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Exp. +
#LAB_9 8 09th Nov. ALIGNMENT TESTS FOR MACHINE TOOLS Demo
Demo +
#LAB_10 9 16th Nov. DEMONSTRATION OF JIGS AND FIXTURES + ---------- QUIZ ---------- Quiz
Experiment No. 1
Equipment
• Surface roughness tester and CMM
required
Sample • Calibration surface, silver-steel and mild-steel machined rods (for surface roughness test)
details • Plastic object with flat and cylindrical surfaces and standard calibration ball (for CMM)
✓ To resist corrosion
• A spherical or cylindrical surface cannot be evaluated, but, by removing the radius with a filter, roughness
data is processed as if taken from a flat surface. Other curved surfaces can be processed besides
cylindrical, such as parabolical and ellipsoidal.
• Supporting not only surface roughness measurement but also fine contour measurement
Print output
𝑌1 + 𝑌2 + ….+ 𝑌𝑁
𝐹𝑜𝑟 𝑅𝑎 => 𝑅𝑎 =
𝑁
𝑙
The digital approximation is: 𝑅𝑎 = 1/𝐿 0 𝑌(𝑙) 𝑑𝑙
𝐿 = sample length
𝑌(𝑙) = the profile height function
1/2
𝑌12 + 𝑌22 + ….+𝑌𝑁2
𝐹𝑜𝑟 𝑅𝑞 => 𝑅𝑞 =
𝑁
𝑙 1/2
The digital approximation is: 𝑅𝑞 = 1/𝐿 න 𝑌 𝑙 2 𝑑𝑙
0
1 2
Ra1 = Ra2
• A single large peak or flaw within the microscopic surface texture will effect (raise) the
RMS value more than the Ra value.
Sample details:
Material : Silver-steel and Mild-steel rod
Surface type : Machined
Diameter : 25 mm (approx.)
No. of samples surfaces: 3
Fig. 5: Samples
Instrument details
Instrument: CMM
Make: Mitutoyo, Japan
Model: CRYSTA-Apex S/ 574
Year: 2020
• The measuring machine uncertainty is not more than one-fifth (ideally one-tenth).
• From sensors installed on each axis scale and working in conjunction with
sensors placed on the workpiece, temperatures are obtained before outputting
the measurement result to the controller.
Temperature Temperature
environment 1 environment 2
Temperature
20±2 °C (64.4-71.6 °F) 16 - 26 °C (60.8-78.8 °F)
Range
Limits within
which Rate of 2 °C per hour or less 2 °C 2 °C per hour or less 5 °C
accuracy is change in 24 hours or less in 24 hours or less
guaranteed
Gradient 1 °C or less per meter 1 °C or less per meter
unit: μm
Maximum permissible
Maximum permissible error (E0,MPE)
Probe used probing error (PFTU,MPE)
ISO 10360-2:2009
ISO 10360-5:2010