LINE DIFF Protection 0f koka SS Panel BPHASE To PHASE test:

Test Object - Device Settings

Substation/Bay:
Substation: Koka SS Substation address:
Bay: Adama II line Bay address:

Device:
Name/description: lLINE DIFF Manufacturer: NR
Device type: PCS 931 Device address:
Serial/model number: 2A49B9
Additional info 1:
Additional info 2:

Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 100.0 V V primary: 230.0 kV
I nom (secondary): 5.000 A I primary: 800.0 A

Residual Voltage/Current Factors:

VLN / VN: 1.732 IN / I nom: 1.000

Limits:
V max: 200.0 V I max: 50.00 A

Debounce/Deglitch Filters:
Debounce time: 3.000 ms Deglitch time: 0.000 s

Overload Detection:
Suppression time: 50.00 ms

Test Object - Other RIO Functions

CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Distance Settings

System parameters:
Line length: 402.0 mΩ Line angle: 74.74 °
PT connection: at busbar CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:

Tolerances:
Tol. T rel.: 5.000 %
Tol. T abs. +: 50.00 ms Tol. T abs. -: 0.000 s
Tol. Z rel.: 5.000 % Tol. Z abs.: 50.00 mΩ
Grounding factor:
kL mag.: 1.000000 kL angle: 0.000000°
Separate arc no
resistance:

Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1 All Tripping All 0.000 s 5.000 % 50.00 ms 0.000 s 5.000 % 50.00 mΩ
Z2 All Tripping All 300.0 ms 5.000 % 50.00 ms 0.000 s 5.000 % 50.00 mΩ
Z3 All Tripping All 1.300 s 5.000 % 50.00 ms 0.000 s 5.000 % 50.00 mΩ
X/Ω

10

-5 -4 -3 -2 -1 0 1 2 3 4 5 6 7
R/Ω

Hardware Configuration

Test Equipment
Type Serial Number
CMC256plus KA686C

Hardware Check
Performed At Result Details
Not yet performed
Analog Outputs
Test Equipment Test Object
Connection Signal
Device Connector Display Name
Terminal
CMC256plus 1 V L1-E V L1-E
VA 2 V L2-E V L2-E
KA686C 3 V L3-E V L3-E
N
CMC256plus 1 V(2)-1
VB N
KA686C
CMC256plus I 1 I L1 I L1
A 2 I L2 I L2
KA686C 3 I L3 I L3
N
CMC256plus I 1 I(2)-1
B 2 I(2)-2
KA686C 3 I(2)-3
N

Binary/Analog Inputs
Test Equipment Test Object
Connection Signal
Device Connector Display Name
Terminal
CMC256plus 1+ Trip Trip
KA686C 1-
2+ Start Start
2-
3+ Bin. In. 3
3-
4+ Bin. In. 4
4-
5+ Bin. In. 5
5-
6+ Bin. In. 6
6-
7+ Bin. In. 7
7-
8+ Bin. In. 8
8-
9+ Bin. In. 9
9-
10+ Bin. In. 10
10-
1 Bin. In. 11
2 Bin. In. 12
N
Binary Outputs
Test Equipment Test Object
Connection Signal
Device Connector Display Name
Terminal
CMC256plus 1+ Ext. zones Ext. zones
KA686C active active
1-
2+ Bin. Out 2
2-
3+ Bin. Out 3
3-
4+ Bin. Out 4
4-
11 Bin. Out 5
12 Bin. Out 6
13 Bin. Out 7
14 Bin. Out 8
N

Analog DC Inputs
Test Equipment Test Object
Connection Signal
Device Connector Display Name
Terminal
CMC256plus V+ V1
KA686C V-
I+ I1
I-

IRIG-B & GPS

Operating mode: None

Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 5.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 100.00 V RIO/Device/Nominal Values/V nom

Comment

Test Settings

Test model:
Test model: constant test current ITest 5.000 A
Allow reduction of no
ITest/VTest:

Fault Inception:
Mode: random
DC-offset: no

Times:
Prefault: 15.00 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception
Other:
CB simulation: off Extended zones: not active
Switch off at zero no
crossing:

Test Results

Shot Test: Fault Type L1-L2

|Z| Phi t nom t act. Dev. ITest Result
993.2 mΩ 74.74 ° 300.0 ms 328.1 ms 9.367 % 5.000 A Passed
4.826 Ω 74.74 ° 1.300 s 1.325 s 1.938 % 5.000 A Passed
3.711 Ω 74.74 ° 1.300 s 1.321 s 1.654 % 5.000 A Passed
6.000 Ω 74.74 ° 1.300 s 1.323 s 1.746 % 5.000 A Passed
8.000 Ω 74.74 ° 1.300 s 1.327 s 2.085 % 5.000 A Passed
1.672 Ω 74.74 ° 300.0 ms 328.4 ms 9.467 % 5.000 A Passed
0.000 Ω 74.74 ° 0.000 s 35.60 ms 35.60 ms 5.000 A Passed
7.109 Ω 74.74 ° 1.300 s 1.326 s 2.023 % 5.000 A Passed
X/Ω

10

-5 -4 -3 -2 -1 0 1 2 3 4 5 6
R/Ω

Shot Test: Fault Type L2-L3

|Z| Phi t nom t act. Dev. ITest Result
1.225 Ω 74.74 ° 300.0 ms 327.1 ms 9.033 % 5.000 A Passed
4.000 Ω 74.74 ° 1.300 s 1.324 s 1.869 % 5.000 A Passed
0.000 Ω 74.74 ° 0.000 s 39.00 ms 39.00 ms 5.000 A Passed
3.164 Ω 74.74 ° 1.300 s 1.322 s 1.669 % 5.000 A Passed
1.711 Ω 74.74 ° 300.0 ms 329.2 ms 9.733 % 5.000 A Passed
5.518 Ω 74.74 ° 1.300 s 1.322 s 1.669 % 5.000 A Passed
8.000 Ω 74.74 ° 1.300 s 1.327 s 2.085 % 5.000 A Passed
6.898 Ω 74.74 ° 1.300 s 1.326 s 2.008 % 5.000 A Passed
 X/Ω

10

-5 -4 -3 -2 -1 0 1 2 3 4 5 6
R/Ω

Shot Test: Fault Type L3-L1

|Z| Phi t nom t act. Dev. ITest Result
1.038 Ω 74.74 ° 300.0 ms 326.5 ms 8.833 % 5.000 A Passed
4.359 Ω 74.74 ° 1.300 s 1.323 s 1.746 % 5.000 A Passed
1.624 Ω 74.74 ° 300.0 ms 330.8 ms 10.27 % 5.000 A Passed
3.404 Ω 74.74 ° 1.300 s 1.324 s 1.862 % 5.000 A Passed
5.312 Ω 74.74 ° 1.300 s 1.325 s 1.962 % 5.000 A Passed
8.000 Ω 74.74 ° 1.300 s 1.327 s 2.115 % 5.000 A Passed
6.834 Ω 74.74 ° 1.300 s 1.325 s 1.908 % 5.000 A Passed
X/Ω

10

-5 -4 -3 -2 -1 0 1 2 3 4 5 6
R/Ω
Shot Test: Fault Type L1-L2-L3
|Z| Phi t nom t act. Dev. ITest Result
1.790 Ω 74.74 ° 300.0 ms 328.9 ms 9.633 % 5.000 A Passed
4.278 Ω 74.74 ° 1.300 s 1.322 s 1.685 % 5.000 A Passed
6.687 Ω 74.74 ° 1.300 s 1.324 s 1.838 % 5.000 A Passed
3.255 Ω 74.74 ° 1.300 s 1.322 s 1.685 % 5.000 A Passed
1.070 Ω 74.74 ° 300.0 ms 326.8 ms 8.933 % 5.000 A Passed
402.0 mΩ 74.74 ° 300.0 ms 327.2 ms 9.067 % 5.000 A Passed
8.229 Ω 74.74 ° 1.300 s 1.327 s 2.092 % 5.000 A Passed
5.473 Ω 74.74 ° 1.300 s 1.323 s 1.754 % 5.000 A Passed
X/Ω

10

-5 -4 -3 -2 -1 0 1 2 3 4 5 6
R/Ω

Shot Details:

Parameters:
Fault Type: L1-L2-L3
| Z |: 5.473 Ω Phi: 74.74 °
R: 1.441 Ω X: 5.280 Ω
ITest 5.000 A

Results:
t act.: 1.323 s Assessment: Passed
t nom: 1.300 s Dev.: 1.754 %
t min: 1.235 s t max: 1.365 s

Fault Quantities (natural):

VL1: 27.37 V 0.00 °
VL2: 27.37 V -120.00 °
VL3: 27.37 V 120.00 °
IL1: 5.000 A -74.74 °
IL2: 5.000 A -194.74 °
IL3: 5.000 A 45.26 °
VFault: 27.37 V 0.00 °
IFault: 5.000 A -74.74 °
 Fault Postfault
Trip

V/V

60
40
20 t/s
-14 -13 -12 -11 -10 -9 -8 -7 -6 -5 -4 -3 -2 -1 0 1
0
-20
-40
-60
-80

VL1 VL2 VL3

I/A
6

2 t/s
-14 -13 -12 -11 -10 -9 -8 -7 -6 -5 -4 -3 -2 -1 0 1
0

-2

-4

-6

IL1 IL2 IL3

Trip
Start

-14 -13 -12 -11 -10 -9 -8 -7 -6 -5 -4 -3 -2 -1 0 1

t/s

Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 1.323 s <none> n/a
C2 - C1 1.323 s n/a

Test State:
Test passed