3.51 Response to time varying current for dependent function 155
3.3.52 Directional, accuracy of operating angle (forward) 156
3.3.53 Directional, accuracy of operating angle (reverse) 157
3.3.54 Directional, trip time vs. angle (forward) 158
3.3.55 Directional, trip time vs angle reverse 160
3.4 Instantaneous residual overcurrent protection, EFPIOC 162
Version: 1
 -5- 1446-18

3.4.1 Intrinsic accuracy 163

3.4.2 Definite time 0,05IB 165
3.4.3 Definite time 0,1IB 166
3.4.4 Definite time 1,0IB 167
3.4.5 Reset time 0,1IB 168
3.4.6 Reset time 1,0IB 169
3.4.7 Reset time 4,0IB 170
3.5 Directional residual overcurrent protection, EF4PTOC 171
3.5.1 Intrinsic accuracy 172
3.5.2 Definite time 0,05IB, 0 s 174
3.5.3 Definite time 0,05IB, 0,3 s 175
3.5.4 Definite time 0,05IB, 60 s 176
3.5.5 Definite time 1,0IB, 0 s 177
3.5.6 Definite time 1,0IB, 0,3 s 178
3.5.7 Definite time 1,0IB, 60 s 179
3.5.8 Definite time 4,0IB, 0 s 180
3.5.9 Definite time 4,0IB, 0,3 s 181
3.5.10 Definite time 4,0IB, 60 s 182
3.5.11 Reset time 0,05IB 183
3.5.12 Reset time 1,0IB 184
3.5.13 Reset time 4,0IB 185
3.5.14 Directional, accuracy of operating angle (forward) 186
3.5.15 Directional, trip time vs. angle 188
3.5.16 Directional, trip time vs. angle (reverse) 190
3.6 Voltage dependent overcurrent, VRPVOC 193
3.6.1 Intrinsic accuracy 194
3.6.2 Definite time 0,02IB 196
3.6.3 Definite time 1,0IB 197
3.6.4 Definite time 5,0IB 198
3.7 Sensitive directional residual overcurrent and power protection, SDEPSDE 199
3.7.1 Accuracy 0 degree 199
3.7.2 Accuracy -90 degree 201
3.7.3 Directional definite time 1,0IB, 0 s 203
3.7.4 Directional definite time 1,0IB, 0,3 s 204
3.7.5 Directional definite time 1,0IB, 3 s 205
3.7.6 Non-directional definite time 0,1IB, 0 s 206
3.7.7 Non-directional definite time 0,1IB, 0,3 s 207
3.7.8 Non-directional definite time 0,1IB, 3 s 208

4 Voltage protection ................................................................................................... 209

4.1 Phase undervoltage protection, UV2PTUV 209
Version: 1
 -6- 1446-18

4.1.1 Intrinsic accuracy 210

4.1.2 Definite time 0,1UB, 0 s 211
4.1.3 Definite time 0,1UB, 0,1 s 212
4.1.4 Definite time 0,1UB, 60 s 213
4.1.5 Definite time 0,3UB, 0 s 214
4.1.6 Definite time 0,3UB, 0,1 s 215
4.1.7 Definite time 0,3UB, 60 s 216
4.1.8 Definite time 1,0UB, 0 s 217
4.1.9 Definite time 1,0UB, 0,1 s 218
4.1.10 Definite time 1,0UB, 60 s 219
4.1.11 Reset time 0,1UB, 0 s 220
4.1.12 Reset time 0,3UB, 0 s 221
4.1.13 Reset time 1,0UB, 0 s 222
4.1.14 Inverse time 1,0UB, 0,05 (curve B) 223
4.1.15 Inverse time 1,0UB, 0,5 (curve B) 224
4.1.16 Inverse time 1,0UB, 1,0 (curve B) 225
4.1.17 Overshoot time 226
4.1.18 Response to time-varying value of the characteristic quantity 227
4.2 Phase overvoltage protection, OV2PTOV 228
4.2.1 Intrinsic accuracy 229
4.2.2 Definite time 0,1UB, 0 s 231
4.2.3 Definite time 0,1UB, 0,1 s 232
4.2.4 Definite time 0,1UB, 60 s 233
4.2.5 Definite time 0,5UB, 0 s 234
4.2.6 Definite time 0,5UB, 0,1 s 235
4.2.7 Definite time 0,5UB, 60 s 236
4.2.8 Definite time 1,0UB, 0 s 237
4.2.9 Definite time 1,0UB, 0,1 s 238
4.2.10 Definite time 1,0UB, 60 s 239
4.2.11 Reset time 0,1UB, 0 s 240
4.2.12 Reset time 0,5UB, 0 s 241
4.2.13 Reset time 1,0UB, 0 s 242
4.2.14 Inverse time 1,0UB, 0,05 (curve C) 243
4.2.15 Inverse time 1,0UB, 0,5 (curve C) 244
4.2.16 Inverse time 1,0UB, 1.0 (curve C) 245
4.2.17 Response to time-varying value of the characteristic quantity 246
4.3 Residual overvoltage protection, ROV2PTOV 247
4.3.1 Intrinsic accuracy 248
4.3.2 Definite time 0,1UB, 0 s 250
4.3.3 Definite time 0,1UB, 0,1 s 251
4.3.4 Definite time 0,1UB, 60 s 252
Version: 1
 -7- 1446-18

4.3.5 Definite time 0,5UB, 0 s 253

4.3.6 Definite time 0,5UB, 0,1 s 254
4.3.7 Definite time 0,5UB, 60 s 255
4.3.8 Definite time 1,0UB, 0 s 256
4.3.9 Definite time 1,0UB, 0,1 s 257
4.3.10 Definite time 1,0UB, 60 s 258
4.3.11 Reset time 0,1UB, 0 s 259
4.3.12 Reset time 0,5UB, 0 s 260
4.3.13 Reset time 1,0UB, 0s 261
4.3.14 Response to time-varying value of the characteristic quantity 262

5 Thermal overload protection ..................................................................................... 263

5.1 Thermal overload protection, TRPTTR 263
5.1.1 Accuracy related to the operating current value 264
5.1.2 Operating time cold curve 265
5.1.3 Operating time hot curve 271
5.1.4 Operating time cold curve 3rd harmonic 272
5.1.5 Operating time cold curve 5th harmonic 273
5.1.6 Operating time cold curve 7th harmonic 274
5.2 Operating time during frequency deviation 275
5.3 Performance with specific cooling time constant 276
5.4 Thermal overload protection, LPTTR 277
5.4.1 Accuracy related to the operating current value 278
5.4.2 Operating time cold curve 279
5.4.3 Operating time hot curve 285
5.4.4 Ambient temperatures, cold curve 286
5.4.5 Ambient temperatures, hot curve 287
5.4.6 Operating time, cold curve 3rd harmonic 288
5.4.7 Operating time, cold curve 5th harmonic 289
5.4.8 Operating time cold curve 7th harmonic 290
5.5 Operating time during frequency deviation 291

6 Distance Protection.................................................................................................. 292

6.1 Distance Protection, ZMFCPDIS 292
6.1.1 Calculation sheets of test points 292
6.2 Long line and Short line characteristic data (dynamic performance tests) 296
6.3 Rated frequency characteristic accuracy tests 297
6.3.1 Basic characteristic accuracy under steady state conditions (1 A, 50 Hz) 297
6.3.2 Basic characteristic accuracy under steady state conditions (1 A, 60 Hz) 299
6.3.3 Basic directional accuracy under steady state conditions (1 A, 50 Hz) 301
6.3.4 Basic directional accuracy under steady state conditions (1 A, 60 Hz) 302
6.3.5 Determination of accuracy related to time delay setting 303
Version: 1
 -8- 1446-18

6.3.6 Determination of the disengaging time, 50 Hz 306

6.3.7 Determination of the disengaging time, 60 Hz 307
6.4 Dynamic performance 308
6.4.1 Operate time and transient overreach at 1 A and 50 Hz (Short line) 308
6.4.2 Operate time and transient overreach at 1 A and 60 Hz (Short line) 313
6.4.3 Operate time and transient overreach at 1 A and 50 Hz (Long line) 316
6.4.4 Operate time and transient overreach at 1 A and 60 Hz (Long line) 321
6.4.5 Operate time and transient overreach (short line with CVT) 324
6.4.6 Transient overreach (Short line) 329
6.4.7 Transient overreach (Long line) 330
6.4.8 Transient overreach (Short line with CVT) 331
6.4.9 Typical operate time 332
6.5 Performance with harmonics 334
6.5.1 Steady state harmonics tests (2 A, 50 Hz) 334
6.5.2 Steady state harmonics tests (2 A, 60 Hz) 335
6.5.3 Transient oscillation tests (50 Hz) 336
6.5.4 Transient oscillation tests (60 Hz) 340
6.6 Performance during off-nominal frequency 344
6.6.1 Steady state frequency deviation tests (50 Hz) 344
6.6.2 Steady state frequency deviation tests (60 Hz) 345
6.6.3 Transient frequency deviation tests (49-51 Hz) 346
6.6.4 Transient frequency deviation tests (47,5-52,5 Hz) 351
6.6.5 Transient frequency deviation tests (57-63 Hz) 356
6.6.6 Transient frequency deviation tests (58,8-61,2 Hz) 361
6.7 Double infeed tests 366
6.8 Distance Protection, ZRWPDIS 370
6.8.1 Calculation sheets of test points 370
6.8.2 Basic characteristic accuracy under steady state conditions (5 A, 16,7 Hz) 371
6.8.3 Basic directional accuracy under steady state conditions (5 A, 16,7 Hz) 374
6.8.4 Acuracy of time delay setting 376
6.8.5 Determination of the disengaging time 377

7 Differential protection .............................................................................................. 379

7.1 Transformer differential protection, T3WPDIF 379
7.1.1 General 379
7.2 Static accuracy Idiff> and operating characteristic 380
7.2.1 Intrinsic accuracy default settings 381
7.3 Operating time (IOM ouput) 389
7.3.1 Operate time, restrained function, single infeed faults (L2-N) 390
7.3.2 Operate time, restrained function, single infeed faults (L1-L2-L3-N) 391
7.3.3 Operate time, restrained function, double infeed faults (L2-N) 392
Version: 1
 -9- 1446-18

7.3.4 Operate time, restrained function, double infeed faults (L1-L2-L3-N) 393
7.3.5 Operate time, unrestrained function, single infeed faults (L2-N) 394
7.3.6 Operate time, unrestrained function, single infeed faults (L1-L2-L3-N) 395
7.3.7 Operate time, unrestrained function, double infeed faults (L2-N) 396
7.3.8 Operate time, unrestrained function, double infeed faults (L1-L2-L3-N) 397
7.4 Operating time (SOM ouput) 398
7.4.1 Operate time, restrained function, single infeed faults (L2-N) 399
7.4.2 Operate time, restrained function, single infeed faults (L1-L2-L3-N) 400
7.4.3 Operate time, restrained function, double infeed faults (L2-N) 401
7.4.4 Operate time, restrained function, double infeed faults (L1-L2-L3-N) 402
7.4.5 Operate time, unrestrained function, single infeed faults (L2-N) 403
7.4.6 Operate time, unrestrained function, single infeed faults (L1-L2-L3-N) 404
7.4.7 Operate time, unrestrained function, double infeed faults (L2-N) 405
7.4.8 Operate time, unrestrained function, double infeed faults (L1-L2-L3-N) 406
7.5 Stability for external faults 407
7.5.1 Stability for external faults, restrained function (L2-N) 408
7.5.2 Stability for external faults, restrained function (L1-L2-L3-N) 409
7.5.3 Stability for external faults, unrestrained function (L2-N) 410
7.5.4 Stability for external faults, unrestrained function (L1-L2-L3-N) 411
7.6 Static accuracy harmonic blocking function 412
7.6.1 Static accuracy harmonic restraint, 2nd harmonic 413
7.6.2 Static accuracy harmonic restraint, 5th harmonic 414
7.7 Line differential protection, L3CPDIF 415
7.7.1 General 415
7.8 Static accuracy Idiff> and operating characteristic 416
7.8.1 Intrinsic accuracy default settings (50 Hz) 417
7.9 Operating time (IOM output) 424
7.9.1 Operate time, restrained function, single infeed faults (L2-N) 425
7.9.2 Operate time, restrained function, single infeed faults (L1-L2-L3-N) 427
7.9.3 Operate time, restrained function, double infeed faults (L2-N) 429
7.9.4 Operate time, restrained function, double infeed faults (L1-L2-L3-N) 431
7.9.5 Operate time, unrestrained function, single infeed faults (L2-N) 433
7.9.6 Operate time, unrestrained function, single infeed faults (L1-L2-L3-N) 435
7.9.7 Operate time, unrestrained function, double infeed faults (L2-N) 437
7.9.8 Operate time, unrestrained function, double infeed faults (L1-L2-L3-N) 439
7.10 Operating time (SOM output) 441
7.10.1 Operate time, restrained function, single infeed faults (L2-N) 442
7.10.2 Operate time, restrained function, single infeed faults (L1-L2-L3-N) 444
7.10.3 Operate time, restrained function, double infeed faults (L2-N) 446
7.10.4 Operate time, restrained function, double infeed faults (L1-L2-L3-N) 448
7.10.5 Operate time, unrestrained function, single infeed faults (L2-N) 450
Version: 1
 -10- 1446-18

7.10.6 Operate time, unrestrained function, single infeed faults (L1-L2-L3-N) 452
7.10.7 Operate time, unrestrained function, double infeed faults (L2-N) 454
7.10.8 Operate time, unrestrained function, double infeed faults (L1-L2-L3-N) 456
7.11 Stability for external faults 458
7.11.1 Stability for external faults, restrained function (L2-N) 459
7.11.2 Stability for external faults, restrained function (L1-L2-L3-N) 461
7.11.3 Stability for external faults, unrestrained function (L2-N) 463
7.11.4 Stability for external faults, unrestrained function (L1-L2-L3-N) 465
7.12 Static accuracy harmonic blocking function 467
7.12.1 Static accuracy harmonic restraint, 2nd harmonic 468
7.12.2 Static accuracy harmonic restraint, 5th harmonic 469
7.13 Line differential protection, L4CPDIF 470
7.13.1 General 470
7.14 Static accuracy Idiff> and operating characteristic 471
7.14.1 Intrinsic accuracy default settings (50 Hz) 472
7.15 Operating time 480
7.15.1 Operate time, restrained function, single infeed faults (L2-N) 481
7.15.2 Operate time, restrained function, single infeed faults (L1-L2-L3-N) 483
7.15.3 Operate time, restrained function, double infeed faults (L2-N) 485
7.15.4 Operate time, restrained function, double infeed faults (L1-L2-L3-N) 487
7.15.5 Operate time, unrestrained function, single infeed faults (L2-N) 489
7.15.6 Operate time, unrestrained function, single infeed faults (L1-L2-L3-N) 491
7.15.7 Operate time, unrestrained function, double infeed faults (L2-N) 493
7.15.8 Operate time, unrestrained function, double infeed faults (L1-L2-L3-N) 495
7.16 Stability for external faults 497
7.16.1 Stability for external faults, restrained function (L2-N) 498
7.16.2 Stability for external faults, restrained function (L1-L2-L3-N) 500
7.16.3 Stability for external faults, unrestrained function (L2-N) 502
7.16.4 Stability for external faults, unrestrained function (L1-L2-L3-N) 504
7.17 Static accuracy harmonic blocking function 506
7.17.1 Static accuracy harmonic restraint, 2nd harmonic 507
7.17.2 Static accuracy harmonic restraint, 5th harmonic 508

8 Measurement uncertainty ......................................................................................... 509

Version: 1
 -11- 1446-18

1 SUMMARY
By order of the client type tests according to IEC 60255-1 have been performed on the product family
of protection relays, Relion 670 and 650 series, version 2.2.

Test / Measurement Test result

Dimensions of structure and visual inspection Passed
Functional requirements Passed
Product safety Passed
Electromagnetic compatibility (EMC) Passed
Burden tests Passed
Climatic environmental conditions Passed
Mechanical environmental conditions Passed
Enclosure protection Passed
Contact performance Passed

In this report, the results of the tests on various protection functions are given.

Protection functions tested

ANSI code Function code
Distance protection 21 ZMFPDIS 1) , ZMFCPDIS,
ZRWPDIS
Phase undervoltage protection 27 UV2PTUV
Negative sequence overcurrent or current unbalance 46 NS2PTOC
protection
Thermal protection 26, 49 LPTTR, TRPTTR
Instantaneous phase overcurrent protection 50 PHPIOC
Time delayed phase overcurrent protection 51 OC4PTOC
Instantaneous residual overcurrent protection 50N EFPIOC
Time delayed residual overcurrent protection 51N EF4PTOC
Voltage restrained overcurrent protection 51V VRPVOC
Phase overvoltage protection 59 OV2PTOV
Residual overvoltage protection 59N ROV2PTOV
Directional phase overcurrent protection 67 OC4PTOC
Directional residual overcurrent protection 67N EF4PTOC, SDEPSDE
Line differential protection 87L L3CPDIF, L4CPDIF
Transformer differential protection 87T T2WPDIF 2), T3WPDIF

1) Manufacturer declares that ZMFPDIS and ZMFCPDIS are fundamentally the same functions.
2) Manufacturer declares that T2WPDIF and T3WPDIF are fundamentally the same functions.
Version: 1
 -12- 1446-18

The table below gives an overview of the test objects.

Type Serial no. Firmware version Manufacturing IED no.

Location
REC670 I1741048 2.2.1.10 India 1A
T1752171 2.2.2.3 Sweden 1B
RET670 T1738217 2.2.1.10 Sweden 2A
T1738218 2.2.1.10 Sweden 2B
I1817001 2.2.2.3 India 2C
RED670 T1819167 2.2.2.3 Sweden 3A (II)
T1738216 2.2.1.10 Sweden 3B
T1739128 2.2.1.10 Sweden 3C
T1739129 2.2.1.10 Sweden 3D
REL670 I1741047 2.2.1.10 India 4
RES670 T1738219 2.2.1.10 Sweden 5
T1819165 2.2.2.3 Sweden 5B
REQ650 T1738222 2.2.1.10 Sweden 6
RER670 T1738220 2.2.1.10 Sweden 7A
T1738221 2.2.1.10 Sweden 7B

Type tests were done on various test objects of various IED types. The tests and the results are
described in the following documents/reports:

Report number Relion version 2.2 device

1418-18 Overview and risk assessment
1417-18 REC670
1414-18 RED670
1410-18 REL670
1416-18 REQ650
1412-18 RER670
1408-18 RES670
1415-18 RET670
1446-18 Tests of protection functions
Version: 1
 -13- 1446-18

2 GENERAL INFORMATION

2.1 The tests were witnessed by

The tests were carried out without a representative of the client present.

2.2 The tests were carried out by

Name Company
Herman Koerts KEMA B.V.,
Arnhem, the Netherlands

2.3 Purpose of the tests

Purpose of the tests was to verify whether the material complies with the specified requirements.

2.4 Measurement uncertainty

A table with measurement uncertainties is enclosed in this report. Unless otherwise stated, the
measurement uncertainties of the results presented in this report are as indicated in that table.
Version: 1
 -14- 1446-18

3 CURRENT PROTECTION

3.1 Negative sequence overcurrent/Current unbalance

protection, NS2PTOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 5 February 2018

Environmental conditions
Ambient temperature 22,6 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy operate current ±1% of Ir at I ≤Ir
±1% of I at I ≥Ir
Reset ratio > 95%
Operate time, start at 0 to 2x Iset: min. = 15 ms max. = 30 ms
Reset time, start at 2x Iset to 0 : min. = 15 ms, max. = 30 ms
Operate time, start at 0 to 10x Iset: min. = 5 ms max. = 20 ms
Reset time, start at 10x Iset to 0 : min. = 20 ms, max. = 35 ms
Accuracy independent time delay, 0,5 Iset to 2x Iset ± 0,2% or ± 35 ms whichever is greater

Result
The object passed the test.
Version: 1
 -15- 1446-18

3.1.1 Intrinsic accuracy

Characteristic test data

Sample IED 2A
Rated current = IBase 5A
Base current 5A
Rated frequency 50 Hz
Range Gs I2 3 % IBase to 500% IBase
Initial start value ≤ 2 x specified accuracy
Ramping step ≤ 0,1 x specified accuracy
Step time 2 to 5 x tstart
Repetitions 5
IL1 varied
Il2 = IL3 5A
Step IL1 1 mA
Step IL1 0,1 s
Version: 1
 -16- 1446-18
Intrinsic accuracy (Input IL1)
Set values IL1 trip Dev. IL1trip IL1 reset Reset - I2 trip I2 reset Dev I2 Reset-
I2 IL1 trip theor. min. avg. max. min. avg. max.
% of IBase A A A A A % IL1 A A A ratio IL1 A A % I2set ratio I2
3 0,150 5,450 5,450 5,451 5,452 0,02 5,440 5,441 5,442 0,998 0,150 0,147 0,20 0,98
4,550 4,554 4,555 4,556 0,11 4,563 4,564 4,565 0,998 0,148 0,145 -1,11 0,98
5 0,250 5,750 5,750 5,751 5,752 0,02 5,730 5,731 5,733 0,997 0,250 0,244 0,13 0,97
4,250 4,253 4,254 4,256 0,09 4,272 4,274 4,275 0,995 0,249 0,242 -0,53 0,97
10 0,500 6,500 6,500 6,501 6,501 0,02 6,458 6,458 6,459 0,993 0,500 0,486 0,07 0,97
3,500 3,504 3,505 3,506 0,14 3,545 3,547 3,548 0,988 0,498 0,484 -0,33 0,97
20 1,000 8,000 7,999 8,000 8,001 0,00 7,912 7,913 7,914 0,989 1,000 0,971 0,00 0,97
2,000 2,006 2,007 2,007 0,35 2,093 2,094 2,095 0,958 0,998 0,969 -0,23 0,97
30 1,500 9,500 9,496 9,498 9,499 -0,02 9,364 9,365 9,366 0,986 1,499 1,455 -0,05 0,97
0,500 0,508 0,508 0,509 1,64 0,641 0,641 0,642 0,792 1,497 1,453 -0,18 0,97
50 2,500 12,500 12,50 12,50 12,50 0,00 12,27 12,27 12,28 0,982 2,500 2,423 0,00 0,97
100 5,000 20,000 19,98 19,98 19,98 -0,10 19,53 19,53 19,53 0,977 4,993 4,843 -0,13 0,97
 -17- 1446-18

3.1.2 Definite time, 0,1IB, 0 s

Characteristic test data

Sample IED 2A
Rated current (Irated) 5A
Rated frequency 50 Hz
Set t1 0s
Range Gs 0,03 x Irated to 5 x Irated
Gs 0,1 x Irated
Pre-fault:
IL1=IL2=IL3 5A
Pre-fault time 0,4 s
Fault:
IL1 varied
Il2 = IL3 5A

Start
Applied values Measured values
(I2) Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0 0,027 0,029 0,032 0,015 0,021 0,030
2 0 0,020 0,024 0,028 0,013 0,022 0,027
5 0 0,015 0,017 0,019 0,024 0,027 0,030
10 0 0,014 0,016 0,018 0,026 0,030 0,034
20 0 0,013 0,016 0,019 0,026 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0 0,027 0,030 0,033 0,015 0,021 0,030
2 0 0,021 0,025 0,029 0,013 0,022 0,027
5 0 0,016 0,017 0,019 0,024 0,027 0,030
10 0 0,014 0,017 0,019 0,026 0,030 0,034
20 0 0,014 0,016 0,019 0,026 0,030 0,034
Version: 1
 -18- 1446-18

3.1.3 Definite time 0,1IB, 0,3 s

Characteristic test data

Sample IED 2A
Rated current (Irated) 5A
Rated frequency 50 Hz
Set t1 0,3 s
Range Gs 0,03 x Irated to 5 x Irated
Gs 0,1 x Irated
Pre-fault:
IL1=IL2=IL3 5A
Pre-fault time 0,4 s
Fault:
IL1 varied
Il2 = IL3 5A

Start
Applied values Measured values
(I2) Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0,3 0,026 0,030 0,032 0,015 0,021 0,030
2 0,3 0,019 0,024 0,028 0,026 0,027 0,029
5 0,3 0,014 0,016 0,018 0,025 0,027 0,029
10 0,3 0,012 0,014 0,018 0,025 0,027 0,029
20 0,3 0,014 0,015 0,018 0,025 0,029 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0,3 0,333 0,334 0,336 0,015 0,021 0,030
2 0,3 0,325 0,329 0,331 0,026 0,027 0,029
5 0,3 0,318 0,320 0,324 0,025 0,027 0,029
10 0,3 0,316 0,318 0,322 0,025 0,027 0,029
20 0,3 0,317 0,320 0,322 0,025 0,029 0,033
Version: 1
 -19- 1446-18

3.1.4 Definite time 0,1IB, 30 s

Characteristic test data

Sample IED 2A
Rated current (Irated) 5A
Rated frequency 50 Hz
Set t1 30 s
Range Gs 0,03 x Irated to 5 x Irated
Gs 0,1 x Irated
Pre-fault:
IL1=IL2=IL3 5A
Pre-fault time 0,4 s
Fault:
IL1 varied
Il2 = IL3 5A

Start
Applied values Measured values
(I2) Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 30 0,027 0,029 0,031 0,014 0,023 0,031
2 30 0,021 0,024 0,026 0,015 0,023 0,031
5 30 0,013 0,015 0,020 0,025 0,028 0,032
10 30 0,011 0,015 0,018 0,026 0,028 0,030
20 30 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 30 30,028 30,032 30,037 0,014 0,023 0,031
2 30 30,021 30,027 30,033 0,015 0,023 0,031
5 30 30,013 30,018 30,026 0,025 0,028 0,032
10 30 30,015 30,020 30,026 0,026 0,028 0,030
20 30 - - - - - -
Version: 1
 -20- 1446-18

3.1.5 Reset 0,1IB, 0 s

Characteristic test data

Sample IED 2A
Rated current (Irated) 5A
Rated frequency 50 Hz
Set t1 0s
Range Gs 0,03 x Irated to 5 x Irated
Gs 0,1 x Irated
Fault:
IL2=IL3 5A
IL1 8A
Fault time 1s
Post fault:
IL1 see table
Il2 = IL3 5A

End value I2 Measured reset times start contact Result

IL1
xGs A A 1 2 3 4 5 Min. Avg. Max.
0,8 0,4 6,20 0,030 0,029 0,025 0,024 0,028 0,024 0,027 0,030
0,4 0,2 5,60 0,020 0,025 0,022 0,023 0,026 0,020 0,023 0,026
0 0 5,00 0,020 0,020 0,025 0,022 0,023 0,020 0,022 0,025
Version: 1
 -21- 1446-18

3.2 Instantaneous phase overcurrent protection, PHPIOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 16 to 29 November 2017

Environmental conditions
Ambient temperature 23 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy ±1,0% of Ir at ≤ Ir
±1,0% of I at I > Ir
Reset ratio > 95% at (50-2500)% of IBase
Operate time at 0 to 2x Iset min. = 15 ms max. = 25 ms
Reset time at 2x Iset to 0 min. = 15 ms, max. = 25 ms
Operate time at 0 to 10x Iset min. = 5 ms max. = 15 ms
Reset time at 10x Iset to 0 min. = 25 ms, max. = 40 ms

Result
The object passed the test.
Version: 1
 -22- 1446-18

3.2.1 Intrinsic accuracy

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 5 % IBase to 400% IBase
Initial start value ≤ 2 X of specified accuracy
Ramping step 0,1 x specified accuracy
Step time 2 to 5 x tstart
Curve family DT
Repetitions 5

Intrinsic accuracy (Input IL1)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Iset A A A ratio
0,0 0,05 0,050 0,050 0,050 -0,20 0,031 0,031 0,031 61,7
0,5 0,07 0,070 0,071 0,071 0,71 0,509 0,051 0,051 72,3
1,0 0,09 0,090 0,090 0,091 0,33 0,071 0,071 0,071 78,3
2,0 0,13 0,130 0,130 0,131 0,15 0,111 0,111 0,111 85,0
3,0 0,17 0,170 0,170 0,170 0,18 0,150 0,151 0,151 88,4
5,0 0,25 0,250 0,250 0,250 0,12 0,230 0,231 0,231 92,1
10,0 0,45 0,450 0,450 0,450 0,04 0,430 0,430 0,431 95,6
20,0 0,84 0,840 0,840 0,841 0,04 0,815 0,815 0,815 97,0
30,0 1,24 1,240 1,240 1,241 0,01 1,203 1,203 1,203 97,0
60,0 2,42 2,419 2,419 2,419 -0,04 2,346 2,346 2,346 97,0
100,0 4,00 3,996 3,996 3,996 -0,10 3,876 3,876 3,876 97,0

Intrinsic accuracy (Input IL2)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Iset A A A ratio
0,0 0,05 0,050 0,050 0,051 0,60 0,031 0,031 0,032 62,2
0,5 0,07 0,070 0,071 0,071 1,14 0,051 0,051 0,052 72,6
1,0 0,09 0,090 0,091 0,091 0,89 0,071 0,071 0,071 78,1
2,0 0,13 0,130 0,130 0,131 0,15 0,110 0,111 0,111 84,9
3,0 0,17 0,170 0,170 0,171 0,12 0,150 0,150 0,151 88,4
5,0 0,25 0,250 0,250 0,250 0,00 0,230 0,230 0,231 92,1
10,0 0,45 0,450 0,450 0,450 -0,02 0,430 0,430 0,431 95,6
20,0 0,84 0,839 0,840 0,840 -0,02 0,814 0,814 0,815 97,0
30,0 1,24 1,239 1,239 1,240 -0,05 1,202 1,202 1,202 97,0
60,0 2,42 2,418 2,419 2,419 -0,06 2,345 2,346 2,346 97,0
100,0 4,00 3,994 3,995 3,995 -0,14 3,874 3,875 3,875 97,0
Version: 1
 -23- 1446-18

Intrinsic accuracy (Input IL3)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Iset A A A ratio
0,0 0,05 0,050 0,050 0,050 0,00 0,030 0,031 0,031 61,0
0,5 0,07 0,070 0,070 0,070 0,14 0,050 0,051 0,051 72,3
1,0 0,09 0,090 0,090 0,090 -0,11 0,070 0,071 0,071 78,4
2,0 0,13 0,130 0,130 0,131 0,23 0,111 0,111 0,111 85,0
3,0 0,17 0,170 0,170 0,171 0,12 0,150 0,151 0,151 88,5
5,0 0,25 0,250 0,250 0,251 0,12 0,230 0,230 0,231 92,0
10,0 0,45 0,449 0,450 0,450 -0,09 0,430 0,430 0,430 95,6
20,0 0,84 0,839 0,839 0,839 -0,12 0,814 0,814 0,814 97,0
30,0 1,24 1,238 1,238 1,239 -0,15 1,201 1,201 1,201 97,0
60,0 2,42 2,415 2,415 2,415 -0,21 2,342 2,342 2,343 97,0
100,0 4,00 3,988 3,988 3,989 -0,29 3,869 3,869 3,869 97,0
Version: 1
 -24- 1446-18

3.2.2 Trip operate 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 27 November 2017

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Gs 0,05 x Irated
Fault L2-N

Trip time
Applied values Measured values
Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0 0,030 0,031 0,032 0,021 0,022 0,024
2 0 0,021 0,022 0,023 0,024 0,026 0,027
5 0 0,010 0,012 0,013 0,031 0,032 0,033
10 0 0,011 0,012 0,013 0,037 0,038 0,038
20 0 0,009 0,011 0,012 0,041 0,042 0,043
Version: 1
 -25- 1446-18

3.2.3 Trip operate 1,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Gs 1,0 x Irated
Fault L2-N

Trip time
Applied values Measured values
Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0 0,025 0,026 0,027 0,012 0,013 0,015
2 0 0,020 0,021 0,023 0,021 0,022 0,023
5 0 0,010 0,011 0,013 0,028 0,029 0,030
10 0 0,010 0,011 0,012 0,032 0,033 0,035
20 0 0,009 0,010 0,011 0,037 0,038 0,040
Version: 1
 -26- 1446-18

3.2.4 Trip operate 4,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Gs 4,0 x Irated
Fault L2-N

Trip time
Applied values Measured values
Time delay Operate time Reset time
theoretical Min. Avg. Max. Min. Avg. Max.
xGs s s s s s s s
1,2 0 0,025 0,026 0,027 0,012 0,013 0,015
2 0 0,020 0,021 0,022 0,021 0,022 0,023
5 0 0,010 0,012 0,013 0,028 0,029 0,031
10 0 0,010 0,011 0,012 0,032 0,033 0,035
20 0 0,009 0,010 0,011 0,038 0,039 0,040
Version: 1
 -27- 1446-18

3.2.5 Reset time 0,05IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Fault L2-N

Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 0,1 0,8 0,04 no reset no reset no reset no reset no reset - - -
2 0,1 0,4 0,02 0,033 0,031 0,032 0,032 0,032 0,031 0,032 0,033
2 0,1 0,2 0,01 0,027 0,026 0,026 0,029 0,029 0,026 0,027 0,029
2 0,1 0,1 0,005 0,028 0,026 0,026 0,027 0,027 0,026 0,027 0,028
2 0,1 0 0 0,026 0,025 0,026 0,025 0,027 0,025 0,026 0,027
Version: 1
 -28- 1446-18

3.2.6 Reset time 1,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Fault L2-N

Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 2 0,8 0,8 0,032 0,030 0,031 0,031 0,031 0,030 0,031 0,032
2 2 0,4 0,4 0,023 0,025 0,025 0,024 0,024 0,023 0,024 0,025
2 2 0,2 0,2 0,024 0,023 0,022 0,024 0,023 0,022 0,023 0,024
2 2 0,1 0,1 0,022 0,022 0,023 0,022 0,022 0,022 0,022 0,023
2 2 0 0 0,022 0,023 0,023 0,021 0,021 0,021 0,022 0,023
Version: 1
 -29- 1446-18

3.2.7 Reset time 10,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 10 x Irated
Fault L2-N

Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 20 0,8 8 0,029 0,031 0,030 0,030 0,029 0,029 0,030 0,031
2 20 0,4 4 0,023 0,023 0,025 0,023 0,024 0,023 0,024 0,025
2 20 0,2 2 0,023 0,022 0,023 0,021 0,024 0,021 0,023 0,024
2 20 0,1 1 0,022 0,023 0,023 0,022 0,022 0,022 0,023 0,023
2 20 0 0 0,021 0,021 0,022 0,022 0,021 0,021 0,021 0,022
Version: 1
 -30- 1446-18

3.2.8 Transient overreach

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 4 January 2018

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Transient overreach < 5% at tau= 100 ms

Result
The object passed the test.
Version: 1
 -31- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) = IBase 1A
Rated frequency 50 Hz
Gs 1 x Irated
Fault L1-N
Fault duration 500 ms

Result

X/R ratio: 0
Setting IED 3A (% IB) Observation
100 5x trip
101 5x no trip
102 5x no trip

X/R ratio: 10 (tau = 31,8 ms)

Setting IED 3A (% IB) Observation
101 5x trip
102 5x short trip (≈ 25 ms)
103 5x no trip

X/R ratio: 40 (tau = 127,3 ms)

Setting IED 3A (% IB) Observation
100 5x trip
101 5x trip
102 5x no trip

X/R ratio: 120 (tau = 381,5 ms)

Setting IED 3A (% IB) Observation
100 5x trip
101 5x trip
102 5x no trip

Transient overreach for X/R= 10: ((103/101)-1)x100% = 1,98%.

Transient overreach for X/R= 40 and 120: ((102/101)-1)x100% = 0,99%.
Version: 1
 -32- 1446-18

3.3 Directional phase overcurrent protection, OC4PTOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 6 December 2017 to 23 January 2018

Environmental conditions
Ambient temperature 22,2 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy operate current ±1,0% of Ir at ≤ Ir
±1,0% of I at I > Ir
Reset ratio > 95% at (50-2500)% of IBase
Operate time, start non-directional at 0 to 2x Iset min. = 15 ms max. = 30 ms
Reset time, start non-directional at 2x Iset to 0 min. = 15 ms, max. = 30 ms
Operate time, start non-directional at 0 to 10x Iset min. = 5 ms max. = 20 ms
Reset time, start non-directional at 10x Iset to 0 min. = 20 ms, max. = 35 ms
Independent time delay at 0 to 2x Iset ± 0,2% or ± 35 ms, whichever is greater
IEC Inverse time characteristics ± 2% or ± 40 ms, whichever is greater

Result
The object passed the test.
Version: 1
 -33- 1446-18

3.3.1 Intrinsic accuracy

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Forward (Non-directional at 0,05 A)
Curve family IEC DT
Range Gs 0,05 x Irated to 4 x Irated
Gs 0,01 x Irated
Range t1 0 s to 60 s
Set t1 0s
U L-E 63,508 V

Input % of set Measured values

range Operate time Reset time
Min. Avg. Max. Deviation Deviation Min. Avg. Max. ratio
Iset Ir
s s s % % s s s
0,0 0,050 0,051 0,051 1,20 0,06 0,030 0,031 0,031 0,60
IL1 10,0 0,450 0,450 0,451 0,09 0,04 0,430 0,430 0,431 0,96
100 3,994 3,994 3,994 -0,15 -0,60 3,914 3,914 3,914 0,98
0,0 0,051 0,051 0,051 2,00 0,10 0,031 0,031 0,031 0,61
IL2 10,0 0,449 0,450 0,450 -0,04 -0,02 0,429 0,429 0,429 0,95
100 3,985 3,986 3,986 -0,35 -1,42 3,906 3,906 3,906 0,98
0,0 0,050 0,050 0,051 0,80 0,04 0,030 0,030 0,030 0,60
IL3 10,0 0,450 0,450 0,450 0,00 0,00 0,430 0,430 0,430 0,96
100 3,994 3,994 3,994 -0,15 -0,60 3,914 3,914 3,914 0,98
Version: 1
 -34- 1446-18

3.3.2 Definite time 0,05IB, 0 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Range t1 0 s to 60 s
Set t1 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0 0,025 0,028 0,032 0,020 0,023 0,026
2 0,10 0 0,021 0,025 0,028 0,022 0,026 0,030
5 0,25 0 0,013 0,016 0,019 0,024 0,029 0,033
10 0,50 0 0,011 0,016 0,021 0,024 0,027 0,030
20 1,00 0 0,013 0,015 0,018 0,025 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0 0,026 0,029 0,032 0,020 0,023 0,026
2 0,10 0 0,021 0,025 0,028 0,022 0,026 0,030
5 0,25 0 0,013 0,016 0,020 0,024 0,029 0,033
10 0,50 0 0,011 0,016 0,021 0,024 0,027 0,030
20 1,00 0 0,013 0,016 0,018 0,025 0,029 0,032
Version: 1
 -35- 1446-18

3.3.3 Definite time 0,05IB, 0,3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Range t1 0 s to 60 s
Set t1 0,3 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,3 0,027 0,030 0,033 0,020 0,024 0,028
2 0,10 0,3 0,022 0,024 0,028 0,023 0,026 0,029
5 0,25 0,3 0,013 0,016 0,019 0,028 0,029 0,031
10 0,50 0,3 0,012 0,016 0,020 0,025 0,027 0,031
20 1,00 0,3 0,013 0,015 0,018 0,027 0,029 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,3 0,331 0,334 0,336 0,020 0,024 0,028
2 0,10 0,3 0,325 0,328 0,330 0,023 0,026 0,028
5 0,25 0,3 0,316 0,319 0,322 0,028 0,029 0,031
10 0,50 0,3 0,315 0,319 0,323 0,025 0,027 0,031
20 1,00 0,3 0,316 0,319 0,321 0,027 0,029 0,033
Version: 1
 -36- 1446-18

3.3.4 Definite time 0,05IB, 60 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Range t1 0 s to 60 s
Set t1 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 60 0,027 0,029 0,031 0,020 0,022 0,024
2 0,10 60 0,021 0,025 0,029 0,023 0,026 0,028
5 0,25 60 0,013 0,016 0,019 0,024 0,028 0,031
10 0,50 60 0,014 0,017 0,019 0,026 0,029 0,032
20 1,00 60 0,011 0,014 0,017 0,027 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 60 60,033 60,037 60,040 0,020 0,022 0,024
2 0,10 60 60,029 60,033 60,036 0,023 0,026 0,028
5 0,25 60 60,013 60,019 60,025 0,024 0,028 0,031
10 0,50 60 60,019 60,023 60,027 0,026 0,029 0,032
20 1,00 60 60,019 60,022 60,025 0,027 0,029 0,032
Version: 1
 -37- 1446-18

3.3.5 Definite time 1,0IB, 0 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Range t1 0 s to 60 s
Set t1 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,2 0 0,025 0,028 0,031 0,013 0,015 0,018
2 2,0 0 0,020 0,023 0,027 0,019 0,021 0,025
5 5,0 0 0,015 0,017 0,021 0,024 0,026 0,028
10 10,0 0 0,013 0,015 0,017 0,023 0,027 0,031
20 20,0 0 0,010 0,015 0,018 0,026 0,029 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,2 0 0,025 0,028 0,031 0,013 0,015 0,018
2 2,0 0 0,020 0,023 0,027 0,019 0,021 0,025
5 5,0 0 0,015 0,018 0,021 0,023 0,026 0,028
10 10,0 0 0,013 0,015 0,017 0,023 0,027 0,031
20 20,0 0 0,011 0,015 0,019 0,026 0,029 0,034
Version: 1
 -38- 1446-18

3.3.6 Definite time 1,0IB, 0,3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Range t1 0 s to 60 s
Set t1 0,3 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,2 0,3 0,027 0,029 0,032 0,013 0,015 0,018
2 2,0 0,3 0,020 0,023 0,025 0,020 0,022 0,025
5 5,0 0,3 0,012 0,016 0,019 0,025 0,028 0,031
10 10,0 0,3 0,013 0,016 0,019 0,025 0,027 0,029
20 20,0 0,3 0,013 0,015 0,017 0,025 0,028 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,2 0,3 0,330 0,333 0,335 0,013 0,015 0,018
2 2,0 0,3 0,323 0,327 0,331 0,020 0,022 0,025
5 5,0 0,3 0,319 0,321 0,323 0,025 0,028 0,031
10 10,0 0,3 0,316 0,320 0,324 0,025 0,027 0,029
20 20,0 0,3 0,316 0,319 0,323 0,025 0,027 0,031
Version: 1
 -39- 1446-18

3.3.7 Definite time 1,0IB, 60 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Range t1 0 s to 60 s
Set t1 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,2 60 0,024 0,028 0,031 0,011 0,015 0,019
2 2,0 60 0,022 0,024 0,025 0,023 0,026 0,028
5 5,0 60 0,014 0,017 0,021 0,024 0,027 0,030
10 10,0 - - - - - - -
20 20,0 - - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,2 60 60,033 60,036 60,040 0,011 0,015 0,019
2 2,0 60 60,028 60,032 60,034 0,023 0,026 0,028
5 5,0 60 60,014 60,022 60,029 0,024 0,027 0,030
10 10,0 - - - - - - -
20 20,0 - - - - - - -
Version: 1
 -40- 1446-18

3.3.8 Definite time 4,0IB, 0 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Range t1 0 s to 60 s
Set t1 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 4,8 0 0,026 0,028 0,031 0,011 0,015 0,019
2 8,0 0 0,020 0,023 0,027 0,018 0,022 0,025
5 20,0 0 0,012 0,016 0,019 0,024 0,026 0,028
10 40,0 0 0,013 0,016 0,020 0,023 0,027 0,032
20 80,0 0 0,011 0,014 0,018 0,027 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 4,8 0 0,026 0,028 0,032 0,011 0,015 0,019
2 8,0 0 0,020 0,023 0,027 0,018 0,022 0,025
5 20,0 0 0,012 0,016 0,019 0,024 0,026 0,028
10 40,0 0 0,013 0,016 0,020 0,023 0,027 0,032
20 80,0 0 0,011 0,014 0,018 0,027 0,029 0,031
Version: 1
 -41- 1446-18

3.3.9 Definite time 4,0IB, 0,3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Range t1 0 s to 60 s
Set t1 0,3 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 4,8 0,3 0,025 0,028 0,031 0,012 0,014 0,016
2 8,0 0,3 0,019 0,022 0,026 0,019 0,021 0,024
5 20,0 0,3 0,013 0,016 0,018 0,022 0,025 0,029
10 40,0 0,3 - - - - - -
20 80,0 0,3 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 4,8 0,3 0,330 0,332 0,334 0,012 0,014 0,016
2 8,0 0,3 0,323 0,326 0,330 0,019 0,021 0,024
5 20,0 0,3 0,316 0,320 0,324 0,022 0,025 0,029
10 40,0 0,3 - - - - - -
20 80,0 0,3 - - - - - -
Version: 1
 -42- 1446-18

3.3.10 Definite time 4,0IB, 60 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Range t1 0 s to 60 s
Set t1 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 4,8 60 0,024 0,026 0,027 0,010 0,012 0,014
2 8,0 60 - - - - - -
5 20,0 60 - - - - - -
10 40,0 60 - - - - - -
20 80,0 60 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 4,8 60 60,024 60,029 60,036 0,010 0,012 0,014
2 8,0 60 - - - - - -
5 20,0 60 - - - - - -
10 40,0 60 - - - - - -
20 80,0 60 - - - - - -
Version: 1
 -43- 1446-18

3.3.11 Reset time 0,05IB

Characteristic test data

Sample IED 3A
Rated current 1A
Rated frequency 50 Hz
DirMode Non-directional
Curve family IEC-DT
tReset 0s
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Time t1 0s

Initial value End value Measured reset times trip contact Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 0,1 0,8 0,04 no reset no reset no reset no reset no reset - - -
2 0,1 0,4 0,02 0,023 0,027 0,030 0,024 0,027 0,023 0,026 0,030
2 0,1 0,2 0,01 0,028 0,026 0,028 0,023 0,023 0,023 0,026 0,028
2 0,1 0,1 0,005 - - - - - - - -
2 0,1 0 0 0,026 0,024 0,027 0,026 0,023 0,023 0,025 0,027
Version: 1
 -44- 1446-18

3.3.12 Reset time 1,0IB

Characteristic test data

Sample IED 3A
Rated current 1A
Rated frequency 50 Hz
DirMode Non-directional
Curve family IEC-DT
tReset 0s
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Time t1 0s
Fault L2-N

Initial value End value Measured reset times trip contact Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 2 0,8 0,8 0,029 0,027 0,032 0,030 0,028 0,027 0,029 0,032
2 2 0,4 0,4 0,027 0,026 0,023 0,021 0,029 0,021 0,025 0,029
2 2 0,2 0,2 0,026 0,029 0,026 0,025 0,026 0,025 0,026 0,029
2 2 0,1 0,1 0,020 0,021 0,024 0,026 0,024 0,020 0,023 0,026
2 2 0 0 0,019 0,025 0,019 0,025 0,024 0,019 0,022 0,025
Version: 1
 -45- 1446-18

3.3.13 Reset time 10,0IB

Characteristic test data

Sample IED 3A
Rated current 1A
Rated frequency 50 Hz
DirMode Non-directional
Curve family IEC-DT
tReset 0s
Range Gs 0,05 x Irated to 25 x Irated
Gs 10 x Irated
Time t1 0s
Fault S-N

Initial value End value Measured reset times trip contact Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 20 0,8 8 0,026 0,027 0,028 0,025 0,029 0,025 0,027 0,029
2 20 0,4 4 0,027 0,024 0,023 0,025 0,024 0,023 0,025 0,027
2 20 0,2 2 0,027 0,026 0,025 0,020 0,024 0,020 0,025 0,027
2 20 0,1 1 0,022 0,023 0,026 0,027 0,022 0,022 0,024 0,027
2 20 0 0 0,020 0,021 0,021 0,018 0,024 0,018 0,021 0,024
Version: 1
 -46- 1446-18

3.3.14 IEC Normal inverse time 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 11 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Function 51
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 1,916 0,025 0,028 0,033 0,019 0,022 0,026
2 0,10 0,501 0,021 0,023 0,024 0,022 0,028 0,031
5 0,25 0,214 0,012 0,014 0,015 0,025 0,027 0,029
10 0,50 0,149 0,013 0,016 0,018 0,026 0,029 0,030
20 1,00 0,113 0,011 0,014 0,017 0,025 0,028 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 1,916 2,036 2,063 2,081 0,019 0,022 0,025
2 0,10 0,501 0,510 0,512 0,513 0,021 0,028 0,031
5 0,25 0,214 0,216 0,220 0,223 0,025 0,027 0,029
10 0,50 0,149 0,146 0,149 0,152 0,026 0,028 0,030
20 1,00 0,113 0,109 0,113 0,116 0,025 0,028 0,031
Version: 1
 -47- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Function 51
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 19,162 0,026 0,028 0,030 0,018 0,021 0,023
2 0,10 5,015 0,023 0,026 0,029 0,022 0,026 0,029
5 0,25 2,140 0,014 0,017 0,019 0,024 0,027 0,030
10 0,50 1,485 0,013 0,014 0,016 0,025 0,029 0,032
20 1,00 1,134 0,014 0,015 0,016 0,025 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 19,162 20,289 20,507 20,763 0,018 0,021 0,023
2 0,10 5,015 5,070 5,077 5,084 0,022 0,026 0,028
5 0,25 2,140 2,142 2,146 2,150 0,024 0,027 0,030
10 0,50 1,485 1,483 1,486 1,488 0,025 0,029 0,032
20 1,00 1,134 1,133 1,135 1,136 0,025 0,030 0,034
Version: 1
 -48- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 10
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 383,237 0,028 0,029 0,030 0,020 0,023 0,025
2 0,10 100,290 0,024 0,026 0,027 0,023 0,026 0,031
5 0,25 42,797 0,014 0,017 0,020 0,025 0,026 0,027
10 0,50 29,706 0,011 0,014 0,017 0,024 0,028 0,031
20 1,00 22,674 0,011 0,013 0,016 0,028 0,030 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 383,237 401,531 403,655 406,066 0,020 0,023 0,025
2 0,10 100,290 100,835 101,094 101,244 0,023 0,026 0,031
5 0,25 42,797 42,803 42,819 42,836 0,025 0,026 0,027
10 0,50 29,706 29,698 29,704 29,710 0,024 0,028 0,031
20 1,00 22,674 22,661 22,666 22,671 0,027 0,030 0,032
Version: 1
 -49- 1446-18

3.3.15 IEC Normal inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault R-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 1,916 0,025 0,028 0,032 0,013 0,016 0,019
2 2,00 0,501 0,024 0,027 0,029 0,023 0,025 0,027
5 5,00 0,214 0,017 0,017 0,017 0,027 0,027 0,028
10 10,00 0,149 0,013 0,015 0,018 0,025 0,028 0,031
20 20,00 0,113 0,012 0,016 0,018 0,026 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 1,916 1,912 1,916 1,920 0,013 0,016 0,019
2 2,00 0,501 0,505 0,507 0,509 0,023 0,025 0,027
5 5,00 0,214 0,209 0,209 0,209 0,027 0,027 0,028
10 10,00 0,149 0,147 0,149 0,152 0,025 0,028 0,031
20 20,00 0,113 0,111 0,114 0,117 0,026 0,030 0,033
Version: 1
 -50- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 19,162 0,025 0,028 0,031 0,012 0,015 0,020
2 2,00 5,015 0,022 0,024 0,028 0,020 0,023 0,027
5 5,00 2,140 0,012 0,015 0,018 0,023 0,027 0,029
10 10,00 1,485 0,011 0,015 0,016 0,025 0,028 0,032
20 20,00 1,134 0,012 0,015 0,017 0,027 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 19,162 19,078 19,083 19,091 0,012 0,015 0,020
2 2,00 5,015 5,006 5,009 5,012 0,020 0,023 0,027
5 5,00 2,140 2,136 2,139 2,143 0,023 0,027 0,029
10 10,00 1,485 1,487 1,490 1,493 0,025 0,028 0,032
20 20,00 1,134 1,131 1,135 1,138 0,026 0,029 0,032
Version: 1
 -51- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 10
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 383,237 0,027 0,029 0,032 0,013 0,017 0,019
2 2,00 100,290 0,021 0,024 0,026 0,019 0,023 0,027
5 5,00 42,797 0,013 0,016 0,019 0,024 0,027 0,030
10 10,00 29,706 - - - - - -
20 20,00 22,674 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 383,237 381,238 381,308 381,409 0,013 0,017 0,019
2 2,00 100,290 100,086 100,095 100,105 0,019 0,023 0,027
5 5,00 42,797 42,736 42,738 42,742 0,024 0,026 0,030
10 10,00 29,706 - - - - - -
20 20,00 22,674 - - - - - -
Version: 1
 -52- 1446-18

3.3.16 IEC Normal inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 1,916 0,028 0,030 0,032 0,013 0,016 0,019
2 4,00 0,501 0,021 0,024 0,027 0,021 0,024 0,025
5 10,00 0,214 0,014 0,017 0,021 0,025 0,027 0,031
10 20,00 0,149 0,015 0,016 0,020 0,024 0,029 0,033
20 40,00 0,113 0,013 0,015 0,016 0,027 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 1,916 1,906 1,910 1,913 0,013 0,016 0,019
2 4,00 0,501 0,502 0,504 0,507 0,021 0,024 0,025
5 10,00 0,214 0,210 0,214 0,218 0,025 0,027 0,031
10 20,00 0,149 0,145 0,149 0,153 0,024 0,029 0,033
20 40,00 0,113 0,109 0,111 0,113 0,027 0,029 0,031
Version: 1
 -53- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 19,162 0,026 0,029 0,032 0,012 0,016 0,019
2 4,00 5,015 0,020 0,023 0,026 0,018 0,021 0,024
5 10,00 2,140 0,012 0,016 0,020 0,024 0,027 0,031
10 20,00 1,485 0,012 0,015 0,018 0,027 0,030 0,032
20 40,00 1,134 0,013 0,015 0,019 0,027 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 19,162 18,977 18,987 18,994 0,012 0,016 0,019
2 4,00 5,015 4,997 4,999 5,003 0,018 0,021 0,024
5 10,00 2,140 2,146 2,148 2,150 0,024 0,027 0,030
10 20,00 1,485 1,489 1,492 1,494 0,027 0,030 0,032
20 40,00 1,134 1,129 1,132 1,136 0,027 0,030 0,034
Version: 1
 -54- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 76,647 0,026 0,028 0,030 0,012 0,013 0,014
2 4,00 20,058 0,021 0,025 0,026 0,019 0,023 0,028
5 10,00 8,559 0,016 0,018 0,021 0,025 0,028 0,030
10 20,00 5,941 - - - - - -
20 40,00 4,535 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 76,647 75,924 75,932 75,942 0,012 0,013 0,014
2 4,00 20,058 19,998 20,001 20,004 0,019 0,023 0,028
5 10,00 8,559 8,570 8,574 8,578 0,025 0,028 0,030
10 20,00 5,941 - - - - - -
20 40,00 4,535 - - - - - -
Version: 1
 -55- 1446-18

3.3.17 IEC Very inverse time 0,05IB

Standard IEC 60255-1, subclause 6.5

Reference IEC 60255-151
Test date 12 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 24 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,375 0,023 0,025 0,028 0,017 0,021 0,026
2 0,10 0,675 0,020 0,024 0,028 0,020 0,023 0,025
5 0,25 0,169 0,013 0,014 0,016 0,025 0,028 0,032
10 0,50 0,075 0,010 0,013 0,017 0,028 0,030 0,031
20 1,00 0,036 0,011 0,014 0,018 0,028 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,375 3,672 3,771 3,875 0,017 0,021 0,026
2 0,10 0,675 0,691 0,694 0,698 0,020 0,022 0,025
5 0,25 0,169 0,167 0,173 0,181 0,025 0,028 0,032
10 0,50 0,075 0,072 0,077 0,084 0,028 0,030 0,031
20 1,00 0,036 0,032 0,036 0,044 0,028 0,031 0,035
Version: 1
 -56- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 33,750 0,024 0,028 0,031 0,018 0,021 0,023
2 0,10 6,750 0,020 0,024 0,028 0,019 0,024 0,026
5 0,25 1,688 0,012 0,015 0,017 0,027 0,030 0,034
10 0,50 0,750 0,012 0,014 0,018 0,028 0,031 0,035
20 1,00 0,355 0,010 0,014 0,016 0,028 0,030 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 33,750 36,033 36,641 37,274 0,018 0,021 0,023
2 0,10 6,750 6,807 6,829 6,868 0,019 0,024 0,026
5 0,25 1,688 1,686 1,690 1,695 0,027 0,030 0,034
10 0,50 0,750 0,744 0,751 0,756 0,028 0,031 0,035
20 1,00 0,355 0,351 0,356 0,364 0,028 0,030 0,031
Version: 1
 -57- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 135,000 0,024 0,025 0,027 0,017 0,020 0,024
2 0,10 27,000 0,020 0,021 0,023 0,020 0,024 0,026
5 0,25 6,750 0,012 0,014 0,015 0,027 0,029 0,031
10 0,50 3,000 0,009 0,011 0,013 0,028 0,029 0,031
20 1,00 1,421 0,009 0,013 0,017 0,027 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 135,000 144,683 145,209 145,910 0,017 0,020 0,024
2 0,10 27,000 27,191 27,246 27,374 0,020 0,024 0,025
5 0,25 6,750 6,741 6,744 6,748 0,027 0,029 0,031
10 0,50 3,000 2,995 3,001 3,003 0,027 0,029 0,031
20 1,00 1,421 1,415 1,419 1,426 0,027 0,031 0,034
Version: 1
 -58- 1446-18

3.3.18 IEC Very inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,375 0,023 0,027 0,030 0,009 0,013 0,016
2 2,00 0,675 0,018 0,022 0,028 0,016 0,018 0,021
5 5,00 0,169 0,011 0,015 0,018 0,022 0,025 0,029
10 10,00 0,075 0,010 0,015 0,017 0,029 0,031 0,032
20 20,00 0,036 0,013 0,014 0,015 0,026 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,375 3,366 3,370 3,373 0,009 0,013 0,016
2 2,00 0,675 0,674 0,678 0,683 0,016 0,018 0,021
5 5,00 0,169 0,165 0,169 0,174 0,022 0,025 0,029
10 10,00 0,075 0,073 0,075 0,082 0,029 0,031 0,032
20 20,00 0,036 0,037 0,039 0,043 0,026 0,029 0,032
Version: 1
 -59- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 33,750 0,025 0,027 0,031 0,011 0,012 0,014
2 2,00 6,750 0,018 0,022 0,025 0,018 0,022 0,024
5 5,00 1,688 0,013 0,015 0,019 0,020 0,024 0,026
10 10,00 0,750 0,010 0,013 0,016 0,026 0,028 0,032
20 20,00 0,355 0,009 0,009 0,010 0,027 0,028 0,028

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 33,750 33,558 33,587 33,619 0,011 0,012 0,014
2 2,00 6,750 6,733 6,739 6,745 0,018 0,021 0,024
5 5,00 1,688 1,681 1,685 1,693 0,020 0,024 0,026
10 10,00 0,750 0,751 0,756 0,763 0,026 0,028 0,032
20 20,00 0,355 0,370 0,370 0,370 0,027 0,028 0,028
Version: 1
 -60- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 135,000 0,023 0,025 0,027 0,008 0,012 0,016
2 2,00 27,000 0,023 0,024 0,027 0,018 0,020 0,026
5 5,00 6,750 0,011 0,014 0,017 0,020 0,025 0,028
10 10,00 3,000 0,010 0,014 0,018 0,025 0,030 0,032
20 20,00 1,421 0,009 0,013 0,017 0,028 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 135,000 134,100 134,159 134,199 0,008 0,012 0,016
2 2,00 27,000 26,934 26,940 26,946 0,018 0,020 0,026
5 5,00 6,750 6,730 6,735 6,740 0,020 0,025 0,028
10 10,00 3,000 3,007 3,013 3,019 0,025 0,030 0,032
20 20,00 1,421 1,430 1,433 1,437 0,028 0,031 0,035
Version: 1
 -61- 1446-18

3.3.19 IEC Very inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,375 0,022 0,025 0,028 0,009 0,012 0,015
2 4,00 0,675 0,021 0,023 0,025 0,018 0,020 0,022
5 10,00 0,169 0,010 0,015 0,019 0,021 0,024 0,027
10 20,00 0,075 0,016 0,017 0,018 0,030 0,031 0,032
20 40,00 0,036 0,011 0,012 0,014 0,028 0,028 0,029

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,375 3,350 3,353 3,357 0,009 0,012 0,015
2 4,00 0,675 0,678 0,678 0,680 0,018 0,020 0,022
5 10,00 0,169 0,168 0,171 0,178 0,021 0,024 0,027
10 20,00 0,075 0,071 0,073 0,074 0,030 0,031 0,032
20 40,00 0,036 0,036 0,042 0,045 0,028 0,028 0,029
Version: 1
 -62- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 33,750 0,023 0,025 0,026 0,008 0,011 0,013
2 4,00 6,750 0,019 0,022 0,026 0,017 0,022 0,025
5 10,00 1,688 0,010 0,014 0,017 0,025 0,026 0,029
10 20,00 0,750 0,012 0,015 0,018 0,027 0,029 0,032
20 40,00 0,355 0,009 0,011 0,012 0,026 0,028 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 33,750 33,464 33,472 33,487 0,008 0,011 0,013
2 4,00 6,750 6,723 6,726 6,728 0,017 0,022 0,025
5 10,00 1,688 1,693 1,698 1,709 0,024 0,026 0,029
10 20,00 0,750 0,752 0,757 0,763 0,027 0,029 0,032
20 40,00 0,355 0,357 0,361 0,364 0,026 0,028 0,030
Version: 1
 -63- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 135,000 0,022 0,026 0,029 0,011 0,014 0,016
2 4,00 27,000 0,021 0,024 0,026 0,017 0,021 0,024
5 10,00 6,750 0,011 0,014 0,017 0,021 0,026 0,029
10 20,00 3,000 0,010 0,015 0,018 0,027 0,029 0,032
20 40,00 1,421 0,009 0,012 0,016 0,026 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 135,000 133,848 133,876 133,895 0,011 0,014 0,016
2 4,00 27,000 26,894 26,900 26,905 0,017 0,021 0,024
5 10,00 6,750 6,778 6,782 6,788 0,020 0,025 0,029
10 20,00 3,000 3,014 3,020 3,028 0,027 0,029 0,032
20 40,00 1,421 1,415 1,422 1,428 0,026 0,030 0,033
Version: 1
 -64- 1446-18

3.3.20 IEC Extremely inverse time 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 13 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 9,091 0,029 0,032 0,035 0,017 0,020 0,023
2 0,10 1,333 0,021 0,024 0,027 0,024 0,027 0,029
5 0,25 0,167 0,017 0,020 0,022 0,029 0,031 0,034
10 0,50 0,040 0,010 0,010 0,011 0,030 0,031 0,031
20 1,00 0,010 0,009 0,013 0,014 0,026 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 9,091 9,470 9,529 9,575 0,017 0,019 0,023
2 0,10 1,333 1,366 1,371 1,376 0,024 0,027 0,029
5 0,25 0,167 0,166 0,177 0,187 0,029 0,030 0,034
10 0,50 0,040 0,058 0,058 0,059 0,030 0,030 0,031
20 1,00 0,010 0,019 0,024 0,033 0,026 0,029 0,032
Version: 1
 -65- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 90,909 0,027 0,032 0,035 0,016 0,021 0,025
2 0,10 13,333 0,020 0,022 0,025 0,026 0,028 0,032
5 0,25 1,667 0,018 0,020 0,023 0,027 0,030 0,033
10 0,50 0,414 0,010 0,014 0,019 0,026 0,030 0,033
20 1,00 0,100 0,008 0,013 0,016 0,026 0,030 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 90,909 95,442 96,921 100,066 0,016 0,021 0,025
2 0,10 13,333 13,495 13,565 13,640 0,026 0,028 0,032
5 0,25 1,667 1,679 1,685 1,689 0,027 0,030 0,033
10 0,50 0,414 0,418 0,422 0,428 0,026 0,030 0,033
20 1,00 0,100 0,117 0,118 0,123 0,026 0,030 0,035
Version: 1
 -66- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 363,636 0,029 0,032 0,035 0,017 0,021 0,026
2 0,10 53,333 0,023 0,024 0,026 0,026 0,028 0,031
5 0,25 6,667 0,017 0,021 0,024 0,025 0,029 0,032
10 0,50 1,616 0,011 0,012 0,013 0,025 0,028 0,033
20 1,00 0,401 0,011 0,013 0,016 0,026 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 363,636 378,912 379,980 381,537 0,017 0,021 0,026
2 0,10 53,333 54,111 54,297 54,479 0,026 0,028 0,031
5 0,25 6,667 6,684 6,694 6,728 0,025 0,029 0,031
10 0,50 1,616 1,629 1,633 1,637 0,025 0,028 0,033
20 1,00 0,401 0,414 0,417 0,420 0,026 0,029 0,032
Version: 1
 -67- 1446-18

3.3.21 IEC Extremely inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 9,091 0,028 0,030 0,034 0,012 0,019 0,022
2 2,00 1,333 0,018 0,022 0,026 0,017 0,021 0,025
5 5,00 0,167 0,015 0,018 0,022 0,029 0,031 0,034
10 10,00 0,040 0,012 0,013 0,015 0,026 0,028 0,030
20 20,00 0,010 0,010 0,013 0,015 0,028 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 9,091 9,029 9,045 9,063 0,012 0,019 0,022
2 2,00 1,333 1,333 1,336 1,338 0,017 0,021 0,025
5 5,00 0,167 0,165 0,176 0,185 0,029 0,031 0,033
10 10,00 0,040 0,051 0,054 0,058 0,026 0,028 0,029
20 20,00 0,010 0,021 0,024 0,028 0,028 0,030 0,033
Version: 1
 -68- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 90,909 0,029 0,032 0,035 0,012 0,017 0,020
2 2,00 13,333 0,021 0,023 0,026 0,016 0,020 0,023
5 5,00 1,667 0,016 0,018 0,021 0,027 0,029 0,032
10 10,00 0,414 0,012 0,014 0,016 0,028 0,031 0,034
20 20,00 0,100 0,010 0,013 0,017 0,026 0,028 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 90,909 90,167 90,188 90,215 0,012 0,017 0,020
2 2,00 13,333 13,279 13,286 13,293 0,016 0,020 0,023
5 5,00 1,667 1,659 1,668 1,673 0,027 0,029 0,032
10 10,00 0,414 0,419 0,422 0,426 0,028 0,031 0,034
20 20,00 0,100 0,116 0,119 0,122 0,026 0,028 0,032
Version: 1
 -69- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 363,636 0,030 0,031 0,033 0,014 0,017 0,021
2 2,00 53,333 0,022 0,024 0,026 0,018 0,020 0,023
5 5,00 6,667 0,017 0,020 0,024 0,027 0,028 0,029
10 10,00 1,616 0,011 0,013 0,014 0,025 0,028 0,031
20 20,00 0,401 0,015 0,016 0,016 0,027 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 363,636 360,869 361,063 361,262 0,014 0,017 0,021
2 2,00 53,333 53,136 53,148 53,159 0,018 0,020 0,023
5 5,00 6,667 6,638 6,645 6,650 0,027 0,028 0,029
10 10,00 1,616 1,636 1,639 1,643 0,025 0,027 0,031
20 20,00 0,401 0,417 0,419 0,425 0,027 0,030 0,034
Version: 1
 -70- 1446-18

3.3.22 IEC Extremely inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 9,091 0,029 0,031 0,034 0,015 0,018 0,021
2 4,00 1,333 0,021 0,023 0,023 0,017 0,020 0,024
5 10,00 0,167 0,015 0,020 0,023 0,026 0,029 0,032
10 20,00 0,040 0,010 0,015 0,018 0,027 0,029 0,030
20 40,00 0,010 0,009 0,012 0,016 0,028 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 9,091 9,000 9,009 9,020 0,015 0,018 0,021
2 4,00 1,333 1,325 1,327 1,328 0,017 0,020 0,024
5 10,00 0,167 0,167 0,175 0,183 0,026 0,029 0,032
10 20,00 0,040 0,051 0,055 0,060 0,027 0,029 0,030
20 40,00 0,010 0,021 0,024 0,027 0,028 0,030 0,034
Version: 1
 -71- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 90,909 0,028 0,031 0,033 0,016 0,018 0,020
2 4,00 13,333 0,020 0,024 0,026 0,018 0,023 0,039
5 10,00 1,667 0,017 0,019 0,022 0,027 0,028 0,030
10 20,00 0,414 0,011 0,013 0,014 0,027 0,031 0,033
20 40,00 0,100 0,012 0,015 0,016 0,026 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 90,909 89,888 89,922 89,941 0,016 0,018 0,020
2 4,00 13,333 13,257 13,258 13,260 0,018 0,019 0,021
5 10,00 1,667 1,678 1,684 1,692 0,027 0,028 0,030
10 20,00 0,414 0,420 0,423 0,428 0,027 0,031 0,033
20 40,00 0,100 0,111 0,113 0,117 0,026 0,029 0,031
Version: 1
 -72- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 363,636 0,027 0,031 0,035 0,017 0,018 0,019
2 4,00 53,333 0,022 0,023 0,026 0,017 0,020 0,023
5 10,00 6,667 0,015 0,019 0,022 0,025 0,027 0,029
10 20,00 1,616 0,011 0,013 0,016 0,026 0,030 0,033
20 40,00 0,401 0,009 0,013 0,016 0,028 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 363,636 360,725 361,014 361,493 0,017 0,018 0,019
2 4,00 53,333 53,072 53,075 53,077 0,017 0,020 0,023
5 10,00 6,667 6,707 6,711 6,721 0,025 0,027 0,029
10 20,00 1,616 1,644 1,648 1,653 0,026 0,030 0,033
20 40,00 0,401 0,413 0,415 0,418 0,028 0,031 0,033
Version: 1
 -73- 1446-18

3.3.23 IEC Long time inverse 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 14 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 30,000 0,026 0,030 0,034 0,021 0,023 0,026
2 0,10 6,000 0,019 0,023 0,026 0,022 0,025 0,027
5 0,25 1,500 0,015 0,018 0,021 0,025 0,028 0,032
10 0,50 0,667 0,015 0,017 0,019 0,030 0,032 0,033
20 1,00 0,316 0,011 0,015 0,018 0,025 0,029 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 30,000 31,844 32,329 32,860 0,021 0,023 0,026
2 0,10 6,000 6,044 6,073 6,093 0,022 0,025 0,027
5 0,25 1,500 1,498 1,503 1,512 0,025 0,028 0,032
10 0,50 0,667 0,664 0,665 0,666 0,030 0,032 0,033
20 1,00 0,316 0,316 0,321 0,325 0,025 0,029 0,034
Version: 1
 -74- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 300,000 0,025 0,029 0,031 0,019 0,022 0,025
2 0,10 60,000 0,020 0,025 0,028 0,025 0,028 0,030
5 0,25 15,000 0,012 0,017 0,021 0,024 0,027 0,030
10 0,50 6,667 0,011 0,015 0,017 0,027 0,028 0,030
20 1,00 3,158 0,010 0,014 0,019 0,031 0,031 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 300,000 315,226 316,823 318,388 0,019 0,022 0,025
2 0,10 60,000 60,363 60,525 60,637 0,025 0,028 0,030
5 0,25 15,000 14,987 15,006 15,031 0,024 0,027 0,030
10 0,50 6,667 6,651 6,660 6,669 0,027 0,028 0,030
20 1,00 3,158 3,153 3,157 3,163 0,031 0,031 0,033
Version: 1
 -75- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 1
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 600,000 0,026 0,030 0,031 0,020 0,022 0,026
2 0,10 120,000 0,020 0,022 0,025 0,023 0,026 0,028
5 0,25 30,000 0,013 0,018 0,020 0,023 0,027 0,029
10 0,50 13,333 0,012 0,015 0,020 0,026 0,029 0,032
20 1,00 6,316 0,010 0,012 0,014 0,026 0,027 0,027

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 600,000 630,089 634,902 639,708 0,019 0,022 0,026
2 0,10 120,000 120,735 121,177 121,350 0,022 0,026 0,027
5 0,25 30,000 29,978 29,995 30,027 0,023 0,027 0,029
10 0,50 13,333 13,318 13,322 13,324 0,026 0,029 0,032
20 1,00 6,316 6,307 6,309 6,315 0,026 0,026 0,027
Version: 1
 -76- 1446-18

3.3.24 IEC Long time inverse 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 30,000 0,026 0,028 0,029 0,015 0,017 0,018
2 2,00 6,000 0,025 0,026 0,027 0,022 0,024 0,027
5 5,00 1,500 0,012 0,016 0,019 0,027 0,028 0,029
10 10,00 0,667 0,017 0,017 0,018 0,023 0,028 0,033
20 20,00 0,316 0,010 0,013 0,018 0,025 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 30,000 29,723 29,728 29,731 0,015 0,016 0,018
2 2,00 6,000 5,978 5,981 5,986 0,022 0,024 0,027
5 5,00 1,500 1,491 1,502 1,509 0,026 0,027 0,029
10 10,00 0,667 0,665 0,668 0,672 0,023 0,028 0,033
20 20,00 0,316 0,312 0,321 0,324 0,025 0,029 0,032
Version: 1
 -77- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 300,000 0,024 0,027 0,029 0,012 0,017 0,019
2 2,00 60,000 0,020 0,023 0,026 0,018 0,021 0,025
5 5,00 15,000 0,012 0,016 0,021 0,023 0,027 0,032
10 10,00 6,667 0,011 0,015 0,018 0,025 0,027 0,031
20 20,00 3,158 0,016 0,017 0,018 0,025 0,027 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 300,000 296,859 296,895 296,926 0,012 0,017 0,019
2 2,00 60,000 59,743 59,747 59,752 0,018 0,021 0,025
5 5,00 15,000 14,947 14,953 14,958 0,023 0,027 0,032
10 10,00 6,667 6,682 6,688 6,695 0,025 0,027 0,031
20 20,00 3,158 3,176 3,177 3,179 0,025 0,027 0,032
Version: 1
 -78- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 1
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 600,000 0,026 0,029 0,033 0,015 0,017 0,018
2 2,00 120,000 0,020 0,024 0,025 0,021 0,022 0,023
5 5,00 30,000 0,013 0,017 0,021 0,024 0,026 0,029
10 10,00 13,333 0,013 0,016 0,018 0,023 0,028 0,031
20 20,00 6,316 0,011 0,012 0,014 0,025 0,028 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 600,000 593,399 593,494 593,578 0,015 0,017 0,018
2 2,00 120,000 119,466 119,472 119,479 0,021 0,022 0,023
5 5,00 30,000 29,883 29,890 29,901 0,023 0,026 0,029
10 10,00 13,333 13,368 13,371 13,373 0,023 0,028 0,031
20 20,00 6,316 6,354 6,357 6,358 0,025 0,028 0,032
Version: 1
 -79- 1446-18

3.3.25 IEC Long time inverse 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 30,000 0,027 0,029 0,031 0,012 0,016 0,020
2 4,00 6,000 0,023 0,025 0,027 0,019 0,022 0,025
5 10,00 1,500 0,012 0,016 0,020 0,024 0,027 0,029
10 20,00 0,667 0,012 0,014 0,019 0,025 0,027 0,028
20 40,00 0,316 0,011 0,015 0,018 0,027 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 30,000 29,553 29,562 29,571 0,012 0,016 0,020
2 4,00 6,000 5,967 5,968 5,970 0,019 0,022 0,025
5 10,00 1,500 1,505 1,509 1,518 0,024 0,027 0,029
10 20,00 0,667 0,667 0,675 0,679 0,025 0,027 0,028
20 40,00 0,316 0,315 0,321 0,326 0,027 0,030 0,033
Version: 1
 -80- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 300,000 0,023 0,027 0,030 0,013 0,016 0,017
2 4,00 60,000 0,021 0,024 0,028 0,021 0,024 0,027
5 10,00 15,000 0,013 0,016 0,019 0,025 0,027 0,028
10 20,00 6,667 - - - - - -
20 2,40 3,158 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 300,000 295,405 295,436 295,504 0,013 0,016 0,017
2 4,00 60,000 59,638 59,645 59,650 0,021 0,024 0,027
5 10,00 15,000 15,035 15,039 15,045 0,025 0,027 0,028
10 20,00 6,667 - - - - - -
20 2,40 3,158 - - - - - -
Version: 1
 -81- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 1
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 600,000 0,024 0,029 0,033 0,011 0,014 0,017
2 4,00 120,000 0,019 0,023 0,027 0,018 0,022 0,024
5 10,00 30,000 0,013 0,016 0,019 0,024 0,027 0,031
10 20,00 13,333 - - - - - -
20 2,40 6,316 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 600,000 598,707 599,832 601,377 0,011 0,014 0,017
2 4,00 120,000 119,812 119,815 119,819 0,018 0,021 0,024
5 10,00 30,000 30,155 30,161 30,167 0,024 0,027 0,031
10 20,00 13,333 - - - - - -
20 2,40 6,316 - - - - - -
Version: 1
 -82- 1446-18

3.3.26 IEC Short time inverse 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 19 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,342 0,025 0,026 0,027 0,020 0,023 0,025
2 0,10 0,089 0,023 0,025 0,028 0,021 0,027 0,039
5 0,25 0,038 0,016 0,016 0,016 0,025 0,027 0,032
10 0,50 0,026 0,010 0,014 0,018 0,030 0,032 0,033
20 1,00 0,020 0,010 0,013 0,015 0,028 0,030 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,342 0,371 0,382 0,387 0,020 0,023 0,025
2 0,10 0,089 0,095 0,097 0,099 0,019 0,023 0,026
5 0,25 0,038 0,033 0,038 0,040 0,025 0,027 0,032
10 0,50 0,026 0,023 0,025 0,026 0,030 0,032 0,033
20 1,00 0,020 0,016 0,021 0,024 0,028 0,029 0,031
Version: 1
 -83- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,416 0,024 0,027 0,029 0,019 0,022 0,026
2 0,10 0,889 0,019 0,023 0,026 0,019 0,023 0,028
5 0,25 0,376 0,011 0,013 0,014 0,025 0,029 0,032
10 0,50 0,259 0,011 0,015 0,018 0,026 0,030 0,034
20 1,00 0,196 0,010 0,013 0,015 0,028 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,416 3,595 3,654 3,713 0,019 0,022 0,026
2 0,10 0,889 0,896 0,899 0,902 0,019 0,023 0,028
5 0,25 0,376 0,373 0,377 0,381 0,025 0,028 0,032
10 0,50 0,259 0,256 0,257 0,260 0,026 0,030 0,034
20 1,00 0,196 0,189 0,193 0,197 0,028 0,031 0,035
Version: 1
 -84- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 13,662 0,024 0,027 0,029 0,020 0,021 0,024
2 0,10 3,557 0,020 0,023 0,026 0,019 0,023 0,027
5 0,25 1,504 0,011 0,014 0,017 0,026 0,029 0,033
10 0,50 1,037 0,012 0,013 0,014 0,025 0,029 0,034
20 1,00 0,786 0,012 0,014 0,016 0,029 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 13,662 14,456 14,546 14,646 0,020 0,021 0,024
2 0,10 3,557 3,580 3,583 3,587 0,019 0,023 0,027
5 0,25 1,504 1,501 1,504 1,508 0,026 0,029 0,033
10 0,50 1,037 1,031 1,034 1,037 0,025 0,029 0,034
20 1,00 0,786 0,780 0,782 0,784 0,029 0,031 0,034
Version: 1
 -85- 1446-18

3.3.27 IEC Short time inverse 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 0,342 0,025 0,026 0,028 0,008 0,013 0,017
2 2,00 0,089 0,022 0,023 0,025 0,017 0,020 0,025
5 5,00 0,038 0,010 0,012 0,014 0,020 0,025 0,028
10 10,00 0,026 0,012 0,014 0,016 0,027 0,028 0,029
20 20,00 0,020 0,012 0,014 0,016 0,027 0,029 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 0,342 0,345 0,347 0,348 0,008 0,013 0,017
2 2,00 0,089 0,094 0,095 0,098 0,017 0,020 0,025
5 5,00 0,038 0,036 0,038 0,044 0,020 0,024 0,028
10 10,00 0,026 0,019 0,022 0,025 0,027 0,028 0,029
20 20,00 0,020 0,021 0,023 0,025 0,027 0,029 0,030
Version: 1
 -86- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,416 0,021 0,026 0,029 0,009 0,013 0,017
2 2,00 0,889 0,020 0,023 0,025 0,017 0,022 0,025
5 5,00 0,376 0,015 0,015 0,016 0,024 0,025 0,025
10 10,00 0,259 0,011 0,014 0,018 0,027 0,029 0,033
20 20,00 0,196 0,009 0,013 0,017 0,026 0,029 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,416 3,399 3,402 3,406 0,009 0,013 0,017
2 2,00 0,889 0,886 0,889 0,893 0,017 0,021 0,025
5 5,00 0,376 0,375 0,375 0,376 0,024 0,025 0,025
10 10,00 0,259 0,253 0,258 0,260 0,026 0,029 0,033
20 20,00 0,196 0,189 0,193 0,196 0,026 0,029 0,033
Version: 1
 -87- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 13,662 0,023 0,026 0,028 0,009 0,012 0,015
2 2,00 3,557 0,020 0,023 0,026 0,018 0,021 0,023
5 5,00 1,504 0,012 0,015 0,019 0,022 0,025 0,028
10 10,00 1,037 0,009 0,013 0,017 0,026 0,031 0,035
20 20,00 0,786 0,008 0,013 0,016 0,026 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 13,662 13,584 13,592 13,597 0,008 0,012 0,015
2 2,00 3,557 3,549 3,552 3,554 0,018 0,021 0,023
5 5,00 1,504 1,496 1,501 1,506 0,022 0,025 0,028
10 10,00 1,037 1,034 1,037 1,042 0,026 0,031 0,034
20 20,00 0,786 0,783 0,785 0,788 0,026 0,03 0,035
Version: 1
 -88- 1446-18

3.3.28 IEC Short time inverse 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 0,342 0,022 0,024 0,029 0,012 0,014 0,015
2 4,00 0,089 0,019 0,021 0,025 0,020 0,022 0,024
5 10,00 0,038 0,011 0,016 0,019 0,022 0,023 0,024
10 20,00 0,026 0,010 0,012 0,016 0,026 0,030 0,033
20 40,00 0,020 0,010 0,012 0,013 0,027 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 0,342 0,343 0,345 0,350 0,012 0,013 0,015
2 4,00 0,089 0,091 0,094 0,097 0,020 0,022 0,024
5 10,00 0,038 0,032 0,036 0,044 0,022 0,023 0,024
10 20,00 0,026 0,026 0,027 0,029 0,026 0,030 0,033
20 40,00 0,020 0,017 0,020 0,023 0,027 0,030 0,034
Version: 1
 -89- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,416 0,021 0,025 0,028 0,011 0,014 0,017
2 4,00 0,889 0,019 0,022 0,025 0,017 0,021 0,025
5 10,00 0,376 0,015 0,016 0,017 0,026 0,028 0,029
10 20,00 0,259 0,009 0,014 0,018 0,025 0,028 0,033
20 40,00 0,196 0,010 0,014 0,017 0,028 0,031 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,416 3,391 3,394 3,397 0,011 0,014 0,017
2 4,00 0,889 0,887 0,889 0,892 0,017 0,021 0,025
5 10,00 0,376 0,376 0,376 0,377 0,026 0,028 0,029
10 20,00 0,259 0,254 0,258 0,261 0,025 0,028 0,033
20 40,00 0,196 0,190 0,192 0,195 0,028 0,031 0,033
Version: 1
 -90- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC-STI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 13,662 0,022 0,025 0,029 0,009 0,013 0,016
2 4,00 3,557 0,021 0,024 0,027 0,021 0,023 0,025
5 10,00 1,504 0,012 0,016 0,019 0,023 0,026 0,028
10 20,00 1,037 0,011 0,015 0,017 0,027 0,029 0,031
20 40,00 0,786 0,012 0,014 0,018 0,029 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 13,662 13,559 13,565 13,569 0,009 0,013 0,016
2 4,00 3,557 3,549 3,552 3,556 0,021 0,023 0,025
5 10,00 1,504 1,505 1,507 1,510 0,023 0,026 0,028
10 20,00 1,037 1,037 1,040 1,043 0,027 0,029 0,031
20 40,00 0,786 0,780 0,783 0,787 0,029 0,031 0,034
Version: 1
 -91- 1446-18

3.3.29 IEEE Normal inverse time 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 21 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,119 0,024 0,028 0,032 0,018 0,021 0,024
2 0,10 0,032 0,022 0,023 0,025 0,024 0,026 0,029
5 0,25 0,014 0,015 0,016 0,018 0,027 0,03 0,031
10 0,50 0,010 0,014 0,016 0,018 0,029 0,031 0,032
20 1,00 0,008 0,014 0,016 0,018 0,028 0,03 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,119 0,130 0,135 0,143 0,018 0,021 0,024
2 0,10 0,032 0,037 0,040 0,040 0,024 0,026 0,029
5 0,25 0,014 0,022 0,024 0,026 0,027 0,03 0,031
10 0,50 0,010 0,023 0,024 0,025 0,029 0,031 0,032
20 1,00 0,008 0,021 0,024 0,026 0,028 0,03 0,031
Version: 1
 -92- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 1,186 0,024 0,027 0,030 0,018 0,022 0,025
2 0,10 0,317 0,024 0,027 0,029 0,024 0,028 0,031
5 0,25 0,141 0,012 0,016 0,020 0,024 0,027 0,031
10 0,50 0,100 0,012 0,015 0,018 0,026 0,027 0,028
20 1,00 0,079 0,013 0,014 0,015 0,027 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 1,186 1,229 1,272 1,302 0,018 0,022 0,025
2 0,10 0,317 0,322 0,328 0,333 0,024 0,028 0,031
5 0,25 0,141 0,140 0,143 0,148 0,024 0,027 0,031
10 0,50 0,100 0,096 0,101 0,105 0,026 0,027 0,028
20 1,00 0,079 0,077 0,078 0,080 0,027 0,030 0,033
Version: 1
 -93- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 10
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 23,727 0,026 0,030 0,032 0,02 0,022 0,024
2 0,10 6,346 0,021 0,024 0,027 0,022 0,027 0,029
5 0,25 2,814 0,012 0,016 0,020 0,025 0,027 0,03
10 0,50 2,010 0,011 0,015 0,018 0,027 0,03 0,034
20 1,00 1,578 0,011 0,014 0,018 0,025 0,026 0,028

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 23,727 23,969 24,339 24,839 0,02 0,022 0,024
2 0,10 6,346 6,360 6,376 6,401 0,022 0,027 0,029
5 0,25 2,814 2,815 2,820 2,822 0,025 0,027 0,03
10 0,50 2,010 2,007 2,011 2,015 0,027 0,03 0,034
20 1,00 1,578 1,576 1,578 1,581 0,025 0,026 0,028
Version: 1
 -94- 1446-18

3.3.30 IEEE Normal inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 0,119 0,029 0,031 0,034 0,014 0,018 0,020
2 2,00 0,032 0,018 0,020 0,022 0,018 0,019 0,020
5 5,00 0,014 0,019 0,020 0,022 0,025 0,028 0,032
10 10,00 0,010 0,009 0,012 0,014 0,025 0,027 0,028
20 20,00 0,008 0,009 0,011 0,014 0,027 0,029 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 0,119 0,125 0,128 0,131 0,014 0,018 0,020
2 2,00 0,032 0,029 0,033 0,042 0,018 0,019 0,020
5 5,00 0,014 0,026 0,029 0,031 0,025 0,028 0,032
10 10,00 0,010 0,018 0,020 0,022 0,025 0,027 0,028
20 20,00 0,008 0,018 0,020 0,021 0,027 0,029 0,034
Version: 1
 -95- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 1,186 0,024 0,028 0,031 0,011 0,015 0,020
2 2,00 0,317 0,022 0,024 0,027 0,019 0,022 0,026
5 5,00 0,141 0,015 0,017 0,019 0,024 0,028 0,030
10 10,00 0,100 0,012 0,015 0,018 0,026 0,028 0,032
20 20,00 0,079 0,016 0,018 0,019 0,032 0,032 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 1,186 1,194 1,196 1,198 0,011 0,015 0,020
2 2,00 0,317 0,319 0,321 0,324 0,019 0,022 0,026
5 5,00 0,141 0,137 0,140 0,143 0,024 0,028 0,030
10 10,00 0,100 0,097 0,098 0,100 0,026 0,028 0,032
20 20,00 0,079 0,073 0,074 0,075 0,032 0,032 0,033
Version: 1
 -96- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 10
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 23,727 0,025 0,028 0,032 0,015 0,017 0,020
2 2,00 6,346 0,021 0,025 0,028 0,021 0,022 0,025
5 5,00 2,814 0,014 0,018 0,021 0,024 0,027 0,029
10 10,00 2,010 0,011 0,015 0,019 0,024 0,028 0,031
20 20,00 1,578 0,012 0,014 0,017 0,025 0,028 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 23,727 23,903 23,916 23,944 0,015 0,017 0,020
2 2,00 6,346 6,355 6,359 6,364 0,021 0,022 0,025
5 5,00 2,814 2,810 2,815 2,822 0,024 0,027 0,029
10 10,00 2,010 2,008 2,012 2,015 0,024 0,027 0,031
20 20,00 1,578 1,575 1,579 1,583 0,025 0,028 0,030
Version: 1
 -97- 1446-18

3.3.31 IEEE Normal inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 0,119 0,024 0,029 0,030 0,013 0,016 0,019
2 4,00 0,032 0,019 0,022 0,026 0,019 0,024 0,027
5 10,00 0,014 0,014 0,018 0,021 0,023 0,025 0,027
10 20,00 0,010 0,011 0,015 0,018 0,025 0,027 0,033
20 40,00 0,008 0,010 0,013 0,018 0,025 0,028 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 0,119 0,121 0,125 0,127 0,013 0,016 0,019
2 4,00 0,032 0,028 0,031 0,036 0,019 0,024 0,027
5 10,00 0,014 0,020 0,025 0,028 0,022 0,025 0,027
10 20,00 0,010 0,020 0,024 0,028 0,025 0,027 0,033
20 40,00 0,008 0,019 0,022 0,026 0,025 0,028 0,033
Version: 1
 -98- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 1,186 0,024 0,028 0,031 0,01 0,015 0,02
2 4,00 0,317 0,021 0,024 0,026 0,019 0,023 0,027
5 10,00 0,141 0,014 0,017 0,021 0,027 0,029 0,03
10 20,00 0,100 0,013 0,016 0,019 0,026 0,028 0,029
20 40,00 0,079 0,014 0,015 0,016 0,024 0,027 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 1,186 1,185 1,188 1,192 0,01 0,015 0,02
2 4,00 0,317 0,318 0,321 0,323 0,019 0,023 0,027
5 10,00 0,141 0,136 0,139 0,143 0,027 0,029 0,03
10 20,00 0,100 0,095 0,098 0,104 0,026 0,028 0,029
20 40,00 0,079 0,078 0,079 0,081 0,024 0,027 0,031
Version: 1
 -99- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-NI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 10
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 23,727 0,025 0,028 0,033 0,013 0,017 0,018
2 4,00 6,346 0,024 0,025 0,025 0,022 0,024 0,025
5 10,00 2,814 0,012 0,016 0,019 0,027 0,029 0,031
10 20,00 2,010 0,011 0,016 0,020 0,025 0,027 0,03
20 40,00 1,578 0,010 0,014 0,017 0,025 0,029 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 23,727 23,650 23,675 23,693 0,013 0,017 0,018
2 4,00 6,346 6,343 6,345 6,346 0,021 0,024 0,025
5 10,00 2,814 2,817 2,822 2,830 0,027 0,029 0,031
10 20,00 2,010 2,012 2,016 2,021 0,025 0,027 0,03
20 40,00 1,578 1,572 1,576 1,579 0,025 0,029 0,033
Version: 1
 -100- 1446-18

3.3.32 IEEE Moderately inverse time 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 21 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,711 0,026 0,029 0,033 0,018 0,021 0,025
2 0,10 0,190 0,021 0,025 0,028 0,022 0,025 0,029
5 0,25 0,084 0,015 0,016 0,018 0,025 0,027 0,028
10 0,50 0,060 0,014 0,016 0,017 0,025 0,028 0,030
20 1,00 0,047 0,010 0,011 0,013 0,030 0,030 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 0,711 0,761 0,776 0,803 0,018 0,021 0,025
2 0,10 0,190 0,190 0,194 0,198 0,022 0,025 0,029
5 0,25 0,084 0,080 0,085 0,089 0,025 0,027 0,028
10 0,50 0,060 0,055 0,061 0,065 0,025 0,028 0,030
20 1,00 0,047 0,043 0,043 0,044 0,030 0,030 0,031
Version: 1
 -101- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 7,106 0,027 0,028 0,029 0,019 0,022 0,027
2 0,10 1,902 0,022 0,023 0,023 0,026 0,027 0,031
5 0,25 0,844 0,014 0,017 0,020 0,024 0,027 0,03
10 0,50 0,603 0,012 0,015 0,018 0,026 0,029 0,031
20 1,00 0,474 0,013 0,016 0,019 0,027 0,03 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 7,106 7,557 7,744 7,876 0,019 0,022 0,027
2 0,10 1,902 1,919 1,926 1,937 0,026 0,027 0,031
5 0,25 0,844 0,842 0,845 0,848 0,024 0,027 0,03
10 0,50 0,603 0,599 0,603 0,607 0,026 0,029 0,031
20 1,00 0,474 0,470 0,474 0,478 0,027 0,03 0,033
Version: 1
 -102- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 28,423 0,026 0,030 0,033 0,021 0,024 0,026
2 0,10 7,606 0,019 0,023 0,026 0,024 0,027 0,030
5 0,25 3,377 0,012 0,016 0,020 0,024 0,027 0,028
10 0,50 2,414 0,011 0,015 0,020 0,026 0,028 0,031
20 1,00 1,896 0,011 0,016 0,019 0,027 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 28,423 29,468 29,944 30,225 0,021 0,024 0,026
2 0,10 7,606 7,647 7,676 7,699 0,024 0,027 0,030
5 0,25 3,377 3,377 3,383 3,390 0,024 0,027 0,028
10 0,50 2,414 2,411 2,413 2,416 0,026 0,028 0,031
20 1,00 1,896 1,891 1,895 1,899 0,027 0,030 0,032
Version: 1
 -103- 1446-18

3.3.33 IEEE Moderately inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 0,711 0,024 0,027 0,033 0,015 0,017 0,018
2 2,00 0,190 0,020 0,024 0,028 0,020 0,022 0,026
5 5,00 0,084 0,012 0,014 0,016 0,023 0,026 0,032
10 10,00 0,060 0,011 0,012 0,013 0,026 0,027 0,028
20 20,00 0,047 0,017 0,018 0,018 0,026 0,028 0,029

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 0,711 0,713 0,717 0,729 0,015 0,017 0,018
2 2,00 0,190 0,189 0,193 0,196 0,020 0,022 0,026
5 5,00 0,084 0,085 0,088 0,094 0,023 0,026 0,032
10 10,00 0,060 0,059 0,061 0,062 0,026 0,027 0,028
20 20,00 0,047 0,047 0,049 0,051 0,026 0,027 0,029
Version: 1
 -104- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 7,106 0,024 0,028 0,032 0,013 0,020 0,039
2 2,00 1,902 0,020 0,021 0,022 0,019 0,020 0,021
5 5,00 0,844 0,015 0,017 0,020 0,024 0,028 0,032
10 10,00 0,603 0,014 0,016 0,019 0,024 0,028 0,032
20 20,00 0,474 0,011 0,014 0,018 0,008 0,024 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 7,106 7,109 7,115 7,120 0,013 0,016 0,019
2 2,00 1,902 1,900 1,902 1,903 0,019 0,020 0,021
5 5,00 0,844 0,839 0,844 0,848 0,024 0,028 0,032
10 10,00 0,603 0,600 0,603 0,605 0,024 0,028 0,032
20 20,00 0,474 0,471 0,475 0,479 0,008 0,024 0,032
Version: 1
 -105- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 28,423 0,026 0,030 0,033 0,011 0,014 0,017
2 2,00 7,606 0,022 0,026 0,028 0,018 0,021 0,024
5 5,00 3,377 0,013 0,014 0,016 0,024 0,026 0,027
10 10,00 2,414 0,016 0,016 0,018 0,025 0,026 0,028
20 20,00 1,896 0,011 0,015 0,018 0,027 0,029 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 28,423 28,385 28,413 28,439 0,011 0,014 0,017
2 2,00 7,606 7,605 7,609 7,612 0,018 0,021 0,024
5 5,00 3,377 3,374 3,376 3,382 0,024 0,026 0,027
10 10,00 2,414 2,416 2,417 2,418 0,025 0,026 0,028
20 20,00 1,896 1,896 1,899 1,902 0,027 0,029 0,030
Version: 1
 -106- 1446-18

3.3.34 IEEE Moderately inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 0,711 0,026 0,028 0,030 0,011 0,013 0,015
2 4,00 0,190 0,021 0,024 0,027 0,019 0,023 0,027
5 10,00 0,084 0,015 0,017 0,020 0,026 0,027 0,03
10 20,00 0,060 0,014 0,015 0,016 0,028 0,029 0,031
20 40,00 0,047 0,010 0,011 0,011 0,028 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 0,711 0,722 0,724 0,726 0,011 0,013 0,015
2 4,00 0,190 0,190 0,193 0,195 0,019 0,022 0,027
5 10,00 0,084 0,080 0,084 0,089 0,026 0,027 0,029
10 20,00 0,060 0,062 0,063 0,064 0,028 0,029 0,031
20 40,00 0,047 0,043 0,044 0,045 0,028 0,029 0,031
Version: 1
 -107- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 7,106 0,024 0,027 0,030 0,012 0,016 0,019
2 4,00 1,902 0,022 0,024 0,027 0,021 0,022 0,023
5 10,00 0,844 0,012 0,015 0,018 0,025 0,027 0,029
10 20,00 0,603 0,012 0,016 0,018 0,026 0,028 0,031
20 40,00 0,474 0,012 0,015 0,018 0,027 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 7,106 7,120 7,122 7,125 0,012 0,016 0,019
2 4,00 1,902 1,902 1,904 1,905 0,021 0,022 0,023
5 10,00 0,844 0,842 0,847 0,853 0,025 0,027 0,029
10 20,00 0,603 0,602 0,604 0,607 0,026 0,028 0,031
20 40,00 0,474 0,470 0,473 0,478 0,027 0,029 0,031
Version: 1
 -108- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-MI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 28,423 0,027 0,029 0,032 0,011 0,015 0,020
2 4,00 7,606 0,020 0,024 0,026 0,020 0,021 0,023
5 10,00 3,377 0,014 0,017 0,021 0,022 0,026 0,028
10 20,00 2,414 0,010 0,015 0,019 0,024 0,027 0,029
20 40,00 1,896 0,012 0,015 0,019 0,027 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 28,423 28,405 28,418 28,428 0,011 0,015 0,020
2 4,00 7,606 7,604 7,609 7,611 0,020 0,021 0,023
5 10,00 3,377 3,383 3,387 3,390 0,022 0,026 0,028
10 20,00 2,414 2,415 2,420 2,425 0,024 0,027 0,029
20 40,00 1,896 1,891 1,893 1,895 0,027 0,030 0,034
Version: 1
 -109- 1446-18

3.3.35 IEEE very inverse time 0,05IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 2,253 0,023 0,027 0,030 0,017 0,021 0,023
2 0,10 0,351 0,020 0,024 0,026 0,020 0,020 0,021
5 0,25 0,065 0,013 0,015 0,017 0,028 0,030 0,032
10 0,50 0,034 0,010 0,012 0,014 0,025 0,029 0,035
20 1,00 0,027 0,011 0,013 0,015 0,027 0,029 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 2,253 2,464 2,488 2,513 0,017 0,021 0,023
2 0,10 0,351 0,362 0,368 0,372 0,020 0,020 0,021
5 0,25 0,065 0,063 0,065 0,070 0,028 0,030 0,032
10 0,50 0,034 0,036 0,038 0,043 0,025 0,029 0,035
20 1,00 0,027 0,020 0,021 0,023 0,027 0,029 0,034
Version: 1
 -110- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 22,530 0,024 0,026 0,029 0,019 0,023 0,026
2 0,10 3,514 0,020 0,022 0,026 0,021 0,024 0,028
5 0,25 0,654 0,016 0,017 0,018 0,025 0,030 0,033
10 0,50 0,345 0,010 0,013 0,017 0,032 0,032 0,033
20 1,00 0,270 0,009 0,012 0,016 0,026 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 22,530 24,095 24,212 24,356 0,019 0,023 0,026
2 0,10 3,514 3,542 3,558 3,576 0,021 0,024 0,028
5 0,25 0,654 0,656 0,658 0,659 0,025 0,030 0,033
10 0,50 0,345 0,344 0,348 0,355 0,031 0,032 0,033
20 1,00 0,270 0,264 0,267 0,270 0,026 0,029 0,032
Version: 1
 -111- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 90,118 0,024 0,026 0,028 0,019 0,020 0,024
2 0,10 14,055 0,020 0,022 0,027 0,022 0,025 0,027
5 0,25 2,616 0,012 0,015 0,019 0,026 0,027 0,030
10 0,50 1,378 0,011 0,014 0,016 0,027 0,031 0,034
20 1,00 1,080 0,010 0,013 0,016 0,028 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 90,118 96,445 96,859 97,367 0,019 0,020 0,023
2 0,10 14,055 14,164 14,202 14,258 0,022 0,025 0,027
5 0,25 2,616 2,616 2,620 2,629 0,026 0,027 0,029
10 0,50 1,378 1,372 1,378 1,387 0,027 0,031 0,034
20 1,00 1,080 1,075 1,078 1,082 0,028 0,031 0,034
Version: 1
 -112- 1446-18

3.3.36 IEEE very inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 2,253 0,024 0,024 0,025 0,010 0,011 0,012
2 2,00 0,351 0,019 0,021 0,026 0,016 0,020 0,026
5 5,00 0,065 0,013 0,015 0,016 0,020 0,022 0,027
10 10,00 0,034 0,009 0,011 0,012 0,029 0,030 0,034
20 20,00 0,027 0,010 0,012 0,013 0,027 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 2,253 2,247 2,248 2,249 0,010 0,011 0,012
2 2,00 0,351 0,348 0,354 0,356 0,016 0,019 0,026
5 5,00 0,065 0,063 0,068 0,071 0,020 0,022 0,027
10 10,00 0,034 0,036 0,041 0,044 0,029 0,030 0,034
20 20,00 0,027 0,020 0,024 0,028 0,027 0,031 0,034
Version: 1
 -113- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 22,530 0,025 0,027 0,030 0,010 0,013 0,018
2 2,00 3,514 0,021 0,023 0,025 0,019 0,021 0,023
5 5,00 0,654 0,010 0,013 0,019 0,021 0,025 0,027
10 10,00 0,345 0,010 0,012 0,015 0,026 0,028 0,033
20 20,00 0,270 0,009 0,012 0,015 0,026 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 22,530 22,355 22,358 22,360 0,010 0,013 0,018
2 2,00 3,514 3,501 3,503 3,505 0,019 0,021 0,023
5 5,00 0,654 0,649 0,660 0,667 0,021 0,025 0,027
10 10,00 0,345 0,342 0,347 0,349 0,026 0,028 0,033
20 20,00 0,270 0,263 0,266 0,269 0,026 0,028 0,031
Version: 1
 -114- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 90,118 0,023 0,025 0,027 0,008 0,012 0,014
2 2,00 14,055 0,018 0,022 0,025 0,018 0,021 0,024
5 5,00 2,616 0,012 0,015 0,018 0,020 0,025 0,027
10 10,00 1,378 0,011 0,015 0,017 0,025 0,028 0,033
20 20,00 1,080 0,011 0,012 0,014 0,027 0,029 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 90,118 89,383 89,401 89,451 0,008 0,012 0,014
2 2,00 14,055 14,008 14,011 14,014 0,018 0,021 0,024
5 5,00 2,616 2,608 2,612 2,620 0,020 0,025 0,027
10 10,00 1,378 1,376 1,380 1,386 0,025 0,028 0,033
20 20,00 1,080 1,075 1,079 1,082 0,027 0,029 0,033
Version: 1
 -115- 1446-18

3.3.37 IEEE very inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 2,253 0,025 0,028 0,030 0,012 0,014 0,016
2 4,00 0,351 0,019 0,023 0,025 0,018 0,021 0,024
5 10,00 0,065 0,011 0,015 0,018 0,020 0,023 0,027
10 20,00 0,034 0,009 0,013 0,016 0,028 0,029 0,030
20 40,00 0,027 0,011 0,014 0,017 0,027 0,030 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 2,253 2,233 2,238 2,245 0,012 0,014 0,016
2 4,00 0,351 0,349 0,351 0,355 0,018 0,021 0,024
5 10,00 0,065 0,064 0,069 0,075 0,020 0,023 0,027
10 20,00 0,034 0,030 0,036 0,044 0,028 0,029 0,030
20 40,00 0,027 0,019 0,024 0,026 0,027 0,030 0,034
Version: 1
 -116- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 22,530 0,022 0,025 0,030 0,011 0,014 0,016
2 4,00 3,514 0,019 0,021 0,022 0,017 0,020 0,022
5 10,00 0,654 0,012 0,014 0,016 0,019 0,025 0,028
10 20,00 0,345 0,014 0,016 0,017 0,029 0,030 0,031
20 40,00 0,270 0,010 0,014 0,018 0,026 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 22,530 22,302 22,315 22,325 0,011 0,013 0,016
2 4,00 3,514 3,493 3,499 3,502 0,017 0,020 0,022
5 10,00 0,654 0,655 0,658 0,661 0,019 0,025 0,028
10 20,00 0,345 0,342 0,344 0,346 0,029 0,030 0,031
20 40,00 0,270 0,262 0,265 0,268 0,026 0,030 0,033
Version: 1
 -117- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-VI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 90,118 0,023 0,025 0,027 0,009 0,011 0,015
2 4,00 14,055 0,019 0,023 0,028 0,017 0,021 0,025
5 10,00 2,616 0,011 0,014 0,018 0,019 0,023 0,026
10 20,00 1,378 0,011 0,015 0,018 0,027 0,030 0,033
20 40,00 1,080 0,010 0,014 0,017 0,027 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 90,118 89,207 89,223 89,235 0,009 0,011 0,015
2 4,00 14,055 13,980 13,988 13,995 0,017 0,021 0,025
5 10,00 2,616 2,624 2,630 2,637 0,019 0,023 0,026
10 20,00 1,378 1,381 1,385 1,388 0,027 0,030 0,033
20 40,00 1,080 1,075 1,079 1,082 0,027 0,031 0,034
Version: 1
 -118- 1446-18

3.3.38 IEEE extremely inverse time 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 20 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,211 0,029 0,032 0,035 0,019 0,021 0,025
2 0,10 0,476 0,021 0,023 0,026 0,024 0,027 0,031
5 0,25 0,065 0,015 0,017 0,019 0,025 0,029 0,034
10 0,50 0,020 0,011 0,013 0,014 0,027 0,028 0,03
20 1,00 0,010 0,012 0,014 0,015 0,027 0,03 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,211 3,382 3,500 3,621 0,019 0,021 0,025
2 0,10 0,476 0,487 0,492 0,497 0,024 0,027 0,031
5 0,25 0,065 0,075 0,079 0,082 0,025 0,029 0,034
10 0,50 0,020 0,029 0,030 0,032 0,027 0,028 0,03
20 1,00 0,010 0,019 0,022 0,024 0,027 0,03 0,035
Version: 1
 -119- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 32,106 0,033 0,034 0,036 0,019 0,021 0,025
2 0,10 4,761 0,020 0,023 0,026 0,025 0,029 0,031
5 0,25 0,648 0,015 0,016 0,017 0,030 0,031 0,033
10 0,50 0,203 0,010 0,013 0,016 0,030 0,033 0,035
20 1,00 0,096 0,012 0,014 0,018 0,026 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 32,106 32,639 33,272 34,098 0,019 0,021 0,025
2 0,10 4,761 4,803 4,808 4,812 0,025 0,029 0,031
5 0,25 0,648 0,663 0,668 0,673 0,030 0,031 0,033
10 0,50 0,203 0,216 0,218 0,220 0,030 0,033 0,035
20 1,00 0,096 0,098 0,102 0,104 0,026 0,029 0,032
Version: 1
 -120- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 128,425 0,028 0,031 0,036 0,019 0,025 0,039
2 0,10 19,043 0,020 0,024 0,027 0,023 0,029 0,031
5 0,25 2,593 0,016 0,019 0,023 0,029 0,031 0,033
10 0,50 0,813 0,011 0,012 0,014 0,028 0,032 0,035
20 1,00 0,385 0,010 0,012 0,013 0,027 0,032 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 128,425 132,834 134,309 136,954 0,019 0,021 0,025
2 0,10 19,043 19,322 19,415 19,531 0,023 0,029 0,031
5 0,25 2,593 2,606 2,615 2,633 0,029 0,031 0,033
10 0,50 0,813 0,827 0,829 0,831 0,028 0,032 0,035
20 1,00 0,385 0,387 0,391 0,396 0,027 0,032 0,034
Version: 1
 -121- 1446-18

3.3.39 IEEE extremely inverse time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,211 0,027 0,031 0,035 0,018 0,020 0,021
2 2,00 0,476 0,019 0,022 0,025 0,017 0,020 0,022
5 5,00 0,065 0,018 0,019 0,021 0,025 0,026 0,027
10 10,00 0,020 0,014 0,016 0,018 0,028 0,030 0,031
20 20,00 0,010 0,009 0,014 0,017 0,028 0,029 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,211 3,195 3,201 3,210 0,018 0,020 0,021
2 2,00 0,476 0,475 0,479 0,481 0,017 0,020 0,022
5 5,00 0,065 0,067 0,069 0,076 0,025 0,026 0,027
10 10,00 0,020 0,030 0,032 0,033 0,028 0,030 0,031
20 20,00 0,010 0,018 0,022 0,023 0,028 0,029 0,030
Version: 1
 -122- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 32,106 0,030 0,032 0,033 0,013 0,017 0,020
2 2,00 4,761 0,025 0,025 0,027 0,023 0,024 0,026
5 5,00 0,648 0,019 0,021 0,023 0,029 0,031 0,032
10 10,00 0,203 0,013 0,014 0,016 0,027 0,030 0,033
20 20,00 0,096 0,008 0,013 0,018 0,027 0,030 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 32,106 31,854 31,877 31,890 0,013 0,017 0,020
2 2,00 4,761 4,745 4,748 4,753 0,023 0,024 0,025
5 5,00 0,648 0,643 0,648 0,652 0,029 0,031 0,032
10 10,00 0,203 0,214 0,216 0,218 0,026 0,030 0,033
20 20,00 0,096 0,100 0,104 0,108 0,027 0,030 0,032
Version: 1
 -123- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 128,425 0,028 0,029 0,031 0,014 0,017 0,019
2 2,00 19,043 0,019 0,023 0,027 0,018 0,021 0,025
5 5,00 2,593 0,016 0,020 0,023 0,026 0,028 0,030
10 10,00 0,813 0,012 0,014 0,016 0,027 0,028 0,030
20 20,00 0,385 0,011 0,013 0,015 0,026 0,029 0,036

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 128,425 127,477 127,494 127,507 0,013 0,017 0,018
2 2,00 19,043 18,981 18,985 18,988 0,018 0,021 0,025
5 5,00 2,593 2,579 2,586 2,599 0,026 0,028 0,030
10 10,00 0,813 0,826 0,829 0,831 0,026 0,028 0,030
20 20,00 0,385 0,388 0,391 0,397 0,026 0,029 0,036
Version: 1
 -124- 1446-18

3.3.40 IEEE extremely inverse time 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,211 0,026 0,032 0,035 0,016 0,017 0,018
2 4,00 0,476 0,019 0,023 0,027 0,016 0,021 0,025
5 10,00 0,065 0,017 0,019 0,020 0,024 0,028 0,033
10 20,00 0,020 0,013 0,015 0,016 0,027 0,028 0,030
20 40,00 0,010 0,012 0,014 0,015 0,026 0,029 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,211 3,186 3,193 3,196 0,016 0,017 0,018
2 4,00 0,476 0,478 0,481 0,485 0,016 0,021 0,025
5 10,00 0,065 0,068 0,073 0,076 0,024 0,028 0,033
10 20,00 0,020 0,028 0,030 0,032 0,026 0,028 0,030
20 40,00 0,010 0,020 0,022 0,024 0,026 0,028 0,031
Version: 1
 -125- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 32,106 0,030 0,032 0,034 0,013 0,018 0,021
2 4,00 4,761 0,022 0,023 0,023 0,025 0,025 0,026
5 10,00 0,648 0,014 0,018 0,024 0,026 0,030 0,032
10 20,00 0,203 0,013 0,016 0,019 0,029 0,030 0,032
20 40,00 0,096 0,009 0,012 0,015 0,026 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 32,106 31,774 31,797 31,820 0,013 0,017 0,021
2 4,00 4,761 4,732 4,733 4,733 0,025 0,025 0,026
5 10,00 0,648 0,654 0,662 0,665 0,026 0,030 0,032
10 20,00 0,203 0,211 0,214 0,217 0,029 0,030 0,032
20 40,00 0,096 0,101 0,105 0,114 0,026 0,031 0,034
Version: 1
 -126- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-EI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L3-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 128,425 0,030 0,032 0,035 0,013 0,021 0,039
2 4,00 19,043 0,019 0,023 0,026 0,018 0,022 0,026
5 10,00 2,593 0,014 0,018 0,023 0,026 0,029 0,033
10 20,00 0,813 0,010 0,012 0,014 0,028 0,032 0,035
20 40,00 0,385 0,009 0,010 0,012 0,032 0,033 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 128,425 127,066 127,116 127,135 0,013 0,017 0,022
2 4,00 19,043 18,931 18,940 18,947 0,018 0,022 0,026
5 10,00 2,593 2,606 2,615 2,624 0,026 0,029 0,033
10 20,00 0,813 0,827 0,831 0,835 0,028 0,032 0,035
20 40,00 0,385 0,394 0,395 0,396 0,032 0,033 0,034
Version: 1
 -127- 1446-18

3.3.41 IEEE long time inverse 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 3 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 1,186 0,027 0,029 0,030 0,022 0,025 0,028
2 0,10 0,317 0,019 0,024 0,028 0,022 0,025 0,029
5 0,25 0,141 0,015 0,017 0,021 0,023 0,027 0,03
10 0,50 0,100 0,014 0,015 0,017 0,026 0,029 0,032
20 1,00 0,079 0,014 0,016 0,017 0,025 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 1,186 1,247 1,256 1,266 0,022 0,025 0,028
2 0,10 0,317 0,322 0,325 0,327 0,022 0,025 0,029
5 0,25 0,141 0,139 0,141 0,143 0,023 0,027 0,03
10 0,50 0,100 0,097 0,100 0,103 0,026 0,029 0,032
20 1,00 0,079 0,074 0,079 0,081 0,025 0,029 0,032
Version: 1
 -128- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 11,863 0,026 0,028 0,031 0,021 0,025 0,028
2 0,10 3,173 0,020 0,023 0,024 0,022 0,026 0,029
5 0,25 1,407 0,015 0,018 0,020 0,026 0,028 0,031
10 0,50 1,005 0,014 0,015 0,016 0,025 0,027 0,033
20 1,00 0,789 0,011 0,014 0,017 0,026 0,028 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 11,863 12,277 12,536 12,749 0,021 0,025 0,028
2 0,10 3,173 3,190 3,202 3,213 0,022 0,026 0,029
5 0,25 1,407 1,403 1,410 1,416 0,026 0,028 0,031
10 0,50 1,005 1,006 1,007 1,009 0,024 0,027 0,032
20 1,00 0,789 0,785 0,788 0,792 0,026 0,028 0,033
Version: 1
 -129- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 47,453 0,025 0,030 0,032 0,024 0,026 0,027
2 0,10 12,691 0,023 0,024 0,028 0,023 0,025 0,028
5 0,25 5,628 0,015 0,018 0,021 0,024 0,028 0,031
10 0,50 4,020 0,011 0,016 0,018 0,024 0,027 0,032
20 1,00 3,156 0,013 0,016 0,018 0,029 0,03 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 47,453 49,832 50,244 50,722 0,024 0,025 0,027
2 0,10 12,691 12,767 12,796 12,839 0,023 0,025 0,028
5 0,25 5,628 5,625 5,633 5,638 0,024 0,028 0,031
10 0,50 4,020 4,016 4,018 4,020 0,024 0,027 0,032
20 1,00 3,156 3,150 3,153 3,157 0,028 0,03 0,032
Version: 1
 -130- 1446-18

3.3.42 IEEE long time inverse 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 1,186 0,025 0,029 0,033 0,014 0,017 0,02
2 2,00 0,317 0,020 0,023 0,026 0,019 0,022 0,026
5 5,00 0,141 0,014 0,017 0,022 0,026 0,027 0,028
10 10,00 0,100 0,013 0,016 0,018 0,027 0,028 0,031
20 20,00 0,079 0,014 0,016 0,018 0,025 0,028 0,03

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 1,186 1,195 1,197 1,200 0,014 0,017 0,02
2 2,00 0,317 0,318 0,320 0,323 0,019 0,022 0,026
5 5,00 0,141 0,136 0,141 0,144 0,025 0,027 0,028
10 10,00 0,100 0,096 0,100 0,103 0,027 0,028 0,031
20 20,00 0,079 0,078 0,080 0,081 0,025 0,028 0,03
Version: 1
 -131- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 11,863 0,026 0,029 0,032 0,011 0,014 0,017
2 2,00 3,173 0,021 0,023 0,024 0,024 0,025 0,027
5 5,00 1,407 0,016 0,018 0,020 0,026 0,029 0,030
10 10,00 1,005 0,012 0,016 0,020 0,028 0,029 0,030
20 20,00 0,789 0,010 0,014 0,017 0,025 0,029 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 11,863 11,864 11,873 11,883 0,011 0,014 0,017
2 2,00 3,173 3,174 3,174 3,174 0,023 0,025 0,027
5 5,00 1,407 1,400 1,404 1,407 0,026 0,029 0,030
10 10,00 1,005 1,002 1,003 1,005 0,028 0,029 0,030
20 20,00 0,789 0,786 0,789 0,793 0,025 0,029 0,034
Version: 1
 -132- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 47,453 0,027 0,028 0,031 0,013 0,015 0,019
2 2,00 12,691 0,022 0,025 0,026 0,021 0,023 0,027
5 5,00 5,628 0,015 0,019 0,021 0,023 0,026 0,03
10 10,00 4,020 0,011 0,016 0,020 0,024 0,027 0,032
20 20,00 3,156 0,011 0,014 0,017 0,028 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 47,453 47,446 47,472 47,494 0,013 0,015 0,019
2 2,00 12,691 12,685 12,688 12,692 0,021 0,023 0,027
5 5,00 5,628 5,622 5,626 5,628 0,023 0,026 0,03
10 10,00 4,020 4,024 4,027 4,029 0,024 0,027 0,032
20 20,00 3,156 3,157 3,160 3,164 0,028 0,029 0,032
Version: 1
 -133- 1446-18

3.3.43 IEEE long time inverse 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 1,186 0,025 0,028 0,032 0,013 0,015 0,019
2 4,00 0,317 0,022 0,025 0,027 0,018 0,023 0,027
5 10,00 0,141 0,014 0,017 0,020 0,025 0,027 0,029
10 20,00 0,100 0,015 0,017 0,019 0,026 0,028 0,03
20 40,00 0,079 0,014 0,016 0,018 0,025 0,027 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 1,186 1,186 1,188 1,190 0,013 0,015 0,019
2 4,00 0,317 0,319 0,322 0,324 0,018 0,023 0,027
5 10,00 0,141 0,138 0,141 0,145 0,025 0,027 0,029
10 20,00 0,100 0,097 0,099 0,103 0,026 0,028 0,03
20 40,00 0,079 0,074 0,079 0,081 0,025 0,027 0,032
Version: 1
 -134- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 11,863 0,025 0,029 0,033 0,011 0,014 0,018
2 4,00 3,173 0,020 0,023 0,027 0,023 0,024 0,027
5 10,00 1,407 0,012 0,016 0,019 0,022 0,027 0,030
10 20,00 1,005 0,018 0,018 0,019 0,027 0,028 0,030
20 40,00 0,789 0,013 0,015 0,018 0,025 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 11,863 11,827 11,834 11,842 0,011 0,014 0,017
2 4,00 3,173 3,171 3,176 3,180 0,023 0,024 0,027
5 10,00 1,407 1,407 1,410 1,413 0,022 0,027 0,030
10 20,00 1,005 1,003 1,009 1,011 0,027 0,028 0,030
20 40,00 0,789 0,784 0,787 0,792 0,025 0,030 0,033
Version: 1
 -135- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 47,453 0,026 0,029 0,031 0,012 0,015 0,019
2 4,00 12,691 0,020 0,023 0,027 0,018 0,020 0,024
5 10,00 5,628 0,014 0,016 0,020 0,024 0,027 0,029
10 20,00 4,020 0,011 0,015 0,019 0,025 0,028 0,030
20 40,00 3,156 0,011 0,014 0,017 0,027 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 47,453 47,321 47,325 47,331 0,012 0,015 0,019
2 4,00 12,691 12,677 12,678 12,681 0,018 0,020 0,024
5 10,00 5,628 5,640 5,642 5,645 0,024 0,027 0,029
10 20,00 4,020 4,027 4,029 4,032 0,025 0,028 0,030
20 40,00 3,156 3,152 3,154 3,158 0,027 0,030 0,033
Version: 1
 -136- 1446-18

3.3.44 IEEE long time very inverse 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 3 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,280 0,025 0,028 0,033 0,021 0,024 0,025
2 0,10 0,511 0,022 0,025 0,028 0,023 0,026 0,028
5 0,25 0,095 0,015 0,017 0,019 0,026 0,028 0,030
10 0,50 0,050 0,013 0,015 0,016 0,024 0,027 0,034
20 1,00 0,039 0,015 0,017 0,019 0,027 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 3,280 3,506 3,539 3,576 0,021 0,024 0,025
2 0,10 0,511 0,526 0,529 0,532 0,023 0,026 0,028
5 0,25 0,095 0,097 0,099 0,104 0,026 0,028 0,030
10 0,50 0,050 0,048 0,053 0,056 0,024 0,027 0,034
20 1,00 0,039 0,033 0,036 0,040 0,027 0,030 0,033
Version: 1
 -137- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 32,799 0,025 0,028 0,032 0,020 0,024 0,027
2 0,10 5,114 0,024 0,026 0,029 0,023 0,026 0,029
5 0,25 0,951 0,013 0,016 0,019 0,024 0,028 0,032
10 0,50 0,500 0,012 0,014 0,016 0,026 0,028 0,032
20 1,00 0,392 0,010 0,013 0,014 0,025 0,028 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 32,799 34,577 35,167 35,633 0,020 0,024 0,027
2 0,10 5,114 5,177 5,190 5,213 0,023 0,026 0,029
5 0,25 0,951 0,954 0,961 0,967 0,024 0,028 0,032
10 0,50 0,500 0,497 0,506 0,510 0,026 0,028 0,032
20 1,00 0,392 0,387 0,388 0,390 0,025 0,028 0,033
Version: 1
 -138- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 131,197 0,025 0,029 0,031 0,022 0,025 0,027
2 0,10 20,457 0,024 0,026 0,028 0,023 0,026 0,027
5 0,25 3,803 0,017 0,018 0,019 0,027 0,029 0,03
10 0,50 2,001 0,011 0,015 0,017 0,027 0,03 0,033
20 1,00 1,567 0,010 0,015 0,018 0,025 0,028 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 131,197 137,406 139,408 140,727 0,022 0,025 0,027
2 0,10 20,457 20,712 20,740 20,781 0,023 0,026 0,027
5 0,25 3,803 3,809 3,812 3,818 0,027 0,029 0,03
10 0,50 2,001 2,000 2,006 2,013 0,027 0,03 0,033
20 1,00 1,567 1,563 1,565 1,567 0,025 0,028 0,033
Version: 1
 -139- 1446-18

3.3.45 IEEE long time very inverse 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,280 0,026 0,029 0,032 0,011 0,014 0,018
2 2,00 0,511 0,020 0,023 0,028 0,019 0,023 0,026
5 5,00 0,095 0,014 0,017 0,021 0,028 0,029 0,032
10 10,00 0,050 0,011 0,013 0,014 0,026 0,029 0,031
20 20,00 0,039 0,016 0,016 0,018 0,024 0,027 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 3,280 3,297 3,301 3,305 0,011 0,014 0,018
2 2,00 0,511 0,507 0,510 0,514 0,018 0,023 0,026
5 5,00 0,095 0,090 0,097 0,110 0,028 0,029 0,032
10 10,00 0,050 0,052 0,056 0,062 0,026 0,029 0,031
20 20,00 0,039 0,033 0,039 0,040 0,024 0,027 0,031
Version: 1
 -140- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 32,799 0,026 0,029 0,031 0,012 0,015 0,020
2 2,00 5,114 0,021 0,024 0,026 0,018 0,021 0,026
5 5,00 0,951 0,014 0,017 0,020 0,023 0,025 0,029
10 10,00 0,500 0,011 0,015 0,018 0,028 0,030 0,031
20 20,00 0,392 0,010 0,012 0,013 0,026 0,026 0,028

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 32,799 32,859 32,871 32,881 0,012 0,015 0,020
2 2,00 5,114 5,115 5,119 5,123 0,018 0,021 0,026
5 5,00 0,951 0,946 0,955 0,965 0,023 0,025 0,029
10 10,00 0,500 0,497 0,502 0,510 0,028 0,030 0,031
20 20,00 0,392 0,387 0,388 0,389 0,026 0,026 0,028
Version: 1
 -141- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 131,197 0,027 0,030 0,031 0,014 0,018 0,020
2 2,00 20,457 0,020 0,024 0,027 0,020 0,024 0,027
5 5,00 3,803 0,012 0,014 0,015 0,022 0,024 0,026
10 10,00 2,001 0,011 0,015 0,018 0,026 0,029 0,032
20 20,00 1,567 0,011 0,013 0,015 0,026 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 131,197 131,387 131,420 131,463 0,014 0,018 0,020
2 2,00 20,457 20,446 20,454 20,457 0,020 0,024 0,027
5 5,00 3,803 3,806 3,811 3,815 0,022 0,024 0,026
10 10,00 2,001 2,002 2,008 2,013 0,026 0,029 0,032
20 20,00 1,567 1,565 1,568 1,572 0,026 0,029 0,032
Version: 1
 -142- 1446-18

3.3.46 IEEE long time very inverse 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,280 0,026 0,028 0,030 0,010 0,013 0,018
2 4,00 0,511 0,020 0,021 0,022 0,018 0,020 0,021
5 10,00 0,095 0,014 0,017 0,019 0,028 0,029 0,030
10 20,00 0,050 0,015 0,016 0,018 0,023 0,028 0,032
20 40,00 0,039 0,013 0,015 0,018 0,026 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 3,280 3,278 3,283 3,288 0,010 0,013 0,018
2 4,00 0,511 0,509 0,510 0,511 0,018 0,020 0,021
5 10,00 0,095 0,092 0,100 0,110 0,028 0,029 0,030
10 20,00 0,050 0,051 0,053 0,054 0,023 0,027 0,032
20 40,00 0,039 0,033 0,037 0,039 0,026 0,030 0,033
Version: 1
 -143- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 32,799 0,026 0,029 0,033 0,011 0,014 0,018
2 4,00 5,114 0,023 0,025 0,028 0,020 0,023 0,026
5 10,00 0,951 0,013 0,015 0,016 0,023 0,025 0,028
10 20,00 0,500 0,011 0,014 0,017 0,024 0,029 0,031
20 40,00 0,392 0,011 0,012 0,013 0,025 0,026 0,027

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 32,799 32,698 32,716 32,736 0,011 0,014 0,018
2 4,00 5,114 5,102 5,105 5,107 0,020 0,023 0,026
5 10,00 0,951 0,961 0,966 0,973 0,023 0,025 0,028
10 20,00 0,500 0,497 0,504 0,509 0,024 0,029 0,031
20 40,00 0,392 0,387 0,388 0,389 0,025 0,026 0,027
Version: 1
 -144- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTVI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L1-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 131,197 0,024 0,028 0,030 0,011 0,014 0,016
2 4,00 20,457 0,023 0,024 0,025 0,019 0,020 0,021
5 10,00 3,803 0,012 0,016 0,021 0,027 0,028 0,030
10 20,00 2,001 0,017 0,018 0,020 0,027 0,028 0,030
20 40,00 1,567 0,011 0,014 0,018 0,024 0,027 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 131,197 130,775 130,807 130,839 0,011 0,014 0,016
2 4,00 20,457 20,414 20,415 20,416 0,019 0,020 0,021
5 10,00 3,803 3,819 3,829 3,837 0,027 0,028 0,030
10 20,00 2,001 2,009 2,010 2,012 0,027 0,028 0,030
20 40,00 1,567 1,562 1,565 1,568 0,024 0,027 0,030
Version: 1
 -145- 1446-18

3.3.47 IEEE long time extremely inverse 0,05IB

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 21 December 2017

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 7,293 0,025 0,028 0,030 0,019 0,022 0,025
2 0,10 1,080 0,020 0,023 0,028 0,019 0,022 0,026
5 0,25 0,146 0,011 0,015 0,018 0,028 0,031 0,034
10 0,50 0,045 0,014 0,016 0,017 0,025 0,028 0,034
20 1,00 0,021 0,009 0,013 0,017 0,030 0,032 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 7,293 7,417 7,722 7,909 0,019 0,022 0,025
2 0,10 1,080 1,088 1,094 1,099 0,019 0,022 0,026
5 0,25 0,146 0,145 0,150 0,155 0,027 0,031 0,034
10 0,50 0,045 0,047 0,049 0,051 0,025 0,028 0,034
20 1,00 0,021 0,023 0,027 0,033 0,030 0,032 0,034
Version: 1
 -146- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 72,932 0,025 0,028 0,030 0,019 0,021 0,024
2 0,10 10,803 0,020 0,023 0,025 0,020 0,024 0,028
5 0,25 1,460 0,015 0,016 0,017 0,027 0,028 0,032
10 0,50 0,449 0,013 0,015 0,017 0,027 0,029 0,030
20 1,00 0,205 0,013 0,014 0,014 0,032 0,033 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 72,932 77,122 77,966 78,940 0,019 0,021 0,024
2 0,10 10,803 10,872 10,921 10,987 0,020 0,024 0,028
5 0,25 1,460 1,455 1,460 1,465 0,027 0,028 0,032
10 0,50 0,449 0,445 0,453 0,460 0,027 0,029 0,030
20 1,00 0,205 0,205 0,206 0,206 0,032 0,033 0,033
Version: 1
 -147- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 291,727 0,027 0,029 0,031 0,019 0,022 0,026
2 0,10 43,213 0,022 0,024 0,026 0,018 0,024 0,026
5 0,25 5,839 0,013 0,014 0,016 0,025 0,028 0,029
10 0,50 1,794 0,013 0,014 0,016 0,027 0,029 0,03
20 1,00 0,821 0,013 0,014 0,016 0,028 0,03 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,06 291,727 307,237 310,062 313,131 0,019 0,022 0,026
2 0,10 43,213 43,552 43,649 43,765 0,018 0,024 0,026
5 0,25 5,839 5,816 5,827 5,831 0,025 0,028 0,029
10 0,50 1,794 1,789 1,790 1,792 0,027 0,029 0,03
20 1,00 0,821 0,814 0,819 0,821 0,028 0,03 0,034
Version: 1
 -148- 1446-18

3.3.48 IEEE long time extremely inverse 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 7,293 0,024 0,028 0,030 0,009 0,012 0,014
2 2,00 1,080 0,020 0,023 0,026 0,019 0,020 0,021
5 5,00 0,146 0,011 0,015 0,019 0,023 0,025 0,028
10 10,00 0,045 0,012 0,014 0,015 0,026 0,028 0,030
20 20,00 0,021 0,011 0,014 0,016 0,028 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 7,293 7,254 7,257 7,262 0,009 0,012 0,014
2 2,00 1,080 1,076 1,080 1,082 0,019 0,020 0,021
5 5,00 0,146 0,144 0,148 0,156 0,023 0,025 0,028
10 10,00 0,045 0,048 0,050 0,052 0,026 0,028 0,030
20 20,00 0,021 0,021 0,024 0,027 0,028 0,031 0,035
Version: 1
 -149- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 72,932 0,022 0,024 0,028 0,008 0,011 0,017
2 2,00 10,803 0,021 0,022 0,024 0,018 0,025 0,039
5 5,00 1,460 0,013 0,014 0,015 0,021 0,026 0,029
10 10,00 0,449 0,009 0,013 0,018 0,027 0,029 0,030
20 20,00 0,205 0,013 0,014 0,014 0,033 0,033 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 72,932 72,304 72,325 72,349 0,008 0,011 0,017
2 2,00 10,803 10,765 10,769 10,772 0,018 0,021 0,024
5 5,00 1,460 1,453 1,460 1,463 0,021 0,026 0,029
10 10,00 0,449 0,450 0,458 0,465 0,027 0,029 0,030
20 20,00 0,205 0,205 0,206 0,206 0,033 0,033 0,033
Version: 1
 -150- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 291,727 0,023 0,026 0,031 0,010 0,013 0,016
2 2,00 43,213 0,019 0,022 0,026 0,018 0,022 0,025
5 5,00 5,839 0,010 0,014 0,018 0,021 0,025 0,028
10 10,00 1,794 0,010 0,013 0,016 0,030 0,031 0,033
20 20,00 0,821 0,012 0,014 0,016 0,029 0,031 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,20 291,727 289,269 289,331 289,458 0,010 0,013 0,016
2 2,00 43,213 43,049 43,059 43,066 0,018 0,022 0,025
5 5,00 5,839 5,815 5,821 5,827 0,021 0,025 0,028
10 10,00 1,794 1,799 1,807 1,819 0,030 0,031 0,033
20 20,00 0,821 0,822 0,826 0,834 0,029 0,031 0,033
Version: 1
 -151- 1446-18

3.3.49 IEEE long time extremely inverse 2,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,05
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 7,293 0,025 0,027 0,031 0,011 0,014 0,016
2 4,00 1,080 0,019 0,022 0,024 0,018 0,019 0,022
5 10,00 0,146 0,010 0,015 0,018 0,020 0,024 0,029
10 20,00 0,045 0,010 0,013 0,017 0,025 0,029 0,032
20 40,00 0,021 0,011 0,013 0,016 0,029 0,031 0,034

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 7,293 7,225 7,227 7,231 0,011 0,014 0,016
2 4,00 1,080 1,078 1,080 1,084 0,018 0,019 0,022
5 10,00 0,146 0,151 0,156 0,164 0,020 0,024 0,029
10 20,00 0,045 0,047 0,054 0,059 0,025 0,029 0,032
20 40,00 0,021 0,021 0,024 0,027 0,028 0,031 0,034
Version: 1
 -152- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 0,5
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 72,932 0,026 0,027 0,028 0,011 0,013 0,016
2 4,00 10,803 0,020 0,024 0,027 0,016 0,020 0,023
5 10,00 1,460 0,010 0,012 0,015 0,022 0,023 0,028
10 20,00 0,449 0,010 0,013 0,016 0,028 0,030 0,032
20 40,00 0,205 0,009 0,012 0,015 0,029 0,031 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
Gs A s s s s s s s
1,2 2,40 72,932 72,178 72,193 72,211 0,011 0,013 0,016
2 4,00 10,803 10,749 10,752 10,755 0,016 0,020 0,023
5 10,00 1,460 1,473 1,478 1,484 0,021 0,023 0,028
10 20,00 0,449 0,454 0,460 0,465 0,028 0,030 0,032
20 40,00 0,205 0,208 0,211 0,219 0,029 0,031 0,032
Version: 1
 -153- 1446-18

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEEE-LTEI
Range Gs 0,05 x Irated to 25 x Irated
Gs 2 x Irated
TMS 2
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 291,727 0,022 0,026 0,029 0,010 0,013 0,017
2 4,00 43,213 0,019 0,023 0,027 0,018 0,020 0,022
5 10,00 5,839 0,012 0,016 0,018 0,021 0,024 0,027
10 20,00 1,794 0,010 0,012 0,016 0,027 0,032 0,034
20 40,00 0,821 0,010 0,014 0,017 0,026 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,40 291,727 288,709 288,738 288,768 0,010 0,013 0,017
2 4,00 43,213 42,973 42,977 42,985 0,018 0,020 0,021
5 10,00 5,839 5,874 5,876 5,878 0,021 0,024 0,027
10 20,00 1,794 1,807 1,816 1,826 0,027 0,032 0,034
20 40,00 0,821 0,815 0,820 0,826 0,026 0,031 0,035
Version: 1
 -154- 1446-18

3.3.50 Overshoot time, OC4PTOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 4 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family DT
Gs 1 x Irated
Time setting 0,2 sec

Set values Measured values

xGs Max operating time 2xGs Non-operating time Overshoot time
2xGs
A ms ms ms
1 230 190 40

Results

Measured maximum operating time (manual dynamic), 5 shots, no offset:

228,6 ms, 231,1 ms, 229,9 ms. Choice: 230 ms.

Fault duration Result

ms / cycles
220 / 11 5 trips out of 5 shots
210 / 10,5 4 trips out of 5 shots
200 / 10 2 trips out of 5 shots / no trips out of 5 shots
190 / 9,5 No trips out of 5 shots

Overshoot time: 230 – 190 = 40 ms.

Result
The results are for information only.
Version: 1
 -155- 1446-18

3.3.51 Response to time varying current for dependent function

Standard and date

Standard -
Reference IEC 60255-151
Test date 22 January 2018

Environmental conditions
Ambient temperature 21 °C Relative humidity 41 %

Characteristic test data

Sample IED 3A
Function block OC4PTOC
Rated current (Irated) 1A
Rated frequency 50 Hz
Set IBase 1A
Curve family IEC
Curve NI
Gs 100 % IBase
k1 1,0
Test parameters:
G1 2 x Gs
G2 5 x Gs
Modulation period 200 ms
Calculated T0 5,999 s
IL1 variable A
IL2 = IL3 0A

Measured operate times

Test Operate time Deviation from calculated T0
s %
1 5,958 - 0,7
2 5,968 - 0,5
3 5,967 - 0,5
4 5,855 - 2,4
5 5,890 - 1,8
Min. - - 0,5
Avg. - - 1,2
Max. - - 2,4

Requirements
No manufacturer specification.
Requirement according to IEC 60255-151: Maximum deviation from calculated T0: 15%.

Result
The object passed the test.
Version: 1
 -156- 1446-18

3.3.52 Directional, accuracy of operating angle (forward)

Standard and date

Standard -
Reference IEC 60255-151
Test date 24 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Function 67
Angle RCA 40 °
Angle ROA 85 °
DirMode1 Forward
Curve family IEC DT
Fault L1-N
U L1-N 30 V
IL1 2A
IL2 = IL3 0A
Pre-fault voltages 63,15 V
Pre-fault currents 0A
Pre-fault time 200 ms
Fault time 200 ms
Tests per angle 5

Angle Result
°
45,0 5 trips
45,5 5 trips
46,0 no trip
46,5 no trip
-126,0 no trip
-125,5 no trip
-125,0 5 trips
-124,5 5 trips

Requirements:
Manufacturer specification: ± 2 degrees (RCA, ROA).

Result
The object passed the test.
Version: 1
 -157- 1446-18

3.3.53 Directional, accuracy of operating angle (reverse)

Standard and date

Standard -
Reference IEC 60255-151
Test date 24 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Function 67
Angle RCA 55 °
Angle ROA 80 °
DirMode1 Reverse
Curve family IEC DT
Fault L1-N
U L1-N 30 V
IL1 2A
IL2 = IL3 0A
Pre-fault voltages 63,15 V
Pre-fault currents 0A
Pre-fault time 200 ms
Fault time 200 ms
Tests per angle 5

Angle Result
°
44,0 no trip
44,5 no trip
45,0 5 trips
45,5 5 trips
-155,5 5 trips
-155,0 5 trips
-154,5 no trip
-154,0 no trip

Requirements:
Manufacturer specification: ± 2 degrees (RCA, ROA).

Result
The object passed the test.
Version: 1
 -158- 1446-18

3.3.54 Directional, trip time vs. angle (forward)

Standard and date

Standard -
Reference IEC 60255-151
Test date 23 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Function 67
Angle RCA 40 °
Angle ROA 85 °
DirMode1 Forward
Curve family IEC DT
t1 0s

Test 1 Test 2
Angle Trip time Trip time
° s s
0 0,040 0,042
5 0,042 0,037
10 0,042 0,041
15 0,037 0,035
20 0,038 0,035
25 0,037 0,036
30 0,043 0,039
35 0,041 0,037
40 0,040 0,037
45 0,040 0,039
50 no trip no trip
55 no trip no trip
60 no trip no trip
65 no trip no trip
70 no trip no trip
75 no trip no trip
80 no trip no trip
85 no trip no trip
90 no trip no trip
95 no trip no trip
100 no trip no trip
105 no trip no trip
110 no trip no trip
115 no trip no trip
120 no trip no trip
125 no trip no trip
130 no trip no trip
135 no trip no trip
140 no trip no trip
145 no trip no trip
Version: 1
 -159- 1446-18

Test 1 Test 2
Angle Trip time Trip time
° s s
150 no trip no trip
155 no trip no trip
160 no trip no trip
165 no trip no trip
170 no trip no trip
175 no trip no trip
180 no trip no trip
185 no trip no trip
190 no trip no trip
195 no trip no trip
200 no trip no trip
205 no trip no trip
210 no trip no trip
215 no trip no trip
220 no trip no trip
225 no trip no trip
230 no trip no trip
235 0,046 0,054
240 0,041 0,043
245 0,041 0,037
250 0,042 0,038
255 0,040 0,040
260 0,042 0,042
265 0,039 0,043
270 0,040 0,042
275 0,037 0,044
280 0,037 0,042
285 0,038 0,042
290 0,041 0,040
295 0,042 0,037
300 0,038 0,039
305 0,040 0,036
310 0,037 0,042
315 0,035 0,042
320 0,036 0,037
325 0,037 0,041
330 0,039 0,036
335 0,043 0,038
340 0,036 0,040
345 0,037 0,038
350 0,041 0,041
355 0,038 0,042
Version: 1
 -160- 1446-18

3.3.55 Directional, trip time vs angle reverse

Standard and date

Standard -
Reference IEC 60255-151
Test date 23 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Function 67
Angle RCA 55 °
Angle ROA 80 °
DirMode1 Reverse
Curve family IEC DT
t1 0s

Test 1 Test 2
Angle Trip time Trip time
° s s
0 no trip no trip
5 no trip no trip
10 no trip no trip
15 no trip no trip
20 no trip no trip
25 no trip no trip
30 no trip no trip
35 no trip no trip
40 no trip no trip
45 0,058 0,042
50 0,039 0,039
55 0,039 0,040
60 0,038 0,043
65 0,038 0,041
70 0,038 0,038
75 0,042 0,036
80 0,037 0,037
85 0,037 0,036
90 0,040 0,039
95 0,040 0,039
100 0,044 0,037
105 0,036 0,043
110 0,036 0,042
115 0,042 0,035
120 0,042 0,039
125 0,033 0,035
130 0,037 0,037
135 0,044 0,033
Version: 1
 -161- 1446-18

Test 1 Test 2
Angle Trip time Trip time
° s s
140 0,035 0,044
145 0,036 0,041
150 0,042 0,039
155 0,037 0,041
160 0,042 0,038
165 0,035 0,037
170 0,038 0,043
175 0,040 0,034
180 0,042 0,038
185 0,040 0,036
190 0,040 0,038
195 0,037 0,037
200 0,041 0,035
205 0,052 0,050
210 no trip no trip
215 no trip no trip
220 no trip no trip
225 no trip no trip
230 no trip no trip
235 no trip no trip
240 no trip no trip
245 no trip no trip
250 no trip no trip
255 no trip no trip
260 no trip no trip
265 no trip no trip
270 no trip no trip
275 no trip no trip
280 no trip no trip
285 no trip no trip
290 no trip no trip
295 no trip no trip
300 no trip no trip
305 no trip no trip
310 no trip no trip
315 no trip no trip
320 no trip no trip
325 no trip no trip
330 no trip no trip
335 no trip no trip
340 no trip no trip
345 no trip no trip
350 no trip no trip
355 no trip no trip
Version: 1
 -162- 1446-18

3.4 Instantaneous residual overcurrent protection, EFPIOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 8 January 2018

Environmental conditions
Ambient temperature 22,5 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Operate time at 0 to 2x Iset Min. = 15 ms
Max. = 25 ms
Operate time at 0 to 10 x Iset Min. = 5 ms
Max. = 15 ms
Accuracy ±1,0% of Ir at Ir
±1,0% of I at I
Reset ratio >95% at (50-2500)% of IBase
T-reset at 2 x Iset to 0 Min. = 15 ms
Max. = 25 ms
T-reset at 10 x Iset to 0 Min. = 25 ms
Max. = 35 ms

Result
The object passed the test.
Version: 1
 -163- 1446-18

3.4.1 Intrinsic accuracy

Characteristic test data

Sample IED 3A
Rated current 1A
Range Gs 0,05 X Irated to 4 x Irated
Initial start value ≤ 2 x of specified accuracy
Ramping step 0,1 x of specified accuracy
Step time 0,1 sec
IL2nd, IL3rd 0A
Repetitions 5

Intrinsic accuracy (Input IL1)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Iset A A A ratio
0,0 0,05 0,049 0,050 0,051 -0,60 0,031 0,032 0,032 63,4
0,5 0,07 0,069 0,070 0,070 -0,14 0,051 0,051 0,052 73,2
1,0 0,09 0,089 0,090 0,091 0,22 0,070 0,071 0,072 78,3
2,0 0,13 0,129 0,129 0,130 -0,54 0,110 0,111 0,112 85,8
3,0 0,17 0,169 0,170 0,170 -0,12 0,150 0,151 0,152 88,8
5,0 0,25 0,249 0,250 0,250 -0,20 0,231 0,231 0,232 92,7
10,0 0,45 0,449 0,450 0,450 -0,11 0,430 0,431 0,431 95,8
20,0 0,84 0,839 0,840 0,840 -0,05 0,814 0,815 0,816 97,1
30,0 0,84 0,839 0,840 0,840 -0,05 0,814 0,815 0,816 97,1
60,0 1,24 1,238 1,240 1,241 -0,04 1,203 1,203 1,203 97,0
100,0 2,42 2,417 2,418 2,419 -0,09 2,346 2,346 2,347 97,0

Intrinsic accuracy (Input IL2)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Iset A A A ratio
0,0 0,05 0,049 0,050 0,051 -0,20 0,031 0,031 0,032 62,7
0,5 0,07 0,069 0,070 0,071 0,14 0,051 0,051 0,052 72,9
1,0 0,09 0,089 0,090 0,090 -0,44 0,071 0,072 0,072 79,8
2,0 0,13 0,129 0,130 0,130 -0,08 0,110 0,111 0,111 85,1
3,0 0,17 0,169 0,170 0,170 -0,18 0,150 0,150 0,152 88,6
5,0 0,25 0,249 0,249 0,250 -0,32 0,229 0,230 0,231 92,3
10,0 0,45 0,449 0,449 0,450 -0,18 0,429 0,429 0,430 95,6
20,0 0,84 0,837 0,838 0,839 -0,25 0,813 0,813 0,813 97,0
30,0 0,84 0,837 0,838 0,839 -0,25 0,813 0,813 0,813 97,0
60,0 1,24 1,239 1,240 1,240 -0,02 1,202 1,203 1,203 97,0
100,0 2,42 2,417 2,417 2,418 -0,11 2,345 2,345 2,345 97,0
Version: 1
 -164- 1446-18

Intrinsic accuracy (Input IL3)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Iset A A A ratio
0,0 0,05 0,050 0,050 0,050 -0,40 0,031 0,031 0,032 62,7
0,5 0,07 0,069 0,070 0,070 -0,57 0,051 0,051 0,051 73,3
1,0 0,09 0,089 0,090 0,090 -0,22 0,071 0,071 0,072 79,4
2,0 0,13 0,129 0,130 0,130 -0,38 0,110 0,111 0,112 85,9
3,0 0,17 0,169 0,170 0,170 -0,29 0,151 0,151 0,151 89,1
5,0 0,25 0,249 0,249 0,250 -0,28 0,230 0,231 0,231 92,6
10,0 0,45 0,448 0,449 0,450 -0,27 0,430 0,431 0,431 95,9
20,0 0,84 0,839 0,840 0,840 -0,05 0,814 0,815 0,815 97,0
30,0 0,84 0,839 0,840 0,840 -0,05 0,814 0,815 0,815 97,0
60,0 1,24 1,239 1,239 1,239 -0,09 1,202 1,202 1,203 97,0
100,0 2,42 2,417 2,418 2,418 -0,10 2,346 2,346 2,346 97,0
Version: 1
 -165- 1446-18

3.4.2 Definite time 0,05IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Fault L1-N
IL2nd IL3rd 1A

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 0 0,025 0,026 0,027 0,020 0,022 0,023
2 1,10 0 0,200 0,021 0,023 0,024 0,026 0,027
5 1,25 0 0,011 0,012 0,013 0,031 0,033 0,034
10 1,50 0 0,010 0,011 0,013 0,036 0,037 0,038
20 2,00 0 0,090 0,010 0,011 0,041 0,042 0,044
Version: 1
 -166- 1446-18

3.4.3 Definite time 0,1IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,1 x Irated
Fault L2-N
IL2nd IL3rd 1A

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 0 0,027 0,028 0,029 0,016 0,017 0,017
2 1,20 0 0,019 0,020 0,020 0,021 0,022 0,024
5 1,50 0 0,009 0,010 0,012 0,028 0,029 0,031
10 2,00 0 0,008 0,009 0,011 0,033 0,035 0,036
20 3,00 0 0,007 0,009 0,010 0,038 0,039 0,040
Version: 1
 -167- 1446-18

3.4.4 Definite time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC DT
Range Gs 0,01 x Irated to 25 x Irated
Gs 1 x Irated
Fault L2-N
IL2nd IL3rd 1A

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0 0,027 0,028 0,029 0,014 0,015 0,017
2 3,0 0 0,019 0,020 0,021 0,022 0,023 0,025
5 6,0 0 0,013 0,015 0,016 0,029 0,030 0,032
10 11,0 0 0,009 0,010 0,011 0,034 0,035 0,036
20 21,0 0 0,008 0,009 0,010 0,039 0,040 0,041
Version: 1
 -168- 1446-18

3.4.5 Reset time 0,1IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,1 x Irated
Fault L1-N
IL2nd IL3rd 1A

Residual current Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 0,2 0,8 0,08 0,051 0,054 0,056 0,054 0,056 0,051 0,054 0,056
2 0,2 0,4 0,04 0,025 0,028 0,025 0,027 0,026 0,025 0,026 0,028
2 0,2 0,2 0,02 0,025 0,026 0,026 0,025 0,024 0,024 0,025 0,026
2 0,2 0,1 0,01 0,025 0,026 0,025 0,024 0,025 0,024 0,025 0,026
2 0,2 0 0 0,023 0,023 0,022 0,023 0,022 0,022 0,022 0,023
Version: 1
 -169- 1446-18

3.4.6 Reset time 1,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Fault L1-N
IL2nd IL3rd 1A

Residual current Measured reset times trip contact Result

Initial value End value s
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 2 0,8 0,8 0,031 0,032 0,029 0,031 0,032 0,029 0,031 0,032
2 2 0,4 0,4 0,023 0,023 0,024 0,024 0,023 0,023 0,023 0,024
2 2 0,2 0,2 0,023 0,023 0,023 0,021 0,024 0,021 0,023 0,024
2 2 0,1 0,1 0,022 0,023 0,023 0,023 0,023 0,022 0,023 0,023
2 2 0 0 0,021 0,023 0,023 0,023 0,023 0,021 0,023 0,023
Version: 1
 -170- 1446-18

3.4.7 Reset time 4,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Fault L1-N
IL2nd IL3rd 1A

Residual current Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 8 0,8 3,2 0,031 0,032 0,029 0,030 0,030 0,029 0,030 0,032
2 8 0,4 1,6 0,025 0,025 0,023 0,025 0,026 0,023 0,024 0,026
2 8 0,2 0,8 0,021 0,021 0,022 0,023 0,024 0,021 0,022 0,024
2 8 0,1 0,4 0,024 0,022 0,021 0,023 0,023 0,021 0,023 0,024
2 8 0 0 0,023 0,021 0,023 0,022 0,023 0,021 0,022 0,023
Version: 1
 -171- 1446-18

3.5 Directional residual overcurrent protection, EF4PTOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 25 January 2018

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy operate current ±1,0% of Ir at ≤ Ir
±1,0% of I at I > Ir
Operate current, step 1-4 (1-2500)% of IBase
Reset ratio >95% at (10-2500)% of IBase
Relay characteristic angle (-180 to 180) degrees
Operate time, start non-directional at 0 to 2 x Iset Min. = 15 ms
Max. = 30 ms
Reset time, start non-directional at 2 x Iset to 0 Min. = 15 ms
Max. = 30 ms
Operate time, start non-directional at 0 to 10 x Iset Min. = 5 ms
Max. = 20 ms
Reset time, start non-directional at 10 x Iset to 0 Min. = 20 ms
Max. = 35 ms
Operate current for directional release (1-100)% of IBase
Minimum operate time for inverse curves, step 1-4 (0,000-60,000) s
Independent time delay at 0 to 2 x Iset, step 1-4 (0,000-60,000) s

Result
The object passed the test.
Version: 1
 -172- 1446-18

3.5.1 Intrinsic accuracy

Characteristic test data

Sample IED 3A
Rated current 1A
Rated frequency 50 Hz
DirMode1 Non-directional
Initial start value ≤ 2 x of specified accuracy
Ramping step 0,1 x of specified accuracy
Step time 2 to 5 x tstart
Repetitions 5

Intrinsic accuracy (Input IL1)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Ir A A A ratio
0,0 0,01 0,009 0,010 0,010 -0,04 0,005 0,006 0,006 0,61
0,5 0,03 0,029 0,030 0,030 -0,02 0,026 0,026 0,027 0,89
1,0 0,05 0,049 0,049 0,050 -0,07 0,046 0,047 0,048 0,94
2,0 0,09 0,089 0,090 0,090 -0,04 0,086 0,086 0,086 0,96
3,0 0,13 0,129 0,129 0,130 -0,06 0,126 0,126 0,127 0,97
5,0 0,21 0,210 0,210 0,211 0,00 0,206 0,206 0,206 0,98
10,0 0,41 0,409 0,409 0,410 -0,06 0,401 0,402 0,403 0,98
20,0 0,81 0,808 0,809 0,810 -0,10 0,793 0,794 0,794 0,98
30,0 1,21 1,208 1,209 1,209 -0,14 1,185 1,185 1,185 0,98
60,0 2,40 2,397 2,397 2,397 -0,34 2,349 2,349 2,350 0,98
100,0 4,00 3,990 3,991 3,992 -0,91 3,912 3,912 3,913 0,98

Intrinsic accuracy (Input IL2)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Ir A A A ratio
0,0 0,01 0,009 0,010 0,010 0,00 0,026 0,026 0,027 0,87
0,5 0,03 0,030 0,030 0,031 0,00 0,047 0,047 0,048 0,94
1,0 0,05 0,050 0,050 0,050 -0,02 0,086 0,087 0,088 0,96
2,0 0,09 0,090 0,090 0,090 0,01 0,126 0,126 0,126 0,97
3,0 0,13 0,130 0,130 0,131 -0,01 0,205 0,206 0,206 0,98
5,0 0,21 0,209 0,210 0,210 0,00 0,402 0,402 0,402 0,98
10,0 0,41 0,410 0,410 0,411 -0,06 0,794 0,794 0,794 0,98
20,0 0,81 0,809 0,809 0,810 -0,06 0,794 0,794 0,794 0,98
30,0 1,21 1,209 1,209 1,209 -0,10 1,185 1,185 1,185 0,98
60,0 2,40 2,397 2,397 2,397 -0,31 2,349 2,349 2,350 0,98
100,0 4,00 3,992 3,992 3,993 -0,78 3,912 3,913 3,913 0,98
Version: 1
 -173- 1446-18

Intrinsic accuracy (Input IL3)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range A A A A % Ir A A A ratio
0,0 0,01 0,009 0,010 0,010 -0,04 0,006 0,006 0,007 0,64
0,5 0,03 0,029 0,030 0,030 -0,04 0,026 0,026 0,027 0,89
1,0 0,05 0,049 0,050 0,050 -0,03 0,046 0,046 0,047 0,93
2,0 0,09 0,089 0,090 0,090 -0,04 0,086 0,087 0,087 0,97
3,0 0,13 0,129 0,130 0,130 -0,04 0,126 0,126 0,127 0,98
5,0 0,21 0,210 0,211 0,212 0,07 0,206 0,206 0,207 0,98
10,0 0,41 0,410 0,410 0,411 0,02 0,403 0,403 0,404 0,98
20,0 0,81 0,810 0,810 0,811 0,03 0,794 0,795 0,796 0,98
30,0 1,21 1,210 1,210 1,211 0,01 1,187 1,187 1,187 0,98
60,0 2,40 2,399 2,400 2,401 0,00 2,352 2,353 2,353 0,98
100,0 4,00 3,997 3,998 3,998 -0,25 3,9175 3,919 3,919 0,98
Version: 1
 -174- 1446-18

3.5.2 Definite time 0,05IB, 0 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,01 x Irated to 25 x Irated
Gs 0,05 x Irated
Range t1 0 s to 60 s
Set t1 0s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 0 0,026 0,029 0,032 0,015 0,017 0,020
2 1,10 0 0,019 0,021 0,024 0,022 0,024 0,028
5 1,25 0 0,012 0,014 0,017 0,024 0,027 0,029
10 1,50 0 0,014 0,017 0,019 0,025 0,027 0,032
20 2,00 0 0,010 0,016 0,019 0,026 0,029 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 0 0,026 0,029 0,032 0,015 0,017 0,020
2 1,10 0 0,019 0,021 0,024 0,022 0,024 0,028
5 1,25 0 0,012 0,014 0,017 0,024 0,027 0,029
10 1,50 0 0,014 0,017 0,019 0,025 0,027 0,032
20 2,00 0 0,010 0,016 0,018 0,026 0,028 0,033
Version: 1
 -175- 1446-18

3.5.3 Definite time 0,05IB, 0,3 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Range t1 0 s to 60 s
Set t1 0,3 s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 0,3 0,027 0,029 0,031 0,013 0,015 0,017
2 1,10 0,3 0,018 0,020 0,022 0,020 0,023 0,029
5 1,25 0,3 0,012 0,014 0,016 0,025 0,027 0,029
10 1,50 0,3 0,013 0,014 0,018 0,024 0,027 0,032
20 2,00 0,3 0,011 0,016 0,019 0,027 0,029 0,032

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 0,3 0,330 0,334 0,337 0,013 0,015 0,017
2 1,10 0,3 0,321 0,323 0,325 0,020 0,023 0,028
5 1,25 0,3 0,317 0,318 0,321 0,025 0,027 0,029
10 1,50 0,3 0,315 0,318 0,321 0,024 0,027 0,032
20 2,00 0,3 0,314 0,319 0,322 0,027 0,029 0,032
Version: 1
 -176- 1446-18

3.5.4 Definite time 0,05IB, 60 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Range t1 0 s to 60 s
Set t1 60 s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 60 - - - - - -
2 1,10 60 0,018 0,023 0,026 0,021 0,025 0,028
5 1,25 60 0,014 0,016 0,019 0,023 0,027 0,030
10 1,50 60 0,012 0,014 0,017 0,027 0,030 0,033
20 2,00 60 0,012 0,015 0,017 0,025 0,028 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,06 60 - - - - - -
2 1,10 60 60,018 60,025 60,031 0,020 0,025 0,028
5 1,25 60 60,023 60,025 60,028 0,023 0,027 0,030
10 1,50 60 60,014 60,018 60,022 0,027 0,030 0,033
20 2,00 60 60,011 60,014 60,017 0,025 0,028 0,030
Version: 1
 -177- 1446-18

3.5.5 Definite time 1,0IB, 0 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,01 x Irated to 25 x Irated
Gs 1 x Irated
Range t1 0 s to 60 s
Set t1 0s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0 0,023 0,027 0,031 0,011 0,020 0,039
2 3,0 0 0,019 0,023 0,027 0,019 0,022 0,025
5 6,0 0 0,012 0,017 0,019 0,025 0,027 0,030
10 11,0 0 0,013 0,015 0,018 0,026 0,029 0,032
20 21,0 0 0,012 0,016 0,019 0,025 0,030 0,033

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0 0,023 0,027 0,031 0,011 0,016 0,019
2 3,0 0 0,019 0,023 0,027 0,019 0,022 0,025
5 6,0 0 0,012 0,017 0,020 0,025 0,027 0,030
10 11,0 0 0,013 0,015 0,018 0,026 0,029 0,031
20 21,0 0 0,012 0,016 0,019 0,025 0,029 0,033
Version: 1
 -178- 1446-18

3.5.6 Definite time 1,0IB, 0,3 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,01 x Irated to 25 x Irated
Gs 1 x Irated
Range t1 0 s to 60 s
Set t1 0,3 s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0,3 0,024 0,027 0,031 0,011 0,015 0,019
2 3,0 0,3 0,019 0,023 0,025 0,019 0,022 0,024
5 6,0 0,3 0,014 0,017 0,020 0,026 0,029 0,031
10 11,0 0,3 0,011 0,015 0,018 0,026 0,027 0,028
20 21,0 0,3 0,010 0,014 0,017 0,026 0,027 0,028

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0,3 0,329 0,331 0,334 0,011 0,015 0,019
2 3,0 0,3 0,325 0,328 0,331 0,019 0,022 0,024
5 6,0 0,3 0,317 0,321 0,323 0,026 0,029 0,030
10 11,0 0,3 0,317 0,319 0,322 0,026 0,027 0,028
20 21,0 0,3 0,315 0,318 0,320 0,026 0,027 0,028
Version: 1
 -179- 1446-18

3.5.7 Definite time 1,0IB, 60 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Range t1 0 s to 60 s
Set t1 60 s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 60 0,027 0,030 0,032 0,013 0,015 0,020
2 3,0 60 0,020 0,025 0,028 0,019 0,024 0,027
5 6,0 60 0,015 0,018 0,021 0,025 0,027 0,031
10 11,0 - - - - - - -
20 21,0 - - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 60 60,035 60,038 60,042 0,013 0,015 0,020
2 3,0 60 60,029 60,032 60,036 0,019 0,023 0,027
5 6,0 60 60,016 60,024 60,027 0,025 0,027 0,031
10 11,0 - - - - - - -
20 21,0 - - - - - - -
Version: 1
 -180- 1446-18

3.5.8 Definite time 4,0IB, 0 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Range t1 0 s to 60 s
Set t1 0s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 5,8 0 0,023 0,027 0,032 0,012 0,016 0,020
2 9,0 0 0,018 0,022 0,024 0,019 0,023 0,027
5 21,0 0 0,013 0,016 0,021 0,025 0,027 0,029
10 41,0 0 0,013 0,015 0,016 0,025 0,029 0,033
20 81,0 0 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 5,8 0 0,023 0,027 0,032 0,012 0,016 0,020
2 9,0 0 0,019 0,022 0,024 0,019 0,023 0,027
5 21,0 0 0,013 0,016 0,021 0,025 0,027 0,028
10 41,0 0 0,013 0,015 0,016 0,025 0,029 0,033
20 81,0 0 - - - - - -
Version: 1
 -181- 1446-18

3.5.9 Definite time 4,0IB, 0,3 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Range t1 0 s to 60 s
Set t1 0,3 s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 5,8 0,3 0,025 0,027 0,031 0,012 0,016 0,020
2 9,0 0,3 0,018 0,022 0,024 0,022 0,024 0,026
5 21,0 0,3 0,014 0,017 0,020 0,024 0,028 0,030
10 41,0 0,3 0,011 0,012 0,014 0,026 0,027 0,028
20 81,0 0,3 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 5,8 0,3 0,328 0,332 0,336 0,011 0,015 0,020
2 9,0 0,3 0,324 0,325 0,327 0,022 0,024 0,025
5 21,0 0,3 0,320 0,321 0,322 0,024 0,028 0,030
10 41,0 0,3 0,316 0,317 0,318 0,025 0,027 0,028
20 81,0 0,3 - - - - - -
Version: 1
 -182- 1446-18

3.5.10 Definite time 4,0IB, 60 s

Characteristic test data

Sample IED 3B
Rated current (Irated) 1A
Rated frequency 50 Hz
DirMode1 Non directional
Curve family IEC DT
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Range t1 0 s to 60 s
Set t1 60 s
Fault L2-N
IL1=IL3 1A

Start
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 5,8 60 0,026 0,028 0,033 0,011 0,015 0,020
2 8,0 60 - - - - - -
5 20,0 60 - - - - - -
10 40,0 60 - - - - - -
20 80,0 60 - - - - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 5,8 60 60,032 60,036 60,039 0,011 0,014 0,019
2 8,0 60 - - - - - -
5 20,0 60 - - - - - -
10 40,0 60 - - - - - -
20 80,0 60 - - - - - -
Version: 1
 -183- 1446-18

3.5.11 Reset time 0,05IB

Characteristic test data

Sample IED 3B
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 0,05 x Irated
Fault L2-N
IL1=IL3 1A

Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 1,1 0,8 1,04 0,024 0,032 0,027 0,029 0,026 0,024 0,028 0,032
2 1,1 0,4 1,02 0,026 0,022 0,025 0,023 0,020 0,020 0,023 0,026
2 1,1 0,2 1,01 0,021 0,026 0,022 0,023 0,023 0,021 0,023 0,026
2 1,1 0 1 0,026 0,024 0,023 0,023 0,024 0,023 0,024 0,026
Version: 1
 -184- 1446-18

3.5.12 Reset time 1,0IB

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 1 x Irated
Fault L2-N
IL1=IL3 1A

Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 3 0,8 1,8 0,025 0,031 0,026 0,028 0,029 0,025 0,028 0,031
2 3 0,4 1,4 0,025 0,024 0,023 0,024 0,020 0,020 0,023 0,025
2 3 0,2 1,2 0,026 0,024 0,023 0,021 0,024 0,021 0,024 0,026
2 3 0,1 1,1 0,019 0,025 0,023 0,019 0,026 0,019 0,022 0,026
2 3 0 1 0,023 0,019 0,022 0,021 0,024 0,019 0,022 0,024
Version: 1
 -185- 1446-18

3.5.13 Reset time 4,0IB

Characteristic test data

Sample IED 3B
Rated current = IBase 1A
Rated frequency 50 Hz
Range Gs 0,05 x Irated to 25 x Irated
Gs 4 x Irated
Fault L2-N
IL1=IL3 1A

Measured reset times trip contact

Initial value End value s Result
xGs A xGs A 1 2 3 4 5 Min. Avg. Max.
2 9 0,8 4,2 0,028 0,024 0,026 0,026 0,026 0,024 0,026 0,028
2 9 0,4 2,6 0,024 0,029 0,021 0,020 0,022 0,020 0,023 0,029
2 9 0,2 1,8 0,024 0,026 0,027 0,026 0,023 0,023 0,025 0,027
2 9 0,1 1,4 0,021 0,025 0,022 0,024 0,026 0,021 0,024 0,026
2 9 0 1 0,023 0,020 0,019 0,026 0,024 0,019 0,022 0,026
Version: 1
 -186- 1446-18

3.5.14 Directional, accuracy of operating angle (forward)

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
SeqType Zero seq
EnDir Enable
AngleRCA 65 °
polMethod Voltage
set t1 0s
Fault L1-N
IL1 2A
IL2=IL3 0A
UL1 30 V
Pre-fault voltages 63,15 V
Pre-fault currents 0A
Pre fault time 200 ms
Fault time 200 ms
Tests per angle 5

Angle accuracy, DirMode1: Reverse

Angle Result
°
27,0 no trip
28,0 3 trips
29,0 3 trips
30,0 5 trips
30,5 5 trips
200,0 5 trips
201,0 3 trips
202,0 3 trips
203,0 1 short trip
204,0 1 short trip
205,0 no trip
205,5 no trip
Version: 1
 -187- 1446-18

Angle accuracy, DirMode1: Forward

Angle Result
°
20,0 5 trips
21,0 3 trips
21,5 3 trips
22,0 3 trips
22,5 no trip
23,0 no trip
206,5 no trip
207,0 no trip
207,5 2 trips
208,0 2 trips
209,0 2 trips
210,0 5 trips

Requirements:
Manufacturer specification: ± 2 degrees (RCA, ROA).

Result
The object passed the test.
Version: 1
 -188- 1446-18

3.5.15 Directional, trip time vs. angle

Standard and date

Standard -
Reference IEC 60255-151
Test date 25 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
SeqType Zero seq
EnDir Enable
Angle RCA 65 °
polMethod Voltage
DirMode1 Forward
Curve family IEC DT
t1 0s

Test 1 Test 2
Angle Trip time Trip time
° s s
0 0,028 0,030
5 0,031 0,025
10 0,030 0,028
15 0,026 0,027
20 0,026 0,028
25 no trip no trip
30 no trip no trip
35 no trip no trip
40 no trip no trip
45 no trip no trip
50 no trip no trip
55 no trip no trip
60 no trip no trip
65 no trip no trip
70 no trip no trip
75 no trip no trip
80 no trip no trip
85 no trip no trip
90 no trip no trip
95 no trip no trip
100 no trip no trip
105 no trip no trip
110 no trip no trip
115 no trip no trip
120 no trip no trip
125 no trip no trip
130 no trip no trip
135 no trip no trip
Version: 1
 -189- 1446-18

Test 1 Test 2
Angle Trip time Trip time
° s s
140 no trip no trip
145 no trip no trip
150 no trip no trip
155 no trip no trip
160 no trip no trip
165 no trip no trip
170 no trip no trip
175 no trip no trip
180 no trip no trip
185 no trip no trip
190 no trip no trip
195 no trip no trip
200 no trip no trip
205 no trip no trip
210 no trip 0,030
215 0,026 0,027
220 0,025 0,025
230 0,030 0,026
225 0,033 0,031
235 0,030 0,028
240 0,027 0,029
245 0,034 0,031
255 0,030 0,032
260 0,025 0,027
265 0,029 0,030
250 0,029 0,031
270 0,026 0,028
275 0,031 0,031
280 0,027 0,025
285 0,028 0,029
290 0,032 0,029
295 0,027 0,029
300 0,027 0,026
305 0,027 0,032
310 0,026 0,025
315 0,027 0,027
320 0,030 0,032
325 0,031 0,030
330 0,028 0,033
335 0,027 0,028
340 0,028 0,030
345 0,033 0,028
350 0,029 0,031
355 0,025 0,031
Version: 1
 -190- 1446-18

3.5.16 Directional, trip time vs. angle (reverse)

Standard and date

Standard -
Reference IEC 60255-151
Test date 25 January 2018

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
SeqType Zero seq
EnDir Enable
Angle RCA 65 °
polMethod Voltage
DirMode1 Reverse
Curve family IEC DT
t1 0s

Test 1 Test 2
Angle Trip time Trip time
° s s
0 no trip no trip
5 no trip no trip
10 no trip no trip
15 no trip no trip
20 no trip no trip
25 no trip no trip
30 0,042 0,030
35 0,027 0,031
40 0,029 0,028
45 0,033 0,029
50 0,030 0,030
55 0,030 0,024
60 0,031 0,032
65 0,031 0,032
70 0,032 0,033
75 0,028 0,027
80 0,029 0,027
85 0,027 0,027
90 0,026 0,034
95 0,025 0,029
100 0,026 0,031
105 0,026 0,031
110 0,028 0,027
115 0,028 0,030
120 0,030 0,029
125 0,029 0,028
Version: 1
 -191- 1446-18

Test 1 Test 2
Angle Trip time Trip time
° s s
130 0,031 0,027
135 0,031 0,029
140 0,034 0,034
145 0,029 0,028
150 0,029 0,028
155 0,026 0,025
160 0,025 0,027
165 0,032 0,032
170 0,032 0,031
175 0,031 0,027
180 0,026 0,028
185 0,026 0,033
190 0,027 0,028
195 0,032 0,031
200 0,025 0,028
205 no trip no trip
210 no trip no trip
215 no trip no trip
220 no trip no trip
225 no trip no trip
230 no trip no trip
235 no trip no trip
240 no trip no trip
245 no trip no trip
250 no trip no trip
255 no trip no trip
260 no trip no trip
265 no trip no trip
270 no trip no trip
275 no trip no trip
280 no trip no trip
285 no trip no trip
290 no trip no trip
295 no trip no trip
300 no trip no trip
305 no trip no trip
310 no trip no trip
315 no trip no trip
320 no trip no trip
325 no trip no trip
Version: 1
 -192- 1446-18

Test 1 Test 2
Angle Trip time Trip time
° s s
330 no trip no trip
335 no trip no trip
340 no trip no trip
345 no trip no trip
350 no trip no trip
355 no trip no trip
Version: 1
 -193- 1446-18

3.6 Voltage dependent overcurrent, VRPVOC

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-151
Test date 3 December 2017

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy start overcurrent ±1% of Ir at I ≤ Ir
±1% of I at I > Ir
Start overcurrent (2,0-5000,0)% of IBase
Reset ratio, overcurrent >95%
Reset time, start overcurrent at 2 x Iset to 0 Min. = 15 ms
Max. = 30 ms
Operate time, start overcurrent at 0 to 2x Iset Min. = 15 ms
Max. = 30 ms
Reset time, start overcurrent at 10 x Iset to 0 Min. = 20 ms
Max. = 35 ms
Operate time, start overcurrent at 0 to 10 x Iset Min. = 5 ms
Max. = 20 ms
Minimum operate time for inverse time (0,00-60,00) s
characteristic
Accuracy minimum operate time for inverse tima ±0,2% or ±35 ms whichever is greater
characteristic

Result
The object passed the test.
Version: 1
 -194- 1446-18

3.6.1 Intrinsic accuracy

Characteristic test data

Sample IED 3A
Rated current = IBase 1A
Rated frequency 50 Hz
VDepMode See tables
Range Gs 0,02 x IBase to 4 x IBase
Curve family DT
Repetitions 5

Input IL1
VDepMode Slope
UHighLimit 100 %UB
VDepFact 5%
Istart 100 %IB

Applied values Measured values

Operate Reset
U U Min. Avg. Max. Deviation Min. Avg. Max. Reset
% UB V A A A % of IB A A A ratio
100 110 1,000 1,001 1,001 0,08 0,960 0,960 0,961 0,96
80 88 0,747 0,747 0,747 0,0 0,717 0,717 0,717 0,96
60 66 0,494 0,494 0,494 0,1 0,474 0,474 0,474 0,96
50 55 0,367 0,368 0,368 0,1 0,352 0,353 0,353 0,96
40 44 0,241 0,241 0,241 0,1 0,231 0,231 0,231 0,96
30 33 0,114 0,114 0,114 0,1 0,109 0,109 0,109 0,96
25 27,5 0,050 0,050 0,05 0,0 0,049 0,049 0,049 0,98
20 22 0,049 0,050 0,051 0,0 0,049 0,049 0,049 0,98

Input IL2
VDepMode Slope
UHighLimit 80 %UB
VDepFact 10 %
Istart 50 %IB

Set values Measured values

Operate Reset
U U Min. Avg. Max. Deviation Min. Avg. Max. Reset
% UB V A A A %of IB A A A ratio
100 110 0,499 0,499 0,500 -0,1 0,479 0,479 0,479 0,96
80 88 0,499 0,500 0,500 0,0 0,479 0,479 0,479 0,96
60 66 0,336 0,336 0,337 0,0 0,323 0,323 0,323 0,96
50 55 0,254 0,255 0,255 0,0 0,244 0,244 0,244 0,96
40 44 0,173 0,173 0,173 0,0 0,165 0,166 0,166 0,96
30 33 0,091 0,092 0,092 0,1 0,088 0,088 0,089 0,96
25 27,5 0,051 0,051 0,051 0,1 0,049 0,049 0,049 0,96
20 22 0,051 0,051 0,051 0,1 0,049 0,049 0,049 0,96
Version: 1
 -195- 1446-18

Input IL3
VDepMode Step
UHighLimit 50 %UB
VDepFact 30 %
Istart 50 %IB

Set values Measured values

Operate Reset
U U Min. Avg. Max. Deviation Min. Avg. Max. Reset
% UB V A A A % of IB A A A ratio
100 110 0,500 0,500 0,501 0,0 0,480 0,480 0,480 0,96
80 88 0,500 0,500 0,501 0,0 0,480 0,480 0,480 0,96
60 66 0,500 0,500 0,500 0,0 0,480 0,480 0,480 0,96
50 55 0,500 0,500 0,500 0,0 0,480 0,480 0,480 0,96
40 44 0,150 0,150 0,151 0,0 0,144 0,144 0,144 0,96
30 33 0,150 0,151 0,151 0,1 0,144 0,144 0,144 0,95
25 27,5 0,150 0,150 0,151 0,0 0,144 0,144 0,145 0,96
20 22 0,150 0,151 0,151 0,1 0,144 0,144 0,145 0,96
Version: 1
 -196- 1446-18

3.6.2 Definite time 0,02IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC DT
Range Gs 0,02 x Irated to 50 x Irated
Gs 0,02 x Irated
Range tDef_OC 0 s to 6000 s
Set tDef_OC 0s
VDepMode Step
UHighLimit 60 %UB
VDepFact 50 %
Fault L2-N

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,012 0 0,026 0,029 0,034 0,011 0,015 0,018
2 0,020 0 0,024 0,027 0,031 0,015 0,017 0,019
5 0,050 0 0,017 0,019 0,022 0,023 0,025 0,027
10 0,100 0 0,013 0,017 0,020 0,023 0,028 0,031
20 0,200 0 0,014 0,016 0,018 0,026 0,029 0,033
Version: 1
 -197- 1446-18

3.6.3 Definite time 1,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC DT
Range Gs 0,02 x Irated to 50 x Irated
Gs 1 x Irated
Range tDef_OC 0 s to 6000 s
Set tDef_OC 0s
VDepMode Step
UHighLimit 60 %UB
VDepFact 50 %
Fault L2-N

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 0,6 0 0,026 0,029 0,031 0,012 0,015 0,019
2 1,0 0 0,027 0,029 0,031 0,014 0,016 0,018
5 2,5 0 0,018 0,021 0,023 0,020 0,025 0,029
10 5,0 0 0,014 0,016 0,020 0,023 0,028 0,031
20 10,0 0 0,013 0,017 0,019 0,036 0,040 0,043
Version: 1
 -198- 1446-18

3.6.4 Definite time 5,0IB

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
Curve family IEC DT
Range Gs 0,02 x Irated to 50 x Irated
Gs 5 x Irated
Range tDef_OC 0 s to 6000 s
Set tDef_OC 0s
VDepMode Step
UHighLimit 60 %UB
VDepFact 50 %
Fault L2-N

Trip
Applied values Measured values
Time delay Operate time Reset time
Ifault theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 3,0 0 0,025 0,028 0,033 0,014 0,017 0,019
2 5,0 0 0,024 0,027 0,029 0,013 0,017 0,019
5 12,5 0 0,018 0,021 0,024 0,033 0,036 0,038
10 25,0 0 0,016 0,019 0,022 0,034 0,038 0,042
20 50,0 0 0,014 0,016 0,019 0,036 0,039 0,043
Version: 1
 -199- 1446-18

3.7 Sensitive directional residual overcurrent and power

protection, SDEPSDE
3.7.1 Accuracy 0 degree

Standard and date

Standard -
Reference IEC 60255-151
Test date 29 January 2018

Characteristic test data

Sample IED 3A
Set UBase 110 V
Set IBase 1A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode 3I0Cosfi
DirMode Forward
Angle RCADir 0°
Angle RCAComp 0°
Angle ROADir 85 °
DirMode1 Forward
TimeChar IEC Def Time
tDef 0s
Range Gs INCosPhi> 0,0025 x IBase to 2 IBase
Gs 1 x IBase
Fault L2-N
UL2-N 50 V
UL1-N = UL3-N 63,51 V
IL1 = IL3 0A

Angle I theor. Ioperate Deviation Ireset

Min. Avg. Max. Itheor. IBase Min. Avg. Max.
3 Io to -3 Uo ° A % %
-70 2,924 2,909 2,913 2,918 -0,4 -1,1 2,884 2,886 2,889
-60 2,000 1,993 1,995 1,996 -0,2 -0,5 1,962 1,964 1,966
-50 1,556 1,553 1,554 1,556 -0,1 -0,2 1,525 1,527 1,528
-40 1,305 1,305 1,305 1,305 0,0 0,0 1,279 1,280 1,282
-30 1,155 1,155 1,155 1,155 0,0 0,0 1,131 1,131 1,132
-20 1,064 1,065 1,065 1,065 0,1 0,1 1,042 1,042 1,043
-10 1,015 1,016 1,017 1,017 0,2 0,2 0,994 0,995 0,995
0 1,000 1,001 1,002 1,002 0,2 0,2 0,979 0,980 0,980
Version: 1
 -200- 1446-18

Angle I theor. Ioperate Deviation Ireset

Min. Avg. Max. Itheor. IBase Min. Avg. Max.
3 Io to -3 Uo ° A % %
10 1,015 1,017 1,017 1,017 0,2 0,2 0,995 0,995 0,995
20 1,064 1,065 1,066 1,066 0,2 0,2 1,042 1,043 1,043
30 1,155 1,154 1,155 1,156 0,0 0,0 1,131 1,131 1,133
40 1,305 1,305 1,306 1,306 0,0 0,1 1,279 1,280 1,281
50 1,556 1,553 1,554 1,556 -0,1 -0,2 1,524 1,526 1,527
60 2,000 1,995 1,996 1,996 -0,2 -0,4 1,961 1,963 1,965
70 2,924 2,903 2,904 2,905 -0,7 -2,0 2,874 2,878 2,885
- - - - - - - - - -
-100 no trip - no trip - - - - - -
180 no trip - no trip - - - - - -
100 no trip - no trip - - - - - -

Requirement
Manufacturer specification.
Operate level for 3I0cosfi dirctional residual overcurrent:
- 1% of Ir at I ≤ Ir
- 1% of I at I ≥ Ir.

Result
The object passed the test.
Version: 1
 -201- 1446-18

3.7.2 Accuracy -90 degree

Standard and date

Standard -
Reference IEC 60255-151
Test date 29 January 2018

Characteristic test data

Sample IED 3A
Set UBase 110 V
Set IBase 1A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode 3I0Cosfi
DirMode Forward
Angle RCADir -90 °
Angle RCAComp 0°
Angle ROADir 65 °
DirMode1 Forward
TimeChar IEC Def Time
tDef 0s
Fault L2-N
UL2-N 50 V
UL1-N = UL3-N 63,51 V
IL1 = IL3 0A

Accuracy -90 °
Angle 3Io to -3Uo I theor. Ioperate Deviation Ireset
° A Min. Avg. Max. Itheor. Ibase Min. Avg. Max.
% %
0 no trip - no trip - - - - - -
10 no trip - no trip - - - - - -
20 no trip - no trip - - - - - -
30 2,000 1,994 1,995 1,996 -0,2 -0,5 1,960 1,963 1,965
40 1,556 1,553 1,554 1,554 -0,1 -0,2 1,524 1,526 1,526
50 1,305 1,304 1,305 1,305 0,0 0,0 1,279 1,279 1,280
60 1,155 1,155 1,155 1,155 0,0 0,0 1,131 1,131 1,131
70 1,064 1,065 1,065 1,065 0,1 0,1 1,042 1,042 1,042
80 1,015 1,016 1,017 1,017 0,2 0,2 0,994 0,944 0,995
90 1,000 1,001 1,001 1,001 0,1 0,1 0,979 0,979 0,979
100 1,015 1,016 1,017 1,017 0,2 0,2 0,994 0,994 0,994
110 1,064 1,065 1,065 1,065 0,1 0,1 1,042 1,042 1,042
120 1,155 1,155 1,156 1,156 0,1 0,1 1,131 1,131 1,132
130 1,305 1,303 1,305 1,306 0,0 0,0 1,278 1,279 1,279
140 1,556 1,552 1,554 1,556 -0,1 -0,2 1,524 1,525 1,526
150 2,000 1,994 1,996 1,998 -0,2 -0,4 1,962 1,964 1,967
160 no trip - no trip - - - - - -
170 no trip - no trip - - - - - -
Version: 1
 -202- 1446-18

Angle 3Io to -3Uo I theor. Ioperate Deviation Ireset

° A Min. Avg. Max. Itheor. Ibase Min. Avg. Max.
% %
180 no trip - no trip - - - - - -
- - - - - - - - - -
-10 no trip - no trip - - - - - -
-90 no trip - no trip - - - - - -
-170 no trip - no trip - - - - - -

Manufacturer specification:
Operate level for 3I0cosfi dirctional residual overcurrent:
- 1% of Ir at I ≤ Ir.
- 1% of I at I ≥ Ir.

Result
The object passed the test.
Version: 1
 -203- 1446-18

3.7.3 Directional definite time 1,0IB, 0 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode 3I0Cosfi
DirMode Forward
Angle RCADir 0°
Angle RCAComp 0°
Angle ROADir 85 °
Curve family IEC DT
Range Gs 0,0025 x IBase to 2 x IBase
Gs 1 x IBase
tDef 0s
tReset 0s
Fault L1-N
UL1-N 50 V
UL2-N = UL3-N 63,51 V
IL2 = IL3 1A
Angle 3I0 to -3U0 0˚

Start
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0 0,167 0,170 0,175 0,025 0,028 0,031
2 3,0 0 0,136 0,142 0,148 0,028 0,034 0,046
5 6,0 0 0,111 0,118 0,124 0,028 0,034 0,040
10 11,0 0 0,109 0,114 0,121 0,030 0,043 0,062
20 21,0 0 0,107 0,113 0,120 0,030 0,042 0,066

Trip
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0 0,167 0,171 0,175 0,025 0,028 0,031
2 3,0 0 0,136 0,142 0,148 0,028 0,034 0,046
5 6,0 0 0,111 0,118 0,124 0,028 0,034 0,040
10 11,0 0 0,109 0,114 0,121 0,030 0,043 0,062
20 21,0 0 0,107 0,113 0,120 0,030 0,042 0,066

Manufacturer specification:
Operate time for directional residual overcurrent at 0 to 2x Iset: min. 110 ms, max. 160 ms.
Reset time for directional residual overcurrent at 2x Iset to 0: min. 20 ms, max. 60 ms.
Version: 1
 -204- 1446-18

3.7.4 Directional definite time 1,0IB, 0,3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode 3I0Cosfi
DirMode Forward
Angle RCADir 0°
Angle RCAComp 0°
Angle ROADir 85 °
Curve family IEC DT
Range Gs 0,0025 x IBase to 2 x IBase
Gs 1 x IBase
tDef 0,3 s
tReset 0s
Fault L1-N
UL1-N 50 V
UL2-N = UL3-N 63,51 V
IL2 = IL3 1A
Angle 3I0 to -3U0 0˚

Start
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0,3 0,161 0,165 0,169 0,026 0,030 0,034
2 3,0 0,3 0,136 0,144 0,149 0,027 0,034 0,050
5 6,0 0,3 0,113 0,117 0,120 0,028 0,043 0,070
10 11,0 0,3 0,106 0,111 0,117 0,032 0,035 0,043
20 21,0 0,3 0,108 0,114 0,119 0,030 0,033 0,037

Trip
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 0,3 0,465 0,470 0,475 0,026 0,030 0,034
2 3,0 0,3 0,440 0,448 0,456 0,027 0,034 0,050
5 6,0 0,3 0,416 0,421 0,424 0,028 0,043 0,070
10 11,0 0,3 0,409 0,416 0,424 0,032 0,035 0,043
20 21,0 0,3 0,411 0,417 0,423 0,030 0,033 0,037

Manufacturer specification:
Independent time-delay for directional residual overcurrent at 0 to 2x Iset: ± 0,2% or ±170 ms,
whichever is greater.
Version: 1
 -205- 1446-18

3.7.5 Directional definite time 1,0IB, 3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode 3I0Cosfi
DirMode Forward
Angle RCADir 0°
Angle RCAComp 0°
Angle ROADir 85 °
Curve family IEC DT
Range Gs 0,0025 x IBase to 2 x IBase
Gs 1 x IBase
tDef 3s
tReset 0s
Fault L1-N
UL1-N 50 V
UL2-N = UL3-N 63,51 V
IL2 = IL3 1A
Angle 3I0 to -3U0 0˚

Start
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 3 0,167 0,172 0,177 0,029 0,030 0,032
2 3,0 3 0,138 0,143 0,151 0,033 0,036 0,043
5 6,0 3 0,117 0,122 0,125 0,025 0,038 0,051
10 11,0 3 0,110 0,114 0,121 0,029 0,034 0,046
20 21,0 3 0,104 0,110 0,116 0,029 0,031 0,035

Trip
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 2,2 3 3,168 3,174 3,179 0,029 0,030 0,032
2 3,0 3 3,138 3,145 3,160 0,033 0,036 0,043
5 6,0 3 3,120 3,129 3,134 0,025 0,038 0,051
10 11,0 3 3,111 3,118 3,121 0,029 0,034 0,046
20 21,0 3 3,104 3,111 3,116 0,029 0,031 0,035

Manufacturer specification:
Independent time-delay for directional residual overcurrent at 0 to 2x Iset: ± 0,2% or ±170 ms,
whichever is greater.
Version: 1
 -206- 1446-18

3.7.6 Non-directional definite time 0,1IB, 0 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode OplNNonDir
Curve family IEC DT
Range Gs 0,01 x IBase to 4 x IBase
Gs 0,1 x IBase
tlNNonDir 0s
tReset 0s
Fault L1-N
UL1-N 50 V
UL2-N = UL3-N 63,51 V
IL2 = IL3 1A
Angle 3I0 to -3U0 0˚

Start
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 0 0,083 0,086 0,088 0,028 0,033 0,036
2 1,20 0 0,055 0,058 0,061 0,055 0,059 0,062
5 1,50 0 0,030 0,034 0,039 0,080 0,082 0,085
10 2,00 0 0,022 0,026 0,030 0,087 0,090 0,094
20 3,00 0 0,018 0,022 0,025 0,092 0,095 0,098

Trip
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 0 0,083 0,086 0,089 0,028 0,033 0,036
2 1,20 0 0,055 0,059 0,062 0,055 0,059 0,062
5 1,50 0 0,030 0,034 0,040 0,080 0,082 0,085
10 2,00 0 0,022 0,026 0,031 0,087 0,090 0,094
20 3,00 0 0,018 0,022 0,026 0,092 0,095 0,098

Manufacturer specification:
Operate time for non-directional residual overcurrent at 0 to 2x Iset: min. 40 ms, max. 65 ms.
Reset time for non-directional residual overcurrent at 2x Iset to 0: min. 40 ms, max. 65 ms.
Version: 1
 -207- 1446-18

3.7.7 Non-directional definite time 0,1IB, 0,3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode OplNNonDir
Curve family IEC DT
Range Gs 0,01 x IBase to 4 x IBase
Gs 0,1 x IBase
tlNNonDir 0,3 s
tReset 0s
Fault L1-N
UL1-N 50 V
UL2-N = UL3-N 63,51 V
IL2 = IL3 1A
Angle 3I0 to -3U0 0˚

Start
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 0,3 0,082 0,085 0,089 0,030 0,033 0,036
2 1,20 0,3 0,056 0,059 0,063 0,054 0,057 0,063
5 1,50 0,3 0,031 0,035 0,037 0,078 0,081 0,085
10 2,00 0,3 0,022 0,026 0,029 0,087 0,091 0,937
20 3,00 0,3 0,019 0,022 0,025 0,090 0,093 0,097

Trip
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 0,3 0,387 0,390 0,393 0,030 0,033 0,036
2 1,20 0,3 0,360 0,363 0,366 0,054 0,057 0,059
5 1,50 0,3 0,335 0,338 0,341 0,078 0,081 0,085
10 2,00 0,3 0,328 0,332 0,336 0,087 0,091 0,937
20 3,00 0,3 0,321 0,325 0,329 0,090 0,093 0,097

Manufacturer specification:
Independent time-delay for non-directional residual overcurrent at 0 to 2x Iset: ± 0,2% or ±75 ms,
whichever is greater.
Version: 1
 -208- 1446-18

3.7.8 Non-directional definite time 0,1IB, 3 s

Characteristic test data

Sample IED 3A
Rated current (Irated) 1A
Rated frequency 50 Hz
OpMode OplNNonDir
Curve family IEC DT
Range Gs 0,01 x IBase to 4 x IBase
Gs 0,1 x IBase
tlNNonDir 3s
tReset 0s
Fault L1-N
UL1-N 50 V
UL2-N = UL3-N 63,51 V
IL2 = IL3 1A
Angle 3I0 to -3U0 0˚

Start
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 3 0,082 0,085 0,089 0,029 0,032 0,036
2 1,20 3 0,055 0,059 0,063 0,058 0,060 0,061
5 1,50 3 0,031 0,034 0,036 0,078 0,080 0,084
10 2,00 3 0,022 0,026 0,031 0,087 0,092 0,094
20 3,00 3 0,019 0,021 0,025 0,090 0,094 0,097

Trip
Applied values Measured values
Time delay Operate time Reset time
IL1 theoretical Min. Avg. Max. Min. Avg. Max.
xGs A s s s s s s s
1,2 1,12 3 3,084 3,089 3,093 0,029 0,032 0,036
2 1,20 3 3,055 3,061 3,064 0,058 0,060 0,061
5 1,50 3 3,031 3,035 3,039 0,078 0,080 0,084
10 2,00 3 3,022 3,026 3,031 0,087 0,092 0,094
20 3,00 3 3,019 3,023 3,032 0,090 0,094 0,097

Manufacturer specification:
Independent time-delay for non-directional residual overcurrent at 0 to 2x Iset: ± 0,2% or ±75 ms,
whichever is greater.
Version: 1
 -209- 1446-18

4 VOLTAGE PROTECTION

4.1 Phase undervoltage protection, UV2PTUV

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 9 January 2018

Environmental conditions
Ambient temperature 22,9 °C

Characteristic test data: general settings UV2PTUV

Conn Type PhN RMS (All measurements except Reset time)
PhN DFT (Measurements of Reset time)
OpMode 1 out of 3
tReset1 0 s
HystAbs1 1 % of Ubase
IntBlkStVal1 1 % of Ubase

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy operate voltage 0,5% of Ur
Operate time, start, at 2x Uset to 0 Min. = 15 ms Max. = 30 ms
Reset time, start, at 0 to 2x Uset Min. = 15 ms Max. = 30 ms
Operate time, start, at 1,2x Uset to 0 Min. = 5 ms Max. = 25 ms
Reset time, start at 0 to 1,2x Uset Min. = 15 ms Max. = 35 ms
Accuracy Definite time delay 0,2% or 40 ms, whichever is greater
Accuracy Inverde time characteristics 5% or 45 ms, whichever is greater

Result
The object passed the test.
Version: 1
 -210- 1446-18

4.1.1 Intrinsic accuracy

Characteristic test data

Serial number IED 3A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Set hysteresis 1 % of Ubase
Initial start value ≥ 2 x of specified accuracy
Ramping step 0,01 V
Step time 0,1 s
Repetitions 5

Intrinsic accuracy (Input UL1)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range V V V V % of Ur V V V ratio
2,0 1,27 1,27 1,28 1,28 0,01 1,89 1,89 1,90 0,97
3,0 1,91 1,91 1,92 1,93 0,01 2,52 2,53 2,54 0,96
5,0 3,18 3,17 3,18 3,19 0,00 3,80 3,80 3,81 0,98
10,0 6,35 6,35 6,36 6,37 0,01 6,98 6,98 6,99 0,98
30,0 19,05 19,04 19,05 19,05 0,00 19,67 19,67 19,67 0,98
60,0 38,11 38,08 38,08 38,09 -0,02 38,69 38,70 38,71 0,98
100,0 63,51 63,46 63,46 63,47 -0,04 64,07 64,07 64,08 0,96

Intrinsic accuracy (Input UL2)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range V V V V % of Ur V V V ratio
2,0 1,27 1,27 1,28 1,28 0,01 1,90 1,90 1,91 0,99
3,0 1,91 1,90 1,91 1,92 0,00 2,53 2,53 2,54 0,98
5,0 3,18 3,17 3,17 3,18 0,00 3,80 3,81 3,81 1,00
10,0 6,35 6,34 6,36 6,36 0,00 6,97 6,98 6,99 0,99
30,0 19,05 19,04 19,04 19,05 -0,01 19,67 19,67 19,68 0,99
60,0 38,11 38,07 38,08 38,08 -0,02 38,70 38,70 38,71 0,98
100,0 63,51 63,45 63,46 63,46 -0,04 64,08 64,08 64,09 0,98

Intrinsic accuracy (Input UL3)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Reset
% of set range V V V V % of Ur V V V ratio
2,0 1,27 1,27 1,27 1,28 0,00 1,90 1,90 1,91 0,99
3,0 1,91 1,91 1,91 1,92 0,01 2,53 2,53 2,54 0,98
5,0 3,18 3,18 3,19 3,19 0,01 3,80 3,80 3,81 0,97
10,0 6,35 6,35 6,35 6,35 0,00 6,97 6,98 6,99 0,99
30,0 19,05 19,05 19,05 19,05 0,00 19,67 19,68 19,68 0,99
60,0 38,11 38,08 38,08 38,08 -0,02 38,70 38,71 38,71 0,99
100,0 63,51 63,45 63,45 63,46 -0,05 64,07 64,08 64,09 0,99
Version: 1
 -211- 1446-18

4.1.2 Definite time 0,1UB, 0 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,1 x UBase
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,024 0,027 0,030 0,028 0,031 0,034
0,4 0 0,022 0,024 0,027 0,025 0,029 0,032
0,2 0 0,021 0,025 0,030 0,019 0,023 0,028
0 0 0,022 0,024 0,027 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,024 0,027 0,030 0,029 0,031 0,034
0,4 0 0,022 0,025 0,027 0,025 0,029 0,032
0,2 0 0,021 0,025 0,030 0,019 0,023 0,028
0 0 0,022 0,025 0,027 - - -
Version: 1
 -212- 1446-18

4.1.3 Definite time 0,1UB, 0,1 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,1 x UBase
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,1 0,027 0,027 0,028 0,030 0,031 0,031
0,4 0,1 0,023 0,023 0,024 0,026 0,027 0,027
0,2 0,1 0,024 0,025 0,025 0,025 0,025 0,025
0 0,1 0,021 0,023 0,025 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,1 0,132 0,132 0,133 0,030 0,031 0,031
0,4 0,1 0,128 0,129 0,129 0,026 0,027 0,027
0,2 0,1 0,126 0,127 0,127 0,025 0,025 0,025
0 0,1 0,126 0,128 0,131 - - -
Version: 1
 -213- 1446-18

4.1.4 Definite time 0,1UB, 60 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,1 x UBase
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 60 0,025 0,027 0,029 0,026 0,029 0,033
0,4 60 0,022 0,025 0,029 0,026 0,029 0,034
0,2 60 0,021 0,025 0,028 0,022 0,024 0,026
0 60 0,023 0,025 0,027 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 60 60,028 60,031 60,035 0,026 0,029 0,033
0,4 60 60,031 60,034 60,038 0,026 0,029 0,034
0,2 60 60,027 60,030 60,034 0,022 0,024 0,026
0 60 60,023 60,03 60,034 - - -
Version: 1
 -214- 1446-18

4.1.5 Definite time 0,3UB, 0 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,3 x UBase
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,024 0,027 0,029 0,027 0,031 0,034
0,4 0 0,022 0,025 0,028 0,026 0,029 0,033
0,2 0 0,021 0,025 0,030 0,026 0,029 0,033
0 0 0,022 0,024 0,026 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,025 0,027 0,029 0,027 0,031 0,034
0,4 0 0,022 0,025 0,028 0,026 0,029 0,033
0,2 0 0,021 0,026 0,030 0,026 0,029 0,033
0 0 0,023 0,024 0,027 - - -
Version: 1
 -215- 1446-18

4.1.6 Definite time 0,3UB, 0,1 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,3 x UBase
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,1 0,023 0,023 0,024 0,026 0,026 0,027
0,4 0,1 0,023 0,024 0,024 0,032 0,033 0,033
0,2 0,1 0,021 0,022 0,023 0,033 0,033 0,034
0 0,1 0,024 0,026 0,028 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,1 0,128 0,128 0,129 0,026 0,026 0,027
0,4 0,1 0,128 0,129 0,129 0,032 0,033 0,033
0,2 0,1 0,126 0,126 0,127 0,033 0,033 0,034
0 0,1 0,126 0,128 0,130 - - -
Version: 1
 -216- 1446-18

4.1.7 Definite time 0,3UB, 60 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,3 x UBase
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 60 0,024 0,027 0,030 0,028 0,030 0,032
0,4 60 0,022 0,026 0,029 0,026 0,030 0,035
0,2 60 0,022 0,025 0,030 0,026 0,030 0,034
0 60 0,021 0,024 0,028 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 60 60,031 60,035 60,038 0,028 0,030 0,032
0,4 60 60,029 60,032 60,035 0,026 0,030 0,035
0,2 60 60,021 60,031 60,036 0,026 0,030 0,034
0 60 60,030 60,032 60,036 - - -
Version: 1
 -217- 1446-18

4.1.8 Definite time 1,0UB, 0 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 1 x UBase
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,023 0,027 0,030 0,026 0,029 0,033
0,4 0 0,022 0,025 0,029 0,028 0,030 0,033
0,2 0 0,023 0,025 0,028 0,027 0,031 0,034
0 0 0,023 0,027 0,029 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,023 0,027 0,031 0,026 0,029 0,033
0,4 0 0,022 0,025 0,029 0,028 0,030 0,033
0,2 0 0,023 0,025 0,028 0,027 0,031 0,034
0 0 0,023 0,027 0,029 - - -
Version: 1
 -218- 1446-18

4.1.9 Definite time 1,0UB, 0,1 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 1 x UBase
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,1 0,027 0,028 0,028 0,031 0,031 0,031
0,4 0,1 0,023 0,023 0,023 0,032 0,032 0,033
0,2 0,1 0,022 0,023 0,024 0,034 0,034 0,035
0 0,1 0,022 0,024 0,027 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,1 0,133 0,133 0,133 0,031 0,031 0,031
0,4 0,1 0,128 0,128 0,128 0,032 0,032 0,033
0,2 0,1 0,126 0,127 0,127 0,034 0,034 0,035
0 0,1 0,124 0,127 0,133 - - -
Version: 1
 -219- 1446-18

4.1.10 Definite time 1,0UB, 60 s

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 1 x UBase
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 60 0,025 0,028 0,030 0,027 0,031 0,034
0,4 60 0,022 0,027 0,030 0,028 0,030 0,035
0,2 60 0,023 0,025 0,027 0,027 0,030 0,034
0 60 0,020 0,024 0,026 - - -

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 60 60,028 60,031 60,034 0,027 0,031 0,034
0,4 60 60,031 60,034 60,036 0,028 0,030 0,035
0,2 60 60,025 60,031 60,035 0,027 0,030 0,034
0 60 60,026 60,030 60,034 - - -
Version: 1
 -220- 1446-18

4.1.11 Reset time 0,1UB, 0 s

Characteristic test data

Sample IED 3 B
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 0,5 % of UBase 0,55 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,1 x UBase
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,023 0,028 0,032 0,023 0,028 0,032
1,6 0 0,023 0,025 0,028 0,023 0,025 0,028
2 0 0,018 0,023 0,028 0,018 0,023 0,028
Version: 1
 -221- 1446-18

4.1.12 Reset time 0,3UB, 0 s

Characteristic test data

Sample IED 3 B
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 0,5 % of UBase 0,55 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0,3 x UBase
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,029 0,031 0,025 0,029 0,031
1,6 0 0,023 0,025 0,029 0,023 0,025 0,029
2 0 0,020 0,020 0,021 0,020 0,020 0,021
Version: 1
 -222- 1446-18

4.1.13 Reset time 1,0UB, 0 s

Characteristic test data

Sample IED 3 B
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family DT
Set hysteresis 0,5 % of UBase 0,55 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 0 x UBase
Fault L1-N

Set values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,024 0,027 0,030 0,024 0,027 0,030
1,6 0 0,023 0,025 0,026 0,023 0,025 0,026
2 0 0,021 0,023 0,025 0,021 0,023 0,025
Version: 1
 -223- 1446-18

4.1.14 Inverse time 1,0UB, 0,05 (curve B)

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family Inverse curve B
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 1 x UBase
Range k1 0,05 to 1,1
Set k1 0,05
Fault L1-N

Applied values Measured values

Time delay Start operate time Trip operate time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0,744 0,023 0,025 0,028 0,782 0,785 0,790
0,6 0,214 0,016 0,020 0,024 0,234 0,239 0,243
0,4 0,124 0,015 0,017 0,019 0,144 0,146 0,148
0,2 0,093 0,018 0,021 0,023 0,114 0,116 0,119
0,0 0,079 0,017 0,019 0,021 0,101 0,103 0,106
Version: 1
 -224- 1446-18

4.1.15 Inverse time 1,0UB, 0,5 (curve B)

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family Inverse curve B
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 1 x UBase
Range k1 0,05 to 1,1
Set k1 0,5
Fault L1-N

Set values Measured values

Time delay Start operate time Trip operate time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 6,950 0,028 0,028 0,029 7,140 7,142 7,150
0,6 1,641 0,015 0,017 0,020 1,675 1,678 1,681
0,4 0,741 0,015 0,017 0,019 0,768 0,770 0,772
0,2 0,436 0,015 0,019 0,022 0,458 0,462 0,465
0,0 0,297 0,015 0,018 0,023 0,321 0,325 0,327
Version: 1
 -225- 1446-18

4.1.16 Inverse time 1,0UB, 1,0 (curve B)

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Rated frequency 50 Hz
Curve family Inverse curve B
Set hysteresis 1 % of UBase 1,1 V
Range Gs 0,01 x UBase to 1 x UBase
Gs 1 x UBase
Range k1 0,05 to 1,1
Set k1 1
Fault L1-N

Applied values Measured values

Time delay Start operate time Trip operate time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 13,844 0,023 0,025 0,027 14,196 14,203 14,208
0,6 3,228 0,017 0,020 0,024 3,278 3,281 3,283
0,4 1,428 0,015 0,017 0,020 1,455 1,458 1,460
0,2 0,817 0,016 0,019 0,022 0,841 0,844 0,846
0,0 0,539 0,014 0,017 0,020 0,563 0,566 0,568
Version: 1
 -226- 1446-18

4.1.17 Overshoot time

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 11 January 2018

Characteristic test data

Sample IED 3 A
Characterist1 Definite Time
OpMode1 1 out of 3
U1< 100 % UBase
t1 0s
Voltage 1,2xGs 76,21 V
Voltage 0,8xGs 50,81 V
Fault L1-N

Test results

Measured maximum operating time, 5 shots:

26,5 ms, 28,9 ms, 23,7 ms, 22,8 ms and 24,9 ms.

Fault duration Result

ms
29 5 trips out of 5 shots
24 5 trips out of 5 shots
19 5 trips out of 5 shots
14 5 trips out of 5 shots
9 No trip out of 5 shots

Overshoot time: 29 - 9 = 20 ms.

Requirements
No manufacturer specifications are given for overshoot time.

Result
The results are for information only.
Version: 1
 -227- 1446-18

4.1.18 Response to time-varying value of the characteristic quantity

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 22 January 2018

Environmental conditions
Ambient temperature 20,5 °C Relative humidity 40,1 %

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V
Set UBase 110 V
Rated frequency 50 Hz
Curve family Curve B
Gs 100 % UBase
k1 1,0
Test:
G1 0,9 xGs
G2 0,6 xGs
Modulation period 200 ms
Calculated T0 6,154 s
UL1 Variable V
UL2=UL3 63,51 V

Measured operate times:

Test Operate time Deviation from calculated T0

s %
1 6,365 3,4
2 6,339 3,0
3 6,349 3,2
4 6,221 1,1
5 6,212 0,9

Requirements
According to standard IEC 60255-127, the measured operating time shall not differ from the
calculated T0 by more than 15%.

Result
The object passed the test.
Version: 1
 -228- 1446-18

4.2 Phase overvoltage protection, OV2PTOV

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 9, 11, 15 and 16 January 2018

Characteristic test data: general settings OV2PTOV

Conn Type PhN RMS
OpMode 1 out of 3
tReset1 0 s
HystAbs1 1 % of UBase

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy operate voltage ±0,5% of Ur at U ≤ Ur
±0,5% of U at U > Ur
Operate time, start at 0 to 2 x Uset Min. = 15 ms
Max. 30 ms
Reset time, start at 2 x Uset to 0 Min. = 15 ms
Max. 30 ms
Operate time, start at 0 to 1.2 x Uset Min. = 20 ms
Max. 35 ms
Reset time, start at 1.2 x Uset to 0 Min. = 5 ms
Max. 25 ms
Accuracy Definite time delay 0,2% or 45 ms, whichever is greater
Accuracy Inverse time delay 5% or 45 ms , whichever is greater

Result
The object passed the test.
Version: 1
 -229- 1446-18

4.2.1 Intrinsic accuracy

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Tdelay 0s

Intrinsic accuracy (Input UL1)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Hysteresis
UPh-N % of
% of UBase V V V V % of Ur V V V UBase/√3
1,0 0,64 0,61 0,62 0,63 -0,01 0,32 0,32 0,33 0,47
2,0 1,27 1,26 1,27 1,28 0,00 0,65 0,66 0,67 0,96
3,0 1,91 1,88 1,89 1,90 -0,01 1,27 1,28 1,28 0,96
5,0 3,18 3,17 3,17 3,18 0,00 2,54 2,56 2,57 0,97
10,0 6,35 6,33 6,34 6,35 -0,01 5,71 5,72 5,72 0,98
30,0 19,05 19,03 19,04 19,04 -0,01 18,41 18,42 18,42 0,98
60,0 38,11 38,07 38,08 38,08 -0,02 37,45 37,45 37,45 0,99
100,0 63,51 63,45 63,46 63,47 -0,04 62,83 62,83 62,84 0,99
150,0 95,26 95,18 95,18 95,19 -0,08 94,55 94,56 94,56 0,98
200,0 127,02 126,9 126,9 126,9 -0,11 126,2 126,2 126,2 1,10

Intrinsic accuracy (Input UL2)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Hysteresis
UPh-N % of
% of UBase V V V V % of Ur V V V UBase/√3
1,0 0,64 0,63 0,63 0,64 0,00 0,32 0,33 0,33 0,48
2,0 1,27 1,26 1,27 1,27 0,00 0,64 0,65 0,65 0,98
3,0 1,91 1,89 1,90 1,91 0,00 1,27 1,27 1,28 0,99
5,0 3,18 3,16 3,17 3,17 -0,01 2,54 2,55 2,56 0,97
10,0 6,35 6,33 6,34 6,35 -0,01 5,71 5,71 5,72 0,99
30,0 19,05 19,03 19,04 19,04 -0,01 18,41 18,41 18,41 0,99
60,0 38,11 38,06 38,07 38,08 -0,03 37,44 37,45 37,45 0,98
100,0 63,51 63,45 63,46 63,46 -0,04 62,81 62,82 62,83 1,01
150,0 95,26 95,17 95,18 95,18 -0,08 94,54 94,55 94,55 0,99
200,0 127,02 126,9 126,9 126,9 -0,11 126,3 126,3 126,3 0,94
Version: 1
 -230- 1446-18

Intrinsic accuracy (Input UL3)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Hysteresis
UPh-N % of
% of UBase V V V V % of Ur V V V UBase/√3
1,0 0,64 0,62 0,63 0,64 -0,01 0,32 0,33 0,33 0,48
2,0 1,27 1,27 1,27 1,27 0,00 0,64 0,64 0,65 0,99
3,0 1,91 1,90 1,91 1,91 0,00 1,27 1,28 1,28 0,99
5,0 3,18 3,15 3,17 3,18 -0,01 2,55 2,55 2,56 0,97
10,0 6,35 6,34 6,35 6,35 0,00 5,72 5,72 5,73 0,98
30,0 19,05 19,03 19,04 19,04 -0,01 18,41 18,42 18,42 0,98
60,0 38,11 38,06 38,07 38,07 -0,03 37,44 37,45 37,46 0,98
100,0 63,51 63,45 63,45 63,46 -0,05 62,82 62,82 62,83 0,99
150,0 95,26 95,16 95,16 95,17 -0,09 94,53 94,54 94,55 0,98
200,0 127,02 126,8 126,8 126,8 -0,20 126,2 126,2 126,2 0,94
Version: 1
 -231- 1446-18

4.2.2 Definite time 0,1UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,028 0,031 0,014 0,018 0,021
1,6 0 0,017 0,019 0,021 0,026 0,027 0,029
2 0 0,014 0,017 0,021 0,025 0,027 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,029 0,032 0,014 0,018 0,021
1,6 0 0,017 0,019 0,021 0,026 0,027 0,029
2 0 0,014 0,017 0,021 0,025 0,027 0,031
Version: 1
 -232- 1446-18

4.2.3 Definite time 0,1UB, 0,1 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,024 0,026 0,028 0,013 0,016 0,018
1,6 0,1 0,020 0,021 0,023 0,020 0,026 0,029
2 0,1 0,015 0,019 0,022 0,022 0,024 0,028

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,129 0,131 0,133 0,013 0,016 0,019
1,6 0,1 0,122 0,124 0,128 0,020 0,026 0,029
2 0,1 0,120 0,122 0,124 0,022 0,024 0,028
Version: 1
 -233- 1446-18

4.2.4 Definite time 0,1UB, 60 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 0,023 0,027 0,030 0,014 0,018 0,022
1,6 60 0,016 0,019 0,022 0,020 0,024 0,027
2 60 0,016 0,018 0,021 0,024 0,026 0,030

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 60,026 60,033 60,039 0,014 0,018 0,022
1,6 60 60,016 60,025 60,031 0,020 0,024 0,027
2 60 60,020 60,024 60,029 0,024 0,026 0,030
Version: 1
 -234- 1446-18

4.2.5 Definite time 0,5UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,028 0,031 0,014 0,016 0,019
1,6 0 0,014 0,018 0,023 0,022 0,026 0,028
2 0 0,014 0,016 0,020 0,023 0,026 0,027

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,028 0,031 0,014 0,016 0,019
1,6 0 0,015 0,018 0,023 0,022 0,026 0,028
2 0 0,014 0,016 0,020 0,024 0,026 0,027
Version: 1
 -235- 1446-18

4.2.6 Definite time 0,5UB, 0,1 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,027 0,028 0,030 0,014 0,019 0,021
1,6 0,1 0,014 0,020 0,024 0,020 0,024 0,026
2 0,1 0,016 0,018 0,019 0,022 0,024 0,025

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,128 0,131 0,135 0,014 0,018 0,021
1,6 0,1 0,119 0,124 0,128 0,020 0,024 0,026
2 0,1 0,121 0,123 0,125 0,022 0,024 0,025
Version: 1
 -236- 1446-18

4.2.7 Definite time 0,5UB, 60 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 0,024 0,027 0,030 0,014 0,018 0,019
1,6 60 0,017 0,019 0,021 0,021 0,024 0,026
2 60 0,014 0,017 0,020 0,023 0,026 0,028

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 60,024 60,032 60,039 0,014 0,018 0,019
1,6 60 60,017 60,025 60,030 0,021 0,024 0,026
2 60 60,014 60,023 60,028 0,023 0,026 0,028
Version: 1
 -237- 1446-18

4.2.8 Definite time 1,0UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,028 0,031 0,014 0,016 0,020
1,6 0 0,015 0,019 0,023 0,027 0,027 0,027
2 0 0,014 0,018 0,022 0,025 0,026 0,027

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,028 0,031 0,014 0,016 0,020
1,6 0 0,015 0,019 0,023 0,027 0,027 0,027
2 0 0,014 0,018 0,022 0,025 0,026 0,027
Version: 1
 -238- 1446-18

4.2.9 Definite time 1,0UB, 0,1 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,026 0,028 0,030 0,015 0,017 0,021
1,6 0,1 0,016 0,019 0,022 0,020 0,022 0,026
2 0,1 0,015 0,016 0,018 0,024 0,027 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,129 0,133 0,135 0,015 0,017 0,021
1,6 0,1 0,118 0,123 0,128 0,020 0,022 0,026
2 0,1 0,120 0,121 0,124 0,024 0,027 0,031
Version: 1
 -239- 1446-18

4.2.10 Definite time 1,0UB, 60 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 0,025 0,028 0,031 0,013 0,015 0,018
1,6 60 0,015 0,019 0,022 0,022 0,025 0,028
2 60 0,015 0,018 0,022 0,023 0,027 0,031

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 60,025 60,034 60,038 0,013 0,015 0,018
1,6 60 60,019 60,025 60,030 0,022 0,025 0,028
2 60 60,022 60,025 60,028 0,023 0,027 0,031
Version: 1
 -240- 1446-18

4.2.11 Reset time 0,1UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Range tReset 0 s to 60 s
Set tReset 0s
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,024 0,028 0,031 0,024 0,028 0,031
0,4 0 0,025 0,028 0,029 0,024 0,028 0,029
0 0 0,023 0,025 0,026 0,023 0,025 0,026
Version: 1
 -241- 1446-18

4.2.12 Reset time 0,5UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Range tReset 0s
Set tReset 0 s to 60 s
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,026 0,028 0,031 0,026 0,028 0,031
0,4 0 0,024 0,026 0,030 0,024 0,026 0,029
0 0 0,021 0,025 0,027 0,021 0,025 0,027
Version: 1
 -242- 1446-18

4.2.13 Reset time 1,0UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Range tReset 0s
Set tReset 0 s to 60 s
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,025 0,028 0,031 0,025 0,028 0,031
0,4 0 0,025 0,027 0,029 0,025 0,027 0,029
0 0 0,022 0,026 0,029 0,022 0,026 0,029
Version: 1
 -243- 1446-18

4.2.14 Inverse time 1,0UB, 0,05 (curve C)

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family Inverse curve C
Range Gs 0,01 xUBase to 1 xUBase
Gs 1 xUBase
Range k1 0,05 to 1,1
Set k1 0,05
Fault L1-N

Applied values Measured values

Time delay Start operate time Trip operate time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,152 0,026 0,028 0,032 0,177 0,181 0,184
1,4 0,048 0,023 0,025 0,028 0,070 0,073 0,077
1,6 0,039 0,017 0,020 0,024 0,056 0,060 0,063
1,8 0,037 0,015 0,018 0,021 0,054 0,058 0,061
2,0 0,036 0,016 0,018 0,022 0,055 0,058 0,061
Version: 1
 -244- 1446-18

4.2.15 Inverse time 1,0UB, 0,5 (curve C)

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family Inverse curve C
Range Gs 0,01 xUBase to 1 xUBase
Gs 1 xUBase
Range k1 0,05 to 1,1
Set k1 0,5
Fault L1-N

Applied values Measured values

Time delay Start operate time Trip operate time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 1,204 0,025 0,027 0,032 1,167 1,171 1,175
1,4 0,164 0,020 0,024 0,028 0,188 0,192 0,196
1,6 0,072 0,016 0,019 0,022 0,090 0,094 0,098
1,8 0,050 0,016 0,018 0,020 0,071 0,074 0,077
2,0 0,043 0,014 0,017 0,02 0,061 0,065 0,068
Version: 1
 -245- 1446-18

4.2.16 Inverse time 1,0UB, 1.0 (curve C)

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Curve family Inverse curve C
Range Gs 0,01 xUBase to 1 xUBase
Gs 1 xUBase
Range k1 0,05 to 1,1
Set k1 1
Fault L1-N

Set values Measured values

Time delay Start operate time Trip operate time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 2,372 0,025 0,027 0,028 2,271 2,275 2,278
1,4 0,293 0,020 0,025 0,029 0,309 0,313 0,317
1,6 0,108 0,015 0,017 0,019 0,127 0,130 0,133
1,8 0,065 0,015 0,018 0,020 0,087 0,090 0,092
2,0 0,050 0,016 0,018 0,020 0,070 0,074 0,077
Version: 1
 -246- 1446-18

4.2.17 Response to time-varying value of the characteristic quantity

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 22 January 2018

Environmental conditions
Ambient temperature 19,5 °C Relative humidity 40,1 %

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Curve family Curve B
Gs 100 % UBase
k1 1,0
Test:
G1 1,2 xGs
G2 1,5 xGs
Modulation period 200 ms
Calculated T0 3,545 s
UL1 Variable V
UL2=UL3 0V

Measured operate times:

Test Operate time Deviation from calculated T0

s %
1 3,568 0,6
2 3,561 0,5
3 3,561 0,5
4 3,405 - 3,9
5 3,395 - 4,2

Requirements
According to standard IEC 60255-127, the measured operating time shall not differ from the
calculated T0 by more than 15%.

Result
The object passed the test.
Version: 1
 -247- 1446-18

4.3 Residual overvoltage protection, ROV2PTOV

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 17 and 18 January 2018

Environmental conditions
Ambient temperature 21,6 °C Relative humidity 28 %

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Accuracy Operate voltage, step 1 – step 2 0,5% of Ur at U ≤ Ur
0,5% of U at U ≥ Ur
Operate time, start at 0 to 2 x Uset Min. = 15 ms
Max. = 30 ms
Reset time, start at 2 x Uset to 0 Min. = 15 ms
Max. = 30 ms
Operate time, start at 0 to 1.2 x Uset Min. = 20 ms
Max. = 35 ms
Reset time, start at 1.2 x Uset to 0 Min. = 5 ms
Max. = 25 ms
Accuracy Definite time delay at 0 to 1,2x Uset 0,2% or 45 ms, whichever is greater

Result
The object passed the test.
Version: 1
 -248- 1446-18

4.3.1 Intrinsic accuracy

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set HystAbs 1 % of UBase 1,1 V
Set HystAbs 0,5 % of UBase 0,55V for settings 1% to 3% Ubase
Curve family DT
Range Gs 0,01x Ubase to 2x UBase
Gs See table xUBase
Tdelay 0s

Intrinsic accuracy (Input UL1)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Hysteresis
UPh-N % of
% of UBase V V V V % of Ur V V V UBase/√3
1,0 0,64 62,90 62,90 62,91 0,02 63,19 63,20 63,21 0,47
2,0 1,27 62,27 62,27 62,28 0,03 62,54 62,57 62,58 0,47
3,0 1,91 61,62 61,63 61,64 0,02 61,93 61,93 61,94 0,47
5,0 3,18 60,36 60,37 60,37 0,03 60,97 60,97 60,98 0,94
10,0 6,35 57,19 57,20 57,22 0,04 57,80 57,80 57,81 0,94
30,0 19,05 44,50 44,51 44,52 0,05 45,11 45,12 45,13 0,96
60,0 38,11 25,47 25,47 25,48 0,06 26,06 26,08 26,09 0,96
100,0 63,51 63,63 63,64 63,64 0,12 64,23 64,24 64,25 0,94
150,0 95,26 31,91 31,91 31,91 0,14 32,50 32,51 32,52 0,94
190,0 120,67 6,520 6,526 6,540 0,16 7,120 7,138 7,150 0,96

Intrinsic accuracy (Input UL2)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Hysteresis
UPh-N % of
% of UBase V V V V % of Ur V V V UBase/√3
1,0 0,64 62,87 62,88 62,89 0,01 63,16 63,17 63,18 0,46
2,0 1,27 62,24 62,25 62,26 0,01 62,52 62,53 62,54 0,44
3,0 1,91 61,60 61,61 61,62 0,01 61,89 61,90 61,91 0,46
5,0 3,18 60,33 60,35 60,38 0,02 60,95 60,95 60,96 0,94
10,0 6,35 57,17 57,18 57,18 0,02 57,77 57,78 57,78 0,94
30,0 19,05 44,48 44,49 44,50 0,03 45,08 45,09 45,10 0,94
60,0 38,11 25,44 25,45 25,46 0,04 26,06 26,06 26,07 0,96
100,0 63,51 63,58 63,59 63,60 0,07 64,18 64,19 64,21 0,94
150,0 95,26 31,86 31,87 31,88 0,11 32,47 32,48 32,49 0,96
190,0 120,67 6,480 6,486 6,490 0,12 7,090 7,098 7,100 0,96
Version: 1
 -249- 1446-18

Intrinsic accuracy (Input UL3)

Set values Measured values
Operate Reset
Min. Avg. Max. Deviation Min. Avg. Max. Hysteresis
UPh-N % of
% of UBase V V V V % of Ur V V V UBase/√3
1,0 0,64 62,87 62,88 62,89 0,01 63,16 63,17 63,18 0,46
2,0 1,27 62,24 62,25 62,25 0,01 62,52 62,53 62,55 0,44
3,0 1,91 61,60 61,61 61,62 0,01 61,89 61,90 61,91 0,46
5,0 3,18 60,34 60,35 60,35 0,02 60,94 60,95 60,96 0,94
10,0 6,35 57,17 57,18 57,19 0,02 57,77 57,78 57,79 0,94
30,0 19,05 44,49 44,49 44,50 0,03 45,09 45,09 45,10 0,94
60,0 38,11 25,45 25,47 25,48 0,06 26,05 26,06 26,07 0,93
100,0 63,51 63,59 63,60 63,61 0,08 64,19 64,20 64,21 0,94
150,0 95,26 31,87 31,88 31,89 0,11 32,46 32,48 32,49 0,94
190,0 120,67 6,500 6,502 6,510 0,14 7,100 7,106 7,110 0,95
Version: 1
 -250- 1446-18

4.3.2 Definite time 0,1UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Range tdelay 0 s to 6000 s
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,023 0,027 0,031 0,011 0,014 0,016
1,6 0 0,019 0,023 0,028 0,017 0,020 0,023
2 0 0,021 0,023 0,026 0,019 0,021 0,024

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,023 0,027 0,031 0,011 0,014 0,016
1,6 0 0,019 0,024 0,028 0,017 0,020 0,023
2 0 0,021 0,023 0,026 0,019 0,021 0,024
Version: 1
 -251- 1446-18

4.3.3 Definite time 0,1UB, 0,1 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Range tdelay 0 s to 6000 s
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,023 0,027 0,030 0,012 0,014 0,015
1,6 0,1 0,019 0,022 0,026 0,020 0,022 0,024
2 0,1 0,020 0,023 0,027 0,019 0,022 0,025

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,129 0,131 0,132 0,012 0,014 0,015
1,6 0,1 0,124 0,126 0,128 0,020 0,022 0,024
2 0,1 0,126 0,127 0,130 0,019 0,022 0,025
Version: 1
 -252- 1446-18

4.3.4 Definite time 0,1UB, 60 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Range tdelay 0 s to 6000 s
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 0,022 0,026 0,029 0,011 0,013 0,015
1,6 60 0,021 0,025 0,027 0,016 0,019 0,022
2 60 0,021 0,024 0,026 0,019 0,020 0,025

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 60,027 60,031 60,035 0,011 0,013 0,015
1,6 60 60,023 60,031 60,035 0,016 0,019 0,022
2 60 60,022 60,030 60,034 0,019 0,020 0,025
Version: 1
 -253- 1446-18

4.3.5 Definite time 0,5UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Range tdelay 0 s to 6000 s
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,022 0,026 0,028 0,011 0,013 0,016
1,6 0 0,023 0,025 0,027 0,015 0,018 0,021
2 0 0,021 0,023 0,026 0,019 0,021 0,024

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,023 0,026 0,028 0,011 0,013 0,016
1,6 0 0,023 0,025 0,027 0,015 0,018 0,021
2 0 0,021 0,023 0,026 0,019 0,021 0,024
Version: 1
 -254- 1446-18

4.3.6 Definite time 0,5UB, 0,1 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Range tdelay 0 s to 6000 s
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,025 0,027 0,028 0,010 0,014 0,017
1,6 0,1 0,020 0,023 0,026 0,015 0,017 0,021
2 0,1 0,020 0,021 0,023 0,016 0,021 0,026

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,130 0,132 0,133 0,010 0,014 0,016
1,6 0,1 0,125 0,127 0,129 0,015 0,017 0,021
2 0,1 0,122 0,125 0,128 0,016 0,021 0,026
Version: 1
 -255- 1446-18

4.3.7 Definite time 0,5UB, 60 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Range tdelay 0 s to 6000 s
Set t delay 60 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 0,023 0,025 0,029 0,011 0,012 0,013
1,6 60 0,020 0,024 0,027 0,015 0,018 0,020
2 60 0,019 0,022 0,024 0,018 0,021 0,025

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 60,023 60,031 60,035 0,010 0,012 0,013
1,6 60 60,024 60,031 60,036 0,015 0,018 0,020
2 60 60,021 60,026 60,030 0,018 0,021 0,025
Version: 1
 -256- 1446-18

4.3.8 Definite time 1,0UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Range tdelay 0 s to 6000 s
Set t delay 0s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,024 0,027 0,029 0,009 0,012 0,014
1,6 0 0,020 0,024 0,028 0,013 0,016 0,018
2 0 0,019 0,022 0,024 0,018 0,021 0,022

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0 0,025 0,027 0,029 0,009 0,012 0,014
1,6 0 0,020 0,024 0,028 0,013 0,016 0,018
2 0 0,019 0,022 0,024 0,018 0,021 0,022
Version: 1
 -257- 1446-18

4.3.9 Definite time 1,0UB, 0,1 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Range tdelay 0 s to 6000 s
Set t delay 0,1 s
Fault L2-N

Start
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,022 0,025 0,028 0,008 0,011 0,014
1,6 0,1 0,021 0,023 0,027 0,012 0,016 0,021
2 0,1 0,018 0,023 0,026 0,018 0,021 0,024

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 0,1 0,127 0,129 0,133 0,008 0,011 0,014
1,6 0,1 0,126 0,127 0,129 0,012 0,016 0,021
2 0,1 0,123 0,128 0,132 0,018 0,021 0,024
Version: 1
 -258- 1446-18

4.3.10 Definite time 1,0UB, 60 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Range tdelay 0 s to 6000 s
Set t delay 60 s
Fault L2-N

Start
Set values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 0,024 0,028 0,031 0,009 0,012 0,015
1,6 60 0,022 0,024 0,026 0,017 0,018 0,019
2 60 0,020 0,023 0,028 0,018 0,022 0,025

Trip
Applied values Measured values
Time delay Operate time Reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
1,2 60 60,025 60,034 60,038 0,013 0,015 0,018
1,6 60 60,019 60,025 60,030 0,022 0,025 0,028
2 60 60,022 60,025 60,028 0,023 0,027 0,031
Version: 1
 -259- 1446-18

4.3.11 Reset time 0,1UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,1 xUBase
Range tReset 0 s to 60 s
Set tReset 0s
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,025 0,029 0,031 0,025 0,029 0,031
0,4 0 0,023 0,027 0,030 0,023 0,027 0,030
0 0 0,020 0,022 0,025 0,020 0,022 0,025
Version: 1
 -260- 1446-18

4.3.12 Reset time 0,5UB, 0 s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 0,5 xUBase
Range tReset 0 s to 60 s
Set tReset 0s
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,026 0,029 0,031 0,026 0,029 0,031
0,4 0 0,026 0,027 0,030 0,026 0,027 0,030
0 0 0,018 0,023 0,026 0,018 0,023 0,026
Version: 1
 -261- 1446-18

4.3.13 Reset time 1,0UB, 0s

Characteristic test data

Sample IED 3A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Set hysteresis 1 % of UBase 1,1 V
Curve family DT
Range Gs 0,01 xUBase to 2 xUBase
Gs 1 xUBase
Range tReset 0 s to 60 s
Set tReset 0s
Fault L1-N

Applied values Measured values

Time delay Start reset time Trip reset time
theoretical Min Avg Max Min Avg Max
xGs s s s s s s s
0,8 0 0,024 0,028 0,031 0,024 0,028 0,031
0,4 0 0,022 0,023 0,024 0,022 0,023 0,024
0 0 0,020 0,023 0,027 0,020 0,023 0,027
Version: 1
 -262- 1446-18

4.3.14 Response to time-varying value of the characteristic quantity

Standard and date

Standard IEC 60255-1, subclause 6.5
Reference IEC 60255-127
Test date 18 January 2018

Environmental conditions
Ambient temperature 22,5 °C Relative humidity 31,4 %

Characteristic test data

Sample IED 3 A
Rated voltage (Urated) 110 V ph-ph
Set UBase 110 V
Rated frequency 50 Hz
Curve family Curve A
Gs 50 % UBase
k1 1,0
Test:
G1 1,2 xGs
G2 1,5 xGs
Modulation period 200 ms
Calculated T0 2,857 s
UL1 Variable V
UL2=UL3 63,51 V

Measured operate times:

Test Operate time Deviation from calculated T0

s %
1 2,911 1,9
2 2,911 1,9
3 2,905 1,7
4 2,855 -0,07
5 2,854 -0,07

Requirements
According to standard IEC 60255-127, the measured operating time shall not differ from the
calculated T0 by more than 15%.

Result
The object passed the test.
Version: 1
 -263- 1446-18

5 THERMAL OVERLOAD PROTECTION

5.1 Thermal overload protection, TRPTTR

Standard and date

Standard IEC 60255-1, Subclause 6.5
Reference IEC 60255-149
Test dates 6-12 February 2018

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Parameter Accuracy
Base current ±1% of Ir
Operate current ±1% of Ir
Operate time ±5% or ±200 ms, whichever is greater
Alarm level 1 and 2 ±2% of heat content trip
Reset level temperature ±2% of heat content trip
Harmonic frequency dependence (20% content) ±2%
Frequency dependence, operate value ±1% / Hz

Result
The object passed the test.
Version: 1
 -264- 1446-18

5.1.1 Accuracy related to the operating current value

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range Iref 10 % IBase to 1000% IBase
Range IBase 30 % IBase to 250% IBase
Range tau 0,1 min to 500 min.
Set tau 0,1 min
Range Itrip 50 % of IBase to 250%IBase
Accuracy operate current 1 % of Irated
Current IL2
Duration of current 2 min

Set IBase Set Itrip Theoretical Supplied Start Trip Heat

Operate current content
current
% IBase % IBase A A %
30 50 0,75 0,7 no no 86,6
30 100 1,5 1,45 no no 93,3
30 250 3,75 3,7 no no 97,4
100 50 2,5 2,45 no no 96,1
100 100 5 4,95 no no 98,1
100 250 12,5 12,45 no no 99,3
200 50 5 4,95 no no 98,2
200 100 10 9,95 no no 99,1
200 200 20 19,95 no no 99,7
Version: 1
 -265- 1446-18

5.1.2 Operating time cold curve

5.1.2.1 Cold curve min. I min. tau

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 30 % IBase to 250% IBase
Range tau 0,1 min
Set tau 0,1 min
Range Itrip 50 % of IBase to 250%IBase
Set Itrip 50 % IBase
Current IL2

Current IL2 Measured Deviation

T. Theoretical min. avg. max. avg. Max.
xGs A s s s s % s % s
1,2 0,9 7,11 7,232 7,251 7,295 1,9 0,14 2,5 0,18
1,6 1,2 2,97 3,017 3,055 3,094 2,8 0,08 4,1 0,12
2 1,5 1,73 1,727 1,756 1,806 1,7 0,03 4,6 0,08
5 3,75 0,24 0,223 0,272 0,308 11,2 0,03 25,7 0,06
10 7,5 0,06 0,048 0,078 0,101 29,3 0,02 67,5 0,04
Version: 1
 -266- 1446-18

5.1.2.2 Cold curve min. I average tau

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 30 % IBase
Range tau 0,1 min to 500 min.
Set tau 1 min
Range Itrip 50 % of IBase to 250%IBase
Set Itrip 50 % IBase
Current IL2

Current IL2 Measured Deviation

T. Theoretical min. avg. max. avg. Max.
xGs A s s s s % s % s
1,2 0,9 71,14 72,00 72,06 72,11 1,3 0,92 1,4 0,97
1,6 1,2 29,72 29,85 29,87 29,90 0,5 0,15 0,6 0,18
2 1,5 17,26 17,33 17,37 17,41 0,6 0,11 0,9 0,15
5 3,75 2,45 2,431 2,473 2,527 1,0 0,02 3,2 0,08
10 7,5 0,60 0,618 0,672 0,706 11,4 0,07 17,1 0,10
Version: 1
 -267- 1446-18

5.1.2.3 Cold curve min. I max. tau

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 30 % IBase
Range tau 0,1 min to 500 min.
Set tau 10 min
Range Itrip 50 % IBase to 250%IBase
Set Itrip 50 % IBase
Current IL2

Current IL2 Measured Deviation

T. Theoretical min. avg. max. avg. Max.
xGs A s s s s % s % s
1,2 0,9 711,37 719,2 720,1 720,6 1,2 8,71 1,3 9,23
1,6 1,2 297,19 298,6 298,7 298,8 0,5 1,49 0,5 1,61
2 1,5 172,61 173,2 173,3 173,4 0,4 0,69 0,5 0,79
5 3,75 24,49 24,52 24,55 24,58 0,2 0,05 0,4 0,09
10 7,5 6,03 6,037 6,054 6,085 0,4 0,02 0,9 0,05
Version: 1
 -268- 1446-18

5.1.2.4 Cold curve default I min. tau

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 100 % IBase
Range tau 0,1 min to 500 min.
Set tau 0,1 min
Range Itrip 50 % IBase to 250% IBase
Set Itrip 110 % IBase
Current IL2

Current IL2 Measured Deviation

T. Theoretical min. avg. max. avg. Max.
xGs A s s s s % s % s
1,2 6,6 7,11 7,122 7,162 7,210 0,7 0,05 1,4 0,10
1,6 8,8 2,97 2,934 2,964 3,012 -0,3 -0,01 1,3 0,04
2 11,0 1,73 1,717 1,750 1,791 1,4 0,02 3,8 0,06
5 27,5 0,24 0,233 0,257 0,308 4,8 0,01 25,7 0,06
10 55,0 0,06 0,033 0,054 0,097 -9,8 -0,01 60,9 0,04
Version: 1
 -269- 1446-18

5.1.2.5 Cold curve default I average tau

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 100 % IBase
Range tau 0,1 min to 500 min.
Set tau 1 min
Range Itrip 50 % IBase to 250%IBase
Set Itrip 110 % IBase
Current IL2

Current IL2 T Theoretical Measured Deviation

xGs A s s % s
1,2 6,6 71,14 71,14 0,0 0,00
1,6 8,8 29,72 29,81 0,3 0,09
2 11,0 17,26 17,33 0,4 0,07
5 27,5 2,45 2,373 -3,1 -0,08
10 55,0 0,60 0,685 13,6 0,08
Version: 1
 -270- 1446-18

5.1.2.6 Cold curve default I max. tau

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 100 % IBase
Range tau 0,1 min to 500 min.
Set tau 10 min
Range Itrip 50 % of IBase to 250%IBase
Set Itrip 110 % IBase
Current IL2

Current IL2 T. Theoretical Measured Deviation

xGs A s s % s
1,2 6,6 711,37 711,2 0,0 -0,17
1,6 8,8 297,19 297,0 -0,1 -0,19
2 11,0 172,61 172,5 -0,1 -0,11
5 27,5 24,49 24,42 -0,3 -0,07
10 55,0 6,03 6,13 1,6 0,10
Version: 1
 -271- 1446-18

5.1.3 Operating time hot curve

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 50 % IBase
Range tau 0,1 min to 500 min.
Set tau 1 min
Range Itrip 50 % IBase to 250% IBase
Set Itrip 110 % IBase
Current IL2

Preload End current T. Theoretical Measured Deviation

% A xGs A s s % s
10 0,870 1,2 3,30 66,82 67,04 0,3 0,22
1,6 4,40 27,33 27,37 0,2 0,04
2 5,50 15,74 15,74 0,0 0,00
5 13,75 2,21 2,28 3,0 0,07
10 27,50 0,54 0,584 7,6 0,04
30 1,506 1,2 3,30 57,12 57,36 0,4 0,24
1,6 4,40 22,24 22,23 0,0 -0,01
2 5,50 12,58 12,55 -0,3 -0,03
5 13,75 1,72 1,787 3,6 0,06
10 27,50 0,42 0,466 10,2 0,04
50 1,945 1,2 3,30 45,55 45,80 0,6 0,25
1,6 4,40 16,68 16,82 0,8 0,14
2 5,50 9,25 9,320 0,8 0,07
5 13,75 1,24 1,317 6,5 0,08
10 27,50 0,30 0,321 6,2 0,02
70 2,301 1,2 3,30 31,19 31,50 1,0 0,31
1,6 4,40 10,55 10,62 0,6 0,07
2 5,50 5,72 5,745 0,5 0,03
5 13,75 0,75 0,756 1,4 0,01
10 27,50 0,18 0,228 25,6 0,05
90 2,609 1,2 3,30 12,29 12,48 1,6 0,19
1,6 4,40 3,73 3,772 1,2 0,04
2 5,50 1,97 1,953 -0,7 -0,01
5 13,75 0,25 0,233 -6,6 -0,02
10 27,50 0,06 0,076 25,5 0,02
Version: 1
 -272- 1446-18

5.1.4 Operating time cold curve 3rd harmonic

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 50 % IBase
Range tau 0,1 min to 500 min.
Set tau 0,1 min
Range Itrip 50 % of IBase to 250%IBase
Set Itrip 100 % IBase
Current IL2
Harmonic order 3
Magnitude 10 %
Number of tests 5

Harmonic = 3 (percentage of harmonic = 10%)

End test current value Calculated operate time Measured operate time
Min. Avg. Max.
xGs s s s s
1,2 6,98 6,950 6,984 7,010
1,6 2,93 2,943 2,976 3,012
2 1,71 1,753 1,789 1,811
5 0,24 0,228 0,268 0,320
10 0,06 0,040 0,066 0,102
Version: 1
 -273- 1446-18

5.1.5 Operating time cold curve 5th harmonic

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 50 % IBase
Range tau 0,1 min to 500 min.
Set tau 1 min
Range Itrip 50 % IBase to 250% IBase
Set Itrip 100 % IBase
Current IL2
Harmonic order 5

Harmonic = 5 (percentage of harmonic = 25%)

End test current value Calculated operate time Measured operate time
xGs s s
1,2 63,61 64,29
1,6 27,50 27,68
2 16,10 16,15
5 2,30 2,448
10 0,57 0,708
Version: 1
 -274- 1446-18

5.1.6 Operating time cold curve 7th harmonic

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 50 % IBase
Range tau 0,1 min to 500 min.
Set tau 1 min
Range Itrip 50 % IBase to 250% IBase
Set Itrip 100 % IBase
Current IL2
Harmonic order 7

Harmonic = 7 (percentage of harmonic = 15%)

End test current value Calculated operate time Measured operate time
xGs s s
1,2 68,21 68,83
1,6 28,88 29,04
2 16,82 16,97
5 2,39 2,497
10 0,59 0,673
Version: 1
 -275- 1446-18

5.2 Operating time during frequency deviation

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Range IBase 30 % IBase to 250% IBase
Set IBase 50 % IBase
Range tau 0,1 min to 500 min.
Set tau 0,1 min
Range Itrip 50 % IBase to 250%Base
Set Itrip 100 % IBase
Current IL2
Number of tests 5

Frequency = 47,5 Hz
End test current value Calculated operate time Measured operate time
Min. Avg. Max.
xGs s s s s
1,2 7,11 6,544 7,103 7,798
2 1,73 1,669 1,736 1,813
10 0,060 0,030 0,069 0,120

Frequency = 52,5 Hz
End test current value Calculated operate time Measured operate time
Min. Avg. Max.
xGs s s s s
1,2 7,11 6,902 7,190 7,554
2 1,73 1,670 1,759 1,837
10 0,060 0,045 0,083 0,103
Version: 1
 -276- 1446-18

5.3 Performance with specific cooling time constant

Characteristic test data

Sample IED 2 A
Irated 5A
IBase 5A
Rated frequency 50 Hz
Function 49
Range Irefe 10 % IBase to 1000% IBase
Range IBase 30 % IBase to 250% Ibase
Set IBase 100 % IBase
Range tau 0,1 min. to 500 min.
Set tau 1 10 min.
Range Itrip 50 % IBase to 250% IBase
Set Itrip 120 % IBase
Current IL2
Fault current 12 A 2x Itrip

Tfault Deviation
Set tau Tcooling Calculated Measured
2 min. s s s % s
0,1 15 160,2 160,0 -0,1 -0,2
1 15 42,7 42,6 -0,2 -0,1
1 40 90,2 90,1 -0,1 -0,1
10 40 12,8 12,8 0,3 0,0
10 120 35,2 35,2 0,0 0,0
10 240 62,6 62,5 -0,1 -0,1
Version: 1
 -277- 1446-18

5.4 Thermal overload protection, LPTTR

Standard and date

Standard IEC 60255-1, Subclause 6.5
Reference IEC 60255-149
Test dates 13, 14, 15, 27 and 28 February 2018

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Parameter Accuracy
Reference current ±1% of Ir
Reference temperature ±1 ˚C
Operate time ±5% or ±200 ms, whichever is greater
Alarm temperature ±2 ˚C
Operate temperature ±2 ˚C
Harmonic frequency dependence (20% content) ±2%
Frequency dependence, operate value ±2% / Hz

Result
The object passed the test.
Version: 1
 -278- 1446-18

5.4.1 Accuracy related to the operating current value

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref See table
Range tau 1 min to 1000 min.
Set tau 1 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 110 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC
Accuracy Itrip 1 % of Irated
Duration of current 10 min.

Set IRef Theoretical Supplied current Start Trip Displayed Temp

Operate current
% Ibase A A °C
10 0,5 0,45 no no 91,0
30 1,5 1,45 no no 103,3
50 2,5 2,45 no no 105,9
100 5 4,95 no no 107,8
200 10 9,95 no no 108,8
300 15 14,95 no no 109,2
Version: 1
 -279- 1446-18

5.4.2 Operating time cold curve

5.4.2.1 Cold curve min. I min. tau

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 10 % IBase
Range tau 1 min to 1000 min.
Set tau 1 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC
Number of tests 5

Current Measured Deviation

T. Theoretical min. avg. max. avg. Max.
xIref A s s s s % s % s
1,2 0,6 46,61 48,13 48,19 48,23 3,4 1,58 3,5 1,62
1,6 0,8 21,73 22,26 22,31 22,34 2,7 0,58 2,8 0,61
2 1 12,97 13,32 13,36 13,42 3,0 0,39 3,4 0,45
5 2,5 1,90 2,030 2,062 2,080 8,8 0,17 9,7 0,18
10 5 0,47 0,596 0,614 0,645 31,1 0,15 37,7 0,18
Version: 1
 -280- 1446-18

5.4.2.2 Cold curve min. I average tau

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 10 % IBase
Range tau 1 min to 1000 min.
Set tau 10 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Current T. Theoretical Measured Deviation

xIref A s s % s
1,2 0,6 466,08 480,4 3,1 14,32
1,6 0,8 217,29 221,8 2,1 4,51
2 1 129,73 131,7 1,5 1,97
5 2,5 18,96 19,24 1,5 0,28
10 5 4,68 4,845 3,4 0,16
Version: 1
 -281- 1446-18

5.4.2.3 Cold curve min. I max. tau

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 10 % IBase
Range tau 1 min to 1000 min.
Set tau 30 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Current T. Theoretical Measured Deviation

xIref A s s % s
1,2 0,6 1398,23 1439,0 2,9 40,77
1,6 0,8 651,86 663,8 1,8 11,94
2 1 389,20 395,2 1,5 6,00
5 2,5 56,89 57,59 1,2 0,70
10 5 14,05 14,32 1,9 0,27
Version: 1
 -282- 1446-18

5.4.2.4 Cold curve default I min. tau

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 1 min.
Range Trip Temp 0 oC to 600 oC
Set Trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Current T. Theoretical Measured Deviation Deviation

min. avg. max. avg. max.
xIref A s s s s % s % s
1,2 3,0 46,61 47,33 47,37 47,41 1,6 0,76 1,7 0,80
1,6 4,0 21,73 22,03 22,05 22,09 1,5 0,32 1,7 0,36
2 5,0 12,97 13,18 13,19 13,21 1,7 0,22 1,8 0,24
5 12,5 1,90 2,023 2,048 2,083 8,0 0,15 9,8 0,19
10 25,0 0,47 0,554 0,600 0,623 28,0 0,13 33,0 0,15
Version: 1
 -283- 1446-18

5.4.2.5 Cold curve default I average tau

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 10 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Current T Theoretical Measured Deviation

xIref A s s % s
1,2 3,0 466,08 471,9 1,2 5,82
1,6 4,0 217,29 219,3 0,9 2,01
2 5,0 129,73 130,8 0,8 1,07
5 12,5 18,96 19,17 1,1 0,21
10 25,0 4,68 4,85 3,5 0,17
Version: 1
 -284- 1446-18

5.4.2.6 Cold curve default I max. tau

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 30 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Current T. Theoretical Measured Deviation

xIref A s s % s
1,2 3,0 1398,23 1416,0 1,3 17,77
1,6 4,0 651,86 657,6 0,9 5,74
2 5,0 389,20 392,2 0,8 3,00
5 12,5 56,89 57,33 0,8 0,44
10 25,0 14,05 14,23 1,2 0,18
Version: 1
 -285- 1446-18

5.4.3 Operating time hot curve

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 1 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 140 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Preload End current T. Theoretical Measured Deviation

% A xIref A s s % s
10 0,791 1,2 3,00 151,84 158,9 4,6 7,06
1,6 4,00 41,75 42,36 1,5 0,61
2 5,00 22,81 23,21 1,8 0,40
5 12,50 3,05 3,170 4,0 0,12
10 25,00 0,75 0,89 19,4 0,14
30 1,369 1,2 3,00 142,14 149,2 5,0 7,06
1,6 4,00 36,66 37,4 2,0 0,74
2 5,00 19,65 19,97 1,6 0,32
5 12,50 2,56 2,688 4,8 0,12
10 25,00 0,63 0,794 27,0 0,17
50 1,768 1,2 3,00 130,57 137,5 5,3 6,93
1,6 4,00 31,10 31,8 2,2 0,70
2 5,00 16,32 16,68 2,2 0,36
5 12,50 2,08 2,233 7,5 0,16
10 25,00 0,50 0,659 30,6 0,15
70 2,092 1,2 3,00 116,22 122,90 5,8 6,68
1,6 4,00 24,98 25,72 3,0 0,74
2 5,00 12,79 13,13 2,7 0,34
5 12,50 1,58 1,765 11,4 0,18
10 25,00 0,38 0,489 27,4 0,11
90 2,372 1,2 3,00 97,31 104,7 7,6 7,39
1,6 4,00 18,15 18,78 3,5 0,63
2 5,00 9,03 9,45 4,6 0,42
5 12,50 1,09 1,294 18,9 0,21
10 25,00 0,26 0,433 64,7 0,17
Version: 1
 -286- 1446-18

5.4.4 Ambient temperatures, cold curve

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 135 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 10 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 155 oC
Set DefaultAmbTemp See tables
Set DefaultTemp 0 oC

Ambient temperature: 20 oC
Preload T. Theoretical T. Measured Deviation
xIref A s s % s
1,2 3,0 711,37 723,3 1,7 11,93
1,6 4,0 297,19 300,2 1,0 3,01
2 5,0 172,61 174,1 0,9 1,49
5 12,5 24,49 24,74 1,0 0,25
10 25,0 6,03 6,13 1,6 0,10

Ambient temperature: 60 oC
Preload T. Theoretical T. Measured Deviation
xIref A s s % s
1,2 3,0 402,46 407,5 1,3 5,04
1,6 4,0 192,85 194,8 1,0 1,95
2 5,0 116,10 117,1 0,9 1,00
5 12,5 17,13 17,32 1,1 0,19
10 25,0 4,24 4,37 3,2 0,14
Version: 1
 -287- 1446-18

5.4.5 Ambient temperatures, hot curve

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 135 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 1 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 155 oC
Set DefaultAmbTemp See tables
Set DefaultTemp 0 oC

Ambient temperature: 20 oC
Preload End current T. Theoretical T. Measured Deviation
% A xIref A s s % s
50 1,768 1,2 3,0 45,55 46,95 3,1 1,40
- 1,6 4,0 16,68 17,22 3,2 0,54
- 2 5,0 9,25 9,563 3,4 0,31
- 5 12,5 1,24 1,400 13,2 0,16
- 10 25,0 0,30 0,482 59,5 0,18

Ambient temperature: 60 oC
Preload End current T. Theoretical T. Measured Deviation
% A xIref A s s % s
50 1,768 1,2 3,0 14,65 15,40 5,1 0,75
- 1,6 4,0 6,25 6,565 5,1 0,32
- 2 5,0 3,60 3,878 7,8 0,28
- 5 12,5 0,50 0,643 28,4 0,14
- 10 25,0 0,12 0,245 99,2 0,12
Version: 1
 -288- 1446-18

5.4.6 Operating time, cold curve 3rd harmonic

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 1 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC
Number of tests 5

Harmonic = 3 (percentage of harmonic = 10%)

Current Calculated Measured operate time Deviation
operate time Min. Avg. Max. Avg. Max.
xGs A s s s s % s % s
1,2 3,0 45,91 46,75 46,78 46,79 1,9 0,87 1,9 0,88
2 5,0 12,83 13,04 13,09 13,13 2,0 0,26 2,3 0,30
10 25,0 0,46 0,546 0,598 0,643 28,9 0,13 38,6 0,18
Version: 1
 -289- 1446-18

5.4.7 Operating time, cold curve 5th harmonic

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 10 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Harmonic = 5 (percentage of harmonic = 25%)

Current Calculated Measured operate Deviation
operate time time
xGs A s s % s
1,2 3,0 425,99 439,41 3,1 13,42
2 5,0 121,27 123,90 2,2 2,63
10 25,0 4,41 5,160 17,1 0,75
Version: 1
 -290- 1446-18

5.4.8 Operating time cold curve 7th harmonic

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 10 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Harmonic = 7 (percentage of harmonic = 15%)

Current Calculated Measured operate Deviation
operate time time
xGs A s s % s
1,2 3,0 450,77 462,36 2,6 11,59
2 5,0 126,56 128,71 1,7 2,15
10 25,0 4,58 4,845 5,8 0,26
Version: 1
 -291- 1446-18

5.5 Operating time during frequency deviation

Characteristic test data

Sample IED 7 A
Irated 5A
IBase 5A
Rated frequency 16,7 Hz
Range Tref 0 oC to 600 oC
Set Tref 90 oC
Range Iref 0 % IBase to 400% IBase
Set Iref 50 % IBase
Range tau 1 min to 1000 min.
Set tau 1 min.
Range trip Temp 0 oC to 600 oC
Set trip Temp 90 oC
Set DefaultAmbTemp 20 oC
Set DefaultTemp 0 oC

Frequency = 15,865 Hz
Current Calculated operate time Measured operate time
Min. Avg. Max.
xGs s s s s
1,2 46,61 47,25 47,29 47,31
2 12,97 13,17 13,19 13,21
10 0,47 0,559 0,601 0,643

Frequency = 17,535 Hz
Current Calculated operate time Measured operate time
Min. Avg. Max.
xGs s s s s
1,2 46,61 47,380 47,410 47,440
2 12,97 13,170 13,208 13,240
10 0,47 0,569 0,610 0,648
Version: 1
 -292- 1446-18

6 DISTANCE PROTECTION

6.1 Distance Protection, ZMFCPDIS

6.1.1 Calculation sheets of test points
IED number 3C
Protection function under test ZMFCPDIS
Set IBase = CT primary current 200 A
Set CT secondary current = rated current 1A
Set UBase = VT primary voltage 110 kV ph-ph
Set VT secondary voltage 110 V
IED settings are expressed in Primary values

Test point A
Parameter Value Rationale Rationale
U (V) 33 0,3 x 110 0,3 x Urated
I (A) 2 2x1 2 x Irated
Ztest (Ω) 4,7631 - -
Ztest primary (Ω) 23,8157 - -

Settings of IED Value

X1FwPP 23,72
R1FwPP 2,08
RFPP 47,63
X1RvPP 23,72
X1FwPE 23,72
R1FwPE 2,08
X0FwPE 94,90
R0FwPE 8,30
RFPE 47,63
X1RvPE 23,72
Version: 1
 -293- 1446-18

Test point B
Parameter Value Rationale Rationale
U (V) 121 1,1 x 110 1,1 x Urated
I (A) 0,5 0,5 x 1 0,5 x Irated
Ztest (Ω) 69,8594 - -
Ztest primary (Ω) 349,2969 - -

Settings of IED Value

X1FwPP 347,97
R1FwPP 30,44
RFPP 698,59
X1RvPP 347,97
X1FwPE 347,97
R1FwPE 30,44
X0FwPE 1391,87
R0FwPE 121,77
RFPE 698,59
X1RvPE 347,97
Version: 1
 -294- 1446-18

Test point C
Parameter Value Rationale Rationale
U (V) 11 0,1 x 110 0,1 Urated
I (A) 30 30 x 1 30 x Irated
Ztest (Ω) 0,10585 - -
Ztest primary (Ω) 0,52924 - -

Settings of IED Value

X1FwPP 0,527
R1FwPP 0,046
RFPP 1,058
X1RvPP 0,527
X1FwPE 0,527
R1FwPE 0,046
X0FwPE 2,109
R0FwPE 0,185
RFPE 1,058
X1RvPE 0,527

Test point D
Parameter Value Rationale Rationale
U (V) 77 (33 + 121)/2 (0,3x Urated + Umax.)/2
I (A) 1,25 (2 + 0,5)/2 (2x Irated + Imin.)/2
Ztest (Ω) 17,78239 - -
Ztest primary (Ω) 88,91194 - -

Settings of IED Value

X1FwPP 88,574
R1FwPP 7,749
RFPP 177,824
X1RvPP 88,574
X1FwPE 88,574
R1FwPE 7,749
X0FwPE 354,294
R0FwPE 30,997
RFPE 177,824
X1RvPE 88,574
Version: 1
 -295- 1446-18

Test point E
Parameter Value Rationale Rationale
U (V) 22 (11 + 33)/2 (Umin. + 0,3x Urated)/2
I (A) 16 (30 + 2)/2 (Imax. + 2x Irated)/2
Ztest (Ω) 0,39693 - -
Ztest primary (Ω) 1,98464 - -

Settings of IED Value

X1FwPP 1,977
R1FwPP 0,173
RFPP 3,969
X1RvPP 1,977
X1FwPE 1,977
R1FwPE 0,173
X0FwPE 7,908
R0FwPE 0,692
RFPE 3,969
X1RvPE 1,977
Version: 1
 -296- 1446-18

6.2 Long line and Short line characteristic data (dynamic

performance tests)

Short line data

R1L = R2L 0,637 Ω
X1L = X2L 7,272 Ω
R0L 2,548 Ω
X0L 29,104 Ω

Long line data

R1L = R2L 3,184 Ω
X1L = X2L 36,36 Ω
R0L 12,740 Ω
X0L 145,52 Ω
Version: 1
 -297- 1446-18

6.3 Rated frequency characteristic accuracy tests

6.3.1 Basic characteristic accuracy under steady state conditions
(1 A, 50 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.2
Test dates 1 to 3 May 2018

Characteristic test data

Test method Ramp of shots
Pre-fault time 500 ms
Frequency 50 Hz

Basic characteristic accuracy for various points

Test point εz Measured at
%
A 0,2 various
B 0,5 L1-E, 70, 90 °
C 1,3 L1-L2-L3, 90 °
D 0,2 Various
E 0,8 L1-L3, 0 °

Basic characteristic accuracy at 90 °

Test point εx Measured at
%
A 0,2 various
B 0,5 L1-E
C 1,3 L1-L2-L3
D 0,2 L1-E, L2-E
E 0,6 L1-L3
Version: 1
 -298- 1446-18

Basic characteristic accuracy at 0°

Test point εR Measured at
%
A 0,2 various
B 0,3 L1-L2
C 0,9 L1-L2-L3
D 0,2 L2-E
E 0,8 L1-L3

Requirements
Manufacturer specifications: ±2% static accuracy. Conditions: voltage range (0,1-1,1)xUr, current
range: (0,5-30)xIr, at angles: 0 ° and 85 °.

Result
The test object passed the tests.
Version: 1
 -299- 1446-18

6.3.2 Basic characteristic accuracy under steady state conditions

(1 A, 60 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.2
Test dates 24 to 28 May 2018

Characteristic test data

Test method Ramp of shots
Pre-fault time 500 ms
Frequency 60 Hz

Basic characteristic accuracy for various points

Test point εz Measured at
%
A 0,2 various
B 0,5 L1-E, 80, 90 °
C 1,3 L1-L2-L3, 80 °
D 0,3 various
E 0,7 various

Basic characteristic accuracy at 90 °

Test point εx Measured at
%
A 0,2 L1-E, L2-E
B 0,5 L1-E
C 1,2 L1-L2, L1-L2-L3
D 0,3 L2-E
E 0,6 various
Version: 1
 -300- 1446-18

Basic characteristic accuracy at 0°

Test point εR Measured at
%
A 0,2 L2-E
B 0,2 L1-L2, L2-L3
C 0,7 L1-L2-L3
D 0,2 L2-E
E 0,7 L3-E, L2-L3, L3-L1

Requirements
Manufacturer specifications: ±2% static accuracy. Conditions: voltage range (0,1-1,1)xUr, current
range: (0,5-30)xIr, at angles: 0 ° and 85 °.

Result
The object passed the tests.
Version: 1
 -301- 1446-18

6.3.3 Basic directional accuracy under steady state conditions

(1 A, 50 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.3
Test dates 3 May 2018

Environmental conditions
Ambient temperature 19,2 °C Relative humidity 36 %

Characteristic test data

Test point A
Test method Step test
Step size 0,2 °
Step duration 137 ms
Test current 2A
Test-impedance second quadrant 7,592 Ω
Test impedance fourth quadrant 7,621 Ω

Basic directional accuracy for various fault types

Test type ℮dir2 ℮dir4
° °
L1-N 0 0
L2-N 0 0,2
L3-N 0 0,2
L1-L2 0 0,2
L2-L3 0 0,2
L3-L1 0 0,2
L1-L2-L3 0,2 0,2

Basic directional accuracy eαx

Basic directional accuracy edir2 0,2 °
Basic directional accuracy edir4 0,2 °

Requirements
• Manufacturer specifications: ±2 ° static angular accuracy. Conditions: voltage range (0,1-
1,1)xUr, current range: (0,5-30)xIr, at angles: 0 ° and 85 °.

Result
The test object passed the tests.
Version: 1
 -302- 1446-18

6.3.4 Basic directional accuracy under steady state conditions

(1 A, 60 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.3
Test dates 29 May 2018

Environmental conditions
Ambient temperature 21,4 °C Relative humidity 71 %

Characteristic test data

Test point A
Test method Step test
Step size 0,2 °
Step duration 137 ms
Test current 2A
Test-impedance second quadrant 7,592 Ω
Test impedance fourth quadrant 7,621 Ω

Basic directional accuracy for various fault types

Test type ℮dir2 ℮dir4
° °
L1-N 0 0
L2-N 0 0,2
L3-N 0 0,2
L1-L2 0 0
L2-L3 0 0,2
L3-L1 0 0,2
L1-L2-L3 0,4 0,2

Basic directional accuracy eαx

Basic directional accuracy edir2 0,4 °
Basic directional accuracy edir4 0,2 °

Requirements
• Manufacturer specifications: ±2 ° static angular accuracy. Conditions: voltage range (0,1-
1,1)xUr, current range: (0,5-30)xIr, at angles: 0 ° and 85 °.

Result
The object passed the tests.
Version: 1
 -303- 1446-18

6.3.5 Determination of accuracy related to time delay setting

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.4
Test dates 31 May 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Frequency 50 Hz
Test point A
Zfault (sec.) 2,382 Ω
Angle 85 °
Number of tests 5
Measurement method time difference between Start and Trip signal

IED settings: tPPZ1 = tPEZ1 = 0,3 s

Fault type Shot Measured time delay start > trip
ms
L1-E 1 299,9
2 300,2
3 299,7
4 300,5
5 300,7
L2-E 1 299,8
2 300,6
3 299,8
4 299,4
5 300,0
L3-E 1 300,8
2 299,9
3 300,0
4 300,2
5 300,0
L1-L2 1 300,9
2 300,5
3 302,5
4 303,1
5 300,9
L2-L3 1 300,3
2 300,4
3 300,8
4 300,4
5 300,3
Version: 1
 -304- 1446-18

IED settings: tPPZ1 = tPEZ1 = 0,3 s

L3-L1 1 300,4
2 300,4
3 300,6
4 300,0
5 300,7
L1-L2-L3 1 300,4
2 303,6
3 300,6
4 300,1
5 300,9
Version: 1
 -305- 1446-18

IED settings: tPPZ1 = tPEZ1 = 30 s

Fault type Shot Measured time delay start > trip
s
L1-E 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00
L2-E 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00
L3-E 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00
L1-L2 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00
L2-L3 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00
L3-L1 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00
L1-L2-L3 1 30,00
2 30,00
3 30,00
4 30,00
5 30,00

Requirements
Manufacturer specification: Definite time delay to trip, Ph-E and Ph-Ph operation: ±0,2% or ±35 ms,
whichever is greater.

Result
The test object passed the tests.
Version: 1
 -306- 1446-18

6.3.6 Determination of the disengaging time, 50 Hz

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.5
Test date 29 May 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Test point A
Ztest (secondary) 2,382 Ω
Angle 85 °
UL 9,526 V (0,15x 110/√3)
Itest 4A
Number of tests 5
Fault type L1-L2-L3

Frequency: 50 Hz
Test no Disengaging time
ms
1 35,4
2 33,6
3 31,4
4 32,5
5 31,8

Requirements
Manufacturer specification: Reset time at 0,1 to 2x Zreach: min. = 20 ms, max. = 35 ms.

Result
The test object passed the tests.
Version: 1
 -307- 1446-18

6.3.7 Determination of the disengaging time, 60 Hz

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.5
Test date 29 May 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Test point A
Ztest (secondary) 2,382 Ω
Angle 85 °
UL 9,526 V (0,15x 110/√3)
Itest 4A
Number of tests 5
Fault type L1-L2-L3

Frequency: 60 Hz
Test no Disengaging time
ms
1 33,5
2 33,3
3 31,9
4 33,8
5 31,9

Requirements
Manufacturer specification: Reset time at 0,1 to 2x Zreach: min. = 20 ms, max. = 35 ms.

Result
The test object passed the tests.
Version: 1
 -308- 1446-18

6.4 Dynamic performance

6.4.1 Operate time and transient overreach at 1 A and 50 Hz
(Short line)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.2
Test dates 12 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Number of shots per test 4
IED settings:
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

Requirements
Manufacturer specification: operate time 16 ms typically.

Result
The test object passed the tests.
Version: 1
 -309- 1446-18

6.4.1.1 L1-L2-L3 fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,016 0,017 0,017 0,018
50 0,017 0,016 0,017 0,019
80 0,025 0,025 0,026 0,037
90 0,026 0,027 0,038 0,039
95 0,026 0,034 0,039 0,038
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,014 0,014 0,014 0,015
50 0,014 0,014 0,015 0,015
80 0,023 0,023 0,025 0,035
90 0,025 0,025 0,031 0,037
95 0,025 0,031 0,037 0,037
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,019 0,020 0,020 0,020
50 0,020 0,019 0,019 0,028
80 0,027 0,027 0,029 0,039
90 0,027 0,029 0,040 0,041
95 0,030 0,038 0,040 0,040
105 - - - -
110 - - - -
Version: 1
 -310- 1446-18

6.4.1.2 L1-N fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,015 0,016 0,017 0,018
50 0,017 0,017 0,017 0,017
80 0,017 0,017 0,024 0,038
90 0,025 0,030 0,038 0,038
95 0,032 0,037 0,041 0,041
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,013 0,014 0,015 0,015
50 0,015 0,014 0,014 0,015
80 0,015 0,014 0,015 0,036
90 0,017 0,016 0,036 0,037
95 0,027 0,030 0,037 0,037
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,017 0,019 0,019 0,020
50 0,019 0,019 0,019 0,020
80 0,020 0,021 0,034 0,040
90 0,035 0,036 0,039 0,040
95 0,037 0,048 0,050 0,052
105 - - - -
110 - - - -
Version: 1
 -311- 1446-18

6.4.1.3 L2-L3 fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,016 0,015 0,016 0,017
50 0,016 0,017 0,016 0,017
80 0,026 0,026 0,027 0,027
90 0,026 0,027 0,030 0,031
95 0,029 0,030 0,035 0,036
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,014 0,014 0,015 0,016
50 0,013 0,015 0,015 0,015
80 0,025 0,025 0,025 0,025
90 0,025 0,024 0,026 0,025
95 0,024 0,025 0,029 0,027
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,017 0,017 0,020 0,020
50 0,017 0,018 0,019 0,020
80 0,029 0,029 0,029 0,031
90 0,029 0,034 0,034 0,040
95 0,036 0,037 0,042 0,044
105 - - - -
110 - - - -
Version: 1
 -312- 1446-18

6.4.1.4 L2-L3-N fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,016 0,016 0,017 0,017
50 0,016 0,016 0,017 0,019
80 0,027 0,027 0,029 0,038
90 0,028 0,029 0,038 0,038
95 0,031 0,037 0,041 0,038
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,013 0,014 0,015 0,015
50 0,014 0,014 0,015 0,016
80 0,024 0,024 0,024 0,035
90 0,025 0,024 0,036 0,037
95 0,025 0,031 0,038 0,036
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 30 SIR 50
% of IED reach s s s s
0 0,018 0,019 0,019 0,019
50 0,019 0,019 0,019 0,026
80 0,029 0,028 0,035 0,040
90 0,033 0,036 0,040 0,040
95 0,037 0,050 0,053 0,040
105 - - - -
110 - - - -
Version: 1
 -313- 1446-18

6.4.2 Operate time and transient overreach at 1 A and 60 Hz

(Short line)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.2
Test date 14 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Number of shots per test 4
IED settings:
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

Requirements
Manufacturer specification: operate time 16 ms typically.

Result
The test object passed the tests.
Version: 1
 -314- 1446-18

6.4.2.1 L1-N fault

Fault position Average trip time for

SIR 10
% of IED reach s
0 0,016
50 0,015
80 0,016
90 0,024
95 0,034
105 -
110 -

Fault position Minimum trip time for

SIR 10
% of IED reach s
0 0,015
50 0,013
80 0,015
90 0,016
95 0,030
105 -
110 -

Fault position Maximum trip time of

SIR 10
% of IED reach s
0 0,017
50 0,017
80 0,018
90 0,031
95 0,043
105 -
110 -
Version: 1
 -315- 1446-18

6.4.2.2 L2-L3 fault

Fault position Average trip time for

SIR 10
% of IED reach s
0 0,015
50 0,016
80 0,023
90 0,026
95 0,027
105 -
110 -

Fault position Minimum trip time for

SIR 10
% of IED reach s
0 0,014
50 0,014
80 0,022
90 0,021
95 0,022
105 -
110 -

Fault position Maximum trip time of

SIR 10
% of IED reach s
0 0,018
50 0,018
80 0,024
90 0,031
95 0,031
105 -
110 -
Version: 1
 -316- 1446-18

6.4.3 Operate time and transient overreach at 1 A and 50 Hz

(Long line)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.2
Test date 13 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Number of shots per test 4
IED settings:
Parameter Set value
Ω
X1FwPPZ1 29,09
R1FwPPZ1 2,55
RFPPZ1 10,00
X1RvPPZ1 29,09
X1FwPEZ1 29,09
R1FwPEZ1 2,55
X0FwPEZ1 116,42
R0FwPEZ1 10,19
RFPE 15,00
X1RvPEZ1 29,09

Requirements
Manufacturer specification: operate time 16 ms typically.

Result
The test object passed the tests.
Version: 1
 -317- 1446-18

6.4.3.1 L1-L2-L3 fault

Fault position Average trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,015 0,015 0,017 0,018
50 0,025 0,025 0,026 0,026
80 0,025 0,025 0,026 0,026
90 0,025 0,025 0,026 0,027
95 0,025 0,026 0,027 0,031
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,013 0,013 0,015 0,015
50 0,023 0,023 0,024 0,023
80 0,024 0,023 0,024 0,024
90 0,023 0,023 0,024 0,025
95 0,024 0,025 0,024 0,026
105 - - - -
110 - - - -

Fault position Maximum trip time of

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,016 0,017 0,020 0,020
50 0,027 0,026 0,027 0,030
80 0,026 0,027 0,027 0,030
90 0,026 0,026 0,028 0,029
95 0,027 0,028 0,029 0,037
105 - - - -
110 - - - -
Version: 1
 -318- 1446-18

6.4.3.2 L2-N fault

Fault position Average trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,015 0,015 0,017 0,017
50 0,025 0,025 0,027 0,027
80 0,025 0,025 0,027 0,028
90 0,025 0,027 0,029 0,030
95 0,029 0,030 0,031 0,037
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,014 0,014 0,015 0,015
50 0,023 0,023 0,024 0,025
80 0,023 0,023 0,025 0,025
90 0,024 0,024 0,026 0,027
95 0,023 0,024 0,025 0,027
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,017 0,017 0,019 0,019
50 0,026 0,026 0,029 0,029
80 0,026 0,027 0,029 0,030
90 0,027 0,033 0,035 0,036
95 0,037 0,036 0,050 0,051
105 - - - -
110 - - - -
Version: 1
 -319- 1446-18

6.4.3.3 L3-L1 fault

Fault position Average trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,015 0,016 0,016 0,017
50 0,025 0,025 0,027 0,027
80 0,025 0,026 0,026 0,027
90 0,025 0,026 0,027 0,027
95 0,031 0,031 0,030 0,032
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,013 0,014 0,014 0,015
50 0,023 0,024 0,025 0,025
80 0,023 0,024 0,025 0,025
90 0,023 0,024 0,024 0,025
95 0,023 0,024 0,025 0,025
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,016 0,017 0,017 0,019
50 0,026 0,026 0,028 0,029
80 0,028 0,027 0,028 0,030
90 0,027 0,027 0,030 0,029
95 0,047 0,050 0,050 0,049
105 - - - -
110 - - - -
Version: 1
 -320- 1446-18

6.4.3.4 L3-L1-N fault

Fault position Average trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,015 0,015 0,018 0,017
50 0,025 0,025 0,027 0,026
80 0,025 0,025 0,026 0,027
90 0,026 0,026 0,028 0,029
95 0,031 0,030 0,033 0,036
105 - - - -
110 - - - -

Fault position Minimum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,013 0,013 0,015 0,015
50 0,023 0,023 0,023 0,025
80 0,024 0,024 0,024 0,025
90 0,023 0,024 0,026 0,025
95 0,024 0,025 0,025 0,025
105 - - - -
110 - - - -

Fault position Maximum trip time for

SIR 0,2 SIR 0,5 SIR 5 SIR 10
% of IED reach s s s s
0 0,016 0,017 0,019 0,019
50 0,027 0,026 0,030 0,029
80 0,027 0,027 0,029 0,030
90 0,035 0,029 0,033 0,036
95 0,049 0,036 0,050 0,050
105 - - - -
110 - - - -
Version: 1
 -321- 1446-18

6.4.4 Operate time and transient overreach at 1 A and 60 Hz

(Long line)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.2
Test date 14 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Number of shots per test 4
IED settings:
Parameter Set value
Ω
X1FwPPZ1 29,09
R1FwPPZ1 2,55
RFPPZ1 10,00
X1RvPPZ1 29,09
X1FwPEZ1 29,09
R1FwPEZ1 2,55
X0FwPEZ1 116,42
R0FwPEZ1 10,19
RFPE 15,00
X1RvPEZ1 29,09

Requirements
Manufacturer specification: operate time 16 ms typically.

Result
The test object passed the tests.
Version: 1
 -322- 1446-18

6.4.4.1 L1-N fault

Fault position Average trip time for

SIR 0,5
% of IED reach s
0 0,015
50 0,023
80 0,023
90 0,025
95 0,027
105 -
110 -

Fault position Minimum trip time for

SIR 0,5
% of IED reach s
0 0,013
50 0,021
80 0,022
90 0,022
95 0,022
105 -
110 -

Fault position Maximum trip time for

SIR 0,5
% of IED reach s
0 0,018
50 0,025
80 0,025
90 0,029
95 0,032
105 -
110 -
Version: 1
 -323- 1446-18

6.4.4.2 L2-L3 fault

Fault position Average trip time for

SIR 0,5
% of IED reach s
0 0,017
50 0,023
80 0,024
90 0,025
95 0,027
105 -
110 -

Fault position Minimum trip time for

SIR 0,5
% of IED reach s
0 0,013
50 0,022
80 0,022
90 0,022
95 0,023
105 -
110 -

Fault position Maximum trip time for

SIR 0,5
% of IED reach s
0 0,026
50 0,024
80 0,026
90 0,031
95 0,032
105 -
110 -
Version: 1
 -324- 1446-18

6.4.5 Operate time and transient overreach (short line with CVT)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.3
Test date 12 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Number of shots per test 4
IED settings:
Parameter Set value
Ω
X1FwPPZ1 29,09
R1FwPPZ1 2,55
RFPPZ1 10,00
X1RvPPZ1 29,09
X1FwPEZ1 29,09
R1FwPEZ1 2,55
X0FwPEZ1 116,42
R0FwPEZ1 10,19
RFPE 15,00
X1RvPEZ1 29,09

Requirements
Manufacturer specification: operate time 16 ms typically.

Result
The test object passed the tests.
Version: 1
 -325- 1446-18

6.4.5.1 L2-L3 fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,018 0,021 0,036
50 0,019 0,023 0,038
80 0,029 0,033 0,050
90 0,033 0,036 0,053
95 0,040 0,049 0,069
105 - - -
110 - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,014 0,018 0,029
50 0,015 0,019 0,030
80 0,020 0,019 0,037
90 0,027 0,028 0,039
95 0,028 0,035 0,053
105 - - -
110 - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,021 0,027 0,045
50 0,021 0,028 0,046
80 0,038 0,041 0,061
90 0,040 0,042 0,075
95 0,052 0,060 0,081
105 - - -
110 - - -
Version: 1
 -326- 1446-18

6.4.5.2 L1-L2-L3 fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,017 0,021 0,030
50 0,018 0,021 0,034
80 0,025 0,030 0,042
90 0,030 0,033 0,052
95 0,034 0,041 0,059
105 - - -
110 - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,015 0,018 0,029
50 0,015 0,019 0,029
80 0,019 0,020 0,037
90 0,027 0,028 0,045
95 0,028 0,037 0,048
105 - - -
110 - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,020 0,029 0,035
50 0,020 0,028 0,038
80 0,029 0,034 0,047
90 0,035 0,037 0,060
95 0,038 0,046 0,065
105 - - -
110 - - -
Version: 1
 -327- 1446-18

6.4.5.3 L3-L1-N fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,018 0,022 0,037
50 0,019 0,025 0,039
80 0,030 0,034 0,051
90 0,034 0,037 0,055
95 0,040 0,049 0,069
105 - - -
110 - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,016 0,019 0,029
50 0,016 0,019 0,031
80 0,019 0,020 0,038
90 0,027 0,028 0,045
95 0,029 0,037 0,056
105 - - -
110 - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,020 0,032 0,046
50 0,020 0,032 0,046
80 0,039 0,041 0,062
90 0,040 0,041 0,066
95 0,052 0,061 0,081
105 - - -
110 - - -
Version: 1
 -328- 1446-18

6.4.5.4 L1-N fault

Fault position Average trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,018 0,019 0,036
50 0,018 0,021 0,037
80 0,028 0,032 0,050
90 0,032 0,035 0,056
95 0,041 0,049 0,069
105 - - -
110 - - -

Fault position Minimum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,014 0,017 0,029
50 0,015 0,018 0,029
80 0,018 0,019 0,039
90 0,020 0,020 0,046
95 0,029 0,037 0,056
105 - - -
110 - - -

Fault position Maximum trip time for

SIR 5 SIR 10 SIR 50
% of IED reach s s s
0 0,021 0,021 0,042
50 0,022 0,028 0,042
80 0,038 0,041 0,062
90 0,041 0,048 0,062
95 0,053 0,061 0,080
105 - - -
110 - - -
Version: 1
 -329- 1446-18

6.4.6 Transient overreach (Short line)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.4
Test date 18 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Impedance step-size 0,5 % reach
Pre-fault time 200 ms
IED settings:
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

SIR Fault type XST XNT TO

10 Phase – earth L1-N 99,5 100,5 1,0
10 Phase – phase L2-L3 99,5 100,5 1,0
50 Phase – earth L1-N 100 102 2,0
50 Phase – phase L2-L3 99,5 101,5 2,0

Requirements
Manufacturer specification: < 5% at 85 o, measured with CVTs and 0,5 < SIR< 30.

Result
The test object passed the tests.
Version: 1
 -330- 1446-18

6.4.7 Transient overreach (Long line)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.4
Test date 18 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Impedance step-size 0,5 % reach
Pre-fault time 200 ms
IED settings:
Parameter Set value
Ω
X1FwPPZ1 29,09
R1FwPPZ1 2,55
RFPPZ1 10,00
X1RvPPZ1 29,09
X1FwPEZ1 29,09
R1FwPEZ1 2,55
X0FwPEZ1 116,42
R0FwPEZ1 10,19
RFPE 15,00
X1RvPEZ1 29,09

SIR Fault type XST XNT TO

0,2 Phase – earth L1-N 99,5 100 0,5
0,2 Phase – phase L2-L3 99,5 100,5 1,0
5 Phase – earth L1-N 99,5 100,5 1,0
5 Phase – phase L2-L3 99,5 100 0,5

Requirements
Manufacturer specification: < 5% at 85 o, measured with CVTs and 0,5 < SIR< 30.

Result
The object passed the tests.
Version: 1
 -331- 1446-18

6.4.8 Transient overreach (Short line with CVT)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.4
Test date 18 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Impedance step-size 0,5 % reach
Pre-fault time 200 ms
IED settings:
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

SIR Fault type XST XNT TO

10 Phase – earth L1-N 99,5 100,5 1,0
10 Phase – phase L2-L3 99,5 100 0,5
50 Phase – earth L1-N 99,5 101,5 2,0
50 Phase – phase L2-L3 99 101 2,0

Requirements
Manufacturer specification: < 5% at 85 o, measured with CVTs and 0,5 < SIR< 30.

Result
The test object passed the tests.
Version: 1
 -332- 1446-18

6.4.9 Typical operate time

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.3.5
Test date 12 and 13 June 2018

Environmental conditions
Ambient temperature 21 °C
Temperature of test object 21 °C

Characteristic test data

Frequency 50 Hz
Data evaluated 6.4.6 (Short line)
6.4.7 (Long line)
Fault positions evaluated 0, 50, 80 %
SIR evluated 5
Weigh factor LN faults 6
Weigh factor LLN faults 2
Weigh factor LL faults 1
Weigh factor L1L2L3 fault 1

Mode (most frequently measured value) 0,0170

Median (central value) 0,0182
Mean (average value) 0,0206

Tip time class Frequency of occurrence

s %
0,0135 2,29
0,0140 1,25
0,0145 1,56
0,0150 7,50
0,0155 3,96
0,0160 7,92
0,0165 5,73
0,0170 10,31
0,0175 5,73
0,0180 5,00
0,0185 1,98
0,0190 5,00
0,0195 1,04
0,0200 0,73
0,0205 0,00
0,0210 0,00
0,0215 0,00
0,0220 0,00
0,0225 0,00
0,0230 0,21
Version: 1
 -333- 1446-18

Tip time class Frequency of occurrence

s %
0,0235 0,83
0,0240 0,21
0,0245 2,19
0,0250 4,27
0,0255 4,58
0,0260 4,48
0,0265 6,25
0,0270 5,31
0,0275 4,48
0,0280 3,75
0,0285 1,56
0,0290 1,25
0,0295 0,42
0,0300 0,21

ZMFCPDIS Typical operate time

11

10

8
Occurence (%)

0
0,0145

0,0285
0,0135
0,0140

0,0150
0,0155
0,0160
0,0165
0,0170
0,0175
0,0180
0,0185
0,0190
0,0195
0,0200
0,0205
0,0210
0,0215
0,0220
0,0225
0,0230
0,0235
0,0240
0,0245
0,0250
0,0255
0,0260
0,0265
0,0270
0,0275
0,0280

0,0290
0,0295
0,0300

Trip time class (ms)

Requirements
Operate time:16 ms typically.

Result
The object passed the tests.
Version: 1
 -334- 1446-18

6.5 Performance with harmonics

6.5.1 Steady state harmonics tests (2 A, 50 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.4.1
Test date 30 May 2018

Characteristic test data

Ztest 25,403 Ω
Ztest primary 127,0170592 Ω
Settings IED:
X1FwPP 126,53
R1FwPP 11,07
RFPP 254,03
X1RvPP 126,53
X1FwPE 126,53
R1FwPE 11,07
X0FwPE 506,13
R0FwPE 44,28
RFPE 254,03
X1RvPE 126,53

Harmonic Maximum inaccuracy

%
3 0,15
5 0,15
7 0,15

Requirements
Manufacturer specifications: ±2% static accuracy. Conditions: voltage range (0,1-1,1)xUr, current
range: (0,5-30)xIr, at angles: 0 o. and 85 o.
Harmonic frequency dependence (10% content): ±10%.

Result
The test object passed the tests.
Version: 1
 -335- 1446-18

6.5.2 Steady state harmonics tests (2 A, 60 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.4.1
Test date 30 May 2018

Characteristic test data

Ztest 25,403 Ω
Ztest primary 127,0170592 Ω
Settings IED:
X1FwPP 126,53
R1FwPP 11,07
RFPP 254,03
X1RvPP 126,53
X1FwPE 126,53
R1FwPE 11,07
X0FwPE 506,13
R0FwPE 44,28
RFPE 254,03
X1RvPE 126,53

Harmonic Maximum inaccuracy

%
3 0,15
5 0,15
7 0,15

Requirements
Manufacturer specifications: ±2% static accuracy. Conditions: voltage range (0,1-1,1)xUr, current
range: (0,5-30)xIr, at angles: 0 o. and 85 o.
Harmonic frequency dependence (10% content): ±10%.

Result
The test object passed the tests.
Version: 1
 -336- 1446-18

6.5.3 Transient oscillation tests (50 Hz)

6.5.3.1 Case 1

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.4.2
Test date 20 June 2018

Characteristic test data

C0 and C1 4,31 µF
Number of shots per test 4
IED settings:
Parameter Value
Ω
X1FwPPZ1 27,00
R1FwPPZ1 1,900
RFPPZ1 10,00
X1RvPPZ1 27,00
X1FwPEZ1 27,00
R1FwPEZ1 1,900
X0FwPEZ1 110,0
R0FwPEZ1 8,000
RFPE 15,00
X1RvPEZ1 27,00

Fault position Average trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,078 0,032
90 0,100 0,034
95 0,126 0,036
105 - -
110 - -
115 - -
125 - -

Fault position Minimum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,074 0,031
90 0,090 0,033
95 0,121 0,035
105 - -
110 - -
115 - -
125 - -
Version: 1
 -337- 1446-18

Fault position Maximum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,082 0,034
90 0,108 0,036
95 0,132 0,036
105 - -
110 - -
115 - -
125 - -

Requirements
No specific specification is given concerning performance during transient oscillations.

Result
The results are for information only.
Version: 1
 -338- 1446-18

6.5.3.2 Case 2

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.4.2
Test date 20 June 2018

Characteristic test data

C0 and C1 8,93 µF
Number of shots per test 4
IED settings:
Parameter Value
Ω
X1FwPPZ1 27,00
R1FwPPZ1 1,900
RFPPZ1 10,00
X1RvPPZ1 27,00
X1FwPEZ1 27,00
R1FwPEZ1 1,900
X0FwPEZ1 110,0
R0FwPEZ1 8,000
RFPE 15,00
X1RvPEZ1 27,00

Fault position Average trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,144 0,035
90 0,170 0,035
95 0,177 0,035
105 - -
110 - -
115 - -
125 - -

Fault position Minimum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,141 0,033
90 0,169 0,035
95 0,162 0,034
105 - -
110 - -
115 - -
125 - -
Version: 1
 -339- 1446-18

Fault position Maximum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,147 0,037
90 0,172 0,036
95 0,195 0,037
105 - -
110 - -
115 - -
125 - -

Requirements
No specific specification is given concerning performance during transient oscillations.

Result
The results are for information only
Version: 1
 -340- 1446-18

6.5.4 Transient oscillation tests (60 Hz)

6.5.4.1 Case 1

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.4.2
Test date 20 June 2018

Characteristic test data

C0 and C1 2,83 µF
Number of shots per test 4
IED settings:
Parameter Value
Ω
X1FwPPZ1 32,40
R1FwPPZ1 1,900
RFPPZ1 10,00
X1RvPPZ1 32,40
X1FwPEZ1 32,40
R1FwPEZ1 1,900
X0FwPEZ1 131,9
R0FwPEZ1 8,000
RFPE 15,00
X1RvPEZ1 32,40

Fault position Average trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,064 0,029
90 0,050 0,030
95 0,062 0,030
105 - -
110 - -
115 - -
125 - -

Fault position Minimum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,060 0,028
90 0,044 0,029
95 0,049 0,030
105 - -
110 - -
115 - -
125 - -
Version: 1
 -341- 1446-18

Fault position Maximum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,066 0,031
90 0,054 0,032
95 0,075 0,031
105 - -
110 - -
115 - -
125 - -

Requirement
No specific specification is given concerning performance during transient oscillations.

Result
The results are for information only
Version: 1
 -342- 1446-18

6.5.4.2 Case 2

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.4.2
Test date 20 June 2018

Characteristic test data

C0 and C1 6,05 µF
Number of shots per test 4
IED settings:
Parameter Value
Ω
X1FwPPZ1 32,40
R1FwPPZ1 1,900
RFPPZ1 10,00
X1RvPPZ1 32,40
X1FwPEZ1 32,40
R1FwPEZ1 1,900
X0FwPEZ1 131,9
R0FwPEZ1 8,000
RFPE 15,00
X1RvPEZ1 32,40

Fault position Average trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,137 0,031
90 0,162 0,031
95 - 0,031
105 - -
110 - -
115 - -
125 - -

Fault position Minimum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,128 0,028
90 0,157 0,030
95 0,180 0,030
105 - -
110 - -
115 - -
125 - -

Note
3 trips out of 4 shots.
Version: 1
 -343- 1446-18

Fault position Maximum trip time of

L1-N fault L1-L2-L3 fault
% of IED reach s s
80 0,141 0,035
90 0,166 0,032
95 - 0,032
105 - -
110 - -
115 - -
125 - -

Requirements
No specific specification is given concerning performance during transient oscillations.

Result
The results are for information only
Version: 1
 -344- 1446-18

6.6 Performance during off-nominal frequency

6.6.1 Steady state frequency deviation tests (50 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.5.1
Test date 31 May 2018

Characteristic test data

fmin(eff) 45 Hz (50 Hz – 10%)
fmax(eff) 55 Hz (50 Hz + 10%)
Test point A
Angles 0, 90 °
Test method Ramp of shots
Pre-fault time 500 ms
Number of tests per point 10

Test method Non frequency compensated

Basic characteristic accuracy εx at frequency fmin(eff) ± 0,2%
Basic characteristic accuracy εx at frequency fmax(eff) ± 0,1%
Basic characteristic accuracy εr at frequency fmin(eff) ± 0,6%
Basic characteristic accuracy εr at frequency fmax(eff) ± 0,2%

Requirements
Manufacturer specifications: ±2% static accuracy. Conditions: voltage range (0,1-1,1)xUr, current
range: (0,5-30)xIr, at angles: 0 o and 85 o.
Frequency dependence, distance protection: ±2% / Hz.

Result
The test object passed the tests.
Version: 1
 -345- 1446-18

6.6.2 Steady state frequency deviation tests (60 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.5.1
Test date 30 May 2018

Characteristic test data

fmin(eff) 54 Hz (60 Hz - 10%)
fmax(eff) 66 Hz (60 Hz + 10%)
Test point A
Angles 0, 90 °
Test method Ramp of shots
Pre-fault time 500 ms
Number of tests per point 10

Test method Frequency compensated

Basic characteristic accuracy εx at frequency fmin(eff) ± 0,2%
Basic characteristic accuracy εx at frequency fmax(eff) ± 0,2%
Basic characteristic accuracy εr at frequency fmin(eff) ± 0,2%
Basic characteristic accuracy εr at frequency fmax(eff) ± 0,1%

Requirements
Manufacturer specifications: ±2% static accuracy. Conditions: voltage range (0,1-1,1)xUr, current
range: (0,5-30)xIr, at angles: 0 o. and 85 o

Frequency dependence, distance protection: ±2% / Hz.

Result
The test object passed the tests.
Version: 1
 -346- 1446-18

6.6.3 Transient frequency deviation tests (49-51 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.5.2
Test date 19 June 2018

Characteristic test data

SIR value 10
fmin 49 Hz
fmax 51 Hz
Number of tests per test point 4
IED settings
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

Requirements
Manufacturer specification: operate time 16 ms typically.
No specification is given for the influence of frequency deviation on the operate time.

Result
The results are for information only.
Version: 1
 -347- 1446-18

6.6.3.1 L1-L2-L3 fault

Fault position Average trip time for Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,017 0,017 0,017
50 0,015 0,016 0,018
80 0,025 0,025 0,026
90 0,027 0,027 0,026
95 0,027 0,033 0,037
105 - - -
110 - - -

Fault position Minimum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,015 0,014 0,015
50 0,014 0,015 0,015
80 0,018 0,024 0,024
90 0,024 0,025 0,024
95 0,025 0,027 0,034
105 - - -
110 - - -

Fault position Maximum trip time of Δf

49 Hz 50,0 Hz 51 Hz
% of IED reach s s s
0 0,020 0,020 0,020
50 0,020 0,019 0,020
80 0,027 0,027 0,027
90 0,029 0,029 0,029
95 0,031 0,040 0,040
105 - - -
110 - - -
Version: 1
 -348- 1446-18

6.6.3.2 L1-N fault

Fault position Average trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,017 0,017 0,017
50 0,016 0,017 0,017
80 0,018 0,018 0,019
90 0,025 0,028 0,031
95 0,032 0,036 0,044
105 - - -
110 - - -

Fault position Minimum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,015 0,015 0,014
50 0,014 0,014 0,014
80 0,015 0,015 0,015
90 0,016 0,017 0,024
95 0,027 0,031 0,034
105 - - -
110 - - -

Fault position Maximum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,020 0,019 0,019
50 0,019 0,019 0,019
80 0,021 0,022 0,029
90 0,036 0,036 0,037
95 0,038 0,050 0,056
105 - - -
110 - - -
Version: 1
 -349- 1446-18

6.6.3.3 L2-L3 fault

Fault position Average trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,016 0,016 0,016
50 0,016 0,016 0,016
80 0,026 0,026 0,026
90 0,027 0,027 0,028
95 0,030 0,030 0,036
105 - - -
110 - - -

Fault position Minimum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,014 0,014 0,014
50 0,015 0,014 0,014
80 0,025 0,024 0,025
90 0,025 0,025 0,025
95 0,025 0,026 0,025
105 - - -
110 - - -

Fault position Maximum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,017 0,017 0,018
50 0,019 0,017 0,019
80 0,027 0,028 0,028
90 0,032 0,033 0,035
95 0,036 0,036 0,054
105 - - -
110 - - -
Version: 1
 -350- 1446-18

6.6.3.4 L2-L3-N fault

Fault position Average trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,017 0,016 0,016
50 0,017 0,016 0,016
80 0,026 0,027 0,026
90 0,030 0,030 0,030
95 0,031 0,036 0,044
105 - - -
110 - - -

Fault position Minimum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,014 0,014 0,014
50 0,014 0,014 0,014
80 0,024 0,025 0,025
90 0,025 0,025 0,025
95 0,025 0,032 0,034
105 - - -
110 - - -

Fault position Maximum trip time of Δf

49 Hz 50 Hz 51 Hz
% of IED reach s s s
0 0,019 0,019 0,019
50 0,028 0,019 0,018
80 0,029 0,029 0,031
90 0,035 0,036 0,035
95 0,037 0,050 0,053
105 - - -
110 - - -
Version: 1
 -351- 1446-18

6.6.4 Transient frequency deviation tests (47,5-52,5 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.5.2
Test date 19 June 2018

Characteristic test data

SIR value 10
fmin 47,5 Hz
fmax 52,5 Hz
Number of tests per test point 4
IED settings
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

Requirements
Manufacturer specification: operate time 16 ms typically.
No specification is given for the influence of frequency deviation on the operate time.

Result
The results are for information only.
Version: 1
 -352- 1446-18

6.6.4.1 L1-L2-L3 fault

Fault position Average trip time for Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,017 0,016 0,016
50 0,017 0,017 0,017
80 0,022 0,026 0,026
90 0,026 0,027 0,031
95 0,027 0,034 0,057
105 0,057 - -
110 - - -

Fault position Minimum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,014 0,015 0,014
50 0,015 0,014 0,014
80 0,015 0,024 0,024
90 0,024 0,025 0,027
95 0,025 0,031 0,038
105 0,040 - -
110 - - -

Fault position Maximum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,014 0,0146 0,0137
50 0,0147 0,014 0,0139
80 0,015 0,0241 0,0237
90 0,0241 0,025 0,0267
95 0,025 0,0309 0,0379
105 0,0398 - -
110 - - -
Version: 1
 -353- 1446-18

6.6.4.2 L1-N fault

Fault position Average trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,016 0,017 0,016
50 0,016 0,017 0,017
80 0,018 0,018 0,021
90 0,021 0,029 0,033
95 0,031 0,037 0,081
105 0,086 - -
110 - - -

Fault position Minimum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,014 0,014 0,015
50 0,014 0,014 0,015
80 0,016 0,015 0,016
90 0,017 0,017 0,027
95 0,019 0,032 0,038
105 0,039 - -
110 - - -

Fault position Maximum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,018 0,019 0,018
50 0,019 0,019 0,019
80 0,021 0,026 0,033
90 0,028 0,037 0,038
95 0,037 0,049 0,127
105 0,137 - -
110 - - -
Version: 1
 -354- 1446-18

6.6.4.3 L2-L3 fault

Fault position Average trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,016 0,016 0,016
50 0,016 0,017 0,016
80 0,025 0,026 0,026
90 0,026 0,028 0,030
95 0,028 0,030 0,069
105 0,081 - -
110 - - -

Fault position Minimum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,014 0,015 0,014
50 0,014 0,015 0,015
80 0,015 0,025 0,025
90 0,024 0,024 0,025
95 0,025 0,025 0,027
105 0,053 - -
110 - - -

Fault position Maximum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,017 0,017 0,017
50 0,018 0,018 0,018
80 0,029 0,029 0,028
90 0,029 0,034 0,036
95 0,032 0,035 0,131
105 0,121 - -
110 - - -
Version: 1
 -355- 1446-18

6.6.4.4 L2-L3-N fault

Fault position Average trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,016 0,016 0,016
50 0,017 0,017 0,018
80 0,026 0,026 0,028
90 0,026 0,030 0,034
95 0,031 0,036 0,086
105 0,086 - -
110 - - -

Fault position Minimum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,015 0,014 0,014
50 0,013 0,015 0,014
80 0,025 0,025 0,025
90 0,024 0,024 0,027
95 0,024 0,030 0,039
105 0,045 - -
110 - - -

Fault position Maximum trip time of Δf

47,5 Hz 50,0 Hz 52,5 Hz
% of IED reach s s s
0 0,019 0,017 0,019
50 0,020 0,019 0,020
80 0,029 0,029 0,032
90 0,030 0,036 0,039
95 0,037 0,040 0,129
105 0,100 - -
110 - - -
Version: 1
 -356- 1446-18

6.6.5 Transient frequency deviation tests (57-63 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.5.2
Test date 19 June 2018

Characteristic test data

SIR value 10
fmin (60 Hz – 5%) 57 Hz
fmax (60 Hz + 5%) 63 Hz
Number of tests per test point 4
IED settings
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

Requirements
Manufacturer specification: operate time 16 ms typically.
No specification is given for the influence of frequency deviation on the operate time.

Result
The results are for information only.
Version: 1
 -357- 1446-18

6.6.5.1 L1-L2-L3 fault

Fault position Average trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,015 0,016 0,015
50 0,016 0,015 0,015
80 0,017 0,023 0,023
90 0,023 0,024 0,027
95 0,024 0,029 0,046
105 0,048 - -
110 - - -

Fault position Minimum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,012 0,013 0,013
50 0,012 0,013 0,012
80 0,016 0,021 0,021
90 0,021 0,022 0,022
95 0,022 0,027 0,032
105 0,032 - -
110 - - -

Fault position Maximum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,018 0,018 0,018
50 0,019 0,019 0,019
80 0,019 0,024 0,025
90 0,025 0,026 0,031
95 0,026 0,032 0,061
105 0,076 - -
110 - - -
Version: 1
 -358- 1446-18

6.6.5.2 L1-N fault

Fault position Average trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,015 0,016 0,015
50 0,015 0,016 0,016
80 0,016 0,017 0,020
90 0,021 0,025 0,030
95 0,027 0,031 0,073
105 0,070 - -
110 - - -

Fault position Minimum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,013 0,014 0,014
50 0,012 0,013 0,014
80 0,012 0,014 0,015
90 0,014 0,017 0,024
95 0,019 0,027 0,043
105 0,033 - -
110 - - -

Fault position Maximum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,018 0,018 0,018
50 0,018 0,018 0,018
80 0,018 0,027 0,028
90 0,028 0,032 0,035
95 0,032 0,039 0,108
105 0,109 - -
110 - - -
Version: 1
 -359- 1446-18

6.6.5.3 L2-L3 fault

Fault position Average trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,015 0,015 0,014
50 0,015 0,016 0,015
80 0,022 0,024 0,024
90 0,023 0,025 0,027
95 0,025 0,026 0,068
105 0,070 - -
110 - - -

Fault position Minimum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,013 0,013 0,013
50 0,012 0,013 0,013
80 0,016 0,022 0,022
90 0,022 0,022 0,023
95 0,022 0,022 0,025
105 0,033 - -
110 - - -

Fault position Maximum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,017 0,017 0,017
50 0,017 0,019 0,017
80 0,025 0,025 0,026
90 0,026 0,031 0,032
95 0,031 0,031 0,111
105 0,101 - -
110 - - -
Version: 1
 -360- 1446-18

6.6.5.4 L2-L3-N fault

Fault position Average trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,015 0,015 0,015
50 0,016 0,015 0,015
80 0,023 0,024 0,024
90 0,024 0,026 0,031
95 0,028 0,031 0,072
105 0,067 - -
110 - - -

Fault position Minimum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,014 0,012 0,013
50 0,013 0,014 0,013
80 0,017 0,021 0,022
90 0,021 0,023 0,025
95 0,022 0,028 0,033
105 0,033 - -
110 - - -

Fault position Maximum trip time of Δf

57,0 Hz 60,0 Hz 63,0 Hz
% of IED reach s s s
0 0,018 0,017 0,017
50 0,018 0,017 0,019
80 0,027 0,027 0,027
90 0,027 0,031 0,038
95 0,033 0,035 0,111
105 0,100 - -
110 - - -
Version: 1
 -361- 1446-18

6.6.6 Transient frequency deviation tests (58,8-61,2 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.5.2
Test date 19 June 2018

Characteristic test data

SIR value 10
fmin (60 Hz – 2%) 58,8 Hz
fmax (60 Hz + 2%) 61,2 Hz
Number of tests per test point 4
IED settings
Parameter Set value
Ω
X1FwPPZ1 5,82
R1FwPPZ1 0,51
RFPPZ1 10,00
X1RvPPZ1 5,82
X1FwPEZ1 5,82
R1FwPEZ1 0,51
X0FwPEZ1 23,27
R0FwPEZ1 2,04
RFPE 15,00
X1RvPEZ1 5,82

Requirements
Manufacturer specification: operate time 16 ms typically.
No specification is given for the influence of frequency deviation on the operate time.

Result
The results are for information only.
Version: 1
 -362- 1446-18

6.6.6.1 L1-L2-L3 fault

Fault position Average trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,016 0,015 0,015
50 0,015 0,015 0,015
80 0,022 0,023 0,023
90 0,023 0,023 0,023
95 0,024 0,029 0,032
105 - - -
110 - - -

Fault position Minimum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,014 0,013 0,013
50 0,013 0,013 0,013
80 0,013 0,022 0,022
90 0,022 0,021 0,021
95 0,022 0,024 0,028
105 - - -
110 - - -

Fault position Maximum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,019 0,019 0,018
50 0,018 0,019 0,019
80 0,025 0,025 0,025
90 0,025 0,025 0,026
95 0,027 0,033 0,036
105 - - -
110 - - -
Version: 1
 -363- 1446-18

6.6.6.2 L1-N fault

Fault position Average trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,016 0,015 0,015
50 0,016 0,015 0,015
80 0,016 0,017 0,018
90 0,022 0,024 0,028
95 0,028 0,032 0,038
105 - - -
110 - - -

Fault position Minimum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,014 0,013 0,013
50 0,013 0,013 0,013
80 0,013 0,014 0,014
90 0,015 0,015 0,022
95 0,023 0,023 0,030
105 - - -
110 - - -

Fault position Maximum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,018 0,018 0,018
50 0,018 0,017 0,018
80 0,019 0,023 0,024
90 0,031 0,033 0,033
95 0,033 0,043 0,048
105 - - -
110 - - -
Version: 1
 -364- 1446-18

6.6.6.3 L2-L3 fault

Fault position Average trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,015 0,015 0,015
50 0,015 0,015 0,015
80 0,023 0,024 0,023
90 0,024 0,024 0,026
95 0,026 0,026 0,034
105 - - -
110 - - -

Fault position Minimum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,013 0,014 0,013
50 0,013 0,013 0,013
80 0,022 0,022 0,022
90 0,022 0,022 0,022
95 0,022 0,022 0,024
105 - - -
110 - - -

Fault position Maximum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,016 0,017 0,017
50 0,018 0,017 0,018
80 0,025 0,025 0,026
90 0,029 0,028 0,032
95 0,032 0,033 0,048
105 - - -
110 - - -
Version: 1
 -365- 1446-18

6.6.6.4 L2-L3-N fault

Fault position Average trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,015 0,015 0,015
50 0,015 0,015 0,015
80 0,024 0,024 0,024
90 0,026 0,026 0,027
95 0,028 0,031 0,039
105 - - -
110 - - -

Fault position Minimum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,013 0,013 0,013
50 0,013 0,013 0,013
80 0,021 0,022 0,022
90 0,023 0,021 0,022
95 0,022 0,026 0,029
105 - - -
110 - - -

Fault position Maximum trip time of Δf

58,8 Hz 60,0 Hz 61,2 Hz
% of IED reach s s s
0 0,018 0,018 0,017
50 0,018 0,018 0,018
80 0,026 0,026 0,026
90 0,032 0,032 0,032
95 0,032 0,036 0,047
105 - - -
110 - - -
Version: 1
 -366- 1446-18

6.7 Double infeed tests

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.6.1 and 6.6.2
Test date 21 June to 2 July 2018

Characteristic test data

Source impedance data:
Source S1:
Z1 1 + j30 Ω
Z0 1 + j30 Ω
Source S2:
Z1 1 + j7 Ω
Z0 1 + j21 Ω

Fault Test description Trip Start Remark

no.
ms ms
Tests without pre-fault load
1 Long, S1 – S2, L1-N, 70% 88,4 88,4 -
2 Long, S1 – S2, L1-N, 90% No trip No start -
3 Long, S1 – S2, L1-L2, 70% 26,1 25,6 -
4 Long, S1 – S2, L1-L2, 90% No trip No start -
5 Long, S1 – S2, L1-L2-N, 70% 24,7 24,2 -
6 Long, S1 – S2, L1-L2-N, 90% No trip No start -
7 Long, S1 – S2, L1-L2-L3, -0% No trip No start -
8 Long, S1 – S2, L1-L2-L3, +0% 14,4 13,9 -
9 Long, S2 – S1, L1-N, 70% 85,9 85,4 -
10 Long, S2 – S1, L1-N, 90% No trip No start -
11 Long, S2 – S1, L1-L2, 70% 24,6 24,2 -
12 Long, S2 – S1, L1-L2, 90% No trip No start -
13 Long, S2 – S1, L1-L2-N, 70% 23,6 23,5 -
14 Long, S2 – S1, L1-L2-N, 90% No trip No start -
15 Long, S2 – S1, L1-L2-L3, -0% No trip No start -
16 Long, S2 – S1, L1-L2-L3, +0% 18,4 18,4 -
17 Short, S1 – S2, L1-N, 70% 91,6 91,1 -
18 Short, S1 – S2, L1-N, 90% No trip No start -
19 Short, S1 – S2, L1-L2, 70% 92,3 91,1 -
Version: 1
 -367- 1446-18

Fault Test description Trip Start Remark

no.
ms ms
20 Short, S1 – S2, L1-L2, 90% No trip No start -
21 Short, S1 – S2, L1-L2-N, 70% 91,2 90,8 -
22 Short, S1 – S2, L1-L2-N, 90% No trip No start -
23 Short, S2 – S1, L1-N, 70% 24,0 24,5 -
24 Short, S2 – S1, L1-N, 90% No trip No start -
25 Short, S2 – S1, L1-L2, 70% 26,9 26,4 -
26 Short, S2 – S1, L1-L2, 90% No trip No start -
27 Short, S2 – S1, L1-L2-N, 70% 23,6 23,1 -
28 Short, S2 – S1, L1-L2-N, 90% No trip No start -
Tests with pre-fault load
29 Long, S1 – S2, L1-N, -0% Export No trip No start -
30 Long, S1 – S2, L1-N, +0% Export 14,3 13,9 -
31 Long, S1 – S2, L1-N, 50% Export 86,4 86,4 -
32 Long, S1 – S2, L1-N, 70% Export 88,2 87,8 -
33 Long, S1 – S2, L1-N, 100% Export No trip No start -
34 Long, S1 – S2, L1-L2, -0% Export No trip No start -
35 Long, S1 – S2, L1-L2, +0% Export 15,0 14,6 -
36 Long, S1 – S2, L1-L2, 50% Export 26,2 25,7 -
37 Long, S1 – S2, L1-L2, 70% Export 24,5 24,5 -
38 Long, S1 – S2, L1-L2, 100% Export No trip No start -
39 Long, S1 – S2, L1-L2-L3, -0% Export No trip No start -
40 Long, S1 – S2, L1-L2-L3, +0% Export 14,4 13,9 -
41 Long, S1 – S2, L1-L2-L3, 50% Export 25,5 25,5 -
42 Long, S1 – S2, L1-L2-L3, 70% Export 24,0 23,5 -
43 Long, S1 – S2, L1-L2-L3, 100% Export No trip No start -
44 Short, S1 – S2, L1-N, -0% Export No trip No start -
45 Short, S1 – S2, L1-N, +0% Export 322,8 322,8 -
46 Short, S1 – S2, L1-N, 50% Export 87,0 87,0 -
47 Short, S1 – S2, L1-N, 70% Export 92,8 92,8 -
48 Short, S1 – S2, L1-N, 100% Export No trip No start -
49 Short S1 – S2, L1-L2, -0% Export No trip No start -
50 Short, S1 – S2, L1-L2, +0% Export 25,0 24,5 -
51 Short, S1 – S2, L1-L2, 50% Export 25,6 25,6 -
52 Short S1 – S2, L1-L2, 70% Export 92,7 92,3 -
53 Short, S1 – S2, L1-L2, 100% Export No trip No start -
54 Short S1 – S2, L1-L2-L3, -0% Export No trip No start -
55 Short, S1 – S2, L1-L2-L3, +0% Export 15,9 15,8 -
56 Short, S1 – S2, L1-L2-L3, 50% Export 16,3 15,8 -
57 Short S1 – S2, L1-L2-L3, 70% Export 13,6 13,1 -
58 Short, S1 – S2, L1-L2-L3, 100% Export No trip No start -
59 Long, S1 – S2, L1-N, -0% Import No trip No start -
Version: 1
 -368- 1446-18

Fault Test description Trip Start Remark

no.
ms ms
60 Long, S1 – S2, L1-N, +0% Import 14,0 13,1 -
61 Long, S1 – S2, L1-N, 50% Import 85,0 85,0 -
62 Long, S1 – S2, L1-N, 70% Import 88,5 88,5 -
63 Long, S1 – S2, L1-N, 100% Import No trip No start -
64 Long, S1 – S2, L1-L2, -0% Import No trip No start -
65 Long, S1 – S2, L1-L2, +0% Import 15,0 14,5 -
66 Long, S1 – S2, L1-L2, 50% Import 24,7 24,2 -
67 Long, S1 – S2, L1-L2, 70% Import 71,3 71,2 -
68 Long, S1 – S2, L1-L2, 100% Import No trip No start -
69 Long, S1 – S2, L1-L2-L3, -0% Import No trip No start -
70 Long, S1 – S2, L1-L2-L3, +0% Import 19,4 19,0 -
71 Long, S1 – S2, L1-L2-L3, 50% Import 25,0 24,5 -
72 Long, S1 – S2, L1-L2-L3, 70% Import 24,4 23,9 -
73 Long, S1 – S2, L1-L2-L3, 100% Import No trip No start -
74 Short, S1 – S2, L1-N, -0% Import No trip No start -
75 Short, S1 – S2, L1-N, +0% Import 334,4 334,0 -
76 Short, S1 – S2, L1-N, 50% Import 100,1 99,7 -
77 Short, S1 – S2, L1-N, 70% Import 101,8 101,3 -
78 Short, S1 – S2, L1-N, 100% Import No trip No start -
79 Short S1 – S2, L1-L2, -0% Import No trip No start -
80 Short, S1 – S2, L1-L2, +0% Import 24,7 24,7 -
81 Short, S1 – S2, L1-L2, 50% Import 89,6 89,1 -
82 Short S1 – S2, L1-L2, 70% Import 92,1 92,1 -
83 Short, S1 – S2, L1-L2, 100% Import No trip No start -
84 Short S1 – S2, L1-L2-L3, -0% Import No trip No start -
85 Short, S1 – S2, L1-L2-L3, +0% Import 16,5 16,0 -
86 Short, S1 – S2, L1-L2-L3, 50% Import 13,8 13,8 -
87 Short S1 – S2, L1-L2-L3, 70% Import 19,7 19,2 -
88 Short, S1 – S2, L1-L2-L3, 100% Import No trip No start -
Current reversal
89 S1 – S2, L1-N, +0% (line 2) No trip No start -
Evolving faults, one line affected
90 S1 – S2, L1-N, L1-L2-N, +0% 10 ms 15,0 14,6 -
91 S1 – S2, L1-N, L1-L2-N, +0% 30 ms 16,3 15,8 -
92 S1 – S2, L1-N, L1-L2-N, +0% 200 ms 13,9 13,5 -
93 S1 – S2, L1-N, L1-L2-N, +70% 10 ms 26,3 25,4 -
94 S1 – S2, L1-N, L1-L2-N, +70% 30 ms 25,0 24,6 -
95 S1 – S2, L1-N, L1-L2-L3, +0% 10 ms 13,4 13,4 -
96 S1 – S2, L1-N, L1-L2-L3, +0% 30 ms 15,5 15,4 -
97 S1 – S2, L1-N, L1-L2-L3, +0% 200 ms 13,5 13,0 -
98 S1 – S2, L1-N, L1-L2-L3, +70% 10 ms 29,4 28,9 -
99 S1 – S2, L1-N, L1-L2-L3, +70% 30 ms 25,4 25,4 -
Version: 1
 -369- 1446-18

Evolving faults, both lines affected

Fault Test description Delta time Trip Start Remark
no.
ms ms ms
100 S1 – S2, L1-N(1), L2-N(2), +0% 10 15,3 15,3 -
101 S1 – S2, L1-N(1), L2-N(2), +0% 30 12,8 12,8 -
102 S1 – S2, L1-N(1), L2-N(2), +0% 200 14,9 14,4 -
103 S1 – S2, L1-N(1), L2-N(2), 70% 10 25,6 25,6 -
104 S1 – S2, L1-N(1), L2-N(2), 70% 30 24,7 24,3 -
105 S1 – S2, L1-N(1), L1-L2-L3(2), +0% 10 14,1 14,1 -
106 S1 – S2, L1-N(1), L1-L2-L3(2), +0% 30 14,1 14,1 -
107 S1 – S2, L1-N(2), L2-N(1), +0% 10 24,6 24,6 -
108 S1 – S2, L1-N(2), L2-N(1), +0% 30 25,1 24,7 -
109 S1 – S2, L1-N(2), L2-N(1), +0% 200 26,1 25,6 -
110 S1 – S2, L1-N(2), L2-N(1), 70% 10 31,7 31,2 -
111 S1 – S2, L1-N(2), L2-N(1), 70% 30 29,9 29,4 -
112 S1 – S2, L1-N(2), L1-L2-L3(1), +0% 10 19,0 19,0 -
113 S1 – S2, L1-N(2), L1-L2-L3(1), +0% 30 24,5 24,0 -
114 S1 – S2, L1-N(2), L1-L2-L3(1), +0% 200 24,9 24,9 -
115 S2 - S1, L1-N(1), L2-N(2), +0% 10 14,7 14,2 -
116 S2 – S1, L1N(1), L2-N (2), +0% 30 13,7 13,3 -
117 S2 – S1, L1-N(1), L2-N(2), +0% 200 14,7 15,1 -
118 S2 – S1, L1-N(1), L2-N(2), 70% 10 26,0 26,0 -
119 S2 – S1, L1-N(1), L2-N(2), 70% 30 24,5 24,4 -
120 S2 – S1, L1-N(1), L1-L2-L3(2), +0% 10 14,5 14,5 -
121 S2 – S1, L1-N(1)L1-L2-L3(2), +0% 30 14,2 14,2 -
122 S2 – S1, L1-N(1), L1-L2-L3(2), +0% 200 15,3 15,2 -
123 S2 – S1, L1-N(2),L2-N(1), +0% 10 22,0 22,0 -
124 S2 – S1, L1-N(2), L2-N(1), +0% 30 22,7 22,3 -
125 S2 – S1 , L1-N(2), L2-N(1), +0% 200 23,4 23,0 -
126 S2 – S1, L1-N(2), L2-N(1), 70% 10 32,2 31,8 -
127 S2 – S1, L1-N(2), L2-N(1), 70% 30 32,2 31,2 -
128 S2 – S1, L1-N(2), L1-L2-L3-N(1), 10 24,6 24,6 -
+0%
129 S2 – S1, L1-N(2), L1-L2-L3(1), +0% 30 13,4 12,9 -
130 S2 – S1, L1-N(2), L1-L2-L3(1), +0% 200 23,0 23,0 -

Requirements
As stated by the client.

Result
The test object passed the tests.
Version: 1
 -370- 1446-18

6.8 Distance Protection, ZRWPDIS

6.8.1 Calculation sheets of test points

IED number 7A
Protection function under test ZRWPDIS
Set IBase = CT primary current 1200 A
Set CT secondary current = rated current 5A
Set UBase = VT primary voltage 27,5 kV
Set VT secondary voltage 110 V
IED settings are expressed in Primary values

Test point A
Parameter Value Rationale Rationale
U (V) 33 0,3 x 110 0,3 x Ur
I (A) 10 2x5 2 x Ir
Ztest (Ω) 3,3 - -
Ztest primary (Ω) 3,437 - -

Settings of IED Value

X1Fw 3,32 Ω
RFPEFw 3,44 Ω
Line angle 75 ˚

Test point B
Parameter Value Rationale Rationale
U (V) 100 Limit U to 150 V in all cases
I (A) 1 0,2 x 5 0,2 x Ir (accuracy specification)
Ztest (Ω) 100 - -
Ztest primary (Ω) 104,167 - -

Settings of IED Value

X1Fw 100,62 Ω
RFPEFw 104,17 Ω
Line angle 75 ˚

Test point C
Parameter Value Rationale Rationale
U (V) 11 0,1 x 110 0,1 x Ur (accuracy specification)
I (A) 50 10 x Ir Near 12 x Ir (accuracy specification)
Ztest (Ω) 0,220 - -
Ztest primary (Ω) 0,229 - -

Settings of IED Value

X1Fw 0,221 Ω
RFPEFw 0,229 Ω
Line angle 75 ˚
Version: 1
 -371- 1446-18

6.8.2 Basic characteristic accuracy under steady state conditions

(5 A, 16,7 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.2
Test dates 11 and 12 April 2018

Environmental conditions
Ambient temperature 20,2 °C Relative humidity 55 %

Characteristic test data

Sample IED 7A
Irated 5A
Frated 16,7 Hz
line angle 75,0 o

X1Fw 3,32 Ω
RFPEFw 3,44 Ω
Test current 10,0 A
Zsec. 0,96 Zprim.

Point A
Measured Theoretical Deviation
Agle Test Z R X Z R X Z R X
angle Ω Ω Ω Ω Ω Ω % % %
0 -0,11 3,463 3,463 -0,007 3,440 3,440 0,000 0,7 0,7 -
10 9,75 3,697 3,644 0,626 3,666 3,611 0,637 0,8 0,9 -1,7
20 19,78 4,075 3,834 1,379 4,056 3,812 1,387 0,5 0,6 -0,6
30 29,77 4,714 4,092 2,341 4,699 4,070 2,350 0,3 0,6 -0,4
40 39,68 5,141 3,957 3,282 5,165 3,957 3,320 -0,5 0,0 -1,1
50 49,95 4,330 2,786 3,315 4,334 2,786 3,320 -0,1 0,0 -0,2
60 59,96 3,829 1,917 3,315 3,834 1,917 3,320 -0,1 0,0 -0,2
70 69,97 3,528 1,208 3,315 3,533 1,208 3,320 -0,1 0,0 -0,2
80 79,98 3,366 0,585 3,315 3,371 0,585 3,320 -0,2 0,0 -0,2
90 90,00 3,325 0,000 3,325 3,320 0,000 3,320 0,2 0,0 0,2
Version: 1
 -372- 1446-18

Characteristic test data

Sample IED 7A
Irated 5 A
Frated 16,7 Hz
line angle 75,0 o

X1Fw 100,62 Ω
RFPEFw 104,17 Ω
Test current 1,0 A
Zsec. 0,96 Zprim.

Point B
Measured Theoretical Deviation
Agle Test Z R X Z R X Z R X
angle Ω Ω Ω Ω Ω Ω % % %
0 0,07 103,7 103,7 0,126 104,170 104,170 0,000 -0,5 -0,5 -
10 10,47 109,1 107,3 19,83 111,022 109,336 19,279 -1,7 -1,9 2,9
20 20,66 120,8 113,1 42,64 122,835 115,427 42,012 -1,7 -2,0 1,5
30 30,14 142,0 122,8 71,27 142,299 123,234 71,149 -0,2 -0,4 0,2
40 39,68 155,8 119,9 99,48 156,537 119,914 100,620 -0,5 0,0 -1,1
50 50,32 132,2 84,43 101,8 131,350 84,430 100,620 0,6 0,0 1,2
60 60,28 117,2 58,09 101,8 116,186 58,093 100,620 0,9 0,0 1,2
70 70,09 107,5 36,62 101,1 107,078 36,623 100,620 0,4 0,0 0,5
80 79,98 102,0 17,74 100,5 102,172 17,742 100,620 -0,2 0,0 -0,1
90 90,00 99,48 0,000 99,48 100,620 0,000 100,620 -1,1 0,0 -1,1
Version: 1
 -373- 1446-18

Characteristic test data

Sample IED 7A
Irated 5 A
Frated 16,7 Hz
line angle 75,0 o

X1Fw 0,221 Ω
RFPEFw 0,229 Ω
Test voltage 12,7 V
Zsec. 0,96 Zprim.

Point C
Measured Theoretical Deviation
Agle Test Z R X Z R X Z R X
angle Ω Ω Ω Ω Ω Ω % % %
0 -0,25 0,2330 0,2330 -0,0010 0,229 0,229 0,000 1,7 1,7 -
10 9,48 0,2491 0,2457 0,0410 0,244 0,241 0,042 2,0 2,2 -3,3
20 19,19 0,2758 0,2605 0,0907 0,270 0,254 0,092 2,1 2,6 -1,9
30 28,69 0,3205 0,2811 0,1538 0,313 0,271 0,157 2,4 3,7 -1,7
40 39,12 0,3400 0,2638 0,2146 0,344 0,264 0,221 -1,3 0,0 -3,0
50 49,31 0,2849 0,1857 0,2160 0,289 0,186 0,221 -1,4 0,0 -2,4
60 59,47 0,2516 0,1278 0,2167 0,256 0,128 0,221 -1,6 0,0 -2,1
70 69,79 0,2332 0,0806 0,2189 0,236 0,081 0,221 -1,0 0,0 -1,1
80 79,92 0,2230 0,0390 0,2196 0,225 0,039 0,221 -0,8 0,0 -0,8
90 90,00 0,2210 0,0000 0,2210 0,221 0,000 0,221 -0,2 0,0 -0,2

Requirements
Manufacturer specification: ±5% static accuracy. Conditions: Voltage range (0,1-1,1)xUr, current
range (0,2-12)xIr, at angles 0 degrees and 85 degrees.

Result
The test object passed the tests.
Version: 1
 -374- 1446-18

6.8.3 Basic directional accuracy under steady state conditions

(5 A, 16,7 Hz)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.3
Test dates 12 April 2018

Environmental conditions
Ambient temperature 23,1 °C Relative humidity 45 %

Characteristic test data (second quadrant)

Sample IED 7A
Irated 5A
Frated 16,7
line angle 75,0 ˚
X1Fw 3,32 Ω
RFPEFw 3,44 Ω
ArgNegRes 120,0 degrees
ArgDir 15,0 degrees
Zfault 2,656 Ω
Test current 10,0 A
Step size angle 0,3 degrees
Time / step 165 ms

Second quadrant
Fault Test no. Measured angle Deviation
o o

L-E 1 120,0 0,0

2 120,0 0,0
3 120,0 0,0
4 120,0 0,0
5 120,0 0,0
Version: 1
 -375- 1446-18

Characteristic test data (fourth quadrant)

Sample IED 7A
Irated 5A
Frated 16,7
line angle 75,0 ˚
X1Fw 3,32 Ω
RFPEFw 3,44 Ω
ArgNegRes 120,0 degrees
ArgDir 15,0 degrees
Zfault 2,750 Ω
Test current 10,0 A
Step size angle 0,3 degrees
Time / step 165 ms

Fourth quadrant
Fault Test no. Measured angle Deviation
o o

L-E 1 14,4 -0,6

2 14,4 -0,6
3 14,4 -0,6
4 14,4 -0,6
5 14,4 -0,6

Results
Basic directional accuracy for various fault types.
Fault type edir2 edir4
° °
L-N 0 0,6

Basic directional accuracy eαx.

Basic directional accuracy edir2 0,0
Basic directional accuracy edir4 0,6

Requirements
Manufacturer specification: static angular accuracy ± 3,0 degrees. Conditions: Voltage range (0,1-
1,1)xUr, current range (0,2-12)xIr, at angles 0 degrees and 85 degrees.

Result
The test object passed the tests.
Version: 1
 -376- 1446-18

6.8.4 Acuracy of time delay setting

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.3
Test dates 16 April 2018

Environmental conditions
Ambient temperature 22,4 °C Relative humidity 48 %

Characteristic test data

Sample IED 7A
Irated 5 A
Frated 16,7 Hz
line angle 75,0 ˚
X1Fw 3,32 Ω
RFPEFw 3,44 Ω
ArgNegRes 120,0 degrees
ArgDir 15,0 degrees
tPEZ1 See table
IMinOpPE 15 % IB
ImMinOpPP 15 % IB
TimerSelZ1 Timers separated

Setting tPEZ1 Trip operate

s s
Min. Avg. Max.
0,0 0,039 0,040 0,041
0,3 0,341 0,342 0,344
3,0 3,041 3,043 3,046

Requirements
Manufacturer specification: Definite time delay Ph-E and Ph-Ph operation: ± 0,2% or ± 50 ms,
whichever is greater.

Result
The test object passed the tests.
Version: 1
 -377- 1446-18

6.8.5 Determination of the disengaging time

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-121, subclause 6.2.3
Test dates 16 April 2018

Environmental conditions
Ambient temperature 22,4 °C Relative humidity 48 %

Characteristic test data

Sample IED 7A
Irated 5 A
Frated 16,7 Hz
line angle 75,0 ˚
X1Fw 3,32 Ω
RFPEFw 3,44 Ω
tPEZ1 0,0 s
tPPZ1 0,0 s
IMinOpPE 15 % IB
ImMinOpPP 15 % IB
Test current 10 A

Zfault= 1,719 Ω
Test no Disengaging time
ms
1 40,2
2 41,1
3 41,3
4 41,9
5 41,9

Zfault = 0,859 Ω
Test no Disengaging time
ms
1 40,1
2 39,6
3 41,3
4 42,5
5 42,0
Version: 1
 -378- 1446-18

Zfault = 0,344 Ω
Test no Disengaging time
ms
1 40,2
2 42,3
3 41,5
4 42,3
5 41,2

Requirements
There is no manufacturer specification for the disengaging time. Manufacturer specification for reset
time at 0,2 to 2x Zreach: min. = 50 ms, max = 100 ms.

Result
The results are for information only.
Version: 1
 -379- 1446-18

7 DIFFERENTIAL PROTECTION

7.1 Transformer differential protection, T3WPDIF

7.1.1 General

The Trip and Start signals of the protection function block were connected to a digital output and
measured directly at the respective digital output .
As digital output an IOM output (electromechanical contact) was used. Timing measurements were
also done with a SOM output (static output) used.
Version: 1
 -380- 1446-18

7.2 Static accuracy Idiff> and operating characteristic

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 5 to 7 March 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Operating characteristic, current ±1% of Ir at I≤Ir, ±1% of I at I ≥ Ir
Reset ratio > 90%
Minimum pickup current ±1% of Ir

Result
The object passed the test.
Version: 1
 -381- 1446-18

7.2.1 Intrinsic accuracy default settings

Characteristic test data

Sample IED 2A
Rated current 5 A
Rated frequency 50 Hz
I3 0 A
IED settings:
% of IB A
IdMin 0,2 1
EndSec1 1 5
EndSec2 2 10
SlopeSec2 0,4
SlopeSec3 0,8
Id Unre 8 40

Intrinsic accuracy (L1-N)

L1-N
16

14

12

10
Idiff. (A)

8
Fault L1-N
6 Characteristic

0
0 5 10 15 20 25 30
Istab. (A)
Version: 1
 -382- 1446-18

Trip Reset Reset ratio Error Idiff.

trip
I1 trip I1 reset I2 Istab Idiff Istab Idiff Idiff % (Ir/I)
A A A A A A A
1,002 0,954 0 1,002 1,002 0,954 0,954 0,954 0,04
1,001 0,955 0 1,001 1,001 0,955 0,955 0,955 0,02
1,997 1,950 1 1,997 0,997 1,950 0,950 0,950 -0,06
1,995 1,949 1 1,995 0,995 1,949 0,949 0,949 -0,10
2,996 2,948 2 2,996 0,996 2,948 0,948 0,948 -0,08
2,996 2,949 2 2,996 0,996 2,949 0,949 0,949 -0,08
1,000 1,047 2 2,000 1,000 2,000 0,953 0,953 0,00
1,000 1,047 2 2,000 1,000 2,000 0,953 0,953 0,00
,997 3,950 3 3,997 0,997 3,950 0,950 0,950 -0,06
3,996 3,951 3 3,996 0,996 3,951 0,951 0,951 -0,08
2,002 2,046 3 3,000 0,998 3,000 0,954 0,954 -0,04
2,001 2,046 3 3,000 0,999 3,000 0,954 0,954 -0,02
6,652 6,525 5 6,652 1,652 6,525 1,525 0,947 -0,18
6,653 6,527 5 6,653 1,653 6,527 1,527 0,948 -0,16
3,999 4,043 5 5,000 1,001 5,000 0,957 0,957 0,02
3,998 4,045 5 5,000 1,002 5,000 0,955 0,955 0,04
9,980 9,746 7 9,980 2,980 9,746 2,746 0,948 -0,24
9,980 9,749 7 9,980 2,980 9,749 2,749 0,948 -0,24
5,200 5,286 7 7,000 1,800 7,000 1,714 0,952 0,00
5,200 5,286 7 7,000 1,800 7,000 1,714 0,952 0,00
24,872 21,794 10 24,872 14,872 21,794 11,794 0,948 -0,17
24,870 21,794 10 24,870 14,870 21,794 11,794 0,948 -0,17
6,996 7,142 10 10,000 3,004 10,000 2,858 0,953 0,08
6,997 7,140 10 10,000 3,003 10,000 2,860 0,953 0,06
7,400 7,626 12 12,000 4,600 12,000 4,374 0,951 0,00
7,401 7,626 12 12,000 4,599 12,000 4,374 0,951 -0,02
7,986 8,309 15 15,000 7,014 15,000 6,691 0,956 0,20
7,987 8,306 15 15,000 7,013 15,000 6,694 0,956 0,19
9,002 9,549 20 20,000 10,998 20,000 10,451 0,950 -0,02
9,001 9,549 20 20,000 10,999 20,000 10,451 0,950 -0,01
Version: 1
 -383- 1446-18

Characteristic test data

Sample IED 2A
Rated current 5A
Rated frequency 50 Hz
I3 0A
IED settings:
% of IB A
IdMin 0,2 1
EndSec1 15
EndSec2 2 10
SlopeSec2 0,2
SlopeSec3 0,6
Id Unre 8 40

Intrinsic accuracy (L2-N)

L2-N
14

12

10
Idiff. (A)

L2-N
6
Characteristic
4

0
0 5 10 15 20 25 30
Istab.(A)
Version: 1
 -384- 1446-18

Trip Reset Reset ratio Error Idiff.

trip
I1 trip I1 reset I2 Istab Idiff Istab Idiff Idiff % (Ir/I)
A A A A A A A
1,002 0,957 0 1,002 1,002 0,957 0,957 0,957 0,04
1,004 0,956 0 1,004 1,004 0,956 0,956 0,956 0,08
2,001 1,955 1 2,001 1,001 1,955 0,955 0,955 0,02
2,001 1,956 1 2,001 1,001 1,956 0,956 0,956 0,02
3,002 2,955 2 3,002 1,002 2,955 0,955 0,955 0,04
3,001 2,957 2 3,001 1,001 2,957 0,957 0,957 0,02
1,003 1,049 2 2,000 0,997 2,000 0,951 0,951 -0,06
1,002 1,048 2 2,000 0,998 2,000 0,952 0,952 -0,04
4,003 3,957 3 4,003 1,003 3,957 0,957 0,957 0,06
4,002 3,959 3 4,002 1,002 3,959 0,959 0,959 0,04
2,006 2,051 3 3,000 0,994 3,000 0,949 0,949 -0,12
2,007 2,052 3 3,000 0,993 3,000 0,948 0,948 -0,14
6,436 6,340 5 6,436 1,436 6,340 1,340 0,956 0,10
6,434 6,340 5 6,434 1,434 6,340 1,340 0,956 0,08
4,009 4,055 5 5,000 0,991 5,000 0,945 0,945 -0,18
4,010 4,056 5 5,000 0,990 5,000 0,944 0,944 -0,20
9,292 9,139 7 9,292 2,292 9,139 2,139 0,954 0,09
9,291 9,139 7 9,291 2,291 9,139 2,139 0,954 0,07
5,410 5,486 7 7,000 1,590 7,000 1,514 0,946 -0,20
5,413 5,489 7 7,000 1,587 7,000 1,511 0,944 -0,26
16,239 15,523 10 16,239 6,239 15,523 5,523 0,950 -0,07
16,238 15,525 10 16,238 6,238 15,525 5,525 0,950 -0,08
7,514 7,634 10 10,000 2,486 10,000 2,366 0,946 -0,28
7,515 7,635 10 10,000 2,485 10,000 2,365 0,946 -0,30
21,192 20,140 12 21,192 9,192 20,140 8,140 0,948 -0,25
21,192 20,140 12 21,192 9,192 20,140 8,140 0,948 -0,25
8,312 8,494 12 12,000 3,688 12,000 3,506 0,948 -0,24
8,312 8,494 12 12,000 3,688 12,000 3,506 0,948 -0,24
9,516 9,790 15 15,000 5,484 15,000 5,210 0,947 -0,29
9,517 9,790 15 15,000 5,483 15,000 5,210 0,947 -0,31
11,523 11,944 20 20,000 8,477 20,000 8,056 0,948 -0,27
11,522 11,945 20 20,000 8,478 20,000 8,055 0,948 -0,26
13,527 14,098 25 25,000 11,473 25,000 10,902 0,948 -0,23
13,526 14,098 25 25,000 11,474 25,000 10,902 0,948 -0,23
Version: 1
 -385- 1446-18

Characteristic test data

Sample IED 2A
Rated current 5A
Rated frequency 50 Hz
I3 0A
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 15
EndSec2 2 10
SlopeSec2 0,25
SlopeSec3 0,5
Id Unre 8 40

Intrinsic accuracy (L3-N)

L3-N
12

10

8
Idiff. (A)

6
L3-N
Characteristic
4

0
0 5 10 15 20 25 30
Istab. (A)
Version: 1
 -386- 1446-18

Trip Reset Reset ratio Error Idiff.

trip
I1 trip I1 reset I2 Istab Idiff Istab Idiff Idiff % (Ir/I)
A A A A A A A
1,495 1,432 0 1,495 1,495 1,432 1,432 0,955 -0,10
1,495 1,432 0 1,495 1,495 1,432 1,432 0,955 -0,10
2,493 2,428 1 2,493 1,493 2,428 1,428 0,952 -0,14
2,494 2,430 1 2,494 1,494 2,430 1,430 0,953 -0,12
3,492 3,427 2 3,492 1,492 3,427 1,427 0,951 -0,16
3,492 3,427 2 3,492 1,492 3,427 1,427 0,951 -0,16
0,509 0,574 2 2,000 1,491 2,000 1,426 0,951 -0,18
0,509 0,574 2 2,000 1,491 2,000 1,426 0,951 -0,18
4,491 4,429 3 4,491 1,491 4,429 1,429 0,953 -0,18
4,493 4,429 3 4,493 1,493 4,429 1,429 0,953 -0,14
1,509 1,575 3 3,000 1,491 3,000 1,425 0,950 -0,18
1,508 1,573 3 3,000 1,492 3,000 1,427 0,951 -0,16
6,990 6,871 5 6,990 1,990 6,871 1,871 0,951 -0,15
6,991 6,872 5 6,991 1,991 6,872 1,872 0,951 -0,13
3,504 3,570 5 5,000 1,496 5,000 1,430 0,953 -0,08
3,505 3,570 5 5,000 1,495 5,000 1,430 0,953 -0,10
9,659 9,496 7 9,659 2,659 9,496 2,496 0,951 -0,11
9,655 9,494 7 9,655 2,655 9,494 2,494 0,951 -0,17
5,009 5,095 7 7,000 1,991 7,000 1,905 0,953 -0,18
5,006 5,095 7 7,000 1,994 7,000 1,905 0,953 -0,12
15,480 14,976 10 15,480 5,480 14,976 4,976 0,950 -0,18
15,479 14,982 10 15,479 5,479 14,982 4,982 0,951 -0,19
7,251 7,378 10 10,000 2,749 10,000 2,622 0,953 -0,02
7,251 7,381 10 10,000 2,749 10,000 2,619 0,952 -0,02
19,475 18,783 12 19,475 7,475 18,783 6,783 0,950 -0,17
19,476 18,785 12 19,476 7,476 18,785 6,785 0,950 -0,16
8,250 8,429 12 12,000 3,750 12,000 3,571 0,952 0,00
8,251 8,429 12 12,000 3,749 12,000 3,571 0,952 -0,02
25,446 24,472 15 25,446 10,446 24,472 9,472 0,949 -0,26
25,442 24,470 15 25,442 10,442 24,470 9,470 0,948 -0,28
9,750 10,005 15 15,000 5,250 15,000 4,995 0,951 0,00
9,751 10,003 15 15,000 5,249 15,000 4,997 0,952 -0,02
12,257 12,634 20 20,000 7,743 20,000 7,366 0,950 -0,09
12,259 12,636 20 20,000 7,741 20,000 7,364 0,950 -0,12
Version: 1
 -387- 1446-18

Characteristic test data

Sample IED 2A
Rated current 5A
Rated frequency 50 Hz
I3 0A
IED settings:
% of IB A
IdMin 0,2 1
EndSec1 0,6 3
EndSec2 1,6 8
SlopeSec2 0,25
SlopeSec3 0,5
Id Unre 8 40

Intrinsic accuracy (L1-L2-L3-N)

L1-L2-L3-N
9

6
Idiff. (A)

4 L1-L2-L3-N
Characteristic
3

0
0 5 10 15 20 25
Istab. (A)
Version: 1
 -388- 1446-18

Trip Reset Reset ratio Error Idiff.

trip
I1 trip I1 reset I2 Istab Idiff Istab Idiff Idiff % (Ir/I)
A A A A A A A
0,997 0,957 0 0,997 0,997 0,957 0,957 0,957 -0,06
0,997 0,957 0 0,997 0,997 0,957 0,957 0,957 -0,06
1,990 1,952 1 1,990 0,990 1,952 0,952 0,952 -0,20
1,991 1,953 1 1,991 0,991 1,953 0,953 0,953 -0,18
2,988 2,951 2 2,988 0,988 2,951 0,951 0,951 -0,24
2,989 2,949 2 2,989 0,989 2,949 0,949 0,949 -0,22
1,006 1,045 2 2,000 0,994 2,000 0,955 0,955 -0,12
1,006 1,045 2 2,000 0,994 2,000 0,955 0,955 -0,12
4,317 4,242 3 4,317 1,317 4,242 1,242 0,948 -0,25
4,316 4,244 3 4,316 1,316 4,244 1,244 0,949 -0,26
2,006 2,050 3 3,000 0,994 3,000 0,950 0,950 -0,12
2,006 2,048 3 3,000 0,994 3,000 0,952 0,952 -0,12
6,975 6,861 5 6,975 1,975 6,861 1,861 0,947 -0,38
6,974 6,857 5 6,974 1,974 6,857 1,857 0,945 -0,39
3,510 3,580 5 5,000 1,490 5,000 1,420 0,947 -0,20
3,511 3,580 5 5,000 1,489 5,000 1,420 0,947 -0,22
10,465 10,154 7 10,465 3,465 10,154 3,154 0,948 -0,35
10,467 10,154 7 10,467 3,467 10,154 3,154 0,948 -0,33
5,013 5,111 7 7,000 1,987 7,000 1,889 0,945 -0,26
5,015 5,111 7 7,000 1,985 7,000 1,889 0,945 -0,30
12,481 12,062 8 12,481 4,481 12,062 4,062 0,949 -0,19
12,480 12,067 8 12,480 4,480 12,067 4,067 0,949 -0,20
5,762 5,867 8 8,000 2,238 8,000 2,133 0,948 -0,24
5,759 5,867 8 8,000 2,241 8,000 2,133 0,948 -0,18
16,443 15,843 10 16,443 6,443 15,843 5,843 0,947 -0,44
16,440 15,845 10 16,440 6,440 15,845 5,845 0,947 -0,46
6,767 6,925 10 10,000 3,233 10,000 3,075 0,946 -0,34
6,767 6,926 10 10,000 3,233 10,000 3,074 0,946 -0,34
7,765 7,971 12 12,000 4,235 12,000 4,029 0,948 -0,30
7,764 7,972 12 12,000 4,236 12,000 4,028 0,948 -0,28
9,268 9,553 15 15,000 5,732 15,000 5,447 0,947 -0,31
9,269 9,553 15 15,000 5,731 15,000 5,447 0,947 -0,33
11,772 12,184 20 20,000 8,228 20,000 7,816 0,947 -0,27
11,775 12,182 20 20,000 8,225 20,000 7,818 0,948 -0,30
Version: 1
 -389- 1446-18

7.3 Operating time (IOM ouput)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 27 March, 23, 25 April, 4, 9 July 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
No timing specifications are given for function T3WPDIF operating with BOM or IOM outputs.

Result
The results are for information only.
Version: 1
 -390- 1446-18

7.3.1 Operate time, restrained function, single infeed faults (L2-N)

Characteristic test data
Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 28,7 32,5 36,0 13,4 15,6 17,8
#2 28,1 32,4 35,4 13,4 15,8 18,2
#3 27,2 32,3 36,2 13,3 15,6 17,6
#4 27,7 32,3 35,7 6,8 11,7 18,2

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 11,6 15,2 20,0 15,3 20,3 23,3
#2 9,5 12,4 17,8 21,7 23,5 25,4
#3 8,6 11,3 16,4 20,9 22,9 25,1
#4 8,4 10,8 14,9 13,2 18,3 23,0
Version: 1
 -391- 1446-18

7.3.2 Operate time, restrained function, single infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 31,1 33,6 36,0 7,0 9,2 12,1
#2 31,2 33,4 36,0 6,1 9,1 12,6
#3 31,2 33,5 35,8 6,5 9,1 11,5
#4 31,5 33,5 36,5 6,6 9,1 11,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 11,9 13,5 15,5 18,5 21,0 23,4
#2 9,7 11,3 13,7 21,7 23,4 26,2
#3 8,5 10,3 12,5 21,3 22,9 25,6
#4 8,1 10,0 12,4 19,8 22,2 24,9
Version: 1
 -392- 1446-18

7.3.3 Operate time, restrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 27,7 32,5 37,1 13,4 15,6 18,1
#2 15,4 18,7 22,9 27,1 29,4 31,8
#3 14,9 17,4 21,6 27,2 29,8 32,7
#4 14,8 17,0 21,0 27,5 29,7 32,0

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 10,0 13,1 18,1 21,3 23,1 25,7
#2 8,8 11,3 16,6 22,7 24,5 26,8
#3 8,1 10,4 14,7 22,4 24,2 26,1
#4 8,0 10,1 13,8 21,9 23,9 26,3
Version: 1
 -393- 1446-18

7.3.4 Operate time, restrained function, double infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 31,3 33,6 36,4 6,9 9,2 11,9
#2 15,2 17,0 19,1 18,4 24,7 31,4
#3 14,8 16,8 18,4 19,7 26,1 31,1
#4 14,9 16,5 18,0 16,0 29,2 31,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 10,3 12,1 14,4 21,5 23,1 25,7
#2 8,8 10,4 11,9 22,9 24,4 26,0
#3 8,4 10,3 11,0 22,7 24,3 25,8
#4 8,0 9,9 12,1 22,5 24,0 25,7
Version: 1
 -394- 1446-18

7.3.5 Operate time, unrestrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 28,6 32,0 36,0 14,0 16,0 18,7
#2 16,6 20,4 26,1 20,0 24,9 29,3
#3 15,2 18,3 23,3 26,7 28,9 30,9
#4 14,0 17,1 22,0 27,7 30,0 32,4

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 11,8 15,3 21,2 15,6 20,2 24,4
#2 9,6 12,4 16,5 21,5 23,6 25,6
#3 8,7 11,2 15,5 21,1 23,0 25,8
#4 8,2 10,7 15,2 20,2 22,0 24,1
Version: 1
 -395- 1446-18

7.3.6 Operate time, unrestrained function, single infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 27,4 30,6 35,0 13,1 15,6 18,8
#2 16,6 18,6 20,8 20,9 25,9 28,7
#3 15,1 17,0 19,2 26,2 28,9 31,2
#4 14,3 16,2 18,5 27,7 29,8 31,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 11,5 13,6 16,4 19,1 21,1 24,0
#2 9,4 11,2 13,4 21,5 23,5 25,9
#3 8,6 10,4 12,7 21,2 23,0 25,8
#4 8,1 10,1 12,6 20,0 22,0 24,6
Version: 1
 -396- 1446-18

7.3.7 Operate time, unrestrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,2 22,2 27,7 17,9 20,8 26,6
#2 15,5 18,2 23,0 27,1 29,7 31,5
#3 13,9 16,7 20,8 27,8 30,1 32,6
#4 13,5 16,0 19,5 28,3 30,9 33,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 10,0 13,2 18,6 20,9 23,0 25,5
#2 8,8 11,4 15,8 22,5 24,5 27,0
#3 8,3 10,5 15,5 22,3 24,4 26,5
#4 8,0 10,2 15,0 22,1 23,9 26,3
Version: 1
 -397- 1446-18

7.3.8 Operate time, unrestrained function, double infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5 A
Inception angle start 0 ˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 1 5
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,1 20,1 22,3 17,9 20,4 22,5
#2 14,7 16,7 19,2 27,0 29,5 31,8
#3 13,5 15,8 17,8 27,7 30,0 32,7
#4 18,8 15,3 16,9 28,7 30,7 32,4

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 10,2 11,9 14,5 21,3 23,2 25,4
#2 8,5 10,5 13,2 22,7 24,5 27,2
#3 8,1 9,9 12,2 22,6 24,2 26,7
#4 7,8 9,4 11,2 22,2 23,7 25,3
Version: 1
 -398- 1446-18

7.4 Operating time (SOM ouput)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 25 July 2018

Environmental conditions
Ambient temperature 22,7 °C

Requirements
Parameter Specification
Operate time, restrained, 0 to 10x IdMin. Min. 25 ms
Max. 35 ms
Reset time, restrained, 10x IdMin. to 0 Min. 5 ms
Max. 15 ms
Operate time, unrestrained, 0 to 10x IdUnre Min. 5 ms
Max. 15 ms
Reset time, unrestrained, 10x IdUnre to 0 Min. 15 ms
Max. 35 ms

Result
The object passed the tests.
Version: 1
 -399- 1446-18

7.4.1 Operate time, restrained function, single infeed faults (L2-N)

Characteristic test data
Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 23,2 26,9 30,0 16,5 18,8 21,3
#2 22,8 26,7 30,7 16,5 18,9 20,9
#3 22,3 26,7 30,9 16,2 18,8 21,2
#4 23,2 26,8 30,5 16,5 18,9 21,0

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 7,0 10,6 16,6 18,9 23,4 26,4
#2 5,1 7,7 12,4 24,6 26,5 28,9
#3 4,2 6,6 11,2 24,3 26,1 28,3
#4 3,7 6,0 10,6 23,3 25,1 27,6
Version: 1
 -400- 1446-18

7.4.2 Operate time, restrained function, single infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 26,0 28,1 30,7 10,0 12,5 15,0
#2 26,0 28,1 30,8 9,6 12,5 15,4
#3 26,1 28,1 30,5 9,8 12,5 15,2
#4 25,7 28,0 30,7 10,0 12,4 14,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 7,0 8,8 11,2 21,7 24,0 26,8
#2 5,0 6,6 9,6 24,9 26,8 29,3
#3 4,1 5,8 8,1 24,5 26,3 29,0
#4 3,7 5,4 7,7 23,2 25,2 27,3
Version: 1
 -401- 1446-18

7.4.3 Operate time, restrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 22,1 26,8 30,2 16,3 18,8 21,2
#2 10,1 13,2 18,2 30,1 32,7 34,5
#3 9,5 11,9 16,0 30,7 33,1 34,7
#4 9,3 12,0 15,0 30,4 32,8 35,1

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 5,6 8,6 13,8 24,6 26,2 28,2
#2 4,2 6,7 10,9 25,8 27,5 30,0
#3 3,8 5,8 9,6 25,9 27,5 29,8
#4 3,3 5,5 9,0 25,4 27,0 29,6
Version: 1
 -402- 1446-18

7.4.4 Operate time, restrained function, double infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 26,0 28,1 30,9 9,9 12,4 15,7
#2 9,6 11,4 13,5 21,8 29,2 34,6
#3 9,2 10,9 13,3 23,0 33,0 35,7
#4 9,0 10,6 12,5 30,8 32,8 34,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 5,5 7,2 9,4 24,7 26,4 28,4
#2 4,2 5,8 8,6 26,1 27,6 29,6
#3 3,6 5,4 7,7 25,8 27,4 29,9
#4 3,5 5,2 6,9 25,5 27,2 28,7
Version: 1
 -403- 1446-18

7.4.5 Operate time, unrestrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 22,6 26,5 30,8 16,8 19,2 22,1
#2 11,4 14,8 21,6 23,2 28,0 32,2
#3 9,7 12,7 17,5 29,4 31,9 34,2
#4 8,8 12,0 16,4 30,7 33,2 35,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 7,3 10,6 16,5 18,8 23,4 26,6
#2 5,0 7,5 12,5 24,6 26,7 29,1
#3 4,1 6,5 11,9 24,3 26,2 28,6
#4 3,8 6,2 10,3 23,2 25,2 27,7
Version: 1
 -404- 1446-18

7.4.6 Operate time, unrestrained function, single infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 5,000
#2 15,000 0,000 0,000 15,000 15,000
#3 30,000 0,000 0,000 30,000 30,000
#4 50,000 0,000 0,000 50,000 50,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 19,3 24,5 28,2 17,0 19,0 21,7
#2 11,2 12,9 15,4 23,6 29,2 32,4
#3 9,7 11,3 13,5 30,2 32,3 34,5
#4 8,8 10,5 12,2 30,9 33,1 34,8

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 7,1 8,7 11,1 22,0 24,3 26,9
#2 4,9 6,6 9,0 25,1 26,9 29,4
#3 4,1 5,7 8,0 24,5 26,3 28,8
#4 3,8 5,4 6,9 23,2 25,1 27,9
Version: 1
 -405- 1446-18

7.4.7 Operate time, unrestrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,8 16,9 21,5 21,1 23,9 29,5
#2 9,7 12,7 17,2 30,6 32,6 34,8
#3 8,8 11,3 15,8 31,0 33,4 35,7
#4 8,2 11,0 14,1 31,6 34,1 36,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 5,7 8,5 13,6 24,6 26,3 29,1
#2 4,2 6,6 11,2 26,0 27,7 30,4
#3 3,7 5,9 10,0 25,6 27,5 29,9
#4 3,4 5,4 9,0 25,4 27,1 29,3
Version: 1
 -406- 1446-18

7.4.8 Operate time, unrestrained function, double infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5 A
Inception angle start 0 ˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 1 5
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Settings
Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 10,000
#2 15,000 15,000 0,000 15,000 30,000
#3 30,000 30,000 0,000 30,000 60,000
#4 50,000 50,000 0,000 50,000 100,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,8 14,6 17,0 21,3 23,8 26,3
#2 9,6 11,2 13,9 30,4 32,7 34,9
#3 8,7 10,4 12,7 30,9 33,4 35,7
#4 8,1 9,9 12,0 31,5 33,9 35,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 5,5 7,3 9,7 24,7 26,5 28,8
#2 4,1 5,8 7,8 26,1 27,9 30,4
#3 3,4 5,3 7,5 25,7 27,6 30,1
#4 3,4 4,8 7,2 25,3 27,1 28,9
Version: 1
 -407- 1446-18

7.5 Stability for external faults

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 25, 26 and 30 July 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
Stability during a situation with through-current: no trip, no start

Result
The object passed the test.
Version: 1
 -408- 1446-18

7.5.1 Stability for external faults, restrained function (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Stability for external faults for network time constant 300 ms

Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 0,000
#2 15,000 15,000 0,000 15,000 0,000
#3 30,000 30,000 0,000 30,000 0,000
#4 50,000 50,000 0,000 50,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
Version: 1
 -409- 1446-18

7.5.2 Stability for external faults, restrained function (L1-L2-L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 100
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Stability for external faults for network time constant 300 ms

Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 0,000
#2 15,000 0,000 0,000 15,000 0,000
#3 30,000 0,000 0,000 30,000 0,000
#4 50,000 0,000 0,000 50,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
Version: 1
 -410- 1446-18

7.5.3 Stability for external faults, unrestrained function (L2-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Stability for external faults for network time constant 300 ms

Test point I1 I2 I3 Istab Idiff
#1 5,000 5,000 0,000 5,000 0,000
#2 15,000 15,000 0,000 15,000 0,000
#3 30,000 30,000 0,000 30,000 0,000
#4 50,000 50,000 0,000 50,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
Version: 1
 -411- 1446-18

7.5.4 Stability for external faults, unrestrained function (L1-L2-L3-N)

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 1,5
EndSec1 1,25 6,25
EndSec2 3 15
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 15
CrossBlockEn On
NegSeqDiffEn On
OpenCTEnable Off
SOTF mode On

Stability for external faults for network time constant 300 ms

Test point I1 I2 I3 Istab Idiff
#1 5,000 0,000 0,000 5,000 0,000
#2 15,000 0,000 0,000 15,000 0,000
#3 30,000 0,000 0,000 30,000 0,000
#4 50,000 0,000 0,000 50,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
Version: 1
 -412- 1446-18

7.6 Static accuracy harmonic blocking function

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 12 March 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Function Accuracy
Second harmonic blocking ± 1% of Ir (fundamental magnitude 100% of Ir)
Fifth harmonic blocking ± 5% of Ir (fundamental magnitude 100% of Ir)

Result
The object passed the test.
Version: 1
 -413- 1446-18

7.6.1 Static accuracy harmonic restraint, 2nd harmonic

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Fault type L1-L2-L3-N
I1 0A
I2 5A
IED settings:
% of IB A
IdMin 0,4 2
EndSec1 15
EndSec2 2 10
SlopeSec2 30 %
SlopeSec3 60 %
Id Unre 8 40
I2/I1 ratio 15 %
I5/I1 ratio 25 %

Harmonic angle Harmonic content increasing, Harmonic content decreasing,

o trip stable off trip stable on
% %
0 15,1 14,8
45 15,1 14,7
90 15,1 14,7
135 15,1 14,7
180 15,2 14,9

Note
Start contact was always on.
Version: 1
 -414- 1446-18

7.6.2 Static accuracy harmonic restraint, 5th harmonic

Characteristic test data

Sample IED 2A
Rated frequency 50 Hz
Rated current 5A
Fault type L1-L2-L3-N
I1 0A
I2 5A
IED settings:
% of IB A
IdMin 0,4 2
EndSec1 15
EndSec2 2 10
SlopeSec2 30 %
SlopeSec3 60 %
Id Unre 8 40
I2/I1 ratio 15 %
I5/I1 ratio 25 %

Harmonic angle Harmonic content increasing, Harmonic content decreasing,

o trip stable off trip stable on
% %
0 25,8 25,6
45 25,8 25,6
90 25,8 25,6
135 25,9 25,6
180 25,9 25,7

Note
Start contact was always on.
Version: 1
 -415- 1446-18

7.7 Line differential protection, L3CPDIF

7.7.1 General

The Trip and Start signals of the protection function block were connected to a digital output and
measured directly at the respective digital output.
As digital output an IOM output (electromechanical contact) was used. Timing measurements were
also done with a SOM output (static output) used.
Version: 1
 -416- 1446-18

7.8 Static accuracy Idiff> and operating characteristic

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 13 March 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Operating characteristic, current ±4% of Ir at I≤Ir, ±4% of I at I ≥ Ir

Result
The object passed the test.
Version: 1
 -417- 1446-18

7.8.1 Intrinsic accuracy default settings (50 Hz)

Characteristic test data

Sample IED 3A and 3B
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,5 1,5
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 20

Intrinsic accuracy (L1-N)

L1-N
3,0

2,5

2,0
Idiff. (A)

1,5 IED 3A
IED 3B
1,0 Characteristic

0,5

0,0
0 1 2 3 4 5 6
Istab. (A)
Version: 1
 -418- 1446-18

IED 3A
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,300 0,284 0,300 0,300 0,284 0,284 0,947 0,0
0,000 0,300 0,284 0,300 0,300 0,284 0,284 0,947 0,0
1,000 0,703 0,706 1,000 0,297 1,000 0,294 0,990 -0,3
1,000 0,691 0,705 1,000 0,309 1,000 0,295 0,955 0,9
1,000 1,285 1,264 1,285 0,285 1,264 0,264 0,926 -1,5
1,000 1,280 1,276 1,280 0,280 1,276 0,276 0,986 -2,0
2,000 1,486 1,509 2,000 0,514 2,000 0,491 0,955 1,4
2,000 1,484 1,505 2,000 0,516 2,000 0,495 0,959 1,6
2,000 2,796 2,766 2,796 0,796 2,766 0,766 0,962 -2,2
2,000 2,794 2,766 2,794 0,794 2,766 0,766 0,965 -2,4
3,000 2,081 2,101 3,000 0,919 3,000 0,899 0,978 1,9
3,000 2,083 2,121 3,000 0,917 3,000 0,879 0,959 1,7
4,000 2,286 2,365 4,000 1,714 4,000 1,635 0,954 0,8
4,000 2,280 2,365 4,000 1,720 4,000 1,635 0,951 1,2
5,000 2,493 2,605 5,000 2,507 5,000 2,395 0,955 0,3
5,000 2,486 2,604 5,000 2,514 5,000 2,396 0,953 0,6

IED 3B
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,301 0,287 0,301 0,301 0,287 0,287 0,953 0,1
0,000 0,300 0,287 0,300 0,300 0,287 0,287 0,957 0
1,000 0,705 0,716 1,000 0,295 1,000 0,284 0,963 -0,5
1,000 0,707 0,725 1,000 0,293 1,000 0,275 0,939 -0,7
1,000 1,313 1,305 1,313 0,313 1,305 0,305 0,974 1,3
1,000 1,311 1,307 1,311 0,311 1,307 0,307 0,987 1,1
2,000 1,523 1,544 2,000 0,477 2,000 0,456 0,956 -2,3
2,000 1,528 1,532 2,000 0,472 2,000 0,468 0,992 -2,8
2,000 2,817 2,799 2,817 0,817 2,799 0,799 0,978 -1,0
2,000 2,820 2,778 2,820 0,820 2,778 0,778 0,949 -0,8
3,000 2,128 2,153 3,000 0,872 3,000 0,847 0,971 -2,8
3,000 2,126 2,152 3,000 0,874 3,000 0,848 0,970 -2,6
4,000 2,329 2,391 4,000 1,671 4,000 1,609 0,963 -1,7
4,000 2,340 2,401 4,000 1,660 4,000 1,599 0,963 -2,4
5,000 2,512 2,613 5,000 2,488 5,000 2,387 0,959 -0,5
5,000 2,516 2,630 5,000 2,484 5,000 2,370 0,954 -0,6
Version: 1
 -419- 1446-18

Sample IED 3A and 3B

Rated frequency 50
Rated current 1
IED settings:
% of IB
IdMin 0,4
EndSec1 1,5
EndSec2 4
SlopeSec2 25
SlopeSec3 50
Id Unre 20

Intrinsic accuracy (L2-N)

3,0
L2-N

2,5

2,0
Idiff. (A)

1,5 IED 3A
IED 3B
Characteristic
1,0

0,5

0,0
0 2 4 6 8
Istab. (A)
Version: 1
 -420- 1446-18

IED 3A
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
%(Ir/I)
0,000 0,400 0,380 0,400 0,400 0,380 0,380 0,950 0,0
0,000 0,400 0,380 0,400 0,400 0,380 0,380 0,950 0,0
1,000 1,389 1,377 1,389 0,389 1,377 0,377 0,969 -1,1
1,000 1,387 1,365 1,387 0,387 1,365 0,365 0,943 -1,3
1,000 0,598 0,606 1,000 0,402 1,000 0,394 0,980 0,2
1,000 0,604 0,610 1,000 0,396 1,000 0,390 0,985 -0,4
2,000 1,473 1,485 2,000 0,527 2,000 0,515 0,977 0,2
2,000 1,467 1,487 2,000 0,533 2,000 0,513 0,962 0,8
2,000 2,659 2,638 2,659 0,659 2,638 0,638 0,968 -3,1
2,000 2,657 2,635 2,657 0,657 2,635 0,635 0,967 -3,2
3,000 2,236 2,244 3,000 0,764 3,000 0,756 0,990 -1,1
3,000 2,229 2,243 3,000 0,771 3,000 0,757 0,982 -0,4
4,000 3,981 3,944 3,981 0,981 3,944 0,944 0,962 -3,8
4,000 3,965 3,929 3,965 0,965 3,929 0,929 0,963 -5,0
5,000 2,973 2,977 4,000 1,027 4,000 1,023 0,996 0,2
5,000 2,975 2,987 4,000 1,025 4,000 1,013 0,988 0,0
5,000 3,464 3,524 5,000 1,536 5,000 1,476 0,961 0,7
5,000 3,461 3,509 5,000 1,539 5,000 1,491 0,969 0,9

IED 3B
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,407 0,389 0,407 0,407 0,389 0,389 0,956 0,7
0,000 0,408 0,389 0,408 0,408 0,389 0,389 0,953 0,8
1,000 1,412 1,397 1,412 0,412 1,397 0,397 0,964 1,2
1,000 1,406 1,401 1,406 0,406 1,401 0,401 0,988 0,6
1,000 0,609 0,623 1,000 0,391 1,000 0,377 0,964 -0,9
1,000 0,607 0,620 1,000 0,393 1,000 0,380 0,967 -0,7
2,000 1,493 1,511 2,000 0,507 2,000 0,489 0,964 -1,8
2,000 1,496 1,518 2,000 0,504 2,000 0,482 0,956 -2,1
2,000 2,715 2,696 2,715 0,715 2,696 0,696 0,973 1,1
2,000 2,724 2,699 2,724 0,724 2,699 0,699 0,965 1,8
3,000 2,244 2,264 3,000 0,756 3,000 0,736 0,974 -1,9
3,000 2,241 2,274 3,000 0,759 3,000 0,726 0,957 -1,6
4,000 4,063 4,021 4,063 1,063 4,021 1,021 0,960 0,6
4,000 4,079 4,049 4,079 1,079 4,049 1,049 0,972 1,4
5,000 3,018 3,054 4,000 0,982 4,000 0,946 0,963 -4,2
5,000 3,023 3,041 4,000 0,977 4,000 0,959 0,982 -4,7
5,000 3,542 3,557 5,000 1,458 5,000 1,443 0,990 -4,4
5,000 3,513 3,564 5,000 1,487 5,000 1,436 0,966 -2,5
Version: 1
 -421- 1446-18

Characteristic test data

Sample IED 3A and 3B
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,2 0,2
EndSec1 11
EndSec2 22
SlopeSec2 30 %
SlopeSec3 60 %
Id Unre 20 20

Intrinsic accuracy (L3-N)

L3-N
4,0

3,5

3,0

2,5
Idiff. (A)

2,0 IED 3A
IED 3B
1,5
Characteristic
1,0

0,5

0,0
0 2 4 6 8
I stab. (A)
Version: 1
 -422- 1446-18

IED 3A
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,200 0,190 0,200 0,200 0,190 0,190 0,950 0,0
0,000 0,201 0,190 0,201 0,201 0,190 0,190 0,945 0,1
1,000 0,799 0,802 1,000 0,201 1,000 0,198 0,985 0,1
1,000 0,794 0,807 1,000 0,206 1,000 0,193 0,937 0,6
1,000 1,278 1,273 1,278 0,278 1,273 0,273 0,982 -0,5
1,000 1,273 1,263 1,273 0,273 1,263 0,263 0,963 -0,9
2,000 1,493 1,506 2,000 0,507 2,000 0,494 0,974 0,7
2,000 1,500 1,516 2,000 0,500 2,000 0,484 0,968 0,0
2,000 1,503 1,512 2,000 0,497 2,000 0,488 0,982 -0,3
2,000 1,499 1,517 2,000 0,501 2,000 0,483 0,964 0,1
2,000 1,490 1,506 2,000 0,510 2,000 0,494 0,969 1,0
2,000 1,533 1,548 2,000 0,467 2,000 0,452 0,968 -3,3
2,000 1,531 1,538 2,000 0,469 2,000 0,462 0,985 -3,1
2,000 1,521 1,541 2,000 0,479 2,000 0,459 0,958 -2,1
2,000 1,523 1,539 2,000 0,477 2,000 0,461 0,966 -2,3
2,000 3,150 3,088 3,150 1,150 3,088 1,088 0,946 -3,4
2,000 3,160 3,096 3,160 1,160 3,096 1,096 0,945 -3,0
3,000 1,903 1,939 3,000 1,097 3,000 1,061 0,967 -0,3
3,000 1,899 1,935 3,000 1,101 3,000 1,065 0,967 0,1
3,000 5,587 5,395 5,587 2,587 5,395 2,395 0,926 -2,5
3,000 5,605 5,395 5,605 2,605 5,395 2,395 0,919 -2,2
4,000 2,287 2,362 4,000 1,713 4,000 1,638 0,956 0,8
4,000 2,290 2,371 4,000 1,710 4,000 1,629 0,953 0,6
5,000 2,694 2,790 5,000 2,306 5,000 2,210 0,958 0,3
5,000 2,678 2,774 5,000 2,322 5,000 2,226 0,959 1,0
Version: 1
 -423- 1446-18

IED 3B
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,203 0,195 0,203 0,203 0,195 0,195 0,961 0,3
0,000 0,202 0,195 0,202 0,202 0,195 0,195 0,965 0,2
1,000 0,810 0,816 1,000 0,190 1,000 0,184 0,968 -1,0
1,000 0,806 0,814 1,000 0,194 1,000 0,186 0,959 -0,6
1,000 1,298 1,285 1,298 0,298 1,285 0,285 0,956 0,9
1,000 1,302 1,284 1,302 0,302 1,284 0,284 0,940 1,1
2,000 1,528 1,529 2,000 0,472 2,000 0,471 0,998 -2,8
2,000 1,515 1,516 2,000 0,485 2,000 0,484 0,998 -1,5
2,000 1,512 1,524 2,000 0,488 2,000 0,476 0,975 -1,2
2,000 1,512 1,529 2,000 0,488 2,000 0,471 0,965 -1,2
2,000 1,522 1,540 2,000 0,478 2,000 0,460 0,962 -2,2
2,000 1,487 1,491 2,000 0,513 2,000 0,509 0,992 1,3
2,000 1,487 1,500 2,000 0,513 2,000 0,500 0,975 1,3
2,000 1,488 1,493 2,000 0,512 2,000 0,507 0,990 1,2
2,000 1,489 1,497 2,000 0,511 2,000 0,503 0,984 1,1
2,000 3,256 3,195 3,256 1,256 3,195 1,195 0,951 0,2
2,000 3,264 3,159 3,264 1,264 3,159 1,159 0,917 0,4
3,000 1,917 1,968 3,000 1,083 3,000 1,032 0,953 -1,5
3,000 1,918 1,961 3,000 1,082 3,000 1,039 0,960 -1,6
3,000 5,780 5,543 5,780 2,780 5,543 2,543 0,915 0,4
3,000 5,786 5,551 5,786 2,786 5,551 2,551 0,916 0,5
4,000 2,330 2,395 4,000 1,670 4,000 1,605 0,961 -1,8
4,000 2,331 2,388 4,000 1,669 4,000 1,612 0,966 -1,8
5,000 2,718 2,804 5,000 2,282 5,000 2,196 0,962 -0,8
5,000 2,731 2,842 5,000 2,269 5,000 2,158 0,951 -1,3
Version: 1
 -424- 1446-18

7.9 Operating time (IOM output)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 18 and 19 July 2018

Environmental conditions
Ambient temperature 20-24 °C

Requirements
No timing specifications are given for function L3CPDIF operating with BOM or IOM outputs.

Result
The results are for information only.
Version: 1
 -425- 1446-18

7.9.1 Operate time, restrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1 A
Inception angle start 0 ˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 3 3
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 40 40
NegSeqDiffEn On
CrossBlockEn No
ChargCurEnable Off
AddDelay Off
OpenCTEnable On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 3,000 0,000 3,000 3,000
#4 5,000 0,000 5,000 5,000
#5 10,000 0,000 10,000 10,000
#6 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 37,9 43,4 47,8 19,0 23,1 27,2
#2 27,6 33,4 39,4 32,3 35,7 40,8
#3 26,0 31,1 37,6 27,5 34,9 40,6
#4 24,3 29,0 36,3 25,5 29,9 37,4
#5 22,2 27,2 33,4 23,7 27,5 32,0
#6 20,7 25,1 30,3 22,8 26,3 30,9
Version: 1
 -426- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 19,0 23,7 30,2 22,2 28,5 32,7
#2 17,1 21,8 28,4 26,4 30,0 33,7
#3 16,9 21,1 27,5 22,4 28,9 33,4
#4 16,2 20,3 25,4 19,8 24,2 31,1
#5 15,3 19,4 25,3 18,4 21,9 25,2
#6 14,3 18,1 22,7 17,2 20,4 24,0

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 38,6 43,2 47,6 19,2 23,0 26,6
#2 27,2 32,9 39,8 30,8 35,3 40,4
#3 25,1 30,5 37,7 27,7 34,3 40,0
#4 23,3 28,5 35,1 24,3 29,4 37,9
#5 23,2 27,0 32,8 23,5 27,3 31,4
#6 21,9 26,3 32,7 23,4 27,2 32,2

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,6 23,7 29,7 22,4 28,5 33,4
#2 17,0 21,5 27,5 26,2 29,6 33,4
#3 16,1 20,5 26,5 22,2 28,5 33,8
#4 15,6 19,9 24,8 19,3 23,7 30,4
#5 15,1 19,2 26,1 18,7 21,8 25,4
#6 14,9 19,2 24,2 18,0 21,7 25,0
Version: 1
 -427- 1446-18

7.9.2 Operate time, restrained function, single infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Tim 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 3,000 0,000 3,000 3,000
#4 5,000 0,000 5,000 5,000
#5 10,000 0,000 10,000 10,000
#6 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 37,0 42,0 47,2 20,0 23,6 28,3
#2 26,1 30,0 33,7 31,1 35,8 40,9
#3 25,0 28,5 32,8 31,1 35,6 39,9
#4 23,2 26,7 30,6 24,5 29,5 38,7
#5 22,0 25,5 29,2 23,5 27,5 32,1
#6 21,6 24,8 28,5 23,0 27,0 31,3
Version: 1
 -428- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,4 22,1 25,7 26,1 29,7 33,7
#2 16,3 19,7 23,8 25,7 29,7 33,5
#3 15,5 19,4 23,4 25,0 29,0 32,9
#4 15,2 18,9 22,4 19,0 23,7 31,4
#5 14,5 18,4 21,7 18,2 21,5 24,8
#6 14,6 18,1 21,5 17,4 20,9 24,3

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 37,8 41,8 46,1 19,1 23,0 27,1
#2 27,1 31,1 35,3 31,8 36,8 41,9
#3 26,0 29,3 32,8 31,6 36,3 41,2
#4 23,9 27,5 31,4 25,7 30,5 38,2
#5 22,3 26,0 29,4 23,7 28,1 33,5
#6 21,6 25,1 28,4 23,4 27,5 33,0

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,6 21,8 25,6 25,9 29,3 33,2
#2 17,6 20,9 24,9 27,4 30,9 34,4
#3 16,9 20,4 23,8 26,1 30,4 34,9
#4 15,8 19,6 22,8 20,5 24,5 32,2
#5 15,4 18,9 22,1 19,0 22,3 25,5
#6 14,5 18,5 22,0 18,0 21,5 24,9
Version: 1
 -429- 1446-18

7.9.3 Operate time, restrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 40 40
NegSeqDiffEn On
CrossBlockEn No
ChargCurEnable Off
AddDelay Off
OpenCTEnable On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 22,4 27,8 33,5 25,3 30,3 35,6
#2 21,3 25,7 32,5 33,4 37,8 41,5
#3 19,6 23,7 29,9 32,2 35,7 40,7
#4 18,6 22,8 27,7 31,4 34,9 40,2
#5 18,9 23,4 27,8 31,9 35,4 41,1
Version: 1
 -430- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,6 21,6 27,6 27,8 31,5 35,0
#2 15,5 19,6 26,4 28,0 31,1 34,7
#3 15,2 18,5 24,6 26,6 30,0 33,9
#4 14,2 18,0 22,1 25,9 29,4 33,3
#5 14,2 18,5 23,1 26,4 29,7 33,1

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 22,9 27,6 34,3 25,2 30,4 36,8
#2 22,4 26,6 32,3 33,8 38,5 43,4
#3 20,3 24,5 29,5 32,5 36,6 42,4
#4 20,0 24,0 28,1 32,3 35,7 40,0
#5 19,0 22,7 27,7 30,8 34,7 40,0

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,1 21,8 28,5 28,3 31,7 35,2
#2 16,4 20,8 27,9 28,9 32,4 35,5
#3 15,6 19,8 25,4 27,1 31,1 34,5
#4 15,5 19,2 24,1 27,4 30,6 33,8
#5 14,2 18,2 23,0 26,1 29,5 33,5
Version: 1
 -431- 1446-18

7.9.4 Operate time, restrained function, double infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Tim 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 3,000 3,000 3,000 10,000
#4 5,000 5,000 5,000 20,000
#5 10,000 10,000 10,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 21,6 24,8 28,8 24,2 29,9 37,8
#2 20,4 23,9 27,3 33,3 37,5 41,7
#3 20,2 23,2 26,7 32,5 37,1 43,2
#4 19,4 23,0 25,9 32,0 36,2 40,8
#5 19,2 22,7 26,0 31,3 35,8 41,3
Version: 1
 -432- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,8 20,0 23,9 27,6 30,9 34,9
#2 15,0 18,7 22,3 28,3 31,3 35,1
#3 15,2 18,8 22,7 27,5 31,0 34,7
#4 15,1 18,4 21,9 26,8 30,2 33,6
#5 14,5 17,8 21,4 26,4 29,8 33,5

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 22,2 25,8 29,2 25,0 30,9 39,2
#2 21,6 25,1 28,2 34,5 38,4 45,1
#3 19,2 22,8 26,0 32,3 36,6 42,7
#4 19,2 22,4 26,4 32,1 35,8 40,7
#5 19,2 22,8 26,3 31,4 35,5 40,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,4 21,0 24,4 28,9 32,2 35,7
#2 16,7 20,0 23,2 29,2 32,7 36,0
#3 14,9 18,5 22,4 26,6 30,7 34,2
#4 14,8 18,1 21,5 26,3 30,1 33,6
#5 14,6 18,1 21,5 26,4 29,9 33,5
Version: 1
 -433- 1446-18

7.9.5 Operate time, unrestrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 11
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 29,5 37,9 46,1 20,2 24,7 30,5
#2 20,9 27,0 33,7 31,7 35,8 40,5
#3 18,4 23,1 28,7 32,3 36,2 40,0
#4 16,7 21,4 27,9 33,6 37,8 41,7
#5 16,0 20,3 25,7 34,8 38,7 44,6
Version: 1
 -434- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,8 23,9 30,1 23,1 28,7 33,0
#2 17,4 21,6 27,7 26,0 29,8 33,5
#3 15,6 19,9 25,7 26,7 30,3 34,4
#4 14,9 18,9 25,8 28,6 32,0 35,9
#5 14,2 18,1 22,9 29,4 32,9 36,9

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 27,4 38,2 46,4 19,2 24,0 28,7
#2 21,1 26,6 33,1 31,4 35,7 41,4
#3 18,6 23,7 29,6 32,8 36,8 41,7
#4 18,1 22,1 28,9 34,5 38,6 44,2
#5 16,9 21,1 26,9 35,2 39,7 45,3

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,6 23,5 31,2 22,4 28,3 33,1
#2 16,9 21,7 27,6 26,2 29,9 34,3
#3 16,3 20,5 26,7 27,5 31,2 35,1
#4 15,9 19,8 25,8 29,6 33,0 36,3
#5 15,2 19,3 24,3 30,4 34,1 37,2
Version: 1
 -435- 1446-18

7.9.6 Operate time, unrestrained function, single infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 11
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 26,1 32,5 39,3 19,4 23,6 28,8
#2 21,4 24,5 27,7 31,4 36,1 41,7
#3 18,5 22,1 25,6 33,1 37,0 42,3
#4 17,4 21,0 24,4 34,6 38,3 44,0
#5 15,8 20,0 23,9 34,6 39,1 44,9
Version: 1
 -436- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,0 21,4 25,2 25,0 28,9 32,7
#2 16,8 20,0 23,7 26,2 30,0 33,8
#3 15,7 19,3 22,6 27,1 31,0 34,5
#4 15,3 18,7 22,1 28,8 32,4 36,1
#5 14,6 18,3 21,6 29,7 33,2 36,7

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 27,4 34,3 40,4 19,7 24,4 30,3
#2 20,9 24,5 28,4 31,9 36,2 42,3
#3 18,1 21,5 25,4 32,3 36,5 42,7
#4 17,1 20,5 24,5 34,4 38,2 44,8
#5 16,0 19,9 23,7 35,1 39,4 44,6

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,9 22,2 25,6 25,7 29,6 33,4
#2 17,2 20,5 23,9 26,8 30,4 33,9
#3 15,5 19,0 22,9 26,9 30,7 34,6
#4 14,7 18,5 22,2 29,1 32,5 36,1
#5 14,6 18,4 22,0 30,2 33,3 37,1
Version: 1
 -437- 1446-18

7.9.7 Operate time, unrestrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 11
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 22,0 27,1 33,1 26,2 31,2 36,7
#2 19,3 24,0 30,9 33,8 38,9 43,4
#3 17,1 21,5 27,5 34,8 38,7 43,5
#4 16,2 20,3 25,9 36,6 40,0 43,9
#5 15,6 19,3 24,2 36,0 42,6 51,3
Version: 1
 -438- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,1 22,1 27,9 27,8 31,7 35,0
#2 15,8 20,4 25,6 28,6 32,0 35,5
#3 14,7 19,1 24,2 28,6 32,1 35,6
#4 14,2 18,0 22,5 29,5 33,0 37,2
#5 13,9 17,7 22,3 30,1 36,4 46,6

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 20,9 26,6 32,5 25,6 30,9 37,0
#2 18,8 23,6 29,6 34,1 38,5 42,8
#3 17,2 21,6 27,8 34,8 38,9 42,9
#4 17,2 20,9 27,7 36,3 40,5 45,4
#5 16,6 20,2 24,6 37,5 43,3 52,0

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,4 21,9 28,7 28,0 31,5 35,3
#2 16,3 20,3 27,9 28,2 31,8 35,8
#3 15,2 19,2 25,5 29,0 32,3 35,9
#4 15,1 19,0 24,7 30,2 33,6 36,7
#5 14,9 18,7 23,8 31,1 37,5 47,5
Version: 1
 -439- 1446-18

7.9.8 Operate time, unrestrained function, double infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 3 3
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 1 1
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 20,8 24,1 27,4 24,4 29,9 37,4
#2 18,4 22,2 25,7 33,4 38,1 43,0
#3 16,9 20,0 23,5 33,8 38,2 43,5
#4 16,5 20,3 24,1 35,7 40,4 45,6
#5 16,3 19,6 22,8 40,8 45,5 51,3
Version: 1
 -440- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,6 19,8 23,4 28,1 31,1 34,8
#2 15,5 19,0 22,9 27,9 31,5 35,1
#3 14,4 17,9 21,9 28,2 31,7 35,4
#4 14,9 18,6 22,2 30,4 33,7 37,3
#5 14,3 17,8 21,4 34,2 39,7 43,8

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 21,2 24,7 28,1 25,7 30,6 36,8
#2 19,6 22,7 26,0 34,5 39,0 43,5
#3 18,1 21,2 24,2 35,0 39,3 43,7
#4 16,4 19,4 23,1 34,8 39,3 43,2
#5 15,8 19,0 23,0 40,1 44,9 50,3

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,4 20,8 24,4 28,5 32,1 35,5
#2 16,3 19,9 23,3 29,5 32,7 35,8
#3 15,8 19,2 22,4 29,6 32,9 36,1
#4 14,6 18,1 21,8 30,0 33,2 36,9
#5 14,3 17,6 21,1 34,5 39,5 44,4
Version: 1
 -441- 1446-18

7.10 Operating time (SOM output)

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 31 July to 1 August 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
Specification
Operate time, restrained function, at 0 to 10x IdMin min. = 10 ms max. = 30 ms
Reset time, restrained function, at 10x IdMin to 0 min. = 20 ms, max. = 45 ms
Operate time, unrestrained function, at 0 to 10x IdUnre min. = 10 ms max. = 25 ms
Reset time, unrestrained function, at 10x IdUnre to 0 min. = 20 ms, max. = 50 ms
Note: data obtained with single input current group.

Result
The objects passed the tests.
Version: 1
 -442- 1446-18

7.10.1 Operate time, restrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 3,000 0,000 3,000 3,000
#4 5,000 0,000 5,000 5,000
#5 10,000 0,000 10,000 10,000
#6 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 33,4 39,4 43,5 23,1 27,0 32,5
#2 23,3 29,2 35,6 34,9 39,6 43,9
#3 21,4 26,6 33,5 31,5 38,7 43,9
#4 20,2 25,0 31,7 28,6 34,2 43,7
#5 18,3 22,9 28,7 27,1 30,8 35,2
#6 17,6 21,8 27,9 27,1 30,6 34,7
Version: 1
 -443- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,6 19,5 26,5 25,9 32,4 37,1
#2 12,9 17,6 24,4 29,7 33,8 37,7
#3 12,2 16,7 22,8 25,7 32,6 37,5
#4 11,7 15,9 22,0 23,3 28,1 35,9
#5 10,7 14,7 20,8 22,0 25,1 29,2
#6 10,8 14,4 18,8 21,3 24,9 28,5

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 34,0 38,9 43,1 22,3 26,3 31,4
#2 23,2 29,0 35,6 34,6 39,0 42,6
#3 21,3 26,4 32,5 30,7 37,4 43,5
#4 19,6 24,1 30,4 28,4 32,8 39,8
#5 18,9 23,0 29,2 26,8 30,7 36,5
#6 17,3 21,2 26,7 25,7 29,3 33,1

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,0 19,1 25,7 25,3 31,9 36,7
#2 12,9 17,2 22,7 29,6 33,4 37,6
#3 12,1 16,3 22,3 25,5 31,8 36,6
#4 11,4 15,3 21,1 23,0 27,3 35,0
#5 10,7 14,9 20,1 21,8 25,4 28,9
#6 10,2 13,6 18,8 21,1 24,2 28,0
Version: 1
 -444- 1446-18

7.10.2 Operate time, restrained function, single infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 3,000 0,000 3,000 3,000
#4 5,000 0,000 5,000 5,000
#5 10,000 0,000 10,000 10,000
#6 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 33,7 37,8 41,7 23,7 27,4 31,4
#2 23,4 26,8 30,2 35,4 40,3 45,7
#3 21,0 24,8 28,4 35,2 39,9 44,9
#4 19,8 23,2 26,5 28,8 33,8 40,9
#5 18,5 22,0 25,4 27,3 31,9 37,0
#6 17,5 20,6 24,0 26,9 30,9 35,5
Version: 1
 -445- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,0 17,8 21,3 29,5 33,4 36,9
#2 12,9 16,4 19,5 30,4 34,3 37,5
#3 12,1 15,5 18,7 30,1 33,5 36,9
#4 11,5 14,9 18,2 23,3 27,8 34,1
#5 10,8 14,3 17,8 22,0 25,6 28,9
#6 10,3 13,5 17,2 21,3 24,8 28,3

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 33,1 37,2 42,3 22,2 25,9 29,5
#2 22,7 26,1 30,4 34,7 39,3 44,1
#3 21,1 24,5 28,1 33,9 39,3 44,0
#4 19,6 22,9 26,4 28,5 33,6 40,8
#5 18,1 21,6 25,1 26,7 30,8 36,5
#6 17,6 20,9 24,5 26,8 30,3 35,3

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,9 17,0 20,4 28,9 32,6 36,9
#2 12,1 15,4 18,9 29,5 33,5 37,6
#3 11,8 15,0 18,9 28,8 33,1 36,8
#4 11,2 14,6 18,1 23,3 27,4 34,9
#5 10,4 13,7 17,4 21,7 25,0 28,3
#6 10,5 13,8 17,2 21,3 24,5 28,1
Version: 1
 -446- 1446-18

7.10.3 Operate time, restrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 3,000 3,000 3,000 10,000
#4 5,000 5,000 5,000 20,000
#5 10,000 10,000 10,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,5 23,3 29,7 28,8 34,0 40,7
#2 17,3 21,7 27,5 37,4 41,8 46,3
#3 15,5 19,7 26,0 35,5 39,3 44,8
#4 15,9 19,7 25,0 35,9 39,8 45,8
#5 15,8 19,3 24,7 35,4 39,1 44,9
Version: 1
 -447- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,5 16,9 24,4 31,6 34,7 38,7
#2 11,7 15,7 20,7 32,1 35,1 39,1
#3 10,7 14,4 20,4 30,4 33,8 37,2
#4 10,7 14,5 19,9 30,8 34,0 37,4
#5 9,9 14,2 18,6 30,1 33,7 37,1

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,8 24,0 29,4 29,2 34,1 41,1
#2 18,3 22,6 28,3 37,9 41,9 46,4
#3 15,9 20,6 25,1 35,8 40,2 45,7
#4 15,3 18,9 23,7 34,7 38,2 43,2
#5 15,0 18,6 22,5 34,7 38,0 41,6

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,1 17,7 24,2 32,1 35,5 38,7
#2 12,0 16,5 22,7 32,7 35,8 39,6
#3 11,3 15,2 20,9 30,9 34,4 38,4
#4 10,0 13,8 20,2 29,7 33,2 36,9
#5 9,8 13,5 19,3 29,7 33,1 36,7
Version: 1
 -448- 1446-18

7.10.4 Operate time, restrained function, double infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,5 20,8 24,5 28,3 33,8 42,5
#2 16,9 20,4 23,7 37,2 41,9 46,6
#3 15,3 18,6 22,3 36,3 40,3 45,1
#4 15,1 18,6 22,0 35,3 39,6 46,0
#5 15,1 18,3 21,8 35,4 39,3 44,3
Version: 1
 -449- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,4 15,8 19,6 31,8 35,1 38,6
#2 11,4 14,9 18,7 32,0 35,7 39,3
#3 10,5 13,9 17,7 30,9 34,2 37,9
#4 10,2 13,5 17,2 30,0 33,4 37,4
#5 9,9 13,2 16,9 29,9 33,4 37,1

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 18,1 21,5 24,7 29,0 33,8 40,6
#2 17,1 20,6 23,7 37,1 41,6 46,9
#3 16,0 19,2 22,5 36,0 40,5 45,6
#4 15,2 18,9 22,1 35,0 39,1 45,6
#5 15,5 18,5 21,7 35,3 39,4 44,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,8 16,3 19,7 31,7 35,6 38,7
#2 11,7 15,2 18,6 32,1 35,8 39,1
#3 10,7 14,4 18,0 31,5 34,8 38,2
#4 10,4 13,9 17,5 30,2 33,6 37,4
#5 10,1 13,6 16,9 30,3 33,9 36,8
Version: 1
 -450- 1446-18

7.10.5 Operate time, unrestrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 11
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 23,2 33,7 42,4 23,5 28,2 34,3
#2 17,1 22,4 29,2 34,6 39,1 46,1
#3 14,3 19,0 25,9 36,4 39,9 44,3
#4 13,1 17,5 22,9 37,7 41,5 45,7
#5 12,6 16,7 21,6 39,2 43,4 48,2
Version: 1
 -451- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,5 19,5 26,0 25,5 32,4 37,1
#2 12,9 17,0 24,3 29,2 33,2 37,7
#3 11,3 15,4 22,0 30,3 34,0 38,1
#4 10,9 15,0 20,0 32,5 36,0 39,7
#5 10,5 14,6 19,1 33,3 37,2 41,0

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 23,6 33,8 42,9 22,5 27,8 33,4
#2 18,1 23,2 30,0 34,7 39,6 45,4
#3 14,8 19,6 26,2 36,9 40,5 45,3
#4 13,6 17,9 23,0 37,6 41,7 46,7
#5 12,3 16,3 21,8 38,1 42,1 45,7

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,1 19,6 26,2 27,0 32,3 38,3
#2 12,9 18,0 24,0 29,8 34,1 38,2
#3 11,7 16,1 20,9 30,9 34,5 37,9
#4 10,8 15,1 21,5 32,5 36,0 40,7
#5 10,1 13,9 18,1 33,0 36,8 40,5
Version: 1
 -452- 1446-18

7.10.6 Operate time, unrestrained function, single infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 1A
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 23,2 28,9 35,9 23,5 27,8 33,0
#2 16,8 20,3 23,7 35,3 39,5 44,7
#3 14,2 17,7 20,7 36,2 40,4 45,5
#4 12,9 16,5 20,0 37,5 41,6 45,6
#5 12,4 15,6 19,2 38,5 42,8 48,6
Version: 1
 -453- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,9 17,4 21,3 28,9 32,8 36,9
#2 12,5 15,9 19,8 30,2 33,8 37,3
#3 11,5 14,9 18,3 31,1 34,6 38,0
#4 10,7 14,3 17,9 32,7 36,0 39,3
#5 10,3 13,6 17,2 33,4 36,6 40,3

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 23,3 30,2 36,8 23,3 30,2 36,8
#2 17,3 20,8 24,5 35,7 39,8 45,4
#3 14,5 18,0 22,0 36,9 40,3 45,7
#4 13,3 16,7 20,0 38,4 41,8 47,5
#5 12,2 15,9 19,1 39,0 42,8 48,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,8 18,1 21,8 29,5 33,3 37,3
#2 12,9 16,3 19,7 30,4 34,1 38,2
#3 11,4 15,1 18,3 31,0 34,6 38,2
#4 10,7 14,2 17,5 32,4 35,9 39,4
#5 10,2 13,9 17,0 33,7 37,1 40,4
Version: 1
 -454- 1446-18

7.10.7 Operate time, unrestrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 11
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,9 23,2 29,7 29,4 35,3 42,4
#2 15,3 20,1 26,5 38,0 42,8 46,7
#3 13,5 17,8 23,5 38,9 43,0 48,5
#4 12,6 16,6 21,2 39,0 43,9 48,7
#5 12,1 15,8 21,2 40,3 47,8 59,2
Version: 1
 -455- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,3 17,9 24,9 32,2 35,7 39,1
#2 11,7 16,5 23,1 32,4 36,1 39,9
#3 11,0 15,2 20,9 33,0 36,4 39,4
#4 10,7 14,4 18,4 33,4 37,3 41,3
#5 10,1 14,0 18,7 34,1 41,0 51,2

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 17,0 22,2 28,8 28,6 33,9 40,5
#2 14,6 19,4 25,4 37,0 41,4 45,5
#3 13,2 17,2 22,8 37,9 41,7 45,9
#4 12,3 16,4 22,4 38,8 43,5 48,2
#5 11,6 15,5 20,4 39,7 46,7 56,4

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,9 17,0 23,1 30,7 34,8 38,5
#2 11,6 15,6 21,5 31,8 34,9 38,6
#3 10,7 14,3 19,4 32,3 35,4 39,4
#4 10,3 14,3 19,2 33,4 36,9 40,4
#5 10,1 13,8 19,5 33,8 40,7 49,7
Version: 1
 -456- 1446-18

7.10.8 Operate time, unrestrained function, double infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
No. of shots 5
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 1A
CrossBlockEn No
NegSeqDiffEn On
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3A (II)
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,9 20,7 24,8 28,2 34,5 41,6
#2 15,1 18,8 21,7 38,5 42,5 48,5
#3 13,6 16,9 20,7 38,7 43,1 48,3
#4 12,4 15,8 19,1 39,5 43,5 48,5
#5 11,7 14,8 18,4 44,7 49,3 56,6
Version: 1
 -457- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,1 16,1 20,4 31,6 35,6 39,3
#2 12,2 15,7 19,0 32,9 36,2 40,6
#3 11,0 14,5 18,0 33,1 36,5 40,2
#4 10,4 13,7 17,2 33,5 36,9 40,6
#5 9,6 13,3 17,2 38,7 43,5 48,0

IED 3B
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,7 20,8 25,2 28,3 34,3 42,9
#2 14,6 17,8 21,5 36,8 41,3 45,7
#3 12,9 16,1 20,0 37,5 41,8 45,9
#4 12,3 15,8 19,3 39,7 43,5 48,3
#5 12,1 15,5 18,6 44,9 49,5 55,3

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,6 16,2 20,6 31,7 35,6 39,4
#2 11,2 14,8 18,5 31,9 35,2 38,6
#3 10,6 13,8 17,6 32,5 35,7 39,3
#4 10,2 13,9 17,2 33,7 37,0 40,2
#5 10,5 13,8 17,5 39,3 43,9 47,9
Version: 1
 -458- 1446-18

7.11 Stability for external faults

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 31 July to 1 August 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
Stability during a situation with through-current: no trip, no start

Result
The object passed the test.
Version: 1
 -459- 1446-18

7.11.1 Stability for external faults, restrained function (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
NegSeqDiffEn On
CrossBlockEn No
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Stability for external faults for network time constant 300 ms

Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip
Version: 1
 -460- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -461- 1446-18

7.11.2 Stability for external faults, restrained function (L1-L2-L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 40 40
NegSeqDiffEn On
CrossBlockEn No
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Stability for external faults for network time constant 300 ms

Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip
Version: 1
 -462- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -463- 1446-18

7.11.3 Stability for external faults, unrestrained function (L2-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 11
NegSeqDiffEn On
CrossBlockEn No
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Stability for external faults for network time constant 300 ms

Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip
Version: 1
 -464- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -465- 1446-18

7.11.4 Stability for external faults, unrestrained function (L1-L2-L3-N)

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Inception angle start 0˚
Inception angle end 350 ˚
Inception angle step 10 ˚
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
tIdMinHigh 0s
Id Unre 1A
NegSeqDiffEn On
CrossBlockEn No
ChargCurEnable Off
AddDelay Off
OpenCTEnable On
LDLPSCH On

Stability for external faults for network time constant 300 ms

Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip
Version: 1
 -466- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -467- 1446-18

7.12 Static accuracy harmonic blocking function

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 6 August 2018

Environmental conditions
Ambient temperature 21,4 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Function Accuracy
Second harmonic blocking ± 3% of Ir (fundamental magnitude 100% of Ir)
Fifth harmonic blocking ± 10% of Ir (fundamental magnitude 100% of Ir)

Result
The objects passed the test.
Version: 1
 -468- 1446-18

7.12.1 Static accuracy harmonic restraint, 2nd harmonic

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Fault type L1-L2-L3-N

IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 10 10
I2/I1 ratio 10 %
I5/I1 ratio 25 %

IED 3A
Harmonic angle Harmnic content increasing, Harmonic content decreasing,
o trip stable off trip stable on
% %
0 10,5 9,8
45 10,6 10,0
90 10,7 10,0
135 10,6 9,9
180 10,4 9,8

IED 3B
Harmonic angle Increasing, trip stable off Decreasing, trip stable on
o % %
0 10,5 9,8
45 10,6 10,0
90 10,7 10,0
135 10,6 9,9
180 10,4 9,8

Note
Start contact was always on.
Version: 1
 -469- 1446-18

7.12.2 Static accuracy harmonic restraint, 5th harmonic

Characteristic test data

Sample IED 3A (II) and 3B
Rated frequency 50 Hz
Rated current 1A
Fault type L1-L2-L3-N

IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,25 1,25
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 10 10
I2/I1 ratio 10 %
I5/I1 ratio 25 %

IED 3A
Harmonic angle Increasing, trip stable off Decreasing, trip stable on
o % %
0 29,2 28,4
45 28,8 27,8
90 28,6 27,7
135 28,3 27,2
180 28,0 26,8

IED 3B
Harmonic angle Increasing, trip stable off Decreasing, trip stable on
o % %
0 29,2 28,4
45 28,8 27,8
90 28,6 27,7
135 28,3 27,2
180 28,0 26,8

Note
Start contact was always on.
Version: 1
 -470- 1446-18

7.13 Line differential protection, L4CPDIF

7.13.1 General

The Trip and Start signals of the protection function block were connected to a digital output and
measured directly at the respective digital output
As digital output an IOM output (electromechanical contact) was used.
Version: 1
 -471- 1446-18

7.14 Static accuracy Idiff> and operating characteristic

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 29 March, 3 April 2018

Environmental conditions
Ambient temperature 20-22 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Minimum operate current ±1% of Ir at I≤Ir, ±1% of I at I ≥ Ir

Specification is valid for a single IED with 2Mbit/s communication back-to-back testing.

Result
The results are for information only.
Version: 1
 -472- 1446-18

7.14.1 Intrinsic accuracy default settings (50 Hz)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A

IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 1,5 1,5
EndSec2 33
SlopeSec2 40 %
SlopeSec3 80 %
Id Unre 20 20
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip No

Intrinsic accuracy (L1-N)

L1-N
3,0

2,5

2,0
Idiff. (A)

1,5 IED 3A
IED 3B
1,0 Characteristic

0,5

0,0
0 1 2 3 4 5 6
Istab. (A)
Version: 1
 -473- 1446-18

IED 3C
Current Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,300 0,285 0,300 0,300 0,285 0,285 0,950 0,0
0,000 0,300 0,284 0,300 0,300 0,284 0,284 0,947 0,0
1,000 1,284 1,269 1,284 0,284 1,269 0,269 0,947 -1,6
1,000 1,284 1,269 1,284 0,284 1,269 0,269 0,947 -1,6
1,000 0,686 0,701 1,000 0,314 1,000 0,299 0,952 1,4
1,000 0,686 0,701 1,000 0,314 1,000 0,299 0,952 1,4
1,500 1,191 1,206 1,500 0,309 1,500 0,294 0,951 0,9
1,500 1,191 1,206 1,500 0,309 1,500 0,294 0,951 0,9
1,500 1,986 1,947 1,986 0,486 1,947 0,447 0,920 -0,8
1,500 1,988 1,949 1,988 0,488 1,949 0,449 0,920 -0,7
2,000 1,481 1,506 2,000 0,519 2,000 0,494 0,952 1,9
2,000 1,481 1,506 2,000 0,519 2,000 0,494 0,952 1,9
2,000 1,514 1,540 2,000 0,486 2,000 0,460 0,947 -1,4
2,000 2,800 2,733 2,800 0,800 2,733 0,733 0,916 -2,0
2,000 2,798 2,732 2,798 0,798 2,732 0,732 0,917 -2,1
3,000 2,077 2,121 3,000 0,923 3,000 0,879 0,952 2,3
3,000 2,076 2,120 3,000 0,924 3,000 0,880 0,952 2,4
4,000 2,293 2,376 4,000 1,707 4,000 1,624 0,951 0,4
4,000 2,292 2,378 4,000 1,708 4,000 1,622 0,950 0,5
5,000 2,490 2,614 5,000 2,510 5,000 2,386 0,951 0,4
5,000 2,490 2,614 5,000 2,510 5,000 2,386 0,951 0,4
Version: 1
 -474- 1446-18

IED 3D
Current Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,303 0,288 0,303 0,303 0,288 0,288 0,950 0,3
0,000 0,303 0,288 0,303 0,303 0,288 0,288 0,950 0,3
1,000 1,312 1,296 1,312 0,312 1,296 0,296 0,949 1,2
1,000 1,312 1,297 1,312 0,312 1,297 0,297 0,952 1,2
1,000 0,707 0,722 1,000 0,293 1,000 0,278 0,949 -0,7
1,000 0,707 0,722 1,000 0,293 1,000 0,278 0,949 -0,7
1,500 1,211 1,227 1,500 0,289 1,500 0,273 0,945 -1,1
1,500 1,211 1,226 1,500 0,289 1,500 0,274 0,948 -1,1
1,500 2,016 1,974 2,016 0,516 1,974 0,474 0,919 1,0
1,500 2,016 1,975 2,016 0,516 1,975 0,475 0,921 1,0
2,000 1,515 1,540 2,000 0,485 2,000 0,460 0,948 -1,5
2,000 1,514 1,540 2,000 0,486 2,000 0,460 0,947 -1,4
2,000 1,514 1,540 2,000 0,486 2,000 0,460 0,947 -1,4
2,000 2,852 2,786 2,852 0,852 2,786 0,786 0,923 1,1
2,000 2,852 2,785 2,852 0,852 2,785 0,785 0,921 1,1
3,000 2,116 2,162 3,000 0,884 3,000 0,838 0,948 -1,6
3,000 2,116 2,163 3,000 0,884 3,000 0,837 0,947 -1,6
4,000 2,330 2,417 4,000 1,670 4,000 1,583 0,948 -1,8
4,000 2,330 2,417 4,000 1,670 4,000 1,583 0,948 -1,8
5,000 2,533 2,661 5,000 2,467 5,000 2,339 0,948 -1,3
5,000 2,534 2,661 5,000 2,466 5,000 2,339 0,948 -1,4
Version: 1
 -475- 1446-18

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A

IED settings:
% of IB A
IdMin 0,4 0,4
EndSec1 1,5 1,5
EndSec2 44
SlopeSec2 25 %
SlopeSec3 50 %
Id Unre 20 20
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip No

Intrinsic accuracy (L2-N)

2,5
L2-N

2,0

1,5
Idiff. (A)

IED 3A
IED 3B
1,0
Characteristic

0,5

0,0
0 1 2 3 4 5 6 7
Istab. (A)
Version: 1
 -476- 1446-18

IED 3C
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
% (Ir/I)
0,000 0,401 0,381 0,401 0,401 0,381 0,381 0,950 0,1
0,000 0,400 0,381 0,400 0,400 0,381 0,381 0,953 0,0
1,000 0,602 0,621 1,000 0,398 1,000 0,379 0,952 -0,2
1,000 0,603 0,623 1,000 0,397 1,000 0,377 0,950 -0,3
1,000 1,403 1,385 1,403 0,403 1,385 0,385 0,955 0,3
1,000 1,405 1,385 1,405 0,405 1,385 0,385 0,951 0,5
2,000 1,482 1,507 2,000 0,518 2,000 0,493 0,952 -0,7
2,000 1,477 1,505 2,000 0,523 2,000 0,495 0,946 -0,2
2,000 2,700 2,653 2,700 0,700 2,653 0,653 0,933 0,0
2,000 2,699 2,652 2,699 0,699 2,652 0,652 0,933 -0,1
3,000 2,220 2,259 3,000 0,780 3,000 0,741 0,950 0,5
3,000 2,219 2,258 3,000 0,781 3,000 0,742 0,950 0,6
3,000 3,998 3,931 3,998 0,998 3,931 0,931 0,933 -2,6
3,000 3,998 3,930 3,998 0,998 3,930 0,930 0,932 -2,6
4,000 2,955 3,006 4,000 1,045 4,000 0,994 0,951 2,0
4,000 2,955 3,007 4,000 1,045 4,000 0,993 0,950 2,0
5,000 3,474 3,550 5,000 1,526 5,000 1,450 0,950 0,1
5,000 3,474 3,550 5,000 1,526 5,000 1,450 0,950 0,1

IED 3D
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip
%(Ir/I)
0,000 0,402 0,381 0,402 0,402 0,381 0,381 0,948 0,2
0,000 0,401 0,380 0,401 0,401 0,380 0,380 0,948 0,1
1,000 0,604 0,625 1,000 0,396 1,000 0,375 0,947 -0,4
1,000 0,604 0,624 1,000 0,396 1,000 0,376 0,949 -0,4
1,000 1,404 1,385 1,404 0,404 1,385 0,385 0,953 0,4
1,000 1,406 1,385 1,406 0,406 1,385 0,385 0,948 0,6
2,000 1,481 1,510 2,000 0,519 2,000 0,490 0,944 -0,6
2,000 1,483 1,511 2,000 0,517 2,000 0,489 0,946 -0,8
2,000 2,717 2,672 2,717 0,717 2,672 0,672 0,937 1,3
2,000 2,718 2,674 2,718 0,718 2,674 0,674 0,939 1,4
3,000 2,247 2,287 3,000 0,753 3,000 0,713 0,947 -2,2
3,000 2,248 2,288 3,000 0,752 3,000 0,712 0,947 -2,3
3,000 4,113 4,022 4,113 1,113 4,022 1,022 0,918 2,9
3,000 4,113 4,025 4,113 1,113 4,025 1,025 0,921 2,9
4,000 3,015 3,067 4,000 0,985 4,000 0,933 0,947 -3,9
4,000 3,016 3,067 4,000 0,984 4,000 0,933 0,948 -4,0
5,000 3,502 3,579 5,000 1,498 5,000 1,421 0,949 -1,8
5,000 3,501 3,577 5,000 1,499 5,000 1,423 0,949 -1,7
Version: 1
 -477- 1446-18

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A

IED settings:
% of IB A
IdMin 0,2 0,2
EndSec1 11
EndSec2 22
SlopeSec2 30 %
SlopeSec3 60 %
Id Unre 20 20
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip No

Intrinsic accuracy (L3-N)

L3-N
3,0

2,5

2,0
Idiff. (A)

1,5 IED 3A
IED 3B
1,0 Characteristic

0,5

0,0
0 1 2 3 4 5 6
I stab. (A)
Version: 1
 -478- 1446-18

IED 3C
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip %
(Ir/I)
0,000 0,200 0,191 0,200 0,200 0,191 0,191 0,955 0,0
0,000 0,201 0,190 0,201 0,201 0,190 0,190 0,945 0,1
1,000 0,802 0,811 1,000 0,198 1,000 0,189 0,955 -0,2
1,000 0,801 0,812 1,000 0,199 1,000 0,188 0,945 -0,1
1,000 1,290 1,270 1,290 0,290 1,270 0,270 0,931 0,7
1,000 1,289 1,268 1,289 0,289 1,268 0,268 0,927 0,7
2,000 1,501 1,526 2,000 0,499 2,000 0,474 0,950 -0,1
2,000 1,499 1,525 2,000 0,501 2,000 0,475 0,948 0,1
2,000 3,243 3,094 3,243 1,243 3,094 1,094 0,880 -0,2
2,000 3,238 3,092 3,238 1,238 3,092 1,092 0,882 -0,4
2,500 1,688 1,728 2,500 0,812 2,500 0,772 0,951 1,2
2,500 1,688 1,728 2,500 0,812 2,500 0,772 0,951 1,2
2,500 4,429 4,201 4,429 1,929 4,201 1,701 0,882 -1,5
2,500 4,428 4,201 4,428 1,928 4,201 1,701 0,882 -1,5
3,000 1,891 1,945 3,000 1,109 3,000 1,055 0,951 0,8
3,000 1,890 1,945 3,000 1,110 3,000 1,055 0,950 0,9
4,000 2,286 2,370 4,000 1,714 4,000 1,630 0,951 0,8
4,000 2,285 2,370 4,000 1,715 4,000 1,630 0,950 0,9
5,000 2,680 2,794 5,000 2,320 5,000 2,206 0,951 0,9
5,000 2,679 2,794 5,000 2,321 5,000 2,206 0,950 0,9
Version: 1
 -479- 1446-18

IED 3D
Currents Trip Reset Reset ratio Error Idiff.
I2 I1 trip I1 reset Istab Idiff Istab Idiff Idiff Trip %(Ir/I)
0,000 0,200 0,191 0,200 0,200 0,191 0,191 0,955 0
0,000 0,201 0,190 0,201 0,201 0,190 0,190 0,945 0,1
1,000 0,803 0,812 1,000 0,197 1,000 0,188 0,954 -0,3
1,000 0,802 0,812 1,000 0,198 1,000 0,188 0,949 -0,2
1,000 1,290 1,270 1,290 0,290 1,270 0,270 0,931 0,1
1,000 1,290 1,269 1,290 0,290 1,269 0,269 0,928 -0,1
2,000 1,504 1,529 2,000 0,496 2,000 0,471 0,950 -0,4
2,000 1,503 1,529 2,000 0,497 2,000 0,471 0,948 -0,3
2,000 3,266 3,122 3,266 1,266 3,122 1,122 0,886 0,5
2,000 3,268 3,124 3,268 1,268 3,124 1,124 0,886 0,6
2,500 1,721 1,762 2,500 0,779 2,500 0,738 0,947 -2,1
2,500 1,721 1,762 2,500 0,779 2,500 0,738 0,947 -2,1
2,500 4,562 4,324 4,562 2,062 4,324 1,824 0,885 1,2
2,500 4,561 4,326 4,561 2,061 4,326 1,826 0,886 1,2
3,000 1,916 1,973 3,000 1,084 3,000 1,027 0,947 -1,5
3,000 1,918 1,974 3,000 1,082 3,000 1,026 0,948 -1,6
4,000 2,324 2,411 4,000 1,676 4,000 1,589 0,948 -1,4
4,000 2,324 2,411 4,000 1,676 4,000 1,589 0,948 -1,4
5,000 2,730 2,847 5,000 2,270 5,000 2,153 0,948 -1,3
5,000 2,731 2,847 5,000 2,269 5,000 2,153 0,949 -1,3
Version: 1
 -480- 1446-18

7.15 Operating time

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 18, 19, 23 April, 16 and July 2018

Environmental conditions
Ambient temperature 22-24 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Tolerance
Operate time with two input group’s currents, restrained Min. = 10 ms
function, in a 50 Hz system, 0 to 10xIdmin. Max. = 20 ms
Operate time, restrained function at 0 to 10x Idmin., in a 50 Hz Min. = 10 ms
system 2) Max. = 20 ms
Reset time,restrained function at 10x Idmin. to 0 2) Min. = 45 ms
Max. = 65 ms
Operate time, unrestrained function at 0 to 10x IdUnre 2) Min. = 5 ms
Max. = 15 ms
Reset time, unrestrained function at 10x IdUnre to 0 2) Min. = 25 ms
Max. = 35 ms

1 Data obtained by applying two input group’s currents to simulate an external fault with default
settings. Ir is applied to both input groups as pre- and after-fault currents. Fault: increasing one
group’s currents to 10x Idmin. and decreasing the other group’s currents to 0.
2 Data obtained by applying one input group’s currents only.

Result
The object passed the test.
Version: 1
 -481- 1446-18

7.15.1 Operate time, restrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 40 40
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,0 19,0 24,4 50,8 56,0 61,0
#2 14,4 17,4 22,5 49,4 54,2 60,4
#3 12,9 15,8 20,4 46,9 49,7 53,6
#4 12,7 15,0 19,6 45,1 48,5 52,4
#5 11,9 14,5 18,0 42,7 46,1 48,1

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,1 17,7 22,4 17,3 22,3 24,9
#2 12,6 15,6 20,7 16,0 20,2 24,6
#3 10,8 13,9 18,6 13,5 15,3 17,2
#4 10,8 13,1 17,4 12,1 13,8 15,5
#5 10,0 12,5 16,9 11,2 13,0 15,6
Version: 1
 -482- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,2 19,7 25,1 47,9 55,1 58,1
#2 14,3 17,7 23,4 46,4 52,9 57,6
#3 13,1 16,5 21,0 45,6 48,1 50,4
#4 12,7 15,8 20,1 44,5 46,9 51,0
#5 11,8 14,2 17,9 40,9 46,3 50,2

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,9 17,8 23,4 17,8 22,6 26,3
#2 12,9 16,1 21,5 16,4 20,9 25,4
#3 11,1 14,5 19,7 14,1 16,2 18,2
#4 11,1 14,1 18,9 12,6 14,9 16,8
#5 9,6 12,1 16,0 10,9 13,0 14,8
Version: 1
 -483- 1446-18

7.15.2 Operate time, restrained function, single infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 40 40
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,2 18,5 20,2 53,1 56,2 60,4
#2 15,3 17,1 18,8 48,5 54,2 60,6
#3 12,8 15,7 17,8 46,0 48,2 52,4
#4 12,3 14,6 16,9 42,7 46,8 49,8
#5 11,8 14,1 16,1 43,1 47,5 49,5

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,8 16,4 18,3 20,9 24,0 26,3
#2 13,1 15,0 17,1 17,5 22,2 25,7
#3 10,5 13,5 15,7 13,9 16,5 18,4
#4 10,0 12,3 14,9 12,2 14,2 16,8
#5 9,7 11,7 13,7 11,2 13,1 15,6
Version: 1
 -484- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 15,7 17,5 19,9 53,6 56,6 61,8
#2 14,2 15,9 17,7 49,5 55,7 61,3
#3 12,8 14,5 16,5 46,6 50,0 53,6
#4 12,4 14,1 15,7 44,0 48,0 51,9
#5 11,6 13,4 15,4 42,4 46,9 48,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,9 15,8 18,9 21,0 23,4 25,7
#2 12,2 14,2 16,2 16,4 21,1 24,7
#3 11,0 13,0 14,8 13,9 15,8 17,6
#4 10,2 12,3 14,2 12,3 14,2 16,0
#5 9,8 11,6 13,5 11,3 13,2 15,0
Version: 1
 -485- 1446-18

7.15.3 Operate time, restrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 40 40
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,5 17,3 22,3 56,3 59,3 64,0
#2 13,5 16,2 20,6 56,0 59,0 63,1
#3 12,5 15,0 19,5 54,0 57,2 61,7
#4 12,4 14,4 16,9 54,4 56,6 59,3
#5 11,9 13,7 17,8 51,3 55,8 57,8

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,5 15,6 20,4 23,4 25,2 27,0
#2 11,3 14,2 19,5 23,1 24,8 26,7
#3 10,8 13,1 17,4 21,1 23,3 25,7
#4 9,9 12,3 16,3 20,9 22,5 24,3
#5 9,9 11,9 16,2 20,4 22,1 24,0
Version: 1
 -486- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 15,0 18,4 23,5 55,3 58,2 62,4
#2 13,7 16,8 21,6 55,1 57,5 62,0
#3 12,5 15,5 20,1 53,6 56,0 58,4
#4 11,9 14,5 18,9 52,4 56,2 59,4
#5 11,6 13,7 17,5 50,2 55,2 59,1

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,1 16,5 21,5 24,3 26,2 28,2
#2 11,7 14,9 20,1 23,1 25,6 27,7
#3 10,6 13,5 18,5 21,2 23,9 26,3
#4 10,2 12,8 16,0 20,9 23,2 25,4
#5 9,7 11,9 15,4 20,4 22,2 24,0
Version: 1
 -487- 1446-18

7.15.4 Operate time, restrained function, double infeed faults (L1-L2-

L3-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 40 40
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,2 16,1 18,6 56,1 59,9 61,7
#2 13,3 15,0 17,2 55,8 59,9 62,2
#3 12,7 14,2 16,0 56,2 58,6 61,4
#4 12,4 14,0 15,5 53,0 57,5 60,7
#5 11,5 13,7 15,8 50,9 56,2 59,4

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,0 13,9 15,9 23,4 25,3 27,1
#2 11,1 13,1 14,7 23,1 25,1 26,8
#3 10,5 12,2 14,2 21,3 23,6 26,0
#4 10,0 11,9 13,7 19,4 22,8 24,7
#5 9,4 11,3 13,3 20,7 22,8 25,7
Version: 1
 -488- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,2 16,0 18,3 55,3 59,1 61,0
#2 13,2 15,4 17,7 53,9 58,7 60,8
#3 12,4 14,9 16,7 52,8 56,9 59,6
#4 12,1 14,4 16,5 51,5 55,7 58,7
#5 11,4 13,4 15,1 53,9 56,2 58,9

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,4 14,1 16,4 23,2 25,5 27,9
#2 11,5 13,8 15,7 23,4 25,8 28,0
#3 11,3 13,2 15,2 21,6 24,6 26,8
#4 10,2 12,6 14,7 18,0 23,5 25,8
#5 9,7 11,5 13,2 21,1 22,8 24,6
Version: 1
 -489- 1446-18

7.15.5 Operate time, unrestrained function, single infeed faults (L2-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 11
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 15,9 19,3 24,5 50,0 55,6 60,5
#2 14,1 17,3 22,4 48,1 53,7 60,1
#3 13,1 16,0 20,5 53,3 57,8 61,7
#4 12,7 15,9 20,4 55,7 59,7 63,1
#5 12,2 14,7 17,9 56,5 60,6 63,8

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,8 17,5 23,0 17,4 22,1 24,8
#2 12,3 15,5 20,3 16,1 20,3 24,5
#3 11,2 13,9 19,2 22,7 24,7 26,9
#4 10,5 13,9 18,4 24,7 27,1 28,7
#5 10,3 12,9 17,2 25,5 27,5 29,9
Version: 1
 -490- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 15,9 19,3 24,6 50,6 55,4 58,2
#2 14,0 17,2 22,3 48,1 53,6 58,4
#3 12,7 15,7 20,9 54,7 58,0 60,7
#4 12,4 14,8 19,2 58,2 60,4 62,9
#5 12,2 14,2 17,7 58,6 61,1 63,5

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 13,8 17,2 22,1 17,4 22,1 25,4
#2 12,3 15,3 20,1 16,2 20,3 25,0
#3 11,2 13,8 18,7 22,7 24,5 26,2
#4 10,3 12,9 17,7 24,3 26,1 27,8
#5 10,2 12,3 15,9 24,9 27,1 29,0
Version: 1
 -491- 1446-18

7.15.6 Operate time, unrestrained function, single infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 11
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 0,000 1,000 1,000
#2 2,000 0,000 2,000 2,000
#3 5,000 0,000 5,000 5,000
#4 10,000 0,000 10,000 10,000
#5 20,000 0,000 20,000 20,000
#6 0,000 20,000 20,000 20,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 15,4 17,5 19,4 51,8 57,1 61,9
#2 14,3 16,8 18,7 45,6 54,2 60,7
#3 13,0 14,8 16,7 54,5 58,7 61,4
#4 12,7 14,6 16,5 54,1 58,8 62,9
#5 11,9 13,5 15,2 58,2 61,2 64,7
#6 11,6 13,6 15,6 55,3 59,8 62,2
Version: 1
 -492- 1446-18

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,7 15,2 17,2 19,8 22,9 24,9
#2 12,3 14,5 17,1 15,2 21,8 25,6
#3 10,6 12,6 14,3 22,1 24,7 26,5
#4 10,1 12,5 15,2 24,5 26,5 28,7
#5 9,7 11,5 13,2 25,2 27,0 28,8
#6 9,4 11,5 13,3 25,3 27,1 29,4

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 16,0 18,3 20,3 52,3 55,3 57,9
#2 14,0 16,1 18,7 47,5 54,3 60,3
#3 12,9 15,4 17,2 54,2 58,4 61,3
#4 12,3 14,0 15,8 56,7 60,7 64,1
#5 12,1 14,1 16,2 57,4 60,3 63,1
#6 11,6 13,6 15,6 55,2 60,1 63,5

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,8 16,8 18,6 21,8 24,2 26,2
#2 12,4 14,4 17,2 16,4 21,4 24,9
#3 11,4 13,4 15,4 23,4 25,4 27,4
#4 10,6 12,3 13,8 24,6 26,1 27,9
#5 10,0 12,2 14,2 25,5 27,8 29,9
#6 9,8 11,6 13,5 25,4 27,2 29,9
Version: 1
 -493- 1446-18

7.15.7 Operate time, unrestrained function, double infeed faults (L2-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 11
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 4,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,5 17,6 22,7 55,3 59,1 63,5
#2 13,7 16,2 20,8 55,5 59,6 63,2
#3 12,7 15,0 19,9 57,4 60,8 64,0
#4 12,1 14,2 18,0 58,6 62,1 65,4
#5 11,3 13,9 17,6 58,0 63,9 72,5

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,4 15,5 21,1 23,5 25,1 26,9
#2 11,5 14,1 19,0 22,9 24,9 26,9
#3 10,4 13,0 17,5 24,2 25,9 27,9
#4 9,7 12,5 16,4 25,2 27,0 29,1
#5 9,6 12,1 14,7 25,6 31,3 39,2
Version: 1
 -494- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,1 17,6 22,5 54,1 58,0 60,0
#2 13,5 16,5 21,8 53,6 57,7 60,6
#3 12,7 15,6 20,5 54,3 58,6 62,0
#4 11,9 15,1 19,0 57,5 60,3 64,8
#5 11,3 13,6 17,2 56,2 64,8 74,8

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,5 15,8 21,5 23,5 25,7 27,8
#2 11,5 14,6 19,9 23,3 25,6 27,5
#3 10,8 13,6 18,0 24,4 26,6 28,6
#4 10,4 13,6 17,2 25,2 28,3 30,5
#5 9,9 11,8 14,7 25,9 31,2 39,3
Version: 1
 -495- 1446-18

7.15.8 Operate time, unrestrained function, double infeed faults (L1-

L2-L3-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 11
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

Settings
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 2,000
#2 2,000 2,000 2,000 2,000
#3 5,000 5,000 5,000 10,000
#4 10,000 10,000 10,000 20,000
#5 20,000 20,000 20,000 40,000

IED 3C
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,6 16,9 19,0 53,3 58,2 62,1
#2 13,7 15,8 17,6 51,7 57,5 61,4
#3 12,3 14,8 16,8 53,5 58,6 62,5
#4 12,1 13,9 16,1 55,2 59,7 63,5
#5 10,9 13,0 15,6 54,9 60,5 64,1

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,5 14,8 17,0 23,8 26,1 28,2
#2 11,4 13,8 16,4 23,5 25,8 27,9
#3 10,1 12,4 14,6 24,4 26,4 28,5
#4 9,8 11,7 14,6 25,3 27,1 29,8
#5 9,2 11,3 14,0 25,6 27,5 29,9
Version: 1
 -496- 1446-18

IED 3D
Test point Measured values trip contact
Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 14,4 16,0 17,6 56,6 59,2 61,4
#2 13,3 15,0 16,7 56,1 58,7 61,0
#3 12,3 14,0 15,8 57,1 59,6 62,3
#4 11,8 13,5 15,0 58,0 60,4 63,0
#5 11,2 12,8 14,6 58,1 60,6 63,5

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 12,2 14,2 16,0 23,8 25,5 27,2
#2 11,3 13,1 14,9 23,1 25,2 26,8
#3 10,4 12,3 14,0 24,3 26,2 27,6
#4 9,9 11,8 13,7 25,1 27,1 29,0
#5 9,6 11,6 13,2 25,9 27,6 29,2
Version: 1
 -497- 1446-18

7.16 Stability for external faults

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 1 to 5 April 2014

Environmental conditions
Ambient temperature 22 °C

Requirements
Stability during a situation with through-current: no trip, no start.

Result
The object passed the test.
Version: 1
 -498- 1446-18

7.16.1 Stability for external faults, restrained function (L2-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 40 40
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

IED 3C
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -499- 1446-18

IED 3D
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -500- 1446-18

7.16.2 Stability for external faults, restrained function (L1-L2-L3-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 40 40
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

IED 3C
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -501- 1446-18

IED 3D
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -502- 1446-18

7.16.3 Stability for external faults, unrestrained function (L2-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 11
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

IED 3C
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -503- 1446-18

IED 3D
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -504- 1446-18

7.16.4 Stability for external faults, unrestrained function (L1-L2-L3-N)

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 11
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
tIdMinHigh 0s
Id Unre 11
OpenCTEnable On
OCTBlockEn On
LossSynEn Off
CCCOpMode Off
SendInterTrip Yes

IED 3C
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -505- 1446-18

IED 3D
Stability for external faults for network time constant 300 ms
Test point I1 I2 Istab Idiff
#1 1,000 1,000 1,000 0,000
#2 2,000 2,000 2,000 0,000
#3 5,000 5,000 5,000 0,000
#4 10,000 10,000 10,000 0,000
#5 20,000 20,000 20,000 0,000

Test point Measured values trip contact

Operate times Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no trip no trip no trip no trip no trip no trip
#2 no trip no trip no trip no trip no trip no trip
#3 no trip no trip no trip no trip no trip no trip
#4 no trip no trip no trip no trip no trip no trip
#5 no trip no trip no trip no trip no trip no trip

Test point Measured values start contact

Operate time Reset time
Min. Avg. Max. Min. Avg. Max.
ms ms ms ms ms ms
#1 no start no start no start no start no start no start
#2 no start no start no start no start no start no start
#3 no start no start no start no start no start no start
#4 no start no start no start no start no start no start
#5 no start no start no start no start no start no start
Version: 1
 -506- 1446-18

7.17 Static accuracy harmonic blocking function

Standard and date

Standard IEC 60255-1, clause 6.5
Reference IEC 60255-13
Test date 5 April 2018

Environmental conditions
Ambient temperature 22 °C

Requirements
The tests shall be performed within the specification limits of the manufacturer given below.

Function Accuracy
Second harmonic blocking ± 1% of Ir (fundamental magnitude 100% of Ir)
Fifth harmonic blocking ± 3% of Ir (fundamental magnitude 100% of Ir)

Result
The object passed the test.
Version: 1
 -507- 1446-18

7.17.1 Static accuracy harmonic restraint, 2nd harmonic

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
Fault L1-L2-L3-N
I1 1A
I2 2A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 22
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
Id Unre 10 10
I2/I1 ratio 10 %
I5/I1 ratio 10 %

IED 3C
Harmonic angle Harmonic content increasing, Harmonic content decreasing,
o trip stable off trip stable on
% %
0 10,8 10,6
45 10,8 10,5
90 10,7 10,4
135 10,8 10,5
180 10,9 10,7

IED 3D
Harmonic angle Increasing, trip stable off Decreasing, trip stable on
o % %
0 9,8 9,6
45 9,6 9,4
90 9,6 9,3
135 9,7 9,4
180 9,8 9,6

Note
Start contact was always on.
Version: 1
 -508- 1446-18

7.17.2 Static accuracy harmonic restraint, 5th harmonic

Characteristic test data

Sample IED 3C and 3D
Rated frequency 50 Hz
Rated current 1A
Fault L1-L2-L3-N
I1 1A
I2 2A
IED settings:
% of IB A
IdMin 0,3 0,3
EndSec1 22
EndSec2 33
SlopeSec2 50 %
SlopeSec3 100 %
Id Unre 10 10
I2/I1 ratio 10 %
I5/I1 ratio 10 %

IED 3C
Harmonic angle Harmonic content increasing, Harmonic content decreasing,
o trip stable off trip stable on
% %
0 10,8 10,6
45 11,8 11,5
90 11,2 11,0
135 11,6 10,9
180 10,2 10,0

IED 3D
Harmonic angle Harmonic content increasing, Harmonic content decreasing,
o trip stable off trip stable on
% %
0 10,1 9,8
45 9,4 9,2
90 9,6 9,4
135 9,8 9,6
180 10,0 9,8

Note
Start contact was always on.
Version: 1
 -509- 1446-18

8 MEASUREMENT UNCERTAINTY

The measurement uncertainties in the results presented are as specified below unless otherwise
indicated.

Measurement Measurement uncertainty

Current Range 0,010 – 0,050 A: 5%
Range 0,050 – 20 A: 0,5%
Voltage Range 0,1 V – 0,5 V: 1%
Range 0,5 V – 150 V: 0,5%
Phase angle between current and voltage 0,1 deg
Time 0,5 ms

The used EMC test generators are calibrated on an annual base and comply with the tolerances
mentioned in the applicable test standard.
Version: 1