Professional Documents
Culture Documents
s
17Bbt0001
INTRODUCTION
➢
The Scanning Tunneling Microscope is an electron
electron cloud around the nucleus.
microscope that transmits three-dimensional images of the
➢
conductive solid surface at an atomic size.
The STM allows the inspection of the properties of a
➢
It is a very important technique in determining the atomic
structures and
investigation. electronic states of the surface under
➢
size thanks to the high
Surfaces can be viewed at the atomic
resolution (0.1 Ǻ) that STM has.
BASIC COMPONENTS OF STM:
It consists of five
The scanner
can be basic components:
mounted with
the tip or the
sample stage.
1. Metal tip
2. Piezoelectric scanner
3. Current amplifier (nA)
4. Bipotentiostat (bias)
5. Feedback loop (current)
TUNNELING EFFECT
➢
The basis of STM is the quantum tunneling theory.
➢
According to quantum tunneling theory, when the energy
of an electron exceeds its total energy, it can penetrate
physics. So it can tunnel.
regions which are impossible according to classical
➢
In other words, if two conductors are brought closer to
each other by 10 Ǻ or more and a potential difference is
created between them, the electrons are likely to tunnel
through the potential barrier between these two
conductors.
HOW & WHEN DOES IT TUNNEL OUT?
The truth of the matter is that the probability of escaping the nucleus depends on a whole lot of other factors except
the potential energy possessed by the electron, which is depicted by the equation of approximate transmission
probability, which goes as:
T = [16E(U-E)/U2]e -2k2L
AND:
k ½
2 = [2m( U-E)] / h
E= Total energy
So, the above equation proves that under certain conditions, the probability of the electron escaping the nucleus could
be rather high. As the higher and wider the barrier gets, the lower the transmission probability, and vice versa.
WORKING PRINCIPLE OF STM
➢
The STM and its working relies heavily on the
is controlled by the piezoelectric scanner.
positioning of the probe or the metal tip, which
➢
The probe is moved in a oscillatory manner
resembling the way an electron moves in a
television channel tube. And its movements in all
three directionsis controlled precisely to gather
optimal results.
➢
The tunneling current, which occurs when scanning
the specimen on the specimen surface, is measured
and is used to obtain surface topography, since this
current I is a function of the distance d between the
-(k*d)
specimen and the tip, depicted by: I=K*V*e
❖
STM’s Working Principle:
GENERATING TUNNELING
CURRENT
➢
If a very sharp metal tip, called a probe (atomic size), is
approached to the surface to be investigated by a mechanical
system (1-10 Ǻ) , the electron cloud overlaps and electrons
are superimposed on the surface, a current is generated called
tunneling current. This current applied by the probe as well, in
turn assists the electron
by providing it with energy more than
that of Work Function.
➢
The direction of flow depends on the sign of the applied potential.
➢
If the sample is negatively charged, the electrons will pass
the filled orbital of the sample to the empty orbital of the
through
tip.
➢
The flow here is very small and at nA level.
TRANSFER OF ELECTRONS FROM SPECIMEN TO TIP OR VICE VERSA
TAKES PLACE AS SUCH:
CONSTANT CURRENT & CONSTANT
HEIGHT TECHNIQUES
➢
In constant-height mode, the tip scans in a horizontal plane above the
sample and the tunneling current varies depending on topography and
the local surface electronic properties of the sample. This method is
preferred for flat surfaces as otherwise a tip crash is possible. The
tunneling current measured at each location on the sample surface
constitute the data set, creating the topography image in figure (a).
➢
In the constant-current mode, by adjusting the height of the type, the
current is held constant by the feedback circuit which keeps the
current constant and is moved on the type surface. During this time,
changes are recorded and the height of the image is created by the path
of the tip as shown in figure (b).
FACTORS AFFECTING THE
RESOLUTION:
• One of the factors affecting resolution is
corrugation, i.e. how much the electron
density of surface atoms vary in heights
above the surface.
•
STM imaging depends on the nature of the
surface and the magnitude and sign of the
tunneling current. For example, if you have
Cu and Si on the same surface, under the
same condition, the current with Cu is
much higher .
ADVANTAGES OF STM:
➢
STMs are helpful because they can give researchers a three dimensional profile of surface, which
allows roughness, surface defects
researchers to analysis a multitude of characteristics, including
and determining things about the molecule’s size and conformation.
➢
They will activate in temperatures as low as zero Kelvin up to a few hundred degrees Celsius.
➢
Scanning Tunneling Microscope works faster than Atomic Force Microscope.
➢
AFM max sample size is 150x150 µm. On the other hand, STM generates mm size length and width.
➢
Lastly, resolution of STM is much better than AFM.
DISADVANTAGES OF STM:
➢
STMs
can be difficult to use effectively. There is very specific technique that requires a lot of skill
and precision.
➢
STM requires very stable and smooth surfaces, excellent vibration control and sharp tips.
➢
STMs use highly specialized equipment that is fragile and expensive.
➢
Although, STM can be used to analyze only conductive materials, while AFM can be used for
conductive and insulator materials.
➢
but AFM can work even in liquid. For that reason AFM can be
STM requires vacuum atmosphere
used for biological materials.