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Mark B. Mitchell
0065-2393/93/0236-0351$07.25/0
© 1993 American Chemical Society
interactions.
D i f f u s e reflectance has b e e n used extensively i n the visible a n d ultravio
let regions o f the electromagnetic spectrum for the characterization o f solid
materials such as inorganic powders. M a n y o f the effects a n d constraints that
Publication Date: May 5, 1993 | doi: 10.1021/ba-1993-0236.ch013
Theory
T h e r e are t w o general types o f reflected light: specular a n d diffuse. A
c o m m o n example o f specular reflection (also called front-surface, regular, o r
F r e s n e l reflection) is light reflected f r o m mirrors o r other p o l i s h e d surfaces.
Specular reflectance occurs at any interface between t w o materials w i t h
different refractive indices. Specularly reflected light is characterized b y the
rule that the angle o f reflection is equal to the angle o f incidence. C o m m o n
examples o f diffusely reflecting surfaces are the matte surfaces characteristic
o f certain types o f paper a n d powders. D i f f u s e l y reflected radiation is the
fight reflected f r o m a diffusely reflecting sample f o r w h i c h the angle o f
reflection does not equal the angle o f incidence.
ri = η + ik' (1)
I = I e- *
0
k
(2)
Jfc'=Jfc/4irv (3)
k = 2.303ac (4)
f(R )
œ = (l-R f/2R^-k/s
œ (5)
1 = I e~"
0 (6)
substituted f o r R i n e q 5, w h e r e
œ
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R' = R (sample)/Β»
œ œ (standard) (7)
œ œ
Incident Radiation
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Publication Date: May 5, 1993 | doi: 10.1021/ba-1993-0236.ch013
Analyzer
Radiation from
To detector
interferometer
Polarizer
[] Sample
(A)
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Publication Date: May 5, 1993 | doi: 10.1021/ba-1993-0236.ch013
U Sample
(B)
Radiation from
interferometer
Detector
Analyzer
(C)
Figure 2. Schematic diagram of three commonly used optical configurations that
eliminate to a great degree the contribution of Fresnel specular reflectance to
the collected radiation. The top diagram (A) represents the in-line configuration
in which polarizers are used to eliminate the specular component. The middle
diagram (B) shows the off-line configuration in which exclusion of the plane of
incidence from the collection optics is used to eliminate the specularly reflected
component. The bottom diagram (C) is a configuration built by Fuller and
Griffiths (3). (Reproduced with permission from reference 17. Copyright 1948.)
configuration.
3800 3000
Cm" 1
solid solutions in KCl (1:50 weight ratio): PVPh~P2VP polymer complex formed
with 4:1 initial composition (A); pure PVPh (B); and pure P2VP (C). (Reproduced
with permission from reference 27. Copyright 1984.)
(30).
I n 1984, the technique o f using K B r overlayers to obtain D R I F T spectra
o f p o l y m e r fibers was i n t r o d u c e d b y M c K e n z i e et a l . ( 3 2 ) , w h o investigated
the c o u p l i n g agent 7-aminopropyltriethoxysilane (7-APS) o n Ε-glass fibers.
Publication Date: May 5, 1993 | doi: 10.1021/ba-1993-0236.ch013
Ε-glass fiber mats were cut into circles to fit the D R I F T spectroscopy cell.
H a d the samples obeyed the K u b e l k a - M u n k relation, it w o u l d have b e e n
possible to obtain the spectrum o f the c o u p l i n g agent o n the fibers b y
subtracting a spectrum o f the fibers alone f r o m that o f the fibers treated w i t h
7 - A P S . Unfortunately, this m e t h o d d i d not w o r k w e l l . Subtraction o f the
spectrum d u e to the Ε-glass substrate f r o m the spectrum o f Ε-glass treated
w i t h 7 - A P S y i e l d e d a spectrum i n w h i c h some o f the substrate bands h a d not
b e e n subtracted completely a n d some h a d b e e n oversubtracted. T h i s result
was an obvious indication o f n o n - K u b e l k a - M u n k behavior, presumably d u e
to anomalous dispersion. A n additional p r o b l e m that M c K e n z i e et al. e n c o u n
tered was that rotation o f the sample generated p r o f o u n d changes i n the
observed spectrum. A s i n their previous study (31) a n d the study b y M a u l
hardt a n d K u n a t h ( 3 0 ) , the useful range o f the D R I F T spectra was 4 0 0 0 - 1 6 0 0
c m . T h e lower l i m i t is a significant l i m i t a t i o n because it eliminates virtually
- 1
ture (150 °C), the absorption pattern changed a n d the result c o u l d no longer
be i d e n t i f i e d as a methoxide. F e - Z S M - 5 gives the same sequence o f p r o d
ucts. M e t h a n o l adsorption o n N a - Z S M - 5 a n d silicalite resulted i n the f o r m a
tion o f the surface methoxide o n l y at r o o m temperature a n d at 200 °C.
T h o m p s o n a n d P a l m e r ( 2 2 ) u s e d i n situ D R I F T spectroscopy to study
the reaction o f S 0 w i t h C a C 0 . C a C O is u s e d as an adsorbent for S 0 i n
2 3 s 2
temperature.
O n e o f the limitations o f the D R I F T technique is the n e e d to dilute
strongly absorbing samples i n a nonabsorbing matrix to avoid reststrahlen
effects. I n their D R I F T studies, T h o m p s o n a n d P a l m e r u s e d N a C l as the
diluent (1:10 C a C 0 : N a C l ) , a n d i n their photoacoustic studies using p u r e
3
oxidation of N O to N O +
b y C o (III) through the infrared absorption o f the
nitrosyl cation at 2162 c m - 1
a n d coordinated nitrosyl at 1674 a n d 1562 c m - 1
.
T h e species adsorbed o n a silver catalyst d u r i n g the oxidation of acetalde-
hyde was analyzed b y K a n n o a n d Kobayashi (48) using D R I F T spectroscopy.
T h e D R I F T spectra obtained f r o m the reaction were c o m p a r e d w i t h similar
spectra for silver salts, such as silver acetate, silver lactate, silver ketenide,
a n d silver carbonate. T h e s e comparisons, facilitated assignment of observed
peaks i n the i n f r a r e d spectrum o f the catalyst as b e i n g due to silver acetate
intermediates, a strongly adsorbed acetaldehyde, a n d an adsorbed alcohol.
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M n ( C O ) , K [ H F e ( C O ) ] , a n d K [ F e M n ( C O ) ] . D R I F T spectroscopy
2 1 0 3 n 2 1 2
NAVENUMBER
shown in sequence from bottom to top representing metal loadings of 0.92, 1.7,
2.5, 3.8, 4.5, and 5.6% Cu on Si0 , respectively.
2
spectrum o f the overlayers; that is, the C u ( a c a c ) species not i n direct contact
2
Summary
D i f f u s e reflectance spectroscopy i n the m i d - i n f r a r e d range is a p o w e r f u l
technique for the study o f certain types o f samples, i n c l u d i n g polymers,
heterogeneous catalysts, a n d n o v e l materials. D R I F T has great potential f o r
the study o f a w i d e variety o f processing p r o b l e m s a n d for i n situ investiga
tions, b o t h as a stand-alone technique a n d i n conjunction w i t h G C a n d
G C - M S . W h a t must b e kept i n m i n d i f useful results are expected are the
approximations inherent i n the technique such as optically dilute samples, the
problems a n d the solutions associated w i t h specular a n d diffuse Fresnel
reflectance, a n d the n e e d f o r reproducible sample preparation.
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RECEIVED for review July 15, 1991. ACCEPTED revised manuscript September
25, 1992.