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Internal Memory
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2
Control Control
Write
Memory Type Category Erasure Volatility
Mechanism
Random-access Read-write Electrically, Electrically Volatile
memory (RAM) memory byte-level
Read-only
Masks
memory (ROM) Read-only
Not possible
Programmable memory
ROM (PROM)
Erasable PROM UV light, chip-
(EPROM) level Nonvolatile
Electrically Electrically
Read-mostly Electrically,
Erasable PROM memory byte-level
(EEPROM)
Table 5.1
Semiconductor Memory Types
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Address line T3 T4
T5 C1 C2 T6
Transistor
Storage
capacitor
T1 T2
(a) Dynamic RAM (DRAM) cell (b) Static RAM (SRAM) cell
Dynamic RAM
• Data
◼ Bits stored as charge in capacitors. Presence and absence of charge
represents 1 and 0 respectively.
◼ Charges leak
◼ Need refreshing even when powered
• Simpler construction
• Less expensive
• Slower
• Main memory
DRAM Operation
• Analog Device
DRAM Operation
• Write
• Voltage to bit line - High for 1, low for 0
• Then signal address line - transfers charge to
capacitor
• Read
Static RAM
• Bits stored as on/off switches
• More expensive
• Faster
• Digital Device
◼ Uses flip-flops
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◼ Dynamic cell
◼ Simpler to build, smaller
◼ More dense (smaller cells = more cells per unit
area)
DRAM
◼ Less expensive
◼ Requires the supporting refresh circuitry
◼ Tend to be favored for large memory
+ requirements
◼ Used for main memory
◼ Static cell
◼ Faster
◼ Used for cache memory (both on and off chip)
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Flash
EPROM EEPROM
Memory
Electrically erasable Intermediate between
Erasable programmable read- EPROM and EEPROM
programmable only memory in both cost and
read-only memory functionality
Can be written into at
any time without
Erasure process erasing prior contents Uses an electrical
erasing technology,
can be performed does not provide byte-
repeatedly Combines the advantage
of non-volatility with the level erasure
flexibility of being
More expensive than updatable in place Microchip is organized
PROM but it has the so that a section of
advantage of the More expensive than memory cells are erased
multiple update EPROM in a single action or
capability “flash”
Interleaved Memory Composed of a collection of
DRAM chips
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If consecutive words of
memory are stored in different
banks, the transfer of a block of
memory is speeded up
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Error Correction
◼ Hard Failure
◼ Permanent physical defect
◼ Memory cell or cells affected cannot reliably store data but become
stuck at 0 or 1 or switch erratically between 0 and 1
◼ Can be caused by:
◼ Harsh environmental abuse
◼ Manufacturing defects
◼ Soft Error
◼ Random, non-destructive event that alters the contents of one or
more memory cells
◼ No permanent damage to memory
◼ Can be caused by:
◼ Power supply problems
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Flash Memory
◼ Used both for internal memory and external memory
applications
◼ Uses only one transistor per bit so it achieves the high density of
EPROM
+ Summary
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Internal
Memory
Chapter 5
◼ Error correction