A DVANCED E LECTROMAGNETICS S YMPOSIUM , AES 2012, 16 – 19 A PRIL 2012, PARIS – FANCE

Focusing of Electromagnetic Field by a 3-D Cassegrain Reflector System Coated

with Chiral Medium
M. J. Mughal, A. R. Farooqi∗ and M. M. Ali
Faculty of Electronic Engineering,
GIK Institute of Engineering Sciences and Technology, Topi (23640), Khyber Pakhtunkhwa, Pakistan.
*corresponding author, E-mail: abdulrazzaqf@gmail.com

Abstract and Gregorian reflector systems has been done by [20, 21].
In this paper, focused field of a 3-D Cassegrain reflector is
The electromagnetic field expressions for the focused field
analyzed when its main paraboloidal reflector has a coating
of a 3-D Cassegrain system with its paraboloidal reflector
of chiral medium.
coated with chiral medium are analyzed. Maslov’s method
The present study is divided into five sections. Section
is used to find the field expressions at high frequencies.
2 describes the relation of incident and reflected field am-
The dependency of focused field on the thickness of chi-
plitudes from perfect electric conductor (PEC) plane coated
ral coating, chirality parameter and relative permittivity is
with a layer of chiral medium. In section 3, GO fields ex-
studied. It is concluded that the field strength at focal region
pressions for 3-D Cassegrain reflector system are presented.
increases by increasing the thickness of chiral layer, chiral-
The simulation results and the conclusions are presented in
ity parameter and relative permittivity of the chiral coat-
section 4 and 5, respectively.
ing. Therefore, it is possible to maximize the focused field
strength by adjusting these parameters.
2. Relation of Incident and Reflected Fields
1. Introduction by PEC Plane Coated with Chiral Medium
In focusing applications such as optical devices, laser cav- To observe the focal region fields of a 3-D Cassegrain sys-
ities and solar energy collectors, different types of metal- tem when its paraboloidal reflector has a coating of chiral
lic and dielectric reflectors are used. The losses which material, the reflection phenomenon is considered from the
occur due to these reflectors can be controlled by coating PEC plane which is coated with a chiral layer as in [1, 2].
these reflectors with the layer of chiral medium as it has the The region z ≤ 0 is occupied with free space i.e., with pa-
property to minimize the losses by adjusting the parameter
termed as chirality parameter [1, 2]. Such types of chiral
coating may be useful for collection of data by remote sens-
ing of different vegetation layers and also in biomedicine
and biochemistry applications [3, 4].
In 19th century, the chiral medium was studied be-
cause of its optical rotation property. Later, it was theoret-
ically and experimentally proved that left circularly polar-
ized (LC) and right circularly polarized (RC) waves exist
in the chiral medium. These waves have different phase
velocities, it means that the chiral medium has two dif-
ferent refractive indices for LC and RC waves [5]. Also
due to different circular polarizations, the waves have dif-
ferent modes of propagation [6]. Many scientists have
explored the interaction and properties of electromagnetic
waves with chiral slabs, reflection and transmission through
chiral interfaces and characteristics of antennas embedded
in the chiral medium [7-11].
To observe the field strength at focal region, Maslov’s
method is used as an alternative because Geometrical Op-
tics (GO) is an approximate method and fails at focal points
[12-19]. The physical explanation of Maslov’s method and Figure 1: Reflection from the PEC plane coated with chiral
its comparison to different asymptotic ray theory (ART) medium
techniques have been given by Ziolkowski et al. [12]. Anal-
ysis of focal region fields of chiral coated 2-D Cassegrain rameters (ε0 , µ0 ) while the region 0 ≤ z ≤ d consists of
chiral layer i.e., (ε, µ, β) which is actually the coating at
PEC plane as shown in Figure 1. At interfaces z = 0 and
z = d, the application of boundary conditions yields fol-
lowing equation [1],
[ ] ( )
B⊥ −1
= [r] + [T ] ([∆] [R2 ] [∆] − [R]) [t]
B∥
[ ] (1)
A⊥
×
A∥
where A⊥ , B⊥ and A∥ , B∥ are the amplitudes of perpen-
dicular and parallel components of incident and reflected
fields, respectively. In Equation (1), the matrices [r], [R],
[t], [T ], [∆] and [R2 ] are of 2×2 order, defined in terms of
Fresnel coefficients as given in [1]. By using this relation,
the amplitudes of reflected waves from chiral coated 3-D
Cassegrain reflector system are obtained in the next section.

3. Geometrical Optics Field for 3-D

Cassegrain Reflector System Coated with
Chiral Medium Figure 2: 3-D Cassegrain System
Cassegrain reflector system consists of a paraboloidal
and the hyperboloid reflector. The geometry equations Here H1 is the distance from point (ξ2 , η2 , ζ2 ) to the fo-
of paraboloidal and the hyperboloid reflector of a 3-D cal point z = −g and H2 is the distance from the same
Cassegrain system can be formulated as [13], point to the focal point z = g. The reflected wave from the
√ paraboloidal surface will behave as incident wave for the
σ2 d
ζ1 = g − f + 1 , ζ2 = σ22 + e2 , g 2 = d2 + e2 (2) hyperboloid reflector is given by,
4f e
where, Ei2 = E exp{jko (x sin 2φ1 cos φ3 + y sin 2φ1 sin φ3
−z cos 2φ1 )} (9)
σ1 = ξ12 + η12 , σ2 = ξ22 + η22 , dH2 = gζ2 − d2 (3)
and (ξ1 , η1 , ζ1 ) and (ξ2 , η2 , ζ2 ) are the points in cartesian The rectangular components of the field reflected from
coordinate system which lie at the paraboloidal reflector paraboloidal reflector are given as [2],
and hyperboloid sub-reflector, respectively. Let the inci- Ex = B⊥ sin2 φ2 − B∥ cos2 φ2 cos 2φ1 (10)
dent electromagnetic wave is traveling along the z-direction
as shown in Figure 2. The Incident wave equation can be Ey = − cos φ2 sin φ2 (B∥ cos 2φ1 + B⊥ ) (11)
written as, Ez = −B∥ sin 2φ1 cos φ2 (12)
Ei = ax exp(−jko z) (4)
The initial value of the reflected wave from the surface of
Unit vectors an1 and an2 normal to the paraboloidal and hyperboloid reflector can be obtained using snell’s law as,
hyperboloid surfaces are given as,
Er2 = −Ei2 + 2(Ei2 .an2 )an2 (13)
an1 = sin φ1 cos φ2 ax + sin φ1 sin φ2 ay − cos φ1 az (5)
where, The rectangular components of reflected wave from the hy-
perboloid reflector are,
σ1 2f
sin φ1 = √ 2 , cos φ1 = √ 2
σ1 + 4f 2 σ1 + 4f 2
r
E2x = −B⊥ sin2 φ2 + B∥ cos2 φ2 cos 2φ1
(6)
η1 −2G sin φ3 cos φ2 (14)
tan φ2 =
ξ1 r
E2y = cos φ2 sin φ2 (B∥ cos 2φ1 + B⊥ )
and −2G sin φ3 sin φ2 (15)
an2 = − sin φ3 cos φ2 ax − sin φ3 sin φ2 ay + cos φ3 az (7)
r
E2z = −B∥ sin 2φ1 cos φ2 + 2G cos φ3 (16)

where, where,
aσ2 bζ2 G = − sin φ3 cos φ2 (B⊥ sin2 φ2 − B∥ cos2 φ2 cos 2φ1 )
sin φ3 = √ , cos φ3 = √
b H1 H 2 a H1 H2
η2
(8) + cos φ2 sin2 φ2 cos φ3 (B∥ cos 2φ1 + B⊥ )
tan φ2 = −B∥ sin 2φ1 cos φ2 cos φ3
ξ2

2
The expression for the focal region field is calculated by where the terms in phase function are given as,
using Maslov’s method, given as [13],
2f cos 2φ1
[∫ ∫ −W1 ] ∫ 2π Co = −c
W2 1 + cos 2φ1
jk H 3 cos3 φ1 sin 2φ1 √
E(r) = + Er2 2
2π W1 −W2 0 f2 τ1 = (ξ2 − ξ1 )2 + (η2 − η1 )2 + (ζ2 − ζ1 )2
√ a cos φ3 cos(2φ1 − 2φ3 )
2
cos(2φ1 − φ3 ) Cex1 = √
× CΛξ Λη Λζ a2 cos2 φ3 − b2 sin2 φ3
2 cos φ3
b2 sin φ3 sin(2φ1 − 2φ3 )
× exp[−jko {Co + τ1 + Cex1 +√
a2 cos2 φ3 − b2 sin2 φ3
−r sin φ sin(2φ1 − 2φ3 ) cos(φ2 − ϕ)]dφ1 dφ2
−r cos(2φ1 − 2φ3 ) cos θ
(17)
and the limits of integration are chosen using relations,
where,
( )
L
1 + tan 2φ1 tan φ1 cos2 φ2 W1 = 2 tan−1
Λξ = 2f
1 + tan 2φ1 tan φ3 cos2 φ2 ( )
l
1 + tan 2φ1 tan φ1 sin2 φ2 W2 = tan−1
Λη = 2c
1 + tan 2φ1 tan φ3 sin2 φ2
2ac
Λζ = 1− [Λξ cos2 φ2 + Λη sin2 φ2 ]
H1 (H2 + a) 4. Results and Discussion
C = sin(2φ1 − 2φ3 )
In this section, Equation (17) is solved numerically for L =
The rectangular components of field are given as, 16, l = 4, a = 5, b = 6 and kf = 20. The limits of
[∫ ∫ −W1 ] ∫ 2π integration are taken using the formulas for W1 and W2 .
jk W2 ( The effects of chiral layer thickness (d), chirality parameter
r
E2x = + −B⊥ sin2 φ2
2π W1 −W2 0 (β) and relative permittivity (ε) on the focal region of a 3-D
) Cassegrain reflector system are investigated and analyzed.
+B∥ cos φ2 cos 2φ1 − 2G sin φ3 cos φ2
2
√
H23 cos3 φ1 sin 2φ1 cos(2φ1 − φ3 )
× CΛξ Λη Λζ
f2 2 cos φ3
× exp[−jko {Co + τ1 + Cex1
−r sin θ sin(2φ1 − 2φ3 ) cos(φ2 − ϕ)]dφ1 dφ2
(18)
[∫ ∫ ]∫
W2 −W1 2π
jk
r
E2y = − + {−2G sin φ3 sin φ2
2π W1 −W2 0
}
+ cos φ2 sin φ2 (B∥ cos 2φ1 + B⊥ )
√
H23 cos3 φ1 sin 2φ1 cos(2φ1 − φ3 )
× CΛξ Λη Λζ
f2 2 cos φ3
× exp[−jko {Co + τ1 + Cex1
−r sin θ sin(2φ1 − 2φ3 ) cos(φ2 − ϕ)]dφ1 dφ2 Figure 3: Chiral thickness effect in 3-D Cassegrain system
(19)
[∫ ∫ ]∫ Figure 3 shows the dependence of chiral thickness (d)
W2 −W1 2π
r jk on the strength of focal region field. It is clear that by
E2z = + (2G cos φ3
2π W1 −W2 0 increasing the thickness, focal region field strength in-
) creases because of increase in the number of chiral medium
−B∥ sin 2φ1 cos φ2
√ molecules, here β and ε are kept constant i.e., β = 0.5 and
H 3 cos3 φ1 sin 2φ1 cos(2φ1 − φ3 ) ε = 2. Figure 4 indicates that by increasing the chirality
× 2 CΛξ Λη Λζ parameter β keeping ε = 2 and d = 0.1, the focused field
f2 2 cos φ3
strength increases, the reason is the increased concentration
× exp[−jko {Co + τ1 + Cex1
of chiral medium molecules.
−r sin θ sin(2φ1 − 2φ3 ) cos(φ2 − ϕ)]dφ1 dφ2 Figure 5 shows the effect of change in relative permit-
(20) tivity ε when β = 0.5 and d = 0.1. It is observed that grad-

3
Figure 4: Chirality parameter effect in 3-D Cassegrain sys-
tem
Figure 5: Relative permittivity effect in 3-D Cassegrain sys-
tem
ual increase in the value of ε increases the strength of focal
region field. The reason is,√the chiral material impedance is
inversely proportional to ε. When ε is increased, there is
decrease in η and ultimately the focal region field strength
is increased.
Finally, the chirality parameter is fixed i.e., β = 0 and
the dependency of dielectric thickness on focal region field
is observed. Figure 6 shows the increased focal region field
strength when d is increased keeping β = 0 and ε = 2. The
effect of dielectric relative permittivity on focal region field
is shown in Figure 7, with β = 0 and d = 0.4. The focal re-
gion field strength increases as value of relative permittivity
is increased.
5. Conclusions
The focal region fields of a 3-D Cassegrain reflector system
are observed with its paraboloidal reflector coated with chi-
ral layer. It is concluded that by increasing the chiral coat-
ing thickness (d), chirality parameter (β) and relative per-
4
Figure 6: Dielectric thickness effect in 3-D Cassegrain sys-
tem
Figure 7: Dielectric relative permittivity effect in 3-D
Cassegrain system
mittivity (ε) of chiral coating, the strength of focal region
field is increased. Also the dielectric layer coating effect is
analyzed by putting the chirality parameter equal to zero. It
is concluded that the focused field strength can be increased
by increasing the relative permittivity ε and thickness d of
the dielectric coating. Thus, present study is useful for the
optimization in different focusing applications.
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