Professional Documents
Culture Documents
A p–n junction is a junction formed by joining p-type and n-type semiconductors together in
very close contact.
The PN junction is not constructed by adding two separate p- type and n- type materials
because this will reduce the contact area between the two surfaces due to imperfections,
grain boundaries etc.
➢ Ion implantation
➢ Diffusion of dopants
➢ Epitaxial method.
Formation of the depletion region.
When the n-type semiconductor and p-type semiconductor materials are first joined together,
a very large density gradient exists between both sides of the pn junction.
This results in the free electrons from the donor impurity atoms to migrate across the junction
to fill up the holes in the p-type material producing negative ions and vice versa.
This charge transfer of electrons and holes across the pn junction is known as diffusion.
This will result in positively charged donor ions (ND) on the n-side and negatively charged
acceptor ions (NA) on the p- side.
This process continues until a point is reached where the negative charged accepter ions
repels any further diffusion of electrons and vice versa.
These two layers of positive and negative charges form the depletion region, as the region
near the junction is depleted of charge
The electric field formed in the depletion region acts as a barrier.
The potential difference required to move the electrons through the electric field is called the
barrier potential.
Barrier potential depends on the type of semiconductor material, amount of doping and
temperature. This is approximately 0.7 V for silicon and 0.3 V for germanium.
The Energy Level Diagram of a PN junction
As diffusion occur, the depletion region forms and the energy level of the n-region conduction
band drops, causing alignment of the Fermi level. At this point the energy bands are at
equilibrium.
There is an energy gradient across the depletion region so that a n-region electron must climb
to get in to the p-region.
Biasing the PN Junction – FORWARD BIAS
P-Side of the diode is connected to a positive supply and the N-Type to a negative supply.
Electrons gains energy to overcome the barrier potential and move into the p-region
Positive voltage is applied to the n-side and a negative voltage is applied to the p-side of
semiconductor.
Reverse bias potential attracts the majority carriers away from the pn junction, widening the
depletion region
Reverse current can flow through the pn junction due to minority carriers
I-V Characteristics of a PN junction diode
I-V Characteristics of a PN junction diode
Forward bias
Electrons will acquire the energy and cross the pn junction resulting the
current
Forward voltage at which the current through the junction starts
increasing rapidly is called the knee voltage or cut-off voltage
Reverse bias
Majority carriers drift away from the junction hence no current is resulted
due to majority carriers.
When reverse bias voltage exceeds certain voltage, a sharp increase in the
reverse current is observed. This voltage is known as breakdown voltage.
Zener breakdown
Occurs in heavily doped p-n junction diode
Heavy doping narrower the depletion layer (about 100 A0).
Results in large electric field (108 Vm-1) even for small reverse voltage.
Electric field breaks the covalent bonds and produces electron hole pairs.
Zener breakdown occurs in the diodes with the breakdown voltage lessthan 6V.
The Zener breakdown voltage decreases with increase in temperature. This is due to
increase in the temperature, increases the energy of valance electrons hence less field is
enough to break the covalent bond.
Avalanche breakdown.
This occurs for high reverse voltages. Due to high reverse voltage, the minority carriers
get high kinetic energy.
They collide with the valence electrons of the atoms and break the covalent bonds creating
new electron hole pairs.
The newly generated electron hole pairs will generate further electron hole pairs. In this way
large electron hole pairs will be created which result in sharp increase in reverse current.
This mechanism occurs to the diodes where the breakdown voltage is more than 6V.
The avalanche breakdown voltage increases with increase in temperature because, the
increase in the temperature increases the collisions of electron with lattice resulting the loss of
electron energy.
PN Junction diode equation:
PN Junction diode equation:
𝒆𝑽
𝑰 = 𝑰𝟎 𝒆𝒙𝒑 −𝟏
𝜷𝑲𝑻
𝛽 is numerical constant and depends upon the diode material. For Ge 𝛽 = 1 and for Si 𝛽 = 2
ZENER DIODE
It is a heavily doped pn junction diode that is designed to
operate under reverse biasing conditions
It is properties will be same as any other normal diode under the forward bias conditions.
When operated under reverse bias conditions, it will allow the current beyond certain
voltage called as zener voltage
When the applied reverse bias voltage increases slowly, till up to a certain voltage, its
characteristics are same as any normal diode, but when the reverse voltage reaches a
characteristic value (called as zener voltage) electric field in the depletion will increases
rapidly and the valence electrons get sufficient energy to break the covalent bonds and
become free electrons.
Spontaneous Emission
Principle:
Emits radiation in ultraviolet, visible and infrared regions.
Construction
➢ An n-type material is grown on a substrate and p-type is deposited on it by
diffusion.
➢ As recombination takes in p-type, it is kept uppermost.
➢ The metal anode connection is made on outer edge of p-layer to allow more
central surface area for light to escape
➢ Domed lenses are used to reduce the reduction process
Working
➢ When forward bias voltage is applied, the electrons cross the junction and
recombine with the holes
➢ The energy of electron is liberated in the form of photon.
➢ The colour of emitted radiation depend upon the energy gap of semiconductor
➢ The energy gap can be varied by varying doping elements and doping levels..
Applications of LEDs
➢ For solid state displays which are replacing the conventional lighting rapidly.
➢ For entering information in to optical computer memories.
➢ For arrays of different displays.
➢ Infrared LEDs are used in burglar alarm systems.
➢ In LED Televisions.
Photodetectors
A photodetector is a device which absorbs light and converts the optical energy to
measurable electric current.
When a beam of photons impinges on these devices, they absorbs these photons
and generate electron–hole pairs in the depletion region.
They are also known as O/E convertor.
Photodetectors used in optical communication systems because of their small size,
fast detection speed, and high detection efficiency.
The important Semiconductor photo detectors are
➢ Basic photo diode
➢ Positive intrinsic negative (PIN) photodiode
➢ Avalanche photodiode (APD)
Working
➢ When the photon enters in to depletion layer, it separates the electron and holes i.e.
generate the charge carriers.
➢ The number of charge carriers generated is proportional to intensity of incident light.
These charge carriers results in the photo current in the external circuit.
➢ The dark current is the current which exist even with no photons incident.
➢ From the graph we can observe the reverse current and luminous flux are linearly
proportional.
Applications of photo diode:
➢ In alarm systems
➢ Counting the number of items on the conveyer belt
➢ In infrared remote control such as televisions to air conditioners.
➢ Light operated switches (optical switches)
➢ Systems for detecting light
➢ Sound tracks in films.
The quantum efficiency of the photo diode is defined as number of electron hole pairs
created per photon.
IP is photo generated current and
𝐼𝑃 ℎ𝜐 ℎ𝜐
𝑄𝑢𝑎𝑛𝑡𝑢𝑚 𝐸𝑓𝑓𝑖𝑐𝑖𝑒𝑛𝑐𝑦 𝜂 = =𝑅 P0 is incident optical power at a
𝑃0 𝑞 𝑞 particular wavelength.
𝐼𝑃
𝑅= 𝑖𝑠 𝑐𝑎𝑙𝑙𝑒𝑑 𝑎𝑠 𝑟𝑒𝑠𝑝𝑜𝑛𝑠𝑖𝑣𝑖𝑡𝑦, 𝑖. 𝑒. 𝑐𝑢𝑟𝑟𝑒𝑛𝑡 𝑝𝑒𝑟 𝑢𝑛𝑖𝑡 𝑝𝑜𝑤𝑒𝑟
𝑃0
Positive-Intrinsic-Negative (pin) photodiode
Principle
➢ The device converts the optical energy to current.
➢ When photonic energy impinges on the intrinsic region, it create electron hole pairs.
➢ These electron hole pairs result in current in the circuit under reverse bias.
Construction
➢ Consist of three layers, positive region, an
intrinsic region and negative region.
➢ Width of positive region< Width of negative
region < intrinsic region
➢ Works under reverse bias.
➢ Both the P and N regions are heavily doped
Working
➢ The beam of photons of suitable intensity is made to incident on the device
➢ These photons create electron and hole pairs in the intrinsic region
➢ Under reverse bias voltage, these electrons constitute current
➢ It is a linear device i.e. the current produced will be proportional to the optical power
➢ The increased depletion region due to the intrinsic layer improves the performance by
increasing the volume in which light conversion occurs
PIN diode as variable resistor under forward bias
➢ The high electric field developed across the junction under forward bias.
➢ This will speeds up the transport of charge carriers from the P region to the N region.
➢ The amount of current will depends upon the applied forward bias voltage hence it acts
as variable resistor.
PIN diode as a capacitor under forward bias voltage
➢ Under reverse bias, the depletion layer becomes fully depleted.
➢ Hence the device acts as the capacitor.
➢ The capacitance of the pin diode becomes independent of the level of bias once
the depletion layer is fully depleted
Applications
RF and microwave switches due to their low capacitance.
Used in Photo detectors
The PIN photodiode is also used to detect X-rays and gamma rays photons.
Avalanche Photo Diode
Principle
➢ The device converts the optical energy to electrical energy.
➢ The reverse bias voltage applied is very high (avalanche region)
Construction
➢ Consist of three layers, highly doped p region,
an intrinsic region, one lightly doped p region
and highly doped n region.
➢ Width of lightly doped n- region < width of
lightly doped p- region < width of heavily
doped n- region < intrinsic region
➢ Works under high reverse bias (avalanche
region).
Working
➢ The beam of photons of suitable intensity is made to incident on the device
➢ These photons create electron and hole pairs in the intrinsic region.
➢ These electrons accelerated under the high electric field (due to large reverse voltage) and
collides with bound (neutral) atoms and generate few more electrons
➢ The newly generated electrons also accelerated under high electric field and create few
more electrons (avalanche effect.)
➢ The avalanche action enables the gain of the diode to be increased many times, providing a
much greater level of sensitivity.
The advantages
➢ High sensitivity
➢ High Gain.
➢ Quick response time.
➢ It detects low-intensity light.
➢ A single-photon generates multiple
charge carriers.
The disadvantages
➢ High operating voltage
➢ non linear output current
➢ High range of noise
➢ Low reliability
Applications
➢ Bar code readers
➢ Burglar alarm systems
➢ As receiver in optical fiber communication
➢ In light detecting sensors
Comparison between PIN Photo diode and Avalanche diode
Construction
➢ Most of the solar cells are made form
crystalline silicon
➢ It consist a pn junction diode
➢ P-layer is made extremely thin so that
incident light photons may easily reach
the pn junction.
➢ Antireflection coating minimizes the
loss of solar energy due to reflection
➢ The finger collector on p layer acts as
the positive output terminal (anode) and
the metal contact at the bottom acts as a
cathode.
Working
➢ When the solar energy is incident on the top surface, the photons enters in to depletion
region
➢ These photons generate the electron hole pairs in the depletion layer.
➢ These electrons and holes produce the current.
➢ The current is directly proportional to the illumination power (mW/cm2) and also
depends on the size of the surface area being illuminated.
➢ Silicon and germanium are the most widely used semiconductors materials for solar
cells although gallium arsenide, indium arsenide and cadmium arsenide are also being
used nowadays.
𝐾𝑇 𝑁𝐷 𝑁𝐴
The Junction potential is given by 𝑉𝐵 = 𝑞
𝑙𝑛 𝑛2𝑖
2𝜖 𝑁𝐴 +𝑁𝐷
The Width of junction is 𝑊 = 𝑞 𝑁𝐴 𝑁𝐷
𝑉𝐵
𝑁𝐴 𝑊 𝑁𝐷 𝑊
Width of n-side 𝑊𝑛 = 𝑁 width of p-side 𝑊𝑛 = 𝑁
𝐴 +𝑁𝐷 𝐴 +𝑁𝐷
1.24 𝐼𝑃 ℎ𝜐
Wavelength of photon, 𝜆= 𝜇𝑚 𝑄𝑢𝑎𝑛𝑡𝑢𝑚 𝐸𝑓𝑓𝑖𝑐𝑖𝑒𝑛𝑐𝑦 𝜂 =
𝐸𝑔(𝑒𝑉) 𝑃0 𝑞
𝐼𝑃 𝜂𝑞 𝜂𝑞𝜆
𝑅𝑒𝑠𝑝𝑜𝑛𝑠𝑖𝑣𝑖𝑡𝑦 𝑐𝑢𝑟𝑟𝑒𝑛𝑡 𝑝𝑒𝑟 𝑢𝑛𝑖𝑡 𝑝𝑜𝑤𝑒𝑟 , 𝑅 = = =
𝑃0 ℎ𝜐 ℎ𝑐
PROBLEMS
1. Calculate the wavelength of light emitted by an LED with band gap of energy
1.8 eV.
2. Calculate the band gap energy of GaAsP semiconductor whose output
wavelength is 6715 A0.
3. The band gap of a specimen of gallium arsenide phosphide is 1.98 eV.
Determine the wavelength of the electromagnetic radiation that is emitted upon
direct recombination of electron and hole in the sample. What is the colour of
emitted radiation?
4. The reverse saturation current at 300 K of a PN Junction diode is 5 μA. Find the
voltage be applied across the junction to obtain a forward bias current of 50
mA.
5. The current in a p-n junction at 270C is 0.18 µA when a large reverse bias
voltage is applied. Calculate the current when a forward bias of 0.38 V is
applied.
6. Calculate the ratio of current for a forward bias of 0.06 V to the current of same
value of reverse bias applied to a pn junction diode at 27 ℃
7. Consider a uniformly doped thin n-type semiconductor with light shining
uniformly across the entire region. If the optical generation rate is 1012 cm-3s-1,
and the carrier lifetime is 6 nanoseconds, what is the number of carriers
generated at equilibrium?
8. Calculate the depletion width of n-side of a Silicon P-N junction if ND=1015 cm-3 and NA =
1019 cm-3 and total depletion width is 1.04 x 10-4 cm at 300K.
9. A photodiode is made with p-type Ge doped with 1023Ga atoms/ m-3 and n-type Ge with
1022 As atoms/ m-3. The dielectric constant for Ge is 16. The intrinsic carrier concentration
of Ge is 1010 cm-3 at 300 K. Calculate the width of the depletion layers.
10. A photodiode has a responsivity of 0.5 A/W at 850 nm. Find the efficiency of the detector.
11. An APD has a quantum efficiency of 50% at a wavelength of 500 nm in the absence of
multiplication. If the device is operated with a reverse bias to give a multiplication factor
of 8, calculate the responsivity.
12. A potential barrier of 0.7 V exists across a p−n junction. A constant electric field of
magnitude 2×106 Vm-1 exists in the depletion region. Calculate the width of depletion
region.
13. The width of the depletion region in a p–n junction diode is 600 nm and an intense electric
field of 6×105 V/m is also found to exist. The height of the potential barrier is
14. If the depletion width of a p-n junction is 500 nm and electric field across the depletion
region is 5×105 Vm-1, calculate the minimum kinetic energy electron to diffuse from the
n-side to the p-side ?
15. A single Solar cell (12cm x 12 cm) voltage of 0.55 V and a current of 2.4 A. If the
insolation is 850 W/m2 calculate it’s efficiency.
16. Solar insolation on a rectangular solar cell module (20 cm x 15 cm) is 600 Wm2. If the
efficiency of the cells is 12%, evaluate the power out put of the module.
17. A single solar cell, on illumination by insolation of about 800 W/m2 produces a voltage of
0.5 V and a current up to 2.0 A. The efficiency of the solar cell is 12.5%. Calculate the area
of solar cell.