Accelerated Life Testing

ME6226, Product Reliability
Dr. Piyush Shakya
Engineering Asset Management (EAM) Group

Department of Mechanical Engineering
Indian Institute of Technology Madras
pshakya@iitm.ac.in
https://home.iitm.ac.in/pshakya/
April 26, 2023
Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 1 / 29

Contents
1 Accelerated Life Testing (ALT)

Accelerated Life Testing (ALT)
1 Traditional life data analysis includes analyzing the time to failure

data of a component/system obtained under normal operating con-
ditions.
2 In many cases, life data analysis under normal condition is very

difficult to obtain as life of the components may be very high (e.g.
For ball bearing life may be in years.)
3 Therefore, testing engineers have came up with methods to force

these components/systems to fail more quickly that they would
under normal conditions.
4 The purpose of ALT is to quickly find and correct design related

defects that will cause product failure during its specified lifetime.
(Without changing failure modes due to acceleration)

Accelerated Life Testing (ALT)
The accelerated life testing may be performed in the following manners:-
Accelerated Cycling/ Accelerated Duty Cycling
The components which are expected to operate for only a few hours a
day can be operated continuously for full day.
Overstress (Testing for Constant Stress)
An accelerated test is a test in which the applied stress is chosen to exceed

that encountered in field operation, but still below the technological
limits.

1 Examples:
1 Key lock motorcycle 30000 turns
2 RH & LH Indicator in motorcycles switches
3 Bump test
4 TV receiver is typically operated for 6 hours a day. If the ALT is run

continuously for 24 hours a day, it would be accelerated by a factor
of 4 over average use.
2 Many times accelerated cycling is not sufficient to reduce the
overall time.

It is assumed that no new failure modes are introduced as a result of
increasing the no. of cycles per unit time and that failures occur due to
cycling only.
xn = No. of cycles per unit of time under normal operating condition.

xs = No. of cycles per unit of time under accelerated conditions.
tn = Time to failure under xn cycles per unit of time.
ts = Time to failure under xs cycles per unit of time.
As the no. of operating cycles is the same for both normal and acceler-
ated condition. Therefore,
ts × xs = tn × xn
xn
ts = tn ( )
xs
& Rn (tn ) = Rs (ts )
Acceleration Factor
Acceleration Factor:
xs tn
=
xn ts
Life under normal condition
AF =
Life under elevated stress level
For the Weibull distribution:
−( ηtnn )βn
Rn (tn ) = e
−( ηtss )βs
=e
−( tηnsxxns )βs
=e
Therefore βs = βn = β ( shape factor remains same )

ηn xn ηn
ηs = ηs =
xs AF

Example 1
Example 1
TV receiver is typically operated for 6 hours a day. If the ALT is run
continuously for 24 hours a day, it would be accelerated by a factor of 4
over average use.
Unit of time = 1 day

&
xn = 6 hours/day
&
xs = 24 hours/day
Therefore, ts = tn (xn /xs ) = tn /4
ts = tn /4 Receptor will fail in 1/4th no. of days than normal condition.

Example 2
Example 2
The average use of a washing machine is 10 hours per week. The
washing machine drum rotates 1000 cycles(rotations)/hour. If the drum
is rotated for a full week without any break, what is the A.F ?
xn = 10000 × 10 cycles/week
xs = 10000 × 168 cycles/week
168 · 10000
Therefore, A.F = = 16.8
10 · 10000

Example 3
Example 3
A component was tested at an accelerated life test (accelerated cycling)
at 100 cycles/hour. The resultant failure data were found to have a
Weibull distribution, with β = 2.5 & ηs = 1000 hours, if the normal
cycle time is 5/hour. What is the scale parameter for normal operating
conditions & what is the reliability function?
Ans :- For normal operating condition :

ηs = ηn · (xn /xs )
Therefore, ηn = ηs · (xs /xn )
= 1000 · (100/5) = 20000 hrs
βn = βs = β = 2.5
2.5
Therefore, R(t) = e(−t/20000)
In many Life tests, Rolling bearing run at multiple times (speed) than
their normal speed. Sometimes as high as 3 times.
Example 4
Example 4
For an electrical insulator AC Voltage in the test was cycled at 412 Hz
instead of normal 50 Hz, what is the A.F. ?
A.F. = 412/50 = 8.24

For electronic items, hazard rate may be between 10−10 /hour to 10−7 /hour
(components) & for system assembly, it may be between 10−7 /hour to
10−5 /hour. Therefore, accelerated testing is required for parameter esti-
mation of the population.
An accelerated test is a test in which the applied stress is chosen
to exceed that encountered in field operation, but still below the
technological limits. This is in order to shorten the time to failure
of the item considered by avoiding an alteration of the involved
failure mechanism (genuine acceleration)
In accelerated tests, failure mechanisms are assumed to be acti-
vated selectively by increased stress. The quantitative relationship
between degree of activation and extent of stress is called accelera-
tion factor.
It is assumed that higher stress levels in acceleration tests will ac-
celerate the same failure mode as in normal stress conditions.
Failure will happen more quickly; only a transformation of time
scale, no new failure mode are introduced.
tn = Time to failure under normal stress
ts = Time to failure under high stress
tn = AF · ts where AF is acceleration factor.

Pr (Tn < tn ) = Fn (tn ) = Pr (Ts < ts ) = Fs (ts ) = Fs (tn /AF)
Fs (tn /AF) is the CDF of failure distribution
Fn (tn ) = Fs (tn /AF). Differentiating both sides with respect to time:
d n tn o
fn (tn ) = Fs
dt AF
1 tn
fn (tn ) = fs
AF AF
As now there is only one time variable tn , it may be replaced by t.
1 t
fn (t) = fs
AF AF
Example 5
Example 5
For the CFR model, a component is tested at 120 ◦ C & found to be having
MTTF = 500 hrs. Normal use is 25 ◦ C. Assuming AF = 15, determine
the component’s MTTF & reliability function of normal stress levels.
Fn (t) = Fs (t/AF) = 1 − e−λs (t/AF)

1
= 500 hrs
λs
λs = 1/500 per hrs
t
Fn (t) = 1 − e− 500×15
t
Fn (t) = 1 − e− 7500
Therefore, MTTF(normal stress) = 7500 hrs
Common stresses in ALT
1 Temperature
2 Vibration
3 Humidity
4 Pressure
5 Voltage
Proposed by Svante Arrhenius in 1889 for experimental study of inver-

sion of sucrose.
Arrhenius Model : - When failures are accelerated primarily as a result
of an increase in temperature, a common approach is based on Arrhenius
model.
r = Ae-B/T [ r is called reaction rate as initially Arrhenius equation was
developed for chemical reactions, r is inversely proportional to life pa-
rameters ]

Arrhenius Model
As AFns = (tnormal /tstress ) = (rstress /rnormal ) (if reaction rate is high, life
will be less)
Where r is reaction or process rate, A & B are constants & T is
temperature in kelvin.
A e(−B/T2 ) − TB + TB B( T1 − T1 )
AF12 = A e(−B/T1 )
=e 2 1 AF12 = e 1 2
The constant B may be calculated by testing at 2 different temperatures

& computing the AF on the basis of the fitted distributions.
ln(AF )
Therefore, B = ( 1 − 121 ) Where AF12 =(η1 /η2 ) where ηi is the scale
T1 T2
parameter

Example 6
Example 6
An electronic component has a normal operating temp. of 21 ◦ C. Under
stress condition of 157 ◦ C, a Weibull distribution was obtained with η =
254 hrs and at 177 ◦ C, a Weibull distribution was obtained with η= 183
hrs. The shape parameter did not change with β= 1.72. What are the
shape parameter & scale parameter at normal operating temperature?
Ans:
η1
AF12 = (for Temp.T1 = 430K & T2 = 450K)
η2
254
AF12 = = 1.388
183
ln(AF12 ) ln(1.388)
B= 1 1
= 1 1
= 3172
( T1 − T2 ) ( 430 − 450 )

Example 6
Example 6
An electronic component has a normal operating temp. of 21 ◦ C. Under
stress condition of 157 ◦ C a Weibull distribution was obtained with η =
254 hrs and at 177 ◦ C, a Weibull distribution was obtained with η= 183
hrs. The shape parameter did not change with β= 1.72. What are the
shape parameter & scale parameter at normal operating temperature?
Ans: AF12 ( Acceleration factor between normal & T2 )

B( T1n − T1 )
=e 2 , Tn = 21 + 273 = 294 K
1 1
AFn2 = e3172( 294 − 450 ) = 42.1
ηn ηn
AFn2 = = = 42.1
η2 183
Therefore ηn = 7704.3 hrs & βn = β = 1.72
Example 7
Example 7
The following failure data (in hours) were obtained from accelerated
life testing a sample of ten units to failure.
2750 3100 3400 3800 4100

4400 4700 5100 5700 6400
The accelerated life test was conducted at 150 ◦ C. The expected use
operating temp. is 85 ◦ C. Use the Arrhenius model & determine the
mean life at the use temperature?
Ans: Given B = 2321 & that the life distribution is Weibull,

Mean life = 4345 hrs = MTTF
1
MTTF = ηΓ 1 +
β

Example 7
MTTF1 η1
= = AF12 (as β1 = β2 = β)
MTTF2 η2
MTTFn ηn B( 1 − 1 )
= = AFn1 = e Tn T1
MTTF1 η1
Tn = 85 + 273 = 358 Kelvin

T1 = 150 + 273 = 423 Kelvin
1 1
MTTFn = 4345 · e2321( 358 − 423 )
MTTFn = 4345 × 2.7 = 11766.61 hrs

Eyring Model
1 The Eyring model in its simplest form may be written as:
r = ATα e T e[C+ T ]S1 ,

−B D
(T is in Kelvin)
Where r is the process rate & A, B, C, D, and α are constants. The S1

is the additional stress.
2 The Arrhenius model is limited to only one stress (temperature).

Cases where stresses other than temperature should also be ac-
counted, the Eyring model is used.
3 If there are 2 stresses other than temperature
r = ATα e T e[C+ T ]S1 e[E+ T ]S2

−B D F

Eyring Model
1 For two stresses (temperature & one non-thermal stress), five differ-
ent constants are required to be estimated. Therefore experiments
should be conducted for 5 distinct stress combination.
2 With every additional non-thermal stress, two more constants should
be evaluated/ estimated.
3 If alpha is close to zero & if second stress is absent the Eyring model
is close to Arrhenius model.
4 For one non-thermal stress & Temp:
T2 α B( T1 − T1 ) [C+ TD ]S′1 −[C+ TD ]S1
AF12 = e 1 2 e 2 1
T1
Where S′1 is second level of S1

Example 8
Example 8
For a simplified Eyring model, α & D are assumed to be 0 for 2 stresses
(one thermal & other non-thermal). The time for 10% components to
fail is given below. Assume that process rate is equal to 1/t10 . Find the
parameters of the eyring model. [Take ln V as second stress]
10th percentile Time Temperature(◦ C) Voltage

253 40 60
148 80 60
97 40 120

Example 8
r = ATα e T e[C+ T ]S1

−B D
Taking α & D = 0,
−B
r = Ae T eCS1
−B
r = Ae T V C
Taking ln both sides
B
ln r = ln A −+ C ln V , r = 1/t10
T
B
− ln t10 = ln A − + C ln V
T
B
ln t10 = − ln A + − C ln V
T
B
ln t10 = A1 + − C ln V
T
where A1 = − ln A
Example 8
t10 ln t10 Temp.(◦ C) Temp. (K) V 1/T (K) -ln V

253 5.5334 40 313.16 60 0.00319 -4.0943
148 4.9972 80 353.16 60 0.00283 -4.0943
97 4.1109 40 313.16 120 0.00319 -4.7875
Based on the data given, different parameters of the eyring model can
be estimated.
IMP :- If no. of conducted experiments are more than 3 (for this case)
then the best fit curve has to be fitted.

Highly accelerated life test (HALT)
1 In HALT, the stresses are way beyond the operating condition tech-
nological limits.
2 HALT are used in early design and development phase to reveal

the potential failure modes.
3 The purpose of HALT is not to measure but to improve reliability.

(By eleminating the new revealed failure modes)

Highly accelerated Stress Screen (HASS)
1 The HASS is a reliability screening to identify failure attributed to

inherent variability of manufacturing process that is not detected
by Burn in or other traditional methods.
2 The HALT is performed during the product development stage

to identify the possible failure modes and remove them through
robust design. The HASS is performed during the manufacturing
to remove latent flaws.

Highly accelerated Stress Screen (HASS)
Source: “TT electronics" blog by David Phillips

Thank You
“The summit of happiness is reached when a person is ready to be what

he is” — Erasmus

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ME6226, Product Reliability

Dr. Piyush Shakya

Engineering Asset Management (EAM) Group

April 26, 2023

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 1 / 29

1 Accelerated Life Testing (ALT)

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 2 / 29

1 Traditional life data analysis includes analyzing the time to failure

2 In many cases, life data analysis under normal condition is very

3 Therefore, testing engineers have came up with methods to force

4 The purpose of ALT is to quickly find and correct design related

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 3 / 29

The accelerated life testing may be performed in the following manners:-

Accelerated Cycling/ Accelerated Duty Cycling

Overstress (Testing for Constant Stress)

An accelerated test is a test in which the applied stress is chosen to exceed

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 4 / 29

2 RH & LH Indicator in motorcycles switches

4 TV receiver is typically operated for 6 hours a day. If the ALT is run

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 5 / 29

xn = No. of cycles per unit of time under normal operating condition.

Therefore βs = βn = β ( shape factor remains same )

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 7 / 29

Unit of time = 1 day

ts = tn /4 Receptor will fail in 1/4th no. of days than normal condition.

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 8 / 29

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 9 / 29

Ans :- For normal operating condition :

A.F. = 412/50 = 8.24

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 11 / 29

tn = AF · ts where AF is acceleration factor.

Fn (t) = Fs (t/AF) = 1 − e−λs (t/AF)

Proposed by Svante Arrhenius in 1889 for experimental study of inver-

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 15 / 29

The constant B may be calculated by testing at 2 different temperatures

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 16 / 29

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 17 / 29

Ans: AF12 ( Acceleration factor between normal & T2 )

2750 3100 3400 3800 4100

Ans: Given B = 2321 & that the life distribution is Weibull,

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 19 / 29

Tn = 85 + 273 = 358 Kelvin

MTTFn = 4345 × 2.7 = 11766.61 hrs

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 20 / 29

1 The Eyring model in its simplest form may be written as:

r = ATα e T e[C+ T ]S1 ,

Where r is the process rate & A, B, C, D, and α are constants. The S1

2 The Arrhenius model is limited to only one stress (temperature).

3 If there are 2 stresses other than temperature

r = ATα e T e[C+ T ]S1 e[E+ T ]S2

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 21 / 29

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 22 / 29

10th percentile Time Temperature(◦ C) Voltage

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 23 / 29

r = ATα e T e[C+ T ]S1

t10 ln t10 Temp.(◦ C) Temp. (K) V 1/T (K) -ln V

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 25 / 29

2 HALT are used in early design and development phase to reveal

3 The purpose of HALT is not to measure but to improve reliability.

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 26 / 29

1 The HASS is a reliability screening to identify failure attributed to

2 The HALT is performed during the product development stage

Dr. Piyush Shakya (EAM, IITM) https://home.iitm.ac.in/pshakya/ April 26, 2023 27 / 29

Source: “TT electronics" blog by David Phillips