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Metallurgical Engineering
04/13/2021 Slide - 2
Some factors that distinguish PVD from CVD are:
1. Reliance on solid or molten sources
2. Physical mechanisms (evaporation or collisional impact)
by which source atoms enter the gas phase
3. Reduced pressure environment through which the gaseous
species are transported
4. General absence of chemical reactions in the gas phase and
at the substrate surface (reactive PVD processes are
exceptions)
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Two major types of PVD
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Department of Materials and
Metallurgical Engineering
Evaporation
Evaporation Phenomena (1)
Early attempts to quantitatively interpret evaporation
phenomena are connected with the names of Hertz, Knudsen,
and, later, Langmuir. Based on experimentation on the
evaporation of mercury, Hertz, in 1882, observed that
evaporation rates were:
• Not limited by insufficient heat supplied to the surface of the
molten evaporant
• Proportional to the difference between the equilibrium pressure Pe,
of Hg at the given temperature and the hydrostatic pressure Ph,
acting on the evaporant
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Evaporation Phenomena (2)
• Hertz concluded that a liquid has a specific ability to
evaporate at a given temperature.
• Furthermore, the maximum evaporation rate is attained
when the number of vapor molecules emitted corresponds to
that required to exert the equilibrium vapor pressure while
none return.
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Evaporation Phenomena (3)
• These ideas led to the basic equation for the rate of evaporation from
both liquid and solid surfaces, namely,
• Where:
• e, The evaporation flux in number of atoms (or molecules) per unit area per
unit time, and
• e, The coefficient of evaporation, which has a value between 0 and 1.
• Pe, The equilibrium pressure of Hg at the given temperature
• Ph, The hydrostatic pressure acting on the evaporant .
• M is the molecular weight of the gas (oxygen = 16)
04/13/2021 • R Boltzmann constant 1.37 x 10-16 erg deg-1, Slide - 8
• When e = 1 and Pe is zero, the maximum evaporation rate
is realized.
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Evaporation Phenomena (3)
• Evaporation rate formula:
Where:
e, is the mass evaporation rate. At a pressure of torr, a typical
value of e, for many elements is approximately g/cm2-sec of
evaporant.
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Total evaporated mass
Source types:
• Point source
• Surface source
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Thickness film: Point source
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Thickness film: surface source
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Department of Materials and
Metallurgical Engineering
Sputtering
Sputtering target and application
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Department of Materials and
Metallurgical Engineering
RF Sputtering
History RF sputtering
• RF sputtering was invented as a means of depositing
insulating thin films.
• Suppose we wish to produce thin SiO, films and attempt to
use a quartz disk 0.1 cm thick as the target in a conventional
dc sputtering system.
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How RF sputtering work?
• RF voltages can be coupled through any kind of impedance so that
the electrodes need not be conductors. This makes it possible to
sputter any material irrespective of its resistivity. Typical RF
frequencies employed range from 5 to 30 MHz. However, 13.56
MHz is widely used
• RF sputtering essentially works because the target self-biases to a
negative potential. Once this happens, it behaves like a dc target
where positive ion bombardment sputters away atoms for subsequent
deposition. Negative target bias is a consequence of the fact that
electrons are considerably more mobile than ions and have little
difficulty in following the periodic change in the electric field.
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Department of Materials and
Metallurgical Engineering
Magnetron Sputtering
Magnetron sputtering
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Department of Materials and
Metallurgical Engineering
Reactive Sputtering
Reactive sputtering
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Department of Materials and
Metallurgical Engineering
Evaporation vs Sputtering
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