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JOURNAL OF APPLIED PHYSICS 112, 043516 (2012)
(Received 18 April 2012; accepted 18 July 2012; published online 30 August 2012)
The heat equation in an anisotropic material under sinusoidal excitation is solved in cylindrical-polar
coordinates for the geometry conventionally used in the measurement of thermal conductivity by the
“3-Omega” method. Although the solution can be carried out in Cartesian coordinates using Fourier
transforms, the inverse transforms have to be evaluated numerically. The current method allows us
to make contact with, and extend, the analytical results of Cahill and Pohl for isotropic substrates.
We find that the 3-Omega method experiment, if performed conventionally, measures the average
thermal conductivity in the in-plane and cross-plane directions, for modest anisotropies. An alternate
geometry with separate heater and thermometer lines is explored, where the temperature of the
thermometer is expected on physical grounds to be selectively sensitive to the in-plane thermal
conductivity. The selectivity is quantified using the analytic forms derived for the temperature
C 2012 American Institute
profile, and the results are verified by finite element method simulations. V
of Physics. [http://dx.doi.org/10.1063/1.4747836]
I. INTRODUCTION the film. Reference 5 has analyzed the most general case of
multilayer thin films on a semi-infinite substrate, with a diag-
The 3x method1 is a popular technique for the measure-
onal anisotropic thermal conductivity matrix for each layer.
ment of the thermal conductivity of substrates and thin films.
The solution is carried out in Cartesian coordinates by taking
In the conventional 3x method, a metal line with four con-
the Fourier transform in the in-plane direction, and using a
tact pads (two outer pads for sourcing current and two inner
transfer matrix approach for the cross-plane direction. The
ones for measuring voltage) is used both as the heat source,
inverse Fourier transform is then evaluated to yield the 2D
through Joule heating by a sinusoidal current source, and as
temperature profile.
the thermometer, through its temperature coefficient of re-
Naturally, the method of Ref. 5 is perfectly applicable to
sistance. The desired thermal properties of the underlying
the anisotropic-substrate-only case; however, it is not amena-
material appear in the third harmonic of the voltage across
ble to closed-form solution because the inverse Fourier trans-
the inner (voltage) pads, hence the name of the method. For
form has to be computed numerically. As formulated, it is
substrates or films thicker than 2–3 times the thermal pene-
not applicable to non-planar (e.g., etched) geometries and
tration depth (defined by Eq. (2) of Ref. 2), conductivity can
does not consider the heat capacity of the heater line.6 The
be calculated from the slope of the temperature profile vs.
latter two defects can be remedied by fully numerical solu-
logarithm of the frequency.1 If the sample consists of a thin
tion using the finite element method (FEM).
film of lower thermal conductivity on a substrate of higher,
For substrates, the temperature of the heater-
then in order to extract the thermal conductivity of the thin
thermometer depends only logarithmically on its width.
film alone, it is customary to perform two frequency sweeps,
Varying the heater width has been utilized for substrate ani-
one on the film/substrate and another on the substrate alone.
sotropy determination; however, the attempt was restricted
Their difference gives the temperature drop across the thin
to a relatively thin substrate (60 lm) of high anisotropy ratio
film alone.3,4 For such thin films, varying the heater width
(0.7) between the in-plane and cross-plane directions.14
(defined as its dimension along the surface of the sample) is
Attempts at extracting anisotropy for thick substrates of
a viable means of extracting the anisotropy in the thermal
smaller anisotropy are easily masked by effects such as inter-
conductivity.13
facial thermal resistance. It is desirable, therefore, to have
Cahill and Pohl1 analyzed the 3x method experiment
separate lines for the heater and thermometer. For modest
for isotropic substrates by solving the heat equation in
heater-thermometer separation, the temperature profile on
cylindrical-polar coordinates under sinusoidal heat-flux exci-
the thermometer line is not sensitive to interfacial thermal re-
tation. For thin film characterization, if the film has lower
sistance, as we will demonstrate later.
conductivity than the substrate, a commonly used approxi-
In this work, we solve the anisotropic heat equation in
mation is to treat the film as a simple thermal insulator and
cylindrical-polar coordinates under sinusoidal heat-flux exci-
to assume purely cross-plane (1D) heat transfer through the
tation and derive the temperature profile throughout the
film.3 This may be prone to serious error depending on the
solid. With some work, this profile gives a formula that
film thickness and the heater width, due to 2D heat flow in
closely parallels the original result of Cahill and Pohl, if the
heater and thermometer are identical.1,14 We then use the
a)
E-mail address: ashok.ramu@gmail.com. derived temperature profile to examine the important case of
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043516-2 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
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043516-3 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
ð ðp
_ @T 2 2 @T
n ðK rTÞdX ¼ limb!0 L kb ðcos h þ gsin hÞ þ k ðg 1Þcoshsinh dh ; (12)
X h¼0 @b @h
qb 0
We thus arrive at the following equation for the temperature Tðb; hÞ C0 ðK0 ðqbÞ þ eK ðqbÞsin2 hÞ; (16)
2 0
profile, and this profile when used in Eq. (10) gives finite sur-
0 ðqrÞ
face and volume integrals: where K00 ðqbÞ dKdðqrÞ evaluated at r ¼ b.
sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi! Using the asymptotic form7 of K0(qb) for qb 1, we
get
1
Tðr; hÞ ¼ C0 K0 qr 1 þ 1 sin2 h : (14)
g qb 1 2
Tðb; hÞ C0 ln 0:577 esin h (17)
2 2
Here, C0 ¼ A0(1 þ B0). Equation (14) shows that in the aniso-
tropic case, the contours of constant temperature-amplitude Substituting Eq. (17) in Eq. (12), evaluating the integral over
around the heater are no longer circles, but instead are h, and using Eqs. (10) and (13), we get
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043516-4 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
DP 2 1
C0 ¼ : (18)
pLk g þ 1 1 ðg1Þ2
4gðgþ1Þ
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043516-5 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
conductivities close to 1 W/m-K. With the in-plane thermal r ðK rTRe Þ ¼ 2xCv TIm Q; (22a)
conductivity held constant at 0.9 W/m-K, increasing the
_
cross-plane conductivity from 0.9 to 1.1 W/m-K resulted in a r ðK rTIm Þ ¼ 2xCv TRe : (22b)
maximum increase of 9.5% in the temperature sensed by the
thermometer. With the cross-plane thermal conductivity held Here, T ¼ Tej2xt is the steady-state temperature profile and
constant at 0.9 W/m-K, increasing the in-plane value from T ¼ TRe þ jTIm, where TRe and TIm are the in-phase and quad-
0.9 to 1.1 W/m-K resulted in a much larger (43%) increase in rature components of temperature oscillation. The power
the sensed temperature. Once again, FEM simulations repro- density Q ¼ P/(wheatertheaterL), where theater is the heater
duced the results of Eq. (21). The rest of the physical param- thickness, P ¼ Vrms2/R as before, and Q is non-zero only
eters was the same as before, namely D ¼ 100 lm, L ¼ 1 cm, within the heater. The phase of the temperature is referenced
wheater ¼ wtherm ¼ 20 lm, and Cv ¼ 2.74 J/cm3-K. to the applied power; thus, the imaginary part of Q is 0 in
Equation (21) seems to show a strong dependence on Eq. (22b). Using the FEM discretization procedure, the pair
wheater and wtherm, suggesting high sensitivity to errors in of Eqs. (22) is rewritten as a single matrix equation having
measuring these quantities. However, the double integrals the form
make this dependence rather weak in most cases. It is in fact " #
proved in the appendix that if wtherm D and wheater D, _
S^ _ 2xM T1
¼ ½B (23)
the dependencies vanish. For thermal conductivities of the
2xM S^ T2
order of 10 W/m-K, with D ¼ 100 lm and wtherm ¼ wheater
¼ 20 lm, a 10% error in the heater and thermometer widths _
results in 0.6% error in the sensed temperature at 50 Hz, and where S^ and M are the so-called “stiffness”
_
and “mass” mat-
the error remains <1% even at a separation D as low as rices (Ref. 8, pp. 149–150). S^ and M are constructed from
30 lm. The errors become smaller as wtherm and wheater the basis functions, the thermal conductivity tensor, and the
decrease, due to the conditions mentioned above being satis- heat capacity. If N is the number of grid points, T1 and T2 are
fied more closely. However for thermal conductivities of the NX1 arrays containing TRe and TIm evaluated at the grid
order of 1 W/m-K, errors of 10% in the widths result in 5% points. The first N rows of B are constructed from the power
error in the temperature with D ¼ 30 lm, wtherm ¼ wheater density Q, and the next N rows are zero since Eq. (22b) has
¼ 20 lm. By increasing D to 100 lm, we can reduce this sen- no source term. Eq. (23) is a 2 N by 2 N matrix equation, N
sitivity to 0.25%. Thus, the sensitivity to the heater and ther- being the number of grid points. By solving Eq. (23) using
mometer widths is highest for low substrate thermal the usual linear algebraic methods, we can directly obtain
conductivities and small heater-thermometer separations. the in-phase and quadrature components of temperature
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043516-6 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
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043516-7 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
interfacial thermal impedance when separate heater and ther- Energy Frontier Research Center funded by the US Depart-
mometer lines are used, for substrate thermal conductivities ment of Energy, Office of Basic Energy Sciences, under
of the order of 1 W/m-K. Award No. DE-SC0001009.
P
ACKNOWLEDGMENTS Tmeas ¼ pffiffiffi
~
2Lkwheater q
We wish to thank Rachel Koltun (Materials Department, ð wheater =2 pffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi
U.C. Santa Barbara) for helpful discussion. This work was d=dzðerf ð qðD þ z xÞÞ dx;
x¼wheater =2 z¼0
supported by the Center for Energy Efficient Materials, an
(A3)
1
Finally by means of a similar manipulation we obtain, D. G. Cahill and R. O. Pohl, Phys. Rev. B 35, 4067–4073 (1987).
2
D. G. Cahill, Rev. Sci. Instrum. 61, 802 (1990).
sffiffiffiffiffiffi 3
D. G. Cahill, M. Katiyar, and J. R. Abelson, Phys. Rev. B 50, 6077–6081
P 1 qD (1994).
Tmeas ¼ pffiffiffiffiffiffi e : (A5) 4
2pLk~ qD 5
S. M. Lee and D. G. Cahill, J. Appl. Phys. 81, 2590 (1997).
T. Tong and A. Majumdar, Rev. Sci. Instrum. 77, 104902 (2006).
6
S. P. Gurrum, W. P. King, and Y. K. Joshi, J. Appl. Phys. 103, 113517
A simple analytic expression can thus be derived for the temper- (2008).
7
ature response under certain conditions, namely wtherm D, Handbook of Mathematical Functions with Formulas, Graphs, and Mathe-
matical Tables, edited by M. Abramowitz and I. A. Stegun (Dover, New
wheater D and j1/qj D L. This result can also be derived York, 1972), pp. 374–375.
by setting q(D þ s — x)qD in the integrand of Eq. (21), and 8
C. Johnson, Numerical Solution of Partial Differential Equations by the
then using the asymptotic form7 of K0(z) for large jzj. Finite Element Method (Cambridge University Press, New York, 1987).
Downloaded 09 Sep 2012 to 128.148.252.35. Redistribution subject to AIP license or copyright; see http://jap.aip.org/about/rights_and_permissions
043516-8 A. T. Ramu and J. E. Bowers J. Appl. Phys. 112, 043516 (2012)
9 12
A. Jacquot, B. Lenoir, A. Dauscher, M. St€ olzer, and J. Meusel, J. Appl. A. T. Ramu, Doctoral dissertation, U. C. Santa Barbara, 2011.
13
Phys. 91, 4733 (2002). B. W. Olson, S. Graham, and K. Chen, Rev. Sci. Instrum. 76, 053901
10
G. A. Slack, J. Appl. Phys. 35, 339 (1964). (2005).
11 14
H. Yokokawa and Y. Takahashi, J. Chem. Thermodyn. 11, 411–420 T. Borca-Tasciuc, A. R. Kumar, and G. Chen, Rev. Sci. Instrum. 72, 2139
(1979). (2001).
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