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The ISO11452-4 standard specifies two BCI test methods: the substitution (open-loop), and
current monitoring (closed-loop) probe methods. Both test methods consist of two phases:
Calibration Procedure
The calibration procedure (same for both methods) is performed with an unmodulated
sinusoidal RF signal. During the calibration procedure net power (forward power minus
reverse power) is injected into the current probe creating the required current level in the
calibration fixture over the required frequency range (1 – 400 MHz). The level of forward
power used during the calibration is later used during the actual testing. BCI test severity
levels (required current levels) are specified in Table 1.
AM Modulated Signal
During the testing (in both methods) the AM modulated signal is used with the carrier
frequency, fC, varied from 1 to 400 MHz. Let’s briefly discuss the modulation process. The
unmodulated signal is a sinusoid shown in Figure 9a.
The modulating signal, shown in Figure 9b, is also a sinusoid of an angular frequency θ,
corresponding to the linear (cyclic) frequency of 1 kHz. The amplitude of this sinusoid is
controlled by the modulation index, m, where,
(1)
The resulting AM-modulated signal is shown in Figure 9c. The peak amplitude of this signal
is larger than the amplitude of the original unmodulated signal (since we are adding two
sinusoids).
The reduction in the peak amplitude of the original unmodulated signal can be also described
in terms of the mean power. Let’s denote the mean power of the original unmodulated signal
as PCW, and the mean power of the amplitude-reduced unmodulated signal as P′C. Then [1],
(2)
(3)
or
(4)
Thus, to adjust the amplitude of the carrier wave prior to modulation, the power is decreased
by 5.1 dB and then AM modulating signal is added.
The test configuration for the substitution method is shown in Figure 11 and Figure 12,
respectively.
The test is conducted by injecting the forward power (recorded during the calibration
procedure) into the current probe clamped over the harness connected to the DUT. The
forward power is incrementally increased until the level used in calibration (that produced the
required current) is reached. Note that the calibrated level of the forward power corresponded
to the load of 50 Ω. The load impedance during the testing varies and could be smaller or
larger than 50Ω. Thus, the forward power used during the testing may induce larger or
smaller currents in the harness than the forward power induced during the calibration.
The test configuration for the closed-loop method with power limitation is shown in
Figure 13 and Figure 14, respectively.
Figure 13: Test configuration – closed-loop method with power limitation – top
view
Figure 15: Current measurement probe used in closed -loop method with power
limitation
During testing power level recorded during the calibration is applied to the injection probe.
The forward power is incrementally increased until the level used in calibration (that
produced the required current in the 50Ω fixture) is reached. Current level in the wiring
harness is measured using the measurement probe. If this measured current is below the level
specified in Table 1, the power to the injection probe is increased until the specified current
level is achieved or the power limit is reached. The power limit is specified by
(5)
Figure 16 shows the passing test result for a DUT which was tested to the severity level IV,
using the substitution method.
Figure 17 shows the test result with anomalies for a DUT which was tested to the severity
level IV, using the substitution method.
Figure 18 shows the test result when a DUT was tested using the closed-loop method with
power limitation (note: the test limits in this plot do not correspond to the ISO 11452-4
specification).
Anomalies are categorized as belonging to one of several classes. ISO 11452-1, [4], defines
theses classes as follows.
o Class A – all functions of a DUT perform as designed during and after exposure to a
disturbance.
o Class B – all function of a DUT perform as designed during exposure; however, one
or more of them can go beyond a specified tolerance.
o All functions return automatically to within normal limits after exposure is removed
(memory functions belong Class A).
o Class C – one or more functions of a DUT do not perform as designed during
exposure but return automatically to normal operation after exposure is removed.
o Class D – one or more functions of a DUT do not perform as designed during
exposure and do not return to the normal operation until exposure is removed and the
DUT is reset by a simple operator action.
o Class E – one or more functions of a DUT do not perform as designed during and
after exposure and cannot be returned to proper operation without repairing or
replacing the DUT.
During the immunity testing, each test group must meet a set of minimum requirements
defined by the functional status classification above.
References