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VLSI Overview CMOS Processing & Fabrication Components: Transistors, Wires, & Parasitics Design Rules & Layout Combinational Circuit Design & Layout Sequential Circuit Design & Layout Standard-Cell Design with CAD Tools Systems Design using Verilog HDL Design Project: Complete Chip
March 15, 2014 1
Determine placement of layout objects Color coding specifies layers Layout objects:
Grid types
P substrate wafer
Mask Generation
Mask Design using Layout Editor user specifies layout objects on different layers output: layout file Pattern Generator Reads layout file Generates enlarged master image of each mask layer Image printed on glass Step & repeat camera Reduces & copies image onto mask One copy for each die on wafer Note importance of mask alignment
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Key idea: Reduce layers to those that describe design Generate physical layers as needed Magic Layout Editor: "Abstract Layers metal1 (blue) - 1st layer metal (equiv. to physical layer) Poly (red) - polysilicon (equivalent to physical layer) ndiff (green) - n diffusion (combination of active, nselect) ntranistor (green/red crosshatch) - combined poly, ndiff pdiff (brown) - p diffusion (combination of active, pselect) ptransistor (brown/red crosshatch) - combined poly, pdiff contacts: combine layers, cut mask
About Magic
Grid distance: l (lambda) Value is process-dependent: l = 0.5 X minimum transistor length Paint squares on grid for each mask layer Layers to interact to form components (e.g. transistors)
Painting metaphor
Poly (red) N Diffusion (green) P Diffusion (brown) Metal (blue) Metal 2 (purple) Well (cross-hatching) Contacts (X)
Magic User-Interface
Cursor
accepts text commands Box :paint poly : paint red :paint ndiff :paint green Paint :write (poly) prints error & status messages
March 15, 2014
Paint
(ntransistor)
Paint
(pdiff)
Transistors - where poly, diffusion cross poly crosses ndiffusion - ntransistor poly crosses pdiffusion - ptransistor Vias - where layers connect Metal 1 connecting to Poly - polycontact Metal 1 connecting to P-Diffusion (normal) - pdc Metal 1 connecting to P-Diffusion (substrate contact) psc Metal 1 connecting to N-Diffusion (normal) - ndc Metal 1 connecting to N-Diffusion (substrate contact) nsc Metal 1 connecting to Metal 2 - via
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pdc
metal1
Masks are tooling for manufacturing. Manufacturing processes have inherent limitations in accuracy. Design rules specify geometry of masks which will provide reasonable yields. Design rules are determined by experience.
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Manufacturing problems
Photoresist shrinkage, tearing. Variations in material deposition. Variations in temperature. Variations in oxide thickness. Impurities. Variations between lots. Variations across a wafer.
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Transistor problems
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Wiring problems
Diffusion: changes in doping -> variations in resistance, capacitance. Poly, metal: variations in height, width -> variations in resistance, capacitance. Shorts and opens:
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Oxide problems
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Via problems
Via may not be cut all the way through. Undesize via has too much resistance. Via may be too large and create short.
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Designed to scale across a wide range of technologies. Designed to support multiple vendors. Designed for educational use. Ergo, fairly conservative.
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l is the size of a minimum feature. Specifying l particularizes the scalable rules. Parasitics are generally not specified in l units
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Design Rules
Typical rules: Minumum size Minimum spacing Alignment / overlap Composition Negative features
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Scalable Design Rules (e.g. SCMOS) Based on scalable coarse grid - l (lambda) Idea: reduce l value for each new process, but keep rules the same Key advantage: portable layout Key disadvantage: not everything scales the same Not used in real life Absolute Design Rules Based on absolute distances (e.g. 0.75m) Tuned to a specific process (details usually proprietary) Complex, especially for deep submicron Layouts not portable
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Intended to be Scalable
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Line size and spacing: metal1: Minimum width=3l, Minimum Spacing=3l metal2: Minimum width=3l, Minimum Spacing=4l poly: Minimum width= 2l, Minimum Spacing=2l ndiff/pdiff: Minimum width= 3l, Minimum Spacing=3l, minimum ndiff/pdiff seperation=10l wells: minimum width=10l, min distance form well edge to source/drain=5l Transistors: Min width=3l Min length=2l Min poly overhang=2l
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Contacts (Vias) Cut size: exactly 2l X 2l Cut separation: minimum 2l Overlap: min 1l in all directions Magic approach: Symbolic contact layer min. size 4 l X 4l Contacts cannot stack (i.e., metal2/metal1/poly) Other rules cut to poly must be 3l from other poly cut to diff must be 3l from other diff metal2/metal1 contact cannot be directly over poly negative features must be at least 2l in size CMP Density rules (AMI/HP subm): 15% Poly, 30% Metal
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Design violations displayed as error paint Find which rule is violated with ":drc why
Poly must overhang transistor by at least 2 (MOSIS rule #3.3)
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Effects of scaling down are positive See book, p. 78-79 - if everything scales, scaling circuit by 1/x increases performance by x Problem: not everything scales proportionally
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MOSIS - MOS Implementation Service Rapid-prototyping for small chips Multi-project chip idea - several designs on the same wafer Reduced mask costs per design Accepts layout designs via email Brokers fabrication by foundries (e.g. AMI, Agilent, IBM, TSMC) Packages chips & ships back to designers Our designs will use AMI 1.5m process (more about this later)
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Some Typical MOSIS Prices (from www.mosis.org) AMI 1.5m Tiny Chip (2.2mm X 2.2mm) $1,080 AMI 1.5m 9.4mm X 9.7mm $17,980 AMI 0.5m 0-5mm2 $5,900 TSMC 0.25m 0-10mm2 $15,550 TSMC 0.18m 0-7mm2 $24,500 TSMC 100-159mm2 $63,250 + $900 X size MOSIS Educational Program (what we use) AMI 1.5m Tiny Chip (2.2mm X 2.2mm) FREE* AMI 0.5mm Tiny Chip (1.5mm X 1.5mm) FREE*
*sponsored by Semiconductor Industry Assn., Semiconductor Research Corp., | AMI, Inc., DuPont Photomasks, and MOSIS
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Layout Considerations
Break layout into interconnected cells Use hierarchy to control complexity Connect cells by
Abutment Added wires Minimize size of overall layout Meet performance constraints Meet design time deadlines
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Key goals:
Hierarchy in Layout
Leaf cells - bottom of hierarchy Root cells - contains overall cell Pad frame - ring that contains I/O pads Core - contains logic organized as subcells
Shift register FSM Other cells
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Hierarchy Example
Pad Frame
Core
Pad 1
Pad 2
...
Pad N
Shift Re giste r
FSM
Othe r Ce lls
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Wires
metal 3
3
3
metal 2
metal 1
3
2
204424 Digital Design Automation
pdiff/ndiff
poly
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Transistors
2 3 2
3
1
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Vias
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Metal 3 via
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Tub tie
4 1
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Spacings
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Overglass
Cut in passivation layer. Minimum bonding pad: 100 m. Pad overlap of glass opening: 6 Minimum pad spacing to unrelated metal2/3: 30 Minimum pad spacing to unrelated metal1, poly, active: 15
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A stick diagram is a cartoon of a layout. Does show all components/vias (except possibly tub ties), relative placement. Does not show exact placement, transistor sizes, wire lengths, wire widths, tub boundaries.
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Key idea: "Stick figure cartoon" of a layout Useful for planning layout
relative placement of transistors assignment of signals to layers connections between cells cell hierarchy
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Circuit Diagram.
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in
out
VSS
phi
204424 Digital Design Automation
phi
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Define cells by outlines & use in a hierarchy to build more complex cells
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External connection - wire cells together Abutment - design cells to connect when adjacent Reflection, mirroring - use to make abutment possible
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First cut:
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NAND sticks
VDD a
out
VSS
204424 Digital Design Automation March 15, 2014 48
Use NAND cell as black box Arrange easy power connections Vertical connections for allow multiple bits
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m2(one-bit-mux)
o2
a1 b1
ai bi
select
select
m2(one-bit-mux)
select select
o1
a0 b0
ai bi
m2(one-bit-mux)
VDD oi VSS
o0
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Multiple-Bit Mux
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Use minimum-size transistors Assume power supply lines pass through cell from left to right at top and bottom of cell Assume inputs are on left side of cell Assume output is on right side of cell Optimize cell to minimize width Optimize cell to minimize overall area
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Layout Example
Circuit Diagram.
Exterior of Cell
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Overall Layout: 52 X 16
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Architecture
major resources, connections
Register-Transfer
logic blocks, FSMs, connections
Logic
gates, flip-flops, latches, connections
Circuit
transistors, parasitics, connections
Layout
mask layers, polygons
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Circuit level - transistors, wires, parasitics Layout level - mask objects Logic level - individual gates, latches, flip-flops Register- transfer level - Verilog HDL Behavior level - Specifications
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Start: higher level (spec) Finish: lower level (implementation) Must meet design criteria and constraints
Design time - how long did it take to ship a product? Performance - how fast is the clock? Cost - NRE + unit cost
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Layout Editors Design Rule Checkers (DRC) Circuit Extractors Layout vs. Schematic (LVS) Comparators Automatic Layout Tools
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Layout Editors
Absolute grid (MAX, LASI, LEdit, Mentor ICStation, other commercial tools) Magic: lambda-based grid - easier to learn, but less powerful Absolute mask (one layer for each mask) Magic: symbolic masks (layers combine to generate actual mask patterns)
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Mask description:
Goal: identify design rule violations Often a separate tool (built in to Magic) General approach: scanline algorithm Computationally intensive, especially for large chips
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Circuit Extractors
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Compare transistors, connections (ignore parasitics) Issue error if two netlists are not equivalent Important for large designs
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Simple: Procedural specification of layout (see book Fig. 2-33, p. 95) Complex: Netlist - places & wires individual transistors
Standard Cells - use predefined cells as "cookie cutters" Gate Arrays - configurable pre-manufactured gates (only change metal masks) FPGAs - electrically configurable array of gates
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Layout editors are interactive tools. Design rule checkers are generally batch--identify DRC errors on the layout. Circuit extractors extract the netlist from the layout. Connectivity verification systems (CVS) compare extracted and original netlists.
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Automatic layout
Cell generators (macrocell generators) create optimized layouts for ALUs, etc. Standard cell/sea-of-gates layout creates layout from predesigned cells + custom routing.
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routing area
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