4

Two Tests are performed

➢Open circuit test
➢Short circuit test

I1 R1 Xl1 I2 Xl2 R2

Iᶲ1 N1 N2
Ic1 Im V2 Z2
V1 E1 E2
Rc1 Xm
5

 Primary = input winding = 1

N1 N2
 Secondary = output winding = 2
 Step-down Transformer: V1 V2

Primary = HV, Secondary = LV

𝑉1 > 𝑉2 ⇒ a > 1 ⇒ 𝐼1 < 𝐼2 ;
𝑉𝐻𝑉 > 𝑉𝐿𝑉 ⇒ 𝐼𝐻𝑉 < 𝐼𝐿𝑉
 Step-up Transformer:
V1 E N1
Primary = LV, Secondary = HV
= 1 = =a
V2 E2 N2
I1 1
=
𝑉1 < 𝑉2 ⇒ 𝑎 < 1 ⇒ 𝐼1 > 𝐼2 ; I2 a
Z1
𝑉𝐿𝑉 < 𝑉𝐻𝑉 ⇒ 𝐼𝐿𝑉 > 𝐼𝐻𝑉 Z2
= a2
6

 One winding left open circuited.

 LV source readily available
 Safer to measure rated voltage on LV-side of
transformer: 𝑽𝑳𝑽 < 𝑽𝑯𝑽
 Only no-load current flows on LV-side, so current
measurement on LV-side safe, even though: 𝑰𝑳𝑽 >
𝑰𝑯𝑽
 Thus, open circuit test measurements performed
on LV-side
 HV-side left open circuited
7

 Source at rated voltage & frequency applied to LV-

side with HV-side left open circuited
 Measure voltage, current, power on LV-side
8

 Consider approximate equiv cct ref Primary

 Open cct test => Step-up mode, 𝑎 < 1:
Primary = LV, Secondary = HV:
(𝑉1 = 𝑉𝐿𝑉 ) < (𝑉2 = 𝑉𝐻𝑉 )

I1 R1 Xl1 X'l2=a2Xl2 R'2=a2R2

Iᶲ1 = Rated
Ic1 I'2 = I2 / a = 0
Im
V'2=E'2
V1 = Rated Rc1 Xm

Primary = LV-side = 1 Secondary = HV-side = 2

9

 Simplified equivalent circuit

 Only shunt branch to be considered

Ioc I'2=0 ReqLV XeqLV

Iᶲ1
Ic1 Im
Voc
RcLV XmLV

Primary = LV-side
10

𝐼𝑛𝑝𝑢𝑡 𝑝𝑜𝑤𝑒𝑟 ≡ 𝑃𝑜𝑤𝑒𝑟 𝑑𝑖𝑠𝑠𝑖𝑝𝑖𝑡𝑎𝑒𝑑 𝑖𝑛 𝑅𝑐𝐿𝑉

𝑃𝑜𝑐 ≡ 𝑃𝐶𝑜𝑟𝑒 ≡ 𝑃𝐻𝑦𝑠𝑡 + 𝑃𝐸𝑑𝑑𝑦
Ioc
𝑉2𝑜𝑐
𝑃𝑜𝑐 = Iᶲ1
𝑅𝑐𝐿𝑉 Ic1 Im
Voc
𝑉2𝑜𝑐 RcLV XmLV
∴ 𝑅𝑐𝐿𝑉 =
𝑃𝑜𝑐
𝑉𝑂𝐶 Primary = LV-side
Also, 𝑅𝑐𝐿𝑉 =
𝐼𝑐1
But, 𝐼𝑐1 not known (at this stage)
11

Also, 𝑃𝑜𝑐 = 𝑉𝑜𝑐 𝐼𝑐1 = 𝑉𝑜𝑐 𝐼𝑜𝑐 cos(𝜃𝑜𝑐 )

𝑃𝑜𝑐 𝑃𝑜𝑐 Ioc
∴ cos 𝜃𝑜𝑐 = =
𝑉𝑜𝑐 𝐼𝑜𝑐 𝑆𝑜𝑐 Iᶲ1
Ic1 Im
𝐼𝑜𝑐 = 𝐼𝑐1 + 𝐼𝑚 Voc
RcLV XmLV
𝐼𝑐1 in phase with 𝑉𝑜𝑐
𝐼𝑚 lags 𝑉𝑜𝑐 by 90° Primary = LV-side

𝐼𝑐1 = 𝐼𝑜𝑐 cos(𝜃𝑜𝑐 )

𝐼𝑚 = 𝐼𝑜𝑐 sin(𝜃𝑜𝑐 )
𝑉𝑜𝑐 𝑉2𝑂𝐶 𝑉𝑂𝐶
𝑋𝑚𝐿𝑉 = 𝑅𝑐𝐿𝑉 = =
𝐼𝑚 𝑃𝑂𝐶 𝐼𝑐1
12

 During short circuit test, rated current flows

through windings
 So, high current on LV-side: 𝐼𝐿𝑉 > 𝐼𝐻𝑉
 Thus, safer to measure current on HV-side
 Only fraction of rated HV voltage applied to get
rated LV-side current, even though: 𝑉𝐻𝑉 > 𝑉𝐿𝑉
 Thus, short circuit test measurements performed
on HV-side
 So, LV-side short circuited
13

 With LV-side short circuited, source at fraction of

rated HV-side voltage & rated frequency applied
to HV-side until rated HV-side current flows
 Measure voltage, current, power on HV-side
14

 Consider approximate equiv cct ref Primary

 Short cct test => Step-down mode, 𝑎 > 1:
Primary = HV, Secondary = LV:
(𝐼1 = 𝐼𝐻𝑉 ) < (𝐼2 = 𝐼𝐿𝑉 )

I1 R1 Xl1 X'l2=a2Xl2 R'2=a2R2

Iᶲ1 < Rated

Ic1 I'2 = I2 / a = Rated
Im
V'2=0
V1 < Rated Rc1 Xm

Primary = HV-side = 1 Secondary = LV-side = 2

15

 Simplified equivalent circuit

 Impedance of shunt branch greater than Req_HV+jXeq_HV
◦ Hence, under short cct, currents flows does not flow through this branch (path of high
resistance)

 Since Req_HV+jXeq_HV is low, only small V is required

to give max I.
Isc ReqHV XeqHV

Iᶲ1 ≈ 0
Ic1 Im
Vsc Rc1 Xm

Primary = HV-side
16

𝑅𝑒𝑞𝐻𝑉 = 𝑅1 + 𝑎2 𝑅2

𝑆𝑜, 𝐼𝑛𝑝𝑢𝑡 𝑝𝑜𝑤𝑒𝑟 ≡ 𝑅𝑎𝑡𝑒𝑑, 𝐹𝑢𝑙𝑙 𝑙𝑜𝑎𝑑 𝑐𝑜𝑝𝑝𝑒𝑟 𝑙𝑜𝑠𝑠

𝑃𝑠𝑐 = 𝐼2𝑠𝑐 𝑅𝑒𝑞𝐻𝑉 Isc ReqHV XeqHV

𝑃𝑠𝑐
∴ 𝑅𝑒𝑞𝐻𝑉 = 2 Vsc
𝐼 𝑠𝑐

Primary = HV-side
17

𝑉𝑠𝑐
𝑍𝑒𝑞𝐻𝑉 =
𝐼𝑠𝑐

But 𝑍𝑒𝑞𝐻𝑉 = 𝑅2𝑒𝑞𝐻𝑉 + 𝑋2𝑒𝑞𝐻𝑉

2 Isc ReqHV XeqHV

∴ 𝑋𝑒𝑞𝐻𝑉 = 𝑍𝑒𝑞𝐻𝑉 −𝑅2𝑒𝑞𝐻𝑉

Vsc
Alternatively: 𝑋𝑒𝑞𝐻𝑉 = 𝑍𝑒𝑞𝐻𝑉 sin(𝜃𝑠𝑐 )
But, 𝑃𝑠𝑐 = 𝑉𝑠𝑐 𝐼𝑠𝑐 𝑐𝑜𝑠 𝜃𝑠𝑐
Primary = HV-side
𝑃𝑠𝑐
∴ 𝜃𝑠𝑐 = 𝑐𝑜𝑠 −1
𝑉𝑠𝑐 𝐼𝑠𝑐
18

IHV ReqHV XeqHV

I'LV = ILV / a
VHV RcHV XmHV V'LV = aVLV

2 𝐹𝑟𝑜𝑚 𝑜𝑝𝑒𝑛 𝑐𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡

𝑅𝑐𝐻𝑉 = 𝑅𝑐1 = 𝑎 𝑅𝑐𝐿𝑉
2 ቋ 𝑤ℎ𝑒𝑟𝑒 𝑣𝑎𝑙𝑢𝑒𝑠 𝑎𝑟𝑒
𝑋𝑚𝐻𝑉 = 𝑋𝑚 = 𝑎 𝑋𝑚𝐿𝑉 𝑟𝑒𝑓𝑒𝑟𝑟𝑒𝑑 𝑡𝑜 𝐿𝑉
V1 E N1
= 1 = =a
V2 E2 N2
𝑅𝑒𝑞𝐻𝑉 = 𝑅𝑒𝑞1 𝐹𝑟𝑜𝑚 𝑆ℎ𝑜𝑟𝑡
ቋ I1
=
1
𝑋𝑒𝑞𝐻𝑉 = 𝑋𝑒𝑞1 𝐶𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡 I2 a
Z1
= a2
Z2
19

I'HV = aIHV ReqLV XeqLV

ILV
V'HV = VHV / a RcLV XmLV VLV

𝐹𝑟𝑜𝑚 𝑜𝑝𝑒𝑛 𝑐𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡

𝑅𝑐1 = 𝑅𝑐𝐿𝑉
ൠ 𝑤ℎ𝑒𝑟𝑒 𝑣𝑎𝑙𝑢𝑒𝑠 𝑎𝑟𝑒
𝑋𝑚 = 𝑋𝑚𝐿𝑉
𝑟𝑒𝑓𝑒𝑟𝑟𝑒𝑑 𝑡𝑜 𝐿𝑉
𝑅𝑒𝑞𝐻𝑉 V1 E N1
𝑅𝑒𝑞𝐿𝑉 = 𝑅𝑒𝑞2 = = 1 = =a
𝑎2 𝐹𝑟𝑜𝑚 𝑆ℎ𝑜𝑟𝑡 V2 E2 N2
𝑋𝑒𝑞𝐻𝑉 𝐶𝑖𝑟𝑐𝑢𝑖𝑡 𝑡𝑒𝑠𝑡 I1
=
1
𝑋𝑒𝑞𝐿𝑉 = 𝑋𝑒𝑞2 = I2 a
𝑎2 Z1
= a2
Z2