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Quality factor of 𝐹
the Varactor Diode 𝑄 = 𝑓
consistency. All data presented are typical values representative of the results observed
from all samples.
Device Theory:
Both simple Schottky and abrupt p-n junction varactors can be described by
straightforward semiconductor theory. Equation 1 gives the well-known variation of
capacitance (C) with applied voltage (V) for a uniformly doped depletion region:
where w is the width of the depleted region and A is the area of the
ohmic contact.
The cut-off frequency (fc) is then defined as the frequency at which the Quality factor is
equal to unity giving:
Conclusion:
The suitability of Sic p-n junction and Schottky varactor diodes for high frequency
applications has been demonstrated. Such devices are capable of operating at high
biases (over 130V) - offering greater power density, impedance and operating
temperature compared to conventional GaAs or Si varactors. Analysis of the effect of
contact resistivity shows clearly that it is this limitation which dominates performance
to date. However, processing technology of Sic is improving rapidly and practical Sic
varactor diodes can be expected to appear in circuit applications very soon.