Muhammad Zohiruddin Bin Khairudin (s60977)

Instrument Function Principle Type of Data

X-rays are shone on a crystal and

Positions and
Determine the the resulting diffraction pattern is
X-ray diffraction intensities of
structure of crystals used to determine the arrangement
diffraction peaks
of atoms in the crystal.

A beam of electrons is scanned

Scanning electron Create images of the across the surface of a sample and Images of the surface
microscope (SEM) surface of materials the resulting electrons are used to of materials
create an image.

A sharp tip is scanned across the

Create images of the Images of the surface
Atomic force surface of a sample and the
surface of materials of materials at the
microscope (AFM) resulting forces are used to create
at the atomic level atomic level
an image.

Heat capacity,
Differential A sample and a reference are heated
Measure the heat melting point, and
scanning and the difference in their heat
capacity of materials glass transition
calorimeter (DSC) capacities is measured.
temperature

Fourier transform Infrared radiation is shone on a

Identify the chemical
infrared sample and the resulting absorption
composition of Absorption spectrum
spectroscopy spectrum is used to identify the
materials
(FTIR) functional groups in the sample.