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F. Patrick McCluskey1, He Yun1, Clifton Edward Buxbaum1, Sevket Yuruker1, Raphael Mandel1, Michael
Ohadi1, Yongwan Park2, Shiladri Chakraborty2, Alireza Khaligh2, Lauren Boteler3, and Miguel Hinojosa3
1
Dept of Mechanical Engineering, Clark School of Engineering, Univ. of Maryland, College Park, MD 20742;
2
Dept of Electrical & Computer Engrg, Clark School of Engineering, Univ. of Maryland, College Park, MD
20742
3
U.S. Army Research Laboratory, Adelphi, MD 20783
Email: mcclupa@umd.edu
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on a multi-functional cooling module and substrate, twelve Flip-chip Bonding Process
capacitors, and the gate drivers. Next to the transformer on Wolfspeed (CREE) CPM2-1200-0025B 1200V, 50A silicon
either side, a micro-controller and auxiliary power module carbide power MOSFETs are chosen as the switches for this
(APM) are placed on the control interface board. This design application. The source and gate pads (top side) are metallized
allows the whole package volume without housing to be with Al and the drain pad (bottom side) is metallized with
reduced to 0.56 liter (165 mm wide x 111 mm long x 35 mm Ni/Ag. In order to make the source and gate pads solderable, a
high), permitting a power density of roughly 18.2 kW/L. process for depositing a new metallization layer was developed
The entire system is built around a 10 kW planar transformer. based on the process used by Hopkins et al [10]. The switches
The transformer is composed of two internally cooled 3D- are placed under an aluminum mask (shown in Fig. 3) designed
printed alumina modules attached to each side of the main and fabricated for use in an AJA ATC 1800 sputtering unit. The
power board, having nano-silver paste syringe-printed primary top sides of the switches are then plasma cleaned inside the
windings on the top of the upper cooler and secondary windings sputtering unit to remove the aluminum oxide layer. After
on the bottom of the lower cooler. Since the transformer is plasma cleaning, 300 nm Ti, 300 nm Ni, and 1000 nm Ag are
actively cooled [9], and the SiC switches can operate at elevated deposited. Fig. 4 shows the switches after metallization. The
new metallization adheres well to the source and gate pads,
temperatures, concerns associated with mounting them directly
allowing for solder joints without delamination. The solid
on the high temperature PCB are alleviated. The switching
aluminum mask significantly reduces the cost of the process,
devices are connected to the windings of the planar transformer
and the yield with regards to short circuits between the gate and
and to positive and negative busses located on the left and right source is approximately 90%.
side of the package, respectively. After the switches are metallized, they are connected to the
heat sinks and substrate. First, a 0.25 mm molybdenum spacer
is connected to the heat sink using Ag80-In20 TLPS to alleviate
the thermo-mechanical stresses induced by CTE mismatch
between the copper heat sink and the SiC devices. The bottom
side of each switch is then connected to the molybdenum spacer
via Pb-5Sn-2.5Ag solder. The entire stack is then connected to
the substrate via SAC305 solder. The connection includes
copper pads between the switch pads on the substrate for
additional mechanical stability. Fig. 5 shows the stacked
connection between the substrate, switch, and heat sink.
(a)
(b)
Figure 2. (a) Plan view, (b) side view of the CAD model of the
main power board used for this SiC based DC-DC converter
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Table 1. Properties of the nano-silver paste
TRANSFORMER
Syringe printing is the additive manufacturing method used
for printing the transformer windings. A design of experiments
was conducted to determine the possible trace widths and
pitches for the chosen paste that would maintain continuous
traces and even surfaces without shorting between lines. The
different gaps between two printed traces with a certain range
of width were tested to examine whether two traces would
contact each other or not.
Figure 6. CAD model of syringe-printed trace sample
Material and Test Plan
In order to facilitate high temperature use up to 250℃, a
ceramic substrate made of 96% alumina was selected to be the
baseplate. A nano-silver paste, purchased from NBE Tech,
LLC, with relatively low electrical resistivity, high thermal
conductivity, and low coefficient of thermal expansion (CTE)
compared to that of alumina (7-8 ppm/℃), was chosen to be the
material used to create the syringe-printed windings. The
properties of this paste are provided in Table 1.
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Test Results
The test results are summarized in Table 2. Symbol x means
the two traces under the corresponding settings touch each
other, making shorting a failure mode. For example, when the
width of each trace is selected to be 0.8 to 1.0 mm, a spacing of
0.3 mm is unreachable as the two traces will contact resulting
in shorting. Fig. 8, corresponding to Group 17, gives a failed
example. In the figure, the two traces with width of 2.6 mm
touch each other on the top. Symbol ✓ indicates the sample
survived, (i.e. no contact between the two traces). Further probe
tests are needed to verify the shorting. Symbol P means pending
(i.e. the tests have been not performed yet). All the test syringe-
printed traces after sintering have been examined by using a (a)
microscope. Some of the surviving samples are shown in Fig. 9
(a) – (f). These are the results of Group 16, 14, 13, 24, 19, and
32. Especially for the Fig. 9 (e) – group 19 - with the width of
2.6 mm for each trace, a minimum spacing of 0.5 mm can be
realized. This is a relatively ideal design for achieving a 10 kW
full bridge SiC DC-DC converter [9].
(c)
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(CALCE) at the University of Maryland for providing the
experimental and processing facilities. Special thanks go to
Prof. Siddhartha Das and Mr. Beihan Zhao for assistance with
the ink jet printing.
References
[1] Manoharan S, Patel C, McCluskey P, Pecht M, “Effective
decapsulation of copper wire-bonded microelectronic devices for
reliability assessment,” Microelectronics Reliability. 2018 May
31;84:197-207.
[2] Boteler, L. M., Niemann, V. A., Urciuoli, D. P., & Miner, S. M.
(2017, April). Stacked power module with integrated thermal
(e) management. In 2017 IEEE International Workshop on
Integrated Power Packaging (IWIPP) (pp. 1-5). IEEE.
[3] Boteler, L. M., Hinojosa, M., Niemann, V. A., Miner, S. M., &
Gonzalez-Nino, D. (2017, May). High voltage stacked diode
package with integrated thermal management. In 2017 16th IEEE
Intersociety Conference on Thermal and Thermomechanical
Phenomena in Electronic Systems (ITherm) (pp. 913-920). IEEE.
[4] Yan Y, Moss J, Ngo KD, Mei Y, Lu GQ. Additive manufacturing
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[5] Chinthavali M, Ayers C, Campbell S, Wiles R, Ozpineci B. A 10-
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[6] Goth C, Putzo S, Franke J. Aerosol Jet printing on rapid
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CONCLUSION AND FUTURE WORK high-frequency power converters. IEEE Transactions on Power
Electronics. 2016 Jan;31(1):52-64.
In this work the following items have been discussed: [8] S Manoharan, C Patel, S Dunford, J Beshears, P McCluskey, Life
prediction of copper wire bonds in commercial devices using
• A full bridge DC-DC converter with a power level of
principal component analysis (PCA), Microelectronics
10 kW has been developed in an advanced module that Reliability 99, 137-151
provides improvements in packaging density, size and [9] Yuruker S., Mandel R., McCluskey P, Ohadi M., Chakraborty S.,
weight over current module technologies. Park Y., Yun H., Khaligh A., Boteler L., Hinojosa M. “Advanced
• Manufacturability of transformer windings with Packaging and Thermal Management of High-power Dc-Dc
regards to spacing and short circuit failures was Converters.” Proceedings of the ASME 2019 International
considered and tested. Technical Conference and Exhibition on Packaging and
• A reduced-size power loop incorporating multi- Integration of Electronic and Photonic Microsystems. ASME
2019 International Technical Conference and Exhibition on
functional thermal and electrical buses, Ag-In TLPS,
Packaging and Integration of Electronic and Photonic
and bare-die SiC MOSFET switches has been Microsystems. Anaheim, California, USA. October 7–9, 2019.
introduced. V001T06A026. ASME.
[10] Y. Xu, I. Husain, H. West, W. Yu and D. Hopkins, "Development
In future work, this power module will continue to be optimized of an ultra-high density Power Chip on Bus (PCoB) module,"
with respect to thermal, electrical, and packaging aspects. 2016 IEEE Energy Conversion Congress and Exposition
Validation of the reliability of the package will be conducted (ECCE), Milwaukee, WI, 2016, pp. 1-7.
using a series of accelerated qualification and operational tests
including temperature cycling tests, power cycling tests, and
shock and vibration tests.
ACKNOWLEDGEMENTS
The authors would like to thank U.S. Army Research
Laboratory for funding this work as a part of Silicon Carbide
Advanced Packaging of Power Semiconductors II Program, as
well the Center for Advanced Life Cycle Engineering
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