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Continuous diamond thin films can be grown on sapphire substrates by microwave plasma chemical vapor
deposition utilizing a pretreatment of adamantane dip coating on the substrate for enhanced nucleation.
Received 6th February 2014
Accepted 10th April 2014
Scanning electron microscopy, X-ray diffraction and Raman spectroscopy show that h111i oriented
diamond films of good crystallinity can be deposited on adamantane-coated sapphire substrates. Cross-
DOI: 10.1039/c4ra01042f
sectional transmission electron microscopy at the diamond/sapphire interface shows that diamond can
www.rsc.org/advances be directly synthesized on sapphire without any interlayer.
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pressure at room temperature.22 The concentration of the morphology of sapphire covered with dry-coated adamantane
solution was 1 g adamantane per 10 ml solvent. The dip coating powder and the morphology of sapphire only dip-coated with
conditions were similar to those used for Si substrate which had glycol solvent without any addition of adamantane are shown as
been described in detail elsewhere.22 Fig. 2(b) and (c). Thus, it clearly indicates that the adamantane
The adamantane-coated sapphire substrates were placed on coating can enhance the yield of diamond deposition. However,
a Mo holder for diamond growth in an AsTeX-type MPCVD we have no clear clues about whether adamantane directly
system.24 The diamond lms were grown at a gas pressure of 50 transforms to diamond or decompose into carbon-containing
torr and microwave power of 800 W for various periods from 15 radicals.
min to 48 h. The diamond lms were formed at a xed total gas To understand the evolution of the diamond deposition on
ow rate of 300 sccm and in the gas mixture containing H2 and adamantane-coated sapphire substrate, the deposition time
CH4 with a CH4–H2 ratio of 0.3/99.7. The substrate temperature was varied from 15–360 min with the same plasma condition.
during the deposition was roughly estimated to be 700 C as The SEM surface morphologies are shown in Fig. 3. For the 15
measured by optical pyrometer. min deposition, only a few diamond particles in 1–2 mm size
The surface morphology was examined in a eld emission are seen to form on sapphire (Fig. 3(a) and (b)) from which the
scanning electron microscope (SEM, JEOL JSM-6500F). The nucleation density is estimated to be about 1 107 cm2. In
crystallinity of diamond was evaluated with X-ray diffraction Fig. 3(c) and (d), the number of diamond particles signicantly
(XRD) and Raman spectroscopy. XRD patterns were acquired increases aer deposition for 30 min (the nucleation density
from a Bruker D2 XRD system using Cu Ka X-rays. Raman 1 108 cm2), indicating that the diamond nucleation
spectroscopy was performed in a LABRAM HR800 system, which density still increases with deposition time. Aer deposition
allowed the 488 nm laser beam be focused to 1 mm diameter for for about 60 min, a continuous diamond lm can form in
micro-mode operation. The lm microstructure and the inter- some local areas. For the 360 min growth, a continuous dia-
face were characterized using transmission electron microscopy mond lm has formed on the whole surface of sapphire
(TEM, FEI Tecnai30F operated at 300 kV). Focused ion beam substrate. The samples deposited for 15–360 min were also
(FIB, Seiko Instruments SMI 3050SE) was used for cross- evaluated with Raman spectroscopy as shown in Fig. 4. In all
sectional TEM specimen preparation. cases, the diamond peak at 1332 cm1 is clearly observed in
addition to the disordered graphitic peak at 1580 cm1. For
Results and discussion the 15 min deposition, a weak peak at 1150 cm1 is addi-
tionally observed, which can be attributed to the nano-
Aer dip-coating of adamantane on sapphire substrate, the diamond signal.25,26 Fig. 5 shows XRD patterns of the diamond
adamantane-coated sapphire substrates were placed in a lms grown on sapphire for the different deposition times. In
MPCVD reactor for diamond deposition. Fig. 1(a) shows the top addition to sapphire (0006) peaks, the XRD patterns in Fig. 5
view surface morphologies of a deposited diamond lm on the present sharp and well-dened peaks at 2q ¼ 43.9 and 75.7
sapphire substrate aer 48 h growth. The diamond grains have corresponding to diamond {111} and {220} reections,
an average size in 10 mm. In the high magnication image as respectively, for growth time reaching 60 min and above,
shown in Fig. 1(b), it can be clearly seen that the surface indicating that the deposited amount of diamond is increased
morphology of the synthesized diamond exhibits triangular and above the detection limit of XRD in consistence with SEM
hexagonal shapes which are the typical appearance of diamond observations.
{111} facets. The thickness of the continuous diamond lm is Furthermore, the cross-sectional TEM specimen of a dia-
10 mm as shown in Fig. 1(c) in cross section view, giving the mond sample deposited on sapphire for 2 h was prepared by
growth rate of diamond of 0.2 mm h1. Fig. 1(d) shows a Raman FIB. For the protection of the TEM specimen against damage
spectrum of the diamond lm on sapphire. The Raman peak at from the high-energy ion beam in FIB, the specimen was
1332 cm1 conrms the successful deposition of the diamond coated with platinum before FIB cutting. The cross-sectional
lm on sapphire, and the full width at half-maximum (FWHM) bright-eld TEM image and the selected area electron
of the peak is determined to be 8 cm1, implying a good crys- diffraction (SAED) pattern from the marked regions of dia-
tallinity for the lm. A broad band exists at 1550 cm1 with a mond and sapphire are shown in Fig. 6. The TEM image in
relatively lower intensity, suggesting the presence of a small Fig. 6(a) shows that the diamond crystallite is in twin char-
amount of graphite. To make sure the effectiveness of acteristics for the le and right halves which also can be
18946 | RSC Adv., 2014, 4, 18945–18950 This journal is © The Royal Society of Chemistry 2014
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Fig. 1 SEM images of synthesized diamond films on sapphire for 48 h in (a) low magnification in plan-view, and (b) high magnification in plan-
view, and (c) in cross section. (d) Raman spectrum.
identied from the SAED patterns in Fig. 6(b)–(e) from the crystalline phases in diamond. The HRTEM image in Fig. 6(f)
individual regions in Fig. 6. Also, it can be seen that the is obtained from an interfacial region between diamond and
sapphire surface remains smooth aer diamond deposition, sapphire (the le-hand side region of the image with zone
implying that the sapphire has undergone negligible etching axis in h21 1
0i sapphire), showing diamond and sapphire
by the plasma. The SAED patterns in Fig. 6(b)–(d) obtained lattice fringes. The d-spacing between the fringes in the dia-
from the corresponding marked regions show the single mond region is 2.06 Å which corresponds to be the diamond
crystalline diamond characteristics in h110i zone axis and {111} interplanar spacing, consistent with the SAED obser-
sapphire in h211
0i one. The SAED patterns in Fig. 6(b) and (c) vations as shown in Fig. 6(b). As the diamond fringes are in
indicate that the le diamond is h001i oriented and the right connection with the sapphire ones, we can observe no inter-
one is h111i oriented, and they are in the twin relationship. layer formed between the diamond and the sapphire, sug-
The SAED pattern in Fig. 6(e) from the interface region shows gesting that the diamond lm was directly grown on the
that the orientation relationship is closed to h110i diamond// sapphire. As shown in Fig. 6(g), the ltered image aer
h211
0i sapphire and {111} diamond//{0001} sapphire or {111} inverse fast Fourier transform (FFT) of the lattice image using
diamond//{01 14} sapphire. This is different from the in-plane diamond (111) and sapphire (01 14) reections illustrates a
epitaxial relationship of h110i diamond//h11 00i sapphire reasonably good match of diamond (111) with sapphire
which has been reported in literature.6,27,28 The lattice 14) due to their close domain matching in 5 : 4 (d-spacings
(01
mismatch of diamond along h110i with sapphire along h21 1
0i 2.06 Å vs. 2.55 Å), consistent with the result obtained from the
is about 6% (5.04 Å versus 4.76 Å), in comparison with that of SAED pattern in Fig. 6(e). Such domain matching has been
39% with sapphire along h11 00i (8.24 Å). Only reections of oen found in heteroepitaxy of thin lm growth.29 Thus, it is
diamond and sapphire can be observed in Fig. 6(e) without suggested that diamond can be epitaxially grown on
any other additional diffraction reections, suggesting that sapphire.
no crystalline interlayers exist between them and no extra
Fig. 2 SEM surface morphology after CVD (a) on uncoated sapphire, (b) on sapphire cover with dry-coated adamantane powder, and (c) on
sapphire only dip-coated with glycol solvent without any addition of adamantane.
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Fig. 6 The cross-sectional BF-TEM image of diamond on sapphire and the corresponding SAED patterns from diamond and sapphire regions. (a)
BF TEM, (b) and (c) SAED patterns of diamond from left and right hand sides, respectively, (d) SAEDP of sapphire. (e) SAEDP at the diamond/
sapphire interface, (f) HRTEM image of the interface between diamond (left) and sapphire with (g) inverse FFT-filtered image of diamond (111) and
sapphire (0114).
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