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Scope of Testing
standard (method) or
items tested detection
technique used
IS 2026 (Part 1):CI. No.: 10.6&
Measurement of
10.1.3 (g):2011, 3% to 14 % ±
14 harmonics of no-load
IEC 60076 (Part 1):CI. No.: 100% 0.6124 %
current
11.1.1:2011
CBIP Manual - 317:CI. No.: 3.5, 1MΩ to
Polarization Index
Sec.: BB:2013, 1TΩ 10 GΩ ±
15 (PI) and Absorption
IEEE Std 500V to 5.86%
Index (AI)
C.57.12.90:Cl.No.:10.11:2015 5000V
Magnetic balance 0.1 V
CBIP Manual - 317:CI. No.: 400 ±
16 test (for3-Ø to
3.17, Sec.: BB:2013 1.733 %
transformers only) 1000 V
Measurement of
50 mA
unbalance/ Neutral CBIP Manual - 317:CI. No.: 6.3, 2.3 A ±
17 to
current (for3-Ø Sec: B:2013 0.285 %
Oil Immersed, 1- transformers only) 50 A
Ø & 3-Ø, Measurement of no-
Distribution and IS 1180 (Part 1):CI. No.:
load current at 50 mA
21.4(c):2014, 1.06702 A
18 Power 112.5% voltage and to
IEC 60076 (Part 1):CI.11.5 ± 0.581 %
Transformer’s up to 125% of rated 50 A
&11.1.3 (e):2011
(Sealed/ Non- voltage.
Sealed and Determination of IS 2026 (Part 1):CI. No.: up to10 kV
Outdoor/ Indoor capacitances 10.1.3(b):2011, Capacitanc
1.84 ±
19 type) windings-to earth, IS 2026 (Part 1):CI. No.: 10.1.3 e:
1.561 %
and between (j):2011 0 to 0.26μF
Range: up to windings IEC 60076 (Part 1):CI. No.:
12500 kVA 11.1.4(c):2011,
Measurement of
Voltage class: IEC 60076 (Part 1):CI. No.:
dissipation factor Up to 10kV
up to 36 kV 11.1.4 (d):2011, 0.366 ±
20 (Tan δ) of the Tan δ:
IEEE std C.57.12.90:CI. No.: 1.21 %
insulation system 0.1% to 2%
capacitances 10.10:2015,
Magnetization 50 mA
CBIP Manual - 317: 1.06702 A
21 Current at Low to
CI. No.: 3.23, Sec.: BB:2013 ± 0.581 %
Voltage Test 50 A
Magnetic Circuit CBIP Manual - 317:CI. No.: 1MΩ to
Test(Core to Core 3.15, Sec.: BB:2013, 1TΩ 10 GΩ ±
22
Frame Insulation IEC 60076 (Part 1):CI. No.: 500V to 5.86 %
Resistance test) 11.12:2011 5000V
IS 2026 (Part 1):CI. No.: 10.8 &
1V
Test On On-Load 10.1.1(f):2011,
23 To Qualitative
Tap Changers IEC 60076 (Part1):CI. No.:
1000 V
11.1.2.1 (f)& 11.7:2011