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SIEVERT INDIA PVT. LTD.

16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706


Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in

QUESTION PAPER

Ref No: – SIPL/NDT/TR.CERT/WP-02 Date -

Method : PAUT
Level : II
Examination Type : Theory

Name of candidate :-

Examination Start Time :-

Finish Time :-

Signature of Examiner :-

Marks Evaluated by
Total Marks Marks Obtained %
ASNT level III (UT)

INSTRUCTION FOR CANDIDATE :

(1) This examination paper contains 30 Questions.


(2) Questions are multi choices.
(3) This examination is a closed book Exam. No reference material will be given.
(4) All questions are to be answered and Carrey equal marks. No negative marks.
(5) Total marks of this examination are 30.Duration of this examination is 30 minutes.
(6) Encircle only one, which is the most correct answer .More than one circled will be
considered wrong answer.
(7) If any change of answer ,candidate should put signature near that multiple choice,
show cloud marking on earlier multiple choice along with ‘x’ mark to indicate
cancellation of earlier multiple choice ,otherwise it will be considered wrong
answer.
(8) A Scientific calculator can be used if require .A Programmable calculator and/or
digital diary is not allowed to use. A dictionary can be used for English
translation in to English or other language.

Signature of Candidate.

1. The Advantages of phased array technology over conventional UT is

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
a. High speed inspection
b. Software control of probe characteristics
c. Multiple angle inspection
d. All of the above
e. a & c only

2. phased array UT is a replacement to conventional UT


a. True
b. False
c. May be considered
d. Need more information

3. The phased array probe design is based on


a. Composite technology
b. Piezo-ceramic technology
c. Ferro electric technology
d. Piezo electric technology

4. The beam steering capabilities of the phased array probe is best achieved by
a. Element width
b. Element size
c. Element gap
d. Total Aperture

5. Phased array beam forming is achieved by


a. Introduction of time shifts during pulse and reception of the individual elements
b. Constructive interference of the acoustic waves forming a wave front
c. Either a or b
d. a & b

6. Linear scanning of a phased array probe is governed by


a. Application of same focal laws multiplexed through many elements
b. Application of different focal laws to different elements
c. Requirement of more number of elements
d. All of the above

7. When it is said that the phased array equipment is 32/128 than what does it means?
a. Probe with only 32 elements can be connected
b. 32 elements can activated simultaneously at a given time
c. 128 can be activated simultaneously at a given time
d. All of the above

8. Encoder resolution for the mouse scanner is…..

a. 32 steps/mm
b. 12 steps/mm
c. 2100 steps/mm
d. 22 steps/mm

To solve the question No. 10, use the below image…..

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in

9. RA stands for Distance between the wedge reference point and the reflector (true/false).

10. What does it stands AOD & COD type of wedge?

11. Phased array Module is designated as “PA 16/128” where 16/128 denotes
a. 16 pulsers and a total of 128 elements
b. 128 pulsers and a total of 16 elements
c. 16 pulse and a total of 128 elements
d. 128 pulse and a total of 128 elements

12. TOFD technique is able to detect


a. Porosity
b. Misoriented crack
c. LOF
d. All of the above
e. a and c only

13. TOFD is scanning based on ….


a. Non amplitude
b. Dependent of weld configuration
c. High Signal to noise ratio
d. None of the above

14. TOFD is scanning based on ….


a. Amplitude
b. Independent of weld configuration
c. High Signal to noise ration
d. None of the above

15. Advantage of TOFD…..


a. Can’t characterize surface breaking defects
b. Excellent PoD for mid-wall defects
c. Not good detection of mis-oriented defects
d. None of the above

16. Limitation of TOFD…


a. Dead zone upto mid-wall
b. High signal to noise ratio
c. High sensitivity

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
d. Dead zone at top surface (OD)

17. Which ASME standard is the related to code case 181?


a. ASME B 31.1 and process piping
b. ASME B 31.3 and process piping
c. ASME B 31.1 and power piping
d. ASME B 31.3 and power piping

18. Allowable Root Volumetric Indication as per API 1104


a. 3 mm
b. >3 mm
c. <6 mm
d. >6 mm

19. Allowable Linear surface indication as per API 1104

a. >50 mm
b. <50 mm
c. >25 mm
d. <25 mm

20. Increasing PRF too high results in ghost or phantom signals (True / False).

21. “Dead elements” are elements in an array that are no longer active in a phased array
probe. This is a result of
a. Failed elements or their soldered connections in the probe
b. Poor or intermittent contacts at the connection terminals or in the cables
c. Failed pulser – receiver boards
d. All of the above potential sources
22. What is not an advantage of 12 bit digitisation over 8 bit digitisation?
a. Improved resolution
b. Improved signal to noise ratio
c. Smaller file size
d. Option to reduce gain to avoid signal saturation

23. Reduction of what parameter will increase the size of a data file collected in a phased –
array S-scan?
a. A-scan time window
b. Number of angles sampled in the S-scan
c. Data sampling rate (12 bit to 8 bit)
d. Scan axis resolution (sample internal)

24. Decreasing which parameter will decrease the size of a data file collected in a phased –
array S-scan?
a. A-scan time window length (range)

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
b. Number of angles sampled in the S-scan
c. A-scan window ADC rate
d. All of the above

25. Some UT instruments permit selection of “filters” in the receiver to optimise signal results.
When using a band – pass filter what is the process called?
a. Probe bandwidth
b. Probe centre frequency
c. Cable length
d. The number of elements in the array

26. The focusing capabilities of the phased array probes is limited to


a. Within Fresnel zone
b. Within Fraunhofar zone
c. Away from Fresnel zone
d. Away from Fraunhofar zone

27. The cobra scanner circumferential pipe OD coverage is


a. 4.5 inch and more
b. 6 inch and more
c. 0.84 inch to 4.5 inch
d. None of above

28. The encoder resolution of the cobra scanner is


a. 32 steps/mm
b. 12 steps/mm
c. 2100 steps/mm
d. 22 steps/mm

29. How much frequency and how many no.s of total element used in cobra scanner probe?
30. Velocity calibration can be performed using:
a. Reflectors from two known radii
b. Reflectors from two side drilled holes at known depths
c. Reflectors from two blocks of the same material with known thicknesses
d. All of the above

31. Which skew (degree) angle used for the transverse indications:
a. 0 degree
b. 90 degree
c. 200 degree
d. 270 degree

32. Which one is Planar Flaws in below mentioned list:


a. burn through
b. porosity
c. lack of fusion
d. none of the above

33. Which one is not the welding defect:


a. Burn through
b. Root concavity
c. Hot tear

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
d. Under cut

34. which option is correct for D – scan:


a. when scanning the probe pair normal to the direction of the beam along a weld or flaw
b. when scanning the probe pair in the direction of the beam transversely across a weld or
flaw
c. a quantitative display of signal amplitudes and time-of-flight data obtained at a single
point on the surface of the test piece
d. quantitative display of signal amplitudes obtained over an area of the test piece surface

35. Arrange the steps to a sensitivity calibration


i. Set section
ii. Set reference amplitude
iii. Set gate A on echo A
iv. Calibrate and accept
v. Set compensation gain
a. i, ii, iii, iv, v
b. ii, i, iii, v, iv
c. ii, iii, i, v, iv
d. ii, iii, I, iv, v

36. The wedge delay calibration is a process that:


a. Identifies the bottom of the wedge
b. It establishes a zero position for the entry surface of the part for all the focal laws
c. Results in each focal laws displaying the same reflector position from the target used
d. All of the above

37. If the gain is set too high when producing the wedge delay envelope:
a. Some or all of the envelope will be drawn off the calibration screen area
b. The instrument will compensate for this
c. An error may result when applying “calibration”
d. Both a & c

38. Type of reflectors used in non-piping job according to code:


a. SDH & Notch,
b. Notch
c. SDH & through hole
d. FBH & Notch

39. For a given linear phased array probe, what variable is available to the operator to limit its
near field length?
a. Frequency
b. Number of elements used
c. Pulse duration of the pulser voltage
d. Voltage to the pulser

40. What is the encoder resolution of weldrover scanner:


a. 12 steps/mm,
b. 2200 steps/mm,
c. 32 steps/mm,
d. 2100 steps/mm,

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
41. Phased array applications use a group of elements in firing a specific focal law. The
dimension of the equivalent probe size in the focal law is considered:
a. The total aperture
b. The active aperture
c. The passive aperture
d. None of the above

42. During data analysis, Data cursor stands for:


a. Green
b. Blue
c. Red
d. None of the above

43. Dead zone can be reduced by


a. increasing the frequency
b. increasing the damping of the piezo electic element in probe
c. improving the surface finishing of the object
d. all of the above
44. Which of the following will have better resolution?
a. highly damped probe
b. hand surface probe
c. large diameter low frequency probe
d. none of the above have any effect on the resolution

45. Short duration pulses from well damped transducers should significantly improve?
a. near surface resolution
b. far field penetration
c. near zone length
d. all the above

46. Increasing the length of the pulse applied to the search unit will
a. increase penetration but decrease resolution
b. decrease penetration and increase resolution
c. increase both penetration and resolution
d. decrease both resolution and penetration

47. The equation sinθ = 1.08λ/D, describes


a. One half-beam spread angle at 20% decrease in signal from the centreline value
b. One half-beam spread angle at 50% decrease in signal from the centreline value
c. One half-beam spread angle at 10% decrease in signal from the centreline value
d. Beam spread angle at 10% decrease in signal from the centreline value

48. Two signals were compared in amplitude to each other. The second was found to be 14 dB
less than the first. This change could have represented a change of….
a. 70 % FSH to 14 % FSH
b. 100 % FSH to 50 % FSH
c. 20 % FSH to 100 % FSH
d. 100 % FSH to 25 % FSH

49. The thinner the crystal, the higher the frequency (true or false).

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
50. Higher frequency sound beams produce higher levels of sensitivity and resolution, but less
ability to penetrate test objects to great depths (true or false).

51. What is the purpose of lateral wave subtraction?


a. Noise reduction
b. To access flaw
c. Aesthetics
d. Both a and c
52. What is used to establish sensitivity when performing a TOFD inspection?
a. Machined targets
b. Reference signals such as the lateral wave or backwall
c. Grain noise
d. Any of the above may be used if suitable

53. TOFD came to prominence as a result of the need to


a. Distinguish geometry from real defects
b. Improve detection of non-fusion
c. Characterise porosity
d. Improve flaw sizing

54. Monitoring the amplitude of the lateral wave is a useful method of


a. Flaw sizing
b. Flaw detection
c. Law characterisation
d. Coupling monitoring

55. Volumetric individual defect length is acceptable as per ‘welding of pipelines and
related facilities’…………

56. IP defect length is acceptable as per ‘welding of pipelines and related


facilities’………….

57. What’s effect of the averaging on the signal in a Data Acquisition System:
a. Decrease in SNR ratio
b. increasing the Effects of Noise
c. Reducing the Effects of Noise
d. None of the above

58. The trace in a sensitivity calibration


a. Refers to the blue outline of the S-Scan display
b. Refers to the green line drawn while transitioning the probe
c. Is analogous to the envelope as mentioned in wedge calibration
d. Both b & c

59. Below shown figure, the arrows is indicating ………………………………………………………type defect.

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in

60. Below shown figure, the arrows is indicating ………………………………………………………type defect.

METHOD: PAUT

EXAMINATION TYPE : Theory DATE:

NAME:

SIGNATURE & DATE:

INSTRUCTIONS:
1. The correct answer should be darkened properly. e.g. 1. Ⓐ ● ⒸⒹⒺ
2. Only one answer should be darkened.
3. No negative marking.
4. Answer explanation and fill in the blank questions on separate sheet and attach.

1. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 31. ⒶⒷⒸⒹⒺ
2. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 32. ⒶⒷⒸⒹⒺ
3. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 33. ⒶⒷⒸⒹⒺ
4. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 34. ⒶⒷⒸⒹⒺ
5. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 35. ⒶⒷⒸⒹⒺ
6. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 36. ⒶⒷⒸⒹⒺ
7. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 37. ⒶⒷⒸⒹⒺ
8. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 38. ⒶⒷⒸⒹⒺ
9. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 39. ⒶⒷⒸⒹⒺ
10. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 40. ⒶⒷⒸⒹⒺ
11. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 41. ⒶⒷⒸⒹⒺ
12. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 42. ⒶⒷⒸⒹⒺ
13. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 43. ⒶⒷⒸⒹⒺ
14. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 44. ⒶⒷⒸⒹⒺ
15. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 45. ⒶⒷⒸⒹⒺ
16. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 46. ⒶⒷⒸⒹⒺ
17. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 47. ⒶⒷⒸⒹⒺ
18. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 48. ⒶⒷⒸⒹⒺ
19. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 49. ⒶⒷⒸⒹⒺ
20. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 50. ⒶⒷⒸⒹⒺ
21. Ⓐ Ⓑ Ⓒ Ⓓ Ⓔ 51. ⒶⒷⒸⒹⒺ

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SIEVERT INDIA PVT. LTD.
16 & 17, Plot-2, Phase-II, Sector-2, Nerul, Navi Mumbai-400706
Phone: +91 22 27727060/27732001, Fax: +91 22 27727076
Email: sievert@mtnl.net.in Web: www.sievert.in
22. ⒶⒷⒸⒹⒺ 52. ⒶⒷⒸⒹⒺ
23. ⒶⒷⒸⒹⒺ 53. ⒶⒷⒸⒹⒺ
24. ⒶⒷⒸⒹⒺ 54. ⒶⒷⒸⒹⒺ
25. ⒶⒷⒸⒹⒺ 55. ⒶⒷⒸⒹⒺ
26. ⒶⒷⒸⒹⒺ 56. ⒶⒷⒸⒹⒺ
27. ⒶⒷⒸⒹⒺ 57. ⒶⒷⒸⒹⒺ
28. ⒶⒷⒸⒹⒺ 58. ⒶⒷⒸⒹⒺ
29. ⒶⒷⒸⒹⒺ 59. ⒶⒷⒸⒹⒺ
30. ⒶⒷⒸⒹⒺ 60. ⒶⒷⒸⒹⒺ

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