5/21/2021

Characterization of
Nanomaterials
Dr. Mehmet KURU

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Microscopy
• Scanning Electron Microscopy (SEM)
• Transmission Electron Microscopy (TEM)
• Scanning Tunelling Microscopy (STM)
• Atomic Force Microscopy (AFM)
Spectroscopy
• X-ray Diffraction (XRD)
• Small Angle X-ray Scattering (SAXS)
• X-ray Photoelectron Spectroscopy (XPS)
• UV-vis Spectroscopy
• FT-IR Spectroscopy

Electron Microscope

• Since there is an electron-

material collision in scattering
methods, it will be useful to talk
about some physical events
first about these collisions.
When an electron beam
collides with a material; emits
some radiation (rays) and
electrons. We can classify
these electrons and rays as
follows.

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Scanning Electron Microscopy

Scanning electron microscopy (SEM) is a microscope technique that creates large-scale images of very
small objects with the help of a focused high-energy electron beam. In scanning electron microscopy,
electrons interact with atoms in the sample, producing different signals that contain information about the
topographic image and composition of the sample surface. The electron beam scans the surface and the
position of the beam is matched to the detected signal, creating an image.
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https://www.youtube.com/watch?v=Vs360UarP1U

https://www.youtube.com/watch?v=GY9lfO-tVfE

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Transmission Electron Microscopy

The difference of this method from the "scanning electron

Microscope (SEM)" method is that the electron beam passes
through the sample in transmission electron microscopy (TEM).
Since the electron beam is passed through the sample to be
examined in this microscope, the sample must be very thin.

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Transmission (TEM) and scanning (SEM) electron microscopy images of magnetic nanoparticles: (A) and (D) Fe3O4
(14.38 ± 3.06 nm); (B) and (E) Fe3O4@CMC (14.05 ± 1.70 nm); (C) and (F) Si–Fe3O4@CMC (14.96 ± 4.16 nm).

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Scannig Tunneling Microscope- STM

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https://www.youtube.com/watch?v=FMNbTcRolPk

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Atomic Force Microscope-AFM

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Atomic Force Microscope-AFM

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X-ray Diffraction Method (XRD)

• With the help of this electron density, the structure and

orientation of the crystal, the purity of the phase, the lattice
constant, the chemical bonds of the atoms and the irregularities in
the crystal structure can be determined.

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UV-vis Spectroscopy

https://www.youtube.com/watch?v=s5uIVQGFDE4

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Fourier Transform Infrared Spectroscopy (FT-IR)

•Economical – cells and mounts are

generally inexpensive
•Well established – most traditional form
of sample measurement
•Excellent spectral information – ideal for
qualitative measurements
•Great for quantitative work – many
standard operating procedures are based on
transmission
A typical FTIR spectrum with a characteristic peaks.

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