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ICFT PROJECT

BY CHAUBEY PRANJAL
H20221230197H
Ion implantation for
Gate Formation P and N well
formation
Similarly for pmos
source and drain
formation done as
shown accordingly
Mask 1
si3n4
sio2

CMP is used to
P Well
planarize the wafer N Well Conformal layer of sio2
surface is deposited by LPCVD

Finally done! P Substrate

Tin barrier is depsited on wafer and deposition of W layer by CVD is done


TI is deposited by sputtering

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