Professional Documents
Culture Documents
S D
B
THE TRANSISTOR AS A SWITCH
Ron is time varying, nonlinear and dependent on VGS V T
the operating point of the transistor
- Constant and linear resistance Req Ron
- Average value of the resistance over the S D
operating region of interest
Rmid
R0
V DS
VDD/2 VDD
Req - Average value of the resistances at the end points of
ID
V GS = VD D
R0
V DS
VDD/2 VDD
Source Drain
W
n+ xd xd n+
Gate-bulk
L d overlap
Top view
CGSO, CGDO = Cox xdW
Gate oxide
tox
n+ L n+
Cross section
GATE CAPACITANCE – CHANNEL CHARGE
G G G
DIFFUSION CAPACITANCE
Channel-stop implant
NA+
Side wall
Source
W
ND
Bottom
xj Side wall
Channel
LS Substrate N A
DYNAMIC BEHAVIOR OF MOS TRANSISTOR
G
CGS CGD
S D
-10 Exponential
10
-12 VT
10 Typical values for S:
0 0.5 1 1.5 2 2.5
VGS (V) 60 .. 100 mV/decade
THRESHOLD VARIATIONS
VT VT
VDS
L
14