OMICRON PTL Mitsubishi MDT-HA Line

OMICRON PTL

Mitsubishi Electric MDT-HA PGJV01A Line PTT

User Manual

V1.100

© OMICRON electronics GmbH 1/6

OMICRON PTL Mitsubishi MDT-HA Line

Content
1. General ...................................................................................................................................................3
2. Software and Hardware Requirements ...............................................................................................3
3. Hardware ................................................................................................................................................4
4. Functional Range...................................................................................................................................4
5. XRIO Converter ......................................................................................................................................5
5.1 Order Options Block .............................................................................................................................5
6. Specific Protection Tests ......................................................................................................................6
6.1 Distance Pickup Tests ..........................................................................................................................6
6.2 Distance Reach Tests ..........................................................................................................................6

© OMICRON electronics GmbH 2/6

OMICRON PTL Mitsubishi MDT-HA Line

1. General
This user manual describes details of testing Mitsubishi MDT-HA relays with the OMICRON
Protection Test Template. General information about the usage of OMICRON Protection Testing Library
items can be found in the OMICRON PTL user manual.

The template has been tested with the following relay:

Manufacturer: Mitsubishi Electric
Model: MDT-HA
Firmware Versions:
BOOT-M: PGHJ0308
MM-CPU: PGJV01 A
BOOT-R: PGHJ0408
MR-CPU: PGJV02 C

2. Software and Hardware Requirements

To use this template, you must have a valid test license for the OMICRON Test Universe 3.10 software or
higher versions and the following test modules:
• Control Center
• Quick CMC
• State Sequencer
• Advanced Distance
• CB Configuration

Any CMC test set can be used with this Protection Test Template.

© OMICRON electronics GmbH 3/6

OMICRON PTL Mitsubishi MDT-HA Line

3. Hardware
There are multiple possibilities of connecting a MDT-HA relay to a CMC test set. The advised connections
are shown in Error! Reference source not found.. These connections are the default settings in the H
ardware Configuration of the PTT.

Connection for Mitsubishi Electric MDT-HA

4. Functional Range
Supported functions:
• ZS Phase Distance Protection
• ZG Ground Distance Protection
• SOF Switch onto Fault Protection

Not supported functions:

• PS Power Swing Tripping/Blocking
• STB Stub Protection
• CA Carrier Trip Schemes
• UV Undervoltage Protection
• REC Reclosing

Although the functions listed above are not supported by the Protection Test Template, the
Relay Parameter Section of the XRIO Converter includes all protection parameters of the relay.

© OMICRON electronics GmbH 4/6

OMICRON PTL Mitsubishi MDT-HA Line

5. XRIO Converter
The Test Object already contains the Mitsubishi MDT-HA XRIO Converter, which includes setting
parameters of the modelled protection relay. The setting parameters are built as an image of the M32CA
software.

The Filter for Mitsubishi MRD/MDT can be used for importing settings into the Relay Parameter
Section.

5.1 Order Options Block

Nominal frequency, secondary nominal currents and secondary nominal voltages are order options.
These parameters have to be set in the Order Options block for correct operation of the PTT.

© OMICRON electronics GmbH 5/6

OMICRON PTL Mitsubishi MDT-HA Line

6. Specific Protection Tests

6.1 Distance Pickup Tests

The Distance Protection Pickup is tested in two steps. First, the enabling currents HOC1 and HOC2 of the
Distance Protection are verified. After that, the reach settings of all distance zones are checked in the
Distance Reach Tests described later.
HOC1 and HOC2 are tested in a similar matter using State Sequencer test modules. The following
sequence of test states is used for HOC1 testing:
• Pre-Fault with nominal voltages and zero currents for 5 seconds
• Fault at 80% Z1 range at line angle with test current < smallest HOC current. The relay must not
trip in this state
• Pre-Fault 2 with nominal voltages and zero currents for 5 seconds
• Fault at 80% Z1 range at line angle with test current > HOC1 current. The relay should react with
a Z1T trip
• Post-Fault with zero voltages and currents
The sequence of test states for HOC2 testing is similar, only the fault states are different:
• Fault at 85% Z2 range at line angle with test current < smallest HOC current. The relay must not
trip
• Fault at 85% Z2 range at line angle with test current > HOC2 current. The relay should react with
a Z2T trip

6.2 Distance Reach Tests

The Distance Reach Tests are split into two separate test modules. One module, Distance Reach
(Reactance) is intended to verify the reach of all distance zones on the reactance axis (ZX settings). The
other module is intended to verify the reach of all distance zones on the resistance axis (Z1R and Z2R
settings). The reason to separate is the MDT-HA directional element, which needs “Constant Source
Impedance” as selected test method in the Advanced Distance test module to be properly tested. Using
“Constant Test Current” or “Constant Test Voltage” would result in failing tests on the resistance axis. The
downside of Using “Constant Source Impedance” is a great variety of test ranges depending on test
settings, making it very difficult to find one test setting meeting the ranges on both, reactance and
resistance. axis. Therefore, the ZSX and ZGX settings are tested with constant test currents, making it a
lot easier to avoid out of range test points. Normally, no user interaction should be necessary apart from
test point adaption or the addition of more test points.

© OMICRON electronics GmbH 6/6