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528 IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 61, NO.

1, JANUARY 2014

Fig. 21. Performance plot at node 6.


Fig. 18. Pattern classification plot at node 5.
TABLE I
P ROPERTY N ODE W ISE C LASSIFICATION ACCURACY

TABLE II
D ISTURBANCE W ISE C LASSIFICATION ACCURACY

Fig. 19. Performance plot at node 5.

TABLE III
C OMPARISON W ITH OTHER M ETHODS

decomposition, the leaf nodes correspond to individual distur-


bance classes. The proposed classifier is compared with an ST-
Fig. 20. Pattern classification plot at node 6. based approach. The features extracted from the ST are the
entropy and standard deviation of the ST result. The details
of all the nodes and disturbances are presented in Tables I of the feature extraction can be found in [15]. The overall
and II, respectively. At the root node, the entire data set with classification accuracy of the proposed method is compared
eight disturbances is subjected for classification into two child with that of some previous methods, and they are summarized
nodes with four disturbances in each. After the three levels of in Table III.

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