ULTRA HIGH RESOLUTION FOURIER TRANSFORM

X-RAY INTERFEROMETER
HERBERT W. SCHNOPPER
MAD CITY LABS
MADISON, WISCONSIN
and
SMITHSONIAN ASTROPHYSICAL OBSERVATORY
CAMBRIDGE, MA
and
JAMES A. MACKAY
MAD CITY LABS
MADISON WISCONSIN
ATTENUATION AND
PHASE SHIFT
d
BRAGGS LAW: n = 2d sin
where:
n = the reflection order
= the X-ray wavelength
d = either the crystal lattice spacing
or the multilayer pair thickness, and
= the incident angle


For a wave propagating in a medium with refractive index n = 1 + i

E(r,t) = E
0
e
-i(t - r/c)
e
-i(2

)r
e
-(2

)r




vacuum propagation -shift absorption


The phase shift, , relative to vacuum that is caused by propagation
through a thickness r is:

= (2/) r

MICHELSONS TWO-BEAM INTERFEROMETER
SCANNING
STAGE
PATH 2
PATH 1
DETECTOR
REFLECTOR
PARTIALLY REFLECTING
BEAM SPLITTER
SIN(X)
PATH 1
PATH 1
PATH 1
PATH 1
0 deg phase shift
180 deg phase shift
A MIRROR STEP EQUAL TO F /2 PRODUCES A PHASE SHIFT O
AND A MAXIMUM SIGNAL
A MIRROR STEP EQUAL TO F /4 PRODUCES A PHASE SHIFT O /2
AND A MINIMUM SIGNAL
x (radians)
-30 -20 -10 0 10 20 30
(
s
i
n
x
)
/
x
0
1
DETECTOR
FIXED REFLECTOR
(MULTILAYERED)
SCANNING REFLECTOR
(MULTILAYERED)
BEAM SPLITTER
(MULTILAYERED)
TELESCOPE
d
TELESCOPE
FOCUS
MICHELSON INTEFRFEROMETER FOR X-RAY SPECTROSCOPY

c
SCANNING
MIRROR
CENTRAL
RAY
INTERMEDIATE
SCAN
POSITION
MAXIMUM
SCAN
POSITION
TELESCOPE
FOCUS
SCAN RANGE
d
d
max
c
max
T
O
/
F
R
O
M
B
E
A
M
S
P
L
I
T
T
E
R
MICHELSON INTERFEROMETER SCANNING ARM
The maximum path difference between these rays (including the
reflection) is
max
= 2(c
max
- d
max
). For a Michelson interferometer,
the resolution element (in wave numbers), k
max
= 1/ (2d
max
) where
d
max
is the maximum on-axis displacement of the scanning reflector.
We adopt the convention of limiting the maximum phase shift
arising from the path difference
max
to /10. This choice implies a
maximum phase shift,
max
= 2(1/10) rad.

For small values of ,
1/(cos
max
) = c
max
/d
max
~ 1 +
max
2
/2,
c
max
/d
max
= 1 + (c
max
- d
max
)/d
max
= 1 +
max
/(2d
max
); therefore,

max
2
~
max
/d
max
= /(10 d
max
).
Table 1. Spectral resolution (/d) vs focal length
FL (m) 100 200 500 1000

max
(rad) 5.0 x 10
-3
2.5 x 10
-3
1.0 x 10
-3
5.0 x 10
-4

max
(deg) 0.286 0.143 0.0573 0.0286
/d 4 x 10
3
1.6 x 10
4
1 x 10
5
4 x 10
5



Table 2. d
max
vs focal length (H-like ions)
FL (m) d
max
( m)
C VI
3.4 nm
N VII
2.5 nm
O VIII
1.9 nm
100.0 13.6 10.0 7.6
200.0 54.4 40.0 30.4
500.0 340.0 250.0 190.0
1000.0 1360.0 1000.0 760.0

FOUR BOUNCE FOURIER TRANSFORM X-RAY SPECTROMETER
REFERENCE
DETECTOR
INTERFEROMETER
DETECTOR
MULTILAYER
BEAMSPLITTER
MULTILAYERED
REFLECTOR
NANOPOSITIONED
SLIDE
FRACTIONAL PATH DIFFERENCE vs TOTAL DISPLACEMENT
FOR A MACH-ZEHNDER INTERFEROMETER
0 20 40 60 80 100
0
1
2
( P/d ) = 2[(1-cos /sin]
max

P
/
d
m
a
x
BRAGG ANGLE ()
Table 3. Species to be studied with the 4-bounce Mach-Zhender
interferometer.
Ion Mg
(VII)
Si
(XIV)
S
(XVI)
Ar
(XVIII)
Ca
(XX)
Ti
(XXII)
Fe
(XXVI)
Wavelength
(nm)
0.84 0.62 0.47 0.37 0.30 0.25 0.18
Bragg
angle (deg)
31.6 22.8 17.1 13.4 10.8 9.0 6.5

BRAGG ANGLE vs WAVELENGTH FOR
COSMICALLY ABUNDANT H-LIKE IONS
(multilayer d-spacing = 0.8 nm)
0 1 2 3 4
0
20
40
60
80
100
Fe (XXVI)
Ti (XXII)
Ca(XX)
Ar (XVIII)
S (XVI)
Si (XIV)
Mg (VII)
O (VIII) N (VII)
C (VI)
WAVELENGTH (nm)
B
R
A
G
G

A
N
G
L
E

(
D
E
G
)
MICHELSON INTERFEROMETER
MACH-ZHENDER INTERFEROMETER
MACH-ZEHNDER INTERFEROMETER