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1. Static Errors:
Static errors are associated with steady-state or constant conditions when using an instrument. They do not
change over time and can result from factors like calibration, environmental conditions, and inherent
instrument limitations. The main types of static errors include:
a. Systematic Error: These errors cause measurements to consistently deviate from the true value by a fixed
amount or in a particular direction. They can be caused by calibration drift, incorrect calibration procedures,
or biases in the instrument's design. Systematic errors can be minimized through proper calibration and
correction techniques.
b. Offset Error: Offset errors refer to a constant deviation of the instrument's output from the expected
value when the input is zero. They are usually represented as an additive constant. Factors like sensor
misalignment, improper zero adjustments, or electrical noise can cause offset errors.
c. Gain Error: Gain errors result in a scaling or amplification discrepancy between the input and output
signals of an instrument. They cause the instrument's output to deviate from the correct value by a fixed
factor or percentage. Gain errors can arise due to nonlinearity in the instrument's response, variations in
component characteristics, or signal conditioning issues.
2. Dynamic Errors:
Dynamic errors occur during time-varying or transient conditions. These errors often arise when there are
rapid changes in the measured signal or when the instrument's response time is insufficient to accurately
capture variations. Here are some common types of dynamic errors:
a. Response Time Error: Response time errors occur when an instrument fails to respond instantaneously to
changes in the measured quantity. The instrument's response time is determined by its physical
characteristics and can lead to inaccuracies if the changes in the measured signal occur more rapidly than the
instrument can track.
b. Aliasing Error: Aliasing errors occur in digitized systems when the sampling rate is inadequate to
accurately represent the frequency content of the measured signal. This can result in false or distorted
measurements, particularly when the input signal contains high-frequency components.
c. Hysteresis Error: Hysteresis errors are observed in instruments that exhibit a lag or memory effect when
measuring a changing signal. The output of the instrument may differ depending on whether the signal is
increasing or decreasing. Hysteresis errors can be caused by mechanical or electrical factors such as friction or
magnetic properties of components.
To ensure accurate measurements, it is important to understand and account for both static and dynamic
errors in the design, calibration, and use of instrumentation systems. Calibration procedures, error
compensation techniques, and appropriate instrument selection can help minimize these errors and improve
measurement accuracy.
Minimizing static errors and dynamic errors in measurements involves employing specific strategies and
techniques. Here's how you can reduce these types of errors:
2. Instrument Selection: Choose high-quality instruments with low inherent errors and better resolution to
minimize static errors.
3. Environmental Control: Maintain a stable and controlled environment to minimize external influences such
as temperature, humidity, and electromagnetic interference.
4. Proper Technique: Use appropriate measurement techniques and ensure proper handling of instruments to
minimize errors caused by operator mistakes.
5. Zeroing and Nulling: Zero or null the measuring instruments before each measurement to eliminate offset
errors.
2. Filtering: Apply suitable filters to remove noise and unwanted frequency components that may contribute
to dynamic errors.
3. Signal Conditioning: Use proper signal conditioning techniques to amplify weak signals and reduce noise
interference.
4. Shielding: Employ shielding techniques to minimize electromagnetic interference and reduce dynamic
errors caused by external sources.
5. Averaging and Smoothing: Utilize averaging and smoothing techniques, such as moving averages or digital
filters, to reduce random fluctuations in the measured data.
It's important to note that the specific methods for minimizing errors will depend on the nature of the
measurement system, the type of measurement being performed, and the level of accuracy required.
Therefore, understanding the measurement setup and the potential sources of errors is crucial in
implementing appropriate error reduction strategies.
QUESTIONS:
Answer: A
Answer: C
A) Environmental noise
B) Instrument sensitivity
Answer: B
Answer: B
5. Which of the following terms is used to describe the precision of a measurement technique?
A) Static error
B) Dynamic error
C) Accuracy
D) Repeatability
Answer: D
C) Quantization noise
Answer: B
A) Instrument drift
B) Measurement uncertainties
C) Instrument resolution
D) Signal noise
Answer: A
Answer: B
10. Which of the following terms is used to describe the accuracy of a measurement technique?
A) Precision
B) Static error
C) Dynamic error
D) Sensitivity
Answer: A
1. In the context of measurement errors, which of the following best describes a systematic error?
D) It results in a biased measurement consistently higher or lower than the true value.
Answer: D
2. Which of the following factors is most likely to contribute to static errors in measurements?
A) Measurement uncertainties
B) Environmental noise
C) Instrument resolution
Answer: C
3. What is the primary source of dynamic errors in high-speed data acquisition systems?
A) Instrument sensitivity
D) Environmental interference
Answer: B
4. Which of the following techniques is commonly used to compensate for systematic errors in
measurements?
Answer: D
6. Which of the following statistical measures is commonly used to quantify the precision of a measurement
technique?
A) Mean
B) Standard deviation
C) Median
D) Mode
Answer: B
A) Instrument noise
B) Signal distortion
C) Instrument drift
Answer: D
Answer: B
9. What is the primary effect of systematic errors on the accuracy of a measurement technique?
B) They result in a biased measurement consistently higher or lower than the true value.
Answer: B
10. Which of the following statistical measures is commonly used to assess the accuracy of a measurement
technique?
A) Confidence interval
B) Range
C) Coefficient of variation
Answer: A
Maxwell bridges
Definition:
The bridge used for the measurement of self-inductance of the circuit is known as the Maxwell bridge. It is
the advanced form of the Wheatstone bridge. The Maxwell bridge works on the principle of the comparison,
i.e., the value of unknown inductance is determined by comparing it with the known value or standard value.
Two methods are used for determining the self-inductance of the circuit. They are
In such type of bridges, the value of unknown resistance is determined by comparing it with the known value
of the standard self-inductance. The connection diagram for the balance Maxwell bridge is shown in the
figure below.
The value of the R3 and the R4 resistance varies from 10 to 1000 ohms with the help of the resistance box.
Sometimes for balancing the bridge, the additional resistance is also inserted into the circuit.
The phasor diagram of Maxwell’s inductance bridge is shown in the figure below.
In this type of bridges, the unknown resistance is measured with the help of the standard
variable capacitance. The connection diagram of the Maxwell Bridge is shown in the figure below.
Let, L1 – unknown inductance of resistance R1.
R1 – Variable inductance of fixed resistance r1.
R2, R3, R4 – variable resistance connected in series with inductor L2.
C4 – known non-inductance resistance
The above equation shows that the bridges have two variables R4 and C4 which appear in one of the two
equations and hence both the equations are independent.
Phasor diagram of Maxwell’s inductance capacitance bridge is shown in the figure below.
1. The Maxwell inductor capacitance bridge requires a variable capacitor which is very expensive.
Thus, sometimes the standard variable capacitor is used in the bridges.
2. The bridge is only used for the measurement of medium quality coils.
Because of the following disadvantages, the Hays bridge is used for the measurement of circuit inductance
which is the advanced form of the Maxwell’s Bridge.