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• 30V/70A, D D
D
D
RDS(ON) =4.5mΩ (typ.) @ VGS = 10V
G
RDS(ON) =6mΩ (typ.) @ VGS = 4.5V S
• Super High Dense Cell Design S
S
• Avalanche Rated
Top View of KPAK
• Reliable and Rugged
• Lead Free and Green Devices Available DD DD
(RoHS Compliant)
Applications G
N-Channel MOSFET
Note: ANPEC lead-free products contain molding compounds/die attach materials and 100% matte tin plate termina-
tion finish; which are fully compliant with RoHS. ANPEC lead-free products meet or exceed the lead-free requirements
of IPC/JEDEC J-STD-020C for MSL classification at lead-free peak reflow temperature. ANPEC defines “Green” to
mean lead-free (RoHS compliant) and halogen free (Br or Cl does not exceed 900ppm by weight in homogeneous
material and total of Br and Cl does not exceed 1500ppm by weight).
ANPEC reserves the right to make changes to improve reliability or manufacturability without notice, and advise
customers to obtain the latest version of relevant information to verify before placing orders.
APM4354KP
Symbol Parameter Test Conditions Unit
Min. Typ. Max.
Static Characteristics
BVDSS Drain-Source Breakdown Voltage VGS=0V, IDS=250µA 30 - - V
VDS=24V, VGS=0V - - 1
IDSS Zero Gate Voltage Drain Current µA
Tj=85°C - - 30
VGS(th) Gate Threshold Voltage VDS=VGS, IDS=250µA 1.3 1.8 2.5 V
IGSS Gate Leakage Current VGS=±20V, VDS=0V - - ±100 nA
70
50
60
50
30 40
30
20
20
10
10
o
TC=25 C
o TC=25 C,VG=10V
0 0
0 20 40 60 80 100 120 140 160 0 20 40 60 80 100 120 140 160
1 Duty = 0.5
100 it
Lim 0.2
n)
s(o 1ms
ID - Drain Current (A)
Rd 0.1
10ms 0.05
0.1
10 0.02
100ms
1s 0.01
DC
0.01 Single Pulse
1
2
Mounted on 1in pad
o o
TC=25 C RθJA :50 C/W
0.1 1E-3
0.1 1 10 80 1E-4 1E-3 0.01 0.1 1 10 100
VDS - Drain - Source Voltage (V) Square Wave Pulse Duration (sec)
10
8
90
4V 6
VGS=10V
60
4
3.5V
30
2
3V
0 0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 0 30 60 90 120 150
12 1.2
10 1.0
8 0.8
6 0.6
4 0.4
2 0.2
0 0.0
1 2 3 4 5 6 7 8 9 10 -50 -25 0 25 50 75 100 125 150
1.4
1.2
o
Tj=25 C
1.0 10
0.8
0.6
o
RON@Tj=25 C: 4.5mΩ
0.4 1
-50 -25 0 25 50 75 100 125 150 0.0 0.3 0.6 0.9 1.2 1.5 1.8
4000 8
3500 7
C - Capacitance (pF)
Ciss
3000 6
2500 5
2000 4
1500 3
1000 2
500 Coss 1
Crss
0 0
0 5 10 15 20 25 30 0 10 20 30 40 50 60 70
VDS
L VDSX(SUS)
tp
DUT VDS
IAS
RG
VDD
VDD
tp IL EAS
0.01Ω
tAV
VDS
RD
VDS
DUT 90%
VGS
RG
VDD
10%
tp VGS
td(on) tr td(off) tf
Package Information
KPAK
F1
F
H
E1
G1
G
D
A
C
e B
S KPAK
Y
M MILLIMETERS INCHES
B
O
L MIN. MAX. MIN. MAX.
A 1.00 1.20 0.039 0.047
K 1.60 0.063
OD0 P0 P2 P1 A
E1
F
W
B0
K0 A0 OD1 B A
B
SECTION A-A
T
SECTION B-B
d
H
A
T1
Application A H T1 C d D W E1 F
330.0±2.00 50 MIN. 12.4+2.00 13.0+0.50 1.5 MIN. 20.2 MIN. 12.0±0.30 1.75±0.10 5.5±0.10
-0.00 -0.20
KPAK P0 P1 P2 D0 D1 T A0 B0 K0
4.0±0.10 8.0±
0.10 2.0±0.10 1.5+0.10 1.5 MIN. 0.3±0.05 6.5±0.10 5.3±0.10 1.4±0.10
-0.00
(mm)
TP tp
Critical Zone
TL to TP
Ramp-up
TL
Temperature
tL
Tsmax
Tsmin
Ramp-down
ts
Preheat
t 25 °C to Peak
25
Time
Reliability Test Program
Test item Method Description
SOLDERABILITY MIL-STD-883D-2003 245°C, 5 sec
HOLT MIL-STD-883D-1005.7 1000 Hrs Bias @125°C
PCT JESD-22-B, A102 168 Hrs, 100%RH, 121°C
TST MIL-STD-883D-1011.9 -65°C~150°C, 200 Cycles
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