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Abstract— In this paper, the traditional Fault Tree Analysis the fault tree thousands of times to get more accurate results.
(FTA) method combined with Monte Carlo simulations (MCSs) is While MCS is computationally intensive, it can accurately
introduced to a real micro-gird with significant clean energy predict fault propagation in a fault tree and thus evaluate a
penetration. Importance of different components in the micro-
system’s reliability.
grid is first found using the traditional FTA but cannot show a
clear illustration of the system’s reliability with respect to time. In this paper, this method is introduced and applied to a
Using the proposed fault-tree-MCS (FT-MCS) method, a micro-grid with significant clean energy penetration. The
simulation program can be established with random sampling MATLAB simulation results produce approximate importance
time. In this process, the contribution of each part to the whole degrees and reliability functions for each major subsystem in
system reliability can be clearly shown with varying time. A more the micro-grid, as well as the overall micro-grid. The paper
accurate Mean Time to Failure (MTTF) can thus be achieved
proceeds as follows. Section II introduces the micro-grid used
using the FT-MCS. FT-MCS is shown to combine the benefits of
fault tree component hierarchy for fault propagation, as well as for the case study where both FTA and FT-MCS are applied.
fault occurrence over time. FTA for this micro-grid is presented in Section III, and FT-
MCS is illustrated in Section IV. Simulation results and
Keywords —Fault Tree Analysis, Micro-grid, Monte Carlo conclusions are shown in Sections V and VI, respectively.
Simulation, Reliability
II. MICRO-GRID FOR CASE STUDY
I. INTRODUCTION
Micro-grids are becoming of more interest worldwide to
1 1
I (20) = I (19) = I (18) = I (17) =1− (1− 5−1 )2 (1− 9−1 )160 = 0.5301
Subsystem 5
m23 2 2
failure G10 1 1
I (21) =1− (1− 3−1 )(1− 5−1 )4 = 0.4206
AND
2 2
1 1
Subsystem 3 Subsystem 4 I (22) =1− (1− 3−1 )(1− 7−1 )80 = 0.7872
failure G8 failure G9 2 2
1 1 1 1
I (23) =1− (1− 3−1 )(1− 5−1 )4(1− 7−1 )80 (1− 9−1 )320 = 0.9530
OR
OR
2 2 2 2
Subsystem 1 Subsystem2
m21 failure G7 m22
failure G6
IV. MONTE CARLO ALGORITHM AND APPLICATION TO FTA
AND
AND
OR
OR
2
FT-MCS Algorithm which the system failed due to each component are recorded
(1) Initialize the maximum simulation time Tmax of the during each interval. This step can give an importance degree
system, simulation interval ǻt, failure distribution of of each component based on the number of times it failed.
each component F1(t), F2(t),…, Fn(t), state function (0 Detailed simulation steps are shown in the FT-MCS algorithm
or 1) of each component x1(t), x2(t),…, xn(t), simulation shown on the left.
cycles Wˈj=1ˈtop event function In a fault tree, the “AND” gate structure function should be
ϕ (t ) = φ ( x1 (t ), x2 (t ),..., xn (t )) b
ϕ (t ) = Π xi , since the top event after an AND gate is 1 (i.e.
i =a
(2) While(jW) ϕ (t ) = 1 ) only if all bottom events have occurred (xi=1). The
d
(3) Using Monte-Carlo method to obtain the occurrence “OR” gate structure function should be ϕ (t ) = Σ xi , since when
i =c
time samples of each basic component t1j, t2j,…,tnj,
only one bottom event occurs, the top event occurs. Below is
tij=F-1(Șij) here tij is the failure occurrence time of the
number i basic component. Șij is the random number the FT-MCS algorithm as applied in MATLAB.
acquired during the jth sample of event i V. SIMULATION RESULTS
(4) Arrange the failure times from small to big The PV, FC, and DG subsystems are found to have the
tf1<tf2<…<tfk<…tfn reliability distributions shown in Fig. 3. The curves in Fig. 3
clearly show how the system reliability changes with time and
(5) For k=1 to n this eliminates the drawbacks of the traditional fault tree
method. In Fig. 3 (a), we can see that the reliability of the PV
(6) If tfk<Tmax subsystem decreases to being 20% reliable after around 5 year
operation. Because of the difference of the components’
(7) x1(tfk)=x2(tfk)=…=xk(tfk)=1, lifetime, different Tmax values in simulations are assumed and
xk+1(tfk)=xk+2(tfk)=…=xn(tfk)=0,ˈcalculate the top event are shown as the maximum values on the time axes which can
ϕ k (t fk ) = φ ( x1 (t fk ), x2 (t fk ),..., xn (t fk )) be found in Fig. 3. Fig. 4 (a), (b), and (c) show the
components’ importance degree in each subsystem. From
(8) If ϕ k (t fk ) = 1 these results we can determine which components are the most
critical in the subsystems and the overall system. To improve a
subsystem’s or system’s reliability, the direct way is to
(9) Record the failure time tfk, the components which lead to
improve the reliability of critical components. Fig. 5 gives the
system failure, and the system failure probability
overall micro-grid system reliability function and importance
distribution
degree of all the components. In simulations, N=500000 and
(10) Else k=k+1 based on the components’ failure rates used, the system MTTF
is found to be 58.3539 years. Note that this excludes grid-side
(11) End if faults which can be translated into a significantly higher
failure rate of the PCC.
(12) Else tfk=Tmax, record the failure time tfk ˈ the Using the MCS method, MTTF or failure rate values of an
components which lead to system failure and system overall micro-grid can be approximated as a micro-grid is
failure probability distribution being designing, and this approximation is based on the micro-
grid’s component hierarchy. The micro-grid’s subsystems,
(13) End for failure rates, and reliability objectives may lead to different
final results, but the FTA and FT-MCS can be used for
(14) Calculate MTTFˈsystem reliability, and importance of sensitivity analysis and rough reliability models.
the basic components 1
PV system reliability
0.6
(t1j,t2j… tnj) are sorted from the smallest to the largest
(tf1,tf2…tfn) and the corresponding basic event order is 0.4
Z1,Z2…Zn. First, only Z1 is set to fail then the top event is
tested. If it survives, the simulation should continue testing the 0.2
next basic component Z2 until the top event fails at tfk. This tfk
is the time to failure of the jth cycle. Another important step is
0
recording the failure times of each component by using the 0 0.4 0.8 1.2 1.6 2
Time (hour) 5
time interval method. Tmax is the maximum simulation time, it x 10
Fig.3 (a) PV system reliabiltiy funciton
is divided into intervals and the numbers of times during
3
FC system reliability Importance degree of the basic componments
1 1
Component Importance
0.8
0.8
0.6
0.6
Reliability
0.4
0.4
0.2
0.2 0
Breaker Generator
Fig.4 (c) DG system importance degree of basic components
0
0 2.5 5 7.5 10 12.5 15
Time (hour) 4 Microgrid system reliability
x 10
1
Fig.3 (b) FC system reliabiltiy funciton
Reliability
0.8 0.6
Reliability
0.6 0.4
0.4
0.2
0.2
0
0 0.5 1 1.5 2 2.5
Time (hour) 6
0 x 10
0 1 2 3
Time (hour)
4 5
5
6 Fig.5 (a) Microgrid system reliability
x 10
Fig.3 (c) DG system reliabiltiy funciton
Importance degree of the basic components
0.7
0.6
Component Importance
0.4 0.5
0.4
0.3
0.3
0.2
0.2
0.1
0.1
0
PVpanel DC/DC DC/AC Breaker 0
Fig.4 (a) PV system importance degree of basic components PV DC/DC DC/AC Breaker FC DG LoadTransmissionPCCStart Generator
0.25
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