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Supervised by:
Prof Hanaa Yousef
Prepared by:
Rokaia Emad Gamal
Figur2 Figur3
X-ray diffraction
X-ray diffraction (XRD) is a common technique that determine a sample's
composition or crystalline structure. For larger crystals such as macromolecules and
inorganic compounds, it can be used to determine the structure of atoms within the
sample. If the crystal size is too small, it can determine sample composition,
crystallinity and phase purity.
Removing these electrons from the system will leave behind a hole that a higher
energy electron can fill in, and it will release energy as it relaxes. The energy released
during this relaxation process is unique to each element on the periodic table, and as
such bombarding a sample with X-rays can be used to identify what elements are
present, as well as what proportion they are present in.
Shown below is an example of how EDS works. The letters K, L, and M refer to
the n value that electrons in that shell have (K electrons, closest to the nucleus, are
n=1 electrons), while α and β indicate the size of the transition. The relaxation from
M to L or L to K are therefore described as Lα or Kα, while going from M to K would
be a Kβ transition. The means that are used for describing these processes as a whole
are known as Siegbahn notation.
Energy-dispersive X-ray diffraction:
-Energy-dispersive X-ray diffraction (EDXRD) is an analytical technique for
characterizing materials. It differs from conventional X-ray diffraction by using
polychromatic photons as the source and is usually operated at a fixed angle. With no
need for a goniometer.
-EDXRD is able to collect full diffraction patterns very quickly. EDXRD is almost
exclusively used with synchrotron radiation which allows for measurement within real
engineering materials
-The x1–x2 scattering plane for battery EDXRD is shown in Figure 1. The incident white
beam of X-ray radiation has an energy range up to approximately 200 keV. The beam
path to the detector is determined by the collimation slit settings di and ds. The
diffraction angle 2𝜕 is fixed by placement of the detector, and the intersection of the
incident and diffracted beams defines a parallelepiped-shaped diffraction gauge
volume from which data is collected. By moving the battery, the gauge volume is
repositioned within. In this example, a sequence of measurements conducted while
moving the battery in the x1 direction would give spatially-resolved data
with di resolution in the direction of current flow. Current distributions in porous
electrodes are found in this direction in most situations, and thus this is usually the
most interesting dimension in which to resolve diffraction data.
Figure 1.Schematic showing white beam EDXRD from a gauge volume placed
within a battery. The beam path to the detector, shown in blue, is determined
by the collimation slit settings di and ds. By moving the battery the gauge
volume may be placed at many locations.