Unit II

Interferometer
Principle, NPL Interferometer, Flatness measuring of slip gauges,
Parallelism, Laser Interferometer

Surface Finish Measurement-

Surface texture, measuring surface finish by Stylus Probe, Tomlinson &
Taly-surf, Analysis of surface traces: Methods

Design of Gauges-
Types of gauges, limits, fits, tolerances, Taylor‘s principle.
 Unit II

Interferometer
 Lecture 1

Fundamental of Interferometer
 BASIC OF INTERFEROMETRY
• Interference – Interaction of light
• Monochromatic lights (having only a single
wavelength) is a wavelength that is composed
of one color but it is confined to an extremely
narrow range

A
 PRINCIPLE

Just as with sound waves, light

waves, when combined, may
interfere constructively,
destructively or some combination
of both.

The interference can occur only

when two light rays are coherent,
that is the two rays maintain their
phase relationship for an
appreciable length of time.

Interference is possible when the two rays are

originated from the same point of the light at
the same time
If the path difference between the
reflected rays is even multiple of half
wave length, they will be out of phase and
dark band will be observed .

If the path difference is odd multiple of

half wave length they will be in phase
with each other and will reinforce each
other , so brightness will be observed.

Resultant wave

Wave 1
Wave 2
Constructive interference Destructive interference
 OPTICAL FLAT
Cylindrical pieces 25 to 300 mm diameter with
a thickness of about 1/6th of the diameter

Transparent material – Quartz, glass, sapphire

Quartz- Hardness,
Low coefficient of expansion,
Resistance to corrosion

Yellow orange light radiated by Helium

Gas use with optical flat
Two types of Optical flat

Type A
Single flat working surface
Uses- Measuring surfaces of flats, slip gauges,
measuring tables

Type B
Both working surfaces flat and parallel to each other
Uses – test measuring surfaces of micrometer,
measuring anvils, testing flatness and parallelism
 Reference Grade or Working Grade or
Grade I Grade II
Tolerance on 0.05 micron 0.10 micron
Flatness
Tolerance on 0.15 micron 0.20 micron
parallelism
Tolerance on 0.20 micron 0.30 micron
thickness
Black dot about 1 mm
diameter on the cylindrical
surface
Grade I type A flat of diameter 250 mm – Optical Flat IA 25- IS: 5440
Grade II type B flat of thickness 12.125 mm – Optical Flat IIB 12.125- IS :5440
If optical flat is now illuminated
by monochromatic source of light
interference fringes will be
observed.

 These are produced by the

interference of light rays reflected
from the bottom face of the
optical flat and top face of the
work piece being tested through
the layers of air
Limitation of optical flat

It is difficult to control the lay of the optical

flat and thus orient the fringes to the best
advantages

The fringe pattern is not viewed from

directly above and resulting obliquity can
cause distortion and errors in viewing
 INTERFEROMETERS
• The extension of the application of optical flat
• Use for measuring flatness and determining
the length of slip gauges.
• Overcomes the disadvantages of optical flat
TYPES OF INTERFEROMETERS
• Michelson Interferometer
• Fabry-Perot Interferometer
• Fringe counting Interferometer
• N.P.L. Flatness Interferometer
• Pitter N.P.L. Gauge Interferometer
• Zeiss gauge block Interferometer
• Multiple beam Interferometer
• Laser Interferometer
MICHELSON INTERFEROMETER

 oldest type

 Utilize monochromatic light from

extended source
Laser Interferometer

Optical technique and digital electronics

High Repeatability and resolution of

displacement measurement (0.1 micron)

High accuracy, long range optical path

NPL Interferometer

Mainly used for checking Flatness

Mercury vapour lamp is used as a

light source

Monochromic radiation wavelength

05 micron
 Surface of gauge Gauge surface Slight rounding off
is inclined to base convex/concave. at corners.
plate
 Pitter—N.P.L. Gauge Interferometer

Lens 2

Mirror This is also called the gauge length

interferometer and used for determining
actual dimensions or absolute length of
Slit the gauges.
Lens 1
As the mechanical sub-division of end
standards length tends to be laborious
when small lengths are considered, and
due to liability of error in that method,
direct measurement interferometer based
on the design of N.P.L. is most commonly
used.
Gauge block

Base plate