FRACTIONAL FACTORIAL

DESIGN OF EXPERIMENTS
- TAGUCHI Method
 Basic methodology

• FULL FACTORIAL DESIGN OF EXERIMENT– is an experiment whose

design consists of two or more factors, each with discrete possible values or "levels", and whose

experimental units take on ALL possible combinations of these levels across all such factors.

• 5 factors, 2 levels each; N=2^5=32 combinations

• FRACTIONAL FACTORIAL EXERIMENT or Taguchi DOE– the method of

reducing the number of experiments to a PRACTICAL level, only a small set from all of the

possibilities.
Before discussing how the Taguchi approach reduces
the number of experiments, it is helpful to
understand how all possible combinations result from
a set of factors.
• Suppose we are concerned about one factor, A (say, temperature). If we
were to study the effect of A on a product at two levels, say, 400°F and
500°F, then two tests become necessary:

Level1 = 𝐴! (400°F) and Level 2 = 𝐴" (500°F)

• Consider now two factors, A and B, each at two levels (A1, A2 and B1, B2).
What are the combinations?

• With three factors, each at two levels. What are the combinations?

• With seven factors, each at two levels. What are the combinations?

• Number of Experimental Run = Level # of Factor

Orthogonal Array

• Runs – Number of rows in the array, which translates into a

number of test cases that will be generated.

• Factors – Number of columns in the array, which translates into

a maximum number of variables that can be handled.

• Levels – Maximum number of values that can be taken on any

single factor.
Orthogonal Array Selector
Standard Orthogonal Arrays

L8 Array
L4 Array
Standard Orthogonal Arrays

L9 Array L12 Array

Standard Orthogonal Arrays
L 16 Array L18 ARRAY
L27 ARRAY
L 50 ARRAY
 Worked Out Example #1
• A microprocessor company is having difficulty with its current yields. Silicon
processors are made on a large die, cut into pieces, and each one is tested to
match specifications.

The company has requested that you run experiments to increase processor
yield. The factors that affect processor yields are temperature, pressure,
doping amount, and deposition rate.

• a) Question: Determine the Taguchi experimental design orthogonal array.

• The operating
conditions for each
parameter and level
are listed below:
•A: Temperature •C: Doping Amount
•A1 = 100ºC •C1 = 4%
•A2 = 150ºC (current) •C2 = 6% (current)
•A3 = 200ºC •C3 = 8%

•B: Pressure •D: Deposition Rate

•B1 = 2 psi •D1 = 0.1 mg/s
•B2 = 5 psi (current) •D2 = 0.2 mg/s (current)
•B3 = 8 psi •D3 = 0.3 mg/s
Example 2.
Design the below experiment using Taguchi Method:
Analyzing Experimental Data
• To determine the effect each variable has on the
output, the signal-to-noise ratio, or the SN number,
needs to be calculated for each experiment conducted.

• Y-bar is the mean value and Si^2 is the variance.

• Yi is the value of the performance characteristic for a
given experiment.
Signal-to-Noise Ratio

2
• REPETITION/replication/trials permits
determination of Signal-to-Noise (S/N) ratio.

• The greater this value, the smaller the

product variance around the target value.
 Worked Out Example #1
• A microprocessor company is having difficulty with its current yields. Silicon
processors are made on a large die, cut into pieces, and each one is tested to
match specifications.

The company has requested that you run experiments to increase processor
yield. The factors that affect processor yields are temperature, pressure,
doping amount, and deposition rate.

• a) Question: Determine the Taguchi experimental design orthogonal array.

• The operating
conditions for each
parameter and level
are listed below:
•A: Temperature •C: Doping Amount
•A1 = 100ºC •C1 = 4%
•A2 = 150ºC (current) •C2 = 6% (current)
•A3 = 200ºC •C3 = 8%

•B: Pressure •D: Deposition Rate

•B1 = 2 psi •D1 = 0.1 mg/s
•B2 = 5 psi (current) •D2 = 0.2 mg/s (current)
•B3 = 8 psi •D3 = 0.3 mg/s
 a) Solution: The L9 orthogonal array should be used.
The filled in orthogonal array should look like this:

This setup allows the testing of all four variables without having to run 81
(=34)
• b) Question: Conducting three trials for each experiment,
the data below was collected. Compute the SN ratio for
each experiment for the target value case, create a
response chart, and determine the parameters that have
the highest and lowest effect on the processor yield.

• C) Is there a significant difference in the computed SN

ratio for each experiment for the target value case?
 Deposition Rate

Temperature

respondents

respondents

respondents
Experiment

Trial 1 = 10

Trial 2 = 10

Trial 3 = 10
Pressure
Number

Amount
Doping
1 0.1 4% 2psi 100dC 87.3 82.3 70.7
2 0.2 6% 5psi 100dC 74.8 70.7 63.2
3 0.3 8% 8psi 100dC 56.5 54.9 45.7
4 0.3 6% 2psi 150dC 79.8 78.2 62.3
5 0.1 8% 5psi 150dC 77.3 76.5 54.9
6 0.2 4% 8psi 150dC 89 87.3 83.2
7 0.2 8% 2psi 200dC 64.8 62.3 55.7
8 0.3 4% 5psi 200dC 99 93.2 87.3
9 0.1 6% 8psi 200dC 75.7 74 63.2
Seatwork no. 1 (Final Period)
Orthogonal Array and Signal-to-Noise Ratio
Addtl: Conduct an Analysis of Variance if applicable.
 Problem no. 1 (Solve for Signal-to-Noise Ratio)
Experiment S/N
1 2 3 4 5 6 mean σ^2
no. \ Trial ratio
1 18 17 14 15 16 17

2 17 25 22 12 14 15

3 25 16 21 17 18 19

4 26 29 23 14 15 16
Problem no. 2 (Solve for Signal-to-Noise Ratio)
Problem no. 3 (Design below Experiment)
Material Level 1 Level 2 Level 3

Wood Black Walnut White Oak Pinewood

Fabric Cotton Linen Wool

Thread Lifetime Threads Polyester Nylon

Nails Round Head Oval Head Masonry

Metal Steel Aluminum Copper

 Problem no. 4
Cont. of prob. 2 - Experimental results..
Experiment S/N
Trial 1 Trial 2 Trial 3 Trial 4 Trial 5 Mean Variance
no.\Trial Ratio

1 11.5 11.8 11.3 10.7 14.8

2 9.2 8.7 8.2 15.5 14.5
3 11.7 11.8 11.5 14.7 12.1
4 12.7 12.7 12.6 8.8 9.8
5 13.8 13.5 13.8 14.4 13.2
6 13.2 13.5 13.4 8.9 14.7
7 12.6 12.9 12.1 11.2 14.3
8 12.3 11.7 12 8.6 8.5