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Textbook Atomic Force Microscopy Methods and Protocols Nuno C Santos Ebook All Chapter PDF
Textbook Atomic Force Microscopy Methods and Protocols Nuno C Santos Ebook All Chapter PDF
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Methods in
Molecular Biology 1886
Nuno C. Santos
Filomena A. Carvalho Editors
Atomic Force
Microscopy
Methods and Protocols
METHODS IN MOLECULAR BIOLOGY
Series Editor
John M. Walker
School of Life and Medical Sciences
University of Hertfordshire
Hatfield, Hertfordshire, AL10 9AB, UK
Edited by
This Humana Press imprint is published by the registered company Springer Science+Business Media, LLC, part of
Springer Nature.
The registered company address is: 233 Spring Street, New York, NY 10013, U.S.A.
Preface
Atomic force microscopy (AFM) has been applied over the last 30 years in a variety of
research fields, including physics, chemistry, engineering, biology, and biomedical sciences.
This work intends to collect some of the most relevant and/or recent experimental
approaches “using atomic force microscopy in Biology and Biomedical Sciences.” Our
overall objective was to provide examples of applications using biological samples, showing
different methods for AFM sample preparation, data acquisition, and processing and some
tips and tricks for optimizing AFM measurements and to avoid problems during them. We
have brought together all these recent advances in the AFM field, expecting that this work
can be a bibliographic reference for researchers on different stages of know-how working
with an AFM in biology, from newcomers with low level of knowledge on the use of this
technique to researchers experienced in AFM but that are starting to work with a particular
new type of sample, methodology, or data treatment process.
For those researchers interested in studying biological samples using AFM, the avail-
ability of a comprehensive source of protocols describing the most recent methodological
advances in this technique is invaluable, as many research publications do not provide such
detailed information and technical notes that are critical to be successful in developing the
experiments. For this reason, we have put together a series of protocols written by a
transdisciplinary group of internationally recognized experts working on developing new
tools for addressing distinct biological questions, therefore providing guidelines for better
performing AFM imaging and force spectroscopy experiments.
The book has 21 chapters, divided into 2 main parts. The first part includes six chapters
addressing the AFM imaging of biological samples; the second part is composed of 15 chap-
ters dedicated to different biological applications and experimental aspects of AFM-based
force spectroscopy measurements.
In Chap. 1, Eaton and Batziou [1] describe different experimental artifacts and technical
issues that an AFM user could face while obtaining AFM images. In this chapter, the authors
describe different types of image artifacts pointing solutions to avoid them. This chapter is
extremely useful to all AFM users, especially to the new ones, whom have little chance of
understanding if something is going wrong with an image. In Chap. 2, Connell et al. explain
different methods to process and quantitatively analyze AFM images of phase-separated
supported lipid bilayers [2]. In Chap. 3, Nasrallah et al. detail the protocol to fabricate
supported lipid bilayers, as well as the main guidelines for successfully using high-speed
AFM imaging [3]. Senapati and Park outline the AFM procedures for imaging membrane
proteins (rhodopsin nanodomains) and to perform their quantitative analysis in Chap. 4 [4].
A detailed description of the methods to prepare and image DNA-protein complexes is
given in Chap. 5 by Pisano and Gilson [5]. The first part of the book ends with Chap. 6, in
which Pi and Cai introduce AFM cell topography, which includes the basic principle of AFM
imaging, basic operation modes, imaging of biological sample, critical tips for cell topogra-
phy and its quantitative imaging, as well as some applications [6].
The second part of the book shows different examples of single-molecule force spec-
troscopy studies and protocols to carry them out. To prepare the samples to perform these
studies, first it is necessary to functionalize the AFM tips and supports for molecular
recognition. Ebner et al., in Chap. 7, describe a set of methods by which a variety of
v
vi Preface
In addition to the protocols themselves, the Notes section of each chapter provides
extremely useful and interesting information about some tips and tricks that are not typically
published in the Methods sections of other standard journal articles.
Acknowledgments
We would like to thank Prof. John M. Walker, our Series Editor at Springer International
Publishing AG (a product of Humana Press), for all the help with the publication of this
volume and for the opportunity to bring together an extraordinary collection of articles.
We also would like to thank Fundação para a Ciência e a Tecnologia, Ministério da
Ciência, Tecnologia e Ensino Superior (FCT-MCTES, Portugal), for their support through
the grants PTDC/BBB-BMD/6307/2014 and PTDC/BBB-BQB/3494/2014.
Finally, we are extremely grateful to all the authors that accepted our challenge, for
taking their time to write these exceptional chapters.
References
1. Eaton P, Batziou K (this volume) Artifacts and practical issues in Atomic Force Microscopy. Methods
Mol Biol
2. Connell S, Heath GR, Goodchild JA (this volume) Quantitative analysis of structure and dynamics in
AFM images of lipid membranes. Methods Mol Biol
3. Nasrallah H, Vial A, Pocholle N, Soulier J, Costa L, Godefroy C, Bourillot E, Lesniewska E, Milhiet
P-E (this volume) Imaging artificial membranes using high-speed Atomic Force Microscopy. Methods
Mol Biol
4. Senapati S, Park PS-H (this volume) Investigating the nanodomain organization of rhodopsin in native
membranes by atomic force microscopy. Methods Mol Biol
5. Pisano S, Gilson E (this volume) Analysis of DNA-protein complexes by Atomic Force Microscopy
Imaging: the case of TRF2-telomeric DNA wrapping. Methods Mol Biol
6. Pi J, Cai J (this volume) Cell topography and its quantitative imaging by AFM. Methods Mol Biol
7. Ebner A, Wildling L, Gruber HJ (this volume) Functionalization of AFM tips and supports for
molecular recognition force spectroscopy and recognition imaging. Methods Mol Biol
8. Liu J, Li W, Zhang X, Feng Y, Fang X (this volume) Ligand-receptor binding on cell membrane:
dynamic force spectroscopy applications. Methods Mol Biol
9. Sumbul F, Rico F (this volume) Single molecule force spectroscopy: experiments, analysis and simula-
tions. Methods Mol Biol
10. Unsay JD, Garcı́a-Sáez AJ (this volume) AFM to study pore-forming proteins. Methods Mol Biol
11. Pires RH, Delcea M, Felix SB (this volume) Imaging and manipulation of extracellular traps by atomic
force microscopy. Methods Mol Biol
12. Oh YJ, Hinterdorfer P (this volume) Investigation of bacterial curli production and adhesion using
AFM. Methods Mol Biol
13. Domingues MM, Felı́cio MR, Gonçalves S (this volume) Antimicrobial peptides: effect on bacterial
cells. Methods Mol Biol
14. Guo Y, Roos W (this volume) AFM nanoindentation experiments on proteins shells: a protocol.
Methods Mol Biol
viii Preface
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v
Contributors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xi
PART I IMAGING
ix
x Contents
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 369
Contributors
xi
xii Contributors
Imaging
Chapter 1
Abstract
As with any other microscopic technique, in atomic force microscopy (AFM), problems can arise. Some of
these happen due to improper use of the microscope by the operator, and some are due to particular
characteristics of the sample. Some occur depending on the type of instrument, or from probe damage.
Some of them are artifacts inherent in the technique. Knowledge of these issues is important for correct data
acquisition and interpretation, and in many cases, training in AFM is inadequate. In this chapter we show
examples of common artifacts in AFM and describe, where possible, how to overcome them. Other practical
issues important for best practice in AFM operation, such as noise reduction and data processing, are also
discussed.
1 Introduction
Nuno C. Santos and Filomena A. Carvalho (eds.), Atomic Force Microscopy: Methods and Protocols, Methods in Molecular Biology,
vol. 1886, https://doi.org/10.1007/978-1-4939-8894-5_1, © Springer Science+Business Media, LLC, part of Springer Nature 2019
3
4 Peter Eaton and Krystallenia Batziou
2 Types of Artifacts
2.1 Probe Artifacts Probe artifacts come about when the shape of the probe is nonideal.
In AFM, as in many other methods, the data output always depends
on the nature of the probe. The image obtained in any microscope
is a convolution of the probe with the sample. In the case of AFM,
the ideal situation is to have the probe with a tip diameter smaller
than the highest resolution required. The probe should also have a
high aspect ratio, such that the probe can reach to the bottom of
any depression or pits in the sample surface, with the minimum of
contact between the sides of the probe and sides of sample features.
However, this is not always the case. Probe-sample convolution and
the effect of different probe sizes are illustrated in Fig. 1.
Sample feature dilation by the probe is an effect that always
occurs in AFM imaging, and can be minimized, but not totally
Artifacts and Practical Issues in AFM 5
Fig. 1 Illustration of effects of probe dilation on the image formed in AFM. In each
case, the left images show the probe and sample feature, the right the image
formed. The first two images show the effect on a raised feature with a small
probe (a), and then with a large diameter tip (b). The lower two images show the
effects of imaging a depressed feature (a pit) with a small (c) and large diameter
tip (d). Raised features tend to be dilated by the probe, while maintaining
accurate height reproduction. On the other hand, depressed features will
become smaller, both in width and height
Fig. 2 Images showing the differences between imaging with a sharp (a) versus
a blunt (b) probe. Both images show the same sample (biaxially oriented
polypropylene film, BOPP), imaged with a sharp probe (a) and with a probe of
the same type that had been blunted by prolonged use (b)
Fig. 3 Examples of tip artifacts leading to repeating shapes in the height images. The samples were protein
nanoparticles (a and c) and a glass microscope slide coated with in proteins (b). All scale bars represent
500 nm
Fig. 4 Illustration of a double tip effect. Height image of DNA molecules, where
each molecule has an apparent “twin” caused by contamination of the probe.
The x–y scale of the image is 1.5 1.5 μm, and the image height is 2.0 nm
Fig. 5 Illustration of the effect of imaging holes in a sample surface with a blunt tip. (a) Height image of a
calibration artifact which features an array of square holes imaged with a sharp probe. When the same area is
scanned with a blunt probe (b), the holes in the surface appear artificially smaller
2.2 Scanner Artifacts In an AFM, the movement of the probe relative to the sample is
carried by a scanner, which translates a voltage produced by the
control electronics to a nano- or micro-metric movement. In nearly
all cases, these are based on piezoelectric crystals, which expand or
contract depending on the polarity of the voltage applied to them.
Since the coefficient of expansion of commonly used piezoelectric
crystals is commonly on the order of 0.01 nm per volt [15], it is
relatively simple with these devices to produce movements with the
nanometric precision required for an AFM.
An ideal AFM scanner would have a perfectly linear relation
between the voltage applied and the distance traveled in all three
axes, would not have any cross talk between movements in different
axes, would respond instantaneously to changes in voltage, and
would also cease movement immediately that the controlling volt-
age ceases changing.
In general, scanners do not produce such perfect movements,
but suffer from a number of imperfections, which give rise to
specific image artifacts which will be discussed in this section. Not
10 Peter Eaton and Krystallenia Batziou
all AFM scanners are the same, as many different designs are in use,
and some reduce or eliminate some of these artifacts.
Finally, apart from the image artifacts produced by piezoelectric
scanners, it is useful for the AFM operator to be aware that piezo-
electrics are quite sensitive materials. They are fragile, and easily
broken. They can also be depolarized by heat or exposure to water,
which will render them useless. Therefore AFM scanners should be
handled with care, and maintained in a dry, room temperature
environment at all times.
2.2.1 Nonlinearity The first major scanner-related artifact is nonlinearity in the x–y
plane. In general, the response of piezoelectrics to voltage is non-
linear. While there are a number of ways to ameliorate, or reduce
this effect, which will be discussed below, if uncorrected this can
introduce severe distortions in the image. Figure 6 illustrates the
effects of this nonlinearity on an image of an AFM calibration grid,
consisting of square, regularly spaced holes in a flat silicon surface.
The two images in Fig. 6 show the same area of the same sample,
scanned using the same instrument and the same AFM probe. The
height image in Fig. 6a was measured using the raw output from
the scanners to linear voltage ramps. It can be seen that in this case,
the response in the X-axis was extremely nonlinear, while linearity
in the y axis was somewhat better but not perfect. The image shown
in Fig. 6b was linearized using position sensors.
There are a number of ways to remedy or improve the linearity
in AFM scanners:
Fig. 6 Example of distortion in the x–y plane of an AFM image due to nonlinearity in the scanner response. The
two images show the same area of the sample. (a) Height image recorded with hardware linearization
disabled, and (b) height image recorded with hardware linearization (displacement sensors) enabled. Both
images are approximately 74 74 μm in x and y and 235 nm in z (height)
Artifacts and Practical Issues in AFM 11
Fig. 7 The causes and effects of creep. (a) Schematic illustration what happens when a piezoelectric
transducer has a voltage change applied to it—the movement of the piezoelectric tends to continue even
after the voltage stops changing. At the point marked “S,” the creep has stopped, and the system is stabilized,
and suitable to begin measuring an undistorted image. In (b), the result of this effect on atomic force
microscopy images is illustrated. The distortion at the start of the height image (the distortion is seen at the
top, in this figure) is due to creep. The image (b) is approximately 9.5 9.5 μm in x and y and 380 nm in
z (height).This effect should not occur if closed-loop operation is used
Artifacts and Practical Issues in AFM 13
2.2.3 Hysteresis (Edge Another effect caused by imperfections in piezo responses is hyster-
Overshoot) esis. Hysteresis in any material is the tendency to fail to return
perfectly to its original shape after extension or compression. In
the piezo actuator in an AFM, this means that in the x–y axis,
forward and back images may be slightly misaligned, although
this is not an important effect for most measurements. Hysteresis
in the z piezo is more important, since it can lead to inaccuracies in
some height measurements, and also in force-distance curve mea-
surements. Examples of the effects of this phenomenon are shown
in Fig. 8.
If the scanner is prone to this effect, it is actually hard to avoid.
The extent of its effects on the image can be lessened somewhat by
scanning more slowly, but will not disappear. The best way to avoid
it, if possible, is to use z sensor height data instead of raw height
data. This is only available if the instrument in use has a displace-
ment sensor on the z piezo. Use of the z sensor data will also
improve the accuracy of force-distance curves. In both cases, it’s
worth bearing in mind that if the z sensor has a considerable noise
level, using this data instead of the standard z height data may result
in better accuracy but lower precision.
Fig. 8 Effects of hysteresis in piezo actuators in AFM. (a) The image is from a height measurement over
square-profile posts that shows where errors can occur when passing over steep features. (b) An example of
an uncorrected deflection-distance curve (from which force-distance curves are calculated. Close to the
turnaround point at the right (arrowed), the forward and back traces do not match due to piezo hysteresis
14 Peter Eaton and Krystallenia Batziou
2.2.4 Scanner Calibration All AFM systems require calibration of the scanner movement in
order to deliver quantitative results. Commercial systems should be
delivered with an accurate calibration, and a certification indicating
the error in the calibration measurement. Nevertheless, piezoelec-
tric materials age over time, which means that, the exact number of
nanometers they move per applied volt changes. Typically, this
change is faster at the beginning of a scanner’s lifetime, and stabi-
lizes over time. It is highly recommended that the scanner is cali-
brated against a trusted calibration artifact 6 months after
installation, and every year thereafter. Calibration procedures have
been extensively described elsewhere [16].
2.3 Noise Vibrations in the AFM system inevitably give rise to noise in the
data produced. This is common in all high-resolution microscopes.
2.3.1 Acoustic
In AFM, compared to electronic microscopes, the system can be
and Mechanical Noise
more troublesome for two reasons. Firstly, the AFM is often a small
system, so it’s more prone to mechanical vibration. Secondly, in
AFM, the probe physically touches the sample, forming a mechani-
cal loop, which transmits all vibrations in the system into the probe-
sample interface. Typically, AFM installations include some form of
vibration isolation, which reduces these effects to an acceptable
level. Acoustic isolation might be included as well. Nevertheless,
these measures only reduce the level of noise. Figure 9 shows image
recorded in an AFM system located in a fully working vibration, and
acoustic enclosure. In Fig. 9, parts A and B are images recorded in
quiet conditions. Figure 9 (parts c and d) are similar images
recorded with people in the room talking and performing various
noisy activities. These produce significant transient noise in the
image.
In Fig. 9, the noise is clearly visible in the lower right hand error
image (Fig. 9d), and somewhat harder to perceive in the
corresponding height image, at the top right (Fig. 9c). But height
images do contain marked vibrations. These are illustrated in the
height profiles in Fig. 10, which were extracted from the images a
and c from Fig. 9.
In order to avoid the problems shown in Fig. 9, it is important,
firstly, to ensure the AFM instrument is shielded toward both
acoustic and vibrational influences. There are many commercial
vibration solutions available, both active and passive. Passive solu-
tions generally work by connecting the AFM instrument to a large
mass on the end of a soft spring. In this way, high frequency
vibrations are absorbed by the mass-spring system. Active systems,
on the other hand, use accelerometers to measure vibrations com-
ing into the system, and actively compensate for these using actua-
tors. Either kind of system can work extremely well to reduce (but
not to eliminate) vibrations entering the AFM system. Thus it’s
important to install the AFM in a low-noise environment, and avoid
the kind of transient impulses illustrated in Fig. 9. Acoustic
Artifacts and Practical Issues in AFM 15
Fig. 9 Examples of transient noise effects in AFM images. All images show the same area of an HOPG sample.
(a, b) show height and amplitude images, respectively, of the samples taken under quiet conditions, i.e., with
the AFM enclosed in a vibration isolation cabinet, and no acoustic or vibration sources in the room. (c, d) show
the equivalent images of the same area with talking and noisy activities occurring in the room. The lines
marked P1 and P2 refer to profiles through these images shown in Fig. 10
Fig. 10 Height profiles indicating interference in height profiles from acoustic and vibrational noise. The graphs
show two line profiles (P1, P2) from Fig. 9a, c. In both graphs, the blue solid line shows the height profile
measured during noisy conditions (from Fig. 9c), while the red dashed line shows the same line recorded
under quiet conditions (from Fig. 9a)
16 Peter Eaton and Krystallenia Batziou
2.3.2 Electronic Noise It is possible for the AFM to pick up electronic noise from the
surrounding environment (e.g., radio-frequency interference), or
from an internal fault in the AFM to give rise to electronic noise in
the image. External noise sources can be diagnosed by switching off
possibly interfering devices. Fluorescent lights are a common cul-
prit in this regard, either malfunctioning, or not. Internal problems
in the AFM may be harder to deal with, but it’s important that the
user check for loose wires if such a problem is suspected. Very
commonly such problems are simple to diagnose, since they are
either completely constant, or switch on and off suddenly, unlike
other sources of noise, and have fixed frequencies. Commonly, this
will be the frequency of the mains AC source (i.e., either 50 or
60 Hz), which can be measured in the AFM image (Fig. 11).
2.3.3 Bit Noise “Bit noise” is an effect due to the limited bit resolution in the
analogue to digital converters (ADCs) which are a vital part of the
AFM. Usually this is only seen in z height images, when looking at
extremely flat samples, or measuring very small images. It comes
about because the AFM electronics usually record the height data
as 16-bit numbers. With 16 bits, the number of discrete height
values that can be registered is 216, i.e., 65,536. While this is a very
large number, and is sufficient for most cases, since the AFM is
extremely sensitive in z, it can be a limitation. If we take the case of
a very large scanner, with 10 μm height range, we can determine
that the smallest value that can be distinguished is 10,000/
65,536, i.e., 0.15 nm. This is a pretty small measurement, espe-
cially in a range of 10 μm; however, most AFMs will have a noise
floor several times smaller than this value. Thus for high-resolu-
tion imaging, bit noise can be a significant factor in image quality.
Fortunately, it is a limitation which is generally easy to overcome.
One solution is to use a smaller scanner. AFM instruments are
often purchased with multiple scanners for imaging samples with
difference size features. This does work, but it’s an expensive
solution to a simple problem with a simple solution. With most
systems, it’s possible to artificially limit the range of the scanner
used when imaging under high-resolution/low-noise conditions.
This has the effect of greatly reducing the bit noise. For example,
in the case above, the same scanner might be used with the
effective range of only 1 μm. Thus, the sampling would occur at
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CENTRAL PREMISES
HISTORY
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BY WILLIAM REID
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CONTENTS.
CHAP. PAGE
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IV. St James Street Bakery 29
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