CFM56

NON DESTRUCTIVE TESTING MANUAL

PART 10 - CHIP/PARTICLE ANALYSIS

*** Description of change : Non technical change : All tasks have been
changed for cleansing activities. This includes one or more of the following
points: Task numbering, modification of Effect use, Effectivities and Links
consistency. For more information see the introduction of the manual.
*** Description of change : Technical change : Entire PART 10 has been
changed, added new material information, removed unused illustrations

TASK 79-00-00-200-010

1. General

This procedure describes the recovery for analysis of chips and wear
particles found during visual inspection of filters, scavenge screens,
magnetic plugs, lubrication units or during drainage of oil tank, sumps,
Transfer Gearbox (TGB) and Accessory Gearbox (AGB) or components.

2. Tools, Equipment and Materials

NOTE: Equivalent substitutes may be used instead of the following items.

A. Tools and Equipment

(1) Equipment

Equipment Description Manufacturer Code

Pyrex Filter Support BY

With funnel and clamp

XX 10 047 30

Vacuum Flask BY

(1 liter capacity)

XX 10 047 05

Filtered Solvent BY
Distributor

XX 66 025 00

Latex Vacuum Hose BY

XX 25 047 55

Flat Tip Tweezers BY

XX 62 000 06

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Equipment Description Manufacturer Code

Petri Dishes BY

PD 15 047 00

Filter for Solvent BY

Distributor

Dia. 1 inch (25.4 mm)

Pore: 0,001 mm

FALP 025 00

Sieves BY

250 um micron

500 um micron

Filters (Polyamide BZ
filter)

Dia. 1.8 inch (45 mm)

Pore: 0.002 inch

(0,05 mm)

EP 1239 D 4 P

Eductor Local Purchase

Vacuum Bulb 300 ml Local Purchase

Bottle Brush Local Purchase

Dia. 0.4 inch (10 mm)

Brush Local Purchase

Binocular x 20 Local Purchase

Magnet Local Purchase

Dia. 1 inch (25,4 mm)

Length 1 inch (25,4

mm)

Pull force 15 lb. (7

daN)

Approximately

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Equipment Description Manufacturer Code

Stainless Steel Tank Local Purchase

or Glass Tank

8 x 4 x 3.5 inches

(200 x 400 x 90 mm)

minimum

Tweezers Local Purchase

Inspection Magnifiers Local Purchase

Electronic Magnifier Local Purchase

(HD Color and USB
compatible)

(2) Consumable Products

Code No. Description

CP2011 Stoddard Solvent

(3) Special Tools

Tool No. Description

856A1364 Chip Detector Debris Photograph

856A2683 Chip Detector Material Identification

Tool

3. Examination of the Chips / Particles or other debris from the Chip

Detectors, Scavenge Screens and Filters

NOTE: Chip / Particle or other debris identification is based on visual

and laboratory analysis. Corrective action is taken after you have
identified the collected chips / particles or other debris.

Subtask 79-00-00-200-006

A. Location of the Scavenge Screens and Magnetic Chip Detectors (MCD’s)

in lubrication pumps on:
(1) CFM56-2A/ -2B/ -2C (Figure 801)
(2) CFM56 -3 (Figure 802)
(3) CFM56 -5A (Figure 803)
(4) CFM56 -5B (Figure 804)

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(5) CFM56 -5C (Figure 805)

(6) CFM56 -7B (Figure 806)

B. Place, without dripping, chip detectors, supply or scavenge filters /

scavenge screens having chips / particles or other debris in a new
polyethylene bag. Tag each bag with the following indications:

CAUTION: REMOVE AND TAG ONE CHIP DETECTOR, SCREEN OR FILTER AT A

TIME. THIS CAN PREVENT AN ERROR IN IDENTIFICATION OF THE
SOURCE OF THE MATERIAL ON THE CHIP DETECTORS.

(1) Airline.
(2) Aircraft type and serial number.
(3) Engine position, serial number, and service time as follows:
(a) Total time.
(b) Time since last shop visit.
(c) Time since engine oil has been changed, if any.
(4) Date and reason for inspection with any remarks.

C. Recovery of Chips / Particles or other Debris

(1) Hardware location: The NDT manual Part 10 is produced for
multiple CFM engine lines and material from one engine location
may not correspond to a different engine. Additionally, in the
future hardware may be redesigned with different materials.
(2) Chips / Particles other Debris acceptability/serviceability
(a) Some Chips / particles or other debris may be acceptable
to one engine model, but not to another. Additionally,
Engine Shop Manual (ESM) and Aircraft Maintenance Manual
(AMM) limits are subject to change. Refer to applicable
to appropriate manual.
(3) Failure mode determination
(a) Determination of failure mode (or root cause) can be
difficult. While certain failures leave clear evidence,
many others are difficult to identify. Part 10 includes
failure mode data, but determining root cause often
requires information from many sources - not just the
chips / particles or other debris.
(4) Chips / particles or other Debris collection methods
(a) Collection of Chips / particles or other Debris is
primarily accomplished with magnetic detectors / scavenges
screens or filters. See Engine Shop Manual (ESM) or
Component Maintenance Manual (CMM) or Aircraft maintenance
Manual (AMM) for proper assembly and disassembly
techniques.

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(b) If Chips / particles or other debris is found, proper

tracking and collection is critical to determining which
hardware needs to be inspected or replaced.

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***** FOR CFM56-2A;CFM56-2B;CFM56-2C *****

CFM56-2A/ -2B/ -2C Engine Sump Areas (Scavenge Screens and Magnetic Chip
Detectors)
Figure 801

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***** FOR CFM56-3 *****

CFM56-3 Engine Sump Areas (Scavenge Screens and Magnetic Chip Detectors)
Figure 802

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***** FOR CFM56-5A *****

CFM56-5A Engine Sump Areas (Scavenge Screens and Magnetic Chip Detectors)
Figure 803

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CFM56-5B Engine Sump Areas (Scavenge Screens and Magnetic Chip Detectors)
Figure 804

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CFM56-5C Engine Sump Areas (Scavenge Screens and Magnetic Chip Detectors)
Figure 805

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***** FOR CFM56-7B *****

CFM56-7B Engine Sump Areas(Scavenge Screens and Magnetic Chip Detectors)
Figure 806

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Subtask 79-00-00-500-001

D. Handling, collection and inspection with no vacuum filtering or

special test equipment for analysis of chips or particles or other
debris. (See Figure 807, Figure 808, Figure 809, Figure 810, Figure
811)

CFM56 strongly recommends sending Chips / particles or other debris to

a certified laboratory for identification: however, the following
steps may be followed if field data is needed and/or the laboratory
analysis is not possible at the time of the event.
(1) Record the date, aircraft number, engine number/position and
chip detector prior to removing Chips / particles or other
debris.
(a) Chips / Particles and other debris can be difficult to
locate and easy to misplace. In some cases, oil may be
toxic or dangerous. For these reasons, CFM56 recommends
the use of specific tools to aid in the safe and proper
handling of debris.

NOTE: Visually inspecting chips / particles and

other debris while it is in the filter is not
recommended. Back-flushing of filter or cutting
open per approved procedures to aid visual
identification is preferred.

(2) Chips/ Particles and other debris collection tools without using
filtering equipment (see Figure 807).
(a) Collection tools may include tweezers, petri dishes,
dowels and special one-sided tape. Utilization of sterile
tools reduces the likelihood of contamination and improves
the accuracy of laboratory analysis.

NOTE: Utilizing office, transparency or other tapes

is not recommended because laboratory analysis
requires dissolving the tape - which takes time and
requires the use of stronger chemicals. Specially
designed carbon tabs are recommended.

(b) Lightly press carbon tabs to chips / particles or other

debris on magnetic sensor.
(c) Under controlled conditions, remove chips / particles or
other debris from carbon tabs and degrease debris.

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Collecting the Chips / Particles
Figure 807

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Subtask 79-00-00-500-003

(d) Use Brass Sieves to determine debris size if available. (Figure 808)

NOTE: Use Brass Sieves and a brass Capture Pan with optional
Cover to retain and capture material and eliminate possible
magnetic interference.

- Recommend two Brass Sieve sizes:

250 um micron
500 um micron
Make sure the cover, sieves (screens) and capture pan are clean and
free of any debris.

- Stake the sieves on top of each other with the largest screen size
on top with the smallest size on bottom.

- Lightly drop the material onto the first screen (top sieve).
- Gently shake the material to see if it falls through the top
screen.

- Remove (un-stake) the top screen.

- Gently shake the next screen to capture the material in the screen
and pan.

- Examine the material in the two un-staked sieves and pan to

identify material.

- Place material from pan on a grid paper with scale to determine

size (Figure 809).

- Take high resolution pictures of the debris on the grid paper.

- Note quantity and size of material on screens.
- Refer to Engine Shop manual (ESM), Component Maintenance Manual
(CMM) and Aircraft Maintenance Manual (AMM) for Disposition.

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Brass Sieve Combinations with Top Two Screens and Bottom Capture Pan
Figure 808

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Subtask 79-00-00-500-004

(e) If sieves are not available:

- Place chips / particles or other debris on grid paper and take

high resolution photographs.

- Note quantity and size of debris on grid paper (Figure 809).

- Refer to Engine Shop Manual (ESM), Component Maintenance Manual
(CMM) and Aircraft Maintenance Manual (AMM) for disposition.
Subtask 79-00-00-500-002

(3) Recover chips / particles and other debris from chip detector magnet
as follows:
(a) Place chip detector on a clean surface, retain plastic bag and
identification tag.
(b) Remove filter /screen from chip detector by pushing the spring
loaded pin that secures filter to chip detector using a fiber
pusher. Replace filter into plastic bag.

NOTE: Chips / Particles and other debris remaining on the

filter may be recovered using filtering equipment. See
paragraph E.

(c) Remove particles from chip detector magnet using a clean cloth
or a thin sheet of paper.

NOTE: The use of a magnet to remove chips / particles from

chip detector magnet is not recommended since repeated
exposure may degrade magnetic performance of magnetic
detector.

NOTE: Avoid collecting chips / particles on a strip of

adhesive tape as it will be difficult to remove them.

(d) Place chips / particles or other debris onto filter paper into
a Petri dish. See Figure 811.
(4) Chips / particles and other debris inspection tools
(a) An inspection magnifier 10X (or higher) magnification is
recommended, but not always needed. The figure shows three
types of eye magnifiers and one type of electronic device
(Magnifier) that are suitable magnifying devices that may be
used by line / shop maintenance personnel. See Figure 810.
(b) A magnet may also be used for identifying the magnetic
properties of chips / particles or other debris.

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Grid Paper for Material Evaluation
Figure 809

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Inspection Magnification Tools for Chip / Particle Identification
Figure 810

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Subtask 79-00-00-200-007

(5) Visual Inspection

(a) The 4 (four) following groups of chips / particles or other
debris can be found:

- Magnetic metal chips / particles such as: machining chips,

(swarf) shots from shot peening, flakes from bearings,
flakes from gear shafts, rivet heads, pieces of component
etc.

- Non-magnetic metal chips / particles such as: non-magnetic

stainless steel, filter mesh chips / particles or other
debris, light alloy, copper, silver, chromium.

- Magnetic non-metallic chips / particles such as: carbon

deposit slightly magnetic.

- Non-metallic chips / particles such as: carbon deposit,

sand, carbon seal, O-ring etc.
(b) Using a 10x magnifier or other types of magnification according
to Figure 810, determine the group of chips / particles or
other debris according to the following elements:

- Appearance: metallic shavings, rivet heads, tooth debris,

shots carbon deposits, burrs, flakes etc.

- Origin: compare chips / particles with samples given in

Figure 818 to Figure 854.

- Quantity: The quantity is determined by measuring surface

of deposit on recovered filter. To measure, the filter must
be in horizontal position and chips / particles spread over
evenly. Filter has a diameter of 1.8 inch (45 mm) and a
surface of 2.5 sq. inch (1600 sq. mm).

NOTE: Most of the time, chips / particles or other debris of

different appearance and origin will be found.

Subtask 79-00-00-220-001

(6) Bearing information (Visual Characteristics)

(a) The primary objective of chip / particle or other debris
identification is for the detection of bearing distress prior
to failure. Any bearing chips / particles or other debris
identified, either visually or by laboratory analysis, is cause
for immediate concern. The following visual characteristics
can be helpful in distinguishing bearing material.

- Many chips of similar size and shape

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- Magnetic material
- Smooth, reflective (silvery) surface on one or both sides
- Roughly circular or elliptical flakes, thinner around edges
- Material that is hard and brittle
- Metal chunks as small dark irregular particles
- Pieces of bearing cage material
- Chunks of silver plated steel
NOTE: A magnet placed under the Petri dish will facilitate
deposit of chips / particles on the filter.

(b) Place an adhesive tape on the Petri dish. See Figure 811.
Write the identification elements indicated on the tag with
ball pen or felt tip. See paragraph 3.B.

CAUTION: IMMEDIATE ACTION MUST BE TAKEN IN ACCORDANCE WITH THE ESM,

AMM OR CMM SHOULD CHIPS OR PARTICLES INDICATE PENDING
COMPONENT FAILURE.

CAUTION: IN ALL CASES, CHIPS / PARTICLES MUST BE SENT TO THE

LABORATORY FOR ANALYSIS.

(c) The following tooling can be used to help chip / particle or

other debris (distress identifiers) identification.

- 856A1364, PRINT SET, IDENTIFICATION - MAGNETIC CHIP

DETECTOR DEBRIS.

- 856A2683, CHIP DETECTOR MATERIAL IDENTIFICATION TOOL.

(d) Analyse chips / particles or other debris per Paragraph F and
Part 9 of the NDT Manual.
(e) A new or thoroughly cleaned chip detector and screen will be
installed on lubrication unit. See AMM / ESM.
Subtask 79-00-00-200-008

E. Handling, collection and inspection using vacuum filtering and special

test equipment for analysis of chips / particles or other debris at a
certified Laboratory.

CAUTION: CHECK THAT THE FUNNEL AND FILTER SUPPORT ARE FREE OF
PARTICLES.

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(1) Place a filter, EP 1239D4P, onto filter support and secure

assembly with clamp. Connect vacuum flask to eductor or vacuum
bulb (300 ml). See Figure 812.

NOTE: The eductor requires a water tap with moderate flow.

(a) If required, install a new filter, FALP 02500, onto

solvent distributor. See Figure 812.

CAUTION: THE SOLVENT USED FOR EACH OPERATION MUST BE A NEW OR

REGENERATED LIQUID. CHECK THAT THE TANK USED IS FREE
OF PARTICLES.

(b) Place oil filter in a clean stainless steel or glass tank.

(2) Pour oil from plastic bag into the funnel. Rinse plastic bag
using distributor of filtered solvent (CP 2011) and pour into
the funnel.

NOTE: Retain tag that identifies the particles.

(3) Fill tank with Stoddard Solvent (CP2011) to immerse oil filter
and soak for 10 minutes.
(4) Using an ultrasonic tank and the distributor of Stoddard Solvent
(CP2011), remove the maximum of particles from oil filter.
(5) Pour the liquid recovered from the tank into the funnel. Rinse
the tank using solvent distributor and pour into the funnel.
(6) Create a partial vacuum in the vacuum flask to assist passage
of the liquid through the filter and collection of suspended
particles on filter.

NOTE: Chips / Particles that remain on the funnel glass

surface will be recovered by rinsing using distributor of
Stoddard Solvent (CP2011).

(7) Remove clamp and funnel. Maintain partial vacuum and rinse
filter by circular motion toward center using distributor of
Stoddard Solvent (CP2011). This operation directs particles
toward the center of the filter and completes rinsing.
(8) Return vacuum flask to ambient pressure. Let filter soak and
place it in a Petri dish, PD 15 04 700, using tweezers, 62 000
06. Close Petri dish.
(9) Place a strip of adhesive tape on Petri dish. See Figure 811.
Using a ball pen or felt tip, write the identification elements
indicated on the tag.

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Petri Dish
Figure 811

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Filtering Equipment
Figure 812

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Subtask 79-00-00-200-012

(10) If a chip / particle or other debris are identified refer to

paragraph F. (Subtask M7-90-00-020-000).
(11) The results of the laboratory analysis can be used to assist
in the type of material identification by using the following
element associations as suggested by possible distress identifiers
(Reference Element Weight Table in Part 9 of NDT Manual:
(a) Fe, Cu - indication of bearing (CFM56 engine bearings have
steel cages - Ag may provide secondary indication).
(b) Fe, Cu, Zn - indication of AGB bearing distress or lube and
scavenge pump bearing distress, pump bearing distress may occur
due to ingestion of material from an engine part's distress,
and Fe indication may be from engine part.
(c) Fe, Cr - possible indication of gearbox parts distress; IGB or
AGB bearing distress. The gearbox bearing housings and the IGB
Horizontal drive shaft are Cr plated.
(d) Fe, Ni, Cr - indication of bearing distress Fe, Ni, Cr are
major constituents of many parts in the sumps.
(e) Fe, Ni, Al - indication of No. 3 Bearings inner race spinning;
Fe, W may be an indication of a future No. 4 Bearing distress.
(f) Al - indication of lube module distress.
Subtask 79-00-00-200-009

F. The following Figures / graphics / photographs are to determine the

status of the Chip / particle or other debris. Additionally reference
Part 9 (CFM56 sump areas) for the different types of material found
in the different sumps and scavenge screens. Have the metallic and
nonmetallic material in scavenge screens and or magnetic particles
attached to the Magnetic plugs analyzed to determine type of material.
(1) Using the figures, you can identify the debris:
(a) The engine model, specific location, nature of material,
appearance of the material, material, quantity of material
and size.
(b) Examine the particles from the chip detector(s) and
scavenge screen (s) to identify the physical properties of
the material (shape, size, quantity, magnetic properties,
non-magnetic properties and color).

NOTE: Refer to the applicable AMM or Engine Shop Manual

(ESM) for the component in question and the
maintenance required to return engine to service.

(2) Immediate Action to be taken according to AMM.

(a) If particles are identified, conform to the indications of
Figure 813 to Figure 817.

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(b) In all cases, particles must be sent to the laboratory for

analysis.
(c) The following tooling can be used to help debris
identification.

- 856A1364, PRINT SET, IDENTIFICATION - MAGNETIC CHIP

DETECTOR DEBRIS.

- 856A2683, CHIP DETECTOR MATERIAL IDENTIFICATION TOOL.

(3) Non Destructive Test Manual (79-00-00-200-009, Part 9) (CFM56
sump areas) for the different types of material found in the
different sumps and scavenge screens. Have the magnetic and
non-magnetic material in scavenge screens and or magnetic
particles attached to the magnetic plugs analyzed to determine
type material.
(4) The different types of Scavenge Sump screens, Magnetic Chip
Detectors (MCD’s) and Debris Monitoring System (MDS) Detectors
and Filters (Screens) are used to locate and identify the debris
within a specific bearing area (Sump). See Figure 813 and
Figure 814.

NOTE: The CFM56-5B and 5C Engines may have installed an Engine

Monitoring Chip Detectors (EMCD) system.

NOTE: Corrective action is taken immediately after you have

identified the collected particles.

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***** FOR CFM56-2A;CFM56-2B;CFM56-2C *****

Chip Detector (CFM56-2 Engines)
Figure 813

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Chip Detector (CFM56-3 / 5A / 7B Engines)
Figure 814

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DMS Detector (CFM56-7B Engines)
Figure 815

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Electrical Master Magnetic Chip Detector (CFM56-5B Engines)
Figure 816

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***** FOR CFM56-5C *****

Electrical Master Magnetic Chip Detector (CFM56-5C Engines)
Figure 817

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Subtask 79-00-00-200-010

(5) The following Tables and Figures are associated with a specific
area of the engine that covers parts (items) affected within each
bearing area (Scavenge Sump Screen and Magnetic Chip Detector). The
Magnetic Chip Detectors (MCD’s) / Debris Monitoring System (MDS)
Detector and Filters (Screens).
(a) The Tables identify the type debris (material) found and in the
last column gives the associated Figure number that identifies
the area of concern within each sump area.

CFM56-2 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Steel X X X X X Figure 818,

Figure 819
and Figure
837

Elastomer X X X X X Figure 820

Carbon Deposits X X X X X Figure 821

Aluminium X X X X X Figure 822

AISI 4130 (30CD4) X X X Figure 824

Z180CDW13 X X X Figure 825

Resin Polyamide X X X Figure 830

A357 (AS7G06) X X X Figure 831

Z12CN18 X X Figure 832

Aluminum Shim X Figure 834

(AMS4012)

Aluminium Paint X X Figure 835

Glass Fiber with X X Figure 836

Polyamide and Figure
853

Metco 601 X X Figure 838

M50 or M50Nil Steel X X X X X Figure 839

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CFM56-2 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Torlon X X Figure 840

(Resin/Polyamide)

Aluminum and X X Figure 842

HASTELLOY X

Graphite C papex + X X Figure 843

sheet of Ni 13 µm

Silver X X Figure 844

Phenolic/Plastic X X Figure 845

Epoxy & Aluminum X X Figure 847

Powder

Z6 CNT 18-1 (AMS X X X Figure 848

7228) or Z10 CNT
18-10 (AMS 7225)

Steel (AISI 4130) X X X Figure 849

Silver X X Figure 850

AMS 6450 or ASTM A231 X X Figure 851

Steel (40NCD7) X X Figure 852

17-4PH / Z12CNDV12 X X Figure 854

CFM56-3 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Steel X X X X X Figure 818,

Figure 819,
Figure 826,
Figure 827
and Figure
837

Elastomer X X X X X Figure 820

Carbon Deposits X X X X X Figure 821

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 CFM56
NON DESTRUCTIVE TESTING MANUAL

CFM56-3 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Aluminium X X X X X Figure 822

15CDV6 X X X Figure 823

AISI 4130 (30CD4) X X X Figure 824

Z180CDW13 X X X Figure 825

AISI 4340 (E-40NCD7) X X X Figure 828

Silver Plated

Z6NCT25 X X X Figure 829

Resin Polyamide X X X Figure 830

A357 (AS7G06) X X X Figure 831

Z12CN18 X X X Figure 832

Aluminum Shim X X Figure 834

(AMS4012)

Aluminium Paint X X Figure 835

Glass Fiber with X X Figure 836

Polyamide and Figure
853

Metco 601 X X Figure 838

M50 or M50Nil Steel X X X X X Figure 839

Torlon X X Figure 840

(Resin/Polyamide)

Aluminum & HASTELLOY X X Figure 842

X

Graphite C papex + X X Figure 843

sheet of Ni 13 µm

Silver X X Figure 844

Phenolic/Plastic X X Figure 845

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NON DESTRUCTIVE TESTING MANUAL

CFM56-3 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Epoxy & Aluminum X X Figure 847

Powder

Silver X X Figure 850

AMS 6450 or ASTM A231 X X Figure 851

17-4PH / Z12CNDV12 X X Figure 854

CFM56-5 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Steel X X X X X Figure 818,

Figure 819,
Figure 837

Elastomer X X X X X Figure 820

Carbon Deposits X X X X X Figure 821

Aluminium X X X X X Figure 822

AISI 4130 (30CD4) X X X Figure 824

Z180CDW13 X X X Figure 825

Resin Polyamide X X X Figure 830

A357 (AS7G06) X X X Figure 831

Z12CN18 X X X Figure 832

A286/Z6NCT25 X X Figure 833

WASPALLOY

Aluminum Shim X X Figure 834

(AMS4012)

Aluminium Paint X X Figure 835

Glass Fiber with X X Figure 836

Polyamide

Metco 601 X X Figure 838

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NON DESTRUCTIVE TESTING MANUAL

CFM56-5 Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

M50 or M50Nil Steel X X X X X Figure 839

Torlon X X Figure 840

(Resin/Polyamide)

15CDV6 (VASCOJET 90) X X X Figure 841

Aluminum & HASTELLOY X X Figure 842

X

Graphite C papex + X X Figure 843

sheet of Ni 13 µm

Silver X X Figure 844

and Figure
850

Phenolic/Plastic X X Figure 845

Epoxy & Aluminum X X Figure 847

Powder

AMS 6450 or ASTM A231 X X Figure 851

17-4PH / Z12CNDV12 X X Figure 854

CFM56-7B Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Steel X X X X X Figure 818,

Figure 819,
and Figure
837

Elastomer X X X X X Figure 820

Carbon Deposits X X X X X Figure 821

Aluminium X X X X X Figure 822

AISI 4130 (30CD4) X X X Figure 824

Z180CDW13 X X X Figure 825

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CFM56-7B Sump Material Table

Material Non Mag TGB AGB Forward Aft Location
Mag

Resin Polyamide X X X Figure 830

A357 (AS7G06) X X X Figure 831

Z12CN18 X X X Figure 832

A286/Z6NCT25 X X Figure 833

WASPALLOY

Aluminum Shim X X Figure 834

(AMS4012)

Aluminium Paint X X Figure 835

Glass Fiber with X X Figure 836

Polyamide

Metco 601 X X Figure 838

M50 or M50Nil Steel X X X X X Figure 839

Torlon X X Figure 840

(Resin/Polyamide)

Aluminum & HASTELLOY X X Figure 842

X

Graphite C papex + X X Figure 843

sheet of Ni 13 µm

Silver X X Figure 844

and Figure
850

Phenolic/Plastic X X Figure 845

Teflon (Abradable) X X Figure 846

Epoxy & Aluminum X X Figure 847

Powder

AMS 6450 or ASTM A231 X X Figure 851

17-4PH / Z12CNDV12 X X Figure 854

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CFM56 (All) All Sump Screen / MCD Material
Figure 818

ALL
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PAGE 837
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CFM56 (All) All Sump Screen / MCD Material
Figure 819

ALL
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CFM56 (All) All Sump Screen / MCD Material
Figure 820

ALL
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PAGE 839
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CFM56 (All) All Sump Screen / MCD Material
Figure 821

ALL
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PAGE 840
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CFM56 (All) All Sump Screen / MCD Material
Figure 822

ALL
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PAGE 841
DEC 15/2019

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 CFM56
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***** FOR CFM56-3 *****

CFM56-3 AGB/TGB Sump Screen / MCD Material
Figure 823

ALL
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PAGE 842
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) AGB/TGB Sump Screen / MCD Material
Figure 824

ALL
79-00-00
INSPECTION 010
PAGE 843
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) AGB/TGB Sump Screen / MCD Material
Figure 825

ALL
79-00-00
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PAGE 844
DEC 15/2019

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 CFM56
NON DESTRUCTIVE TESTING MANUAL

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CFM56-3 AGB/TGB Sump Screen / MCD Material
Figure 826

ALL
79-00-00
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PAGE 845
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NON DESTRUCTIVE TESTING MANUAL

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CFM56-3 AGB/TGB Sump Screen / MCD Material
Figure 827

ALL
79-00-00
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PAGE 846
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NON DESTRUCTIVE TESTING MANUAL

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CFM56-3 AGB/TGB Sump Screen / MCD Material
Figure 828

ALL
79-00-00
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PAGE 847
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NON DESTRUCTIVE TESTING MANUAL

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CFM56-3 AGB/TGB Sump Screen / MCD Material
Figure 829

ALL
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PAGE 848
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CFM56 (All) AGB/TGB Sump Screen / MCD Material
Figure 830

ALL
79-00-00
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PAGE 849
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CFM56 (All) AGB/TGB Sump Screen / MCD Material
Figure 831

ALL
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PAGE 850
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CFM56 (All) AGB/TGB Sump Screen / MCD Material
Figure 832

ALL
79-00-00
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PAGE 851
DEC 15/2019

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 CFM56
NON DESTRUCTIVE TESTING MANUAL

***** FOR CFM56-5A;CFM56-5B;CFM56-5C;CFM56-7B *****

CFM56-5A/5B/5C and 7B Forward Sump Screen/ MCD Material
Figure 833

ALL
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) Forward Sump Screen/ MCD Material
Figure 834

ALL
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PAGE 853
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) Forward Sump Screen/ MCD Material
Figure 835

ALL
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PAGE 854
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) Forward Sump Screen/ MCD Material
Figure 836

ALL
79-00-00
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PAGE 855
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) Forward Sump Screen/ MCD Material
Figure 837

ALL
79-00-00
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PAGE 856
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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 838

ALL
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PAGE 857
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) All Sump Screen / MCD Material
Figure 839

ALL
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PAGE 858
DEC 15/2019

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 CFM56
NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) Forward Sump Screen/ MCD Material
Figure 840

ALL
79-00-00
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PAGE 859
DEC 15/2019

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 CFM56
NON DESTRUCTIVE TESTING MANUAL

***** FOR CFM56-5A;CFM56-5B;CFM56-5C *****

CFM56-5A/5B/5C AGB/TGB Sump Screen / MCD Material
Figure 841

ALL
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PAGE 860
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NON DESTRUCTIVE TESTING MANUAL

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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 842

ALL
79-00-00
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PAGE 861
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 CFM56
NON DESTRUCTIVE TESTING MANUAL

***** FOR CFM56-2A;CFM56-2B;CFM56-2C;CFM56-3;CFM56-5A;CFM56-5B;CFM56-7B *****

CFM56-(All Except -5C) AFT Sump Screen / MCD Material
Figure 843

ALL
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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 844

ALL
79-00-00
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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 845

ALL
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CFM56-7B Forward Sump Screen/ MCD Material
Figure 846

ALL
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CFM56 (All) Forward Sump Screen/ MCD Material
Figure 847

ALL
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PAGE 866
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 CFM56
NON DESTRUCTIVE TESTING MANUAL

***** FOR CFM56-2A;CFM56-2B;CFM56-2C *****

CFM56-2A/2B/2C AGB/TGB Sump Screen / MCD Material
Figure 848

ALL
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CFM56-2C AGB/TGB Sump Screen / MCD Material
Figure 849

ALL
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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 850

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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 851

ALL
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CFM56-2A/2B/2C Aft Sump Screen / MCD Material
Figure 852

ALL
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***** FOR CFM56-2A;CFM56-2B;CFM56-2C;CFM56-3 *****

CFM56-2/-3 Aft Sump Screen / MCD Material
Figure 853

ALL
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CFM56 (All) Aft Sump Screen/ MCD Material
Figure 854

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