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Group: SEM
Introduction
When the two p-n semiconductors are joined together, there is whole diffusion and electrons
through the junction, holes from p to n, electrons from n to p. This diffusion gives rise to a
double charged layer adjacent to the two sides of the junction, forming a junction electric field
Etx directed from semiconductor n to semiconductor p. This electric field will prevent carrier
movement through the junction.
This electric field will prevent carrier movement through the junction. If semiconductor p is
connected to the anode and semiconductor n to the cathode of a source U, then on the contact
surface there is a forward electric field E0 pulling the holes and electrons closer, resulting in a
reduced contact layer width go to facilitate the forward current It flow through the diode. When
increasing the voltage U of the power source, i.e. increasing the magnitude of the electric field
E0, the current It also increase very quickly.
One of the properties of the diode is the rectifier property. In the experiment, we will investigate
the rectifying properties of the diode by drawing a volt-aerometric line of this device.
Experimental Procedure
1. Apparatus
- Experimental circuit board with integrated source and measure (Figure 1).
- Components diode
- Resistors 820Ω and 100kΩ
- Wire connection
Figure 1. Laboratory equipment
2. Prepare the experiment
- Step 1: Set up the circuit according to Figure 2
- Step 2: Turn the knob above A2 to 10mA scale. Valuable one the smallest division of the
corresponding group with this scale of A2.
- Step 3: Turn the knob above V to the scale of 1V. Determine the value of one degree the
smallest division of the corresponding measurement unit this scale of V.
Results
The results obtained are summarized in Table 1. This data is presented graphically in Figure
3.
Um = 1-10V ðV = 1.5%
It = 1-10mA ðA1 = 1.5%
In= 100µA ðA2 = 1.5 %
U(V) 0 0.1 0.2 0.3 0.4 0.5 0.52 0.54 0.56 0.58 0.6 0.62 0.64 0.66 0.68
I(mA) 0 0 0 0.02 0.04 0.3 0.42 0.58 0.82 1 1.4 1.8 2.4 2.8 3.6
Discussion