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Events
An event E is a collection of zero or more sample
points from S
Conditional probability
In some experiment, some prior information may
be available, e.g.,
In general,
Mutual Independence
A and B are said to be mutually independent, iff,
Also, then,
Independent set of events
Set of n events, {A1, A2,..,An} are mutually
independent iff, for each
Series system
Parallel system
Series-parallel system (mixed system)
K-out-of-N system
Standby system
Reliability Block Diagrams: RBDs
R1 R2 Rn
Rs Pr ob(1 2 3 n)
RS = R1 R2 ... Rn
n
Rs Ri
i 1
14
Parallel system
R1
..
.
Input Output
..
.
Rn
Input 2 Output
R p Pr ob(1 2 3 n)
RC’ = 1 – (1-RC)(1-RC)
Series-Parallel System
Series-parallel system: n-series stages, each with
ni parallel components.
voice
control
Input Output
voice
control
voice
Distribution Function:F t 1 e t
t0
Density Function: f t e t
t0
Reliability: R t e t
t0
h t
f t
Failure Rate:
R t
n n
Rs Ri or Rs (t ) Ri (t )
For weibull Distribution:
i 1 i 1
i t
it
if Ri (t ) e then Rs (t ) e i 1
i t
( i ) t
if Ri (t ) e then Rs (t ) e i 1
MTTF for Series System
i 1
i
Parallel system in RBD
A system consisting of n independent components in
parallel.
R1
..
.
It will fail to function only if all n components have failed.
Ei = “The component i is functioning” ..
.
Ep = "the parallel system of n component is functioning
properly."
Rn
Parallel system in RBD(Continued)
E p " The parallel system has failed "
" All n components have failed "
__ __ __
E1 E2 ... En
Therefore:
__ __ __ __ __ __ __
P( E p ) P( E1 E2 ... En ) P ( E1 ) P ( E2 )...P ( En )
P( E p ) 1 P( E p )
Reliability for parallel system
Product law of unreliabilities
n n
R p 1 (1 Ri ) , or R p (t ) 1 (1 Ri (t ))
i 1 i 1
R(t ) [1 (1 Rc (t )) ][1 (1 Rv (t )) ]
2 3
c t 2 c t v t 2 v t 3v t
(2e e )(3e 3e e )
The WFS Example
File Server
Computer Network
Workstation 1 Workstation 2
RBD for the WFS Example
Workstation 1
File Server
Workstation 2
RBD for the WFS Example
(cont.)
Rw(t): workstation reliability
Rf (t): file-server reliability
System reliability R(t) is given by:
R t 1
1 RW t R t
2
f
Note: applies to any time-to-failure distributions
RBD for the WFS Example
(cont.)
Assuming exponentially distributed times to failure:
failure rate of workstation W
failure rate of file-server f
t
R( t ) [1 (1 e w t 2
) ]e f
C
D
A B C E
D
Assuming for each block a failure rate i andC
Calculate reliability for specified time period of 2500 hrs
and MTTF
x
F ( x ) P (Y ( t ) x ) C(n, k) p
k
(1 - p) n- k
k 0
E[Y ( t )] np
Reliability evaluation of K-of-N System
P ( X x) C (n, x) R x (1 R) n x
Rs P( X K ) P( X K 1) P( X N )
N
Rs C ( N , i ) R i (1 R) N i
iK
Reliability for identical K-of-N
Reliability of identical k out of n system
n
Rkofn (t ) FYnk 1 (t ) ( nj )[ R (t )] j [1 R (t )]n j ,
j k
Operating unit
A
Switching device
Output
Input
B
Standby unit
As = Reliability of the switching device
( As 1.0) (0 As 1.0)
B
Standby unit
Let,
Rs (t ) P ( x 0) P ( x 1) e m me m (1 t )e t
2
MTTF Rs (t )dt
0
Case-1: (1/2) standby system (1-OU and 2-SU)
OU-1
Switching device
SU-1
Input Output
SU-2
System reliability is given by,
2 m
m m m e
Rs (t ) P( x 0) P( x 1) P( x 2) e me
2!
1 t
t t
2
e
2!
3
MTTF Rs (t )dt
0
Case-1: (1/N) standby system (1-OU and N-SU)
OU-1
Switching device
Input SU-1
SU-2
Output
SU-N
Rs (t ) P( x 0) P( x 1) P( x N )
1 N
MTTF Rs (t )dt
0
Case-2: (n/N) standby system n-OU and N-SU
OU-1
OU-2
Switching devices
Here, m n t SU-1
Rs (t ) P( x 0) P( x 1) P( x N ) SU-2
1 N
MTTF Rs (t )dt SU-N
0
n
Reliability Evaluation of Standby System
(Imperfect switching device)
Case-1: (1/1) standby system (1-OU and 1-SU)
Operating unit
A
Switching device
( As 1)
Output
Input
B
Standby unit
Standby system
Reliability Evaluation of Standby System
(Imperfect switching device)
Case-3: 1-OU and 1-SU
Rs (t ) P ( x 0) P ( x 1) As e m As me m (1 tAs )e t
1 As
MTTF Rs (t )dt
0
Case-3: 1-OU and 2-SU
Case-3: (n/N) standby unit (n-OU and N-SU)