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NTP60N06, NTB60N06

Power MOSFET
60 V, 60 A, N−Channel
TO−220 and D2PAK
Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge http://onsemi.com
circuits.
60 VOLTS, 60 AMPERES
Features
RDS(on) = 14 m
• Pb−Free Packages are Available
N−Channel
Typical Applications D

• Power Supplies
• Converters
• Power Motor Controls G
• Bridge Circuits
S
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
MARKING
Rating Symbol Value Unit DIAGRAMS
Drain−to−Source Voltage VDSS 60 Vdc 4
Drain
Drain−to−Gate Voltage (RGS = 10 M) VDGR 60 Vdc 4
Gate−to−Source Voltage Vdc
− Continuous VGS 20
− Non−Repetitive (tp10 ms) VGS 30
TO−220
Drain Current NTx60N06
CASE 221A
− Continuous @ TA = 25°C ID 60 Adc AYWW
STYLE 5
− Continuous @ TA = 100°C ID 42.3
− Single Pulse (tp10 s) IDM 180 Apk
1 1 3
Total Power Dissipation @ TA = 25°C PD 150 W 2 Gate Source
Derate above 25°C 1.0 W/°C 3 2
Total Power Dissipation @ TA = 25°C (Note 1) 2.4 W Drain
Operating and Storage Temperature Range TJ, Tstg −55 to °C 4
+175 Drain
Single Pulse Drain−to−Source Avalanche EAS 454 mJ
4
Energy − Starting TJ = 25°C
D2PAK NTx60N06
(VDD = 75 Vdc, VGS = 10 Vdc, L = 0.3 mH
CASE 418B AYWW
IL(pk) = 55 A, VDS = 60 Vdc) 2
STYLE 2
Thermal Resistance °C/W 3
− Junction−to−Case RJC 1.0 2
− Junction−to−Ambient (Note 1) RJA 62.5 1 3
Drain
Gate Source
Maximum Lead Temperature for Soldering TL 260 °C
Purposes, 1/8″ from case for 10 seconds NTx60N06 = Device Code
x = P or B
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not A = Assembly Location
normal operating conditions) and are not valid simultaneously. If these limits Y = Year
are exceeded, device functional operation is not implied, damage may occur WW = Work Week
and reliability may be affected.
1. When surface mounted to an FR4 board using minimum recommended pad ORDERING INFORMATION
size, (Cu Area 0.412 in2).
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.

 Semiconductor Components Industries, LLC, 2004 1 Publication Order Number:


October, 2004 − Rev. 3 NTP60N06/D
NTP60N06, NTB60N06

ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)


Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage (Note 2) V(BR)DSS Vdc
(VGS = 0 Vdc, ID = 250 Adc) 60 72.3 −
Temperature Coefficient (Positive) − 69.8 − mV/°C
Zero Gate Voltage Drain Current IDSS Adc
(VDS = 60 Vdc, VGS = 0 Vdc) − − 1.0
(VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) − − 10
Gate−Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS − − ±100 nAdc
ON CHARACTERISTICS (Note 2)
Gate Threshold Voltage (Note 2) VGS(th) Vdc
(VDS = VGS, ID = 250 Adc) 2.0 2.85 4.0
Threshold Temperature Coefficient (Negative) − 8.0 − mV/°C
Static Drain−to−Source On−Resistance (Note 2) RDS(on) m
(VGS = 10 Vdc, ID = 30 Adc) − 11.5 14

Static Drain−to−Source On−Voltage (Note 2) VDS(on) Vdc


(VGS = 10 Vdc, ID = 60 Adc) − 0.715 1.01
(VGS = 10 Vdc, ID = 30 Adc, TJ = 150°C) − 1.43 −
Forward Transconductance (Note 2) (VDS = 8.0 Vdc, ID = 12 Adc) gFS − 35 − mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Ciss − 2300 3220 pF
(VDS = 25 Vdc,
Vd VGS = 0 Vdc,
Vd
Output Capacitance Coss − 660 925
f = 1.0 MHz)
Transfer Capacitance Crss − 144 300

SWITCHING CHARACTERISTICS (Note 3)


Turn−On Delay Time td(on) − 25.5 50 ns
Rise Time (VDD = 30 Vdc, ID = 60 Adc, tr − 180.7 360
Turn−Off Delay Time VGS = 10 Vdc, RG = 9.1 ) (Note 2) td(off) − 94.5 200
Fall Time tf − 142.5 300
Gate Charge QT − 62 81 nC
(VDS = 48 Vdc,
Vd ID = 60 Adc,
Ad
Q1 − 10.8 −
VGS = 10 Vdc) (Note 2)
Q2 − 29.4 −
SOURCE−DRAIN DIODE CHARACTERISTICS
Forward On−Voltage (IS = 60 Adc, VGS = 0 Vdc) (Note 2) VSD − 0.99 1.05 Vdc
(IS = 45 Adc, VGS = 0 Vdc, TJ = 150°C) − 0.87 −
Reverse Recovery Time trr − 64.9 − ns
(IS = 60 Adc,
Ad VGS = 0 Vdc,
Vd
ta − 44.1 −
dIS/dt = 100 A/s) (Note 2)
tb − 20.8 −
Reverse Recovery Stored Charge QRR − 0.146 − C
2. Pulse Test: Pulse Width ≤ 300 s, Duty Cycle ≤ 2%.
3. Switching characteristics are independent of operating junction temperatures.

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NTP60N06, NTB60N06

120 120
ID, DRAIN CURRENT (AMPS) VGS = 10 V 7V VDS ≥ 10 V

ID, DRAIN CURRENT (AMPS)


100 9V 100

8V 6V
80 80

60 5.5 V 60

40 5V 40
TJ = 25°C
20 4.5 V 20 TJ = 100°C
TJ = −55°C
0 0
0 1 2 3 4 5 3 4 5 6 7 8
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)

Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics


RDS(on), DRAIN−TO−SOURCE RESISTANCE ()

RDS(on), DRAIN−TO−SOURCE RESISTANCE ()


0.026 0.026
VDS = 10 V VGS = 15 V

0.022 0.022
TJ = 100°C
0.018 0.018 TJ = 100°C

0.014 TJ = 25°C 0.014


TJ = 25°C

0.01 0.01
TJ = −55°C
TJ = −55°C
0.006 0.006
0 20 40 60 80 100 120 0 20 40 60 80 100 120
ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)

Figure 3. On−Resistance versus Gate−to−Source Figure 4. On−Resistance versus Drain Current


Voltage and Gate Voltage
RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED)

2.2 10,000
ID = 30 A VGS = 0 V
2 VGS = 10 V TJ = 150°C
1.8
IDSS, LEAKAGE (nA)

1000
1.6
TJ = 125°C
1.4

1.2
100
1 TJ = 100°C

0.8

0.6 10
−50 −25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 5. On−Resistance Variation with Figure 6. Drain−to−Source Leakage Current
Temperature versus Voltage

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NTP60N06, NTB60N06

POWER MOSFET SWITCHING

Switching behavior is most easily modeled and predicted The capacitance (Ciss) is read from the capacitance curve at
by recognizing that the power MOSFET is charge a voltage corresponding to the off−state condition when
controlled. The lengths of various switching intervals (t) calculating td(on) and is read at a voltage corresponding to the
are determined by how fast the FET input capacitance can on−state when calculating td(off).
be charged by current from the generator. At high switching speeds, parasitic circuit elements
The published capacitance data is difficult to use for complicate the analysis. The inductance of the MOSFET
calculating rise and fall because drain−gate capacitance source lead, inside the package and in the circuit wiring
varies greatly with applied voltage. Accordingly, gate which is common to both the drain and gate current paths,
charge data is used. In most cases, a satisfactory estimate of produces a voltage at the source which reduces the gate drive
average input current (IG(AV)) can be made from a current. The voltage is determined by Ldi/dt, but since di/dt
rudimentary analysis of the drive circuit so that is a function of drain current, the mathematical solution is
complex. The MOSFET output capacitance also
t = Q/IG(AV)
complicates the mathematics. And finally, MOSFETs have
During the rise and fall time interval when switching a finite internal gate resistance which effectively adds to the
resistive load, VGS remains virtually constant at a level resistance of the driving source, but the internal resistance
known as the plateau voltage, VSGP. Therefore, rise and fall is difficult to measure and, consequently, is not specified.
times may be approximated by the following: The resistive switching time variation versus gate
tr = Q2 x RG/(VGG − VGSP) resistance (Figure 9) shows how typical switching
performance is affected by the parasitic circuit elements. If
tf = Q2 x RG/VGSP
the parasitics were not present, the slope of the curves would
where maintain a value of unity regardless of the switching speed.
VGG = the gate drive voltage, which varies from zero to VGG The circuit used to obtain the data is constructed to minimize
common inductance in the drain and gate circuit loops and
RG = the gate drive resistance is believed readily achievable with board mounted
and Q2 and VGSP are read from the gate charge curve. components. Most power electronic loads are inductive; the
During the turn−on and turn−off delay times, gate current is data in the figure is taken with a resistive load, which
not constant. The simplest calculation uses appropriate approximates an optimally snubbed inductive load. Power
values from the capacitance curves in a standard equation for MOSFETs may be safely operated into an inductive load;
voltage change in an RC network. The equations are: however, snubbing reduces switching losses.
td(on) = RG Ciss In [VGG/(VGG − VGSP)]
td(off) = RG Ciss In (VGG/VGSP)

6400
VDS = 0 V VGS = 0 V
5600 TJ = 25°C

4800 Ciss
C, CAPACITANCE (pF)

4000

3200
Crss Ciss
2400

1600
Coss
800
Crss
0
10 5 0 5 10 15 20 25
VGS VDS

GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)

Figure 7. Capacitance Variation

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NTP60N06, NTB60N06

VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)


12 1000
VDS = 30 V
QT ID = 60 A
10
VGS = 10 V
VGS
8
tr

t, TIME (ns)
Q1
Q2 tf
6 100
td(off)
4

2 ID = 60 A td(on)
TJ = 25°C
0 10
0 10 20 30 40 50 60 70 1 10 100
QG, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE ()
Figure 8. Gate−to−Source and Drain−to−Source Figure 9. Resistive Switching Time
Voltage versus Total Charge Variation versus Gate Resistance

DRAIN−TO−SOURCE DIODE CHARACTERISTICS


60

VGS = 0 V
IS, SOURCE CURRENT (AMPS)

50 TJ = 25°C

40
TJ = 150°C
30

20 TJ = 25°C

10

0
0.4 0.48 0.56 0.64 0.72 0.8 0.88 0.96
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current

SAFE OPERATING AREA

The Forward Biased Safe Operating Area curves define reliable operation, the stored energy from circuit inductance
the maximum simultaneous drain−to−source voltage and dissipated in the transistor while in avalanche must be less
drain current that a transistor can handle safely when it is than the rated limit and adjusted for operating conditions
forward biased. Curves are based upon maximum peak differing from those specified. Although industry practice is
junction temperature and a case temperature (TC) of 25°C. to rate in terms of energy, avalanche energy capability is not
Peak repetitive pulsed power limits are determined by using a constant. The energy rating decreases non−linearly with an
the thermal response data in conjunction with the procedures increase of peak current in avalanche and peak junction
discussed in AN569, “Transient Thermal temperature.
Resistance−General Data and Its Use.” Although many E−FETs can withstand the stress of
Switching between the off−state and the on−state may drain−to−source avalanche at currents up to rated pulsed
traverse any load line provided neither rated peak current current (IDM), the energy rating is specified at rated
(IDM) nor rated voltage (VDSS) is exceeded and the continuous current (ID), in accordance with industry custom.
transition time (tr,tf) do not exceed 10 s. In addition the total The energy rating must be derated for temperature as shown
power averaged over a complete switching cycle must not in the accompanying graph (Figure 12). Maximum energy at
exceed (TJ(MAX) − TC)/(RJC). currents below rated continuous ID can safely be assumed to
A Power MOSFET designated E−FET can be safely used equal the values indicated.
in switching circuits with unclamped inductive loads. For

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NTP60N06, NTB60N06

SAFE OPERATING AREA

1000 500

EAS, SINGLE PULSE DRAIN−TO−SOURCE


VGS = 20 V ID = 55 A
10 s
ID, DRAIN CURRENT (AMPS)

SINGLE PULSE
400

AVALANCHE ENERGY (mJ)


TC = 25°C
100
300

100 s
200
10 1 ms

RDS(on) LIMIT 10 ms 100


THERMAL LIMIT dc
PACKAGE LIMIT
1 0
0.1 1 10 100 25 50 75 100 125 150 175
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE (°C)

Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus
Safe Operating Area Starting Junction Temperature
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE

1.0
D = 0.5

0.2
(NORMALIZED)

0.1
0.1 P(pk)
0.05 RJC(t) = r(t) RJC
0.02 D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
0.01 t1 READ TIME AT t1
t2 TJ(pk) − TC = P(pk) RJC(t)
SINGLE PULSE DUTY CYCLE, D = t1/t2
0.01
0.00001 0.0001 0.001 0.01 0.1 1.0 10
t, TIME (s)
Figure 13. Thermal Response

di/dt
IS
trr
ta tb
TIME

tp 0.25 IS

IS

Figure 14. Diode Reverse Recovery Waveform

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NTP60N06, NTB60N06

ORDERING INFORMATION
Device Package Shipping†
NTP60N06 TO−220 50 Units/Rail
NTP60N06G TO−220 50 Units/Rail
(Pb−Free)

NTB60N06 D2PAK 50 Units/Rail


NTB60N06G D2PAK 50 Units/Rail
(Pb−Free)

NTB60N06T4 D2PAK 800 Tape & Reel


NTB60N06T4G D2PAK 800 Tape & Reel
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.

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NTP60N06, NTB60N06

PACKAGE DIMENSIONS

TO−220
CASE 221A−09
ISSUE AA

NOTES:
SEATING
−T− PLANE 1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
B F C 2. CONTROLLING DIMENSION: INCH.
T 3. DIMENSION Z DEFINES A ZONE WHERE ALL
S BODY AND LEAD IRREGULARITIES ARE
ALLOWED.
4
INCHES MILLIMETERS
Q A DIM MIN MAX MIN MAX
A 0.570 0.620 14.48 15.75
1 2 3 B 0.380 0.405 9.66 10.28
U
C 0.160 0.190 4.07 4.82
H D 0.025 0.035 0.64 0.88
F 0.142 0.147 3.61 3.73
K G 0.095 0.105 2.42 2.66
Z H 0.110 0.155 2.80 3.93
J 0.018 0.025 0.46 0.64
K 0.500 0.562 12.70 14.27
L R L 0.045 0.060 1.15 1.52
N 0.190 0.210 4.83 5.33
V J Q 0.100 0.120 2.54 3.04
R 0.080 0.110 2.04 2.79
G S 0.045 0.055 1.15 1.39
T 0.235 0.255 5.97 6.47
D U 0.000 0.050 0.00 1.27
N V 0.045 −−− 1.15 −−−
Z −−− 0.080 −−− 2.04

STYLE 5:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN

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NTP60N06, NTB60N06

PACKAGE DIMENSIONS

D2PAK
CASE 418B−04
ISSUE J

C NOTES:
1. DIMENSIONING AND TOLERANCING
E PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
V 3. 418B−01 THRU 418B−03 OBSOLETE,
−B−
W NEW STANDARD 418B−04.
4
INCHES MILLIMETERS
DIM MIN MAX MIN MAX
A 0.340 0.380 8.64 9.65
A B 0.380 0.405 9.65 10.29
S C 0.160 0.190 4.06 4.83
1 2 3 D 0.020 0.035 0.51 0.89
E 0.045 0.055 1.14 1.40
F 0.310 0.350 7.87 8.89
−T− G 0.100 BSC 2.54 BSC
K H 0.080 0.110 2.03 2.79
SEATING W J 0.018 0.025 0.46 0.64
PLANE
G J K 0.090 0.110 2.29 2.79
L 0.052 0.072 1.32 1.83
H M 0.280 0.320 7.11 8.13
D 3 PL N 0.197 REF 5.00 REF
P 0.079 REF 2.00 REF
0.13 (0.005) M T B M
R 0.039 REF 0.99 REF
S 0.575 0.625 14.60 15.88
V 0.045 0.055 1.14 1.40
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN

SOLDERING FOOTPRINT*

8.38
0.33

10.66 1.016
5.08
0.42 0.04
0.20

3.05
0.12
17.02
0.67
SCALE 3:1 inches
mm 

*For additional information on our Pb−Free strategy and soldering


details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.

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