This document summarizes an experiment to characterize the size and shape of particles in a KNN ceramic sample using scanning electron microscopy. The aims are to: 1) identify particle size and shape, 2) create a histogram of sizes and fit with statistics, 3) use Image-J software, and 4) determine average particle size. Scanning electron microscopy is described as capable of high-resolution imaging of particle topography, morphology, composition, and other characteristics. The results determined the average particle size in the sample to be 4.408 micrometers based on measurements of largest particle diameters.
This document summarizes an experiment to characterize the size and shape of particles in a KNN ceramic sample using scanning electron microscopy. The aims are to: 1) identify particle size and shape, 2) create a histogram of sizes and fit with statistics, 3) use Image-J software, and 4) determine average particle size. Scanning electron microscopy is described as capable of high-resolution imaging of particle topography, morphology, composition, and other characteristics. The results determined the average particle size in the sample to be 4.408 micrometers based on measurements of largest particle diameters.
This document summarizes an experiment to characterize the size and shape of particles in a KNN ceramic sample using scanning electron microscopy. The aims are to: 1) identify particle size and shape, 2) create a histogram of sizes and fit with statistics, 3) use Image-J software, and 4) determine average particle size. Scanning electron microscopy is described as capable of high-resolution imaging of particle topography, morphology, composition, and other characteristics. The results determined the average particle size in the sample to be 4.408 micrometers based on measurements of largest particle diameters.
1) Identify the size and shape for as synthesized ceramic 2.) Plot size Histogram and fir it using proper statistics. 3.) Use Image-J software 4.) Give a value for average size. Scanning Electron Microscope (SEM) SCANNING ELECTRON MICROSCOPY (SEM) IS AN IMPORTANT ELECTRON MICROSCOPY TECHNIQUE THAT IS CAPABLE OF ACHIEVING A DETAILED VISUAL IMAGE OF A PARTICLE WITH HIGH-QUALITY AND SPATIAL RESOLUTION. THE SAMPLE IS EXPOSED IN SEM TO THE HIGH-ENERGY ELECTRON BEAM AND GIVES INFORMATION ABOUT TOPOGRAPHY, MORPHOLOGY, COMPOSITION, CHEMISTRY, ORIENTATION OF GRAINS, CRYSTALLOGRAPHIC INFORMATION, ETC. OF A MATERIAL, AND THEREFORE SEM IS A USEFUL TOOL TO BE USED FOR THE CHARACTERIZATION OF MATERIALS. SEM SET UP HISTOGRAM RESULTS If all the particles have similar irregular shape , then we should measure the largest diameter across each particle and then take the average value. Average particle size is come out to be 4.408 micrometer (μm).
The scherrer formula used for XRD crystalline will surely
be different from the absolute measured SEM. XRD shows the crystal size , but SEM shows the particle size ,so you can not compare them together. THANKING YOU