Professional Documents
Culture Documents
Stress-induced sensitization in the heat-affected zone (HAZ) of the 304LN austenitic stainless
steel weld at 923 K (650 C) was evaluated using a thermomechanical simulator (Gleeble 3800)
at different stress levels. The simulated sensitization behavior of the HAZ was studied in close
approximation of the stress and weld thermal cycle that is generally observed during pulse
current gas metal arc welding of the 25-mm-thick section of the 304LN steel. The response to the
degree of sensitization, as a function of the type and magnitude of stresses present in the matrix,
was established through observations on changes in microstructure, electrochemical properties
and hardness measurements. Transmission electron microscopy and selected area diffraction
confirm that sensitization occurred and Cr23C6 precipitates formed at grain boundaries. The
results indicate that the presence of tensile or compressive stresses, especially above the yield
stress of the steel, enhances sensitization.
https://doi.org/10.1007/s11661-018-5082-5
The Minerals, Metals & Materials Society and ASM International 2019
C Cr Ni Mn Si Cu P S Mo N
0.02 18.39 9.03 1.76 0.05 0.32 0.024 0.003 0.26 0.16
Pulse Parameter
Welding Arc Voltage Heat Input (kJ/ Welding Speed (cm/ Mean Current Ip Ib F Tb Tp
Process (V) cm) min) (A) F (A) (A) (Hz) (s) (s)
P-GMAW 28 ± 1 13.4 ± 0.5 19.3 220 ± 3 0.15 332 125 107 3.97 3.66
Thermocouple Distance from FL (mm) Depth from the Bottom of the Plate (mm)
TC1 2 2
TC2 3 4
B. Evaluation of Sensitization Ir
R0 ¼ 100; ½2
Ia
After the HAZ simulation test, the samples were
collected from the middle part of the test specimens where Ir is the peak current density in reverse scan and Ia
where the thermocouple was welded and sectioned is the peak current density in forward scan. The critical
through its centerline, as shown in Figure 4. value for R0 is 1 pct. If R0 < 1 pct, the steel is not
For metallographic examination, the sections of the considered as sensitized. If 1 pct < R0 < 5 pct, the steel
samples were polished with alumina suspension to is considered partially sensitized, and if R0 > 5 pct, it is
0.024 lm surface finish followed by electroetching as assumed to be fully sensitized.[32] The DL-EPR test for
recommended by the ASTM A262 Practice A in 10 pct each sample was repeated three times.
oxalic acid for 3 minutes at 8 V using a direct current
(DC) supply arrangement. The microstructure was
studied under optical microscope and its features were C. TEM Analysis
categorized by ‘‘step,’’ ‘‘dual,’’ and ‘‘ditch’’ structures HAZ-simulated specimens in Gleeble 3800 were
defined as a structure with no single grain completely examined under TEM to study the nature of precipita-
surrounded by carbide, at least one grain completely tion of chromium carbide in the matrix. For TEM
surrounded by carbide from all sides, and many grains examination, thin foils down to 40 lm were prepared,
completely surrounded by carbides from all sides,[31] followed by twin-jet polishing in ethanol and perchloric
respectively, as listed in Table V. Average attacked grain acid (9:1) solution at 30 V, when the temperature was
boundary width and average attacked grain boundary maintained at 30 C to 35 C. The TEM studies
Structure Explanation
Step no single grain is completely surrounded by carbide
Dual at least one grain is completely surrounded by carbide from all
sides
Ditch many grains are completely surrounded by carbide from all sides
Fig. 8—Microstructure observed after ASTM A262 Practice A test on specimens (Table IV) under different stresses: (a) A—showing step
structure; (b) B1—showing step structure; (c) B2—showing dual type structure; (d) B3—showing dual microstructure, with moderate grain
boundary attacks; (e) B4—showing ditch microstructure; (f) C1—showing almost step microstructure, with negligible grain boundary attacks; (g)
C2—showing few dual microstructures; (h) C3—ditch microstructure; and (i) C4—ditch microstructure.
Fig. 15—TEM micrographs showing (a) chromium carbide precipitate, (b) SAD pattern of the precipitate, and (c) spot indexing of the SAD
pattern.